CN118304950A - Probe mechanism, control method thereof and sample analyzer - Google Patents
Probe mechanism, control method thereof and sample analyzer Download PDFInfo
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- CN118304950A CN118304950A CN202211714067.2A CN202211714067A CN118304950A CN 118304950 A CN118304950 A CN 118304950A CN 202211714067 A CN202211714067 A CN 202211714067A CN 118304950 A CN118304950 A CN 118304950A
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- 239000000523 sample Substances 0.000 title claims abstract description 307
- 230000007246 mechanism Effects 0.000 title claims abstract description 46
- 238000000034 method Methods 0.000 title claims abstract description 36
- 238000001514 detection method Methods 0.000 claims abstract description 54
- 230000003287 optical effect Effects 0.000 claims description 17
- 230000008569 process Effects 0.000 abstract description 13
- 230000000903 blocking effect Effects 0.000 description 56
- 230000009471 action Effects 0.000 description 8
- 238000005070 sampling Methods 0.000 description 7
- 238000004140 cleaning Methods 0.000 description 3
- 230000002159 abnormal effect Effects 0.000 description 2
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Abstract
The invention provides a probe mechanism, a control method thereof and a sample analyzer, wherein the probe mechanism comprises a rack, a driving assembly, a probe, a detection assembly and a controller, and the driving assembly is arranged on the rack; the probe is arranged on the driving component in a lifting manner; the detection assembly is arranged on the driving assembly in a lifting manner and is used for detecting first height information of the current height of the probe; the controller is in communication connection with the detection assembly; the controller is used for keeping the probe at the current height or adjusting the height of the probe according to the first height information, and controlling the driving assembly to drive the probe to start resetting at the current height or to start resetting after the height is adjusted. According to the technical scheme, the current height of the probe is detected through the detection assembly, and the starting position during resetting is adjusted according to the current height. Thereby avoid the probe to bump between the in-process that resets and the external structure and lead to damaging, eliminate the risk that the probe reset process exists, improve the reliability of product.
Description
Technical Field
The invention relates to the technical field of biological research instruments, in particular to a probe mechanism, a control method thereof and a sample analyzer.
Background
The probe mechanism is used as one of key components of the sample analysis instrument, and can replace manual operation to perform actions such as sample adding, sampling, pipetting and the like, so that the full automation of the sample analysis instrument is realized. During operation, the control probe descends to the designated height to suck samples, rises to the designated height after the sample sucking is completed, then rotates to the position above the sample adding position to add samples, finally rotates to the cleaning position to clean the inner wall and the outer wall of the probe, and the sample sucking, the sample spitting and the cleaning actions are repeated after the cleaning is completed.
The probe mechanism can reset before working, and in the traditional lifting control method, if the probe mechanism is positioned at a normal working position, the probe is directly moved upwards under the action of the driving mechanism until the reset is completed. If the probe is not in the normal working position, the probe firstly moves downwards under the action of the driving mechanism and then resets, so that the reset height is prevented from exceeding the limit.
However, when the probe is in a lower operating position, there is a potential for the probe tip to collide with the external panel with a significant risk of damage to the probe tip.
Disclosure of Invention
The invention mainly aims to provide a probe mechanism, a control method thereof and a sample analyzer, and aims to solve the technical problem that a probe tip is damaged in a resetting process of a probe.
To achieve the above object, the present invention provides a probe mechanism comprising:
A frame;
the driving assembly is arranged on the rack;
the probe is arranged on the driving assembly in a lifting manner;
the detection component is arranged on the driving component in a lifting manner and is used for detecting first height information of the current height of the probe;
the controller is in communication connection with the detection component;
The controller is used for keeping the probe at the current height or adjusting the height of the probe according to the first height information, and controlling the driving component to drive the probe to start resetting at the current height or to start resetting at the height after adjustment.
Optionally, the controller further comprises:
The judging module is used for judging whether the probe reaches a preset position according to the first height information;
The control module is used for adjusting the height of the probe when the probe does not reach the preset position; and when the probe reaches the preset position, keeping the probe at the current height.
Optionally, the control module is further configured to control the driving assembly to drive the probe to descend by a first preset distance when the probe does not reach the preset position, and control the detecting assembly to detect second height information of the adjusted height of the probe;
The judging module is further used for judging whether the probe reaches the preset position according to the second height information;
the control module is further used for controlling the driving assembly to drive the probe to descend by a second preset interval when the probe does not reach the preset position; and when the probe reaches the preset position, maintaining the height of the probe after the adjustment.
Optionally, the driving assembly includes:
the ball spline is arranged on the frame, and the probe is arranged on the ball spline in a lifting manner;
And the driving piece is connected with the ball spline to drive the probe to lift or rotate on the ball spline.
Optionally, the detection assembly includes:
the optical coupler sensor is arranged on the rack;
And the baffle plate is arranged on the ball spline, wherein the driving piece drives the baffle plate to synchronously move when driving the probe to lift.
Optionally, the probe mechanism further comprises a limiting piece, wherein the limiting piece is arranged on the frame, and the limiting piece is located above the blocking piece.
In addition, in order to solve the above-mentioned problems, the present invention also provides a probe mechanism control method applied to the probe mechanism described above, the probe mechanism control method comprising:
acquiring first height information of the current height of the probe;
Maintaining the probe at the current height or adjusting the height of the probe according to the first height information;
the probe is reset either initially at the current height or after adjustment.
Optionally, the step of maintaining the probe at the current height or adjusting the height of the probe according to the first height information includes:
Judging whether the probe reaches a preset position according to the first height information;
when the probe does not reach the preset position, adjusting the height of the probe;
And when the probe reaches the preset position, keeping the probe at the current height.
Optionally, when the probe does not reach the preset position, the step of adjusting the height of the probe includes:
When the probe does not reach the preset position, the probe is lowered by a first preset interval;
Acquiring second height information of the height of the probe after adjustment;
judging whether the probe reaches the preset position according to the second height information;
When the probe does not reach the preset position, the probe is lowered by a second preset interval;
And when the probe reaches the preset position, maintaining the height of the probe after the adjustment.
In addition, in order to solve the above problems, the present invention also provides a sample analyzer to which the probe mechanism as described above is applied.
According to the technical scheme, the current height of the probe is detected through the detection assembly, and the starting position during resetting is adjusted according to the current height. Thereby avoid the probe to bump between the in-process that resets and the external structure and lead to damaging, eliminate the risk that the probe reset process exists, improve the reliability of product.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to the structures shown in these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a probe mechanism according to the present invention;
FIG. 2 is a schematic diagram of the structure of the detecting assembly in the probe mechanism of the present invention;
FIG. 3 is a flowchart of a first embodiment of a probe control method according to the present invention;
FIG. 4 is a flowchart of a second embodiment of the probe control method according to the present invention;
fig. 5 is a flowchart of a third embodiment of the probe control method according to the present invention.
Reference numerals illustrate:
| Reference numerals | Name of the name | Reference numerals | Name of the name |
| 10 | Rack | 20 | Driving assembly |
| 21 | Ball spline | 22 | Driving piece |
| 30 | Detection assembly | 31 | Optical coupler sensor |
| 32 | Baffle plate | 40 | Probe with a probe tip |
| 50 | Limiting piece | 60 | Thrust rolling needle bearing |
The achievement of the objects, functional features and advantages of the present invention will be further described with reference to the accompanying drawings, in conjunction with the embodiments.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be noted that all directional indicators (such as up, down, left, right, front, and rear … …) in the embodiments of the present invention are merely used to explain the relative positional relationship, movement, etc. between the components in a particular posture (as shown in the drawings), and if the particular posture is changed, the directional indicator is changed accordingly.
Furthermore, descriptions such as those referred to as "first," "second," and the like, are provided for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implying an order of magnitude of the indicated technical features in the present disclosure. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present invention, the meaning of "plurality" means at least two, for example, two, three, etc., unless specifically defined otherwise.
In the present invention, unless explicitly specified and limited otherwise, the terms "connected," "fixed," and the like are to be construed broadly, and for example, "connected" may be either a fixed connection or a removable connection or integrated; can be mechanically or electrically connected; either directly or indirectly, through intermediaries, or both, may be in communication with each other or in interaction with each other, unless expressly defined otherwise. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to the specific circumstances.
In addition, the technical solutions of the embodiments of the present invention may be combined with each other, but it is necessary to be based on the fact that those skilled in the art can implement the technical solutions, and when the technical solutions are contradictory or cannot be implemented, the combination of the technical solutions should be considered as not existing, and not falling within the scope of protection claimed by the present invention.
The invention provides a probe mechanism, referring to fig. 1, the probe mechanism comprises a frame 10, a driving component 20, a probe 40, a detecting component 30 and a controller, wherein the driving component 20 is arranged on the frame 10; the probe 40 is arranged on the driving assembly 20 in a lifting manner; the detecting assembly 30 is arranged on the driving assembly 20 in a lifting manner, and the detecting assembly 30 is used for detecting first height information of the current height of the probe 40; the controller is in communication with the detection assembly 30; the controller is configured to maintain the current height of the probe 40 or adjust the height of the probe 40 according to the first height information, and control the driving component 20 to drive the probe 40 to start to reset at the current height or start to reset at the adjusted height.
The probe 40 is mounted on top of the driving assembly 20, and the driving assembly 20 is lifted and lowered on the frame 10 to drive the probe 40 to lift and lower.
Specifically, the driving assembly 20 may use an air cylinder to drive the probe 40 to lift, and use a motor to drive the probe 40 to rotate, where the probe 40 lifts once to complete the sampling action, and after rotating to the sample loading position, the probe 40 lifts a second time to complete the sample loading action.
Alternatively, to simplify the structure, the driving assembly 20 may also use the ball spline 21 and the driving member 22 to cooperate to realize the lifting and rotating functions of the probe 40.
The ball spline 21 is arranged on the frame 10, and the probe 40 is arranged on the ball spline 21 in a lifting manner; the driving member 22 is coupled to the ball spline 21 to drive the probe 40 to lift or rotate on the ball spline 21. The driving member 22 may be a driving motor or a belt module, so as to drive the ball spline 21 to rotate, and the ball spline 21 rotates to drive the probe 40 to lift.
The detecting assembly 30 may employ, for example, an optocoupler sensor module, a range finder, etc., to detect the current height of the probe 40.
Taking an optical coupler sensor module as an example, please refer to fig. 2, specifically including an optical coupler sensor 31 and a baffle 32, the optical coupler sensor 31 is disposed on the frame 10.
The baffle 32 is fixed on the ball spline 21 through a connecting plate, and the connecting plate is fixed on the ball spline 21 through an upper thrust roller pin bearing 60, a lower thrust roller pin bearing 60 and two bearing check blocks, so that the baffle 32 is prevented from rotating, and the light path of the optocoupler sensor 31 can be stably blocked. Wherein, the driving member 22 drives the blocking piece 32 to move synchronously when driving the probe 40 to lift.
The optocoupler sensor 31 is fixed on the frame 10, the baffle 32 is arranged on the ball spline 21, and the baffle 32 is synchronously lifted along with the lifting of the probe 40. The optocoupler sensor 31 is a slot-type optocoupler, which detects that a certain range of values D1 exists in the vertical direction (D1 is 6.0 mm-7.0 mm), and the baffle 32 has a certain thickness L1 (L1 is 6.0 mm-7.0 mm).
After each sampling and loading, the probe 40 is reset before the next sampling and loading, so that the probe 40 returns to the zero position. The zero point position is a position where the center line of the blocking piece 32 coincides with the center point of the optocoupler sensor 31.
When the probe 40 finishes the last sample application, the probe 40 descends to a lower position, that is, the blocking piece 32 is located below the optocoupler sensor 31, and the optical path of the optocoupler sensor 31 is not blocked by the blocking piece 32. So that the first height information of the current height of the probe 40 is detected to be normal.
The controller then controls the drive assembly 20 to maintain the probe 40 or the blade 32 in the current position and to reset directly at the current position.
In addition, when the probe 40 is not lowered in place after the last sample application is completed, that is, when the probe 40 is at a higher position, the blocking piece 32 is located on the optical path of the optocoupler sensor 31 to block the optical path, so that the first height information of the current height of the probe 40 is detected to be abnormal.
The controller then controls the drive assembly 20 to adjust the height of the probe 40 and begin resetting at the adjusted height.
In the prior art, the baffle 32 is typically lowered by a certain distance to avoid the excessive rise distance exceeding the upper limit value during resetting. However, since the optocoupler sensor 31 has a certain thickness, when the top edge of the baffle 32 is located at the bottom critical area of the detection range of the optocoupler sensor 31, the baffle 32 and the probe 40 are located at a lower position, so that the probe 40 is likely to be damaged due to contact with the external structure when the distance is reduced.
Therefore, in this embodiment, the detection assembly 30 continuously detects the position of the blocking piece 32, so as to indirectly detect the first height information of the probe 40, determine whether the blocking piece 32 is separated from the detection range of the optocoupler sensor 31 according to the first height information, and indicate that the adjustment is completed when the blocking piece 32 is separated from the detection range of the optocoupler sensor 31.
And after the current height is maintained or the height is adjusted, the controller controls the driving piece 22 to drive the ball spline 21 to rotate during resetting, and drives the probe 40 and the baffle 32 to synchronously lift and move. When the center line of the blocking piece 32 moves to overlap with the center line of the detection range of the optocoupler sensor 31, the reset of the probe 40 is completed.
According to the technical scheme of the invention, the current height of the probe 40 is detected by the detection assembly 30, and the starting position during resetting is adjusted according to the current height. Thereby avoiding damage caused by collision between the probe 40 and an external structure in the resetting process, eliminating risks in the resetting process of the probe 40 and improving the reliability of products.
Specifically, the controller further includes a judging module and a control module, where the judging module is configured to judge whether the probe 40 reaches a preset position according to the first height information; the control module is used for adjusting the height of the probe 40 when the probe 40 does not reach the preset position; when the probe 40 reaches the preset position, the probe 40 is maintained at the current height.
In this embodiment, when the blocking piece 32 is not within the detection range of the optocoupler sensor 31, it indicates that the blocking piece 32 and the probe 40 are located at the preset position; when the blocking piece 32 is within the detection range of the optocoupler sensor 31, it indicates that the blocking piece 32 and the probe 40 are not at the preset position.
Further, the probe mechanism further comprises a limiting piece 50, the limiting piece 50 is arranged on the frame 10, and the limiting piece 50 is located above the baffle 32.
In order to prevent misjudgment, a limiting piece 50 is further arranged right above the blocking piece 32, and the limiting piece 50 and the optocoupler sensor 31 are arranged in a staggered manner in the horizontal direction. The height of the limiting piece 50 is higher than that of the optocoupler sensor 31, and the height difference between the limiting piece 50 and the optocoupler sensor 31 is smaller than the thickness of the blocking piece 32, so that when the blocking piece 32 does not block the light path of the optocoupler sensor 31, the blocking piece 32 can only be located below the optocoupler sensor 31, and the detection reliability of the detection assembly 30 is guaranteed.
Further, the control module is further configured to control the driving assembly 20 to drive the probe 40 to descend by a first preset distance when the probe 40 does not reach the preset position, and control the detecting assembly 30 to detect second height information of the adjusted height of the probe 40; the judging module is further configured to judge whether the probe 40 reaches the preset position according to the second height information; the control module is further configured to control the driving assembly 20 to drive the probe 40 to descend by a second preset distance when the probe 40 does not reach the preset position; when the probe 40 reaches the preset position, the probe 40 is maintained at the adjusted height.
In this embodiment, when the height of the probe 40 needs to be adjusted, the controller controls the driving assembly 20 to drive the blocking piece 32 and the probe 40 to descend. Before the adjustment, a maximum adjustment value K1 is first obtained, and the maximum adjustment value K1 can be determined by three parts.
The distance M1 between the first part of the blocking piece 32 and the stopper 50 (M1 is 0.5mm to 2 mm). In this portion, specifically, when the probe 40 is reset to the zero position (refer to that the middle position of the blocking piece 32 is aligned with the light beam emitted by the optocoupler sensor 31 in the normal reset condition, that is, the center of the detection range emitted by the optocoupler sensor 31), the distance between the blocking piece 32 and the limiting member 50 is equal.
The second part is a distance N1 required to be moved when the blocking piece 32 is completely separated from the detection range of the optocoupler sensor 31, wherein N1 is greater than or equal to 1/2×l1. In this portion, the fact that the shutter 32 is completely separated from the detection range of the optocoupler sensor 31 means that the top edge of the shutter 32 descends and just leaves the bottom of the detection range of the optocoupler sensor 31.
The third part is that d1 (d 1 is 0.3 mm-1 mm) is caused by the tolerance of each part of the probe mechanism, namely, when the descending distance K1 is equal to or greater than M1+1/2×L1+d1, the blocking piece 32 can be ensured to be completely separated from the detection range of the optocoupler sensor 31. In this section, the tolerance of the parts includes, in particular, the tolerance of the dimensions of the parts caused by the process, and the thickness of the laser beam emitted by the optocoupler sensor 31 is generally 0.1mm to 0.3mm.
In order to improve the stability of the probe 40 during the resetting process, the present embodiment may be adjusted by a plurality of small-scale adjustments, for example, the probe 40 is first lowered by a first preset distance d2, where d2 should be much smaller than K1, and specifically, the d2 may be set in a range of 1mm to 1.5 mm. Specifically, the first preset distance may be set according to the descent distance K1, for example, 0.3×k1 is greater than or equal to d2 and greater than or equal to 0.1×k1, and in addition, the first preset distance may be fine-tuned according to a tolerance.
After the first adjustment, the detection assembly 30 detects the height of the blocking piece 32, that is, the second height information of the probe 40, once.
When the blocking piece 32 is not within the detection range of the optocoupler sensor 31, the adjustment is completed, the probe 40 is kept at the adjusted height, and the reset is performed at the adjusted height position.
When the blocking piece 32 is within the detection range of the optocoupler sensor 31, the position of the probe 40 is too high, so that the probe 40 can be lowered by a second preset distance d3.
As an embodiment, in this embodiment, d3 is set to d3=k1-d 2, so as to ensure that the blocking piece 32 can completely leave the detection range of the optocoupler sensor 31 during the second adjustment, thereby improving the adjustment efficiency of the probe mechanism of the present invention.
As another embodiment, d3 may be set in a range of 1mm to 1.5mm, and the third height information of the probe 40 is re-detected after the second adjustment, and the above steps are repeated n times until d2+d3+ … dn=k1, that is, the blocking piece 32 can completely leave the detection range of the optocoupler sensor 31, so as to improve the adjustment stability and reliability of the probe mechanism of the present invention.
In addition, in order to solve the above-mentioned problems, the present invention further provides a method for controlling a probe mechanism, referring to fig. 3, fig. 3 is a schematic flow chart of a first embodiment of a method for controlling a probe 40 according to the present invention, where the method for controlling a probe mechanism includes:
step S10: acquiring first height information of the current height of the probe 40;
step S20: maintaining the current height of the probe 40 or adjusting the height of the probe 40 according to the first height information;
step S30: the resetting is started at the current height or the probe 40 is reset at the adjusted height.
The probe 40 is mounted on top of the driving assembly 20, and the driving assembly 20 is lifted and lowered on the frame 10 to drive the probe 40 to lift and lower.
Specifically, the driving assembly 20 may use an air cylinder to drive the probe 40 to lift, and use a motor to drive the probe 40 to rotate, where the probe 40 lifts once to complete the sampling action, and after rotating to the sample loading position, the probe 40 lifts a second time to complete the sample loading action.
Alternatively, to simplify the structure, the driving assembly 20 may also use the ball spline 21 and the driving member 22 to cooperate to realize the lifting and rotating functions of the probe 40.
The ball spline 21 is arranged on the frame 10, and the probe 40 is arranged on the ball spline 21 in a lifting manner; the driving member 22 is coupled to the ball spline 21 to drive the probe 40 to lift or rotate on the ball spline 21. The driving member 22 may be a driving motor or a belt module, so as to drive the ball spline 21 to rotate, and the ball spline 21 rotates to drive the probe 40 to lift.
The detecting assembly 30 may employ, for example, an optocoupler sensor module, a range finder, etc., to detect the current height of the probe 40.
Taking an optical coupler sensing module as an example, the optical coupler sensing module specifically includes an optical coupler sensor 31 and a baffle 32, where the optical coupler sensor 31 is disposed on the frame 10.
The baffle 32 is fixed on the ball spline 21 through a connecting plate, and the connecting plate is fixed on the ball spline 21 through an upper thrust roller pin bearing 60, a lower thrust roller pin bearing 60 and two bearing check blocks, so that the baffle 32 is prevented from rotating, and the light path of the optocoupler sensor 31 can be stably blocked. Wherein, the driving member 22 drives the blocking piece 32 to move synchronously when driving the probe 40 to lift.
The optocoupler sensor 31 is fixed on the frame 10, the baffle 32 is arranged on the ball spline 21, and the baffle 32 is synchronously lifted along with the lifting of the probe 40. The optocoupler sensor 31 is a slot-type optocoupler, which detects that a certain range of values D1 exists in the vertical direction (D1 is 6.0 mm-7.0 mm), and the baffle 32 has a certain thickness L1 (L1 is 6.0 mm-7.0 mm).
After each sampling and loading, the probe 40 is reset before the next sampling and loading, so that the probe 40 returns to the zero position. The zero point position is a position where the center line of the blocking piece 32 coincides with the center point of the optocoupler sensor 31.
When the probe 40 finishes the last sample application, the probe 40 descends to a lower position, that is, the blocking piece 32 is located below the optocoupler sensor 31, and the optical path of the optocoupler sensor 31 is not blocked by the blocking piece 32. So that the first height information of the current height of the probe 40 is detected to be normal.
The controller then controls the drive assembly 20 to maintain the probe 40 or the blade 32 in the current position and to reset directly at the current position.
In addition, when the probe 40 is not lowered in place after the last sample application is completed, that is, when the probe 40 is at a higher position, the blocking piece 32 is located on the optical path of the optocoupler sensor 31 to block the optical path, so that the first height information of the current height of the probe 40 is detected to be abnormal.
The controller then controls the drive assembly 20 to adjust the height of the probe 40 and begin resetting at the adjusted height.
In the prior art, the baffle 32 is typically lowered by a certain distance to avoid the excessive rise distance exceeding the upper limit value during resetting. However, since the optocoupler sensor 31 has a certain thickness, when the top edge of the baffle 32 is located at the bottom critical area of the detection range of the optocoupler sensor 31, the baffle 32 and the probe 40 are located at a lower position, so that the probe 40 is likely to be damaged due to contact with the external structure when the distance is reduced.
Therefore, in this embodiment, the detection assembly 30 continuously detects the position of the blocking piece 32, so as to indirectly detect the first height information of the probe 40, determine whether the blocking piece 32 is separated from the detection range of the optocoupler sensor 31 according to the first height information, and indicate that the adjustment is completed when the blocking piece 32 is separated from the detection range of the optocoupler sensor 31.
And after the current height is maintained or the height is adjusted, the controller controls the driving piece 22 to drive the ball spline 21 to rotate during resetting, and drives the probe 40 and the baffle 32 to synchronously lift and move. When the center line of the blocking piece 32 moves to overlap with the center line of the detection range of the optocoupler sensor 31, the reset of the probe 40 is completed.
According to the technical scheme of the invention, the current height of the probe 40 is detected by the detection assembly 30, and the starting position during resetting is adjusted according to the current height. Thereby avoiding damage caused by collision between the probe 40 and an external structure in the resetting process, eliminating risks in the resetting process of the probe 40 and improving the reliability of products.
Further, referring to fig. 4, fig. 4 is a flowchart of a second embodiment of a control method of the probe 40 according to the present invention, and step S20 includes:
step S21: judging whether the probe 40 reaches a preset position according to the first height information;
Step S22: when the probe 40 does not reach the preset position, adjusting the height of the probe 40;
step S23: when the probe 40 reaches the preset position, the probe 40 is maintained at the current height.
In this embodiment, when the blocking piece 32 is not within the detection range of the optocoupler sensor 31, it indicates that the blocking piece 32 and the probe 40 are located at the preset position; when the blocking piece 32 is within the detection range of the optocoupler sensor 31, it indicates that the blocking piece 32 and the probe 40 are not at the preset position.
Further, the probe mechanism further comprises a limiting piece 50, the limiting piece 50 is arranged on the frame 10, and the limiting piece 50 is located above the baffle 32.
In order to prevent misjudgment, a limiting piece 50 is further arranged right above the blocking piece 32, and the limiting piece 50 and the optocoupler sensor 31 are arranged in a staggered manner in the horizontal direction. The height of the limiting piece 50 is higher than that of the optocoupler sensor 31, and the height difference between the limiting piece 50 and the optocoupler sensor 31 is smaller than the thickness of the optocoupler sensor 31, so that when the blocking piece 32 does not block the optical path of the optocoupler sensor 31, the blocking piece 32 can only be located below the optocoupler sensor 31, and the detection reliability of the detection assembly 30 is guaranteed.
Further, referring to fig. 5, fig. 5 is a flowchart of a third embodiment of a control method of the probe 40 according to the present invention, and step S22 includes:
step S221: when the probe 40 does not reach the preset position, the probe 40 is lowered by a first preset distance;
Step S222: acquiring second height information of the adjusted height of the probe 40;
Step S223: judging whether the probe 40 reaches the preset position according to the second height information;
step S224: when the probe 40 does not reach the preset position, the probe 40 is lowered by a second preset distance;
step S225: when the probe 40 reaches the preset position, the probe 40 is maintained at the adjusted height.
In this embodiment, when the height of the probe 40 needs to be adjusted, the controller controls the driving assembly 20 to drive the blocking piece 32 and the probe 40 to descend. Before the adjustment, a maximum adjustment value K1 is first obtained, and the maximum adjustment value K1 can be determined by three parts.
The distance M1 between the first part of the blocking piece 32 and the stopper 50 (M1 is 0.5mm to 2 mm). In this portion, specifically, when the probe 40 is reset to the zero position (refer to that the middle position of the blocking piece 32 is aligned with the light beam emitted by the optocoupler sensor 31 in the normal reset condition, that is, the center of the detection range emitted by the optocoupler sensor 31), the distance between the blocking piece 32 and the limiting member 50 is equal.
The second part is a distance N1 required to be moved when the blocking piece 32 is completely separated from the detection range of the optocoupler sensor 31, wherein N1 is greater than or equal to 1/2×l1. In this portion, the fact that the shutter 32 is completely separated from the detection range of the optocoupler sensor 31 means that the top edge of the shutter 32 descends and just leaves the bottom of the detection range of the optocoupler sensor 31.
The third part is that d1 (d 1 is 0.3 mm-1 mm) is caused by the tolerance of each part of the probe mechanism, namely, when the descending distance K1 is equal to or greater than M1+1/2×L1+d1, the blocking piece 32 can be ensured to be completely separated from the detection range of the optocoupler sensor 31. In this section, the tolerance of the parts includes, in particular, the tolerance of the dimensions of the parts caused by the process, and the thickness of the laser beam emitted by the optocoupler sensor 31 is generally 0.1mm to 0.3mm.
In order to improve the stability of the probe 40 during the resetting process, the present embodiment may be adjusted by a plurality of small-scale adjustments, for example, the probe 40 is first lowered by a first preset distance d2, where d2 should be much smaller than K1, and specifically, the d2 may be set in a range of 1mm to 1.5 mm.
After the first adjustment, the detection assembly 30 detects the height of the blocking piece 32, that is, the second height information of the probe 40, once.
When the blocking piece 32 is not within the detection range of the optocoupler sensor 31, the adjustment is completed, the probe 40 is kept at the adjusted height, and the reset is performed at the adjusted height position.
When the blocking piece 32 is within the detection range of the optocoupler sensor 31, the position of the probe 40 is too high, so that the probe 40 can be lowered by a second preset distance d3.
As an embodiment, in this embodiment, d3 is set to d3=k1-d 2, so as to ensure that the blocking piece 32 can completely leave the detection range of the optocoupler sensor 31 during the second adjustment, thereby improving the adjustment efficiency of the probe mechanism of the present invention.
As another embodiment, d3 may be set in a range of 1mm to 1.5mm, and the third height information of the probe 40 is re-detected after the second adjustment, and the above steps are repeated n times until d2+d3+ … dn=k1, that is, the blocking piece 32 can completely leave the detection range of the optocoupler sensor 31, so as to improve the adjustment stability and reliability of the probe mechanism of the present invention.
In addition, in order to solve the above problems, the present invention also proposes a sample analyzer to which the probe mechanism as described above is applied.
According to the technical scheme of the invention, the current height of the probe 40 is detected by the detection assembly 30, and the starting position during resetting is adjusted according to the current height. Thereby avoiding damage caused by collision between the probe 40 and an external structure in the resetting process, eliminating risks in the resetting process of the probe 40 and improving the reliability of products.
The foregoing description is only of the preferred embodiments of the present invention and is not intended to limit the scope of the invention, and all equivalent structural changes made by the description of the present invention and the accompanying drawings or direct/indirect application in other related technical fields are included in the scope of the invention.
Claims (10)
1. A probe mechanism, the probe mechanism comprising:
A frame;
the driving assembly is arranged on the rack;
the probe is arranged on the driving assembly in a lifting manner;
the detection component is arranged on the driving component in a lifting manner and is used for detecting first height information of the current height of the probe;
the controller is in communication connection with the detection component;
The controller is used for keeping the probe at the current height or adjusting the height of the probe according to the first height information, and controlling the driving component to drive the probe to start resetting at the current height or to start resetting at the height after adjustment.
2. The probe mechanism of claim 1, wherein the controller further comprises:
The judging module is used for judging whether the probe reaches a preset position according to the first height information;
The control module is used for adjusting the height of the probe when the probe does not reach the preset position; and when the probe reaches the preset position, keeping the probe at the current height.
3. The probe mechanism of claim 2, wherein the control module is further configured to control the driving assembly to drive the probe to descend by a first preset distance and control the detecting assembly to detect second height information of the adjusted height of the probe when the probe does not reach the preset position;
The judging module is further used for judging whether the probe reaches the preset position according to the second height information;
the control module is further used for controlling the driving assembly to drive the probe to descend by a second preset interval when the probe does not reach the preset position; and when the probe reaches the preset position, maintaining the height of the probe after the adjustment.
4. The probe mechanism of claim 1, wherein the drive assembly comprises:
the ball spline is arranged on the frame, and the probe is arranged on the ball spline in a lifting manner;
And the driving piece is connected with the ball spline to drive the probe to lift or rotate on the ball spline.
5. The probe mechanism of claim 4, wherein the detection assembly comprises:
the optical coupler sensor is arranged on the rack;
And the baffle plate is arranged on the ball spline, wherein the driving piece drives the baffle plate to synchronously move when driving the probe to lift.
6. The probe mechanism of claim 5, further comprising a stop disposed on the frame, the stop being located above the baffle.
7. A probe mechanism control method, characterized in that the probe mechanism control method is applied to the probe mechanism according to any one of claims 1 to 6, the probe mechanism control method comprising:
acquiring first height information of the current height of the probe;
Maintaining the probe at the current height or adjusting the height of the probe according to the first height information;
the probe is reset either initially at the current height or after adjustment.
8. The probe mechanism control method according to claim 7, wherein the step of holding the probe at the current height or adjusting the height of the probe according to the first height information comprises:
Judging whether the probe reaches a preset position according to the first height information;
when the probe does not reach the preset position, adjusting the height of the probe;
And when the probe reaches the preset position, keeping the probe at the current height.
9. The probe mechanism control method according to claim 8, wherein the step of adjusting the height of the probe when the probe does not reach the preset position comprises:
When the probe does not reach the preset position, the probe is lowered by a first preset interval;
Acquiring second height information of the height of the probe after adjustment;
judging whether the probe reaches the preset position according to the second height information;
When the probe does not reach the preset position, the probe is lowered by a second preset interval;
And when the probe reaches the preset position, maintaining the height of the probe after the adjustment.
10. A sample analyzer, wherein the sample analyzer is provided with the probe mechanism according to any one of claims 1 to 6.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211714067.2A CN118304950A (en) | 2022-12-29 | 2022-12-29 | Probe mechanism, control method thereof and sample analyzer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211714067.2A CN118304950A (en) | 2022-12-29 | 2022-12-29 | Probe mechanism, control method thereof and sample analyzer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN118304950A true CN118304950A (en) | 2024-07-09 |
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ID=91724412
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202211714067.2A Pending CN118304950A (en) | 2022-12-29 | 2022-12-29 | Probe mechanism, control method thereof and sample analyzer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN118304950A (en) |
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2022
- 2022-12-29 CN CN202211714067.2A patent/CN118304950A/en active Pending
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