CN111707874A - 5G power amplifier testing device and method thereof - Google Patents
5G power amplifier testing device and method thereof Download PDFInfo
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- CN111707874A CN111707874A CN202010600514.6A CN202010600514A CN111707874A CN 111707874 A CN111707874 A CN 111707874A CN 202010600514 A CN202010600514 A CN 202010600514A CN 111707874 A CN111707874 A CN 111707874A
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Abstract
The invention relates to a 5G power amplifier testing device and a method thereof, wherein the device comprises a vector network, a Device Under Test (DUT) and a testing accessory, and is characterized by also comprising a power amplifier integrated spread spectrum module at the output end of the vector network and at the receiving end; the output end comprises a vector network output end spread spectrum module, a power amplifier and a double-shaped coupler which are sequentially and electrically connected; the receiving end comprises a vector network receiving end double-shaped coupler and a spread spectrum module which are sequentially and electrically connected; each double-shaped coupler is also electrically connected with a vector network through a respective down converter; the method adopts the spread spectrum module to carry out index measurement after vector network spread spectrum, and comprises the following steps: power gain, power gain flatness, linear power gain, linear power flatness, 1dB gain compression output power, clutter suppression degree, input voltage standing wave ratio, output voltage standing wave ratio and power added efficiency. The device and the method greatly reduce the test input cost of the 5G power amplifier, and effectively avoid the risks of purchase prohibition and technical lockout.
Description
Technical Field
The invention relates to radio frequency microwave device testing, in particular to a 5G power amplifier testing device and a method thereof.
Background
The fifth generation mobile (5G) communication technology has been rapidly developed with the emphasis of all countries in the world. The method has the characteristics of higher speed, wider bandwidth, higher reliability, lower time delay and the like, and can bring revolutionary change to the existing industrial system. In order to realize the characteristics of high speed, large bandwidth, high reliability and low time delay, higher requirements are necessarily provided for research, development, production, manufacture and detection of related components, particularly key components, such as: microwave amplifiers, mixers, filters, detectors, and Radio Frequency Front Ends (RFFEMs), among others.
Microwave amplifiers are one of the most critical components in 5G critical components, greatly affecting and restricting the performance of communication systems. The power amplifier is a commonly used and widely used one in microwave amplifiers, and is usually located at an end position of a communication system to perform power amplification on a high-power signal under the conditions of high frequency and large bandwidth. The characteristic of high frequency and large bandwidth of the 5G power amplifier puts higher requirements on the performance of test equipment and the test method.
Based on the traditional method, the test of the high-frequency large-bandwidth power amplifier depends more on the performance of a test instrument, such as a vector network analyzer, a spectrum analyzer and the like with higher frequency and larger bandwidth, but the higher performance of the test equipment means higher instrument cost. And the test equipment manufacturers in China have certain technical gaps with the European and American advanced manufacturers, and due to technical protection and blockade of various countries, the risk of purchase prohibition of the test equipment exists, so that the continuous and large-scale related tests are not facilitated. The vector network analyzer is called vector network for short.
In order to solve the above problems, a 5G power amplifier testing apparatus and a method thereof are needed to implement performance testing of a 5G power amplifier on the premise of low cost and controllable risk.
Disclosure of Invention
The technical problem to be solved by the invention is how to provide a 5G power amplifier testing device and a method thereof, so that a low-configuration low-performance radio frequency testing instrument can meet the requirement of a 5G power amplifier performance test.
The above first technical problem of the present invention is solved by: the 5G power amplifier testing device is constructed and comprises a vector network analyzer and a tested device, and is characterized by further comprising:
the vector network output end power amplification integrated spread spectrum module comprises a vector network output end spread spectrum module, a vector network output end power amplifier, a vector network output end double-shaped coupler and a vector network output end down converter, wherein the vector network output end spread spectrum module, the vector network output end power amplifier and the vector network output end double-shaped coupler are sequentially and electrically connected between the vector network analyzer and the input end of a device to be tested;
the vector network receiving end power amplifier integrated spread spectrum module comprises a vector network receiving end double-shaped coupler and a vector network receiving end spread spectrum module which are electrically connected between the output end of a tested device and the vector network analyzer in sequence, and a vector network receiving end down converter which is electrically connected between the other output end of the vector network receiving end double-shaped coupler and the vector network analyzer.
According to the testing device provided by the invention, the vector network receiving end power amplifier integrated spectrum spreading module further comprises a coupler electrically connected between the vector network receiving end double-shaped coupler and the vector network receiving end spectrum spreading module, and the other output of the coupler is connected with a microwave power meter and/or a spectrum analyzer.
According to the testing device provided by the invention, the vector network receiving end power amplifier integrated spread spectrum module further comprises an attenuator electrically connected between the vector network receiving end double-shaped coupler and the vector network receiving end spread spectrum module.
The above-mentioned another technical problem of the present invention is solved by: the method for testing the power gain of the 5G power amplifier is characterized in that a power amplifier integrated spread spectrum module is adopted to carry out spread spectrum on a testing instrument, and comprises the following steps:
401) calibrating the test device and setting corresponding parameters;
402) applying drive to the device under test according to the detailed specification;
403) changing output power of vector network analyzer or adjusting power amplifier gain of vector network output end to make input signal power P of tested deviceiReaching a specified value;
404) reading the output signal power P of the device under testo；
405) From formula Gp＝Po-PiCalculating the power gain GP。
The above-mentioned another technical problem of the present invention is solved by: the method for testing the power gain flatness of the 5G power amplifier is constructed, and is characterized in that a power amplifier integrated spread spectrum module is adopted to carry out spread spectrum on a test instrument, and comprises the following steps:
501) calibrating a test device and setting corresponding parameters including a frequency specified value;
502) applying drive to the device under test according to the detailed specification;
503) changing output power of vector network analyzer or adjusting power amplifier gain of vector network output end to make input signal power P of tested deviceiReaching a specified value;
504) reading the output signal power P of the device under testo；
505) According to formula Gp＝Po-PiCalculating the power gain GP；
506) Continuously changing the frequency of the signal source within a predetermined frequency range to obtain a maximum power gain GPmaxAnd minimum power gain GPmin；
507) By the formula Δ GP＝±(GP max-GP min) And/2, calculating to obtain power gain flatness delta GP。
The above-mentioned another technical problem of the present invention is solved by: the method for testing the linear power gain of the 5G power amplifier is characterized in that a power amplifier integrated spread spectrum module is adopted to carry out spread spectrum on a test instrument, and comprises the following steps:
601) calibrating a test device and setting corresponding parameters including a frequency specified value;
602) applying drive to the device under test according to the detailed specification;
603) changing output power of vector network analyzer or adjusting power amplifier gain of vector network output end to make input signal power P of tested deviceiIn a linear working area with unchanged power gain;
604) reading output signal power Po；
605) From formula Gp＝Po-PiCalculating to obtain linear power gain Glin。
The above-mentioned another technical problem of the present invention is solved by: the method for testing the linearity power gain flatness of the 5G power amplifier is constructed, and is characterized in that a power amplifier integrated spread spectrum module is adopted to carry out spread spectrum on a test instrument, and comprises the following steps:
701) calibrating a test device and setting corresponding parameters including a frequency specified value;
702) applying drive to the device under test according to the detailed specification;
703) changing output power of vector network analyzer or adjusting power amplifier gain of vector network output end to make input signal power P of tested deviceiIn a linear working area with unchanged power gain;
704) maintaining input signal power PiIs a specified value;
705) continuously changing the frequency of the signal source in a prescribed frequency range to obtain a maximum linear power gain GlinmaxAnd minimum power gain Glinmin；
706) By the formula Δ Glin＝±(Glin max-Glinmin) (ii)/2, calculating the linear power gain flatness Δ Glin。
The above-mentioned another technical problem of the present invention is solved by: a method for testing 1dB gain compression output power of a 5G power amplifier is constructed, and is characterized in that a power amplifier integrated spread spectrum module is adopted to carry out spread spectrum on a test instrument, and the method comprises the following steps:
801) aligning the test frequency to a prescribed value;
802) applying drive to the device under test according to the detailed specification;
803) calibrating the test device;
804) changing output power of vector network analyzer or adjusting power amplifier gain of vector network output end to make input signal power P of tested deviceiIn a linear working area with unchanged power gain;
805) reading output signal power PoDetermining the linear power gain Glin；
806) Increasing input signal power PiUntil the power gain drops to Glin-1dB, obtaining a gain compression output power with a current output signal power of 1 dB.
The above-mentioned another technical problem of the present invention is solved by: the method for testing the clutter suppression degree of the 5G power amplifier is characterized in that a power amplifier integrated spread spectrum module is adopted to carry out spread spectrum on a test instrument, and comprises the following steps:
901) aligning the test frequency to a prescribed value;
902) setting corresponding parameters according to the requirement of the test range;
903) calibrating the test device;
904) applying drive to the device under test according to the detailed specification;
905) changing output power of vector network analyzer or adjusting power amplifier gain of vector network output end to make input signal power P of tested deviceiReaching a specified value;
906) reading fundamental output power P on spectrum analyzer0Maximum clutter output power PSP；
907) From the formula Rfs＝Po-PSPCalculating clutter suppression degree Rfs。
The above-mentioned another technical problem of the present invention is solved by: the method for testing the power added efficiency of the 5G power amplifier is characterized in that a power amplifier integrated spread spectrum module is adopted to carry out spread spectrum on a testing instrument, and comprises the following steps:
1001) aligning the test frequency to a prescribed value;
1002) setting corresponding parameters according to the requirement of the test range;
1003) calibrating the test device;
1004) applying drive to the device under test according to the detailed specification;
1005) changing output power of vector network analyzer or adjusting power amplifier gain of vector network output end to make input signal power P of tested deviceiReaching a specified value;
1006) reading output signal power P of a device under test dieoSimultaneously testing the current V and the voltage I of the power supply;
1007) by the formula
Calculating power added efficiency ηaddWherein: q denotes a duty ratio value.
The above-mentioned another technical problem of the present invention is solved by: the method for testing the input/output voltage standing wave ratio of the 5G power amplifier is characterized in that a power amplifier integrated spread spectrum module is adopted to carry out spread spectrum on a test instrument, and comprises the following steps:
1101) aligning the test frequency to a prescribed value;
1102) setting corresponding parameters according to the requirement of the test range;
1103) calibrating the test device;
1104) applying drive to the device under test according to the detailed specification;
1105) changing output power of vector network analyzer or adjusting power amplifier gain of vector network output end to make input signal power P of tested deviceiReaching a specified value;
1106) and reading the input voltage standing wave ratio and the output voltage standing wave ratio.
Compared with the prior art, the 5G power amplifier testing device and the method thereof provided by the invention have the advantages that the low-configuration vector network is used for measuring the 5G power amplifier with higher frequency and larger bandwidth in a spread spectrum mode, so that the cost of testing equipment is effectively reduced; the vector network with low distribution has self-production capacity in China, and the performance stability can reach the test, so the risks of purchase prohibition and technical blockade can be effectively avoided.
Drawings
The invention is further described in detail below with reference to the figures and the specific embodiments.
FIG. 1 is a schematic structural diagram of a 5G power amplifier testing apparatus according to a first embodiment of the present invention;
FIG. 2 is a schematic diagram of signal timing relationships;
FIG. 3 is a flow chart illustrating a method for testing power gain of the 5G power amplifier corresponding to FIG. 1;
FIG. 4 is a flow chart illustrating a method for testing power gain flatness of the 5G power amplifier corresponding to FIG. 1;
FIG. 5 is a flow chart illustrating a method for testing linear power gain of the 5G power amplifier corresponding to FIG. 1;
FIG. 6 is a flow chart illustrating a method for testing linearity power gain flatness of the 5G power amplifier corresponding to FIG. 1;
FIG. 7 is a flow chart illustrating a method for testing 1dB gain compression output power of the 5G power amplifier corresponding to FIG. 1;
fig. 8 is a schematic flow chart corresponding to the method for testing the clutter suppression degree of the 5G power amplifier corresponding to fig. 1;
FIG. 9 is a flow chart illustrating a method for testing power added efficiency of the 5G power amplifier corresponding to FIG. 1;
FIG. 10 is a schematic structural diagram of a 5G power amplifier testing apparatus according to a second embodiment of the present invention;
fig. 11 is a flow chart of a method for testing the input/output power standing wave ratio of the 5G power amplifier corresponding to fig. 10.
Detailed Description
The present invention will be further described in detail with reference to specific examples thereof:
first embodiment
Bulk testing device
The device has a structure shown in fig. 1, and comprises a vector network analyzer, a vector network output end power amplifier integrated spread spectrum module 1, a vector network receiving end power amplifier integrated spread spectrum module 2, a microwave power meter, a spectrum analyzer, a Device Under Test (DUT) and a driving unit thereof, and test accessories (such as a connecting cable, a microwave probe and the like). Wherein:
the vector network output end power amplification integrated spectrum spreading module 1 comprises a vector network output end spectrum spreading module, a vector network output end power amplifier, a vector network output end double-shaped coupler and a vector network output end down converter;
the vector network receiving end power amplifier integrated spread spectrum module 2 comprises a vector network receiving end bi-directional coupler, a vector network receiving end down converter, a coupler and a vector network receiving end spread spectrum module, and is externally connected with a microwave power meter or a spectrum analyzer through the coupler.
Principle of gangue work
A vector network analyzer outputs a test signal to a network output end through a vector network output end frequency spreading module and then enters a bi-directional coupler after power amplification, one path of signal of the bi-directional coupler is accessed to a vector network synchronous signal after passing through a down converter, and the other path of signal is connected to a tested device through a microwave probe;
the device to be tested is driven by a pulse modulation source through a time sequence signal, and the voltage and the current of a grid electrode and a drain electrode are tested by a direct current test system.
The device to be tested outputs microwave signals to the microwave probe, one path of signals passes through the down converter after passing through the dual directional coupler and then is connected with the vector network synchronous signals, one path of signals enters the coupler and then is divided into two paths of signals, and one path of signals passes through the spread spectrum module and returns to a measurement receiver and a reference receiver of the vector network to form a signal loop; and the other signal enters a microwave power meter to calibrate a measuring receiver of the vector network through a directional coupler, and the other signal enters a frequency spectrograph to be used for observing whether the tested device generates self excitation or not and testing the harmonic suppression degree and the clutter suppression degree.
The timing sequence of the above signals is shown in fig. 2, in which: t is tGSIs the gate drive pulse width, tDSIs the drain drive pulse width, tSGFor the pulse width of the signal to be measured, tMFor measuring window pulse width
Detailed test method
Power gain GP：
The test principle is as follows:
power gain G is calculated from equation ①P(unit is dB):
Gp＝Po-Pi………………………………①
in the formula:
Pi-input power of the amplifier, dBm;
Po-output power of the amplifier, dBm.
The test procedure, as shown in fig. 3, specifically includes:
401) calibrating the test system according to requirements before testing;
setting parameters of the vector network according to the detailed standard test requirements of the tested device;
402) according to the detailed specification requirement, sequentially applying grid electrode bias voltage and drain electrode bias voltage with corresponding sizes to the tested device; if the detailed specification does not require any special requirement, only the drain pulse signal is applied. The vector net measurement window should be contained within and in the middle of the drain pulse. Parameters are specifically required to be tested under continuous waves or pulses, and the requirement of pulse width is determined according to detailed specifications;
403) changing output power of the vector network or adjusting power amplification gain of the output end of the vector network to ensure that input signal power P applied to the tested deviceiReaching the specified value. The test procedure preferably uses an automatic test mode, and performs frequency scanning or power scanning according to the detailed and standardized test condition requirements. Meanwhile, in the test, the maximum test power point is ensured not to exceed the bearing capacity of the instrument equipment and the tested device;
404) reading output signal power P using vector neto。
405) Calculating the power gain G according to the formula ①P。
Power gain flatness Δ GP：
The test principle is as follows:
power gain flatness Δ G is calculated from equation ②P：
ΔGP＝±(GP max-GPmin)/2………………………………②
In the formula:
GPmax-maximum power gain, dB, measured at a specified input power and within a specified frequency range;
GPminminimum power gain, dB, measured at a specified input power and over a specified frequency range.
As shown in fig. 4, under the condition of fixing the test frequency and the input power to determine the step size, the test is performed according to the following procedure:
501) setting the output frequency and power of a spread spectrum module at the output end of the vector network and the power amplifier power output at the output end of the vector network according to the detailed standard test requirements of the device to be tested;
502) applying grid and drain bias voltage to the tested device according to the detailed specification requirement, and paying attention to the power-up sequence;
503) changing output power of the vector network or adjusting power amplifier gain of the output end of the vector network to ensure that input signal power P is applied to the tested deviceiReaching a specified value;
504) reading output power from the vector net;
505) calculating power gain by a formula I;
506) under the same input signal power, continuously changing the signal source frequency in a specified frequency range, and measuring the maximum power gain GPmaxAnd minimum power gain GPmin；
507) Power gain flatness Δ G is calculated from equation ②P。
Linear power gain Glin：
As shown in fig. 5, under the condition of fixing the test frequency and the input power to determine the step size, the test is performed according to the following procedure:
601) setting the output frequency and power of a spread spectrum module at the output end of the vector network and the power amplifier power output at the output end of the vector network according to the detailed standard test requirements of the device to be tested;
602) applying grid and drain bias voltage to the tested device according to the detailed specification requirement, and paying attention to the power-up sequence;
603) changing output power of the vector network or adjusting power amplifier gain of the output end of the vector network to ensure that input signal power P is applied to the amplifier to be testediIn the linear operating region. Finding out a region with the power gain not changing along with the input power, namely a linear working region, by using a vector network;
604) reading output signal power P in specified frequency range from vector networko。
605) Linear power gain G is calculated according to equation ①lin。
Linear power flatness Δ Glin：
The test principle is as follows:
linear power gain flatness Δ G is calculated from equation ③lin：
ΔGlin＝±(Glin max-Glinmin)/2………………………………③
In the formula:
Glinmax-maximum linear power gain, dB, measured at a specified input power and within a specified frequency range;
Glinmin-minimum linear power gain, dB, measured at a specified input power and over a specified frequency range.
As shown in fig. 6, under the condition of fixing the test frequency and the input power to determine the step size, the test is performed according to the following procedure:
701) adjusting the working frequency of the vector network to a specified value, and calibrating the test system;
702) adding a specified bias voltage to the tested device according to the sequence of first negative and then positive;
703) changing the power of the input signal to ensure that the variation of the power of the output signal is the same as that of the input signal, and determining the linear working area of the tested device;
704) applying an appropriate input signal power to the device under test;
705) under the same input signal power, the signal source frequency is continuously changed in a specified frequency range, and the maximum linear power gain G is measuredlinmaxAnd minimum power gain Glinmin；
706) Linear power gain flatness Δ G is calculated from equation ③lin。
1dB gain compression output power Po(1dB)：
The test should be performed according to the following procedure:
selecting a fixed frequency point, sweeping the input power, measuring the output power, and measuring the output power at a gain compression of 1dB, as shown in fig. 7, including:
801) adjusting the frequency of the vector net to a specified value;
802) adding a specified bias voltage to the tested device according to the sequence of first negative and then positive;
803) calibrating power and S parameters of the whole system;
804) applying grid and drain bias voltage to the tested device according to the detailed specification requirement, and paying attention to the power-up sequence;
805) changing output power of the vector network or adjusting power amplifier gain of the output end of the vector network to ensure that input signal power P is applied to the tested deviceiReaching a specified value;
806) reading output signal power from the vector net; changing the power of the input signal to make the variation of the power of the output signal the same as that of the input signal, and determining the linear power gain G of the device under testlin；
807) Increasing the input signal power until the current power gain is relative to the linear power gain GlinThe measured output signal power is 1dB gain compression output power P when the measured output signal power is reduced by 1dBo(1dB)。
Clutter suppression degree Rfs：
The test principle is as follows:
the fundamental wave power, the harmonic wave power and the clutter power of a specified frequency point are tested by using a spectrum analyzer, the system loss is considered during the test, the proper compensation is carried out,
calculating clutter suppression degree R by formula ④fs：
Rfs＝Po-PSP………………………………④
In the formula:
Po-fundamental output power, dBm, indicated by the spectrum analyzer;
PSPthe output power of the maximum spur (excluding harmonics), dBm, as indicated by the spectrum analyzer;
the test should be performed according to the following procedure, as shown in fig. 8, including:
901) adjusting the frequency of the vector net to a specified value;
902) setting vector network output and power amplification power output of the vector network output end according to the detailed standard test range requirement of the device to be tested;
903) calibrating power and S parameters of the whole system;
904) applying grid and drain bias voltage to the tested period according to the detailed specification requirement, and paying attention to the power-up sequence;
905) changing output power of the vector network or adjusting power amplifier of output end of the vector network to ensure that input signal power P applied to the tested deviceiReaching a specified value;
906) adjusting the resolution bandwidth of the spectrum analyzer to a specified value, reading P on the spectrum analyzer0、PSP；
907) Calculating clutter suppression degree P by formula ④fs。
Power added efficiency ηadd：
The test principle is as follows:
power added efficiency η is calculated from equation ⑤add：
In the formula:
PO-the output power of the amplifier under test, dBm;
Pi-the input-output power of the amplifier under test, dBm;
q-duty cycle, for continuous wave, duty cycle is 1;
v-peak voltage, supplied to the amplifier by the power supply, V;
I-Peak Current, supplied by the power supply to the amplifier, A.
The test should be performed according to the following procedure, as shown in fig. 9, including:
1001) adjusting the frequency of the vector net to a specified value;
1002) setting vector network output and power amplification power output of the vector network output end according to the detailed standard test range requirement of the device to be tested;
1003) calibrating power and S parameters of the whole system;
1004) applying gate and drain bias voltages to the device under test die according to the detailed specification requirements, and paying attention to the power-up sequence;
1005) changing output power of the vector network or adjusting power amplifier of output end of the vector network to ensure that input signal power P applied to the tested deviceiReaching a specified value;
1006) reading the output signal power of the bare chip of the tested device from the vector network, and simultaneously testing the current and the voltage of the power supply;
1007) power added efficiency η is calculated from equation ⑤add。
Second embodiment
Bulk testing device
The structure of the device is shown in fig. 10, an attenuator is used to replace a coupler in the integrated spread spectrum module 2 of the vectored network receiving end power amplifier of the first embodiment, and meanwhile, a microwave power meter or a spectrum analyzer is not required to be connected externally, and the rest is the same as that of the first embodiment.
Principle of gangue work
The method is the same as the first embodiment except that the attenuator reduces the power of the output signal of the device under test to a range outside the power range allowed to be accepted by the spread spectrum module at the receiving end of the vector network.
Detailed test method
The test should be performed according to the following procedure, as shown in fig. 11, including:
1101) adjusting the frequency of the vector net to a specified value;
1102) setting vector network output and power amplification power output of the vector network output end according to the detailed standard test range requirement of the device to be tested;
1103) calibrating power and S parameters of the whole system;
1104) applying grid and drain bias voltage to the tested device according to the detailed specification requirement, and paying attention to the power-up sequence;
1105) changing output power of the vector network or adjusting power amplifier of output end of the vector network to ensure that input signal power P applied to the tested deviceiReaching a specified value;
1106) reading input voltage standing wave ratio VSWR from vector netiAnd output voltage standing wave ratio VSWRO。
The foregoing is only a preferred embodiment of the present invention, and it is natural that those skilled in the art can change the teaching of the present invention according to the actual needs after understanding the technical means of the present invention. Therefore, all equivalent changes and modifications made in accordance with the claims of the present invention should still fall within the scope of the present invention.
Claims (10)
1. A 5G power amplifier test apparatus comprising a vector network analyzer and a Device Under Test (DUT), further comprising:
the vector network output end power amplifier integrated spread spectrum module (1) comprises a vector network output end spread spectrum module, a vector network output end power amplifier and a vector network output end double-shaped coupler which are sequentially and electrically connected between the vector network analyzer and the input end of a device to be tested, and a vector network output end down converter which is electrically connected between the other output end of the vector network output end double-shaped coupler and the vector network analyzer;
the vector network receiving end power amplifier integrated spread spectrum module (2) comprises a vector network receiving end double-shaped coupler and a vector network receiving end spread spectrum module which are electrically connected between the output end of a tested device and the vector network analyzer in sequence, and a vector network receiving end down converter which is electrically connected between the other output end of the vector network receiving end double-shaped coupler and the vector network analyzer.
2. The test device according to claim 1, wherein said integrated spectrum spreading module (2) further comprises a coupler electrically connected between said dual-type coupler and said spectrum spreading module, and said coupler is further connected to a microwave power meter and/or a spectrum analyzer.
3. The testing device according to claim 1, wherein the vectored network receiving end power amplifier integrated spectrum spreading module (2) further comprises an attenuator electrically connected between the vectored network receiving end double-shaped coupler and the vectored network receiving end spectrum spreading module.
4. A power gain test method of a 5G power amplifier is characterized in that a power amplifier integrated spread spectrum module is adopted to carry out spread spectrum on a test instrument, and the method comprises the following steps:
401) calibrating the test device and setting corresponding parameters;
402) applying drive to the device under test according to the detailed specification;
403) changing output power of vector network analyzer or adjusting power amplifier gain of vector network output end to make input signal power P of tested deviceiReaching a specified value;
404) reading the output signal power P of the device under testo；
405) From formula Gp＝Po-PiCalculating the power gain GP。
5. A power gain flatness test method of a 5G power amplifier is characterized in that a power amplifier integrated spread spectrum module is adopted to carry out spread spectrum on a test instrument, and the method comprises the following steps:
501) calibrating a test device and setting corresponding parameters including a frequency specified value;
502) applying drive to the device under test according to the detailed specification;
503) changing the output power of the vector network analyzer or adjusting the power amplifier gain of the vector network output end to ensure that the device to be testedInput signal power PiReaching a specified value;
504) reading the output signal power P of the device under testo；
505) According to formula Gp＝Po-PiCalculating the power gain GP；
506) Continuously changing the frequency of the signal source within a predetermined frequency range to obtain a maximum power gain GPmaxAnd minimum power gain GPmin；
507) By the formula Δ GP＝±(GP max-GP min) And/2, calculating to obtain power gain flatness delta GP。
6. A linear power gain test method of a 5G power amplifier is characterized in that a power amplifier integrated spread spectrum module is adopted to carry out spread spectrum on a test instrument, and the method comprises the following steps:
601) calibrating a test device and setting corresponding parameters including a frequency specified value;
602) applying drive to the device under test according to the detailed specification;
603) changing output power of vector network analyzer or adjusting power amplifier gain of vector network output end to make input signal power P of tested deviceiIn a linear working area with unchanged power gain;
604) reading output signal power Po；
605) From formula Gp＝Po-PiCalculating to obtain linear power gain Glin。
7. A linear power gain flatness test method of a 5G power amplifier is characterized in that a power amplifier integrated spread spectrum module is adopted to carry out spread spectrum on a test instrument, and the method comprises the following steps:
701) calibrating a test device and setting corresponding parameters including a frequency specified value;
702) applying drive to the device under test according to the detailed specification;
703) changing the output power of the vector network analyzer or adjusting the power amplifier gain of the vector network output end to ensure thatInput signal power P of device under testiIn a linear working area with unchanged power gain;
704) maintaining input signal power PiIs a specified value;
705) continuously changing the frequency of the signal source in a prescribed frequency range to obtain a maximum linear power gain GlinmaxAnd minimum power gain Glinmin；
706) By the formula Δ Glin＝±(Glin max-Glin min) (ii)/2, calculating the linear power gain flatness Δ Glin。
8. A method for testing 1dB gain compression output power of a 5G power amplifier is characterized in that a power amplifier integrated spread spectrum module is adopted to carry out spread spectrum on a test instrument, and comprises the following steps:
801) aligning the test frequency to a prescribed value;
802) applying drive to the device under test according to the detailed specification;
803) calibrating the test device;
804) changing output power of vector network analyzer or adjusting power amplifier gain of vector network output end to make input signal power P of tested deviceiIn a linear working area with unchanged power gain;
805) reading output signal power PoDetermining the linear power gain Glin；
806) Increasing input signal power PiUntil the power gain drops to Glin-1dB, obtaining a gain compression output power with a current output signal power of 1 dB.
9. A clutter suppression degree test method of a 5G power amplifier is characterized in that a power amplifier integrated spread spectrum module is adopted to carry out spread spectrum on a test instrument, and the method comprises the following steps:
901) aligning the test frequency to a prescribed value;
902) setting corresponding parameters according to the requirement of the test range;
903) calibrating the test device;
904) applying drive to the device under test according to the detailed specification;
905) changing output power of vector network analyzer or adjusting power amplifier gain of vector network output end to make input signal power P of tested deviceiReaching a specified value;
906) reading fundamental output power P on spectrum analyzer0Maximum clutter output power PSP；
907) From the formula Rfs＝Po-PSPCalculating clutter suppression degree Rfs。
10. A power added efficiency test method of a 5G power amplifier is characterized in that a power amplifier integrated spread spectrum module is adopted to carry out spread spectrum on a test instrument, and the method comprises the following steps:
1001) aligning the test frequency to a prescribed value;
1002) setting corresponding parameters according to the requirement of the test range;
1003) calibrating the test device;
1004) applying drive to the device under test according to the detailed specification;
1005) changing output power of vector network analyzer or adjusting power amplifier gain of vector network output end to make input signal power P of tested deviceiReaching a specified value;
1006) reading output signal power P of a device under test dieoSimultaneously testing the current V and the voltage I of the power supply;
1007) by the formula
Calculating power added efficiency ηaddWherein: q denotes a duty ratio value.
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