CN1419132A - Contact dynamic contact resistance measurer and measuring method thereof - Google Patents
Contact dynamic contact resistance measurer and measuring method thereof Download PDFInfo
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- CN1419132A CN1419132A CN 02148635 CN02148635A CN1419132A CN 1419132 A CN1419132 A CN 1419132A CN 02148635 CN02148635 CN 02148635 CN 02148635 A CN02148635 A CN 02148635A CN 1419132 A CN1419132 A CN 1419132A
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Abstract
The invention refers to a kind of contactor dynamic contact resistance testing equipment and the method. It includes testing circuit, sample drive control circuit, temperature and mostire adjusting box and industrial control computer, and the linked mode: the computer is respectively linked with two circuits above the former circuit linked with sample contactor and the laser linked with sample coil. It adopts accumulator to reduce voltage fluctuation, exerts large little pulse current on the contactor and resolves precise testing problem.
Description
Technical field:
The invention belongs to a kind of contact resistance proving installation and method of testing, particularly the dynamic contact resistance proving installation of low-pressure electronic equipment product contact and the design of method.
Technical background:
Academia attaches great importance to the contact reliability research of contact both at home and abroad, and especially the research of the contact reliability of low capacity contact is even more important.Because, the low capacity contact is generally all arranged in the various Electric device with a contact, they are widely used in the various control system and device of each industrial sectors such as machinery, electric power, metallurgy, chemical industry, electronics.Concerning the low capacity contact of low-pressure electronic equipment product, its subject matter is that contact resistance is excessive and unstable, and promptly contact reliability is not high, and this often causes the contact contact to be lost efficacy, cause and use the device or the system of these contacts to break down, even produce the tremendous economic loss.And concerning the contact reliability of contact, current research concentrates on the Static Contact resistance of research contact mostly, less to dynamic contact resistance research, particularly the test of dynamic contact resistance and stability yet there are no deep research under actual environment for use temperature, damp condition.Because during actual motion, the contact constantly open, closed, Static Contact resistance is qualified, differ and guarantee that surely repeatedly contact resistance still can be qualified after the open closed in the contact, so the more important thing is and to study under the different actual environment for use temperature and humidity conditions, during contact continuous open closed, the variation of dynamic contact resistance and stability thereof, and and then find out and guarantee and the approach that improves the contact contact reliability.In addition, adopt the conventional DC power supply,, bring bigger data error, use accumulator then not have this shortcoming to test because its voltage is subject to harmonic wave and electromagnetic interference (EMI) as load power source between the contact.The automaticity of proving installation is not high, has then limited the reliability and the efficient of test, and labour intensity is bigger, and has increased unreliable factor artificially.
Summary of the invention: the problem of solution:
The present invention is directed to above-mentioned situation, the accurate test problem of dynamic contact resistance when having solved the continuous open closed of different actual environment for use temperature humidity condition lower contacts, and then find out the approach that guarantees with raising contact contact reliability, the method for testing and the device of dynamic contact resistance promptly is provided.Technical scheme:
When dynamic contact resistance (Dynamic Contact Resistance) just is meant the closing of contact or disconnection, with the big or small contact resistance (generally in the milliohm level) that changes of contact force.Utilize industrial computer, be equipped with modularized circuit and digital high-speed acquisition system low capacity contact dynamic contact resistance is tested immediately.Contact of the present invention dynamic contact resistance proving installation mainly comprises contact dynamic contact resistance test circuit, test product Drive and Control Circuit, temperature and humidity regulator and industrial computer A.Its connected mode is: industrial computer A links to each other with contact dynamic contact resistance test circuit, test product Drive and Control Circuit respectively, and contact dynamic contact resistance test circuit links to each other with the test product contact, and the test product Drive and Control Circuit links to each other with the test product coil.
The test circuit of above-mentioned contact dynamic contact resistance comprises synchronization control circuit, digital high-speed acquisition system, impact damper and industrial computer A.Its connected mode is: with contact J
1Link to each other with digital high-speed acquisition system test lead, synchronization control circuit is by contact J
2On get synchronizing signal, and be connected with digital high-speed acquisition system, impact damper and industrial computer A successively.This device adopts accumulator as load power source between the contact, can reduce the fluctuation of voltage like this, reduces the error of the data of surveying.
The test product Drive and Control Circuit comprises optical controlled bidirectional thyrister SR, triode T, photo-coupler SU, latch and industrial computer A, its connected mode is: the two ends of test product coil link to each other with the common port K of optical controlled bidirectional thyrister SR and single-pole double-throw switch (SPDT) respectively, the optical controlled bidirectional thyrister SR other end links to each other with AC power, and the drive signal of industrial computer A output simultaneously links to each other with the gate pole control end of optical controlled bidirectional thyrister SR through latch; Industrial computer A links to each other with latch, photo-coupler SU, triode T base stage again successively, triode T emitter links to each other with dc power cathode, triode T collector links to each other with AC power, one end 1 of single-pole double-throw switch (SPDT) links to each other with AC power, and the other end 2 links to each other with the positive pole of direct supply.
The method of testing of contact dynamic contact resistance is: under different temperatures test product is carried out reliability testing, make test product under the load of DC24V/1A, carry out the reliability testing operation, and the certain number of times of every operation carries out the test of a contact dynamic contact resistance, all loses efficacy until test product.Utilize industrial computer A to be equipped with modularized circuit and digital high-speed acquisition system, low capacity contact dynamic contact resistance is tested immediately.In test, simulation test product work on the spot situation is put into temperature and humidity regulator with test product.Match in order to ensure measured result and practical working situation, under work is hot, test immediately, test immediately behind the certain number of times of promptly every operation, rather than the method that adopts cold conditions to lag behind and test.Record the result like this and can reflect actual state preferably.Because of contact resistance less relatively, the dynamic process that under little electric current, can not reflect the closing of contact preferably, for improving measuring accuracy and sensitivity, on the contact, apply big short-time pulse electric current in the test and come the dynamic contact resistance on the contact in the test contact closing course.The electric current that it applied should be in the rated thermal current scope of used test product.When one end of sampling test process, feedback signal cuts off electric current at once, so very little to the influence of test product contact.Beneficial effect:
Patent of the present invention has been developed the proving installation that an energy is tested the dynamic contact resistance of the each operation in contact, has realized low-pressure electronic equipment product is tested automatically, thereby has successfully solved accurate test this key issue of contact dynamic contact resistance.This device is easy and simple to handle, has improved testing efficiency, has reduced labour intensity, has also reduced the unreliable factor that the artificial origin causes simultaneously, has guaranteed the precision of test.In addition, the present invention adopts has the high-speed figure memory function, and the digital high-speed acquisition system of high-speed a/d converter, can finish test, memory and analysis to high-frequency phenomena.Realized the automatic control of test by operation application software on industrial computer.
In applied software development, made full use of the powerful hardware handles function of assembly language and flow process control, modular construction and the drawing function of higher level lanquage, reached the purpose of the directly perceived and intensifier performance of the control that makes proving installation.This device software is to finish by subroutine module more independently, is convenient to call.Wherein the main effect of user interface is that test run software is carried out unified organization and administration, and is user-friendly.Therefore, in the user interface design process, noted the principle that should follow, screen interface software designs screen window, help information etc. in line with principle directly perceived, readability.The application software of this device is provided with the help information hurdle, gives necessary teachings in each operating process, and the function to each menu has special annotations window to be illustrated simultaneously.
In test, be simulation test product work on the spot situation, we have introduced temperature and humidity regulator, guaranteed that measured result and practical working situation match, under work is hot, test immediately, be to carry out immediately behind the certain number of times of every operation, rather than the method that adopts cold conditions to lag behind and test, record the result like this and can reflect actual state preferably.Under the varying environment condition, the contact dynamic contact resistance has been carried out test and test figure has been carried out statistical study, proposed to improve the measure of contact contact reliability, played an important role improving the electric equipment products quality.We have adopted big short-time pulse electric current, come in the test contact closing course dynamic contact resistance on the contact; The electric current that applies is the interior short-time pulse electric current of rated thermal current scope of used test product, test process one end of promptly sampling, and feedback signal cuts off electric current at once, so very little to the influence of test product contact.
Patent of the present invention can be applicable to each contactor, relay manufacturer.Their product reliability is improved, like this, not only can improve the prestige and the sales volume of enterprise, bring remarkable economic efficiency, the more important thing is because the raising of product reliability, can make the control system of using these products be out of order less, reduce the loss, thereby bring the important social benefit.This device has following characteristics in sum:
(1) this device adopts accumulator as load power source between the contact, has greatly reduced the fluctuation of voltage,
Reduced the error of the data of surveying;
(2) adopt industrial computer as main frame, control is adopted modular construction with testing circuit,
Interference protection measures such as input and output light isolation have stronger antijamming capability;
(3) adopt bigger pulse current to come the dynamic contact resistance of test contact, improved measuring accuracy,
While is the influencing contactor life-span not;
(4) control the operation of test product automatically by main frame, and finish the test of contact dynamic contact resistance.
Description of drawings:
Fig. 1: apparatus structure connection layout of the present invention;
Fig. 2: the test circuit principle schematic of contact of the present invention dynamic contact resistance;
Fig. 3: test product Drive and Control Circuit principle schematic of the present invention;
Fig. 4: computer software programs block diagram of the present invention.Embodiment: (specifying in conjunction with the accompanying drawings)
Embodiment 1:
Industrial computer A is equipped with modularized circuit and the digital high-speed acquisition system is carried out real-time testing to low capacity contact dynamic contact resistance.From Fig. 1 as seen, a kind of contact dynamic contact resistance proving installation comprises test circuit, test product Drive and Control Circuit, temperature and humidity regulator and the industrial computer A etc. of contact dynamic contact resistance, its connected mode is: industrial computer A links to each other with contact dynamic contact resistance test circuit, test product Drive and Control Circuit respectively, contact dynamic contact resistance test circuit links to each other with the test product contact, and the test product Drive and Control Circuit links to each other with the test product coil.Be simulation test product work on the spot situation, we put into temperature and humidity regulator with test product HH52P type electromagnetic relay (the DC24V coil voltage comprises two pairs of transfer contacts), under-20 ℃ test product are tested.Match in order to ensure measured result and practical working situation, under the work of load DC24V/1A is hot, test immediately, be to carry out immediately behind the certain number of times of every operation, rather than the method that adopts cold conditions to lag behind and test, and the certain number of times of every operation carries out the test of a contact dynamic contact resistance, all lost efficacy until test product, and recorded the result like this and can reflect actual state preferably.The electric current that applies should in the rated thermal current scope of used test product, be the short-time pulse electric current, when sampling test process one finishes, feedback signal cuts off electric current at once.Because contact voltage is quite little during the closing of contact, we adopt big short-time pulse electric current, come in the test contact closing course change procedure of dynamic contact resistance on the contact.Because the dynamic contact resistance of contact changes in time, so need in the operating process to detect at any time.
The test circuit of the contact dynamic contact resistance among Fig. 1 comprises synchronization control circuit, digital high-speed acquisition system, impact damper and industrial computer A as shown in Figure 2.Its connected mode is: with contact J
1Link to each other with digital high-speed acquisition system test lead, synchronization control circuit is by contact J
2On get synchronizing signal, and be connected with digital high-speed acquisition system, impact damper and industrial computer A successively.Wherein, J
1, J
2Be a pair of transfer contact, J
1Be tested contact, J
2For synchro control is used the contact; R
1Be test pull-up resistor, R
2Be the synchro control pull-up resistor.Need to prove that this device adopts accumulator as load power source between the contact, can reduce the fluctuation of voltage like this, reduces the error of the data of surveying.On the contact, apply the big short-time pulse electric current of 5A in the test and come the dynamic contact resistance on the contact in the test contact closing course.
Test product Drive and Control Circuit among Fig. 1 comprises optical controlled bidirectional thyrister SR, triode T, photo-coupler SU, latch and industrial computer A as shown in Figure 3.Its connected mode is: the two ends of test product coil link to each other with the common port K of optical controlled bidirectional thyrister SR and single-pole double-throw switch (SPDT) respectively, the optical controlled bidirectional thyrister SR other end links to each other with AC power, and the drive signal of industrial computer A output simultaneously links to each other with the gate pole control end of optical controlled bidirectional thyrister SR through latch; Industrial computer A links to each other with latch, photo-coupler SU, triode T base stage again successively, triode T emitter links to each other with dc power cathode, triode T collector links to each other with AC power, one end 1 of single-pole double-throw switch (SPDT) links to each other with AC power, and the other end 2 links to each other with the positive pole of direct supply.This test product coil is a direct current, and single-pole double-throw switch (SPDT) K will link to each other with terminal 2.
For the control of dc coil, we have added photo-coupler SU and triode T in circuit.Direct current test product coil switching electric control is finished in switching by control optical controlled bidirectional thyrister SR and photo-coupler SU.Industrial computer A gives optical controlled bidirectional thyrister SR with the triggering and conducting signal through latch earlier, makes it to be in conducting state; Make it conducting with the triggering and conducting signal for photo-coupler SU by latch again then, the conducting of photo-coupler SU provides the base current that makes it conducting for triode T, thereby makes output loop conducting, coil electricity; When industrial computer A made it to end for photo-coupler SU with cut-off signals, triode T had lost the base current that makes it conducting, causes output loop to end, and all coil blackouts are finished the outage control operation of dc coil.This shows that optical controlled bidirectional thyrister SR plays master switch in the direct current output loop.When industrial computer A carried out Output Control Program, the signal data of output was delivered to latch and is preserved, and controlled the adhesive and the release of test product by the switching of optical controlled bidirectional thyrister SR and photo-coupler SU and triode T.Industrial computer A sends trigger pulse to optical controlled bidirectional thyrister SR, and coil is in "on" position.After cancelling pulse, because direct current does not have the zero passage phenomenon, during the control dc coil, utilize photo-coupler SU not conducting after pulse is cancelled, coil is finished outage.After test under the temperature-20 ℃ condition, regulate temperature and humidity regulator again, set the condition of 20 ℃ and 55 ℃ respectively, test.
Computer software programs block diagram of the present invention as seen from Figure 4.The operation testing software, at first carry out system initialization, the initialization system measurement parameter, carry out subroutine separately respectively according to the function key of being imported then, comprise initialization subroutine, parameter modification subroutine, test subroutine, data presentation subroutine, experimental implementation subroutine and data-storing subroutine.
Embodiment 2:
Carry out the dynamic contact resistance test with test product 155 type electromagnetic relays (the AC220V coil voltage comprises three pairs of transfer contacts) for test product.Single-pole double-throw switch (SPDT) K end links to each other with terminal 1 among Fig. 3, and other is with embodiment 1.When exchanging the test of test product, give under the situation of optical controlled bidirectional thyrister SR with the triggering and conducting signal all the time by latch, can make optical controlled bidirectional thyrister SR conducting always, thereby make coil be in "on" position at industrial computer A; And when industrial computer A gives optical controlled bidirectional thyrister SR with cut-off signals by latch, can make not conducting of optical controlled bidirectional thyrister SR by the selection to circuit parameter, then output loop will be turned off because of keeping electric current by the electric current of optical controlled bidirectional thyrister SR less than its conducting when the alternating current natural zero-crossing.
Claims (4)
1. contact dynamic contact resistance proving installation, it is characterized in that: it mainly comprises test circuit, test product Drive and Control Circuit, temperature and humidity regulator and the industrial computer A of contact dynamic contact resistance, its connected mode is: industrial computer A links to each other with contact dynamic contact resistance test circuit, test product Drive and Control Circuit respectively, contact dynamic contact resistance test circuit links to each other with the test product contact, and the test product Drive and Control Circuit links to each other with the test product coil.
2. according to the described a kind of contact of claim 1 dynamic contact resistance proving installation, it is characterized in that: the test circuit of contact dynamic contact resistance comprises synchronization control circuit, digital high-speed acquisition system, impact damper and industrial computer A, and its connected mode is: with contact J
1Link to each other with digital high-speed acquisition system test lead, synchronization control circuit is by contact J
2On get synchronizing signal, be connected with digital high-speed acquisition system, impact damper and industrial computer A successively, and adopt accumulator as load power source between the contact.
3. according to the described a kind of contact of claim 1 dynamic contact resistance proving installation, it is characterized in that: the test product Drive and Control Circuit comprises optical controlled bidirectional thyrister SR, triode T, photo-coupler SU, latch and industrial computer A, its connected mode is: the two ends of test product coil link to each other with the common port K of optical controlled bidirectional thyrister SR and single-pole double-throw switch (SPDT) respectively, the optical controlled bidirectional thyrister SR other end links to each other with AC power, and the drive signal of industrial computer A output simultaneously links to each other with the gate pole control end of optical controlled bidirectional thyrister SR through latch; Industrial computer A links to each other with latch, photo-coupler SU, triode T base stage again successively, triode T emitter links to each other with dc power cathode, triode T collector links to each other with AC power, one end 1 of single-pole double-throw switch (SPDT) links to each other with AC power, and the other end 2 links to each other with the positive pole of direct supply.
4. according to the method for testing of the described a kind of contact of claim 1 dynamic contact resistance, it is characterized in that: under different temperatures, test product is carried out reliability testing, make test product under the load of DC24V/1A, carry out the reliability testing operation, and the certain number of times of every operation carries out the test of a contact dynamic contact resistance, all loses efficacy until test product; Utilize industrial computer to be equipped with modularized circuit and the digital high-speed acquisition system is tested immediately to low capacity contact dynamic contact resistance.In test, simulation test product work on the spot situation is put into temperature and humidity regulator with test product, tests immediately under work is hot, tests immediately behind the certain number of times of promptly every operation, rather than adopts the method for cold conditions hysteresis test.On the contact, apply big short-time pulse electric current in the test, come the dynamic contact resistance on the contact in the test contact closing course, the electric current that applies should be in the rated thermal current scope of used test product, when sampling test process one finishes, feedback signal cuts off electric current at once.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB021486352A CN1180269C (en) | 2002-11-14 | 2002-11-14 | Contact dynamic contact resistance measurer and measuring method thereof |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB021486352A CN1180269C (en) | 2002-11-14 | 2002-11-14 | Contact dynamic contact resistance measurer and measuring method thereof |
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| Publication Number | Publication Date |
|---|---|
| CN1419132A true CN1419132A (en) | 2003-05-21 |
| CN1180269C CN1180269C (en) | 2004-12-15 |
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| Application Number | Title | Priority Date | Filing Date |
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| CNB021486352A Expired - Fee Related CN1180269C (en) | 2002-11-14 | 2002-11-14 | Contact dynamic contact resistance measurer and measuring method thereof |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100353175C (en) * | 2004-12-31 | 2007-12-05 | 河北工业大学 | Test device for small breaker reliability |
| CN101825661A (en) * | 2010-05-18 | 2010-09-08 | 宁波大学 | Instrument for dynamically measuring high resistance |
| CN103809026A (en) * | 2012-11-09 | 2014-05-21 | 镇江宏联电工有限公司（中外合资） | Control switch contact resistance detector |
| CN103926523A (en) * | 2014-04-18 | 2014-07-16 | 无锡优为照明科技有限公司 | Simulation device and method of poor contact conduction among conductors |
| CN104678177A (en) * | 2015-02-27 | 2015-06-03 | 上海和伍新材料科技有限公司 | Method and device for testing insulating material based on radiation source mode |
| CN114047437A (en) * | 2021-11-09 | 2022-02-15 | 中车青岛四方机车车辆股份有限公司 | Contactor state detection method, system and device and railway vehicle |
-
2002
- 2002-11-14 CN CNB021486352A patent/CN1180269C/en not_active Expired - Fee Related
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100353175C (en) * | 2004-12-31 | 2007-12-05 | 河北工业大学 | Test device for small breaker reliability |
| CN101825661A (en) * | 2010-05-18 | 2010-09-08 | 宁波大学 | Instrument for dynamically measuring high resistance |
| CN101825661B (en) * | 2010-05-18 | 2011-12-28 | 宁波大学 | Instrument for dynamically measuring high resistance |
| CN103809026A (en) * | 2012-11-09 | 2014-05-21 | 镇江宏联电工有限公司（中外合资） | Control switch contact resistance detector |
| CN103926523A (en) * | 2014-04-18 | 2014-07-16 | 无锡优为照明科技有限公司 | Simulation device and method of poor contact conduction among conductors |
| CN103926523B (en) * | 2014-04-18 | 2016-08-17 | 无锡优为照明科技有限公司 | The contact bad analog of conduction and analogy method between a kind of conductor |
| CN104678177A (en) * | 2015-02-27 | 2015-06-03 | 上海和伍新材料科技有限公司 | Method and device for testing insulating material based on radiation source mode |
| CN114047437A (en) * | 2021-11-09 | 2022-02-15 | 中车青岛四方机车车辆股份有限公司 | Contactor state detection method, system and device and railway vehicle |
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| Publication number | Publication date |
|---|---|
| CN1180269C (en) | 2004-12-15 |
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