CN117692075A - Compression point testing device and method - Google Patents

Compression point testing device and method Download PDF

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Publication number
CN117692075A
CN117692075A CN202410107269.3A CN202410107269A CN117692075A CN 117692075 A CN117692075 A CN 117692075A CN 202410107269 A CN202410107269 A CN 202410107269A CN 117692075 A CN117692075 A CN 117692075A
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radio frequency
voltage
parameter
parameters
output
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CN117692075B (en
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朱月月
李佳雨
李尊健
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Nanjing Suirui Technology Co ltd
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Nanjing Suirui Technology Co ltd
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Abstract

The embodiment of the application provides a compression point testing device and a compression point testing method, wherein the compression point testing device comprises: the function signal generator is coupled with the input end of the radio frequency device to be tested, is used for inputting radio frequency signals to the radio frequency device to be tested, and is configured to receive an external preset frequency parameter and a plurality of first voltage parameters so as to generate a plurality of radio frequency signals; the measuring unit is coupled with the output end of the radio frequency device, and the radio frequency device outputs a plurality of output signals when receiving a plurality of radio frequency signals; the measuring unit measures second voltage parameters of the output signals, and determines gain parameters and compression points of the output signals and the radio frequency signals according to the first voltage parameters, the corresponding second voltage parameters and the load impedance of the radio frequency device. Therefore, different radio frequency signals are generated by the function signal generator under the preset frequency parameters, and the test can be realized simply, conveniently and at low cost.

Description

Compression point testing device and method
Technical Field
The application relates to the technical field of radio frequency device testing, and relates to a device and a method for testing a compression point.
Background
The compression point (Compression Point) is a parameter used for measuring the linearity of the radio frequency switch, and the higher the compression point is, the better the linearity of the radio frequency switch is, so that the radio frequency switch with a high compression point can bear higher input power and is widely applied to high-power radio frequency systems, such as radar, communication, satellite, radio and other fields.
The scheme for measuring the compression point is as follows: a signal source is connected to an input of a device under test (Device Under Test, DUT), a power meter is connected to an output of the device under test, the output power at different input powers is measured, and an output power-input power curve is plotted to determine the compression point. However, the direct output power of the signal source adopted at present cannot reach the compression point of the radio frequency device, so that a power amplifier needs to be added at the input end of the device to be tested to boost the input power, and meanwhile, an isolator with a corresponding frequency band is added to protect the signal source and the power amplifier. If the device to be tested is damaged in the test process and total reflection occurs, the signal source is damaged, the signal source with high output power and the power amplifier are high in general value, and the test cost is uncontrollable.
Disclosure of Invention
In view of the foregoing, embodiments of the present application provide a compression point testing apparatus and method.
In a first aspect, an embodiment of the present application provides a test apparatus for a compression point, including: a function signal generator and a measurement unit;
the function signal generator is coupled with the input end of the radio frequency device to be tested, is used for inputting radio frequency signals to the radio frequency device to be tested, and is configured to receive an external preset frequency parameter and a plurality of first voltage parameters to generate a plurality of radio frequency signals, and the first voltage parameters are in one-to-one correspondence with the radio frequency signals; a plurality of radio frequency signals are sent to the input end of the radio frequency device;
the measuring unit is coupled with the output end of the radio frequency device, and the radio frequency device outputs a plurality of output signals when receiving a plurality of radio frequency signals; the measuring unit measures second voltage parameters of the output signals, and determines gain parameters and compression points of the output signals and the radio frequency signals according to the first voltage parameters, the corresponding second voltage parameters and the load impedance of the radio frequency device.
Because different radio frequency signals can be generated by the function signal generator with lower cost, and the compression point of the radio frequency device under the preset frequency parameter is measured by the measuring unit, the signal source and the power amplifier which directly generate the power signal can be avoided, and the test can be completed in a simple, convenient and low-cost mode. Meanwhile, the function signal generator generates radio frequency signals based on preset frequency parameters and a plurality of first voltage parameters, so that the function signal generator is beneficial to generating radio frequency signals covering more frequencies and meets the test requirements of low-frequency scenes and the like.
In some embodiments, the measurement unit includes a voltage measurement module and a calculation module;
the voltage measurement module is coupled with the output end of the radio frequency device and is used for measuring a plurality of second voltage parameters;
the calculation module is connected with the voltage measurement module and is configured to determine the gain parameters and the compression points of the output signal and the radio frequency signal according to a plurality of first voltage parameters, the corresponding second voltage parameters and the load impedance of the radio frequency device.
In some embodiments, the computing module is further connected to the function signal generator, the computing module configured to set a preset frequency parameter and a plurality of first voltage parameters, and send the preset frequency parameter and the plurality of first voltage parameters to the function signal generator;
the preset frequency parameter comprises one or more of a low frequency band, an intermediate frequency band and a high frequency band.
Because the preset frequency parameters relate to the low frequency band, the intermediate frequency band and the high frequency band, the range of the values of the frequency parameters is large, so that the test of more radio frequency devices can be realized, and the application is wide.
In some embodiments, the voltage measurement module comprises an oscilloscope, a voltage sensor, or a multimeter.
The second voltage parameter of each output signal can be obtained through the oscilloscope, the voltage sensor or the universal meter, so that the output power of the output signal can be obtained, and the test requirement is met. In addition, the oscilloscope, the voltage sensor or the universal meter can be used as a voltage measurement module, so that the test cost can be reduced, and the test accuracy can be improved.
In some embodiments, the computing module is configured to determine a plurality of input powers according to each first voltage parameter and a load impedance of the radio frequency device; determining a plurality of output powers according to each second voltage parameter and the load impedance of the radio frequency device; determining a plurality of gain parameters according to the plurality of input powers and the plurality of output powers; comparing a preset value with the variation amplitude of the gain parameter, and determining the input power corresponding to the first voltage parameter as a compression point of the radio frequency device at the preset value when the variation amplitude of the gain parameter reaches the preset value;
the preset values include 0.1dBm and/or 1dBm.
In some embodiments, the radio frequency signal and the output signal are both sine waves; the first voltage parameter and the second voltage parameter each comprise a peak-to-peak voltage parameter, a peak voltage parameter, or an effective voltage parameter.
By setting the variety of the first voltage parameter and the second voltage parameter, the input power of the radio frequency signal and the output power of the output signal can be obtained through any type of voltage parameter, and the measurement of the compression point is facilitated.
In a second aspect, an embodiment of the present application provides a method for testing a compression point, where the method includes:
receiving an external preset frequency parameter and a plurality of first voltage parameters to generate a plurality of radio frequency signals, inputting the plurality of radio frequency signals to a radio frequency device to be tested, wherein the first voltage parameters are in one-to-one correspondence with the radio frequency signals; when the radio frequency device receives a plurality of radio frequency signals, the radio frequency device outputs a plurality of output signals;
and measuring second voltage parameters of the plurality of output signals, and determining gain parameters and compression points of the output signals and the radio frequency signals according to the plurality of first voltage parameters, the corresponding second voltage parameters and the load impedance of the radio frequency device.
Because different radio frequency signals can be directly generated through the preset frequency parameters and the first voltage parameters, and the compression point of the radio frequency device is tested by utilizing the radio frequency signals, the adoption of a signal source and a power amplifier which directly generate power signals can be avoided, and the test can be completed in a simple, convenient and low-cost mode. Meanwhile, the radio frequency signals are generated based on the preset frequency parameters and the first voltage parameters, so that the radio frequency signals covering more frequencies can be generated, and the test requirements of low-frequency scenes and the like can be met.
The preset frequency parameter comprises one or more of a low frequency band, an intermediate frequency band and a high frequency band.
Because the preset frequency parameters relate to the low frequency band, the intermediate frequency band and the high frequency band, the range of the values of the frequency parameters is large, so that the test of more radio frequency devices can be realized, and the application is wide.
In some embodiments, determining gain parameters and compression points of the output signal and the radio frequency signal according to the plurality of first voltage parameters, the corresponding second voltage parameters and the preset frequency parameters includes:
determining a plurality of input powers according to each first voltage parameter and the load impedance of the radio frequency device;
determining a plurality of output powers according to each second voltage parameter and the load impedance of the radio frequency device;
determining a plurality of gain parameters according to the plurality of input powers and the plurality of output powers;
comparing a preset value with the variation amplitude of the gain parameter, and determining the input power corresponding to the first voltage parameter as a compression point of the radio frequency device at the preset value when the variation amplitude of the gain parameter reaches the preset value;
the preset values include 0.1dBm and/or 1dBm.
In some embodiments, the radio frequency signal and the output signal are both sine waves; the first voltage parameter and the second voltage parameter each comprise a peak-to-peak voltage parameter, a peak voltage parameter, or an effective voltage parameter.
By setting the variety of the first voltage parameter and the second voltage parameter, the input power of the radio frequency signal and the output power of the output signal can be obtained through any type of voltage parameter, and the measurement of the compression point is facilitated.
The function signal generator with lower cost is used for generating a radio frequency signal based on a preset frequency parameter and a first voltage parameter and sending the radio frequency signal to the radio frequency device, and the measuring unit is used for measuring a second voltage parameter of an output signal of the radio frequency device, so that gain parameters of the output signal and the radio frequency signal can be determined according to the first voltage parameters, the corresponding second voltage parameters and the load impedance of the radio frequency device, and a compression point can be determined according to the gain parameters. Therefore, a signal source and a power amplifier which directly generate a power signal can be avoided, and the test is completed in a simple, convenient and low-cost mode. Meanwhile, the function signal generator generates radio frequency signals based on preset frequency parameters and a plurality of first voltage parameters, so that radio frequency signals covering more frequencies can be conveniently generated, and the test requirements of low-frequency scenes and the like are met.
Drawings
FIG. 1 is a schematic diagram of a test device for measuring compression points;
FIG. 2 is a flowchart illustrating a method for testing compression points according to an embodiment of the present disclosure;
FIG. 3 shows a power profile of a radio frequency device;
FIG. 4 is a second flow chart of a method for testing compression points according to an embodiment of the present disclosure;
fig. 5 is a schematic structural diagram of a test device for compression points according to an embodiment of the present application.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present application are shown in the drawings, it should be understood that the present application may be embodied in various forms and should not be limited to the specific embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
In the following description, numerous specific details are set forth in order to provide a more thorough understanding of the present application. However, it will be apparent to one skilled in the art that the present application may be practiced without one or more of these details. In other instances, some features have not been described in order to avoid obscuring the application; that is, not all features of an actual embodiment are described herein, nor are the functions and structures that would be understood by those skilled in the art to be described in detail.
In the drawings, the size of layers, regions, elements and their relative sizes may be exaggerated for clarity. Like numbers refer to like elements throughout.
It will be understood that when an element or layer is referred to as being "on" … …, "" adjacent to "… …," "connected to" or "coupled to" another element or layer, it can be directly on, adjacent to, connected to or coupled to the other element or layer, or intervening elements or layers may be present. In contrast, when an element is referred to as being "directly on" … …, "" directly adjacent to "… …," "directly connected to" or "directly coupled to" another element or layer, there are no intervening elements or layers present. It will be understood that, although the terms first, second, third, etc. may be used herein to describe various elements, components, regions, layers and/or sections, these elements, components, regions, layers and/or sections should not be limited by these terms. These terms are only used to distinguish one element, component, region, layer or section from another element, component, region, layer or section. Thus, a first element, component, region, layer or section discussed below could be termed a second element, component, region, layer or section without departing from the teachings of the present application. When a second element, component, region, layer or section is discussed, it does not necessarily mean that the first element, component, region, layer or section is present in the present application.
The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. As used herein, the term "and/or" includes any and all combinations of the associated listed items.
Semiconductor devices have been widely used in the modern electronics industry for control, conversion, amplification, operation, etc. functional circuits, along with the attendant non-linearities. In the radio frequency switch, the radio frequency signal and the output signal of the ideal linear circuit are in a first-order linear relation, and a plurality of nonlinear factors exist in the actual circuit to cause multi-harmonic response. The rf switch compression point is a parameter used when measuring the linearity of the rf switch, and represents a critical point at which nonlinear distortion of the output signal begins to occur when the power of the rf signal of the rf switch reaches a certain value, and is used to evaluate the linearity and power bearing capability of the rf switch. The higher the input compression point (i.e., IP1 dB) of the rf switch when the gain is compressed by 1dB, or the higher the input compression point (i.e., IP0.1 dB) of the rf switch when the gain is compressed by 0.1dB, the better the linearity of the rf switch, the higher the input power can be borne, and the rf switch with a high compression point is widely used in high-power rf systems, such as radar, communication, satellite, radio, and other fields. Therefore, evaluating linearity tests of such devices is extremely important.
Fig. 1 shows a schematic structural diagram of a test device for measuring compression points, and one scheme is as follows: the compression point is determined by connecting the signal source 101 to the input of the device under test 104, connecting the power meter 105 to the output of the device under test 104, measuring the output power at different input powers, and plotting the output power versus the input power. However, when measuring the compression point (IP 1dB or IP0.1 dB) of a radio frequency switch with high linearity, the power directly output by the signal source 101 cannot reach the compression point of the device under test 104. Therefore, the power amplifier 102 needs to be added to the input end of the device under test 104 to boost the input power, and the isolator 103 with corresponding frequency band is added to protect the signal source 101 and the power amplifier 102.
Specifically, when the linearity of the low frequency (such as 9 KHz) of the radio frequency switch is measured, when the maximum linear output of the signal source does not meet the test condition, the signal source with high output power is required to be specially equipped, or the low frequency radio frequency power amplifier and the isolator suitable for testing the low frequency band radio frequency device are equipped, the model selection is difficult, the device to be tested with high linearity cannot be touched, if the device to be tested is damaged in the test process and subjected to total reflection, the signal source is damaged, the signal source with high output power and the power amplifier are high in general value, and the test cost is uncontrollable.
Based on this, the embodiment of the application provides a testing device and a testing method for a compression point, wherein the testing device comprises: a function signal generator and a measurement unit; the function signal generator is coupled with the input end of the radio frequency device to be tested, is used for inputting radio frequency signals to the radio frequency device to be tested, and is configured to receive external preset frequency parameters and a plurality of first voltage parameters to generate a plurality of radio frequency signals, and the first voltage parameters are in one-to-one correspondence with the radio frequency signals; a plurality of radio frequency signals are sent to the input end of the radio frequency device; the measuring unit is coupled with the output end of the radio frequency device, and the radio frequency device outputs a plurality of output signals when receiving a plurality of radio frequency signals; the measuring unit measures second voltage parameters of the output signals, and determines gain parameters and compression points of the output signals and the radio frequency signals according to the first voltage parameters, the corresponding second voltage parameters and the load impedance of the radio frequency device. Because different radio frequency signals can be generated by the function signal generator with lower cost, and the compression point of the radio frequency device under the preset frequency parameter is measured by the measuring unit, the signal source and the power amplifier which directly generate the power signal can be avoided, and the test can be completed in a simple, convenient and low-cost mode. Meanwhile, the function signal generator generates radio frequency signals based on preset frequency parameters and a plurality of first voltage parameters, so that the function signal generator is beneficial to generating radio frequency signals covering more frequencies and meets the test requirements of low-frequency scenes and the like.
The following describes a method and an apparatus for testing compression points according to embodiments of the present application with reference to the accompanying drawings.
An embodiment of the present application provides a method for testing a compression point, which is applied to a device for testing a compression point, and fig. 2 is a schematic flow diagram of the method for testing a compression point provided in the embodiment of the present application, as shown in fig. 2, the method for testing a compression point includes the following steps S201 and S202.
Step S201, receiving an external preset frequency parameter and a plurality of first voltage parameters to generate a plurality of radio frequency signals, inputting the plurality of radio frequency signals to a radio frequency device to be tested, wherein the first voltage parameters are in one-to-one correspondence with the radio frequency signals; when the radio frequency device receives a plurality of radio frequency signals, the radio frequency device outputs a plurality of output signals.
The radio frequency signal is regulated by a preset frequency parameter and a plurality of first voltage parameters, and the radio frequency signal changes along with the change of the first voltage parameters; a plurality of radio frequency signals may enter the input of the radio frequency device in sequence. For example, different radio frequency signals may be generated based on the preset frequency parameter and the different first voltage parameter, and the different radio frequency signals may be sent to the input terminal of the radio frequency device to be tested.
It should be noted that the rf device to be tested may be any rf device such as an rf power amplifier, an rf low noise amplifier, a limiter, an rf switch, a filter, or a duplexer.
In some embodiments, the preset frequency parameter is a preset frequency parameter, and the preset frequency parameter may be a low frequency band (0.3 khz-300 khz), an intermediate frequency band (300 khz-3 mhz), and a high frequency band (3 mhz-30 mhz), specifically, an ultra-low frequency band (0.3 khz-3 khz), an ultra-low frequency band (3 khz-30 khz), or an ultra-low frequency band (30 khz-300 khz) in the low frequency band. In other implementations, the predetermined frequency parameter may be a part of the vhf band (30 MHz to 300 MHz), for example, a band less than 100MHz in the vhf band. Because the range of the preset frequency parameter is large, the test of more radio frequency devices can be realized, and the application is wide.
In some embodiments, the first voltage parameter may be a preset voltage parameter, for example, a peak-to-peak voltage parameter, a peak voltage parameter, an effective voltage parameter, or other types of voltage parameters.
It should be noted that the plurality of first voltage parameters are the same, for example, the plurality of first voltage parameters are peak-to-peak voltage parameters, or the plurality of first voltage parameters are effective voltage parameters.
By setting the variety of the first voltage parameter and the second voltage parameter, the input power of the radio frequency signal and the output power of the output signal can be obtained through any type of voltage parameter, and the measurement of the compression point is facilitated.
It should be further noted that the radio frequency signals may be sine waves, and each radio frequency signal is adjusted by a frequency parameter and a first voltage parameter. In some embodiments, the frequency parameters of the plurality of radio frequency signals are the same, and the first voltage parameters of the plurality of radio frequency signals are different, that is, each first voltage parameter corresponds to one radio frequency signal, and the radio frequency signal changes with the change of the first voltage parameter.
In some embodiments, the test device of the compression point comprises a function signal generator; the function signal generator can output signals within a certain power range at a required frequency (namely, a preset frequency parameter). Specifically, the power range of the signal output by the function signal generator can be adjusted by the input first voltage parameter, and a person skilled in the art can obtain a radio frequency signal with the required power at any frequency by controlling the input first voltage parameter and the input preset frequency parameter.
In some embodiments, the preset frequency parameter and the first voltage parameter may be set by a calculation module, which sends the set preset frequency parameter and first voltage parameter to the function signal generator. At this time, "outside" may be understood as the outside of the function signal generator.
Here, the function signal generator may be a signal source or an oscillator that generates a voltage signal, for example.
It should be noted that, the radio frequency signal generated by the function signal generator in the embodiment of the present application is a sine wave voltage signal, and the sine wave voltage signal may cover a direct current to a high frequency alternating current. In the scheme, a test scene with a lower frequency point is adopted, a sine wave voltage signal generated by a function signal generator is used as a radio frequency signal, and an input power value is obtained through conversion of voltage and power, so that a compression point is obtained. The signal source in the related art is a radio frequency signal source for directly outputting a power signal, the frequency range of the radio frequency signal source is a wide frequency range of radio frequency microwaves, and the method is not applicable to a test scene of a lower frequency point.
In some embodiments, the implementation of step S201 may include the steps of:
setting a preset frequency parameter and a plurality of different first voltage parameters;
The preset frequency parameters and a plurality of different first voltage parameters are sent to the function signal generator, so that the function signal generator outputs different radio frequency signals.
The function signal generator acquires the frequency parameter and a plurality of different first voltage parameters, namely, can output radio frequency signals with different powers under the preset frequency parameter, so that the radio frequency signals under any frequency parameter can be provided, and the test requirement is met.
In some embodiments, an output signal may be output according to the preset frequency parameter and a first voltage parameter, and the function signal generator may output radio frequency signals with different output power levels under the preset frequency parameter by inputting the preset frequency parameter and the different first voltage parameter into the function signal generator.
In some embodiments, the function signal generator is coupled to the input of the rf device to be tested, such that the output signal generated by the function signal generator is transmitted to the input of the rf device to be tested.
It should be noted that, the coupling of the function signal generator to the input terminal of the rf device to be tested means: the function signal generator and the input end of the radio frequency device to be tested can be directly connected or indirectly connected, namely 'coupling' comprises two modes of direct connection or indirect connection. The "coupling" appearing in the subsequent specification can be understood with reference to the above explanation.
Step S202, measuring second voltage parameters of a plurality of output signals, and determining gain parameters and compression points of the output signals and the radio frequency signals according to the first voltage parameters, the corresponding second voltage parameters and the load impedance of the radio frequency device.
It should be noted that after each rf signal is input from the input end of the rf device, the output end of the rf device generates a corresponding output signal, the output signal is a sine wave, and compared with the rf signal, the frequency parameter of the output signal is unchanged, and the voltage parameter is changed from the first voltage parameter to the second voltage parameter.
It should be further noted that the second voltage parameter may be a peak-to-peak voltage parameter, a peak voltage parameter, an effective voltage parameter, or another type of voltage parameter.
It should be noted that, in some embodiments, the gain parameter is a ratio between the output power of the output signal and the input power of the rf signal, and the gain parameter of the rf device is the gain of the rf device power.
In some embodiments, the test device of the compression point comprises a measurement unit, wherein the measurement unit is coupled with an output end of the radio frequency device, and the radio frequency device outputs a plurality of output signals when receiving a plurality of radio frequency signals; the measuring unit measures second voltage parameters of the output signals, and determines gain parameters and compression points of the output signals and the radio frequency signals according to the first voltage parameters, the corresponding second voltage parameters and the load impedance of the radio frequency device.
In some embodiments, the measurement unit comprises a voltage measurement module and a calculation module, wherein the voltage measurement module is coupled to an output of the radio frequency device for measuring a plurality of second voltage parameters; the computing module is connected with the voltage measuring module and is configured to determine the input power of the input signal and the output power of the output signal according to the first voltage parameters, the corresponding second voltage parameters and the load impedance of the radio frequency device, determine the gain parameters according to the input power and the output power and determine the compression point according to the change of the gain parameters.
In some embodiments, the voltage measurement module includes an oscilloscope, a voltage sensor, or a multimeter. When the voltage measurement module comprises an oscilloscope, the oscilloscope is coupled with the output end of the radio frequency device, and the process of measuring the second voltage parameters of the plurality of output signals by the measurement unit can be implemented by the following steps:
capturing the waveform of each output signal by adopting an oscilloscope;
a second voltage parameter for each output signal is output based on the captured waveforms.
In some embodiments, since the oscilloscope is coupled to the output terminal of the rf device, the waveform of the output signal passing through the rf device can be captured by the oscilloscope, so that the second voltage parameter corresponding to the output signal can be obtained. The second voltage parameter obtained by the oscilloscope may be a peak-to-peak voltage parameter or a peak-to-voltage parameter.
The oscillograph captures the waveform of the output signals and outputs each output signal, so that the second voltage parameter of each output signal can be obtained, the output power of the output signal can be obtained, and the test requirement is met.
In some embodiments, when the voltage measurement module comprises an oscilloscope, it is also desirable to provide an acquisition device for acquiring a second voltage parameter for each output signal based on the captured waveforms. Specifically, the second voltage parameter of each output signal may be automatically acquired by a program in the acquisition device. Therefore, the accurate collection of test index data can be realized through a program automatic collection mode, and the test efficiency is greatly improved.
In other embodiments, when the voltage measurement module includes a multimeter, the multimeter is coupled to the output of the radio frequency device such that a second voltage parameter of the output signal passing through the radio frequency device can be tested by the multimeter. It should be noted that the second voltage parameter measured by the multimeter is an effective voltage parameter.
In other embodiments, when the voltage measurement module includes a voltage sensor coupled to the output of the radio frequency device, a second voltage parameter of the output signal passing through the radio frequency device may be tested by the voltage sensor. The second voltage parameter measured by the voltage sensor is an effective voltage parameter.
In some embodiments, the step of determining the gain parameters and the compression points of the output signal and the radio frequency signal according to the plurality of first voltage parameters, the corresponding second voltage parameters and the load impedance of the radio frequency device may include the steps of:
determining a plurality of input powers according to each first voltage parameter and the load impedance of the radio frequency device;
determining a plurality of output powers according to each second voltage parameter and the load impedance of the radio frequency device;
a plurality of gain parameters are determined based on the plurality of input powers and the plurality of output powers.
It should be noted that, the first voltage parameter and the second voltage parameter may be peak-to-peak voltage parameter, peak voltage parameter or effective voltage parameter; wherein the relationship between the peak-to-peak voltage parameter and the peak voltage parameter satisfies the following formula (1), and the relationship between the peak voltage parameter and the effective voltage parameter satisfies the following formula (2):
（1）；
（2）；
wherein,as a parameter of the peak-to-peak voltage,as a parameter of the peak voltage value,is an effective voltage parameter.
In some embodiments, when the first voltage parameter and the second voltage parameter are both peak-to-peak voltage parametersAt the time, a first voltage parameterThe relation with the input power satisfies the following formula (3), the second voltage parameter The relationship with the output power satisfies the following formula (4):
（3）；
（4）；
wherein,is input power in milliwatts%）；Is output power in units of；Which is the load impedance of the radio frequency device, in ohms (ohm),the value was 50ohm. By a known peak-to-peak voltage parameter (i.e. a plurality of first voltage parameters)) By combining the above formula (3), a plurality of input powers can be determinedBy a plurality of peak-to-peak voltage parameters (i.e. a plurality of second voltage parameters)) By combining the above formula (4), a plurality of output powers can be determined。
In some embodiments, when the first voltage parameter and the second voltage parameter are both peak voltage parametersAt the time, a first voltage parameterAnd the input power satisfies the following formula (5), and the second voltage parameterThe relation with the output power satisfies the following formula (6):
（5）；
（6）；
wherein,is input power in units of；Is output power in units of；Is the load impedance of the radio frequency device, in ohms,the value was 50ohm. By a known peak voltage parameter (i.e. a plurality of first voltage parameters)) By combining the above formula (5), a plurality of input powers can be determined By a plurality of peak voltage parameters (i.e. a plurality of second voltage parameters)) By combining the above formula (6), a plurality of output powers can be determined。
In some embodiments, when the first voltage parameter and the second voltage parameter are both effective voltage parametersAt the time, a first voltage parameterAnd the input power satisfies the following formula (7), and the second voltage parameterThe relation with the output power satisfies the following formula (8):
（7）；
（8）；
wherein,is input power in units of；Is output power in units of；Is the load impedance of the radio frequency device, in ohms,the value was 50ohm. By knowing the effective voltage parameters of the plurality of radio frequency signals (i.e. the plurality of first voltage parameters) By combining the above formula (7), a plurality of input powers can be determinedBy a plurality of peak voltage parameters (i.e. a plurality of second voltage parameters)) By combining the above formula (8), a plurality of output powers can be determined。
In some embodiments, in determining a plurality of input powersAnd a plurality of output powersThen, the plurality of input powers are calculated by the following formula (9)Conversion toAnd outputs a plurality of output powers by the following formula (10)Conversion to。
（9）；
（10）；
In determining multiple input powers And a plurality of output powersThereafter, each output power can be setWith corresponding input powerIs determined as the gain parameter.
In some embodiments, the method further comprises: comparing a preset value with the variation amplitude of the gain parameter, and determining the input power corresponding to the first voltage parameter as the compression point of the radio frequency device at the preset value when the variation amplitude of the gain parameter reaches the preset value. The preset values include 0.1dBm and 1dBm.
It should be noted that, when the radio frequency device works in the linear region, the gain parameter is constant, and as the input power of the radio frequency device is continuously increased to a preset power value, the radio frequency device starts to enter the nonlinear region to work, when the radio frequency device works in the nonlinear region, the gain parameter starts to gradually decrease, and the decreasing amplitude is not constant, and when the decreasing amplitude of the gain parameter reaches the preset value, the input power corresponding to the first voltage parameter at this time is the compression point of the radio frequency device at the preset value.
For example, when the radio frequency device is operated in the linear region, the gain parameter is always 20dB, when the radio frequency device is operated in the nonlinear region, the gain parameter is gradually reduced from 20dB, and when the gain parameter is reduced to 19.9dB, the input power corresponding to the first voltage parameter is the compression point of the radio frequency device at 0.1 dB; the input power corresponding to the first voltage parameter when the gain parameter is reduced to 19dB is the compression point of the radio frequency device at 1 dB.
In some embodiments, in determining a plurality of input powersAnd a plurality of output powersThereafter, it is also possible to base on a plurality of input powersAnd a plurality of output powersA power curve is plotted and compression points are determined based on the power curve.
Specifically, FIG. 3 schematically illustrates a power profile of a radio frequency device, as shown in FIG. 3, when power is inputLess than or equal toAnd output powerLess than or equal toWhen the RF device is operating in a linear region, e.g., at input powerIs MDS (micro-s) 1 And output powerIs MDS (micro-s) 2 When the radio frequency device works in the linear area; when inputting powerGreater thanWhen the RF device enters a nonlinear region, the RF device is driven with the input powerIs increased in output powerWork input and outputThe ratio of the rate (i.e., the gain parameter) starts to decrease, and when the gain parameter decreases by 1dB (i.e., the gain-1 dB), the point a in fig. 3 is reached, so that the input power corresponding to the point a is the compression point of the radio frequency device at 1 dB. After reaching the compression point of 1dB of the radio frequency device, the power is inputContinuously increasing the output power of the RF deviceNear saturation, i.e. output powerReaching saturated output power. In addition, the shot shown in FIG. 3The frequency device has a dynamic range in which the power is input Is increased in output powerThe linear increase is followed by the nonlinear increase.
According to the method for testing the compression point, different radio frequency signals can be directly generated through the preset frequency parameters and the first voltage parameters, and the compression point of the radio frequency device is tested by utilizing the radio frequency signals, so that the radio frequency signals for testing the compression point of the radio frequency device can be prevented from being generated by adopting a signal source and a power amplifier, and the method is beneficial to reducing the testing cost.
Another embodiment of the present application further provides a method for testing a compression point, and fig. 4 is a second flowchart of the method for testing a compression point provided in the embodiment of the present application, as shown in fig. 4, where the method for testing a compression point includes the following steps:
step S401, storing a plurality of first voltage parameters of the set function signal generator into a test table;
the first voltage parameter may be, for example, a plurality of peak-to-peak voltagesMultiple peak voltagesOr a plurality of effective voltages。
Step S402, capturing a test waveform (corresponding to the waveform of the output signal in the above embodiment) by using an oscilloscope, and reading a corresponding second voltage parameter;
the second voltage parameter may be, for example, a plurality of peak-to-peak voltages Multiple peak voltagesOr a plurality of effective voltages。
Step S403, the read second voltage parameter is stored in a test table;
step S404, automatically generating an input power value corresponding to each first voltage parameter and an output power value corresponding to each second voltage parameter through formula calculation;
it should be noted that the formulas in step S404 include formulas (1) to (10) in the above-described embodiment.
In some embodiments, the first voltage parameters and the second voltage parameters are stored in a preset table, so that input power corresponding to each first voltage parameter and output power corresponding to each second voltage parameter can be generated quickly, and testing precision and testing efficiency are improved.
Table 1 below exemplarily shows a voltage-power calculation table at a load of a radio frequency device of 50 ohm impedance:
table 1:
as can be seen from table 1 above, when any one of the peak-to-peak voltage, the peak voltage (i.e., voltage amplitude), or the effective voltage (i.e., voltage effective value) is known, the corresponding power (mW) or power (dBm) can be obtained by the above formulas (1) to (10).
In some embodiments, the plurality of first voltage parameters and the plurality of second voltage parameters are each stored in a test table in which an input power (mW) and an input power (dBm) corresponding to the first voltage parameters and an output power (mW) and an output power (dBm) corresponding to the second voltage parameters may be automatically generated through the above formulas (1) to (10).
Step S405, automatically marking the index result according to the test index definition.
Here, the test index definition may be: the gain (corresponding to the gain parameter in the above embodiment) is determined according to the multiple input powers and the multiple output powers, when the gain starts to decrease, the radio frequency device is characterized to enter a nonlinear working area, when the gain decreases by 0.1dB, the input power at this time is the compression point of the radio frequency device at 0.1dB, and when the gain decreases by 1dB, the input power at this time is the compression point of the radio frequency device at 1 dB.
In some embodiments, after determining the 0.1dB or 1dB compression point, the compression point may be marked to facilitate a clear and rapid determination of the linearity of the RF device by those skilled in the art.
For example, a predetermined frequency parameter F and a first voltage parameter V are input to the function signal generator 11 The output and input power of the function signal generator is P 11 (mW) radio frequency signals, after the radio frequency signals pass through the radio frequency device to be tested, capturing the test radio frequency signals through an oscilloscope to obtain a second voltage parameter V 12 The corresponding output power is P 12 An output signal of (mW) to input power P 11 (mW) and output Power P 12 (mW) conversion to input Power P 11 (dBm) and output power P 12 (dBm) output power P 12 (dBm) and input Power P 11 The ratio of (dBm) is determined as gain G 1 The method comprises the steps of carrying out a first treatment on the surface of the Next, a preset frequency parameter F and a first voltage parameter V are input to the function signal generator 21 The output and input power of the function signal generator is P 21 (mW) radio frequency signals, after the radio frequency signals pass through the radio frequency device to be tested, capturing the test radio frequency signals through an oscilloscope to obtain a second voltage parameter V 22 The corresponding output power is P 22 An output signal of (mW) to input power P 21 (mW) and output Power P 22 (mW) conversion to input Power P 21 (dBm) and output power P 22 (dBm) output power P 22 (dBm) and input Power P 21 The ratio of (dBm) is determined as the gainG 2 Next, the output power P is obtained in the same manner n2 (dBm) and input Power P n1 Gain G determined by ratio of (dBm) n Wherein n is a positive integer greater than 2; for example, gain G can be obtained 1 、G 2 、G 3 、G 4 、G 5 、G 6 、G 7 、G 8 、G 9 、G 10 。
In some embodiments, the gain is constant when the RF device is operating in the linear region, e.g., gain G 1 、G 2 、G 3 、G 4 、G 5 Are all equal, when the radio frequency device works in the nonlinear region, the gain is controlled from G 5 To G 10 Start to gradually decrease, assume G 5 To G 7 The gain is reduced by 0.1dB, at which time G will be 7 Corresponding input power P 71 (dBm) is marked as the compression point of the RF device at 0.1dB under the frequency parameter F, and assume G 5 To G 10 The gain is reduced by 1dB, at this time, G 10 Corresponding input power P 101 (dBm) is labeled as the compression point of the RF device at 1dB at a frequency parameter F.
The embodiment of the application provides a method for improving the input power of a low frequency band of a test system, which can solve the problem that in the related art, the direct output power of a signal source in the low frequency band is smaller and a power amplifier is needed to improve the input power.
Another embodiment of the present application provides a test device for a compression point, and fig. 5 is a schematic structural diagram of the test device for a compression point provided in the embodiment of the present application, as shown in fig. 5, the test device 50 for a compression point includes: a function signal generator 501 and a measurement unit 503.
The function signal generator 501 is coupled to the rf device 502 to be tested, and is configured to receive an external preset frequency parameter and a plurality of first voltage parameters to generate a plurality of rf signals; the first voltage parameter corresponds to the radio frequency signal one by one; a plurality of rf signals are provided to the input of rf device 502; i.e. the radio frequency signal varies with the variation of the first voltage parameter; different rf signals enter the input of the rf device 502.
The measurement unit 503 is coupled to an output terminal of the rf device 502, and when the rf device 502 receives a plurality of rf signals, the rf device outputs a plurality of output signals; the measurement unit 503 measures second voltage parameters of the plurality of output signals, and determines gain parameters and compression points of the output signals and the radio frequency signals according to the plurality of first voltage parameters, the corresponding second voltage parameters and the load impedance of the radio frequency device.
In some embodiments, the measurement unit 503 includes a voltage measurement module 5031 and a calculation module 5032, and in other embodiments, the measurement unit 503 may include only the voltage measurement module 5031, or the measurement unit 503 may include other modules.
The voltage measurement module 5031 is coupled to the rf device 502, and is configured to measure a second voltage parameter corresponding to each output signal obtained from the output terminal of the rf device 502;
The computing module 5032 is communicatively coupled to the voltage measurement module 5031 and configured to determine a gain parameter and a compression point of the output signal and the rf signal based on the plurality of first voltage parameters, the corresponding second voltage parameters, and the load impedance of the rf device.
Because different radio frequency signals can be generated through the function signal generator with lower cost, and the compression point of the radio frequency device under the preset frequency parameter is measured through the voltage measuring module and the calculating module, the adoption of a signal source and a power amplifier to generate the radio frequency signal for testing the compression point of the radio frequency device can be avoided, and the test cost is reduced.
It should be noted that the function signal generator 501 may be a signal source or an oscillator. The function signal generator 501 is used to generate different types of signals, allowing the user to adjust the frequency of the output signal, typically in a wide frequency range, from a few hertz to hundreds of megahertz or even higher; while the function signal generator 501 also provides an amplitude adjustment function that allows the user to control the amplitude of the output signal (i.e., the rf signal), which allows the rf signal to be scaled up or down as desired. In some embodiments, the function signal generator 501 may be used to replace a low-frequency signal source and output a radio-frequency signal with a certain power range at a required frequency point (i.e. a preset frequency parameter).
It should be further noted that, in the embodiments of the present application, the rf signal generated by the function signal generator (i.e., the signal source) may cover a direct current to a high frequency alternating current. In the scheme, a test scene with a lower frequency point is adopted, a sine wave voltage signal generated by a function signal generator is used as a radio frequency signal, and an input power value is obtained through conversion of voltage and power, so that a compression point is obtained. The signal source in the related art is a radio frequency signal source for directly outputting a power signal, the frequency range of the radio frequency signal source is a wide frequency range of radio frequency microwaves, and the method is not applicable to a test scene of a lower frequency point.
In some embodiments, the computing module 5032 is communicatively coupled to the function signal generator 501 (as shown by the dashed line in fig. 5), and the computing module 5032 is further configured to set the preset frequency parameter and the different first voltage parameter and send the preset frequency parameter and the different first voltage parameter to the function signal generator 501.
In some embodiments, the preset frequency parameter and the plurality of different first voltage parameters are parameters preset by a user, and the preset frequency parameter at least includes a low frequency band (0.3 khz-300 khz), an intermediate frequency band (300 khz-3 mhz), and a high frequency band (3 mhz-30 mhz). The calculating module 5032, upon receiving the preset frequency parameter and each first voltage parameter, sends the preset frequency parameter and each first voltage parameter to the function signal generator 501, and the function signal generator 501 generates a plurality of radio frequency signals based on the preset frequency parameter and each first voltage parameter.
Here, the output signal may be a sine wave.
In some embodiments, the first voltage parameter and the second voltage parameter each comprise a peak-to-peak voltage parameter, a peak voltage parameter, or an effective voltage parameter. Because the preset frequency parameters relate to the low frequency band, the intermediate frequency band and the high frequency band, the range of the values of the frequency parameters is large, so that the test of more radio frequency devices can be realized, and the application is wide.
It should be noted that, the output terminal of the function signal generator 501 is coupled to the input terminal of the rf device 502, so that the output signal (i.e., the rf signal) of the function signal generator 501 may enter the rf device 502, and the output terminal of the rf device 502 is coupled to the input terminal of the voltage measurement module 5031, so that the voltage measurement module 5031 can obtain the output signal and measure the second voltage parameter of the output signal.
In some embodiments, the voltage measurement module 5031 includes an oscilloscope and an acquisition device. An oscilloscope is an electronic test instrument for observing waveforms of electric signals and measuring characteristics of the signals, and displaying waveforms of voltage varying with time by connecting to a circuit under test and measuring the voltage thereof, these waveforms are generally displayed in two-dimensional patterns on a screen of the oscilloscope, the horizontal axis representing time, the vertical axis representing voltage, and the bandwidth of the oscilloscope determining the ability to accurately display high-frequency signals. The higher the bandwidth, the wider the frequency range that the oscilloscope can display; it can be used to replace the power meter, the amplitude (i.e. the second voltage parameter) is read by capturing the voltage waveform with certain frequency and amplitude, and the output power is calculated by the conversion formula of voltage and power.
In some embodiments, the acquisition device may be a lower computer, such as a programmable logic controller (Programmable Logic Controller, PLC) or a single chip microcomputer. The computing module 5032 may be a host computer, i.e., the computing module 5032 may be a stand-alone computer capable of communicating with the acquisition device.
In some embodiments, an oscilloscope is coupled to the output of the rf device 502 for capturing waveforms of each output signal acquired from the output of the rf device 502; the acquisition device is in communication connection with the oscilloscope, and is used for acquiring a second voltage parameter of a waveform captured by the oscilloscope and sending the acquired second voltage parameter to the calculation module 5032; the computing module 5032 is further configured to determine a plurality of input powers from each of the first voltage parameters and the load impedance of the radio frequency device, determine a plurality of output powers from the second voltage parameters corresponding to each of the first voltage parameters and the load impedance of the radio frequency device, and determine a plurality of gain parameters from the plurality of input powers and the plurality of output powers; comparing a preset value with the variation amplitude of the gain parameter, and determining the input power corresponding to the first voltage parameter as a compression point of the radio frequency device at the preset value when the variation amplitude of the gain parameter reaches the preset value, wherein the preset value comprises 0.1dBm and 1dBm.
The waveform of the output signals is captured through the oscilloscope, so that the second voltage parameter of each output signal can be obtained, the output power of the output signals can be obtained, and the test requirement is met. In addition, the oscilloscope is used as a voltage measurement module, so that the test cost can be reduced, and the test accuracy can be improved.
It should be noted that, the manner of determining the compression point implemented by the computing module 5032 is similar to the above embodiment, and will not be described herein.
In some embodiments, the voltage measurement module 5031 further includes a multimeter for measuring a second voltage parameter corresponding to each output signal. The multimeter can be communicatively coupled to the computing module 5032 via a USB interface or a wireless network so that the second voltage parameter can be sent to the computing module 5032. In other embodiments, the multimeter can also be disconnected from the computing module 5032, and the user can manually collect a second voltage parameter collected by the multimeter and input it to the computing module 5032.
In some embodiments, the voltage measurement module 5031 includes a voltage sensor, a corresponding second voltage parameter for each output signal. The voltage sensor may be communicatively coupled to the computing module 5032 via a wireless network such that the second voltage parameter may be communicated to the computing module 5032.
The voltage sensor or the universal meter is adopted as the voltage measuring module to obtain the second voltage parameter of each output signal, so that the output power of the output signal can be obtained, and the test requirement is met. In addition, the voltage sensor or the universal meter is used as a voltage measurement module, so that the test cost can be reduced, and the test efficiency can be improved.
In some embodiments, the computing module 5032 is further configured to store the plurality of first voltage parameters of the set function signal generator to a test table; storing the second voltage parameter read by the oscilloscope into a test table; and automatically generating an input power value corresponding to each first voltage parameter and an output power value corresponding to each second voltage parameter through formula calculation, and automatically marking an index result according to test index definition.
In some embodiments, the function signal generator 501 and the oscilloscope are used for testing, the upper computer (i.e. the computing module 5032) sets the frequency (corresponding to the preset frequency parameter in the above embodiment) and the voltage amplitude (corresponding to the first voltage parameter in the above embodiment) of the waveform (i.e. the radio frequency signal) output by the function signal generator 501, and inputs the waveforms into the test table, Representing peak-to-peak values, if the output waveform is sinusoidal, the amplitude of the output waveform should beThe effective value of the voltage isAt 50 ohm impedance, the power isThen is converted into. When (when)At 1V, the corresponding power is) 3.9794, approximately equal to 4dBm. In the test table, the power value (corresponding to the input power in the embodiment) under the 50 ohm system is automatically converted according to the set voltage amplitude, the power signal is equivalent to the power signal output by the signal source at the required frequency point, the output waveform of the function signal generator is output to the oscilloscope through the radio frequency device to be tested, the output waveform (namely the output signal) is tested by the oscilloscope, and the power signal is output to the output waveform (namely the output signal) through theThe program on the lower computer (i.e. the acquisition device) automatically reads the waveform(i.e. the second voltage parameter) to be readThe values are stored in a test table, and each value is automatically generated through formula calculationAnd (5) automatically marking an index result according to the definition of the test index by the output power value corresponding to the value.
Notably, in some embodiments, the maximum output voltage of the function signal generator 50120V whenThe power converted is 30dBm, so the compression point testing device provided by the embodiment of the application is suitable for a radio frequency device with a compression point smaller than 30dBm in a low-frequency band.
When the linearity of the rf device at low frequency is tested using the function signal generator 501 and the oscilloscope, the judgment mode is the same as the judgment mode of the test result using the signal source and the power meter. When the radio frequency device works in a linear area, the amplitude of the radio frequency signal of the function signal generator 501 increases, the amplitude of the waveform (namely the output signal) measured by the oscilloscope also increases linearly, when the radio frequency device reaches a nonlinear working area of the radio frequency device, the amplitude of the waveform measured by the oscilloscope is compressed, and when the waveform is compressed by 0.1dB/1dB, the power of the output signal generated by the corresponding function signal generator 501 is the compression point of 0.1dB/1 dB.
It should be further noted that, the amplitude measured by the oscilloscope is compressed means that: when the nonlinear operation region of the radio frequency device is reached, the voltage (i.e., the second voltage parameter) of the waveform measured by the oscilloscope is reduced, so that the ratio of the output power to the output power is reduced, i.e., the gain is reduced.
The compression point testing device comprises the function signal generator and the oscilloscope, and the function signal generator and the oscilloscope are low in cost compared with a signal source, so that the construction cost of a compression point measuring testing system can be reduced. In addition, by optimizing the test environment and developing the test program, the accuracy of the test result is improved, and meanwhile, the test efficiency is improved.
It should be noted that, the method of the compression point testing device provided in the embodiment of the present application is similar to that of the compression point testing device in the above embodiment, and for technical features that are not fully disclosed in the embodiment of the present application, reference is made to the above embodiment for understanding, and details are not repeated here.
In several embodiments provided herein, it should be understood that the disclosed structures and methods may be implemented in a non-targeted manner. The above-described structural embodiments are merely illustrative, and for example, the division of units is merely a logic function division, and there may be other division manners in actual implementation, such as: multiple units or components may be combined or may be integrated into another system, or some features may be omitted, or not performed. In addition, the components shown or discussed are coupled to each other or directly.
Features disclosed in several method or structural embodiments provided in the present application may be combined arbitrarily without any conflict to obtain new method embodiments or structural embodiments.
The foregoing is merely some embodiments of the present application, but the protection scope of the present application is not limited thereto, and any person skilled in the art can easily think about changes or substitutions within the technical scope of the present application, and the changes or substitutions should be covered in the protection scope of the present application.

Claims (11)

1. A compression point testing apparatus, comprising:
the function signal generator is coupled with the input end of the radio frequency device to be tested, is used for inputting radio frequency signals to the radio frequency device to be tested, and is configured to receive an external preset frequency parameter and a plurality of first voltage parameters to generate a plurality of radio frequency signals, and the first voltage parameters are in one-to-one correspondence with the radio frequency signals; a plurality of radio frequency signals are sent to the input end of the radio frequency device;
the measuring unit is coupled with the output end of the radio frequency device, and the radio frequency device outputs a plurality of output signals when receiving a plurality of radio frequency signals; the measuring unit measures a plurality of second voltage parameters of the output signals, and determines gain parameters and compression points of the output signals and the radio frequency signals according to the plurality of first voltage parameters, the corresponding second voltage parameters and the load impedance of the radio frequency device.
2. The test device of claim 1, wherein the measurement unit comprises a voltage measurement module and a calculation module;
the voltage measurement module is coupled with the output end of the radio frequency device and is used for measuring a plurality of second voltage parameters;
The calculation module is connected with the voltage measurement module and is configured to determine the gain parameters and the compression points of the output signal and the radio frequency signal according to a plurality of first voltage parameters, the corresponding second voltage parameters and the load impedance of the radio frequency device.
3. The test device of claim 2, wherein the computing module is further coupled to the function signal generator, the computing module configured to set the preset frequency parameter and the plurality of first voltage parameters and send the preset frequency parameter and the plurality of first voltage parameters to the function signal generator;
wherein the preset frequency parameter comprises one or more of a low frequency band, an intermediate frequency band or a high frequency band.
4. The test device of claim 2, wherein the voltage measurement module comprises an oscilloscope, a voltage sensor, or a multimeter.
5. The test apparatus of any one of claims 2 to 4, wherein the calculation module is configured to determine a plurality of the input powers from each of the first voltage parameter and a load impedance of the radio frequency device; determining a plurality of output powers according to each second voltage parameter and the load impedance of the radio frequency device; determining a plurality of gain parameters according to a plurality of input powers and a plurality of output powers; comparing a preset value with the variation amplitude of the gain parameter, and determining the input power corresponding to the first voltage parameter as a compression point of the radio frequency device at the preset value when the variation amplitude of the gain parameter reaches the preset value;
The preset value comprises 0.1 dBm and/or 1 dBm.
6. The test device of claim 1 or 2, wherein the radio frequency signal and the output signal are both sine waves; the first voltage parameter and the second voltage parameter each include a peak-to-peak voltage parameter, a peak voltage parameter, or an effective voltage parameter.
7. A method for testing a compression point, comprising:
receiving an external preset frequency parameter and a plurality of first voltage parameters to generate a plurality of radio frequency signals, inputting the radio frequency signals to a radio frequency device to be tested, wherein the first voltage parameters are in one-to-one correspondence with the radio frequency signals; when the radio frequency device receives a plurality of radio frequency signals, the radio frequency device outputs a plurality of output signals;
and measuring a plurality of second voltage parameters of the output signals, and determining gain parameters and compression points of the output signals and the radio frequency signals according to the plurality of first voltage parameters, the corresponding second voltage parameters and the load impedance of the radio frequency device.
8. The method of claim 7, wherein the predetermined frequency parameter comprises one or more of a low frequency band, an intermediate frequency band, or a high frequency band.
9. The method according to claim 7 or 8, wherein determining the gain parameter and the compression point of the output signal and the radio frequency signal according to the plurality of first voltage parameters, the corresponding second voltage parameters and the preset frequency parameter comprises:
determining a plurality of input powers according to each first voltage parameter and the load impedance of the radio frequency device;
determining a plurality of output powers according to each second voltage parameter and the load impedance of the radio frequency device;
determining a plurality of gain parameters according to a plurality of input powers and a plurality of output powers;
comparing a preset value with the variation amplitude of the gain parameter, and determining the input power corresponding to the first voltage parameter as a compression point of the radio frequency device at the preset value when the variation amplitude of the gain parameter reaches the preset value;
the preset value comprises 0.1dBm and/or 1dBm.
10. The test method according to claim 7 or 8, wherein the radio frequency signal and the output signal are both sine waves; the first voltage parameter and the second voltage parameter each include a peak-to-peak voltage parameter, a peak voltage parameter, or an effective voltage parameter.
11. The test method according to claim 7 or 8, characterized in that the method further comprises:
storing a plurality of the first voltage parameters into a test table;
measuring the second voltage parameter;
storing the measured second voltage parameter to the test table;
and automatically generating the input power corresponding to each first voltage parameter and the output power corresponding to each second voltage parameter.
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CN204304936U (en) * 2014-12-31 2015-04-29 陕西烽火电子股份有限公司 A kind of rf power amplifier circuit being applied to ultrashort wave radio set
CN116106832A (en) * 2022-11-16 2023-05-12 上海广电通信技术有限公司 X-band power amplification system based on eight-port radio frequency pulse amplitude control microstrip network
CN116593860A (en) * 2023-04-11 2023-08-15 芯朴科技(上海)有限公司 Radio frequency amplifier test system and test method

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Publication number Priority date Publication date Assignee Title
CN204304936U (en) * 2014-12-31 2015-04-29 陕西烽火电子股份有限公司 A kind of rf power amplifier circuit being applied to ultrashort wave radio set
CN116106832A (en) * 2022-11-16 2023-05-12 上海广电通信技术有限公司 X-band power amplification system based on eight-port radio frequency pulse amplitude control microstrip network
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