CN1279599C - Defect detecting parametric analysis method - Google Patents
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Abstract
The present invention discloses a defect detecting parametric analysis method which is used for analyzing batches of products with the same batch number. Products of each batch are produced by a plurality of machine tables, at least one wafer in products of each batch is detected by at least one defect detecting item to generate a defect detecting parameter value, and the defect detecting item and the parameter value thereof as well as a process station relative to the defect detecting item are stored in a database. The method comprises the following steps: searching a database to obtain defect detecting parameter values of batches of products; dividing the batches of products into at least one qualified product group and one unqualified product group according to the defect detecting parameter values; searching process stations relative to defect detecting items in the database; searching machine tables which are passed by the process stations of the qualified product group; searching machine tables which are passed by the process stations of the unqualified product group; judging machine tables whose passing probability of the unqualified product group is higher than that of the qualified product group.
Description
Technical field
The present invention relates to a kind of process parameter analytical method, relate in particular to a kind of analytical method of defects detection parameter.
Background technology
In semiconductor fabrication, finish a semiconductor product, to pass through many processing procedures, for example micro-photographing process, etch process, ion implantation manufacture process etc. usually; That is to say in semiconductor fabrication to be applied to a large amount of boards, and many red tapes.Therefore, be familiar with this operator and be devoted to all to guarantee that the board running is normal, keep or improve the product yield, operations such as problem points and board maintenance are confirmed in detecting, can conform with customer demand in the hope of speed of production and the quality that makes semiconductor product.
Generally speaking, inquire into the problem of manufacture of semiconductor, can comprise attribute test on process parameter data, the line (In-line QC) data, defects detection (defect inspection) data, sample test (sample test) data, wafer sort (wafer test) data and encapsulation back test (final test) data from following several item numbers according to setting about analyzing.Wherein, fault detection data is not carry out the detection of defective at each layer of wafer (wafer), accelerate (adder count) or defective categorical measure (class count) as defective total quantity (total count), defective, resulting test value, it is represented with defect map usually.
In the prior art, as shown in Figure 1, at first carry out step 101, know the operator can carry out the test of every defects detection project at each wafer this moment, as the defects count detection of inner metal dielectric layer (inter-metal dielectric layer) etc.
Then, in step 102, know the result that the operator can observe every defects detection project of each wafer, so that find out defects detection result product devious.As shown in Figure 2, in a wafer, can cut into a plurality of lattices (die) 21,, represent the position of other defective 22 of certain one deck of this wafer, promptly represent the distribution map of defective as shown in Figure 2 comprising a plurality of stains are arranged.
At last, in step 104, know processing procedure station that the operator checks that step 103 judges each board in not, so that find out unusual board.For example, know the operator and can detect substandardly, judge that the deposition manufacture process station that problematic processing procedure station Wei inner metal dielectric layer is other, and check out unusual board, as deposition machine, etching machine etc. according to the defective total quantity of inner metal dielectric layer.
Yet, because prior art is to utilize artificial experience to judge to decide analysis result (step 103), so the result's that ultimate analysis is come out accuracy and confidence level will remain to be discussed; Adding the semiconductor manufacturing industry personage changes frequently, experience before and after causing between the phase engineer is not easy succession, and each engineer is limited in one's ability, can't take into account the mode of operation of all boards of plant area, so when the defects detection result of semiconductor product takes place when unusual, the engineer may not be certain to have enough experiences fast and to judge rightly out be which link goes wrong, thereby may must expend many times and carry out correlative study, even might do the judgement that makes mistake, so, not only reduce the efficient of processing procedure, increase production cost, also can't in time improve the production situation to improve yield.
Therefore, how to provide a kind of and can take place in the fault detection data of semiconductor product when unusual, fast and to judge rightly out be the analytical method which link goes wrong, one of important topic of current semiconductor fabrication just.
Summary of the invention
In order to overcome the above-mentioned deficiency of prior art, the object of the present invention is to provide a kind of can the generation in the fault detection data of semiconductor product when unusual, fast and to judge rightly out be the defects detection parameters analysis method which link goes wrong.
Another object of the present invention is to provide a kind of defects detection parameters analysis method that can come the ratio of closing down (kill ratio) of corrective pitting detection according to the result of defects detection and wafer sort.
Feature of the present invention is to cooperate a database that records every defects detection project and relative process work bench, and utilizes intercommunity to analyze gimmick and carry out the analysis of defects detection parameter.
For achieving the above object, defects detection parameters analysis method according to the present invention is in order to analyze the many batches of products that have a lot number respectively, every batch of product is obtained through a plurality of boards, and each wafer in the every batch of product is at least through the detection of a defects detection project, to produce a defects detection parameter value, this defects detection project and parameter value thereof and the processing procedure station that the defects detection project is relevant therewith are not stored in the database, and this method comprises following several steps: search database to obtain the defects detection parameter value of many batches of products; Is a qualified products group and a substandard product group according to the defects detection parameter value with many batches of product differentiations; It is other to search the processing procedure station relevant with the defects detection project from database; Search the board of qualified products group other process at the processing procedure station; Search the board of substandard product group other process at the processing procedure station; And judge that the substandard product group is higher than the board of qualified products group through probability through probability.
In addition, each wafer in the every batch of product is also through the detection of a wafer sort project relevant with the defects detection project, to produce a wafer test parameters value, and more store this wafer sort project and wafer test parameters value in the database, and according to defects detection parameters analysis method of the present invention, also utilize folded figure mode to compare wafer test parameters value distribution map and defect map, so that find out the ratio of closing down (kill ratio) of preferable defects detection.
From the above, because defects detection parameters analysis method according to the present invention is to cooperate to record the database of every defects detection project and relative process work bench and utilize intercommunity analysis gimmick to come the analyzing defect detected parameters, so can take place in the fault detection data of semiconductor product when unusual, fast and to judge rightly out be which link goes wrong, and find out unusual board, the ratio of closing down (kill ratio) that can also come corrective pitting to detect in addition according to the result of defects detection and wafer sort, the mistake that therefore can reduce artificial judgement effectively improves the efficient of processing procedure, reduce production cost, and in time improve the online production situation to improve yield.
Description of drawings
Fig. 1 shows the flow chart of existing defects detection parameters analysis method;
Fig. 2 shows the defects detection parameter value distribution map of wafer;
Fig. 3 shows the flow chart according to the defects detection parameters analysis method of preferred embodiment of the present invention;
Fig. 4 shows the flow chart according to the defects detection parameters analysis method of another preferred embodiment of the present invention; And
Fig. 5 shows the wafer test parameters value distribution map of wafer.
Symbol description among the figure
The flow process of 101～104 existing defects detection parameters analysis methods
21 lattices
22 defectives
23 defect lattices
The flow process of the defects detection parameters analysis method of 301～311 preferred embodiments of the present invention
The flow process of the defects detection parameters analysis method of 401～411 another preferred embodiments of the present invention
51 lattices that overstep the bounds
52 qualified lattices
Embodiment
Following conjunction with figs. illustrates the defects detection parameters analysis method of the preferred embodiment according to the present invention, and wherein identical assembly is with identical symbolic representation.
As shown in Figure 3, show the flow chart of the defects detection parameters analysis method of preferred embodiment of the present invention among the figure, take place when unusual, fast and to judge rightly out be which board is out of joint in order to fault detection data at semiconductor product.
At first, step 301 is searched a database, to obtain the defects detection parameter value of many batches of products.Wherein, each batch (lot) product has a lot number (lot number), and every batch of product includes 25 wafer, and a plurality of boards of every batch of product process multiple tracks processing procedure, a slice in the every batch of product or above wafer are at least through the detection of a defects detection project, to produce a defects detection parameter value.In the present embodiment, the defects detection result can be divided into defective total quantity (total count), defective is accelerated (adder count) or defective categorical measure (class count); And the defects detection parameter value can be represented by a defect map, and the defect map of accelerating with defective is an example, and as shown in Figure 2, a plurality of stains that wherein are distributed in a plurality of lattices 21 of wafer are represented a defective 22 respectively.It is noted that a wafer may all not have defective at different layers, then this moment, one wafer can have defect map more than one.
Then, step 302 shows the defects detection result of each batch product with chart.In the present embodiment, this step utilizes block diagram (histogram) to represent the defects detection parameter value of every batch of product, accelerate or the defective categorical measure as defective total quantity, defective, so the engineer can observe this block diagram and understands the distribution results of defects detection parameter value.
In step 303, be divided into a qualified products group and a substandard product group at many batches of obtained products of step 301, the standard of its differentiation is the default specification that whether conforms with each defects detection parameter value.In the present embodiment, this step is set at A group (qualified products group) product with the several batches of products of defects detection parameter value in default specification limit, for example comprises lot number 1,2,3,4, reaches 5 (shown in steps 304); And with the defects detection parameter value not several batches of products in default specification limit be set at B group (substandard product group) product, for example comprise lot number 6,7,8,9, and 10 (shown in steps 305).
Then, it is other that step 306 is searched the processing procedure station not relevant with the defects detection item target zone of being analyzed from an experience cumulative data storehouse; For example, if the defects detection item target zone analyzed is not inner metal dielectric layer, then relative processing procedure station not may for the deposition manufacture process station of the dielectric layer after the first road metal level not, the micro-photographing process station is other or the etch process station is other.The experience of being accumulated when in the present embodiment, this experience cumulative data storehouse includes senior engineer according to its passing tracking problem; In addition, the data that computer system the method according to this invention is derived also can be stored in this database.
When step 306 from database, search the processing procedure station not relevant with the defects detection item target zone of being analyzed not after, step 307 shows that the project that should follow the trail of is that a certain processing procedure station is other through after the search of step 306.
Then, in step 308, search earlier tracked processing procedure station and do not comprise which board, E1 for example, E2, E3 ...Then, step 309 is calculated the probability of B set product through these other these boards of processing procedure station.In addition, step 310 is calculated the probability of A set product through these other these boards of processing procedure station.At last, in step 311, utilize intercommunity to analyze gimmick, find out the B set product and be higher than the board of A set product through probability through probability.These B set products of being tried to achieve by step 311 are through the high board of probability, exactly the possible problematic board that is analyzed according to the defects detection parameters analysis method of preferred embodiment of the present invention.
In addition, as shown in Figure 4, the flow chart of another preferred embodiment according to the present invention, this enforcement power provides a kind of method of utilizing defect distribution situation and wafer sort result to come corrective pitting quantity control standard.In the present embodiment, each wafer in the every batch of product is also through the detection of a wafer sort project, to produce a wafer test parameters value, this database also stores the correlation of wafer sort project and parameter value and defects detection project and wafer sort project.
At first, step 401 is searched database to obtain the defects detection parameter value of many batches of products.As previously mentioned, each batch product has a lot number, and every batch of product includes 25 wafer, and a slice in the every batch of product or above wafer be through the defects detection project, and every wafer can be through the detection of wafer sort project to produce defects detection parameter value and wafer test parameters value.In the present embodiment, the defects detection parameter value can be by a defect map represented (as shown in Figure 2), and a plurality of stains that wherein are distributed in a plurality of lattices 21 of wafer are just represented a defective 22 respectively, and the lattice with stain is exactly a defect lattice 23.It is noted that a wafer may all not have defective at different layers, then this moment, one wafer can have defect map more than one.
Then, in step 402, judge whether the defects detection parameter value through every batch of obtained product of step 401 surpasses default specification.Generally speaking, the default specification of defects detection parameter value can be a certain limit, this step judges whether the defects detection parameter value of every batch of obtained product surpasses the upper limit (UCL) of default specification, in addition, the defects detection project of this step institute analysis and judgement can be the defective total quantity, defective is accelerated or the defective categorical measure.In the present embodiment, step 402 is searched at every wafer of every batch of product, if comprise the wafer that the above defective of a slice surpasses default specification in a collection of product, then then carry out step 403, to choose the batch number with defective, if not, then stops to analyze.Then, in step 404, find out the defect map of wafer with defective.
Then, whether store the wafer test parameters value of this batch product of the obtained lot number of step 403 in the step 405 judgment data storehouse.In this enforcement, the wafer test parameters value can be represented by a wafer test parameters value distribution map, as shown in Figure 5, in a wafer, can cut into a plurality of lattices, comprising a plurality of lattice 51 (with black display) and a plurality of qualified lattices 52 (showing with white) of overstepping the bounds are arranged.At this moment, if in the step 405 judgment data storehouse when storing the wafer test parameters value, then then carry out the wafer test parameters value distribution map of step 406 with each wafer of obtaining this batch product; If not, then stop to analyze.It is noted that analyzing the wafer test parameters value of searching in step 405,406 is the wafer sort project relevant with the defects detection project, for example functional test (function test) project or power supply supply of current test (IDDQ test) project.
Then, in step 407, the defect map of utilizing the mode of folded figure to contrast to find out by step 404 with by the obtained wafer test parameters value distribution map of step 406, obtaining the overlapping lattice number of two distribution maps, so that calculate the ratio of overlapping lattice number and the quantity of the lattice that oversteps the bounds; In this step, overlapping lattice number is these defect lattices and the overlapping quantity of these lattices that overstep the bounds.Then, judge that in step 408 ratio whether more than or equal to a default value, for example is 50%, if not, then skip over this layer not, when not all slightly out-of-date the stopping of all layers analyzed; If then carry out step 409.
In step 409, will choose through data such as the batch number after the above-mentioned steps analysis, the other data of layer and defective numbers.In the present embodiment, this step is not denoted as a defect layer with the layer of being analyzed earlier, searches then and includes this batch product and the lot number thereof of the wafer that has this defect layer at least, so that choose data such as its batch number, the other data of layer and defective number.
In addition, step 410 can be carried out statistical analysis, obtains a typical value and is used as other number of defects purpose of this layer and closes down ratio (kill ratio).Simultaneously, in step 411, close down ratio (kill ratio) according to this number of defects purpose, the defects detection parameters analysis method of preferred embodiment can be predicted the yield of this product in this other product of layer of follow-up making according to the present invention.
In sum, owing to cooperate the database that records every defects detection project and relative process work bench according to defects detection parameters analysis method of the present invention, and utilize intercommunity to analyze gimmick and come the analyzing defect detected parameters, so can take place in the fault detection data of semiconductor product when unusual, fast and to judge rightly out be which link goes wrong, and find out unusual board, the ratio of closing down (kill ratio) that can also come corrective pitting to detect in addition according to the result of defects detection and wafer sort, the mistake that therefore can reduce artificial judgement effectively improves the efficient of processing procedure, reduce production cost, and in time improve online production to improve yield.
The above only is for example, and non-limiting.Anyly do not break away from spirit of the present invention and category, and, all should be contained in claims of the present invention its equivalent modifications of carrying out or change.
Claims (10)
1, a kind of defects detection parameters analysis method, in order to analyze the many batches of products that have a lot number respectively, these many batches of products are obtained through a plurality of boards, and a slice in the every batch of product or above wafer at least through the detection of a defects detection project to produce a defects detection parameter value, this defects detection project and a processing procedure station relevant with this defects detection project are not stored in the database, this database also stores this defects detection parameter value, it is characterized in that this method comprises:
Search this database to obtain the defects detection parameter value of these many batches of products;
According to this defects detection parameter value should many batches of product differentiations be a qualified products group and a substandard product group;
It is other to search this processing procedure station relevant with this defects detection project from this database;
Search the board of this qualified products group other process at this processing procedure station;
Search the board of this substandard product group other process at this processing procedure station; And
Judge that this substandard product group is higher than the board of this qualified products group through probability through probability.
2, defects detection parameters analysis method as claimed in claim 1 is characterized in that, utilizes intercommunity to analyze gimmick and judges that this substandard product group is higher than the board of this qualified products group through probability through probability.
3, defects detection parameters analysis method as claimed in claim 1 is characterized in that, this defects detection parameter value be a defective total quantity, defective accelerate and defective categorical measure one of them.
4, defects detection parameters analysis method as claimed in claim 3 is characterized in that, more comprises:
Utilize this defects detection parameter value of these many batches of products of histogram graph representation.
5, defects detection parameters analysis method as claimed in claim 1, it is characterized in that, each wafer in the every batch of product also through the detection of a wafer sort project relevant with this defects detection project to produce a wafer test parameters value, this database also stores this wafer sort project and this wafer test parameters value, and this defects detection parameters analysis method more comprises:
Whether the defects detection parameter value of judging these many batches of products is greater than one first standard value;
When the defects detection parameter value of judging these many batches of products greater than this first standard value, obtain the lot number of product with defective;
In this batch product, obtain on each wafer at defective place a plurality of layers not, wherein each layer do not have a defect map respectively, this defect map has a plurality of defect lattices;
Search has the wafer test parameters value distribution map of each wafer of this batch product of defective, and this wafer test parameters value distribution map has a plurality of lattices that overstep the bounds;
Other defect map of each layer and this wafer test parameters value distribution map are folded the figure action, and to obtain an overlapping lattice number, this overlapping lattice number is these defect lattices and the overlapping quantity of these lattices that overstep the bounds;
Calculate the ratio of the quantity of this overlapping lattice number and this lattice that oversteps the bounds;
Judge that whether this ratio is more than or equal to one second standard value;
When judging this ratio less than this second standard value, it is other to skip over this layer;
When judging this ratio, should not be denoted as a defect layer by layer more than or equal to this second standard value; And
Search includes this batch product and the lot number thereof of the wafer that has this defect layer at least.
6, defects detection parameters analysis method as claimed in claim 5 is characterized in that, more comprises:
Defective number according to this defect layer produces the 3rd standard value that a defective as this defect layer is closed down ratio in the statistical analysis mode.
7, defects detection parameters analysis method as claimed in claim 6 is characterized in that, more comprises:
According to the 3rd standard value, prediction proceeds to the yield of this batch product of this defect layer in successive process.
8, defects detection parameters analysis method as claimed in claim 5 is characterized in that, more comprises:
Judge and whether store this wafer test parameters value in this database;
When in judging this database, not storing this wafer test parameters value, stop seek actions; And
When in judging this database, storing this wafer test parameters value, obtain the wafer test parameters value distribution map of each wafer of this batch product with defective.
9, defects detection parameters analysis method as claimed in claim 5 is characterized in that, this wafer sort project is the functional test project.
10, defects detection parameters analysis method as claimed in claim 5 is characterized in that, this wafer sort project is a power supply supply of current test event.
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| CN 03102093 CN1279599C (en) | 2003-01-29 | 2003-01-29 | Defect detecting parametric analysis method |
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| CN 03102093 CN1279599C (en) | 2003-01-29 | 2003-01-29 | Defect detecting parametric analysis method |
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Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9037280B2 (en) * | 2005-06-06 | 2015-05-19 | Kla-Tencor Technologies Corp. | Computer-implemented methods for performing one or more defect-related functions |
| CN102446337A (en) * | 2011-10-12 | 2012-05-09 | 上海华力微电子有限公司 | Defect reporting system |
| CN102663098A (en) * | 2012-04-13 | 2012-09-12 | 保定天威英利新能源有限公司 | Method and system for processing defective photovoltaic modules |
| CN103823408B (en) * | 2012-11-16 | 2016-12-21 | 无锡华润上华科技有限公司 | Semiconductor equipment board quality control method and system |
| CN104465434B (en) * | 2013-09-23 | 2017-07-11 | 中芯国际集成电路制造(上海)有限公司 | Defect analysis method |
| CN111091523B (en) * | 2018-10-08 | 2023-04-18 | 台湾福雷电子股份有限公司 | Computing device and method for substrate defect analysis |
| CN109767996A (en) * | 2018-12-29 | 2019-05-17 | 上海华力微电子有限公司 | Wafer defect analysis system and analysis method |
| CN110441501B (en) * | 2019-06-27 | 2023-03-21 | 北海惠科光电技术有限公司 | Detection method and detection system |
| CN110907135A (en) * | 2019-11-14 | 2020-03-24 | 深圳市华星光电半导体显示技术有限公司 | Control method and device of manufacturing equipment |
| CN113804244B (en) * | 2020-06-17 | 2024-06-25 | 富联精密电子(天津)有限公司 | Defect analysis method and device, electronic device and computer readable storage medium |
| CN114169286A (en) * | 2020-09-11 | 2022-03-11 | 长鑫存储技术有限公司 | Wafer defect tracing method and device, electronic equipment and computer readable medium |
| US11927544B2 (en) | 2020-09-11 | 2024-03-12 | Changxin Memory Technologies, Inc. | Wafer defect tracing method and apparatus, electronic device and computer readable medium |
| CN114192440B (en) * | 2020-09-18 | 2024-05-03 | 中国科学院微电子研究所 | Device and method for detecting unqualified wafers and wafer manufacturing equipment |
| CN112163799B (en) * | 2020-12-02 | 2021-03-02 | 晶芯成(北京)科技有限公司 | Yield analysis method and yield analysis system of semiconductor product |
| CN113049935A (en) * | 2021-03-04 | 2021-06-29 | 长鑫存储技术有限公司 | Semiconductor intelligent detection system, intelligent detection method and storage medium |
| CN116244658B (en) * | 2023-05-06 | 2023-08-29 | 粤芯半导体技术股份有限公司 | Abnormality detection method and device for semiconductor machine, electronic equipment and storage medium |
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