CN1492326A - Internal storage error generator and internal storage error correction function test method of computer main board - Google Patents

Internal storage error generator and internal storage error correction function test method of computer main board Download PDF

Info

Publication number
CN1492326A
CN1492326A CNA021465886A CN02146588A CN1492326A CN 1492326 A CN1492326 A CN 1492326A CN A021465886 A CNA021465886 A CN A021465886A CN 02146588 A CN02146588 A CN 02146588A CN 1492326 A CN1492326 A CN 1492326A
Authority
CN
China
Prior art keywords
data
continuous
internal storage
memory
chipset
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CNA021465886A
Other languages
Chinese (zh)
Other versions
CN1324475C (en
Inventor
操 周
周操
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lenovo Beijing Ltd
Original Assignee
Lenovo Beijing Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lenovo Beijing Ltd filed Critical Lenovo Beijing Ltd
Priority to CNB021465886A priority Critical patent/CN1324475C/en
Publication of CN1492326A publication Critical patent/CN1492326A/en
Application granted granted Critical
Publication of CN1324475C publication Critical patent/CN1324475C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Abstract

The present invention relates to internal storage error generator and internal storage error debugging function test method for computer mainboard. The internal storage error generator includes plug to mainboard, internal storage slot and button, which has one side connected to data lines of the internal storage slot via wires and the other side connected digital ground of the internal storage slot via wires. The test method includes inserting the internal storage error generator into the internal storage slot of the mainboard to be tested and memory bank in the internal storage error generator; and starting the tested mainboard and leading to operate system to run the test software and perform test program. The test process can verify the capability of the mainboard in detecting and debugging the internal storage data errors of 1 bit, 2 bits, continuous 4 bits, continuous 8 bits and continuous 16 bits. The test system is simple and low in hardware cost, and has less interference and influence on tested system.

Description

A kind of EMS memory error generator and computer motherboard internal memory error correction method of testing
Technical field
The present invention relates in the computer realm measuring technology of computer motherboard internal memory error correction is particularly related to a kind of EMS memory error generator and corresponding calculated machine mainboard internal memory error correction method of testing.
Background technology
Most of element of computing machine is by semiconductor fabrication, and its very important parts one internal memory is made up of with the circuit board that is connected these chips many random read-write storing semiconductor chips.Millions of mnemons are arranged in these semiconductor memory chips, and all there are " 0 " or information such as " 1 " in each unit.Because program and data that internal memory cooperates the CPU high speed storing carrying out are so as important components in the computer system, its reliability and fault-tolerant ability are the problems of industry research always.
Industrial community has been studied for many years semiconductor and memory techniques, finds to cause the reason of EMS memory error a lot, mainly is divided into hard error and soft error two classes.Wherein hard error can repeat to take place, and causes mainly due to the hardware damage of the mnemon in the memory chip or aerial lug mistake.Soft error is the mistake that takes place at random, mainly by the noise of electric signal in the data transmission, and the alpha ray that radiomaterial sends in the environment, and cosmic rays causes.
Because soft error is 1 bit-errors normally, and the probability that takes place is higher, and the lower cost that realizes, so since the birth of nineteen forty-seven ECC (Error Correcting Code) error-correcting code technique, this error correcting technique has obtained using comparatively widely in workstation, server product.Because semiconductor devices is the aging hard error that causes in long-term work, multi-bit error can cause program run unusual often, or even system crash.
Though since nineteen sixty industry studying the multidigit error-correcting code technique always, and obtained bigger progress in theory big because the algorithm complexity realizes the cost height, even can influence machine performance to the resource consumption of system.So this technology only adopts in large computer system always.
Entered since 21 century, the continuous development of computer technology, the performance of CPU constantly promotes, and the performance of high-end PC server is mainframe computer in some respects; The high speed development of semiconductor technology makes and realizes that in chipset multidigit ECC algorithm becomes possibility; The development of information industry is had higher requirement to the reliability of PC server and workstation; Therefore the manufacturer of chipset adds the function of multidigit ECC error correction in the product of a new generation.But production firm for computer motherboard and system, but brought new challenge, because do not have the hardware detection that manufacturer had and the technology of chipset, can only finish the design of product according to the hardware design of manufacturer's recommendation and the code of BIOS, and lack checking means and equipment this function simple and convenient.
Because the defective that above-mentioned prior art exists, the inventor is actively studied innovation, through constantly studying, designing based on abundant practical experience and professional knowledge, and after studying sample repeatedly and improving test, create the present invention who has practical value finally.
Summary of the invention
Fundamental purpose of the present invention is, adopts computer software and EMS memory error generator etc., sets up the verifying test system that carries out to computer motherboard internal memory error correction of a cover simple and convenient, to realize following target
(1) join by software and EMS memory error generator, can accurately produce 1,2, continuous 4, continuous 8, continuous 16 EMS memory error.
(2), can verify that the inspection whether mainboard is realized goes out 1 of internal storage data appearance, 2, continuous 4, continuous 8, the function of continuous 16 bit-errors by the computer software inspection.
(3), can verify whether mainboard can be realized 1 of internal memory, the error correction of continuous 4 or continuous 8 bit-errors by the computer software inspection.
(4) test macro is easy to use, and is simple to operate, and it is little that hardware cost drops into, and system under test (SUT) is disturbed and influences little.
Purpose of the present invention and solve its technical problem underlying and realize by the following technical solutions.A kind of EMS memory error generator according to the present invention proposes is characterized in that comprising mainboard plug, memory bank and button, wherein:
This mainboard plug has the interface pin with the memory bar equal number, and the definition of these stitch and the pin definitions of memory bar are identical;
The pin definitions of the pin definitions of this memory bank and the bar of internal memory is mated fully;
One side of this button is connected to the data line of memory bank by circuit, and another side is connected to the digital ground wire of memory bank by circuit; When button is pressed, data line and the digital ground wire that is connected can be communicated with; Be in off-state when button is released.
Aforesaid EMS memory error generator, wherein said button have five, wherein:
First button connects 1 position datawire, and second button connects 2 position datawires, and the 3rd button connects 4 position datawires, and the 4th button connects 8 position datawires, and the 5th button connects 16 position datawires.
The object of the invention to solve the technical problems also adopts following technical measures further to realize.A kind of computer motherboard internal memory error correction method of testing according to the present invention proposes is characterized in that having adopted EMS memory error generator and test plan software, and step comprises:
A. the EMS memory error generator is inserted on the memory bank of tested computer motherboard, memory bar is inserted on the EMS memory error generator; On tested computer motherboard, CPU is installed, and connects memory driver, display, power supply are connected with tested computer motherboard by data bus connection;
B. start tested computer motherboard and be directed to operating system, the operation testing software carries out test procedure.
Aforesaid method of testing, wherein said tested computer motherboard also connects keyboard and mouse.
Aforesaid method of testing, after wherein said testing software at first confirms the function of opened mainboard internal memory error correction, constantly in 4 continuous memory addresss, write FFFFFFFF FFFFFFFF respectively, from these 4 continuous memory addresss, distinguish sense data then again.
Aforesaid method of testing, in the wherein said testing software test procedure, the button of a data line in the data of in the process of read-write, having pressed connection on the EMS memory error generator, data line then is communicated with digital ground wire, data become " 0 " from " 1 ", and a dislocation has appearred in the data that chipset is read from internal memory; Chipset is as supporting 1 internal storage data error correction algorithm, will be this error correcting, it still is FFFFFFFF FFFFFFFF that program obtains data, but can writing down, the register in the chipset finishes 1 internal storage data error correction, data in the read register understood at this moment by testing software, error correction has been carried out in discovery, and testing software will show that computer motherboard finished 1 bit data error correction;
If the button of 2 data lines in the data of having pressed connection on the EMS memory error generator in the process of read-write, these 2 data lines then are communicated with digital ground wire, and data become " 0 " from " 1 ", and two dislocations have appearred in the data that chipset is read from internal memory; Chipset is as supporting 1 internal storage data error correction algorithm, can not be with this error correcting, it is not FFFFFFFF FFFFFFFF that program obtains data, testing software will come out the data presentation that program obtains, register in the chipset can write down finds 2 internal storage data mistakes, data in the read register understood at this moment by testing software, and show 2 internal storage data mistakes of computer motherboard discovery.
Aforesaid method of testing, in the wherein said testing software test procedure, if continuous 4 the internal storage data error corrections of mainboard support need internal memory to use simultaneously in pairs, wherein an internal memory is installed on the EMS memory error generator;
If the button of continuous 4 data lines in the data of in the process of read-write, having pressed connection on the EMS memory error generator, this 4 data line then with digitally is communicated with, data become " 0 " from " 1 ", and continuous 4 dislocations have appearred in the data that chipset is read from internal memory; Chipset is as supporting continuous 4 internal storage data error correction algorithms, will be this error correcting, it still is that the FFFFFFFF FFFFFFFF on each address finishes continuous 4 internal storage data error correction but the register in the chipset can write down in continuous 4 addresses that program obtains data; Data in the read register understood at this moment by testing software, find to have carried out error correction, and testing software will show that computer motherboard finished continuous 4 bit data error correction;
If the button of continuous 8 data lines in the data of in the process of read-write, having pressed connection on the EMS memory error generator 2, these 8 data lines then with digitally are communicated with so, data become " 0 " from " 1 ", and 8 dislocations have appearred in the data that chipset is read from internal memory; Chipset can not be with this error correcting as supporting continuous 4 internal storage data error correction algorithms, and program not all is FFFFFFFF FFFFFFFF from 4 continuous data that the address obtains, and testing software will come out the data presentation that program obtains; Register in the chipset can write down finds continuous 8 internal storage data mistakes, and data in the read register understood at this moment by testing software, and the demonstration computer motherboard is found continuous 8 internal storage data mistakes.
Aforesaid method of testing, in the wherein said testing software test procedure, if continuous 8 the internal storage data error corrections of mainboard support need 4 internal memories to use simultaneously, wherein an internal memory is installed on the EMS memory error generator;
If the button of continuous 8 data lines in the data of in the process of read-write, having pressed connection on the EMS memory error generator, these 8 data lines then with digitally are communicated with, data become " 0 " from " 1 ", and continuous 8 dislocations have appearred in the data that chipset is read from internal memory; Chipset is as supporting continuous 8 internal storage data error correction algorithms, will be this error correcting, it still is that the FFFFFFFF FFFFFFFF on each address finishes continuous 8 internal storage data error correction but the register in the chipset can write down in continuous 4 addresses that program obtains data; Data in the read register understood at this moment by testing software, and as finding to have carried out error correction, testing software will show that tested computer motherboard finished continuous 8 bit data error correction.
If the button of continuous 16 data lines in the data of in the process of read-write, having pressed connection on the EMS memory error generator, and this button, these 16 data lines then with digitally are communicated with so, and data become " 0 " from " 1 ", and 16 dislocations have appearred in the data that chipset is read from internal memory; Chipset can not be with this error correcting as supporting continuous 8 internal storage data error correction algorithms, and program is from 4 continuous data that the address obtains, FFFFFFFFFFFFFFFF, and testing software will come out the data presentation that program obtains; Register in the chipset can write down finds continuous 16 internal storage data mistakes, and data in the read register understood at this moment by testing software, and the demonstration computer motherboard is found continuous 16 internal storage data mistakes.
The present invention compared with prior art has tangible advantage and beneficial effect.By above technical scheme as can be known, the present invention has realized following effect:
(1) computer motherboard internal memory error correction test macro adopts computer program and EMS memory error generator to cooperate, and can produce 1 fast and accurately, and 2, continuous 4, continuous 8, continuous 16 EMS memory error.If use the EMS memory error generator separately, also can produce 1,2, continuous 4, continuous 8, continuous 16 EMS memory error.
(2) by computer software, can verify that can tested computer motherboard find that internal storage data occurs 1,2, continuous 4, continuous 8, continuous 16 bit-errors and realizing, the function of the error correction of continuous 4 or continuous 8 bit-errors to 1 of internal memory.
(3) this test macro uses the EMS memory error generator except that increasing, and need not other hardware device.EMS memory error generator simple installation only needs originally to be inserted in memory bar on the tested mainboard and transfers to and being inserted on the EMS memory error generator, gets final product and the EMS memory error generator is inserted on the tested mainboard.Whole computer motherboard internal memory error correction test macro uses also simpler, after hardware installs, after starting tested computer motherboard and moving testing software, only need press the button on the EMS memory error generator, the information of checkout software can be finished test.
In sum, a kind of EMS memory error generator of the present invention and computer motherboard internal memory error correction method of testing, have above-mentioned many advantages and practical value, and in like product, do not see have similar structural design and test to publish or use, no matter and it structurally or bigger improvement all arranged on the functional method, have large improvement technically, and produced handy and practical effect, and has the effect of enhancement really, thereby being suitable for practicality more, really is a new and innovative, progressive, practical new design.
Above-mentioned explanation only is the general introduction of technical solution of the present invention, for can clearer understanding technological means of the present invention, and can be implemented according to the content of instructions, below with preferred embodiment of the present invention and conjunction with figs. describe in detail as after.
The specific embodiment of the present invention is provided in detail by following examples and accompanying drawing thereof.
Description of drawings
Fig. 1 is the scheme of installation of memory bar on computer motherboard generally;
Fig. 2 is an EMS memory error generator external structure synoptic diagram of the present invention;
Fig. 3 is an EMS memory error generator internal circuit synoptic diagram of the present invention;
Fig. 4 is the scheme of installation of EMS memory error of the present invention on computer motherboard;
Fig. 5 is a computer motherboard internal memory error correction test system hardware arrangement plan of the present invention;
Fig. 6 is the process flow diagram of testing software of the present invention;
Fig. 7 is the synoptic diagram of PC 100/133 sdram memory mistake generator in one embodiment of the present of invention;
Fig. 8 is the synoptic diagram of DDR 200/266 EMS memory error generator among second embodiment of the present invention.
Among the figure: 1. 3. memory bars of the memory bank on computer motherboard 2. computer motherboards, 4. EMS memory error generators, 401. wiring boards, 402. memory banks, 403,404,405,406,407. buttons, 408,409. tie point 5.CPU, 6. power supplys, 7. cabinets
8. cable 9.CDROM or DVD driver 10. data bus connections 11. floppy disks 12. data bus connections 13. hard disk drives 14. data bus connections 15. cables 16. cable 17.220V AC power 18. displays 19. mouses 20. keyboards
Embodiment
Below in conjunction with accompanying drawing and preferred embodiment, to a kind of EMS memory error generator and the computer motherboard internal memory error correction method of testing that foundation the present invention proposes, its embodiment, structure, method and effect thereof, describe in detail as after.
Generally, the installation method of memory bar has memory bank 2 as shown in Figure 1 on tested computer motherboard 1, and memory bar 3 is inserted on the memory bank 2, shown in amplify the part.
The verifying test system that carries out of whole computer motherboard internal memory error correction is dimerous by the testing software that is installed in the hardware on the tested computer motherboard and operate on the tested computer motherboard.Two parts work that cooperatively interacts realizes the test to the checking of internal memory error correction.
When carrying out the validation test of computer motherboard internal memory error correction, as shown in Figure 2, memory bar 3 is inserted on the memory bank 402 above the EMS memory error generator 4.
4 of EMS memory error generators are inserted on the memory bank 2 on the tested computer motherboard 1, as shown in Figure 4.
Among Fig. 2, wiring board 401 has interface physical construction and the dimensional tolerence identical with memory bar 3, meets in 3 corresponding international standards of memory bar the requirement to wiring board.Wiring board 401 also has the interface pin with memory bar 3 equal numbers, and the pin definitions of definition and memory bar 3 is identical, and these stitch correspondences are connected on the pin of memory bank 402.
Memory bank 402 is fixed on the wiring board 401 and the pin definitions of the pin definitions of memory bank 402 and memory bar 3 is mated.
Button 403,404,405,406,407 is fixed on the wiring board 401, and is connected to the data line of memory bar 3 on one side by wiring board 401, and another side is connected to the digital ground wire of memory bar 3 by wiring board 401.Under the normal condition, button 403,404,405,406,407 is in the state of normal off; When pressing, data line and the digital ground wire that is connected can be communicated with.Totally 72 of the data lines that wiring board 401 is connected with memory bar 3 by memory bank 402, button 403 connects wherein 1, understands the generation computing machine and 1 dislocation during internal storage data is communicated by letter if press; Button 404 connects 2 position datawires, if press 2 dislocations in can producing computing machine and internal storage data be communicated by letter; Button 405 connects continuous 4 position datawires, if press continuous 4 dislocations in can producing computing machine and internal storage data be communicated by letter; Button 406 connects continuous 8 position datawires, if press continuous 8 dislocations in can producing computing machine and internal storage data be communicated by letter; Button 407 connects continuous 16 position datawires, if press continuous 16 dislocations in can producing computing machine and internal storage data be communicated by letter.
Fig. 3 is the circuit diagram of EMS memory error generator, and R3 is much smaller than R1 and R2.
1. the chipset on the mainboard 1 is a high level if the number that writes is " 1 " in the time of internal memory 3 write datas, supresses the button 404 on the EMS memory error generator 4, and wherein two of 72 position datawires are connected with digital ground wire.408,409 voltage among Fig. 3 has promptly become low level because the dividing potential drop of R1 and R3 becomes lower magnitude of voltage, and logic is " 0 ".Data on the memory chip read data line on the memory bar 3 will store " 0 " at this moment.When chipset was read these data again after button 404 unclamped, can find that 2 bit data have become " 0 " and promptly produced 2 dislocations.
2. when the chipset on the mainboard 1 is from internal memory 3 read datas, be high level, supress the button 404 on the EMS memory error generator 4, wherein two of 72 position datawires are connected with digital ground wire if the number that memory chip writes on the memory bar 3 is " 1 ".408,409 voltage among Fig. 3 has promptly become low level because the dividing potential drop of R2 and R3 becomes lower magnitude of voltage, and logic is " 0 ".Data on the chipset read data line will be read in " 0 " at this moment.2 bit-errors have promptly been produced.
3. the chipset on mainboard 1 writes " 1 " earlier again from the process of internal memory 3 read datas to internal memory 3, button 404 on the EMS memory error generator 4 is all supressed, existing two of the data of memory chip become " 0 " on the write memory bar 3 so, and two of the numerical value correspondence that chipset is read also are " 0 ".2 bit-errors have promptly been produced.
4. the circuit of other buttons 403,405,406,407 and button 404 similar on the EMS memory error generator 4, just the bar number of the data line that connects is 1,4,8 and 16,403 can connect in 72 data lines any one; 404 can connect in 72 data lines any 2; 405 need to connect continuous 4 and article one should be 72 4n bars (0≤n≤17) in the data line; 406 need to connect continuous 8 and article one should be 72 8n bars (0≤n≤8) in the data line; 407 need to connect continuous 16 and article one should be 72 8n bars (0≤n≤7) in the data line.
As shown in Figure 5; except that EMS memory error generator 4 replaces memory bars are inserted on first memory bank of tested computer motherboard 1; tested computer motherboard 1 also should be installed CPU 5; as being fixed in the suitable computer cabinet 7; tested computer motherboard 1 is protected, and whole simultaneously radiating condition makes moderate progress.
Computer power supply 6 input ends are connected with 220V AC power 17 by cable 16, and output terminal passes through cable 8 and is connected with tested computer motherboard 1, is main board power supply.
CDROM or DVD driver 9 is connected with tested computer motherboard 1 by data bus connection 10, floppy disk 11 is connected with tested computer motherboard 1 by data bus connection 12, and hard disk drive 13 passes through data bus connection 14 and is connected with tested computer motherboard 1.CDROM or DVD driver 9, floppy disk 11, hard disk drive 13 are connected with computer power supply 6 by cable 15, these peripheral hardwares play the pilot operationp system, the effect of operation test procedure can an independent use, also can two or more collaborative uses.Other peripheral hardware is as playing the pilot operationp system, and the effect of operation test procedure also can become the part of computer motherboard internal memory error correction test macro, as Zip drive, and USB Flash driver etc.
Keyboard 20, mouse 19, display 18 are connected with tested computer motherboard 1, respectively as the input of test macro and the output device of test result.
Whole test system hardware starts tested computer motherboard and is directed to the dos operating system environment after connecting correctly, the operation testing software.The process flow diagram of testing software as shown in Figure 6.
Confirm the function of opened mainboard internal memory error correction by testing software after, constantly in 4 continuous memory addresss, write FFFFFFFF FFFFFFFF respectively, from these 4 continuous memory addresss, distinguish sense data then again.
FFFFFFFF FFFFFFFF is 64 bit data, and each data of 64 is important to computing machine, and for guaranteeing that data transmission is correct, the hardware on the computer motherboard produces the checking data of some according to the method difference of error correction.As:
1 internal storage data error correction and 2 internal storage data error detection functions, adopt 64 bit data+8 bit check data=72 bit data, at this moment the most ancient internal memory error correction method has used for many years, so support that the data width of the memory bar of function of data error correction is 72.
A kind of is to adopt the algorithm of 128 bit data+16 bit check data=144 bit data to realize, promptly needs 2 internal memories to work together.
Continuous 8 internal storage data error correction, 16 internal storage data error detection functions adopt the algorithm of 256 bit data+24 bit check data=280 bit data to realize, promptly need 4 internal memories to work together.
The checking of 1 internal storage data error correction
If press the button on the EMS memory error generator 4 403 among Fig. 2 in the process of read-write, and button 403 has connected a data line in the data, this data line then with digitally is communicated with so, and data become " 0 " from " 1 ".One dislocation has appearred in the data that chipset is read from internal memory.Chipset will be this error correcting as supporting 1 internal storage data error correction algorithm, and it still is FFFFFFFF FFFFFFFF that program obtains data, finishes 1 internal storage data error correction but the register in the chipset can write down.Data in the read register understood at this moment by testing software, find to have carried out error correction, and testing software will show that computer motherboard finished 1 bit data error correction.
If press the button on the EMS memory error generator 4 404 among Fig. 2 in the process of read-write, and button 404 has connected 2 data lines in the data, these 2 data lines then with digitally are communicated with, and data become " 0 " from " 1 ".Two dislocations have appearred in the data that chipset is read from internal memory.Chipset can not be with this error correcting as supporting 1 internal storage data error correction algorithm, and it is not FFFFFFFF FFFFFFFF that program obtains data, and testing software will come out the data presentation that program obtains.Register in the chipset can write down finds 2 internal storage data mistakes, and data in the read register understood at this moment by testing software, and shows 2 internal storage data mistakes of computer motherboard discovery.
The checking of continuous 4 internal storage data error corrections
If continuous 4 the internal storage data error corrections of mainboard support need internal memory to use simultaneously in pairs.Wherein an internal memory should be installed on the EMS memory error generator.
If press the button on the EMS memory error generator 4 405 among Fig. 2 in the process of read-write, and button 405 has connected continuous 4 data lines in the data, this 4 data line then with digitally is communicated with, and data become " 0 " from " 1 ".Continuous 4 dislocations have appearred in the data that chipset is read from internal memory.Chipset is as supporting continuous 4 internal storage data error correction algorithms, will be this error correcting, it still is that the FFFFFFFF FFFFFFFF on each address finishes continuous 4 internal storage data error correction but the register in the chipset can write down in continuous 4 addresses that program obtains data.Data in the read register understood at this moment by testing software, find to have carried out error correction, and testing software will show that computer motherboard finished continuous 4 bit data error correction.
If press the button on the EMS memory error generator 4 406 among Fig. 2 in the process of read-write, and button 406 has connected continuous 8 data lines in the data, these 8 data lines then with digitally are communicated with so, according to becoming " 0 " from " 1 ".8 dislocations have appearred in the data that chipset is read from internal memory.Chipset can not be with this error correcting as supporting continuous 4 internal storage data error correction algorithms, and program may not all be FFFFFFFF FFFFFFFF from 4 continuous data that the address obtains, and testing software will come out the data presentation that program obtains.Register in the chipset can write down finds continuous 8 internal storage data mistakes, and data in the read register understood at this moment by testing software, and the demonstration computer motherboard is found continuous 8 internal storage data mistakes.
The checking of continuous 8 internal storage data error corrections
If continuous 8 the internal storage data error corrections of mainboard support need 4 internal memories to use simultaneously.Wherein an internal memory should be installed on the EMS memory error generator.
If press the button on the EMS memory error generator 4 406 among Fig. 2 in the process of read-write, and button 4 06 has connected continuous 8 data lines in the data, these 8 data lines then with digitally are communicated with so, and data become " 0 " from " 1 ".Continuous 8 dislocations have appearred in the data that chipset is read from internal memory.Chipset is as supporting continuous 8 internal storage data error correction algorithms, will be this error correcting, it still is that the FFFFFFFF FFFFFFFF on each address finishes continuous 8 internal storage data error correction but the register in the chipset can write down in continuous 4 addresses that program obtains data.Data in the read register understood at this moment by testing software, and as finding to have carried out error correction, testing software will show that tested computer motherboard finished continuous 8 bit data error correction.
If press the button on the EMS memory error generator 4 407 among Fig. 2 in the process of read-write, and button 407 has connected continuous 16 data lines in the data, these 16 data lines then with digitally are communicated with, according to becoming " 0 " from " 1 ".16 dislocations have appearred in the data that chipset is read from internal memory.Chipset can not be with this error correcting as supporting continuous 8 internal storage data error correction algorithms, and program may not all be FFFFFFFF FFFFFFFF from 4 continuous data that the address obtains, and testing software will come out the data presentation that program obtains.Register in the chipset can write down finds continuous 16 internal storage data mistakes, and data in the read register understood at this moment by testing software, and the demonstration computer motherboard is found continuous 16 internal storage data mistakes.
Two embodiment are as follows:
(1) PC 100/133 SDRAM computer motherboard internal memory error correction test macro
The structure of the ingredient PC 100/133 sdram memory mistake generator that system is important is gone into shown in Figure 7, and the number of pins of bottom golden finger is two-sided totally 168 pins, and two keyways are arranged, and every electric parameter of wiring board is abideed by the technical manual of PC 100/133.
(2) DDR 200/266 computer motherboard internal memory error correction test macro
The structure of the ingredient DDR 200/266 EMS memory error generator that system is important is gone into shown in Figure 8, and the number of pins of bottom golden finger is two-sided totally 184 pins, and a keyway is arranged, and every electric parameter of wiring board is abideed by the technical manual of DDR 200/266.
In aforesaid basic fundamental thought range of the present invention, concerning people, can carry out other various deformation with the common knowledge of this industry, should in the scope of the patented claim that the present invention adds, explain.
The above, it only is preferred embodiment of the present invention, be not that the present invention is done any pro forma restriction, any those skilled in the art may utilize the technology contents of above-mentioned announcement to be changed or be modified to the equivalent embodiment of equivalent variations, but every technical solution of the present invention content that do not break away from,, all still belong in the scope of technical solution of the present invention any simple modification, equivalent variations and modification that above embodiment did according to technical spirit of the present invention.

Claims (8)

1. an EMS memory error generator is characterized in that comprising mainboard plug, memory bank and button, wherein:
This mainboard plug has the interface pin with the memory bar equal number, and the definition of these stitch and the pin definitions of memory bar are identical;
The pin definitions of the pin definitions of this memory bank and the bar of internal memory is mated fully;
One side of this button is connected to the data line of memory bank by circuit, and another side is connected to the digital ground wire of memory bank by circuit; When button is pressed, data line and the digital ground wire that is connected can be communicated with; Be in off-state when button is released.
2. EMS memory error generator according to claim 1 is characterized in that described button has five, wherein:
First button connects 1 position datawire, and second button connects 2 position datawires, and the 3rd button connects 4 position datawires, and the 4th button connects 8 position datawires, and the 5th button connects 16 position datawires.
3. a computer motherboard internal memory error correction method of testing is characterized in that having adopted EMS memory error generator and test plan software, and step comprises:
A. the EMS memory error generator is inserted on the memory bank of tested computer motherboard, memory bar is inserted on the EMS memory error generator; On tested computer motherboard, CPU is installed, and connects memory driver, display, power supply are connected with tested computer motherboard by data bus connection;
B. start tested computer motherboard and be directed to operating system, the operation testing software carries out test procedure.
4. method of testing according to claim 3 is characterized in that wherein said tested computer motherboard also connects keyboard and mouse.
5. method of testing according to claim 3, after it is characterized in that wherein said testing software at first confirms the function of opened mainboard internal memory error correction, constantly in 4 continuous memory addresss, write FFFFFFFF FFFFFFFF respectively, from these 4 continuous memory addresss, distinguish sense data then again.
6. method of testing according to claim 5, it is characterized in that in the wherein said test procedure, the button of a data line in the data of in the process of read-write, having pressed connection on the EMS memory error generator, data line then is communicated with digital ground wire, data become " 0 " from " 1 ", and a dislocation has appearred in the data that chipset is read from internal memory; Chipset is as supporting 1 internal storage data error correction algorithm, will be this error correcting, it still is FFFFFFFF FFFFFFFF that program obtains data, but can writing down, the register in the chipset finishes 1 internal storage data error correction, data in the read register understood at this moment by testing software, error correction has been carried out in discovery, and testing software will show that computer motherboard finished 1 bit data error correction;
If the button of 2 data lines in the data of having pressed connection on the EMS memory error generator in the process of read-write, these 2 data lines then are communicated with digital ground wire, and data become " 0 " from " 1 ", and two dislocations have appearred in the data that chipset is read from internal memory; Chipset is as supporting 1 internal storage data error correction algorithm, can not be with this error correcting, it is not FFFFFFFF FFFFFFFF that program obtains data, testing software will come out the data presentation that program obtains, register in the chipset can write down finds 2 internal storage data mistakes, data in the read register understood at this moment by testing software, and show 2 internal storage data mistakes of computer motherboard discovery.
7. method of testing according to claim 5 is characterized in that in the wherein said test procedure, if continuous 4 the internal storage data error corrections of mainboard support need internal memory to use simultaneously in pairs, wherein an internal memory is installed on the EMS memory error generator;
If the button of continuous 4 data lines in the data of in the process of read-write, having pressed connection on the EMS memory error generator, this 4 data line then with digitally is communicated with, data become " 0 " from " 1 ", and continuous 4 dislocations have appearred in the data that chipset is read from internal memory; Chipset is as supporting continuous 4 internal storage data error correction algorithms, will be this error correcting, it still is that the FFFFFFFF FFFFFFFF on each address finishes continuous 4 internal storage data error correction but the register in the chipset can write down in continuous 4 addresses that program obtains data; Data in the read register understood at this moment by testing software, find to have carried out error correction, and testing software will show that computer motherboard finished continuous 4 bit data error correction;
If the button of continuous 8 data lines in the data of in the process of read-write, having pressed connection on the EMS memory error generator 2, these 8 data lines then with digitally are communicated with so, data become " 0 " from " 1 ", and 8 dislocations have appearred in the data that chipset is read from internal memory; Chipset can not be with this error correcting as supporting continuous 4 internal storage data error correction algorithms, and program not all is FFFFFFFF FFFFFFFF from 4 continuous data that the address obtains, and testing software will come out the data presentation that program obtains; Register in the chipset can write down finds continuous 8 internal storage data mistakes, and data in the read register understood at this moment by testing software, and the demonstration computer motherboard is found continuous 8 internal storage data mistakes.
8. according to claim 3,4 described method of testings, it is characterized in that in the wherein said test procedure that if continuous 8 the internal storage data error corrections of mainboard support need 4 internal memories to use simultaneously, wherein an internal memory is installed on the EMS memory error generator;
If the button of continuous 8 data lines in the data of in the process of read-write, having pressed connection on the EMS memory error generator, these 8 data lines then with digitally are communicated with, data become " 0 " from " 1 ", and continuous 8 dislocations have appearred in the data that chipset is read from internal memory; Chipset is as supporting continuous 8 internal storage data error correction algorithms, will be this error correcting, it still is that the FFFFFFFF FFFFFFFF on each address finishes continuous 8 internal storage data error correction but the register in the chipset can write down in continuous 4 addresses that program obtains data; Data in the read register understood at this moment by testing software, and as finding to have carried out error correction, testing software will show that tested computer motherboard finished continuous 8 bit data error correction.
If the button of continuous 16 data lines in the data of in the process of read-write, having pressed connection on the EMS memory error generator, and this button, these 16 data lines then with digitally are communicated with so, and data become " 0 " from " 1 ", and 16 dislocations have appearred in the data that chipset is read from internal memory; Chipset can not be with this error correcting as supporting continuous 8 internal storage data error correction algorithms, and program not all is FFFFFFFF FFFFFFFF from 4 continuous data that the address obtains, and testing software will come out the data presentation that program obtains; Register in the chipset can write down finds continuous 16 internal storage data mistakes, and data in the read register understood at this moment by testing software, and the demonstration computer motherboard is found continuous 16 internal storage data mistakes.
CNB021465886A 2002-10-24 2002-10-24 Internal storage error generator and internal storage error correction function test method of computer main board Expired - Fee Related CN1324475C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNB021465886A CN1324475C (en) 2002-10-24 2002-10-24 Internal storage error generator and internal storage error correction function test method of computer main board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNB021465886A CN1324475C (en) 2002-10-24 2002-10-24 Internal storage error generator and internal storage error correction function test method of computer main board

Publications (2)

Publication Number Publication Date
CN1492326A true CN1492326A (en) 2004-04-28
CN1324475C CN1324475C (en) 2007-07-04

Family

ID=34232796

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB021465886A Expired - Fee Related CN1324475C (en) 2002-10-24 2002-10-24 Internal storage error generator and internal storage error correction function test method of computer main board

Country Status (1)

Country Link
CN (1) CN1324475C (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100410894C (en) * 2004-11-09 2008-08-13 英特尔公司 System and method for error injection using a flexible program interface field
CN102841832A (en) * 2011-06-24 2012-12-26 鸿富锦精密工业(深圳)有限公司 Error memory chip locating system and method
CN104484274A (en) * 2014-12-24 2015-04-01 浪潮电子信息产业股份有限公司 Memory patrol scrub function test method based on ITP (integration test platform) tool
CN108153616A (en) * 2016-12-06 2018-06-12 北京京存技术有限公司 A kind of storage chip startup program detection method and device
CN112241346A (en) * 2020-10-23 2021-01-19 浪潮电子信息产业股份有限公司 Method, device and system for testing BIOS memory fault detection capability

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1129070C (en) * 1998-02-06 2003-11-26 华为技术有限公司 Recognition method for internal stored operation error in programming
US6233716B1 (en) * 1998-09-24 2001-05-15 Sun Microsystems, Inc. Technique for partitioning data to correct memory part failures
FR2793327B1 (en) * 1999-05-07 2001-07-06 Thomson Multimedia Sa METHOD FOR RECOVERING OPERATING OR ERROR INFORMATION FROM SOFTWARE MODULES OF ON-BOARD SOFTWARE AND A DIGITAL DEVICE THEREOF
CN1141644C (en) * 1999-11-20 2004-03-10 深圳市中兴通讯股份有限公司 Test and monitor method for embedded in processor memory

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100410894C (en) * 2004-11-09 2008-08-13 英特尔公司 System and method for error injection using a flexible program interface field
CN102841832A (en) * 2011-06-24 2012-12-26 鸿富锦精密工业(深圳)有限公司 Error memory chip locating system and method
CN102841832B (en) * 2011-06-24 2017-05-24 佛山慧捷电子科技有限公司 Error memory chip locating method
CN104484274A (en) * 2014-12-24 2015-04-01 浪潮电子信息产业股份有限公司 Memory patrol scrub function test method based on ITP (integration test platform) tool
CN104484274B (en) * 2014-12-24 2017-09-22 浪潮电子信息产业股份有限公司 A kind of internal memory taking turn audit function method of testing based on ITP instruments
CN108153616A (en) * 2016-12-06 2018-06-12 北京京存技术有限公司 A kind of storage chip startup program detection method and device
CN112241346A (en) * 2020-10-23 2021-01-19 浪潮电子信息产业股份有限公司 Method, device and system for testing BIOS memory fault detection capability
CN112241346B (en) * 2020-10-23 2023-03-03 浪潮电子信息产业股份有限公司 Method, device and system for testing BIOS memory fault detection capability

Also Published As

Publication number Publication date
CN1324475C (en) 2007-07-04

Similar Documents

Publication Publication Date Title
US8339827B2 (en) Memory device interface methods, apparatus, and systems
US10614905B2 (en) System for testing memory and method thereof
CN101029918A (en) System and method for testing controllable integrated circuit based on programmable device
US7272774B2 (en) Extender card for testing error-correction-code (ECC) storage area on memory modules
CN102880567B (en) data read-write system
CN86102265A (en) The fast functional testing method and the system thereof of random access memory (RAM)
CN1427420A (en) RAM high speed test control circuit and its testing method
KR102178538B1 (en) Memory device, method of generating log of command signal/address signal of memory device, and method of analyzing error of memory device
CN102483710A (en) Error correcting
CN1324475C (en) Internal storage error generator and internal storage error correction function test method of computer main board
CN1183564A (en) Method and apparatus for testing CPU register bit reverse caused by single particle effect
CN1290013C (en) Method and circuit for verifying instruction integrity in graphic controller
Lee et al. Reducing DRAM latency by exploiting design-induced latency variation in modern DRAM chips
CN1110095C (en) Semiconductor device and internal function identification method of semiconductor device
JP2010027059A (en) Notebook personal computer and its keyboard controller
CN1336553A (en) Mode generator used for testing semiconductor system
KR20110010381A (en) Semiconductor memory device comprising self repair operation and self repair method thereof
US20070169117A1 (en) Firmware loading device
CN1186809C (en) Embedded internal storage test platform device and testing method
CN112540881A (en) Storage device test management method and storage device test management system
TWI530702B (en) Reliability test board and system for chip using the same
CN205302958U (en) Flash memory chip testing frame
Alexander et al. Verification, characterization, and debugging of the HP PA 7200 processor
CN102508749B (en) Method for testing dual inline memory modules (DIMM)
Wang et al. Hierarchical fault tolerance memory architecture with 3-dimension interconnect

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20070704

Termination date: 20091124