CN1560688B - Electrostatic discharge guiding structure and liquid crystal display, with electrostatic discharge guiding structure - Google Patents
Electrostatic discharge guiding structure and liquid crystal display, with electrostatic discharge guiding structure Download PDFInfo
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- CN1560688B CN1560688B CN 200410008100 CN200410008100A CN1560688B CN 1560688 B CN1560688 B CN 1560688B CN 200410008100 CN200410008100 CN 200410008100 CN 200410008100 A CN200410008100 A CN 200410008100A CN 1560688 B CN1560688 B CN 1560688B
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- data line
- section
- static discharge
- ground wire
- intersection
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- 239000004973 liquid crystal related substance Substances 0.000 title description 2
- 230000003068 static effect Effects 0.000 claims description 57
- 239000000758 substrate Substances 0.000 claims description 16
- 238000009413 insulation Methods 0.000 claims description 10
- 230000001960 triggered effect Effects 0.000 claims description 3
- 238000007599 discharging Methods 0.000 abstract 5
- 238000000034 method Methods 0.000 description 14
- 230000007547 defect Effects 0.000 description 10
- 239000010409 thin film Substances 0.000 description 9
- 238000010586 diagram Methods 0.000 description 7
- 239000004020 conductor Substances 0.000 description 4
- 238000005520 cutting process Methods 0.000 description 4
- 230000002950 deficient Effects 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 238000002955 isolation Methods 0.000 description 2
- 238000001182 laser chemical vapour deposition Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000002648 laminated material Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
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Abstract
The invention provides a electrostatic discharging leading structure, the earth wire meeting with a data wire has a primary earth segment and at least an electrostatic discharging ignition segment, and the electrostatic discharging ignition segment is coupled to the primary earth segment. The electrostatic discharging leading structure includes: a data wire; and an earth wire, which has a primary earth segment, the insulating earth meets with the data wire; and at least an electrostatic discharging ignition segment, coupled to the primary earth segment, and the insulating earth meets with the data wire.
Description
Technical field
The present invention relates to a kind of electrostatic discharge conduction structure and have the LCD of electrostatic discharge conduction structure, particularly relate to a kind of LCD that can betide the structure of ad-hoc location in order to the guiding static discharge.
Background technology
Static discharge (Electrostatic Discharge, below be called for short with ESD) is prevalent in measurement, assembling, installation and the use of integrated circuit and LCD.It causes the wherein circuit or the possibility of assembly damage, and directly influences the function of total system.Yet form the reason of ESD stress, modal is to explain with three kinds of models: (1) manikin (human body model): refer to discharge when the tested person thing of deciding current potential is touched in the static electrification discharge of human body institute, and the ESD stress that causes; (2) machine mould (machine model): when referring to that machine touches the tested person thing, machine institute static electrification sees through the tested person thing and discharges the ESD stress that is caused; (3) electric charge component model (charge device model): refer to a former tested person thing that has had electrostatic charge in process subsequently, the contact conductive materials is when contacting the electric conductor of other set potential, esd discharge and the ESD stress that causes.
(thin film transistor liquid crystal display, in manufacture process TFTLCD), processing panel can be through many machines and personnel's operation, and machine and personnel more or less can have static at Thin Film Transistor-LCD.If such static does not go to discharge by certain mode, can cause damage to Thin Film Transistor-LCD unavoidably.Generally speaking, static discharge for Thin Film Transistor-LCD cause damage be mostly because discharge time the Joule heat that produces.Joule heat can may cause two former conductor short circuits that should completely cut off, and also may cause a coherent lead to be fused and open a way by high heat.Two kinds of infringements all can cause the Thin Film Transistor-LCD can't normal operation.
These infringements can be found with the method for electrical testing after Thin Film Transistor-LCD completes.But Thin Film Transistor-LCD is very large article after all, calculate with inch, but the physics size at damage of electrostatic discharge place only has the micron size often.How in the big display of inch, finding the definite infringement position of ESD fast, is an important problem.On the other hand, after the discovery, how can repair these ESD infringements fast, also be an important problem.Solve two problems, can improve the repairing speed and the repairing rate of defective products.
Summary of the invention
In view of this, the object of the present invention is to provide a kind of structure that guides static discharge to ad-hoc location.
Therefore, the invention provides a kind of electrostatic discharge conduction structure, with the ground wire of data line insulation and intersection, have a main ground connection section and at least one static discharge and trigger section, and static discharge triggers section and is coupled to main ground connection section.
According to one embodiment of the invention, above-mentioned static discharge triggers section and has two ends, is connected with main ground connection section respectively.
According to another embodiment of the present invention, above-mentioned ground wire also comprises an opening, roughly triggered section and surround and form by this main ground connection section and this static discharge, and with this data line intersection.
According to another embodiment of the present invention, above-mentioned static discharge triggers section and has one first live width, and this main ground connection section has one second live width, and this first live width is less than this second live width.
The present invention also provides another kind to have the LCD of electrostatic discharge conduction structure, comprising: a substrate; A plurality of data lines are arranged on this substrate with roughly paralleling; And at least one ground wire, being arranged on this substrate, this ground wire insulate and the phase intersection mutually with these data lines, and forms a plurality of intersections district.Wherein, in each intersection district, this ground wire includes: a main ground connection section, an insulation ground and a corresponding data line intersection; And at least one static discharge triggering section, be coupled to this main ground connection section, and insulation ground and corresponding data line intersection.
In the above-mentioned LCD with electrostatic discharge conduction structure, above-mentioned ground wire is between this substrate and each data line; Perhaps, each data line is between this substrate and this ground wire.
Description of drawings
Fig. 1 illustrates data line bit under the situation of ground wire below, the synoptic diagram of electrostatic discharge conduction structure.
Fig. 2 illustrates when the electrostatic discharge conduction structure of Fig. 1 has static discharge to produce, the synoptic diagram of data line and ground wire short circuit.
Fig. 3 illustrates the mode synoptic diagram when the repairing of Fig. 2.
Fig. 4 illustrates when the electrostatic discharge conduction structure of Fig. 1 has static discharge to produce, the synoptic diagram of the impaired open circuit of data line.
Fig. 5 A illustrates the synoptic diagram of walking around the repairing method of defect point when a kind of patch cord of Fig. 4.
Fig. 5 B illustrates the synoptic diagram that directly is formed at the repairing method of defect point top when a kind of patch cord of Fig. 4.
Fig. 6 is according to a LCD of the present invention.
Fig. 7 illustrates has the synoptic diagram that two static discharges trigger the electrostatic discharge conduction structure of section.
The reference numeral explanation
Substrate: 60 ground wires: GND
Data line: DL
0～DL
N-1The intersection district of ground wire and data line: 62
0～62
N-1
Main ground connection section: 72 static discharges trigger section: 70
Opening: 10 patch cords: 20
Defect point: A cut-off part: B, C
Tie point: 30a, 30b
Embodiment
Usually therefore static discharge can easily cause the defective of data line open circuit or short circuit in the discharge of current density higher position.In order to solve the short circuit that data line and ground wire confluce cause because of static discharge or the problem of data line open circuit, the invention provides a kind of structure that can guide static discharge, and can be beneficial to the repairing of data line and ground wire to ad-hoc location.
Fig. 6 is a utilization Thin Film Transistor-LCD of the present invention.Thin Film Transistor-LCD has a substrate 60, a ground wire GND and data line DL
0～DL
N-1Data line DL
0～DL
N-1, be arranged on the substrate 60 with roughly paralleling.One ground wire GND also is arranged on the substrate 60.From the viewpoint of solid, the order of level superposition can be, substrate 60, ground wire GND and data line DL
0～DL
N-1The order of level superposition also can be, substrate 60, data line DL
0～DL
N-1And ground wire GND.
Ground wire GND and data line DL
0～DL
N-1Insulation and phase intersection mutually, and form a plurality of intersections district 62
0～62
N-1Each intersection district is all the same.Below, convenient in order to explain, with intersection district 62
0Interior structure as an illustration.But present patent application is not limited to following explanation.
At first with reference to Fig. 1, with data line DL
0Be positioned at ground wire GND below, and the situation of both mutual electrical isolation is an example.With data line DL
0The ground wire GND of confluce has a main ground connection section 72 and a static discharge triggers section 70.The two ends that static discharge triggers section 70 are connected with main ground connection section 72, all are as ground wire GND basically.Static discharge triggers section 70, main ground connection section 72 and neighbouring part, with data line DL
0The confluce has surrounded an opening 10.
What need pay special attention to is that in Fig. 1, significantly the live width than main ground connection section 72 is little for the live width of static discharge triggering section 70.Such design has following main benefit: see through data line DL
0And ground wire GND discharge ESD incident, the ESD electric current can not flow through main ground connection section 72, is at most to flow through static discharge to trigger section 70.Reason is as described below.
As everyone knows, equipotential conductive surface, the big young pathbreaker of electric field intensity is proportional to the curvature on surface, place.That is to say that on same conductor, relatively point or narrow place will be compared thick or than the place of broad, had bigger electric field intensity.In case ESD stress is across data line DL
0And ground wire GND is when going up because static discharge trigger section 70 surface field intensity can than main ground connection section 72 surface field intensity come big, so that collapse or conducting also can trigger section 70 by static discharge is preferential.In other words, if, static discharge among Fig. 1 triggers section 70 and has one first static discharge trigger voltage, and main ground connection section 72 is when having one second static discharge trigger voltage, the first static discharge trigger voltage can be significantly than next little of the second static discharge trigger voltage.So under this structure, static discharge can be led to thinner static discharge and trigger section 70 and data line DL
0The zone of intersection.Therefore, the ESD electric current can not flow through main ground connection section 72, is at most to flow through static discharge to trigger section 70 yet.In a single day the slip-stick artist finds data line DL
0In the time of may suffering the ESD infringement, just trigger section 70 and data line DL as long as observe static discharge
0The place of infringement problem roughly just should be found in the zone of intersection.
Once across data line DL
0And after the esd event on the ground wire GND took place, as described before, the place that produces high heat must be that static discharge triggers section 70 and data line DL
0The zone of intersection.This may have three kinds of situations and take place.1, static discharge triggers section 70 and data line DL
0Short circuit; 2, static discharge triggering section 70 is fused; And 3, data line DL
0Zone in intersection is fused.The 2nd kind of situation can not cause any problem of circuit operation, so do not need to discuss.Below discuss respectively and suffer from the 1st kind of method for repairing and mending during with the 3rd kind of situation.
Fig. 2 has shown the 1st kind of situation of ESD infringement: static discharge triggers section 70 and data line DL
0Short circuit.The method of repairing is shown in Fig. 3.The mode of repairing is to cut off by two ends B and C that the static discharge with short circuit triggers section 70, and static discharge triggers section 70 and do not become and be connected with ground wire GND, so, data line DL
0Just revert to the state of open circuit (electrically isolated) with ground wire GND.Cutting off mode that thinner static discharge triggers section 70 can utilize laser to melt the mode of cutting to reach.In order to ensure data line DL
0Circuit still keep normal conducting, can form further that patch cord is crossed over defect point A and in defect point A two ends and data line DL
0Electrically connect (can be, detailed method for repairing and mending will in hereinafter doing explanation) with reference to the repairing method of figure 5A and Fig. 5 B.
Fig. 4 has shown the 3rd kind of situation of ESD infringement: data line DL
0The A place forms open circuit by fusing and in figure in the zone of intersection.And Fig. 4 is positioned at data line DL with ground wire GND
0The below, and the situation of both mutual electrical isolation is an example.The method of repairing is shown in Fig. 5 A or Fig. 5 B.Method for repairing and mending is in the two ends of open circuit defect point (indicating the A place), additionally forms a patch cord 20, strides across this open circuit defect point (indicating the A place), and makes data line DL via patch cord 20
0Conducting.Usually the method for repairing is to use laser in data line DL earlier
0Last defect point A produces at two ends tie point 30a and 30b (anticipates promptly, in data line DL
0 Form contact window 30a and 30b in the insulation course of top), utilize laser chemical vapor deposition method (laser CVD) to form patch cord 20 again, and this patch cord 20 can be via tie point 30a and 30b and with data line DL
0Electrically contact.Because utilizing laser to form might to make in the process of tie point 30a and 30b up and down laminated material to melt is in the same place, therefore, the correspondence position of ground wire GND must be avoided in the position of tie point 30a and 30b, and as shown in the figure, the position of tie point 30b is corresponding to the opening 10 of ground wire GND.Formed patch cord 20 can be walked around defect point A (shown in Fig. 5 A), or directly is formed at the linear pattern patch cord (shown in Fig. 5 B) of defect point A top.Just in case, data line DL
0In open circuit,, then can also trigger the two ends B of section 70 and C by static discharge and cut off and repair short circuit also with ground wire GND short circuit.Cutting off mode that thinner static discharge triggers section 70 can utilize laser to melt the mode of cutting to reach.
In addition, triggering section with the static discharge of the ground wire of data line confluce can be one, or two, even more than.As shown in Figure 7, trigger 70 and main ground connection sections 72 of section if will make two static discharges, can by in data line DL
0Form two among the ground wire GND of confluce perpendicular to data line DL
0Opening 10 form.
By above explanation as can be known, the ESD infringement is to repair very easily.
Electrostatic discharge conduction structure of the present invention has limited the occurrence positions of ESD infringement, therefore, can be when an esd event, dwindle the slip-stick artist should follow the zone of looking for, make the slip-stick artist find the position of the problem that may take place fast.And also because the static discharge that can excise in the electrostatic discharge conduction structure triggers the existence of section 70, mending course will be greatly easy.
Though the present invention discloses as above with preferred embodiment; yet it is not in order to limit the present invention; those skilled in the art can do a little change and retouching without departing from the spirit and scope of the present invention, thus protection scope of the present invention should with accompanying Claim the person of being defined be as the criterion.
Claims (4)
1. electrostatic discharge conduction structure comprises:
One data line; And
One ground wire, insulation ground and this data line intersection, and described ground wire has:
One main ground connection section, insulation ground and this data line intersection; And
At least one static discharge triggers section, this static discharge triggers section and has two ends, be connected with this main ground connection section respectively, and insulation ground and this data line intersection, this static discharge trigger section and have one first live width, and this main ground connection section has one second live width, this first live width is less than this second live width, this ground wire also comprises an opening, roughly triggered section and surround and form by this main ground connection section and this static discharge, and with this data line intersection.
2. LCD with electrostatic discharge conduction structure comprises:
One substrate;
A plurality of data lines are arranged on this substrate with roughly paralleling; And
At least one ground wire is arranged on this substrate, and this ground wire insulate and the phase intersection mutually with described data line, and forms a plurality of intersections district;
Wherein, in each intersection district, this ground wire includes:
One main ground connection section, an insulation ground and a corresponding data line intersection; And
At least one static discharge triggers section, this static discharge triggers section and has two ends, is connected with this main ground connection section respectively, and insulation ground and corresponding data line intersection, this static discharge triggers section and has one first live width, this main ground connection section has one second live width, and this first live width is less than this second live width, wherein, in each intersection district, this ground wire also comprises an opening, roughly triggered section and surround and form by this main ground connection section and this static discharge, and with this corresponding data line intersection.
3. the LCD with electrostatic discharge conduction structure as claimed in claim 2, wherein, this ground wire is between this substrate and each data line.
4. the LCD with electrostatic discharge conduction structure as claimed in claim 2, wherein each data line is between this substrate and this ground wire.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200410008100 CN1560688B (en) | 2004-03-10 | 2004-03-10 | Electrostatic discharge guiding structure and liquid crystal display, with electrostatic discharge guiding structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200410008100 CN1560688B (en) | 2004-03-10 | 2004-03-10 | Electrostatic discharge guiding structure and liquid crystal display, with electrostatic discharge guiding structure |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1560688A CN1560688A (en) | 2005-01-05 |
| CN1560688B true CN1560688B (en) | 2010-04-28 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200410008100 Expired - Lifetime CN1560688B (en) | 2004-03-10 | 2004-03-10 | Electrostatic discharge guiding structure and liquid crystal display, with electrostatic discharge guiding structure |
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| Country | Link |
|---|---|
| CN (1) | CN1560688B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104730745B (en) * | 2015-04-09 | 2017-08-25 | 京东方科技集团股份有限公司 | A kind of electrostatic discharge protection device and display panel |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5684547A (en) * | 1994-08-05 | 1997-11-04 | Samsung Electronics Co., Ltd. | Liquid crystal display panel and method for fabricating the same |
| US6429907B1 (en) * | 1999-02-24 | 2002-08-06 | Lg Philips Lcd Co., Ltd. | Liquid crystal display having improved image quality by reducing the excited interference voltage |
| CN1396656A (en) * | 2001-07-10 | 2003-02-12 | Lg.飞利浦Lcd有限公司 | Electrostatic discharge protective circuit and method of thin film transistor liquid crystal display |
| US6696701B2 (en) * | 2001-08-08 | 2004-02-24 | Koninklijke Philips Electronics N.V. | Electrostatic discharge protection for pixellated electronic device |
-
2004
- 2004-03-10 CN CN 200410008100 patent/CN1560688B/en not_active Expired - Lifetime
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5684547A (en) * | 1994-08-05 | 1997-11-04 | Samsung Electronics Co., Ltd. | Liquid crystal display panel and method for fabricating the same |
| US6429907B1 (en) * | 1999-02-24 | 2002-08-06 | Lg Philips Lcd Co., Ltd. | Liquid crystal display having improved image quality by reducing the excited interference voltage |
| CN1396656A (en) * | 2001-07-10 | 2003-02-12 | Lg.飞利浦Lcd有限公司 | Electrostatic discharge protective circuit and method of thin film transistor liquid crystal display |
| US6696701B2 (en) * | 2001-08-08 | 2004-02-24 | Koninklijke Philips Electronics N.V. | Electrostatic discharge protection for pixellated electronic device |
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| Publication number | Publication date |
|---|---|
| CN1560688A (en) | 2005-01-05 |
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Granted publication date: 20100428 |