CN1273839C - Automated test system - Google Patents
Automated test system Download PDFInfo
- Publication number
- CN1273839C CN1273839C CN 03100751 CN03100751A CN1273839C CN 1273839 C CN1273839 C CN 1273839C CN 03100751 CN03100751 CN 03100751 CN 03100751 A CN03100751 A CN 03100751A CN 1273839 C CN1273839 C CN 1273839C
- Authority
- CN
- China
- Prior art keywords
- test
- mentioned
- order
- microprocessor
- auto
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Tests Of Electronic Circuits (AREA)
- Emergency Protection Circuit Devices (AREA)
Abstract
The present invention relates to an automatic test system which comprises a sampling converting device and a microprocessor, wherein the sampling converting device can be used for picking up a plurality of electrical property parameters of a device to be tested, and can be used for converting the electrical property parameters to a plurality of digital signals. The microprocessor can be used for receiving the digital signals so as to complete a plurality of different short circuit protection tests, a plurality of different overcurrent protection tests, and a plurality of different overvoltage protection tests according to specific sequence.
Description
Technical field
The invention relates to a kind of test macro, particularly propose a kind of test macro that can finish the automatic test power supply unit.
Background technology
In existing test process; when testing a power supply unit; after power supply unit that will be earlier that this is to be measured and testing power supply line connect; input AC again; and judge that with visual method output voltage is to judge test result; the output voltage of every group of power supply unit to be measured all will be checked over-voltage protection function; excess current protective function and short-circuit protection function; because of its method of testing is the manual testing; so button is tested one by one when doing a certain test; and observe all output voltages of power supply unit to be measured simultaneously; to judge test result; and when carrying out each test; need restart this power supply unit to be measured, circulate so repeatedly and test, finish up to all test event tests by some button.The mode of this kind manually to test has certain false failure rate to exist, thereby influenced test accuracy, and use the required test duration of this test mode also longer, and method of testing is also more loaded down with trivial details, needs circulation repeatedly by some button.
Summary of the invention
In view of this, fundamental purpose of the present invention is to propose a kind of test macro, it uses the mode of robotization to finish the test of power supply unit, with few false failure rate of going out, and then raising testing precision, and, therefore can go out few test duration, and then enhance productivity because of it does not need loaded down with trivial details button work.
The invention provides a kind of Auto-Test System, it comprises: sampling conversion device, microprocessor, programmable input media control circuit, parsing driving circuit and programmable control circuit of display device.Sampling conversion device converts complex digital signal in order to the plural electrical parameter that captures device to be measured and with above-mentioned electrical parameter, it comprises sampler and digital analog converter, sampler is in order to capture the plural electrical parameter of device to be measured, and digital analog converter is in order to convert the electrical parameter that this sampler captured to complex digital signal.Microprocessor is in order to receive above-mentioned digital signal to finish different overcurrent protection test of plural number different short-circuit protection test, plural number and the different overvoltage protection test of plural number respectively.Programmable input media control circuit receives the different controlling signal of plural number by input media, and each controlling signal changes this device to be measured via this microprocessor, so that this sampling conversion device captures different electrical parameters.Resolve driving circuit and become the cognizable signal of this device to be measured to change above-mentioned controlling signal in order to resolve above-mentioned controlling signal, to change the electrical parameter of this device output to be measured, it comprises decoding scheme and driving circuit, decoding scheme becomes the cognizable signal of this device to be measured in order to resolve above-mentioned controlling signal to change above-mentioned controlling signal, driving circuit is in order to amplify the controlling signal after this decoding scheme is resolved, to change the electrical parameter of this device output to be measured.The programmable control circuit of display device is coupled to this microprocessor and is shown in the display device with the test result with above-mentioned short-circuit protection test, overcurrent protection test and overvoltage protection test.Wherein this microprocessor is finished above-mentioned short-circuit protection test, the test of above-mentioned overcurrent protection and the test of above-mentioned overvoltage protection according to particular order.
In addition; this microprocessor comprises that at least one can eliminate programmable read-only memory (ErasableProgrammable Read-Only Memory; EPROM), in order to store a program to finish above-mentioned short-circuit protection test, overcurrent protection test and overvoltage protection test.
Description of drawings
Fig. 1 represents the system architecture diagram of the test macro of the embodiment of the invention;
Fig. 2 represents the calcspar of the microprocessor of the embodiment of the invention;
Fig. 3 represents the calcspar of the digital analog converter of the embodiment of the invention;
Fig. 4 represents the programmable input media control circuit of the embodiment of the invention and the calcspar of programmable control circuit of display device;
Fig. 5 represents the circuit diagram of the driving circuit of the embodiment of the invention;
Fig. 6 represents the process flow diagram of the test system and test device to be measured of the embodiment of the invention.
The figure number explanation:
The 100-Auto-Test System; The 101-sampling conversion device;
The 102-sampler; The 104-digital analog converter;
The 106-microprocessor;
108-programmable control circuit of display device;
110-programmable input media control circuit;
111-resolves driving circuit; The 112-driving circuit;
The 114-decoding scheme; The 107-microcontroller;
The 200-power supply unit;
The programmable read-only memory eliminated of 210-4k character;
212-128 character random access memory;
214-32 root I/O line;
216-2 16 bit timer/counters;
The 218-interrupt system;
The outer interrupt structure of 220-; 222-full duplex serial port;
The 224-clock circuit; The 226-central processing unit;
310-8 channel multi-way switch; The 312-comparer;
The 314-switching network; The 316-steering logic;
The 318-8 position is approached digital register one by one;
The ternary output latch in 320-8 position;
The 410-keyboard; The 420-display;
The SL0-SL4-sweep signal; The RL0-RL7-signal wire;
The 0-9-numerical key; The ST-initiating key;
TN-change channel key+/--collateral key;
OK-determines key; The ESC-cancel key;
The 502-photo-coupler; R1, R2-resistor;
D1, D2-diode; The Q1-transistor;
The 504-relay; The S1-switch.
Embodiment
Fig. 1 represents the system architecture diagram of the test macro of the embodiment of the invention.As shown in the figure, Auto-Test System 100 comprises: sampling conversion device 101, microprocessor 106, programmable input media control circuit 110, parsing driving circuit 111 and programmable control circuit of display device 108.Sampling conversion device 101 in order to capture device to be measured at this for electrical parameters such as the complex number voltage of power supply unit 200 or current values, and convert above-mentioned electrical parameter to complex digital signal, sampling conversion device 101 comprises sampler 102 and digital analog converter 104, sampler 102 is in order to the electrical parameter of acquisition power supply unit 200, and digital analog converter 104 converts complex digital signal in order to the electrical parameter that sampler 102 is captured.Microprocessor 106 is in order to receive above-mentioned digital signal to carry out the different short-circuit protection test (Short) of plural number, different overcurrent protection test (Over CurrentProtect) and different overvoltage protection (the Over Voltage Protect) tests of plural number of plural number.Programmable input media control circuit 110 receives the different controlling signal of plural number by input medias such as keyboard (with reference to figure 4), each controlling signal changes the electrical parameter that power supply unit 200 is exported via microprocessor 106, so that sampling conversion device 102 captures different electrical parameters.Resolve driving circuit 111 and become power supply unit 200 cognizable signals to change above-mentioned controlling signal in order to resolve above-mentioned controlling signal, to change the electrical parameter of power supply unit 200 outputs, resolve driving circuit 111 and comprise decoding scheme 112 and driving circuit 114, decoding scheme 112 becomes device 200 cognizable signals to be measured in order to resolve above-mentioned controlling signal to change above-mentioned controlling signal, driving circuit 114 is in order to amplify the controlling signal after decoding scheme 112 is resolved, to change the electrical parameter of power supply unit 200 outputs, because the weak output signal that microprocessor 106 is sent, when therefore it joins with power supply unit 200, need through this driving circuit 114.Programmable control circuit of display device 108 is coupled to microprocessor 106 and is shown in the display device (with reference to figure 4) with the test result with above-mentioned short-circuit protection test, overcurrent protection test and overvoltage protection test.Microprocessor 106 is finished above-mentioned short-circuit protection test, the test of above-mentioned overcurrent protection and the test of above-mentioned overvoltage protection according to particular order; microprocessor 106 is that example describes according to the particular order of short-circuit protection test, overcurrent protection test and overvoltage protection test in this embodiment; be that microprocessor 106 is after finishing above-mentioned short-circuit protection test; begin above-mentioned overcurrent protection test again; and after finishing above-mentioned overcurrent protection test, begin above-mentioned overvoltage protection test again.
In addition; test macro of the present invention can comprise the removable formula programmble read only memory PROM of electronics (Electrically-Erasable Programmable Read-Only Memory; E2PROM) (be not presented among Fig. 2); test to finish above-mentioned short-circuit protection for microprocessor 106 accesses in order to store a program; overcurrent protection test and overvoltage protection test; the tester can be according to the content measurement of different devices to be measured, write be stored in the program in the removable formula programmble read only memory PROM of electronics content to control the test event of each different device to be measured.
In addition, programmable control circuit of display device 108 and programmable input media control circuit 110 may be implemented in same device or utilize microcontroller (for example IC8279) 107 to implement, with reference to the detailed description of figure 4.
Fig. 2 represents the calcspar of the microprocessor of the embodiment of the invention.Microprocessor 106 in embodiments of the present invention can be eliminated programmable read-only memory (Erasable ProgrammableRead-Only Memory for a kind of comprising at least; EPROM) known microprocessor; this can eliminate programmable read-only memory in order to store a program to finish above-mentioned short-circuit protection test; overcurrent protection test and overvoltage protection test; the tester can be according to the content measurement of different devices to be measured; write be stored in can eliminate the program in the programmable read-only memory content to control the test event of each different device to be measured; microprocessor 106 in the present embodiment is an example with the AT89C51 chip of the MCS-51 series that Inte1 company is produced; it has the programmable read-only memory eliminated 210 of 4k character; 128 character random access memory 212; 32 I/O lines 214; 2 16 bit timing device/counters 216; interrupt system 218; outer interrupt structure 220; full duplex serial port 222; clock circuit 224 and central processing unit 226; it does not have static logic; therefore can work being low to moderate under the condition of zero frequency, the detailed action specification of this inner structure please refer to the product description of the AT89C51 chip of the MCS-51 series that Intel Company produces.
Fig. 3 represents the calcspar of the digital analog converter of the embodiment of the invention.As shown in the figure, digital analog converter 104 in the present embodiment is that example describes with the ADC0809 chip that approaches comparison type converter one by one, digital analog converter 104 converts digital signal in order to the electrical parameter (simulating signal) with input, it utilizes 8 channel multi-way switchs 310 to receive the simulating signal of input, each channel can convert 8 bit digital to and will change after digital signal send into section ripple comparer 312 of high impedance, comparer 312 receives the signal of tree-shaped switching network 314 outputs of being made up of 256 resitstance voltage dividers simultaneously, comparer 312 is sent into 8 with the signal of output after via steering logic 316 and is approached one by one in the digital register 318,8 signals that approach digital register 318 output one by one can be feedback back the signal that 314,8 of tree-shaped switching networks approach digital register 318 outputs one by one and be exported via 8 ternary output latches 320 backs.
Digital analog converter 104 in this embodiment is an example with the ADC0809 chip that approaches comparison type converter one by one, but the present invention is not limited to the digital analog converter of this type.
Fig. 4 represents the calcspar of programmable input media control circuit, programmable control circuit of display device and the external connection keyboard of the embodiment of the invention.Programmable control circuit of display device 108 and programmable input media control circuit 110 utilize this microcontroller 107 of IC8279 to implement, microcontroller 107 itself can provide sweep signal SL0-SL4, therefore can replace microprocessor 106 to finish the control of input media and display device, as display device, microprocessor 106 is by sweep signal SL0 and SL1 supervisory keyboard 410 as input media and 5 displays 420 for microcontroller 107 external 2 * 8 keyboards 410.Keyboard 410 comprises that 9 numerical keys (0-9), 1 initiating key (ST), 1 change channel key (TN), 2 collateral keies (+/-), 1 definite key (OK) and 1 cancel key (ESC), the push button signalling of user's input is sent into microprocessor 106 via signal wire RL0-RL7, cooperate test macro of the present invention, it is that initiating key just can be finished all test events that the user only needs by singly-bound, so Ke Jie economizes the test duration.Display 420 comprises 1 demonstration channel and 4 s' display voltage value and can show the test result of every test respectively, judges in order to the user.
Fig. 5 represents the circuit diagram of the driving circuit of the embodiment of the invention.Driving circuit 114 is in order to amplify the controlling signal after decoding scheme 112 is resolved, to change the electrical parameter of power supply unit 200 outputs, because the weak output signal that sent of microprocessor 106, so itself and power supply unit 200 need through this driving circuit 114 when joining.As shown in the figure, driving circuit 114 in the present embodiment adopts photo-coupler 502 to isolate, driving circuit 114 also comprises resistor R 1 and R2, diode D1 and D2, transistor Q1 and relay 504, signal from decoding scheme 112 enters photo-coupler 502 via resistor R 1, after photo-coupler 502 conductings, electric current can be via voltage source of supply Vcc via resistor R 2, photo-coupler 502, flow to ground behind diode D1 and the transistor Q1, because transistor Q1 conducting, so relay 504 begins action, switch S 1 in the relay 504 will be switched on, otherwise when photo-coupler 502 not during conducting, the switch S 1 in the relay 504 can not be switched on yet.
Fig. 6 represents the process flow diagram of the test system and test device to be measured of the embodiment of the invention.Whether at first, detect device to be measured (being power supply unit) has been ready for and has waited to accept test (step S601).When power supply unit is not ready for, then finish this testing process (step S602).After power supply unit was ready for, the one group of electrical parameter that utilizes test macro acquisition power supply unit was to carry out a short-circuit protection test (step S603).Judge whether by this short-circuit protection test (step S604).In test macro judgement the end in the time of can not testing by this this testing process (step S602).Then, test macro need can judge whether another group electrical parameter of acquisition to test (step S605) to carry out another short-circuit protection again, as desires to carry out another short-circuit protection test, then repeating step S603-S605.
After finishing all short-circuit protection tests, then begin the overcurrent protection test, the one group of electrical parameter that utilizes test macro acquisition power supply unit is to carry out an overcurrent protection test (step S606).Judge whether by this overcurrent protection test (step S607).In test macro judgement the end in the time of can not testing by this this testing process (step S602).Then, test macro need can judge whether another group electrical parameter of acquisition to test (step S608) to carry out another overcurrent protection again, as desires to carry out another overcurrent protection test, then repeating step S606-S608.
After finishing all overcurrent protection tests, then begin the overvoltage protection test, the one group of electrical parameter that utilizes test macro acquisition power supply unit is to carry out an overvoltage protection test (step S609).Judge whether by this overvoltage protection test (step S410).In test macro judgement the end in the time of can not testing by this this testing process (step S602).Then, test macro need can judge whether another group electrical parameter of acquisition to test (step S411) to carry out another overvoltage protection again, as desires to carry out another overvoltage protection test, then repeating step S609-S411.
At last, after finishing all overvoltage protection tests, all testing processs (step S412) have been finished.
Basic the above, of the present invention kind of test macro, it uses the mode of robotization to finish the test of power supply unit, therefore can reach the purpose of going out few false failure rate and improving testing precision, and, therefore can reach the purpose of going out few test duration and enhancing productivity because of it does not need loaded down with trivial details button work.
Claims (17)
1. Auto-Test System, it comprises:
One sampling conversion device converts complex digital signal in order to the plural electrical parameter that captures a device to be measured and with above-mentioned electrical parameter;
One microprocessor, in order to receive above-mentioned digital signal to finish the different short-circuit protection test (Short) of plural number, different overcurrent protection test (Over Current Protect) and different overvoltage protection (the Over Voltage Protect) tests of plural number of plural number respectively, wherein this microprocessor is finished above-mentioned short-circuit protection test, the test of above-mentioned overcurrent protection and the test of above-mentioned overvoltage protection according to a particular order; And
One programmable input media control circuit, it receives the different controlling signal of plural number by an input media, and each controlling signal changes this device to be measured via this microprocessor, so that this sampling conversion device captures different electrical parameters.
2. Auto-Test System according to claim 1 more comprises:
One resolves driving circuit, becomes the cognizable signal of this device to be measured in order to resolve above-mentioned controlling signal to change above-mentioned controlling signal, to change the electrical parameter of this device output to be measured; And
One programmable control circuit of display device is coupled to this microprocessor and is shown in the display device with the test result with above-mentioned short-circuit protection test, overcurrent protection test and overvoltage protection test.
3. Auto-Test System according to claim 2, wherein this parsing driving circuit comprises:
One decoding scheme becomes the cognizable signal of this device to be measured in order to resolve above-mentioned controlling signal to change above-mentioned controlling signal;
One drive circuit is in order to amplify the controlling signal after this decoding scheme is resolved, with the electrical parameter of this device output to be measured.
4. Auto-Test System according to claim 2, wherein this sampling conversion device comprises:
One sampler is in order to capture the electrical parameter of this device to be measured; And
One digital analog converter is in order to convert the electrical parameter that this sampler captured to complex digital signal.
5. Auto-Test System according to claim 2; wherein this microprocessor comprises that at least one can eliminate programmable read-only memory (Erasable Programmable Read-Only Memory; EPROM), in order to store a program to finish above-mentioned short-circuit protection test, overcurrent protection test and overvoltage protection test.
6. Auto-Test System according to claim 2, wherein this programmable input media control circuit and this programmable control circuit of display device utilize same device to implement.
7. Auto-Test System according to claim 6, wherein this device is a microcontroller.
8. Auto-Test System according to claim 1; more comprise the removable formula programmble read only memory PROM of an electronics (Electrically-Erasable Programmable Read-Only Memory; E2PROM), test to finish above-mentioned short-circuit protection test, overcurrent protection test and overvoltage protection for this microprocessor access in order to store a program.
9. Auto-Test System according to claim 1, wherein this device to be measured is a Voltage Supply Device.
10. Auto-Test System according to claim 1; wherein this microprocessor is complied with this particular order after finishing above-mentioned short-circuit protection test; begin above-mentioned overcurrent protection test again, and after finishing above-mentioned overcurrent protection test, begin above-mentioned overvoltage protection test again.
11. an Auto-Test System, it comprises:
One sampler is in order to capture the plural electrical parameter of a device to be measured;
One digital analog converter is in order to convert the electrical parameter that this sampler captured to complex digital signal
One microprocessor is in order to receive above-mentioned digital signal to finish different overcurrent protection test of plural number different short-circuit protection test, plural number and the different overvoltage protection test of plural number respectively;
One programmable input media control circuit, it receives the different controlling signal of plural number by an input media, and each controlling signal changes this device to be measured via this microprocessor, so that this sampling conversion device captures different electrical parameters;
One decoding scheme becomes the cognizable signal of this device to be measured in order to resolve above-mentioned controlling signal to change above-mentioned controlling signal;
One drive circuit is in order to amplify the controlling signal after this decoding scheme is resolved, with the electrical parameter of this device output to be measured; And
One programmable control circuit of display device is coupled to this microprocessor and is shown in the display device with the test result with above-mentioned short-circuit protection test, overcurrent protection test and overvoltage protection test;
Wherein this microprocessor is finished above-mentioned short-circuit protection test, the test of above-mentioned overcurrent protection and the test of above-mentioned overvoltage protection according to a particular order.
12. Auto-Test System according to claim 11; wherein this microprocessor comprises that at least one can eliminate programmable read-only memory (Erasable Programmabl eRead-Only Memory; EPROM), in order to store a program to finish above-mentioned short-circuit protection test, overcurrent protection test and overvoltage protection test.
13. Auto-Test System according to claim 11; more comprise the removable formula programmble read only memory PROM of an electronics (Electrically-Erasable Programmable Read-Only Memory; E2PROM), test to finish above-mentioned short-circuit protection test, overcurrent protection test and overvoltage protection for this microprocessor access in order to store a program.
14. Auto-Test System according to claim 11, wherein this device to be measured is a Voltage Supply Device.
15. Auto-Test System according to claim 11; wherein this microprocessor is complied with this particular order after finishing above-mentioned short-circuit protection test; begin above-mentioned overcurrent protection test again, and after finishing above-mentioned overcurrent protection test, begin above-mentioned overvoltage protection test again.
16. Auto-Test System according to claim 11, wherein this programmable input media control circuit and this programmable control circuit of display device utilize same device to implement.
17. Auto-Test System according to claim 16, wherein this device is a microcontroller.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 03100751 CN1273839C (en) | 2003-01-21 | 2003-01-21 | Automated test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 03100751 CN1273839C (en) | 2003-01-21 | 2003-01-21 | Automated test system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1519567A CN1519567A (en) | 2004-08-11 |
| CN1273839C true CN1273839C (en) | 2006-09-06 |
Family
ID=34281297
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 03100751 Expired - Fee Related CN1273839C (en) | 2003-01-21 | 2003-01-21 | Automated test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1273839C (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20120102374A1 (en) * | 2009-04-17 | 2012-04-26 | Teradyne, Inc. | Storage device testing |
-
2003
- 2003-01-21 CN CN 03100751 patent/CN1273839C/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| CN1519567A (en) | 2004-08-11 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101018058B (en) | Analog-digital converter circuit | |
| CN1153977C (en) | System measuring partial discharge using digital peak detection | |
| CN100550115C (en) | The method of test driving circuit and the driving circuit that is used for display device | |
| CN103138734B (en) | The simultaneously circuit of the multiple differential wave of integration, sensing circuit and method of operation thereof | |
| CN101776708A (en) | Multichannel voltage collecting device and method | |
| CN1153978C (en) | System for concurrent digital measurement of peak voltage and RMS voltage in high voltage system | |
| CN114720769A (en) | Dynamic characteristic measuring device and method for wide-bandgap power semiconductor field effect transistor | |
| TWI224197B (en) | Automatic test system | |
| CN109633404B (en) | PXI-based avalanche photodetector electrical characteristic test system | |
| CN1273839C (en) | Automated test system | |
| CN1145034C (en) | System for digital measurement of breakdown voltage of high-voltage samples | |
| CN109282856A (en) | It is a kind of while detecting temperature/voltage/current signal single-chip sensor | |
| CN106329901B (en) | Overcurrent protection peripheral circuit and electrical equipment | |
| CN106771563B (en) | Board power testing method, apparatus and system | |
| CN109510628B (en) | Key circuit, matrix key circuit and key identification method of matrix key circuit | |
| CN110470927B (en) | Key testing method and key testing device | |
| US7227349B2 (en) | Method and apparatus for the digital and analog triggering of a signal analysis device | |
| CN206292323U (en) | Many key detection devices | |
| CN1242662A (en) | Inputting and testing circuit for matrix type keyboard | |
| CN106053908A (en) | Analog-to-digital signal conversion device of digital oscilloscope | |
| CN212726974U (en) | Power-on time sequence detection device | |
| CN218824571U (en) | Test tool of direct-current traction protection measurement and control device | |
| CN218630071U (en) | Resistance-capacitance integrated single-machine tester for power semiconductor device | |
| CN209514023U (en) | The normal instruction system of multiple power supplies output | |
| CN117833879A (en) | Digital trigger detection device and oscilloscope |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C19 | Lapse of patent right due to non-payment of the annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |