CN111856184A - Intelligent analyzer for voltage sag tolerance of typical sensitive equipment - Google Patents
Intelligent analyzer for voltage sag tolerance of typical sensitive equipment Download PDFInfo
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- CN111856184A CN111856184A CN202010706146.3A CN202010706146A CN111856184A CN 111856184 A CN111856184 A CN 111856184A CN 202010706146 A CN202010706146 A CN 202010706146A CN 111856184 A CN111856184 A CN 111856184A
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- G06F8/00—Arrangements for software engineering
- G06F8/30—Creation or generation of source code
- G06F8/38—Creation or generation of source code for implementing user interfaces
Abstract
The invention discloses an intelligent analyzer for voltage sag tolerance of typical sensitive equipment, which consists of an upper computer, a programmable power supply, tested equipment, a data acquisition card, a singlechip, a relay and a push-pull electromagnet, wherein the upper computer is connected with the programmable power supply through an LAN (local area network) port and is responsible for controlling the output of the programmable power supply; the programmable power supply output end is connected to the tested device and is responsible for providing test voltage for the tested device; the upper computer is connected with the single chip microcomputer through an RS232 interface and sends a control instruction to the single chip microcomputer, the single chip microcomputer is connected with the relay, and the relay is controlled by the single chip microcomputer according to the instruction of the upper computer. The relay is connected with the push-pull electromagnet, click operation is simulated according to the instruction of the single chip microcomputer, and the tested equipment is started. The invention can effectively and accurately carry out automatic test aiming at the sensitive equipment, and lays an experimental foundation for setting the test standard of the voltage sag tolerance characteristic of the equipment and pertinently adopting treatment and prevention measures for the industry and users.
Description
Technical Field
The invention belongs to an electric power system, and particularly relates to an intelligent analyzer for voltage sag tolerance of typical sensitive equipment.
Background
The voltage sag is a condition that an effective value of an output voltage suddenly drops in a certain time period and is maintained for a certain time period, and then the output voltage is finally recovered to a normal output voltage, and the duration time of the voltage sag is mostly half cycle to several seconds. With the continuous development of the power industry, the requirements of high-end manufacturing such as semiconductor manufacturing, precision machining, aerospace equipment and the like on the quality of electric energy are higher and higher, and voltage sag accidents cause loss which is difficult to estimate in the aspects of equipment production, operation and maintenance and the like.
AC contactors (ACC), variable speed systems (ASD), Programmable Logic Controllers (PLC), and other devices are used in various applications in power systems. While the actual working efficiency of the devices is improved, the actual power system users are more easily influenced by the quality of the electric energy due to the intolerance of the devices to the voltage sag. A number of voltage sag event surveys have shown that when the associated equipment is subjected to a voltage sag, the associated process control system may be interrupted, thereby causing production line disruptions and significant economic losses to the user. In order to understand the tolerance capability of the sensitive devices to the voltage sag and to adopt an effective prevention and treatment scheme, a large number of mechanism, simulation and experimental researches are carried out on different voltage sag types and different devices by related organizations at home and abroad.
At present, a plurality of feature vectors such as voltage sag characteristics, sensitive device types, sensitive device attributes and load states are considered in a comprehensive manner in the existing standard test project and test scheme, and a common voltage sag tolerance characteristic test method of typical sensitive devices is listed. And finally, providing a probability statistical analysis method of the test result according to the problem of the test result. However, the test method considers that the number of feature vectors is too many, each feature vector needs to be manually tested for many times, meanwhile, the resetting of the equipment also needs to be manually reset, the test result also needs to be manually recorded, the labor and the time are wasted in practical occasions, and the test result also has artificial errors. Some people carry out voltage sag sensitivity tests on PLCs of current common brands, simulate a power supply by using a Chroma 61860 recovery type power grid, respectively examine the influence of factors such as basic characteristic quantity of voltage sag, odd harmonics and the like on the sag sensitivity of the PLCs, and manually draw voltage sag sensitivity curves of the PLCs. However, in this method, the output voltage needs to be manually modified every time the test vector is changed, and the manual reading of the test result consumes much time for the experiments with more test vectors and more equipment brands. The mechanism of the ASD voltage sag tolerance characteristics influenced by the ASD (protection and control mode), the load side (load characteristics), and the source side (voltage amplitude before/after voltage sag, sag shape) factors is also analyzed; and voltage sag tolerance curves of ASD were obtained by a number of experiments. However, the modification of the source-side voltage sag characteristic vector and the device fault resetting each time need manual processing, thousands of times of resetting are needed according to the international test standard, and the workload is huge.
At present, the domestic and foreign research in the field is based on manual voltage parameter setting, manual test result reading, manual sag tolerance curve drawing, great labor consumption and time cost, and large error of the duration time of normal operation of equipment under voltage sag calculated manually through oscilloscope waveforms. In order to complete the test of a single sensitive device, about one month is required from the editing of the voltage sag characteristic vector, the recording of the result by an oscilloscope, the manual calculation of the duration time and the manual drawing of a sag curve. Automatic testing of voltage sag tolerance of typical sensitive devices has not been documented to study.
Disclosure of Invention
The device and the method aim to overcome the defects that the existing test experiment needs to manually change a test vector, manually read a test result and manually reset. The invention constructs a typical sensitive equipment voltage sag tolerance intelligent analyzer based on an alternating current programmable power supply, provides a set of complete sensitive equipment voltage sag tolerance characteristic automatic test method on the basis of the existing standard test items and test schemes, automatically generates required voltage sag characteristic quantity for typical test circuits of ACC, ASD and PLC through a program, simultaneously reads the voltage sag tolerance time of equipment through a sliding window algorithm, and controls a travel switch to control the on-off of the tested equipment through the communication of a single chip microcomputer and an upper computer for the tested equipment needing automatic reset, thereby realizing the automatic reset of the equipment. And finally, importing the test result into an upper computer module and automatically drawing a voltage sag tolerance curve. All tests can be realized through software programming, the test accuracy is improved, the workload of people is reduced, the automatic test of the voltage sag tolerance experiment is creatively realized, and the blank that the existing tests are all manual test recording results and cannot be automatically tested is filled. The method provides an experimental foundation for quantifying the voltage sag tolerance of the equipment, and lays a foundation for understanding the tolerance level of the sensitive equipment and formulating the test standard of the tolerance level of the equipment.
The invention adopts the following technical scheme:
the intelligent analyzer consists of an upper computer, a programmable power supply, tested equipment, a data acquisition card, a singlechip, a relay and a push-pull electromagnet. The upper computer is connected with the programmable power supply through the LAN port and is responsible for controlling the output of the programmable power supply; the programmable power supply output end is connected to the tested device and is responsible for providing test voltage for the tested device; the upper computer is connected with the single chip microcomputer through the RS232 interface and sends a control instruction to the single chip microcomputer, the single chip microcomputer is connected with the two relays and controls the relays according to the instruction of the upper computer, the relays are connected with the push-pull type electromagnets, contacts of the push-pull type electromagnets are aligned with reset switches of the equipment to be tested, clicking operation is simulated according to the instruction of the single chip microcomputer, and the equipment to be tested is started. The voltage probe is respectively connected with the programmable power supply output side and the output end of the tested device, the voltage is measured and then connected with the data acquisition card, wherein the device voltage is connected with the second interface of the analog input quantity of the data acquisition card, and the phases A and C of the power supply voltage are respectively connected with the first interface and the third interface of the analog input quantity of the data acquisition card. The data acquisition card is connected with the upper computer and directly uploads the acquired data to the upper computer.
The upper computer is divided into a core logic processing module of the intelligent analyzer, and the core logic processing module is divided into a browser and a server. After the tested parameters are set in the browser interface, the browser initiates a request to the server and downloads the parameters. After receiving the parameters, the server sends a control instruction to the programmable power supply on one hand, controls the output of the voltage of the programmable power supply, and adds the output voltage to the tested equipment; and on the other hand, whether the reset operation is required or not is determined according to the type of the tested equipment, and if the reset operation is required, the server can automatically send an instruction to the reset module at the required moment to reset the tested equipment. Meanwhile, the server can initiate a data acquisition instruction to the data acquisition module, and the data acquisition module acquires voltage data of the programming power supply and the tested device and then transmits the data back to the server. After the test is finished, the server automatically analyzes the acquired data, on one hand, the test result is stored in the database, on the other hand, the test result is transmitted back to the browser, and the browser performs test report display and voltage sag tolerance curve drawing after receiving the transmitted back data.
The invention has the beneficial effects that: the intelligent analyzer for the voltage sag tolerance of the typical sensitive equipment is used for testing the ACC and the PLC, a voltage sag tolerance curve can be generated only by testing the complete characteristic vector of a single voltage sag in about five minutes, compared with a large amount of manual operations required by a traditional testing method, the testing efficiency is greatly improved in a plurality of days, and similarly, the intelligent analyzer for the voltage sag tolerance of the typical sensitive equipment is used for testing the ASD, the resetting of the equipment is realized through an automatic resetting module, the manual waiting for the resetting is not needed, and the productivity is greatly released. The summary shows that the intelligent analyzer for the voltage sag tolerance of the typical sensitive equipment can effectively and accurately perform automatic testing on the sensitive equipment, and lays an experimental foundation for setting a test standard for the voltage sag tolerance characteristic of the equipment and adopting control and preventive measures in a targeted manner for industries and users.
Drawings
FIG. 1 is the overall structure of a typical sensitive device voltage sag tolerance intelligent analyzer
FIG. 2 is a schematic diagram of a voltage sag
FIG. 3 is a waveform of a PLC voltage measurement
FIG. 4 is a measured voltage waveform of a frequency converter
Detailed Description
Referring to the attached drawings, as can be seen from the actual automatic test requirements, the intelligent analyzer for voltage sag tolerance of a typical sensitive device has the following functions: 1) human-computer interface interaction; 2) communicating with a programmable power supply; 3) communicating with a single chip microcomputer; 4) communicating with a data acquisition card; 5) and (6) processing data and drawing a voltage sag tolerance curve.
Fig. 1 shows the general structural framework of a typical sensitive device voltage sag tolerance intelligent analyzer. The system comprises an upper computer 1, a programmable power supply 2, a tested device 3, a load 4, a single chip microcomputer 5, a relay 6, a push-pull electromagnet 7, a data acquisition card 8 and a voltage probe 9. Where 1.1 and 2.1 represent the LAN ports of the respective devices, respectively, and 1 and 2 are connected via these two interfaces. 1,3 and 5.1 respectively represent serial ports of respective devices, and 1 and 5 are connected through the two serial ports by using RS232 interfaces. 5.2 is the I/O port of the singlechip, and is connected with the 6. And 6 is connected with 7 power supply loops. 2.5,3.7, 4.4 and 8.4 are ground wire interfaces of respective devices, and the devices are grounded. 2.2,2.3 and 2.4 are power output ports of 2, namely phases A, B and C. 3.1,3.2 and 3.3 are respectively 3A phase voltage input ports, B phase voltage input ports and 3.4,3.5 and 3.6 are respectively 3A phase voltage output ports, B phase voltage output ports and C phase voltage output ports. 3.2,3.3,3.5,3.6 are dashed boxes indicating that there may be no ports, when these four ports are not present, 3 represents a single phase device and when present, 3 represents a three phase device. And 3.8 represents a reset switch of the tested device, which is a dashed line box, when 3.8 does not exist, the 3 can be automatically reset, and when 3.8 exists, the 3 needs to be manually reset. 4.1,4.2 and 4.3 represent the A, B and C three-phase voltage input ports of the load, 4.2 and 4.3 are dotted lines and may not exist, 4 represents a single-phase load when the two ports do not exist, and 4 represents a three-phase load when the two ports exist. 8.1,8.2 and 8.3 respectively represent a first channel analog input port, a second channel analog input port and a three-channel analog input port of the data acquisition card. The voltage output by the 2.2 and 2.4 ports is connected with a voltage probe 9, and the voltage probe 9 measures the 2.2 and 2.4 voltages and then is connected with 8.1 and 8.3. The output voltage of the 3.4 port is connected with 9, and the voltage of the 3.4 port is measured and connected with 8.2 by 9. 2.2 and 3.1, 2.3 and 3.2,2.4 and 3.3, 3.4 and 4.1, 3.5 and 4.2,3.6 and 4.3, the dashed lines in the figure represent the possible absence, when the dashed lines are absent, the test connections for single-phase devices and when the dashed lines are present, the test connections for three-phase devices. The contact of 7 is aligned with the 3.8 contact. 8.5 and 1.2 are connected by a USB line. The transformation ratio of 9 was 200.
The core of the intelligent analyzer is an upper computer, the upper computer builds a control platform of a B/S mode in a node.js environment, a B/S structure (Browser/Server, Browser/Server mode) is a network structure mode after WEB is started, and a WEB Browser is the most main application software of a client. The mode unifies the client, centralizes the core part of the system function realization to the server, and simplifies the development, maintenance and use of the system. The client only needs to install a browser such as Chrome or Edge, and the Server installs databases such as SQL Server, Oracle, MYSQL and the like. And the browser performs data interaction with the database through the Web Server.
The software development of the upper computer comprises the development of a server (rear end) and a client (front end), the server processes service logic, and the client adopts a browser and only renders an interface. The server and the browser communicate through an Http protocol. The upper computer and the programmable power supply complete the functions of command issuing, query and the like through a TCP/IP protocol. The upper computer is connected with the single chip microcomputer through RS232 serial port communication, and the purpose of controlling the switch reset of the tested equipment is achieved by controlling the single chip microcomputer to control the starting and stopping of the relay. And the upper computer calls a driving program of the data acquisition card to acquire data. The server in the upper computer stores data by using the MongoDB database.
1. Development of client in upper computer
The client is shown in the form of a web page, which may be referred to as a front end. The front-end interface is composed of HTML (hypertext markup language), CSS (cascading style sheets) and JS (JavaScript) files, wherein the HTML files are hypertext markup languages and are responsible for displaying page content, and the CSS files are cascading style sheets and are responsible for modifying the style of the page content, such as controlling the font color and the content position of the page. The JS file is a browser-side script file, the page content and the page style can be dynamically modified through the DOM, and meanwhile, the JS file can be communicated with a background by adopting an AJAX request technology to dynamically and locally modify the content of an interface.
In order to improve the development efficiency, the system integrally adopts a mature front-end framework: bootstrap and JQuery frameworks. And building a system front-end interface by using Bootstrap as a provided basic style. Meanwhile, logic control is realized by using JQuery, and on one hand, a DOM control interface is controlled by using JQuery to display logic; and on the other hand, communication between the front end and the server is realized by using the Ajax packaged by the JQuery. And simultaneously, in order to draw a voltage sag tolerance curve, chart. In order to master the progress of server experiments, real-time bidirectional communication between the front end and the server needs to be realized, and a socket. Js, the server returns the step of the current experiment in real time to the client, and the client updates and displays the progress bar after receiving the step.
And when the tolerance curve is drawn by using Chart.js, the system calculates the time for the corresponding equipment to continuously and normally work under different voltage sag amplitudes according to the acquired data. The time of continuous normal work is taken as a horizontal axis, and the amplitude value is taken as a vertical axis to draw a tolerance curve. When the voltage sag amplitude is higher than the critical amplitude, the device does not fail under the voltage sag amplitude, so a horizontal line is drawn at the critical amplitude, and the range higher than the line represents the range of normal operation. In the test process, when the amplitude is close to the critical amplitude in the process of testing from low to high, one or two error points may appear from high to low, for example, the voltage amplitude fails at 50% of the equipment, but can normally work at 49%, taking ACC as an example, in frequent tests, the test result may be affected due to the heating caused by the coil being energized, for the accuracy of the test result, the point where the error occurs is ignored when the voltage dip point is drawn, and the test result is normally displayed in a report. After one complete test is finished, the continuous working time of the equipment under different voltage sag amplitudes is calculated by using a sliding window algorithm, the maximum working time is found out to be used as a reference value, the continuous working time of the equipment under different voltage sag amplitudes is found out one by one, and finally a voltage sag tolerance curve is generated.
2. Development of server in upper computer
The system is developed based on node.js, which is a JavaScript running environment based on Chrome V8 engine. The JavaScript is operated on a development platform of the server, the running speed of codes written by the JavaScript scripting languages is greatly improved, and the development cost is saved. The control system platform back end development is developed based on node.js operating environment, and the functions of communication with a programmable power supply, control of a singlechip, communication of a data acquisition card and test data processing are realized. The database adopts MongoDB, which is a product between a relational database and a non-relational database, has the most abundant functions in the non-relational database and is most like the relational database.
With the Koa2 framework, the server is built. Realizing routing processing by using an koa-router packet; the data is returned to the front interface using koa-send. And processing the static resource by using koa-static. The front-end interface is rendered using koa-views. The database is accessed using mongoose. Excel is generated by using the node-xlsx control so as to control the derivation of the experimental result. Js is used to return the experimental steps to the front end in real time. And serial port communication is realized by utilizing the serial port, and a control instruction is sent to the single chip microcomputer. And calling a dll dynamic link library by utilizing the ffi to realize a data acquisition function.
Js is constructed on the basis of the node, the language of the server is javascript, and the data acquisition card does not provide a javascript-based acquisition program, so that the C + + acquisition program provided by the data acquisition card is packaged into a dynamic link library DLL, and the node-ffi is used for calling the dynamic link library to realize data acquisition.
2.1 Manual test processing flow
During manual testing, the background splices the parameters into character strings according to corresponding formats according to the parameters transmitted from the front end and a programmable power supply communication protocol, the character strings are transmitted to the programmable power supply by utilizing a TCP/IP protocol, the programmable power supply outputs corresponding voltage quantity according to the set parameters after receiving information, the voltage is applied to testing equipment, meanwhile, the background calls a data acquisition card to acquire data, a data processing algorithm is called to process the data after the testing is finished, the time of continuous normal work of the equipment under the condition of temporary drop is calculated, the data is stored in a database, the data is returned to a browser after the storage is finished, and the processing of the request is finished.
2.2 automatic test handling procedure
The automatic test is similar to the manual test, corresponding test parameters are gradually generated according to the initial amplitude and the reduced step length transmitted by the browser, the corresponding test parameters are spliced into character strings according to a protocol and transmitted to a programmable power supply, then the test is started, the data acquisition card starts to acquire data, the data acquisition card analyzes the data after each step of test is finished, if the equipment fails, if the equipment cannot be automatically restarted, a corresponding instruction is transmitted to the single chip microcomputer through an RS232 serial port, the single chip microcomputer controls the push-pull type electromagnet to restart the equipment after receiving the instruction, and if the equipment can be automatically restarted, the step is not needed. And when the test amplitude is reduced to 0, ending the test, storing the analyzed data into the database, returning the data to the browser after the storage is ended, and ending the processing of the request.
2.3 History record query procedure
After a user clicks and checks a certain test record in a browser, the browser transmits the id corresponding to the test to a server through an Ajax request, the server performs routing processing on the request, the request enters a database query module, the record is queried in a database according to the transmitted id, the experimental result is transmitted back to the browser, and the processing of the request is completed.
2.4 data processing Algorithm
(1) Power sag starting point discrimination
The data collected by the data acquisition card is analyzed by using a sliding window algorithm, for example, a voltage sag waveform output by a programmable power supply shown in fig. 2 is taken as an example, when the voltage sag occurs, a voltage value of the phase is liable to be suddenly changed relative to a voltage value of the same phase of the previous cycle voltage.
(2) Selection of criteria for equipment failure
1) ACC and PLC fault discrimination
The ACC and the PLC do not need manual reset, when voltage sag is recovered, the ACC and the PLC automatically recover to normal work from a fault state, when voltage sag occurs, equipment only has two states of normal work and fault, an ACC contact is closed during normal work, output voltage in a circuit is voltage of a main circuit voltage source, the ACC is disconnected during fault, and the output voltage in the circuit is zero; when the PLC works normally, a normally closed terminal in the PLC is selected, the output of the main circuit is voltage source voltage connected to the main circuit, the terminal is disconnected when a fault occurs, and the output voltage of the main circuit is zero. Therefore, the output voltage of the main circuit is detected as a criterion for judging whether the ACC and the PLC work normally or not, a sliding window algorithm is adopted, the voltage values of the previous cycle and the next cycle are always equal in normal time, the voltage at the same position of the voltage cycle and the previous cycle at the moment when a fault occurs generates a large difference value, and the fault is considered to occur as long as the difference value is larger than a set threshold value.
Referring to fig. 3, point a is the starting time of the power supply voltage sag, point B is the PLC failure time, and the time between the two is automatically analyzed by software, i.e., the duration.
2) Discrimination of ASD equipment fault
According to the analysis of the ASD working principle, the output voltage in the normal working state is high-frequency PWM modulation voltage, for the PWM modulation voltage, the difference value of the front data point and the rear data point of the data collected by the data collection card is very large, because the frequency converter is provided with a large capacitor, the frequency converter can still work for a period of time after the capacitor power supply occurs after the temporary drop, once the capacitor voltage can not provide enough voltage, the frequency converter stops working, because the load carried by the frequency converter is a motor, the motor rotates due to inertia, and finally the rotating speed is stopped to zero, the equipment voltage slowly drops to zero in the process, as shown in figure 4, the difference value of the front data point and the rear data point of the collected voltage is very small. According to the characteristic, the voltage difference value of the front data point and the rear data point of the data acquisition card is judged, when the difference value is smaller than a threshold value, the equipment is considered to be in a fault state, and when the difference value is larger than the threshold value, the equipment is in a normal working state. In order to prevent the situation that misjudgment may occur, a window width is added, namely, when the difference is smaller than the threshold value, data of the window width is continuously judged, if the criterion is met in the window width, the fault is considered, and as long as the criterion is not met once, the fault point which is considered before is not the true fault point, and the search for a new fault point is restarted. Once the fault point of the equipment is found, the time difference between the voltage sag starting point and the voltage sag starting point is the time for the frequency converter to work continuously.
As shown in fig. 4, point a is the starting point of the power supply voltage sag, it can be seen that after the voltage sag, the inverter is still performing PWM modulation, and after a period of time, the inverter stops PWM modulation when reaching point B, and the motor is still rotating due to inertia, that is, point B is considered as the failure point of the inverter. The time between A and B is automatically calculated by software, namely the duration.
3. Automatic reset device design
The automatic reset device consists of three parts of 5,6 and 7. In the typical sensitive equipment voltage sag tolerance intelligent analyzer, an instruction sent by an upper computer is transmitted to a single chip microcomputer module through a standard RS232 communication port. After receiving the corresponding instruction, the single chip controls the on-off of the corresponding relay so as to control the action of the push-pull type electromagnet, and the electromagnet completes the 'clicking' operation on the equipment reset button to realize the reset operation on the sensitive equipment. For the equipment needing power failure before resetting, the power supply loop can be controlled by the relay.
The control core of the control panel is formed by an 8051 single chip microcomputer of STC15W4K32S4 series, the programming language is C language, and the software and hardware cost is extremely low. And a standard RS232 interface on the control panel is used for communicating with an upper computer on one hand and burning a singlechip program on the other hand. The power supply voltage of the control panel is DC 24V which is commonly used in engineering, and the control panel and the relay are isolated by an optical coupler, so that the anti-interference capability is enhanced. The push-pull electromagnet mainly comprises a magnetic core and an electromagnetic ring, and the magnetic core is driven to complete the actions of pushing and pulling through the power on and off of the electromagnetic ring. The push-pull speed is high, and the 'click' operation during manual reset can be simulated. The reset device does not use complex hardware equipment, the control panel core is also composed of a single chip microcomputer, the cost of software and hardware is very low, and the reset device is suitable for engineering application.
Claims (2)
1. The intelligent analyzer is characterized by comprising an upper computer, a programmable power supply, tested equipment, a data acquisition card, a single chip microcomputer, a relay and a push-pull electromagnet, wherein the upper computer is connected with the programmable power supply through an LAN (local area network) port, the output end of the programmable power supply is connected to the tested equipment, the upper computer is connected with the single chip microcomputer through an RS232 interface, the single chip microcomputer is connected with the relay, the relay is connected with the push-pull electromagnet, the contact of the push-pull electromagnet is aligned with a reset switch of the tested equipment, click operation is simulated according to an instruction of the single chip microcomputer, and the tested equipment is started.
2. The intelligent analyzer of voltage sag tolerance of typical sensitive devices according to claim 1, wherein the voltage probe is connected to the programmable power output side and the output end of the test device respectively, the voltage probe is connected to the data acquisition card after measuring the voltage, the device voltage is connected to the second interface of the analog input of the data acquisition card, the phases a and C of the power voltage are connected to the first and third interfaces of the analog input of the data acquisition card respectively, and the data acquisition card is connected to the upper computer and directly uploads the acquired data to the upper computer.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113866575A (en) * | 2021-09-28 | 2021-12-31 | 广东电网有限责任公司 | Voltage sag tolerance testing system and method for low-voltage release |
| CN114095555A (en) * | 2021-12-08 | 2022-02-25 | 金蝶医疗软件科技有限公司 | Information acquisition method and related equipment |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN86206091U (en) * | 1986-08-18 | 1987-07-29 | 刘钢 | Miniaturized ancillary circuit |
| US5886429A (en) * | 1997-12-11 | 1999-03-23 | Board Of Regents, The University Of Texas System | Voltage sag/swell testing station |
| CN110689272A (en) * | 2019-10-09 | 2020-01-14 | 华北电力大学 | Sensitive equipment tolerance characteristic real-time online evaluation method based on stream computing |
| CN111077420A (en) * | 2019-12-27 | 2020-04-28 | 广东电网有限责任公司电力科学研究院 | System and method for automatically testing voltage sag tolerance capability of sensitive equipment |
-
2020
- 2020-07-21 CN CN202010706146.3A patent/CN111856184A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN86206091U (en) * | 1986-08-18 | 1987-07-29 | 刘钢 | Miniaturized ancillary circuit |
| US5886429A (en) * | 1997-12-11 | 1999-03-23 | Board Of Regents, The University Of Texas System | Voltage sag/swell testing station |
| CN110689272A (en) * | 2019-10-09 | 2020-01-14 | 华北电力大学 | Sensitive equipment tolerance characteristic real-time online evaluation method based on stream computing |
| CN111077420A (en) * | 2019-12-27 | 2020-04-28 | 广东电网有限责任公司电力科学研究院 | System and method for automatically testing voltage sag tolerance capability of sensitive equipment |
Non-Patent Citations (1)
| Title |
|---|
| 沈刚: "电动工具开关寿命测试装置执行部分研制", 《科技与创新》 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113866575A (en) * | 2021-09-28 | 2021-12-31 | 广东电网有限责任公司 | Voltage sag tolerance testing system and method for low-voltage release |
| CN114095555A (en) * | 2021-12-08 | 2022-02-25 | 金蝶医疗软件科技有限公司 | Information acquisition method and related equipment |
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Application publication date: 20201030 |