CN1453708A - Automatic periodic test system and method for power switch of computer equipment - Google Patents
Automatic periodic test system and method for power switch of computer equipment Download PDFInfo
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- CN1453708A CN1453708A CN 02118902 CN02118902A CN1453708A CN 1453708 A CN1453708 A CN 1453708A CN 02118902 CN02118902 CN 02118902 CN 02118902 A CN02118902 A CN 02118902A CN 1453708 A CN1453708 A CN 1453708A
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Abstract
The automatic periodic test system for power switch of computer equipment includes one remote host computer, one data collecting circuit, several data acquisition and transmission circuits, several data transmission lines and one periodic power switch switching-over unit. The system may be used in automatic periodic test of several computers. The switch test error codes produced in the test period are transmitted via the data acquisition and transmission circuits to the data input port of the data collecting circuit and further to the remote host computer for record.
Description
Technical field
The invention relates to a kind of measuring technology of computer equipment, be meant a kind of power switch automatic periodic test system and method for testing thereof of computer equipment especially.
Background technology
The computer installation of general new research and development design during the stage, can be done the test of each side in test manufacture to this computer installation, uses and guarantees its product quality.For example in the test of production reliability project, power switch period measuring (Power On-off Cycles Test) is to be one of considerable production reliability test event.
In the design of computer system, when computing machine activates, the ROM-BIOS of computing machine (BIOS) can be carried out a series of test to system hardware, display, keyboard, internal memory, hard disk for example to being connected in this computer system ... Deng testing, system's self test program (Power On SelfTest) of being carried out during this start generally abbreviates POST as.In start self test program,, promptly can produce corresponding start test errors sign indicating number (POST Code) if when having detected arbitrary device and existing mistake in computer system.For example when memory test detects mistake, promptly can be on computer screen the display memory test errors message or send the caution sound.At present the widely used personal computer system of institute mostly follows the definition of IBM standard error sign indicating number, and for example error code 201 is to represent memory test mistake (Memory Test Failed).User, technician can be according to the definition of this error code, and inquire system mistake place.And for computing machine is made manufacturer, assembling manufacturer or maintenance manufacturer, the important especially test message of this start test errors sign indicating number.
When carrying out the test in this power switch cycle, present test mode, often need be about more than 2000 times or the time more than 3 days to this power switch follow-on test, and each tested computing machine board must be by test, do not having mistake or taking place under the machine phenomenon, can guarantee the production reliability of this computer equipment, just consider a large amount of production then.
Yet, in present power switch period measuring technology or method, if when test period has twice or repeatedly wrong a generation, often can't in real time its bad phenomenon complete documentation be got off.Because when tested computing machine board power supply is started shooting again and normally during activation system, its error messages or error code will not exist along with shutdown, and be difficult to carry out tracking, the analysis of mistake.In present measuring technology, only writing down each time, electric power starting makes system's activation (System Boot) carry out specific archives afterwards, and its count value (Counter) is added 1, and exist in the test result data file (Report File) of floppy disk or hard disk or write down each tested computing machine board and the power supply execution result and the bad phenomenon of switching computer circuit each time at any time on the side by the special messenger.Yet the traditional method of testing of this kind both imperfection also is not inconsistent efficient.
Summary of the invention
Edge this, fundamental purpose of the present invention promptly is at the disappearance of aforementioned common technology and actual demand, and develop a kind of computer power switch period measuring system, with reach save manpower again can the complete documentation test process in the practice condition in power switch cycle of each tested computing machine board and tested each time computing machine board.
Another object of the present invention provides a kind of computer power switch automatic periodic test system, it utilizes a long-range main control computer to monitor several tested computing machine boards simultaneously, and with the practice condition that each tested computing machine board is taken place when carrying out the electric power starting self test program note, and can be with this electric power starting self test program in the start test errors sign indicating number that produced be sent in the long-range main control computer, to make comparisons or to produce the test result form.
Another object of the present invention provides a kind of computer power switch period measuring system of being convenient to carry out follow-up error tracking and analysis, the testing engineering personnel only need when the test duration finishes, inspect the record result of the specific archives on long-range main control computer and the tested computing machine board, just can learn each tested computing machine board detailed execution result of Switching Power Supply each time easily.
Another object of the present invention provides a kind of power switch automatic periodic test method of computer equipment, it carries out the test in power switch cycle with a long-range main control computer to many tested computing machine boards, when each tested computing machine board is carrying out the electric power starting self test program, and produce when starting shooting the test errors sign indicating number, can be captured by the data acquisition transfer circuit test errors sign indicating number of should starting shooting, again by a data sink collector with acquisition in each data acquisition transfer circuit to start test errors sign indicating number read, and compile and be sent in the long-range main control computer.
In order to reach above-mentioned purpose, include a long-range main control computer, a data sink collector, a plurality of data acquisition transfer circuit, many data lines, a power switch cycle switch unit in the preferred embodiment of the present invention, utilize above-mentioned circuit arrangement, so that many tested computing machine boards are carried out the automatic test in power switch cycle.This tested computing machine board is in the switch periods of power switch period measuring power supply, the start test errors sign indicating number that produces is delivered to data-in port in the data sink collector via the data acquisition transfer circuit that connects, the start test errors sign indicating number that each tested computing machine board is sent by this data acquisition transfer circuit transmits and is recorded in the long-range main control computer again.
For further specifying above-mentioned purpose of the present invention, design feature and effect, the present invention is described in detail below with reference to accompanying drawing.
Description of drawings
Fig. 1 is the connection diagram that shows computer power switch automatic periodic test system of the present invention;
Fig. 2 is the output waveform figure that shows employed switch periods testing power supply among the present invention;
Fig. 3 is the annexation figure that shows between the further circuit block diagram of data sink collector of the present invention and this data sink collector and long-range main control computer, tested computing machine board;
Fig. 4 is the annexation figure that shows between the further circuit block diagram of data acquisition transfer circuit of the present invention and this data acquisition transfer circuit and tested computing machine board, data sink collector;
Fig. 5 shows control flow chart of the present invention.
Embodiment
At first consult shown in Figure 1, it has shown the connection diagram of the power switch automatic periodic test system of computer equipment of the present invention, this test macro includes a long-range main control computer (Remote ControlPC) 1, one data sink collector (Data Acquisition Device) 2, a plurality of data acquisition transfer circuits (Data Port Capture Device) 3a, 3b ... 3n, many data lines (Data TransferCable) 4a, 4b ... 4n, one power switch cycle switch unit 5 (Power On-off Cycles SwitchUnit), utilize above-mentioned circuit arrangement, can be to many tested computing machine board 6a, 6b ... 6n carries out the automatic test in power switch cycle.
This data sink collector 2 is to can be made into the plug-in card pattern, can be plugged on the bus of this long-range main control computer 1, for example pci bus groove (PCI Bus Slot).Data sink collector 2 has several FPDP (DataPort) or data channel, and each FPDP is respectively via data line 4a, 4b ... 4n and connect data acquisition transfer circuit 3a, 3b respectively ... 3n.This data acquisition transfer circuit 3a, 3b ... 3n also can be made into the plug-in card pattern, can be plugged on tested computing machine board 6a, 6b ... bus on the 6n, for example pci bus groove (PCI Bus Slot).
Each tested computing machine board 6a, 6b ... the switch periods testing power supply ACV ' of 6n is provided by power switch cycle switch unit 5.In the present embodiment, after this power switch cycle switch unit 5 is obtained AC power by an AC power ACV, export this switch periods testing power supply ACV ' (joining shown in Figure 2) by its power output end, for example its electric power starting (Power On) time is 50 seconds (T1), and power-off (Power Off) time is 5 seconds (T2).So periodically supply this switch periods testing power supply ACV ' to each tested computing machine board 6a, 6b ... 6n, by this and can this computing machine board of emulation the number of times of power switch operation when actual use the in the future.
Shown in Figure 3, shown the annexation figure between the further circuit block diagram of data sink collector 2 of the present invention and this data sink collector 2 and long-range main control computer, tested computing machine board.Include known members such as central processing unit 11, primary memory 12, data bus 13, address bus 14, control bus 15, PCI bridge 16 and pci bus 17 at long-range main control computer 1.And include several data buffers (Data Buffer) 21a, 21b in this data sink collector 2 ... 21n, each data buffer 21a, 21b ... the data bus of 21n (AD Bus) is the pci bus 17 that is connected to long-range main control computer.
In addition, include several and door 22a, 22b in this data sink collector 2 ... 22n, each and door 22a, 22b ... the wherein input end of 22n is to be connected to the I/O device that pci bus produces to read signal IOR, and another input end then is connected to I/O port address selected in the long-range main control computer 1 (38OH ~ 39CH) for example respectively.Utilize this I/O device to read signal IOR and I/O port address signal, make and door 22a, 22b ... the output terminal of 22n can produce enable signal respectively and deliver to this data buffer 21a, 21b ... the activation end G of 21n, and can select this data buffer of activation.
Each data buffer 21a, 21b ... data-in port P1, the P2 of 21n ... Pn is via data line 4a, 4b ... 4n and be connected to tested computing machine board 6a, 6b ... data acquisition transfer circuit 3a, the 3b of 6n ... 3n.This data line 4a, 4b ... 4n can adopt the signal transmission cable of general 9 lines, wherein 8 lines are the eight bit data signal wires that are connected to start test errors code data, an other line is the working power Vcc that is connected to electronic package on the tested computing machine board, uses this tested computing machine board of judgement whether during start (Power On).Certainly this signal data transmission line also can adopt the signal data transmission line of other kenel.
Fig. 4 is the annexation figure that shows between the further circuit block diagram of data acquisition transfer circuit of the present invention and this data acquisition transfer circuit and tested computing machine board, data sink collector.At tested computing machine board, for example among first tested computing machine board 6a, include known members such as central processing unit 61, primary memory 62, data bus 63, address bus 64, control bus 65, PCI bridge 66 and pci bus 67.And including a data bolt lock device 31 among this data acquisition transfer circuit 3a, its data bus (AD Bus) is the pci bus 67 that is connected to this tested computing machine board 6a.
In addition, include among this data acquisition transfer circuit 3a one with the door 32, wherein an input end is connected to the I/O device write signal IOW that the pci bus 67 of this tested computing machine board 6a is produced, and another input end then is connected to the wherein I/O port address (for example 08XH) of tested computing machine board 6a.Utilize this I/O device write signal IOW and I/O port address signal, make with door 32 output terminal and can produce the activation end G that enable signal is delivered to this data bolt lock device 31, and can select this data bolt lock device of activation.The data-out port D0-D7 of this data bolt lock device 31 promptly is first data-in port P1 that is connected to data sink collector 2 via data line 4a.So, the start test errors sign indicating number (POST Code) that tested computing machine board be produced in the test process in start can be seen through this data bolt lock device, data line, and data buffer and delivering in the long-range main control computer.
When long-range main control computer when beginning to carry out test, at first carry out the fetch program (I/O Ports Read Program) of each I/O port, and the beginning reading of data is compiled the data of the fixedly output port address that each the tested computing machine board on the circuit is connected to, and writing down start test errors sign indicating number (POST Code) on each tested computing machine board that each set time reads, this start test errors sign indicating number can be stored in the internal memory or disk of this long-range main control computer.And at each tested computing machine board when testing, this tested computing machine board also can demonstrate the start test errors sign indicating number of each tested computing machine board in real time, also this start test errors sign indicating number can be stored in the internal memory or disk of this tested computing machine board.
Fig. 5 has shown the control flow chart of specific embodiments of the invention, cooperate now Fig. 1 to framework shown in Figure 4 with treatment step explanation of the present invention as after.Step of the present invention mainly comprises by power switch cycle switch unit 5 supplies one switch periods testing power supply ACV ' to each tested computing machine board 6a, 6b ... 6n (step 101).During this switch periods testing power supply ACV ' power supply, each tested computing machine board 6a, 6b ... 6n carries out electric power starting self test program (step 102), and produces start test errors sign indicating number (POST Code) in this electric power starting self test program.At this moment, each tested computing machine board 6a, 6b ... 6n can be stored in this start test errors sign indicating number in the specific archives in internal memory or the disk (step 103), also this start test errors sign indicating number can be presented on its display.
In the step 104, by each data acquisition transfer circuit 3a, 3b ... tested computing machine board 6a, 6b that 3n will connect ... the start test errors sign indicating number that 6n is sent when carrying out the electric power starting self test program is captured, and is stored in the data bolt lock device of each data acquisition transfer circuit.
In the step 105, by data sink collector 2 with each data acquisition transfer circuit 3a, 3b ... the tested computing machine board 6a, the 6b that are captured among the 3n ... the start test errors sign indicating number of 6n is read, and compiles and be sent in the long-range main control computer 1.At this moment, each long-range main control computer 1 can be stored in this start test errors sign indicating number in the specific archives in internal memory or the disk (step 106), also this start test errors sign indicating number can be presented on its display.
Utilize above-mentioned explanation as can be known, test macro of the present invention utilizes a long-range main control computer to monitor several (for example 8-16 platform) tested computing machine boards simultaneously, and with the practice condition that each tested computing machine board is taken place when carrying out the electric power starting self test program note, and can be with this electric power starting self test program in the start test errors sign indicating number that produced be sent in the long-range main control computer, to make comparisons or to produce the test result form.So the testing engineering personnel only need to inspect the record result of the specific archives on long-range main control computer and the tested computing machine board again when the test duration finishes, and just can learn each tested computing machine board detailed execution result of Switching Power Supply each time easily.Therefore, the industrial utilization of the true tool height of the present invention.
Certainly, those of ordinary skill in the art will be appreciated that, above embodiment is used for illustrating the present invention, and be not to be used as limitation of the invention, as long as in connotation scope of the present invention, all will drop in the scope of claims of the present invention variation, the modification of the above embodiment.
Claims (13)
1. the power switch automatic periodic test system of a computer equipment includes:
One long-range main control computer;
One data sink collector includes a plurality of data buffers, and the data bus of each data buffer is connected to the bus of long-range main control computer, and this data buffer is that the enable signal that is produced by this long-range main control computer is controlled;
A plurality of data acquisition transfer circuits, include a data bolt lock device in each data acquisition transfer circuit, its data bus is connected to the bus of tested computing machine board, its data-out port is connected in the data-in port of one of them data buffer in this data sink collector, and this data bolt lock device system is controlled by the enable signal that this tested computing machine board is produced;
One power switch cycle switch unit, obtain AC power by an AC power after, by its power output end output switch periods testing power supply, and be supplied to each tested computing machine board;
This long-range main control computer is when carrying out test, can read the practice condition that each tested computing machine board is taken place when carrying out the electric power starting self test program via this data sink collector and data acquisition transfer circuit, and write down the start test errors sign indicating number of each tested computing machine board.
2. the power switch automatic periodic test system of computer equipment as claimed in claim 1 is characterized in that, the plug-in card pattern is made by this data sink collector system, can be plugged on the pci bus groove of this long-range main control computer.
3. the power switch automatic periodic test system of computer equipment as claimed in claim 1 is characterized in that, the plug-in card pattern is made by this data acquisition transfer circuit system, can be plugged on the pci bus groove of this tested computing machine board.
4. the power switch automatic periodic test system of computer equipment as claimed in claim 1, it is characterized in that, be connected with a data line between this data acquisition transfer circuit and data sink collector, so that this data acquisition transfer circuit is captured the start test errors sign indicating number that tested computing machine board is sent, deliver in the data sink collector via this data line.
5. the power switch automatic periodic test system of computer equipment as claimed in claim 4, it is characterized in that, this data line includes many barss data line as data signal line, other includes a linear system and is connected to working power on the tested computing machine board, uses this tested computing machine board of judgement whether during starting shooting.
6. the power switch automatic periodic test system of computer equipment as claimed in claim 1, it is characterized in that the start test errors sign indicating number that this tested computing machine board is produced also is presented at this tested computing machine board in real time and the test errors sign indicating number of should starting shooting is stored in this tested computing machine board.
7. the power switch automatic periodic test system of computer equipment as claimed in claim 1, it is characterized in that, include several and door in this data sink collector, each is that the I/O device that bus produced that is connected to long-range main control computer reads signal with a wherein input end of door, another input end then is connected to I/O port address selected in the long-range main control computer respectively, utilize this I/O device to read signal and I/O port address signal, make the activation end of delivering to each corresponding data impact damper with the output terminal generation enable signal of door.
8. the power switch automatic periodic test system of computer equipment as claimed in claim 1, it is characterized in that, include in this data acquisition transfer circuit one with the door, each is the I/O device write signal that bus produced that is connected to tested computing machine machine with a wherein input end of door, another input end then is connected to I/O port address selected in the tested computing machine board, utilize this I/O device write signal and I/O port address signal, make the activation end of delivering to this data bolt lock device with the output terminal generation enable signal of door.
9. the power switch automatic periodic test method of a computer equipment, be many tested computing machine boards to be carried out the test in power switch cycle with a long-range main control computer, this long-range main control computer is connected with a data sink collector, and being connected with a data acquisition transfer circuit in each tested computing machine board, this method of testing comprises the following steps:
Supply a switch periods testing power supply to each tested computing machine board;
During the power supply of this switch periods testing power supply, each tested computing machine board carries out the electric power starting self test program, and produces start test errors sign indicating number;
The start test errors sign indicating number that the tested computing machine board that will be connected by each data acquisition transfer circuit is sent when carrying out the electric power starting self test program is captured, and is stored in the data bolt lock device of each data acquisition transfer circuit; And
This data sink collector is read the start test errors sign indicating number of the tested computing machine board that captured in each data acquisition transfer circuit, and compiles and be sent in the long-range main control computer.
10. the power switch automatic periodic test method of computer equipment as claimed in claim 9 is characterized in that, comprises that also the start test errors sign indicating number that each tested computing machine board is produced is stored in the internal memory of tested computing machine board or the step in the disk.
11. the power switch automatic periodic test method of computer equipment as claimed in claim 9 is characterized in that, comprises that also the start test errors sign indicating number that each tested computing machine board is produced is presented at the step on the tested computing machine board display.
12. the power switch automatic periodic test method of computer equipment as claimed in claim 9, it is characterized in that, comprise that also the start test errors sign indicating number that each tested computing machine board is produced is stored in the internal memory of this long-range main control computer or the step in the disk.
13. the power switch automatic periodic test method of computer equipment as claimed in claim 9 is characterized in that, comprises that also the start test errors sign indicating number that each tested computing machine board is produced is presented at the step on this long-range main control computer display.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 02118902 CN1223942C (en) | 2002-04-27 | 2002-04-27 | Automatic periodic test system and method for power switch of computer equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 02118902 CN1223942C (en) | 2002-04-27 | 2002-04-27 | Automatic periodic test system and method for power switch of computer equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1453708A true CN1453708A (en) | 2003-11-05 |
| CN1223942C CN1223942C (en) | 2005-10-19 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 02118902 Expired - Fee Related CN1223942C (en) | 2002-04-27 | 2002-04-27 | Automatic periodic test system and method for power switch of computer equipment |
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| CN (1) | CN1223942C (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100399291C (en) * | 2005-01-25 | 2008-07-02 | 英业达股份有限公司 | Method for displaying complete information of BIOS correcting code |
| CN100529775C (en) * | 2005-01-10 | 2009-08-19 | 鸿富锦精密工业（深圳）有限公司 | Power supply switch controller |
| CN1983810B (en) * | 2006-04-03 | 2010-04-21 | 华为技术有限公司 | Method and device for repeated switching cell-phone |
| CN101126952B (en) * | 2006-08-15 | 2010-05-26 | 环达电脑(上海)有限公司 | Remote monitor module for power initialization of computer system |
| CN101482842B (en) * | 2008-01-09 | 2011-11-30 | 鸿富锦精密工业（深圳）有限公司 | Computer power on/off test device |
| CN107729204A (en) * | 2017-11-09 | 2018-02-23 | 英业达科技有限公司 | Test equipment and method of testing |
| TWI711922B (en) * | 2019-04-17 | 2020-12-01 | 上銀科技股份有限公司 | System function test device |
-
2002
- 2002-04-27 CN CN 02118902 patent/CN1223942C/en not_active Expired - Fee Related
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100529775C (en) * | 2005-01-10 | 2009-08-19 | 鸿富锦精密工业（深圳）有限公司 | Power supply switch controller |
| CN100399291C (en) * | 2005-01-25 | 2008-07-02 | 英业达股份有限公司 | Method for displaying complete information of BIOS correcting code |
| CN1983810B (en) * | 2006-04-03 | 2010-04-21 | 华为技术有限公司 | Method and device for repeated switching cell-phone |
| CN101126952B (en) * | 2006-08-15 | 2010-05-26 | 环达电脑(上海)有限公司 | Remote monitor module for power initialization of computer system |
| CN101482842B (en) * | 2008-01-09 | 2011-11-30 | 鸿富锦精密工业（深圳）有限公司 | Computer power on/off test device |
| CN107729204A (en) * | 2017-11-09 | 2018-02-23 | 英业达科技有限公司 | Test equipment and method of testing |
| CN107729204B (en) * | 2017-11-09 | 2020-10-27 | 英业达科技有限公司 | Test equipment and test method |
| TWI711922B (en) * | 2019-04-17 | 2020-12-01 | 上銀科技股份有限公司 | System function test device |
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| Publication number | Publication date |
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| CN1223942C (en) | 2005-10-19 |
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