CN1447116A - Method for measuring degree of roughness of soils - Google Patents

Abstract

This invention discloses a method for testing earth roughness including the following steps: 1) to random sample in a traget earch, random fix two points with a distance of L in between 2) lay down a spring less soft rope closely to the rough plane of earth on a line between the two points to get the direct distance L' 3) to test each sample accordingly 4) to get earth roughness of each sample G1=Li'(i=1,2,3..n) to get the roughness of entire target earth.

Description

A kind of measuring method of soil roughness

Technical field

The present invention relates to a kind of soil quality assay method, especially relate to a kind of measuring method of soil roughness.

Background technology

The water percentage of soil roughness and soil, the soil erosion, soil fertility, soil cultivation level etc. have direct relation, are the call parameters of often measuring in the research of farm-land management and pedology.The measuring method of soil roughness is mainly empirical method and remote sensing method at present, and empirical method is promptly determined by observation is subjective by experienced technician, and is random big and inaccurate; The remote sensing method is to carry out the interpretation analysis by the boat sheet, and the result is relatively accurate, but expends too much resource and can not be widely used in producing.

Summary of the invention

The object of the present invention is to provide a kind of simple and practical soil roughness measuring method, make that common staff just can use that the method can be very fast, measure soil roughness accurately, for production brings convenience.

For achieving the above object, the present invention includes following step: 1) grab sample in the target soil, fix 2 points at random, distance between two points is L; 2) on the straight line of fixing 2 places, be close to the uneven surface of soil with nonelastic tightrope and set level, obtain the stretching distance L of point-to-point transmission tightrope '; 3) and the like measure each sample prescription; 4) draw soil roughness Ci=Li '/L (i=1,2,3 of each sample prescription according to the data that record ... n), draw the soil roughness in full wafer target soil again $C=\underset{i=1}{\overset{n}{\mathrm{\Σ}}}{C}_i/n$ 。

Measured soil roughness of the present invention is simple and practical, can satisfy agricultural production and soil erosion managerial demand.

Description of drawings

Fig. 1 is for getting the synoptic diagram of point mode at random in the target soil;

Fig. 2 is for to be close to the synoptic diagram that the soil uneven surface is set level with nonelastic tightrope.

Embodiment

20 square metres two experiment field A and B are arranged, survey its soil roughness for understanding soil quality, get 6 sampling points to get point mode at random, the L value is 1 meter, by top step on the straight line of fixing 2 places, be close to the uneven surface of soil with nonelastic tightrope and set level, obtain the stretching distance L of point-to-point transmission tightrope ', the L ' value that records each sampling point is respectively A:(1.2,1.2,1.3,1.1,1.3,1.1); B:(1.4,1.3,1.4,1.2,1.2,1.4), A experiment field soil roughness value is Ci=Li`/L=1.2/1=1.2, the soil roughness value that can obtain 6 sampling points successively is respectively (1.2,1.2,1.3,1.1,1.3,1.1), calculates the soil roughness in full wafer target soil $\mathrm{Ca}=\underset{i=1}{\overset{n}{\mathrm{\Σ}}}{C}_i/n=(1.2+1.2+1.3+1.1+1.3+1.1)/6=1.2,$ Soil roughness value that in like manner can experiment with computing field B is Cb=1.32, and it is big that Cb＞Ca obtains testing field B roughness ratio experiment field A, and experiment field A is meticulousr than experiment field B.When C=1, the soil face is a smooth flat, and the C value is big more, and soil roughness is big more.

Claims (1)

1, a kind of measuring method of soil roughness is characterized in that: comprise the steps: 1) grab sample in the target soil, fix 2 points at random, distance between two points is L; 2) on the straight line of fixing 2 places, be close to the uneven surface of soil with nonelastic tightrope and set level, obtain the stretching distance L of point-to-point transmission tightrope '; 3) and the like measure each sample prescription; 4) draw soil roughness Ci=Li '/L (i=1,2,3 of each sample prescription according to the data that record ... n), draw the soil roughness in full wafer target soil again $C=\underset{i=1}{\overset{n}{\mathrm{\Σ}}}{C}_i/n$ 。