CN1186641C - Systemic hierarchial test - Google Patents

Systemic hierarchial test Download PDF

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Publication number
CN1186641C
CN1186641C CNB021045291A CN02104529A CN1186641C CN 1186641 C CN1186641 C CN 1186641C CN B021045291 A CNB021045291 A CN B021045291A CN 02104529 A CN02104529 A CN 02104529A CN 1186641 C CN1186641 C CN 1186641C
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China
Prior art keywords
test
integrated circuit
solid plate
capacity feeder
plugged
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CN1437029A (en
Inventor
李子复
赖银炫
蔡一豪
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Siliconware Precision Industries Co Ltd
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Siliconware Precision Industries Co Ltd
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Abstract

The present invention relates to a systemic layer test (SLT) which mainly uses machine automation for substituting common manual operation and plugging integrated circuits in an entity board for the SLT; otherwise, the substitution of machine automation for the common manual operation can draw the integrated circuits finishing the SLT out of the entity board and can sort the integrated circuits to be output. The scheme of mainly using the machine automation for the SLT of the integrated circuits can overcome the disadvantages of the manually plugged integrated circuits and can facilitate relevant fields to make the SLT to the integrated circuits in a reliable, economic, approximately time-effect mode so as to meet gradually harsh application requirement conditions.

Description

Systemic hierarchial test
Technical field
The present invention is relevant a kind of scheme of integrated circuit being made systemic hierarchial test (SLT), utilize the machine robotization that integrated circuit is plugged in solid plate to carry out systemic hierarchial test, it also can utilize the machine robotization, and the integrated circuit of finishing systemic hierarchial test is extracted and the output of classifying from solid plate.
Background technology
Day by day harsh along with the application requirements condition, the result who integrated circuit is made simulation test is reliable no longer fully, so the scheme of integrated circuit being made systemic hierarchial test is general gradually.So-called " systemic hierarchial test " is that integrated circuit is plugged into its actual solid plate that will be used, and then this solid plate is considered as a system, and whether whether it is normal to test this solid plate, be suitable for cooperating this solid plate to use to judge this integrated circuit.So-called " simulation test " is that integrated circuit is plugged into analog board, and the application signal that will simulate thus is added to this integrated circuit, so that whether test this integrated circuit normal.Because the integrated circuit application conditions that analog board simulated can not be same as the actual solid plate that will be used of this integrated circuit fully, the result who integrated circuit is made simulation test is just unreliable, especially high-quality, under the trend of high precision, the application requirements condition is day by day harsh, and the fiduciary level of simulation test is gradually queried.
Since solid plate to be integrated circuit actual will the person of being used, position of its shape, size, integrated circuit runners (hereinafter to be referred as runners) or the like is ever-changing, event is known makes systemic hierarchial test to integrated circuit, all adopt manpower integrated circuit to be plugged into a runners of solid plate, when finishing systemic hierarchial test, also adopt manpower that integrated circuit is extracted from solid plate again.As shown in Figure 1, known operation to integrated circuit 11 executive system hierarchial tests, be that a solid plate 25 is positioned over a test board 15, with staff 14 this integrated circuit 11 is plugged in an appointment runners 26 on the solid plate 25 again, also after finishing systemic hierarchial test, specifies runners 26 to extract this integrated circuit 11 from solid plate 25.
This operation based on manpower causes batch mixing easily, and because of artificial location is difficult for accurately, the application of force is difficult balanced, often makes integrated circuit or relevant tool impaired, has a strong impact on industrial competitiveness.This operation of artificial in addition execution, limited speed if will strive for the timeliness of delivering goods, then must be carried out simultaneously in a large number, the space that then this test jobs need use causes this industry that integrated circuit is made systemic hierarchial test to suffer from developmental bottleneck with manually very considerable.
Summary of the invention
One of purpose of the present invention provides and a kind ofly is automated as main systemic hierarchial test with machine, manually integrated circuit is inserted into solid plate with the replacement of machine automated job, avoiding batch mixing, and it is inaccurate to exempt artificial location, and integrated circuit or relevant tool that application of force inequality is caused are impaired.
Two of purpose of the present invention provides and a kind ofly is automated as main systemic hierarchial test with machine, manually integrated circuit is inserted into solid plate with the replacement of machine automated job, reach the timeliness requirement, unnecessary considerable manpower and space, be convenient to production and marketing and cooperate, but needn't be in the face of the scheduling difficulty in manpower and space.
Three of purpose of the present invention provides and a kind ofly is automated as main systemic hierarchial test with machine, manually integrated circuit is inserted into solid plate with the replacement of machine automated job, also carry out peripheral operations such as charging, discharging, the significantly production capacity of elevator system hierarchial test and fiduciary level with the machine robotization.
For achieving the above object, whether a kind of systemic hierarchial test provided by the invention when being plugged on a kind of solid plate designation area in order to test a kind of integrated circuit, is applicable to this kind solid plate, and this systemic hierarchial test comprises:
One container is a test solid plate for holding at least one this kind solid plate;
One charger, it holds at least one this kind integrated circuit is to-be-measured integrated circuit;
One erector, in order to this to-be-measured integrated circuit is shifted out this charger and is plugged in designation area on this test solid plate, this erector comprises a compression joint mechanism, in order to this to-be-measured integrated circuit is plugged into designation area on this test solid plate; And
One tester is tested this solid plate that is plugged with this to-be-measured integrated circuit, whether is applicable to this kind solid plate to differentiate this to-be-measured integrated circuit, finishes test one this kind integrated circuit at this point.
Wherein compression joint mechanism cooperates the position of designation area on this test solid plate and moves, so that this to-be-measured integrated circuit is plugged into designation area on this test solid plate.
Wherein also comprise a steering gear, in order to adjust the direction of this to-be-measured integrated circuit, so that this erector is plugged in designation area on this test solid plate with this to-be-measured integrated circuit.
Wherein this tester comprises a test connector, in order to be electrically connected this tester and this test solid plate.
Wherein this container is also in order to fixing this solid plate of being held, so that this to-be-measured integrated circuit designation area on this test solid plate is installed.
Wherein this erector comprises and moves tool, in order to this to-be-measured integrated circuit is moved on to designation area on this test solid plate from this charger, with this compression joint mechanism this to-be-measured integrated circuit is plugged in designation area on this test solid plate.
Wherein moving of this compression joint mechanism is manpower or Mechanical Driven.
Wherein also comprise a steering gear, in order to importing a direction setting value, and the direction of this to-be-measured integrated circuit adjusted to meet this direction setting value.
Wherein also comprise a steering gear, the direction of this to-be-measured integrated circuit is adjusted to, be convenient to this erector this to-be-measured integrated circuit is shifted to this test solid plate from this charger.
Wherein also comprise a steering gear, the direction of this to-be-measured integrated circuit is adjusted in this steering gear, and when this moved tool and this to-be-measured integrated circuit is moved on on this test solid plate designation area, this to-be-measured integrated circuit was convenient to be plugged into designation area on this test solid plate.
Wherein this tester provides a Test input signal to this test solid plate that is plugged with this to-be-measured integrated circuit, and receive a test output signal from this test solid plate that is plugged with this to-be-measured integrated circuit, and send an indicator signal according to this test output signal, be applicable to the degree of this kind solid plate to show this to-be-measured integrated circuit.
Wherein this tester also comprises a test signal recognizer, in order to import a signal sets value, and whether meet this signal sets value according to this test output signal and send this different indicator signals, whether be applicable to this kind solid plate to show this to-be-measured integrated circuit.
Wherein this compression joint mechanism with upper and lower to this to-be-measured integrated circuit being plugged in designation area on this test solid plate, and this erector cooperates the difference of designation area position on the various solid plate, and adjust the horizontal level of this compression joint mechanism, be convenient to this compression joint mechanism this to-be-measured integrated circuit is plugged in designation area on these various solid plate that this container holds.
Wherein this compression joint mechanism with upper and lower to this to-be-measured integrated circuit being plugged in designation area on this test solid plate, this erector comprises at least one driving machine and at least one screw rod, this driving machine is adjusted the dual space position of this compression joint mechanism at surface level via this screw rod, make this compression joint mechanism cooperate various solid plate and aim at designation area on this test solid plate, be convenient to this to-be-measured integrated circuit is plugged in designation area on these various solid plate that this container holds.
Wherein also comprise a discharging machine, in order to the integrated circuit of this being finished test move on to this test solid plate outside, and, this integrated circuit of finishing test is put into diverse location according to test result.
Wherein this charger holds at least one first kind of capacity feeder, and this first kind of capacity feeder is in order to place a plurality of this kind integrated circuit.
Wherein also comprise a discharging machine, this discharging machine holds at least one second kind, the third capacity feeder, this discharging machine cooperates this erector that this integrated circuit of finishing test is moved out to outside this solid plate, if this integrated circuit of finishing test is applicable to this kind solid plate, the integrated circuit of then this being finished test places this second kind of capacity feeder, otherwise is placed on this third capacity feeder.
Wherein also comprise a capacity feeder control module, in order to predict whether this first kind of capacity feeder zero load is arranged, if this first kind of capacity feeder zero load arranged, capacity feeder that then should zero load moves on to outside this charger, and replenishes at least one this first kind of capacity feeder of this kind integrated circuit that be loaded with to this charger; Whether this capacity feeder control module has this second kind in order to predict, this third capacity feeder fully loaded, if having, then the person of being fully loaded with is moved on to outside this discharging machine, and replenishes at least one unloaded person to this discharging machine.
Wherein also comprise a capacity feeder control module, in order to predicting whether this first kind of capacity feeder zero load is arranged, if this first kind of capacity feeder zero load arranged, first kind of capacity feeder that then should zero load moves on to outside this charger; Whether this appearance material controller also has this second kind in order to detect, in this third capacity feeder any one is fully loaded, if have, then the person of being fully loaded with is moved on to outside this discharging machine, and perceiving this charger when accommodating this unloaded first kind of capacity feeder, first kind of capacity feeder of this zero load directly moved on to this discharging machine by this charger, as in this second kind, this third capacity feeder any one, the person of being moved out of to replenish fully loaded.
Wherein also comprise a discharging machine, this discharging machine holds at least one black capacity feeder and at least one colored capacity feeder, this discharging machine cooperates this to move tool this integrated circuit of finishing test is moved out to outside this test solid plate, if this integrated circuit of finishing test is applicable to this kind solid plate, the integrated circuit of then this being finished test places this black capacity feeder, otherwise is placed on this colour capacity feeder; Systemic hierarchial test as claimed in claim 6 system, also comprise empty a black capacity feeder and a colored capacity feeder, this black capacity feeder full load that holds when this discharging machine, this empty black capacity feeder, move tool via this and move on to this discharging machine, and work as this colour capacity feeder full load that this discharging machine holds, this empty colour capacity feeder moves tool via this and moves on to this discharging machine.
Wherein this charger is also in order to predicting the quantity of this kind integrated circuit that this charger holds, and when this quantity is lower than one first setting value, sends one first kind of alarm signal.
Wherein this discharging machine is also in order to predict the total quantity of this kind integrated circuit in this second kind of capacity feeder, and when this total quantity is higher than one second setting value, send one second kind of alarm signal, this discharging machine is also in order to predict the total quantity of this kind integrated circuit in this third capacity feeder, and when the total quantity of this kind integrated circuit surpasses one the 3rd setting value in this third capacity feeder, send the third alarm signal.
Wherein also comprise a well heater, before this to-be-measured integrated circuit is plugged in this test solid plate, heat this to-be-measured integrated circuit.
Wherein this steering gear has the effect of heating concurrently, and this to-be-measured integrated circuit is heated up.
Wherein this erector has the effect of heating concurrently, and it not only is plugged in this to-be-measured integrated circuit designation area on this test solid plate, and this to-be-measured integrated circuit is heated up.
Wherein this capacity feeder control module is if first kind of capacity feeder that should zero load directly moves on to this discharging machine as this second kind of capacity feeder by this charger, and first kind of capacity feeder that then should zero load indicates and become this second kind of capacity feeder; And this capacity feeder control module is if first kind of capacity feeder that should zero load directly moves on to this discharging machine as this third capacity feeder by this charger, and first kind of capacity feeder that then should zero load indicates and become this third capacity feeder.
Wherein this compression joint mechanism sends a kind of signal, and the crimping path of representing this compression joint mechanism position at that time to provide cooperates with it with the position of designation area on this test solid plate.
Wherein also comprise a kind of test runners and a kind of runners introducing mechanism, this test is electrically connected designation area on this test solid plate with runners, this runners introducing mechanism connects this test runners, is convenient to this to-be-measured integrated circuit of this erector in-migration is imported to this test runners.
Wherein this runners introducing mechanism is expanded outwardly with around the runners up a little by this test.
The invention provides a kind of systemic hierarchial test, when being plugged on a kind of solid plate designation area in order to test a kind of integrated circuit, be applicable to the degree of this kind solid plate, this systemic hierarchial test also comprises:
One container is a test solid plate for holding at least one this kind solid plate;
One charger, it holds at least one this kind integrated circuit is to-be-measured integrated circuit;
One erector, in order to this to-be-measured integrated circuit is shifted out this charger and is plugged in designation area on this test solid plate, this erector comprises a compression joint mechanism, in order to this to-be-measured integrated circuit is plugged into designation area on this test solid plate; And
One tester is tested this solid plate that is plugged with this to-be-measured integrated circuit, to distinguish out the degree that this to-be-measured integrated circuit is applicable to this kind solid plate.
Description of drawings
Fig. 1 represents knownly to adopt manpower when an integrated circuit is made systemic hierarchial test this integrated circuit is plugged into solid plate.
Fig. 2 represents the elemental operation system architecture of the present invention to a kind of integrated circuit executive system hierarchial test, for adopting the machine robotization integrated circuit is plugged into solid plate.
Fig. 3 represents the further operating system structure of the present invention to a kind of integrated circuit executive system hierarchial test, for further being convenient to the machine robotization integrated circuit is plugged into solid plate.
Fig. 4 represents that the present invention is plugged into integrated circuit a kind of embodiment of the compression joint mechanism of solid plate.
Fig. 5 represents a kind of embodiment of locator meams between solid plate of the present invention and the compression joint mechanism.
Fig. 6 is the physical construction vertical view of an embodiment of the present invention only for reference.
Embodiment
Figure 2 shows that the elemental operation system architecture of the present invention to a kind of integrated circuit executive system hierarchial test, adopt the machine robotization integrated circuit to be plugged into the mode of solid plate, when being plugged in designation area on a kind of solid plate (a for example integrated circuit runners) to test this kind integrated circuit, whether be applicable to this kind solid plate, this systemic hierarchial test of the present invention system comprises:
One container 24 is a test solid plate 25 for holding at least one this kind solid plate;
One charger 21, it holds at least one this kind integrated circuit is to-be-measured integrated circuit;
One erector 22 is plugged in designation area 26 on this test solid plate 25 in order to this to-be-measured integrated circuit is shifted out this charger 21, and this erector 22 comprises a compression joint mechanism 23, in order to this to-be-measured integrated circuit is plugged into designation area on this test solid plate 25; And
One tester 27, this test solid plate 25 that is plugged with this to-be-measured integrated circuit is tested, whether be applicable to this kind solid plate to differentiate this to-be-measured integrated circuit, or distinguish out the degree that this to-be-measured integrated circuit is applicable to this kind solid plate, finish the systemic hierarchial test of this kind integrated circuit at this point.
In the above-mentioned systemic hierarchial test system, this compression joint mechanism 23 can cooperate the position of designation area on this test solid plate 25 and move, so that this to-be-measured integrated circuit is plugged into designation area on this test solid plate.
Figure 3 shows that the further operating system structure of the present invention to a kind of integrated circuit executive system hierarchial test, in order further to be convenient to the machine robotization integrated circuit is plugged into test solid plate 25, it also comprises a steering gear 32, in order to adjust the direction of this to-be-measured integrated circuit, so that this erector 22 is plugged in designation area 26 on this test solid plate 25 with this to-be-measured integrated circuit.
No matter be Fig. 2 or shown in Figure 3, in the operating system of the present invention to a kind of integrated circuit executive system hierarchial test, this tester 27 can comprise a test connector (not being shown in figure), is convenient to be electrically connected this tester 27 and this test solid plate 25; This container also can be in order to fixing this test solid plate 25 of being held, so that this to-be-measured integrated circuit designation area 26 on this test solid plate 25 is installed; This erector 22 comprises and moves tool (because can adopt known common mechanical arm, so be not shown in Fig. 2,3, but be shown in Fig. 6), in order to this to-be-measured integrated circuit is moved on to designation area 26 on this test solid plate 25 from this charger 21, this to-be-measured integrated circuit is plugged in designation area 26 on this test solid plate 25 with this compression joint mechanism 23.Moving of this compression joint mechanism 23 is by manpower or Mechanical Driven.This steering gear 32 can be designed to be able to import a direction setting value, and the direction of this to-be-measured integrated circuit adjusted to meet this direction setting value, also can be designed to be able to the direction of this to-be-measured integrated circuit is adjusted to, be convenient to this erector 22 this to-be-measured integrated circuit is shifted to this test solid plate 25 from this charger 21.This steering gear 32 can be designed to again, the direction of this to-be-measured integrated circuit can be adjusted to, when this moves tool (not being shown in Fig. 2,3) and this to-be-measured integrated circuit is moved on on this test solid plate 25 designation area 26, designation area 26 on this test solid plate 25 (integrated circuit runners) has just been aimed in the pin position of this to-be-measured integrated circuit, so that be plugged into designation area 26 on this test solid plate 25.The function of this steering gear 32 also can be contained in this erector 22, for example erector 22 comprises mobile tool and this compression joint mechanism 23 etc. and is designed to, no matter the direction of this to-be-measured integrated circuit why, this to-be-measured integrated circuit all conveniently is moved to designation area 26 on this test solid plate 25, and is convenient to be plugged into designation area 26 on this test solid plate 25.
No matter be Fig. 2 or shown in Figure 3, in the operating system of the present invention to a kind of integrated circuit executive system hierarchial test, this test solid plate 25 that 27 pairs of this testers have been plugged with this to-be-measured integrated circuit provides a Test input signal, and receive a test output signal from this test solid plate 25 that is plugged with this to-be-measured integrated circuit, and send an indicator signal according to this test output signal, whether be applicable to this test solid plate 25 to show this to-be-measured integrated circuit.This tester 27 can also comprise a test signal recognizer (end is shown in figure), in order to import a signal sets value, and whether meet this signal sets value according to this test output signal and send this different indicator signals, whether be applicable to this kind solid plate to show this to-be-measured integrated circuit.
No matter be Fig. 2 or shown in Figure 3, in the operating system of the present invention to a kind of integrated circuit executive system hierarchial test, this compression joint mechanism 23 can take above-below direction that this to-be-measured integrated circuit is plugged in designation area 26 on this test solid plate 25, and this erector 22 cooperates the (motherboard for example of designation area on the various solid plate, data card, memory card, integrated circuit runners on drafting card or the like solid plate) difference of position, and adjust the horizontal level of this compression joint mechanism 23, so that this compression joint mechanism 23 is plugged in designation area on these various solid plate that this container 24 held with this to-be-measured integrated circuit.This erector 22 can comprise a driving mechanism (Fig. 3 31), this driving mechanism 31 comprises at least one driving machine (for example motor) and at least one screw rod, this driving machine is adjusted the horizontal level and the upright position of this compression joint mechanism 23 via this screw rod, make this compression joint mechanism 23 can cooperate various different entities plates and aim at designation area 26 on this test solid plate 25, so that this to-be-measured integrated circuit is plugged in designation area on these various solid plate that this container 24 held.At least one driving machine that this driving mechanism 31 comprises and at least one screw rod can be designed to as shown in Figure 4.Among Fig. 4, driving machine 46 drives compression joint mechanism 23 via screw rod 47 and moves up and down, and driving machine 44,45 moves as the plane via driving compression joint mechanisms 23 such as screw rods 41,42,43, plant the applied in any combination of driving mechanism 31 and compression joint mechanism 23 thus, systemic hierarchial test of the present invention system can more easily cooperate various all kinds of Protean solid plate, adopt the machine robotization to integrated circuit executive system hierarchial test, its to become more diversified, diversified integrated circuit application market, especially can provide the benefit that hardly matches.
For easier integrated circuit is plugged into solid plate and electrical connection, the invention provides a kind of test runners that introducing mechanism (surrounding edge that for example expands outwardly a little) arranged up on every side, with its with the test solid plate 25 on designation area 26 (for example be electrically connected, one typical case or integrated circuit runners commonly used have been welded on designation area 26 on the test solid plate 25, and this test is convenient to insert the typical integrated circuit runners that this has been welded on designation area 26 on the test solid plate 25 with runners, to be electrically connected designation area 26 on the test entity Provisional 25).So, erector 22 moves on to this to-be-measured integrated circuit this test runners on this test entity Provisional 25 (also just being electrically connected designation area 26 on this test solid plate 25 easily) easily, also can avoid, this has been welded on the typical integrated circuit runners of designation area 26 on the test solid plate 25, because self will directly connect to-be-measured integrated circuit, so must bear to-be-measured integrated circuit (number is many) plugs frequently thereon, causes its needs to be changed often.This test also can be welded direct to designation area 26 on the test solid plate 25 with runners.Among Fig. 4, contact interface 52, breakout box 51 is option device of the present invention, and contact interface 52 is as the interface of compression joint mechanism 23 contact integrated circuit, and it may will be replaced with different models with the size of this to-be-measured integrated circuit of work, shape etc.Breakout box 51 is in order to be convenient for changing contact interface 52.
No matter be Fig. 2 or shown in Figure 3, in the operating system of the present invention to a kind of integrated circuit executive system hierarchial test, this charger can hold at least one first kind of capacity feeder (Fig. 3 30), and this first kind of capacity feeder 30 is in order to place a plurality of this kind integrated circuit.The present invention is to a kind of machine automated job system of integrated circuit executive system hierarchial test, can also comprise a discharging machine (Fig. 3 34), this moves tool or conventional machinery arm to cooperate (or utilization), with this integrated circuit of finishing test move on to this test solid plate 25 outside, and, this integrated circuit of finishing test is put into diverse location according to test result.For example, if this integrated circuit of finishing test is applicable to this kind solid plate, the integrated circuit of then this being finished test places one second kind of capacity feeder that this discharging machine holds (Fig. 3 35), otherwise is placed on the third capacity feeder that this discharging machine holds (Fig. 3 36).For ease of distinguishing this second kind of capacity feeder and this third capacity feeder, allow this second kind of capacity feeder be plain color (for example black) usually, allow this third capacity feeder be bright color (for example colored).This machine automated job system to integrated circuit executive system hierarchial test of the present invention also can comprise standby empty capacity feeder, for example a black capacity feeder (Fig. 6 75) and a colored capacity feeder (Fig. 6 76); When above-mentioned second kind of capacity feeder full load, this standby black capacity feeder moves on to discharging machine (Fig. 3 34) via mobile tool, and when above-mentioned the third capacity feeder full load, this standby colour capacity feeder moves on to this discharging machine via mobile tool.
The present invention is to a kind of machine automated job system of integrated circuit executive system hierarchial test, also can also comprise a capacity feeder control module (not being shown in figure), in order to predict whether this first kind of capacity feeder 30 zero loads (no longer holding outstanding to-be-measured integrated circuit) are arranged, if this first kind of capacity feeder 30 zero load arranged, capacity feeder that then should zero load moves on to outside this charger 21, and replenishes at least one this first kind of capacity feeder 30 of this kind integrated circuit that is loaded with to this charger 21; Whether this capacity feeder control module also has this second kind of capacity feeder 35 in order to predict, this third capacity feeder 36 is fully loaded, if having, then the person of being fully loaded with is moved on to outside this discharging machine 34, and replenishes at least one unloaded person to this discharging machine 34.This capacity feeder control module also can be designed to, in order to predict whether this first kind of capacity feeder 30 zero loads (no longer holding outstanding to-be-measured integrated circuit) are arranged, if this first kind of capacity feeder 30 zero load arranged, first kind of capacity feeder 30 that then should zero load moves on to outside this charger 21; Also whether have this second kind 35 in order to detect, in this third capacity feeders such as 36 any one be fully loaded, if have, then the person of being fully loaded with is moved on to outside this discharging machine 34, and perceiving this charger 21 when accommodating this unloaded first kind of capacity feeder 30, first kind of capacity feeder 30 of this zero load directly moved on to this discharging machine 34 by this charger 21, as in this second kind, this third capacity feeder any one, the person of being moved out of to replenish fully loaded.This charger 21 also can be designed to, and in order to predicting the quantity of its this kind integrated circuit that holds, and when this quantity is lower than one first setting value, sends one first kind of alarm signal.This discharging machine 34 also can be designed to, (finished test in order to predict in this second kind of capacity feeder 35, be judged to and be applicable to this kind solid plate) total quantity of this kind integrated circuit, and when this total quantity is higher than one second setting value, send one second kind of alarm signal, require to replenish this second kind of capacity feeder 35.This discharging machine also (has been finished test in order to predict in this third capacity feeder 36, be judged to and be not suitable for this kind solid plate) total quantity of this kind integrated circuit, and when the total quantity of this kind integrated circuit surpasses one the 3rd setting value in this third capacity feeder, send the third alarm signal, require to replenish this third capacity feeder 36.This capacity feeder control module can be designed in addition, if first kind of capacity feeder 30 that it should zero load directly moves on to this discharging machine 34 as this second kind of capacity feeder 35 by this charger 21, first kind of capacity feeder that then should zero load indicates and become this second kind of capacity feeder 35; And this capacity feeder control module is if first kind of capacity feeder 30 that should zero load directly moves on to this discharging machine 34 as this third capacity feeder 36 by this charger 21, and first kind of capacity feeder that then should zero load indicates and become this third capacity feeder 36.
The present invention is to a kind of machine automated job system of integrated circuit executive system hierarchial test, can also comprise a well heater (not being shown in Fig. 2,3) again, be plugged on this test solid plate 25 before the designation area 26 in this to-be-measured integrated circuit, heat this to-be-measured integrated circuit.But steering gear 32 can have the effect of heating concurrently, this to-be-measured integrated circuit is heated up, to replace this well heater.Erector 22 also can have the effect of heating concurrently, and it not only is plugged in this to-be-measured integrated circuit designation area on this test solid plate, this to-be-measured integrated circuit is heated up, to replace this well heater.
Collocation each other for designation area 26 on the easier position (representing the path of its crimping) that allows compression joint mechanism 23 and the test solid plate 25, compression joint mechanism 23 of the present invention can be designed to as shown in Figure 5, can send a kind of signal (a for example light beam 60), the crimping path of representing its position at that time to provide cooperates with it with the position of testing designation area 26 on the solid plate 25.For example this light beam 60 is got along at apparent on the test container 24 and 70 should be matched with the position of designation area 26 on the test solid plate 25.

Claims (30)

  1. Whether 1, a kind of systemic hierarchial test when being plugged on a kind of solid plate designation area in order to test a kind of integrated circuit, is applicable to this kind solid plate, and this systemic hierarchial test system comprises:
    One container is a test solid plate for holding at least one this kind solid plate;
    One charger, it holds at least one this kind integrated circuit is to-be-measured integrated circuit;
    One erector, in order to this to-be-measured integrated circuit is shifted out this charger and is plugged in designation area on this test solid plate, this erector comprises a compression joint mechanism, in order to this to-be-measured integrated circuit is plugged into designation area on this test solid plate; And
    One tester is tested this solid plate that is plugged with this to-be-measured integrated circuit, whether is applicable to this kind solid plate to differentiate this to-be-measured integrated circuit, finishes test one this kind integrated circuit at this point.
  2. 2, the system as claimed in claim 1 hierarchial test is characterized in that, this compression joint mechanism cooperates the position of designation area on this test solid plate and moves, so that this to-be-measured integrated circuit is plugged into designation area on this test solid plate.
  3. 3, the system as claimed in claim 1 hierarchial test is characterized in that, also comprises a steering gear, in order to adjust the direction of this to-be-measured integrated circuit, so that this erector is plugged in designation area on this test solid plate with this to-be-measured integrated circuit.
  4. 4, the system as claimed in claim 1 hierarchial test is characterized in that, wherein this tester comprises a test connector, in order to be electrically connected this tester and this test solid plate.
  5. 5, the system as claimed in claim 1 hierarchial test is characterized in that, wherein this container is also in order to fixing this solid plate of being held, so that this to-be-measured integrated circuit designation area on this test solid plate is installed.
  6. 6, the system as claimed in claim 1 hierarchial test, it is characterized in that, wherein this erector comprises and moves tool, in order to this to-be-measured integrated circuit is moved on to designation area on this test solid plate from this charger, this to-be-measured integrated circuit is plugged in designation area on this test solid plate with this compression joint mechanism.
  7. 7, systemic hierarchial test as claimed in claim 2 is characterized in that, moving of this compression joint mechanism is manpower or Mechanical Driven.
  8. 8, the system as claimed in claim 1 hierarchial test is characterized in that, also comprises a steering gear, in order to importing a direction setting value, and the direction of this to-be-measured integrated circuit adjusted to meets this direction setting value.
  9. 9, the system as claimed in claim 1 hierarchial test is characterized in that, also comprises a steering gear, and the direction of this to-be-measured integrated circuit is adjusted to, and is convenient to this erector this to-be-measured integrated circuit is shifted to this test solid plate from this charger.
  10. 10, systemic hierarchial test as claimed in claim 6, it is characterized in that, also comprise a steering gear, the direction of this to-be-measured integrated circuit is adjusted in this steering gear, this move tool with this to-be-measured integrated circuit Yi on this test solid plate during designation area, this to-be-measured integrated circuit is convenient to be plugged into designation area on this test solid plate.
  11. 11, the system as claimed in claim 1 hierarchial test, it is characterized in that, wherein this tester provides a Test input signal to this test solid plate that is plugged with this to-be-measured integrated circuit, and receive a test output signal from this test solid plate that is plugged with this to-be-measured integrated circuit, and send an indicator signal according to this test output signal, be applicable to the degree of this kind solid plate to show this to-be-measured integrated circuit.
  12. 12, systemic hierarchial test as claimed in claim 11, it is characterized in that, wherein this tester also comprises a test signal recognizer, in order to import a signal sets value, and whether meet this signal sets value according to this test output signal and send this different indicator signals, whether be applicable to this kind solid plate to show this to-be-measured integrated circuit.
  13. 13, the system as claimed in claim 1 hierarchial test, it is characterized in that, wherein this compression joint mechanism with upper and lower to this to-be-measured integrated circuit being plugged in designation area on this test solid plate, and this erector cooperates the difference of designation area position on the various solid plate, and adjust the horizontal level of this compression joint mechanism, be convenient to this compression joint mechanism this to-be-measured integrated circuit is plugged in designation area on these various solid plate that this container holds.
  14. 14, systemic hierarchial test as claimed in claim 2, it is characterized in that, wherein this compression joint mechanism with upper and lower to this to-be-measured integrated circuit being plugged in designation area on this test solid plate, this erector comprises at least one driving machine and at least one screw rod, this driving machine is adjusted the dual space position of this compression joint mechanism at surface level via this screw rod, make this compression joint mechanism cooperate various solid plate and aim at designation area on this test solid plate, be convenient to this to-be-measured integrated circuit is plugged in designation area on these various solid plate that this container holds.
  15. 15, the system as claimed in claim 1 hierarchial test, it is characterized in that, also comprise a discharging machine, in order to the integrated circuit Yi that this finished test outside this test solid plate, and, this integrated circuit of finishing test is put into diverse location according to test result.
  16. 16, the system as claimed in claim 1 hierarchial test is characterized in that, wherein this charger holds at least one first kind of capacity feeder, and this first kind of capacity feeder is in order to place a plurality of this kind integrated circuit.
  17. 17, systemic hierarchial test as claimed in claim 16, it is characterized in that, also comprise a discharging machine, this discharging machine holds at least one second kind, the third capacity feeder, this discharging machine cooperates this erector that this integrated circuit of finishing test is moved out to outside this solid plate, if this integrated circuit of finishing test is applicable to this kind solid plate, the integrated circuit of then this being finished test places this second kind of capacity feeder, otherwise is placed on this third capacity feeder.
  18. 18, systemic hierarchial test as claimed in claim 17, it is characterized in that, also comprise a capacity feeder control module, in order to predict whether this first kind of capacity feeder zero load is arranged, if this first kind of capacity feeder zero load arranged, capacity feeder that then should zero load moves on to outside this charger, and replenishes at least one this first kind of capacity feeder of this kind integrated circuit that be loaded with to this charger; Whether this capacity feeder control module has this second kind in order to predict, this third capacity feeder fully loaded, if having, then the person of being fully loaded with is moved on to outside this discharging machine, and replenishes at least one unloaded person to this discharging machine.
  19. 19, systemic hierarchial test as claimed in claim 17, it is characterized in that, also comprise a capacity feeder control module, in order to predict whether this first kind of capacity feeder zero load is arranged, if this first kind of capacity feeder zero load arranged, first kind of capacity feeder that then should zero load moves on to outside this charger; Whether this appearance material controller also has this second kind in order to detect, in this third capacity feeder any one is fully loaded, if have, then the person of being fully loaded with is moved on to outside this discharging machine, and perceiving this charger when accommodating this unloaded first kind of capacity feeder, first kind of capacity feeder of this zero load directly moved on to this discharging machine by this charger, as in this second kind, this third capacity feeder any one, the person of being moved out of to replenish fully loaded.
  20. 20, systemic hierarchial test as claimed in claim 6, it is characterized in that, also comprise a discharging machine, this discharging machine holds at least one black capacity feeder and at least one colored capacity feeder, this discharging machine cooperates this to move tool this integrated circuit of finishing test is moved out to outside this test solid plate, if this integrated circuit of finishing test is applicable to this kind solid plate, the integrated circuit of then this being finished test places this black capacity feeder, otherwise is placed on this colour capacity feeder; Also comprise empty a black capacity feeder and a colored capacity feeder, this black capacity feeder full load that holds when this discharging machine, this empty black capacity feeder, move tool via this and move on to this discharging machine, and this colour capacity feeder full load that holds when this discharging machine, this empty colour capacity feeder moves tool via this and moves on to this discharging machine.
  21. 21, systemic hierarchial test as claimed in claim 16 is characterized in that, wherein this charger is also in order to predicting the quantity of this kind integrated circuit that this charger holds, and when this quantity is lower than one first setting value, sends one first kind of alarm signal.
  22. 22, systemic hierarchial test as claimed in claim 17, it is characterized in that, wherein this discharging machine is also in order to predict the total quantity of this kind integrated circuit in this second kind of capacity feeder, and when this total quantity is higher than one second setting value, send one second kind of alarm signal, this discharging machine is also in order to predicting the total quantity of this kind integrated circuit in this third capacity feeder, and when the total quantity of this kind integrated circuit surpasses one the 3rd setting value in this third capacity feeder, sends the third alarm signal.
  23. 23, the system as claimed in claim 1 hierarchial test is characterized in that, also comprises a well heater, before this to-be-measured integrated circuit is plugged in this test solid plate, heats this to-be-measured integrated circuit.
  24. 24, systemic hierarchial test as claimed in claim 3 is characterized in that, wherein this steering gear has the effect of heating concurrently, and this to-be-measured integrated circuit is heated up.
  25. 25, the system as claimed in claim 1 hierarchial test is characterized in that, wherein this erector has the effect of heating concurrently, and it not only is plugged in this to-be-measured integrated circuit designation area on this test solid plate, and this to-be-measured integrated circuit is heated up.
  26. 26, systemic hierarchial test as claimed in claim 19, it is characterized in that, wherein this capacity feeder control module is if first kind of capacity feeder that should zero load, directly move on to this discharging machine as this second kind of capacity feeder by this charger, first kind of capacity feeder that then should zero load indicates and becomes this second kind of capacity feeder; And this capacity feeder control module is if first kind of capacity feeder that should zero load directly moves on to this discharging machine as this third capacity feeder by this charger, and first kind of capacity feeder that then should zero load indicates and become this third capacity feeder.
  27. 27, the system as claimed in claim 1 hierarchial test is characterized in that, wherein this compression joint mechanism sends a kind of signal, and the crimping path of representing this compression joint mechanism position at that time to provide cooperates with it with the position of designation area on this test solid plate.
  28. 28, the system as claimed in claim 1 hierarchial test, it is characterized in that, also comprise a kind of test runners and a kind of runners introducing mechanism, this test is electrically connected designation area on this test solid plate with runners, this runners introducing mechanism connects this test runners, is convenient to this to-be-measured integrated circuit of this erector in-migration is imported to this test runners.
  29. 29, systemic hierarchial test as claimed in claim 27 is characterized in that, wherein this runners introducing mechanism is expanded outwardly with around the runners up a little by this test.
  30. 30, a kind of systemic hierarchial test when being plugged on a kind of solid plate designation area in order to test a kind of integrated circuit, is applicable to the degree of this kind solid plate, and this systemic hierarchial test system comprises:
    One container is a test solid plate for holding at least one this kind solid plate;
    One charger, it holds at least one this kind integrated circuit is to-be-measured integrated circuit;
    One erector, in order to this to-be-measured integrated circuit is shifted out this charger and is plugged in designation area on this test solid plate, this erector comprises a compression joint mechanism, in order to this to-be-measured integrated circuit is plugged into designation area on this test solid plate; And
    One tester is tested this solid plate that is plugged with this to-be-measured integrated circuit, to distinguish out the degree that this to-be-measured integrated circuit is applicable to this kind solid plate.
CNB021045291A 2002-02-08 2002-02-08 Systemic hierarchial test Expired - Lifetime CN1186641C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNB021045291A CN1186641C (en) 2002-02-08 2002-02-08 Systemic hierarchial test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNB021045291A CN1186641C (en) 2002-02-08 2002-02-08 Systemic hierarchial test

Publications (2)

Publication Number Publication Date
CN1437029A CN1437029A (en) 2003-08-20
CN1186641C true CN1186641C (en) 2005-01-26

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Family Applications (1)

Application Number Title Priority Date Filing Date
CNB021045291A Expired - Lifetime CN1186641C (en) 2002-02-08 2002-02-08 Systemic hierarchial test

Country Status (1)

Country Link
CN (1) CN1186641C (en)

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Publication number Publication date
CN1437029A (en) 2003-08-20

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