CN1494358A - Method of testing AMOLED driver circuit and system - Google Patents
Method of testing AMOLED driver circuit and system Download PDFInfo
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- CN1494358A CN1494358A CNA021503206A CN02150320A CN1494358A CN 1494358 A CN1494358 A CN 1494358A CN A021503206 A CNA021503206 A CN A021503206A CN 02150320 A CN02150320 A CN 02150320A CN 1494358 A CN1494358 A CN 1494358A
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Abstract
The invented method and system are utilized to test N pieces of driving circuit before active mode organic light-emitting diode (AMOLED) is coated onto display screen. One end of driving circuit connected to an organic LED is as a testing output end. First, the method selects a driving circuit to be tested. Then, a current signal from the testing output end of the driving circuit is picked up and analyzed so as to determine whether the driving circuit works normally. All test of driving circuits are completed according to the said method.
Description
Technical field
The invention provides a kind of method of testing and system, is before plating Organic Light Emitting Diode, tests the drive circuit of an active organic light-emitting display.
Background technology
Along with progress of science and technology, screen display technology is also and then maked rapid progress.After secondary optical diode (LED) Display Technique, occurred a kind of brand-new plane Display Technique on the market, this new technology is called Organic Light Emitting Diode (organic lightemitting diode) Display Technique, abbreviates OLED as.Organic Light Emitting Diode needs a drive circuit to drive.With active luminous Display Technique (active matrixorganic light emitting display, be called for short AMOLED) be example, it is luminous to drive Organic Light Emitting Diode that drive circuit produces an electric current, and the light of sending out can be monochromes such as red, green, blue, even can reach full-color effect.Organic Light Emitting Diode not only can roll and be with, and does not also have the visual angle problem fully.Life-span reaches thousands of hours simultaneously, and power consumption is very low.Because Organic Light Emitting Diode has above-mentioned advantage, therefore very likely replace traditional light-emitting diode, become the main flow of Display Technique of future generation.
When utilizing Organic Light Emitting Diode to make a display, each picture element (pixel) needs an Organic Light Emitting Diode, and just each picture element needs a drive circuit.Therefore display has the drive circuit of ten hundreds of even 1,000,000.How testing these drive circuits effectively is very big engineerings.Fig. 1, Fig. 2 and Fig. 3 are the normal at present drive circuit that uses.The method of known test drive circuit is after plating Organic Light Emitting Diode OLED, by writing the single drive circuit of scan line (writescan line) WSL activation out of the ordinary, imports a voltage quasi position by data wire (dataline) DL again.This voltage quasi position is converted to a current signal I through one drive circuit thus, and this current signal I drives Organic Light Emitting Diode OLED and makes OLED luminous.Just according to the voltage quasi position of input, whether the luminosity of range estimation Organic Light Emitting Diode OLED is normal, judges that this drive circuit could operate as normal for the tester.This known method can be because of the difference of tester's subjective mind, and cause the test result inaccuracy.More serious problem is, if some drive circuits can't operate as normal, the related Organic Light Emitting Diode OLED that is plated on this drive circuit also and then scraps, and can't reclaim, and cause the raising of cost.Therefore, just need a kind of method of testing, can before plating Organic Light Emitting Diode OLED, effectively also test each drive circuit exactly.
Summary of the invention
The object of the invention provides a kind of method and system, is before plating Organic Light Emitting Diode, tests the drive circuit of an active organic light-emitting display.
One active organic light-emitting display comprises an input liner (input pad), and writes a scan line and a data wire.
Method of testing provided by the present invention is as follows: repeat following steps, all test up to all drive circuits and finish.Via input liner, the data signal value on the set data line.Via the input liner, import a voltage quasi position to writing scan line, to select the one drive circuit of next desire test.Test output terminal in drive circuit captures a current signal.Analyze this current signal, could operate as normal to judge this one drive circuit.
Test macro provided by the present invention comprises a data input device (data inputdevice), a pixel selection device (pixel selection device), a signal acquisition device (signal extractor) and a signal analyzer (signal analyzer).The data input device is connected with the input liner, is used for setting and the input data signal value.The pixel selection device also is connected with the input liner, is used for importing one and selects signal, to select the drive circuit of desire test.The signal acquisition device is connected with the test output terminal of the drive circuit of desire test, is used for capturing a current signal.Signal analyzer is connected with the signal acquisition device, is used for analyzing current signal, could operate as normal to judge this drive circuit.
Description of drawings
Fig. 1 is for plating the first drive circuit figure of Organic Light Emitting Diode;
Fig. 2 is for plating the second drive circuit figure of Organic Light Emitting Diode;
Fig. 3 is for plating the 3rd drive circuit figure of Organic Light Emitting Diode;
Fig. 4 is not for plating the first drive circuit figure of Organic Light Emitting Diode;
Fig. 5 is the flow chart of method of testing of the present invention;
Fig. 6 is not for plating the second drive circuit figure of Organic Light Emitting Diode;
Fig. 7 is not for plating the 3rd drive circuit figure of Organic Light Emitting Diode;
Fig. 8 is the schematic diagram of test macro first embodiment of the present invention;
Fig. 9 is the schematic diagram of test macro second embodiment of the present invention.
Embodiment
The invention provides a kind of before plating Organic Light Emitting Diode, the method for testing the drive circuit of an active organic light-emitting display.Suppose that this active organic light-emitting display has N drive circuit, be used for a driving N Organic Light Emitting Diode.This active organic light-emitting display also comprises an input liner, and writes a scan line and a data wire.The input liner is used for importing one and selects signal, with the one drive circuit of selecting desire to test, and is used for importing a data-signal, makes Organic Light Emitting Diode luminous.Write scan line and receive selection signal, be used for the drive circuit of activation (enable) or anergy (disable) desire test from the input liner.Data line receives the data signal from the input liner, this data value signal is sent to the drive circuit of desire test.Fig. 4 is a drive circuit (not plating Organic Light Emitting Diode as yet) commonly used.As shown in Figure 4, drive circuit comprises a first transistor M41 and a transistor seconds M43.The first transistor M41 and transistor seconds M43 respectively comprise one source pole (source) S, a gate (gate) G and a drain (drain) D.Wherein, the source S of the first transistor M41 (or drain) is connected to the data line DL of active organic light-emitting display, and what the gate G of the first transistor M41 was connected to active organic light-emitting display writes scan line WSL.The drain D (or source electrode) of transistor seconds M43 is as a test output terminal, this test output terminal plate Organic Light Emitting Diode after, be connected to Organic Light Emitting Diode.
Method of testing provided by the present invention as shown in Figure 5.When step 501, check whether all drive circuits have all been tested to finish.If not, then execution in step 503, via input liner, the numerical value of the data signal on the set data line DL.When step 505,, import a voltage quasi position to writing scan line WSL, to select the one drive circuit of next desire test via the input liner.Drive circuit with Fig. 4 is an example, because the first transistor M41 is a P channel field effect transistor (PMOS).Therefore when step 505, write scan line WSL and can transmit the gate G of a low level voltage,, make the data-signal of in step 503, having set can import this drive circuit to drive the first transistor M41 conducting to the first transistor M41.When step 507, capture a current signal in test output terminal, i.e. the drain D (or source electrode) of Fig. 4 transistor seconds M43.When step 509, analyze this current signal, could operate as normal to judge this one drive circuit.Return step 501 afterwards, check whether all drive circuits have all been tested to finish.If not, then continue execution in step 503,505,507 and 509.If then execution in step 511, finish whole testing process.
Drive circuit with Fig. 4 is an example.Power vd D is 12V, when writing scan line WSL and being 0V, and the first transistor M41 conducting, whole drive circuit is enabled, and data-signal can be imported this drive circuit.Data signal is a magnitude of voltage, and its scope is between 7V～10V.It is 64 GTGs that this scope is divided into, and can make Organic Light Emitting Diode produce 64 kinds of different brightness.If but the drive circuit operate as normal, then the scope of Xie Qu current signal should be between 20 μ A～0.002 μ A.The scope of the corresponding data signal of this scope can be divided into 64 GTGs equally.When execution in step 503, data signal is selected arbitrary GTG of 64 GTGs in the scope of 7V to 10V.When execution in step 509, analyze the current signal that is captured.If this one drive circuit operate as normal, then the numerical value of this current signal should drop in the corresponding GTG.
Test the drive circuit of AMOLED with method of testing of the present invention, can be accurately and finish whole testing process effectively.Can be because of the difference of tester's subjectivity, and produce the shortcoming that test result varies with each individual.
Circuit among Fig. 6, Fig. 7 also is a drive circuit commonly used at present.Different with the drive circuit among Fig. 4 is that the first transistor M61, M71 are n channel field effect transistor (NMOS).Therefore desire activation Fig. 6, drive circuit shown in Figure 7, the data-signal that writes on the scan line WSL should be the accurate position of high voltage.In addition, use the display of the drive circuit among Fig. 7 also to comprise elimination scan line (erase scanline) ESL, be used for before writing a data signal, eliminate the voltage that is stored in the capacitor C 71.
Method of testing of the present invention is not only applicable to Fig. 4, Fig. 6, drive circuit shown in Figure 7, also applicable to other similar drive circuit.
The present invention discloses a kind of system simultaneously, is used for carrying out above-mentioned method of testing.As shown in Figure 8, this system comprises a data input device 21, a pixel selection device 23, a signal acquisition device 25 and a signal analyzer 27.Data input device 21 sees through a connector (connector) 31, is connected with input liner 13, is used for setting the also numerical value of input data signal 15.Pixel selection device 23 also sees through connector 31, is connected with input liner 13, is used for importing one and selects signal 17, to select the drive circuit 11 of desire test.Signal acquisition device 25 is connected with the test output terminal of the drive circuit 11 of desire test, is used for capturing a current signal 19.Signal analyzer 27 is connected with signal acquisition 25, is used for analyzing current signal 19, to judge that this specific drive circuit 11 could operate as normal.
Shown in the embodiment of Fig. 8, signal acquisition device 25 is a single test pin, and desire is tested a certain specific drive circuit 11, just move to the test output terminal of this specific drive circuit 11.Fig. 9 is another embodiment, and as shown in Figure 9, signal acquisition device 25 has several test pin, can be used to test the drive circuit 11 of a permutation.In addition, signal acquisition device 25 also can be designed to a test pin matrix, and the test output terminal of all drive circuits all has a test pin to be attached thereto during test, does not therefore need movable signal acquisition device 25, just can test all drive circuits, to save the time of test.
Above narration only is explanation spirit of the present invention, should be with this as restriction.Ripe this skill person can do suitable variation under the category that does not surmount claim and contained.
Claims (4)
1. a method of testing the AMOLED drive circuit is the method for N drive circuit of test one active organic light-emitting display before plating an Organic Light Emitting Diode, it is characterized in that this active organic light-emitting display comprises:
One input liner is selected a signal and a data signal in order to import one;
One writes scan line, selects signal according to this, the one drive circuit of activation desire test; And
One data wire is in order to be sent to this data value signal this drive circuit of desire test;
This drive circuit comprises:
One the first transistor and a transistor seconds respectively comprise one source pole, a gate and a drain;
Wherein, the source electrode of this first transistor or drain are connected to this data line, and the gate of this first transistor is connected to this and writes scan line, and the source electrode of this transistor seconds or drain are as a test output terminal, plate this Organic Light Emitting Diode after, this drain is connected to this Organic Light Emitting Diode;
The method comprises the following step:
Repeat following steps, up to this N drive circuit all test finish till;
Via this input liner, set a numerical value of this data signal;
Via this input liner, set a numerical value of this selection signal;
Capture a current signal in this test output terminal; And
Analyze this current signal, could operate as normal with this drive circuit of judging the desire test.
2. the method for claim 1 wherein is somebody's turn to do in the step of a numerical value of setting this data signal, and this numerical value is a magnitude of voltage, and scope is between 7V～10V.
3. method as claimed in claim 2 should judge wherein that this drive circuit of desire test could the step of operate as normal, when the scope of this current signal during between 20 μ A～0.002 μ A, but i.e. this specific drive circuit operate as normal of expression.
4. a system that tests the AMOLED drive circuit is the system of N drive circuit of test one active organic light-emitting display before plating an Organic Light Emitting Diode, it is characterized in that this active organic light-emitting display comprises:
One input liner is selected a signal and a data signal in order to import one;
One writes scan line, selects signal according to this, the one drive circuit of activation desire test; And
One data wire is in order to be sent to this data value signal this drive circuit of desire test;
This drive circuit comprises:
One the first transistor and a transistor seconds respectively comprise one source pole, a gate and a drain;
Wherein, the source electrode of this first transistor or drain are connected to this data line, and the gate of this first transistor is connected to this and writes scan line, and the source electrode of this transistor seconds or drain are as a test output terminal, plate this Organic Light Emitting Diode after, this drain is connected to this Organic Light Emitting Diode;
This system comprises:
One data input device is connected to this input liner, in order to set a numerical value of this data signal;
One pixel selection device is connected to this input liner, in order to set a numerical value of this selection signal;
One signal acquisition device is connected to this test output terminal, in order to capture a current signal; And
One signal analyzer is connected to this signal acquisition device, in order to analyze this current signal, and could operate as normal with this drive circuit of judging the desire test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB021503206A CN1331236C (en) | 2002-11-01 | 2002-11-01 | Method of testing AMOLED driver circuit and system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB021503206A CN1331236C (en) | 2002-11-01 | 2002-11-01 | Method of testing AMOLED driver circuit and system |
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| Publication Number | Publication Date |
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| CN1494358A true CN1494358A (en) | 2004-05-05 |
| CN1331236C CN1331236C (en) | 2007-08-08 |
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| Application Number | Title | Priority Date | Filing Date |
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| CNB021503206A Expired - Fee Related CN1331236C (en) | 2002-11-01 | 2002-11-01 | Method of testing AMOLED driver circuit and system |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100356416C (en) * | 2003-04-28 | 2007-12-19 | 统宝光电股份有限公司 | Method and system for testing active display technology drive circuit |
| WO2015149493A1 (en) * | 2014-03-31 | 2015-10-08 | 京东方科技集团股份有限公司 | Test method and test system for oled display device |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5952789A (en) * | 1997-04-14 | 1999-09-14 | Sarnoff Corporation | Active matrix organic light emitting diode (amoled) display pixel structure and data load/illuminate circuit therefor |
| JP4196531B2 (en) * | 2000-09-08 | 2008-12-17 | 富士ゼロックス株式会社 | Driving method of display medium |
-
2002
- 2002-11-01 CN CNB021503206A patent/CN1331236C/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100356416C (en) * | 2003-04-28 | 2007-12-19 | 统宝光电股份有限公司 | Method and system for testing active display technology drive circuit |
| WO2015149493A1 (en) * | 2014-03-31 | 2015-10-08 | 京东方科技集团股份有限公司 | Test method and test system for oled display device |
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| Publication number | Publication date |
|---|---|
| CN1331236C (en) | 2007-08-08 |
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Granted publication date: 20070808 Termination date: 20171101 |