CN117890765A - Continuous integrated circuit testing system and testing method thereof - Google Patents
Continuous integrated circuit testing system and testing method thereof Download PDFInfo
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- CN117890765A CN117890765A CN202410068716.9A CN202410068716A CN117890765A CN 117890765 A CN117890765 A CN 117890765A CN 202410068716 A CN202410068716 A CN 202410068716A CN 117890765 A CN117890765 A CN 117890765A
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- 238000007726 management method Methods 0.000 claims description 31
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2868—Complete testing stations; systems; procedures; software aspects
- G01R31/287—Procedures; Software aspects
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2868—Complete testing stations; systems; procedures; software aspects
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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Abstract
The invention discloses a continuous integrated circuit test system and a test method thereof, which relate to the technical field of integrated circuit test systems and comprise a test equipment control module, a test software module, an automatic control system module and a decision feedback module, wherein the test equipment control module is used for controlling test equipment to automatically adapt to an IC and ensuring the test of consistency and repeatability, the test software module is used for calling test software to test the IC and collect test data to generate a test report, the automatic control system module is used for scheduling execution of a test plan and real-time monitoring of the test progress, and the decision feedback module is used for carrying out IC defect tracking and optimal design feedback on the test data. The invention realizes the automatic equipment connection of the IC test by designing the test equipment control module, ensures the correct connection of the IC and the test equipment, provides stable electrical connection and solves the problem of connection error caused by manual assembly connection.
Description
Technical Field
The invention relates to the technical field of integrated circuit testing systems, in particular to a continuous integrated circuit testing system and a testing method thereof.
Background
A continuous integrated circuit testing system is an efficient, automated system for testing Integrated Circuits (ICs). It aims to ensure quality and stability of IC, reduce failure rate, and improve production efficiency.
1. Patent document US07676715B2 discloses an integrated circuit with successive test repetition function blocks, which enables that during normal operation a plurality of blocks can be tested at a time by transferring status information between selected blocks and test blocks, but the above-mentioned patent does not enable an automated device connection function for IC testing.
2. Patent document KR1020150064385A discloses an integrated circuit test apparatus and system that enables monitoring of power consumption and operation status of individual integrated circuits by including an integrated circuit monitoring unit and a wireless communication unit, but the above-mentioned patent does not enable intelligent management and control of IC tests.
3. Patent document CN116359709a discloses an integrated circuit product testing system, which realizes the confirmation of the working state of an abnormal integrated circuit product, judges whether the normal use is affected or not later, and improves the accuracy of the judging result, but the above patent cannot realize the continuity test coordination function of the IC test.
4. Patent document CN115808611a discloses an integrated circuit test system, which realizes automatic detection and statistics of integrated circuits in different types of objects to be tested, but the above patent cannot realize tracking and feedback optimization functions of IC test results.
In summary, the above patent cannot realize automatic equipment connection for IC test, intelligent management and control for IC test, continuous test coordination function for IC test, and tracking and feedback optimization function for IC test result, resulting in low IC test accuracy, poor reliability, uncoordinated continuous test, and failure to track abnormal optimized IC design, which reduces IC product yield;
Therefore, the application provides a continuous integrated circuit test system and a test method thereof, which can realize the automatic equipment connection of the IC test, the intelligent management and control of the IC test, the continuous test coordination function of the IC test and the tracking and feedback optimization function of the IC test result.
Disclosure of Invention
The invention aims to provide a continuous integrated circuit test system and a test method thereof, which are used for solving the technical problems that the IC test accuracy is low, the reliability is poor, continuous test is uncoordinated and abnormal optimization IC design cannot be tracked to reduce the yield of an IC product due to the fact that the automatic equipment connection for IC test, the intelligent management and control for IC test, the continuous test coordination function for IC test and the tracking and feedback optimization functions for IC test results cannot be realized in the background technology.
In order to achieve the above purpose, the present invention provides the following technical solutions: a continuous integrated circuit test system comprises a test equipment control module, a test software module, an automatic control system module and a decision feedback module;
The test equipment control module is connected with the test software module through a signal line, the automatic control module is connected with the test software module through a data line, and the decision feedback module is connected with the test software module and the automatic control system module through a pluggable data port for transmitting data;
the test equipment control module is used for controlling the test equipment to automatically adapt to the IC so as to ensure the test of consistency and repeatability, the test software module is used for calling test software to generate a test report for IC test and collecting test data, the automatic control system module is used for scheduling execution of a test plan and real-time monitoring of test progress, and the decision feedback module is used for carrying out IC defect tracking and optimal design feedback on the test data.
Preferably, the test equipment control module includes: a test seat control unit, a probe card control unit and a test instrument control unit;
the test seat control unit takes the IC off the storage rack by using an automatic mechanical arm and accurately places the IC on the test seat;
The probe card control unit ensures that probes on the probe card contact the IC pins with proper pressure and position by controlling the motor;
The test instrument control unit uses GPIB communication protocol to communicate with the oscillograph and the signal generator test instrument, configures instrument parameters and sends out measurement instructions.
Preferably, the test software module includes: the system comprises a test plan management unit, a test case management unit, a test data acquisition unit, a data analysis processing unit and a report generation unit;
The test plan management unit creates a test plan through GUI software, and a test operator specifies a test stage and a schedule through the test plan management unit;
the test case management unit classifies the test cases of the test case library according to functions, performances, electrical characteristics and fault modes for a test operator to select;
The test data acquisition unit receives test data of the test equipment and the instrument in real time through the data acquisition interface, and transmits the test data to the database for storage;
The data analysis processing unit uses a data analysis algorithm to carry out statistical analysis, anomaly detection and performance evaluation on the data acquired by the test data acquisition unit;
The report generating unit is used for generating a test report by the test software according to the data base acquired by the test data acquisition unit and the data result of the analysis statistics of the data analysis processing unit for the test operator to check and export.
Preferably, the automation control system module includes: the system comprises a test plan dispatching unit, a test case execution control unit and a test progress monitoring unit;
the test plan scheduling unit utilizes a scheduling algorithm to automatically schedule test tasks according to the priority and the resource availability of the test plan;
The test case execution control unit realizes the automatic execution of the test case and comprises the control of parameter setting, test starting and test ending;
The test progress monitoring unit monitors the test progress in real time by using the instrument panel and the alarm system, and gives an alarm to cope with the problem occurring at any time.
Preferably, the decision feedback module includes: a defect tracking management unit and an automated decision support unit;
The defect tracking management unit is used for recording and tracking problems found in IC test;
The automated decision support unit is used for making decisions of repairing defects, optimizing designs and secondary tests based on the results of the test reports and defect information and feeding back the decisions to the test software module.
Preferably, the data analysis processing unit uses a data analysis algorithm as an isolated forest algorithm, and the kernel of the isolated forest algorithm is to identify abnormal values by constructing a random tree on the database data acquired by the test data acquisition unit;
in an isolated forest, simulating the distribution of data by recursively constructing binary trees, randomly selecting a feature from a data set as f for each random tree, randomly selecting a segmentation value between a minimum value and a maximum value of the feature as s, and dividing the data points into a left subtree and a right subtree according to the segmentation value s, wherein the process is performed recursively until the depth of the tree reaches a preset maximum depth or only one data point is left;
To calculate the anomaly score for a data point, it needs to be determined from its depth in the random tree. The shallower the depth, the more easily the data points are isolated, and therefore the lower the anomaly score, the anomaly score is calculated as:
s(x)2-E(h(x))/c
where h (x) is the path length, defined as the depth from the root node to data point x, E (h (x)) is the average path length, for a given random tree, the average of the path lengths of all data points is calculated, s (x) is the anomaly score, and c is a constant value for scaling.
Preferably, the data analysis processing unit performs anomaly detection using an orphan algorithm, identifies outliers by setting a threshold t for the anomaly score, typically s (x) compared to t for relative magnitude, and if s (x) < t, the data point x is considered outliers, otherwise is considered normal.
Preferably, the scheduling algorithm used in the test plan scheduling unit is an FCFS scheduling algorithm, and the specific scheduling algorithm pseudo code is as follows:
The test plans are submitted to the queue and then executed continuously according to the FCFS scheduling algorithm, so that priority execution according to the test plan submitting sequence is realized.
Preferably, the test method comprises the steps of:
S1, firstly, a test plan making and preparing stage: creating a test plan including a test objective, a planning stage and a schedule using a test plan management unit, then selecting an appropriate test case library (function, performance, electrical characteristics, failure mode), selecting and configuring test cases using a test case management unit;
S2, then, entering a test execution stage: the method comprises the steps of using a test seat control unit to correctly mount an IC on a test seat, using a probe card control unit to ensure the correct position and contact pressure of a probe card, using a test instrument control unit to configure and trigger a test instrument, and generating test signals and measuring IC responses;
S3, then, entering a data processing stage: the data processing analysis unit performs statistics, isolation anomaly detection and performance evaluation on the data in the database acquired by the test data acquisition unit, the data are transmitted to the report generation unit, and the report generation unit generates a test report by analyzing the data result of the statistics of the database acquired by the test data acquisition unit and the data analysis processing unit, and stores the test report in a test software record user interface for a test operator to check and export;
and S4, finally, recording and tracking the problems found in the IC by using a defect tracking and management unit.
Preferably, the test method further comprises the steps of:
S11, after the test plan is formulated, the test plan scheduling unit uses the FCFS scheduling algorithm to schedule a first test plan preferentially and continuously execute the test plan;
S21, a test progress monitoring unit monitors the test progress in real time by using an instrument board and an alarm system, and when a response error and disconnection occur in the test, the test progress monitoring unit sends an alarm to remind a tester to calibrate test software and a test IC;
S31, automatically executing the test cases by using a test case execution control unit, and transmitting the acquired data to a test database for storage through a test data acquisition unit;
s41, based on abnormal condition information in the test report generation result, the automatic decision support unit feeds the defect information back to the user interface and the test software, and carries out secondary detection and sends out a decision scheme for optimizing the IC design according to the abnormal information of the detection result.
Compared with the prior art, the invention has the beneficial effects that:
1. The invention realizes the automatic equipment connection of the IC test by designing the test equipment control module, ensures the correct connection of the IC and the test equipment, provides stable electrical connection and solves the problem of connection error caused by manual assembly connection;
2. The invention realizes the intelligent control of the IC test by designing the test software module, ensures the accuracy of the IC test, selects proper test cases for testing and generates an analysis report according to the test data, solves the problem that the visual function of the IC test result cannot be realized, and improves the intellectualization of the IC test;
3. The invention realizes the function of continuous test coordination of IC test by designing the automatic control system module, and solves the problems of test conflict and delay caused by disordered test plan and inaccurate test result;
4. The invention realizes the tracking and feedback optimization functions of IC test results by designing the decision feedback module, improves the yield of IC products and optimizes the IC design level.
Drawings
FIG. 1 is a schematic diagram of a continuous integrated circuit test system according to the present invention;
FIG. 2 is a schematic diagram of a control module of a test apparatus according to the present invention;
FIG. 3 is a schematic diagram of a test software module according to the present invention;
FIG. 4 is a schematic diagram of an automated control system module according to the present invention;
fig. 5 is a schematic diagram of a decision feedback module according to the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In the description of the present invention, it should be noted that the directions or positional relationships indicated by the terms "upper", "lower", "inner", "outer", "front", "rear", "both ends", "one end", "the other end", etc. are based on the directions or positional relationships shown in the drawings, are merely for convenience of describing the present invention and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific direction, be configured and operated in the specific direction, and thus should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "provided," "connected," and the like are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art.
Example 1
Referring to fig. 1-5, an embodiment of the present invention is provided: a continuous integrated circuit test system and a test method thereof comprise a test equipment control module, a test software module, an automatic control system module and a decision feedback module;
The test equipment control module is connected with the test software module through a signal line, the automatic control module is connected with the test software module through a data line, and the decision feedback module is connected with the test software module and the automatic control system module through a pluggable data port for transmitting data;
The test equipment control module is used for controlling the test equipment to automatically adapt to the IC so as to ensure the consistency and repeatability of the test, the test software module is used for calling test software to generate a test report for testing the IC and collecting test data, the automatic control system module is used for scheduling and executing a test plan and monitoring the test progress in real time, and the decision feedback module is used for carrying out IC defect tracking and optimal design feedback on the test data;
Further, firstly, a plurality of test plans are created by using a test software module, each test case library is matched, then, a test equipment control module precisely connects an IC with a test instrument, ensures that the IC is well contacted with test equipment, prevents test deviation, then, an automatic control system module is used for dispatching the test plans, realizing continuous test and monitoring the completion condition of the test progress in real time, ensuring that the test is smoothly carried out and each test is implemented completely, finally, a test report is generated by collecting test data, and the decision feedback module is used for carrying out IC defect tracking repair and IC optimization design feedback on the test data.
Example 2
Referring to fig. 1 and 2, an embodiment of the present invention is provided: a continuous integrated circuit test system and a test method thereof, wherein the test equipment control module comprises: a test seat control unit, a probe card control unit and a test instrument control unit;
the test seat control unit takes the IC off the storage rack by using an automatic mechanical arm and accurately places the IC on the test seat;
The probe card control unit ensures that probes on the probe card contact the IC pins with proper pressure and position by controlling the motor;
The test instrument control unit uses GPIB communication protocol to communicate with the oscillograph and the signal generator test instrument, configures instrument parameters and sends out measurement instructions;
Further, when a specific IC needs to be tested, an operator inputs the identification of the IC through a test software interface, the system will automatically perform the robot arm operation to mount the IC on the test seat, and before the test begins, the system will automatically adjust the position and pressure of the probe card according to the pin arrangement of the IC to ensure a good electrical connection, and during the test, the test software will automatically communicate with the required test instruments to configure their measurement parameters so as to generate the necessary test signals and collect data.
Example 3
Referring to fig. 1 and 3, an embodiment of the present invention is provided: a continuous integrated circuit test system and a test method thereof, wherein the test software module comprises: the system comprises a test plan management unit, a test case management unit, a test data acquisition unit, a data analysis processing unit and a report generation unit;
The test plan management unit creates a test plan through GUI software, and a test operator specifies a test stage and a schedule through the test plan management unit;
the test case management unit classifies the test cases of the test case library according to functions, performances, electrical characteristics and fault modes for a test operator to select;
The test data acquisition unit receives test data of the test equipment and the instrument in real time through the data acquisition interface, and transmits the test data to the database for storage;
The data analysis processing unit uses a data analysis algorithm to carry out statistical analysis, anomaly detection and performance evaluation on the data acquired by the test data acquisition unit;
The report generating unit is used for generating a test report by the test software according to the data base acquired by the test data acquisition unit and the data analysis and processing unit;
Further, an operator creates a test plan by using an interface of test software, selects an IC to be tested and a corresponding test case, and arranges the date and time of the test, the operator selects an appropriate test case in the test software, the test case can be subjected to self-defining setting according to the requirement, after the test starts, test data can be automatically collected and stored in a database, the integrity and accuracy of the data are ensured, the test data are automatically transmitted to a data analysis unit, the unit executes various analyses, abnormal data points are detected, performance indexes are calculated, and once the test is completed and the data analysis is completed, the test software automatically uses a report generation module to generate a test report for the operator to check or export.
Example 4
Referring to fig. 1 and 4, an embodiment of the present invention is provided: a continuous integrated circuit test system and a test method thereof, wherein the automatic control system module comprises: the system comprises a test plan dispatching unit, a test case execution control unit and a test progress monitoring unit;
the test plan scheduling unit utilizes a scheduling algorithm to automatically schedule test tasks according to the priority and the resource availability of the test plan;
The test case execution control unit realizes the automatic execution of the test case and comprises the control of parameter setting, test starting and test ending;
The test progress monitoring unit monitors the test progress in real time by using the instrument board and the alarm system, and gives an alarm to cope with the problem occurring at any time;
Further, the system automatically schedules test tasks according to the test plan and the priorities, ensures that the high-priority tasks are executed first, the test software automatically executes the test according to the setting of the test cases, captures data and stores the results in the database, an operator can check the instrument panel at any time, know the test progress, and the system can automatically give an alarm to cope with potential problems.
Example 5
Referring to fig. 1 and 5, an embodiment of the present invention is provided: a continuous integrated circuit test system and a test method thereof, wherein the decision feedback module comprises: a defect tracking management unit and an automated decision support unit;
The defect tracking management unit is used for recording and tracking problems found in IC test;
the automatic decision support unit is used for making decisions for repairing defects, optimizing designs and secondary tests based on the results of the test reports and defect information and feeding back the decisions to the test software module;
Further, based on the test report, decisions may be taken such as repairing defects, adjusting production parameters, or conducting further tests, which feedback is used to improve the design and manufacturing process of the IC.
The working principle is that firstly, a test environment is initialized, the test equipment is ensured to be connected and installed with an IC correctly by using a control module of the test equipment, then, a continuous proper test plan is formulated by using a test software module, a test target, a stage and a time table are definitely defined, a proper test case library is selected for parameter configuration, then, when the test is started, the automatic control system module is used for continuous test and monitoring the test process in real time, a test report is output, finally, defect tracking and repairing are carried out on the test result report by using a decision feedback module, abnormal information is fed back to the test software, the test software makes an optimization decision, and the IC yield is improved.
It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The present embodiments are, therefore, to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Claims (10)
1. A continuous integrated circuit testing system, characterized by: the system comprises a test equipment control module, a test software module, an automatic control system module and a decision feedback module;
The test equipment control module is connected with the test software module through a signal line, the automatic control module is connected with the test software module through a data line, and the decision feedback module is connected with the test software module and the automatic control system module through a pluggable data port for transmitting data;
the test equipment control module is used for controlling the test equipment to automatically adapt to the IC so as to ensure the test of consistency and repeatability, the test software module is used for calling test software to generate a test report for IC test and collecting test data, the automatic control system module is used for scheduling execution of a test plan and real-time monitoring of test progress, and the decision feedback module is used for carrying out IC defect tracking and optimal design feedback on the test data.
2. A continuous integrated circuit testing system according to claim 1, wherein: the test equipment control module comprises: a test seat control unit, a probe card control unit and a test instrument control unit;
the test seat control unit takes the IC off the storage rack by using an automatic mechanical arm and accurately places the IC on the test seat;
The probe card control unit ensures that probes on the probe card contact the IC pins with proper pressure and position by controlling the motor;
The test instrument control unit uses GPIB communication protocol to communicate with the oscillograph and the signal generator test instrument, configures instrument parameters and sends out measurement instructions.
3. A continuous integrated circuit testing system according to claim 1, wherein: the test software module comprises: the system comprises a test plan management unit, a test case management unit, a test data acquisition unit, a data analysis processing unit and a report generation unit;
The test plan management unit creates a test plan through GUI software, and a test operator specifies a test stage and a schedule through the test plan management unit;
the test case management unit classifies the test cases of the test case library according to functions, performances, electrical characteristics and fault modes for a test operator to select;
The test data acquisition unit receives test data of the test equipment and the instrument in real time through the data acquisition interface, and transmits the test data to the database for storage;
The data analysis processing unit uses a data analysis algorithm to carry out statistical analysis, anomaly detection and performance evaluation on the data acquired by the test data acquisition unit;
The report generating unit is used for generating a test report by the test software according to the data base acquired by the test data acquisition unit and the data result of the analysis statistics of the data analysis processing unit for the test operator to check and export.
4. A continuous integrated circuit testing system according to claim 1, wherein: the automated control system module includes: the system comprises a test plan dispatching unit, a test case execution control unit and a test progress monitoring unit;
the test plan scheduling unit utilizes a scheduling algorithm to automatically schedule test tasks according to the priority and the resource availability of the test plan;
The test case execution control unit realizes the automatic execution of the test case and comprises the control of parameter setting, test starting and test ending;
The test progress monitoring unit monitors the test progress in real time by using the instrument panel and the alarm system, and gives an alarm to cope with the problem occurring at any time.
5. A continuous integrated circuit testing system according to claim 1, wherein: the decision feedback module comprises: a defect tracking management unit and an automated decision support unit;
The defect tracking management unit is used for recording and tracking problems found in IC test;
The automated decision support unit is used for making decisions of repairing defects, optimizing designs and secondary tests based on the results of the test reports and defect information and feeding back the decisions to the test software module.
6. A continuous integrated circuit testing system according to claim 1, wherein: the data analysis processing unit uses a data analysis algorithm as an isolated forest algorithm, and the core of the isolated forest algorithm is to identify abnormal values by constructing a random tree on the database data acquired by the test data acquisition unit;
in an isolated forest, simulating the distribution of data by recursively constructing binary trees, randomly selecting a feature from a data set as f for each random tree, randomly selecting a segmentation value between a minimum value and a maximum value of the feature as s, and dividing the data points into a left subtree and a right subtree according to the segmentation value s, wherein the process is performed recursively until the depth of the tree reaches a preset maximum depth or only one data point is left;
To calculate the anomaly score for a data point, it needs to be determined from its depth in the random tree. The shallower the depth, the more easily the data points are isolated, and therefore the lower the anomaly score, the anomaly score is calculated as:
s(x)2-E(h(x))/c
where h (x) is the path length, defined as the depth from the root node to data point x, E (h (x)) is the average path length, for a given random tree, the average of the path lengths of all data points is calculated, s (x) is the anomaly score, and c is a constant value for scaling.
7. A continuous integrated circuit testing system according to claim 1, wherein: the data analysis processing unit performs anomaly detection using an orphan algorithm, identifies outliers by setting a threshold t for the anomaly score, typically s (x) compared to t for relative magnitude, and if s (x) < t, the data point x is considered outliers, otherwise is considered normal.
8. A continuous integrated circuit testing system according to claim 1, wherein: the dispatching algorithm used in the test plan dispatching unit is an FCFS dispatching algorithm, and the specific dispatching algorithm pseudo code is as follows:
# define a test plan queue, store test plans in commit order
test_plan_queue[]
# Submit test plan to queue
def submit_test_plan(test_plan):
test_plan_queue.append(test_plan)
Execution of test plans in a test plan queue
def execute_test_plans():
while len(test_plan_queue)>0:
# Fetch the next test plan to be executed from the queue
current_test_plantest_plan_queue.pop(0)
# Execute current test plan
execute_test_plan(current_test_plan)
# Outputting test plan information of completion of execution
Print ('execution test plan:', current_test_play)
Example #: submitting a test plan
Submit_test_plan ("test plan 1")
Submit_test_plan ("test plan 2")
Submit_test_plan ("test plan 3")
# Execution test plan
execute_test_plans()
The test plans are submitted to the queue and then executed continuously according to the FCFS scheduling algorithm, so that priority execution according to the test plan submitting sequence is realized.
9. A method of testing a continuous integrated circuit testing system according to any of claims 1-8, wherein: the test method comprises the following steps:
S1, firstly, a test plan making and preparing stage: creating a test plan including a test objective, a planning stage and a schedule using a test plan management unit, then selecting an appropriate test case library (function, performance, electrical characteristics, failure mode), selecting and configuring test cases using a test case management unit;
S2, then, entering a test execution stage: the method comprises the steps of using a test seat control unit to correctly mount an IC on a test seat, using a probe card control unit to ensure the correct position and contact pressure of a probe card, using a test instrument control unit to configure and trigger a test instrument, and generating test signals and measuring IC responses;
S3, then, entering a data processing stage: the data processing analysis unit performs statistics, isolation anomaly detection and performance evaluation on the data in the database acquired by the test data acquisition unit, the data are transmitted to the report generation unit, and the report generation unit generates a test report by analyzing the data result of the statistics of the database acquired by the test data acquisition unit and the data analysis processing unit, and stores the test report in a test software record user interface for a test operator to check and export;
and S4, finally, recording and tracking the problems found in the IC by using a defect tracking and management unit.
10. The method of claim 9, wherein: the test method further comprises the following steps:
S11, after the test plan is formulated, the test plan scheduling unit uses the FCFS scheduling algorithm to schedule a first test plan preferentially and continuously execute the test plan;
S21, a test progress monitoring unit monitors the test progress in real time by using an instrument board and an alarm system, and when a response error and disconnection occur in the test, the test progress monitoring unit sends an alarm to remind a tester to calibrate test software and a test IC;
S31, automatically executing the test cases by using a test case execution control unit, and transmitting the acquired data to a test database for storage through a test data acquisition unit;
s41, based on abnormal condition information in the test report generation result, the automatic decision support unit feeds the defect information back to the user interface and the test software, and carries out secondary detection and sends out a decision scheme for optimizing the IC design according to the abnormal information of the detection result.
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