CN118435140A - 异常感测装置、异常感测方法以及异常感测程序 - Google Patents

异常感测装置、异常感测方法以及异常感测程序 Download PDF

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Publication number
CN118435140A
CN118435140A CN202280085861.7A CN202280085861A CN118435140A CN 118435140 A CN118435140 A CN 118435140A CN 202280085861 A CN202280085861 A CN 202280085861A CN 118435140 A CN118435140 A CN 118435140A
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abnormality
data
image data
image
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Chinese (zh)
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山野幸一
冈洋辉
田村和巳
村上优作
武村和俊
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Daicel Corp
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Daicel Corp
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/04—Architecture, e.g. interconnection topology
    • G06N3/045—Combinations of networks
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20084—Artificial neural networks [ANN]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Software Systems (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Computing Systems (AREA)
  • Data Mining & Analysis (AREA)
  • General Engineering & Computer Science (AREA)
  • Biomedical Technology (AREA)
  • Biophysics (AREA)
  • Computational Linguistics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Health & Medical Sciences (AREA)
  • Automation & Control Theory (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Medical Informatics (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Image Analysis (AREA)
CN202280085861.7A 2021-12-27 2022-12-23 异常感测装置、异常感测方法以及异常感测程序 Pending CN118435140A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021-212492 2021-12-27
JP2021212492 2021-12-27
PCT/JP2022/047718 WO2023127748A1 (ja) 2021-12-27 2022-12-23 異常検知装置、異常検知方法及び異常検知プログラム

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CN118435140A true CN118435140A (zh) 2024-08-02

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EP (1) EP4459404A4 (https=)
JP (1) JPWO2023127748A1 (https=)
CN (1) CN118435140A (https=)
WO (1) WO2023127748A1 (https=)

Families Citing this family (7)

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Publication number Priority date Publication date Assignee Title
CN116954171A (zh) * 2023-07-31 2023-10-27 格创东智(武汉)科技有限公司 制程异常处理方法、装置、制程控制系统及存储介质
WO2025079372A1 (ja) * 2023-10-12 2025-04-17 Ｔｍｔマシナリー株式会社 推定プログラム、情報処理装置、および推定方法
CN117576100B (zh) * 2024-01-16 2024-03-22 浙江合丰科技有限公司 一种fpc连接器表面缺陷分级检测评价方法
TW202544948A (zh) * 2024-03-08 2025-11-16 日商東京威力科創股份有限公司 電腦程式、學習模型之產生方法、資訊處理方法及資訊處理裝置
CN119420767B (zh) * 2024-12-30 2025-04-29 武汉车凌智联科技有限公司 一种基于互联网多场景应用的跨维度交互系统
CN120598434B (zh) * 2025-08-06 2025-10-17 宝鸡市聚鑫源新材料股份有限公司 基于工业视觉的钛棒生产质检方法及系统
CN120635835B (zh) * 2025-08-18 2025-10-17 陕西雅泰乳业有限公司 一种奶粉搅拌加工用实时监测方法及系统

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103257366B (zh) * 2012-02-17 2016-03-30 中国石油化工股份有限公司 一种检测搅拌床反应器内结块的方法
JP2013191185A (ja) * 2012-03-15 2013-09-26 Mitsubishi Electric Corp 異変検知装置
JP6842299B2 (ja) 2016-12-28 2021-03-17 三菱パワー株式会社 診断装置、診断方法及びプログラム
US11204594B2 (en) * 2018-12-13 2021-12-21 Fisher-Rosemount Systems, Inc. Systems, methods, and apparatus to augment process control with virtual assistant
JP7020392B2 (ja) * 2018-12-25 2022-02-16 東芝三菱電機産業システム株式会社 データ収集再生システム
EP4160342A4 (en) * 2020-05-29 2024-07-17 Daicel Corporation Abnormal modulation cause identification device, abnormal modulation cause identification method, and abnormal modulation cause identification program
JP7604486B2 (ja) * 2020-05-29 2024-12-23 株式会社ダイセル 異常変調原因特定装置、異常変調原因特定方法及び異常変調原因特定プログラム

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JPWO2023127748A1 (https=) 2023-07-06
WO2023127748A1 (ja) 2023-07-06
EP4459404A1 (en) 2024-11-06
EP4459404A4 (en) 2025-11-19

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