CN108650035B - Electronic equipment calibration method and device, electronic equipment and storage medium - Google Patents
Electronic equipment calibration method and device, electronic equipment and storage medium Download PDFInfo
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- CN108650035B CN108650035B CN201810463461.0A CN201810463461A CN108650035B CN 108650035 B CN108650035 B CN 108650035B CN 201810463461 A CN201810463461 A CN 201810463461A CN 108650035 B CN108650035 B CN 108650035B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/10—Monitoring; Testing of transmitters
- H04B17/11—Monitoring; Testing of transmitters for calibration
- H04B17/13—Monitoring; Testing of transmitters for calibration of power amplifiers, e.g. gain or non-linearity
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/10—Monitoring; Testing of transmitters
- H04B17/11—Monitoring; Testing of transmitters for calibration
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/30—Monitoring; Testing of propagation channels
- H04B17/309—Measuring or estimating channel quality parameters
- H04B17/354—Adjacent channel leakage power
Abstract
The application provides an electronic equipment calibration method, an electronic equipment calibration device, electronic equipment and a storage medium, wherein the method comprises the following steps: the method comprises the steps of obtaining an initial power supply voltmeter of a reference channel corresponding to the electronic equipment to be calibrated according to attributes of the electronic equipment to be calibrated, conducting calibration test on the reference channel of the electronic equipment to be calibrated according to the initial power supply voltmeter, determining a first power supply voltmeter corresponding to the reference channel of the electronic equipment to be calibrated, conducting calibration test on non-reference channels of the electronic equipment to be calibrated according to the first power supply voltmeter of the reference channel, and determining a second power supply voltmeter corresponding to the non-reference channels of the electronic equipment to be calibrated. Therefore, the working parameters of each channel of the electronic equipment to be calibrated can be obtained, the adjacent channel leakage ratio can meet the requirement when the electronic equipment works in any channel, the power consumption of the radio frequency power amplifier can also reach a better value, and the consistency of the performance of the electronic equipment with the same attribute is improved.
Description
Technical Field
The present application relates to the field of communications technologies, and in particular, to an electronic device calibration method and apparatus, an electronic device, and a storage medium.
Background
Radio frequency power amplifiers are an important component of various wireless transmitters. The radio frequency power amplifier generally has a plurality of channels, and one channel is usually selected as a reference channel. When the radio frequency power amplifier of the electronic equipment works in other non-reference channels, the working parameters of the reference channel, such as reference supply voltage, reference radio frequency gain index and the like, are adopted for working. Moreover, all electronic devices of the same model typically employ one set of operating parameters of the prototype.
In practical use, since the radio frequency path usually generates a frequency response, if all channels of the same electronic device adopt parameters of a reference Channel, a problem of large energy consumption easily occurs that an Adjacent Channel Leakage Ratio (ACLR for short) of a part of channels does not meet requirements, or a supply voltage of the radio frequency power amplifier does not reach a minimum.
Moreover, because the performances of the components used by the electronic equipment of the same model are different, all the electronic equipment of the same model adopt one set of working parameters of a prototype, the ACLR of the channels of part of the electronic equipment cannot meet the requirements or the power consumption is large, so that the performances of the electronic equipment of the same model are inconsistent.
Disclosure of Invention
The present application is directed to solving, at least to some extent, one of the technical problems in the related art.
The application provides an electronic equipment calibration method, which is characterized in that a reference channel is subjected to calibration test according to an initial power supply voltmeter of the reference channel corresponding to electronic equipment to be calibrated, and each non-reference channel is subjected to calibration test according to a first power supply voltmeter of the calibrated reference channel. Therefore, all channels of each electronic device to be calibrated are calibrated according to the attribute of the electronic device to be calibrated to obtain the working parameters of the channels of each electronic device to be calibrated, so that when the electronic device works in any channel, the adjacent channel leakage ratio can meet the requirement, the power consumption of the radio frequency power amplifier is better, and the performance consistency of the electronic devices with the same attribute is improved.
The application provides an electronic equipment calibrating device.
The application provides an electronic device.
The present application proposes a non-transitory computer-readable storage medium.
An embodiment of one aspect of the present application provides an electronic device calibration method, including:
acquiring an initial power supply voltmeter of a reference channel corresponding to the electronic equipment to be calibrated according to the attribute of the electronic equipment to be calibrated, wherein the initial power supply voltmeter comprises each initial power supply voltage;
according to the initial power supply voltmeter, performing calibration test on a reference channel of the electronic equipment, and determining a first power supply voltmeter corresponding to the reference channel of the electronic equipment to be calibrated;
and respectively carrying out calibration test on each non-reference channel of the electronic equipment to be calibrated according to the first power supply voltmeter, and determining a second power supply voltmeter corresponding to each non-reference channel of the electronic equipment to be calibrated.
According to the electronic equipment calibration method, the initial power supply voltmeter of the reference channel corresponding to the electronic equipment to be calibrated is obtained according to the attribute of the electronic equipment to be calibrated, the reference channel of the electronic equipment to be calibrated is subjected to calibration test according to the initial power supply voltmeter, the first power supply voltmeter corresponding to the reference channel of the electronic equipment to be calibrated is determined, then, calibration test is respectively carried out on all non-reference channels of the electronic equipment to be calibrated according to the first power supply voltmeter of the reference channel, and the second power supply voltmeter corresponding to all non-reference channels of the electronic equipment to be calibrated is determined. In this embodiment, a calibration test is performed on the reference channel according to the initial power supply voltmeter of the reference channel corresponding to the electronic device to be calibrated, and a calibration test is performed on each non-reference channel according to the calibrated first power supply voltmeter of the reference channel. Therefore, all channels of each electronic device to be calibrated are calibrated according to the attribute of the electronic device to be calibrated to obtain the working parameters of the channels of each electronic device to be calibrated, so that when the electronic device works in any channel, the adjacent channel leakage ratio can meet the requirement, the power consumption of the radio frequency power amplifier is better, and the performance consistency of the electronic devices with the same attribute is improved.
Another embodiment of the present application provides an electronic device calibration apparatus, including:
the calibration method comprises the steps that an obtaining module is used for obtaining an initial power supply voltmeter of a reference channel corresponding to electronic equipment to be calibrated according to the attribute of the electronic equipment to be calibrated, wherein the initial power supply voltmeter comprises initial power supply voltages;
the first determining module is used for performing calibration test on a reference channel of the electronic equipment according to the initial power supply voltmeter and determining a first power supply voltmeter corresponding to the reference channel of the electronic equipment to be calibrated;
and the second determining module is used for respectively performing calibration test on each non-reference channel of the electronic equipment to be calibrated according to the first power supply voltmeter and determining a second power supply voltmeter corresponding to each non-reference channel of the electronic equipment to be calibrated.
According to the electronic equipment calibration device, the initial power supply voltmeter of the reference channel corresponding to the electronic equipment to be calibrated is obtained according to the attribute of the electronic equipment to be calibrated, the reference channel of the electronic equipment to be calibrated is subjected to calibration test according to the initial power supply voltmeter, the first power supply voltmeter corresponding to the reference channel of the electronic equipment to be calibrated is determined, then, calibration test is respectively carried out on all non-reference channels of the electronic equipment to be calibrated according to the first power supply voltmeter of the reference channel, and the second power supply voltmeter corresponding to all non-reference channels of the electronic equipment to be calibrated is determined. In this embodiment, a calibration test is performed on the reference channel according to the initial power supply voltmeter of the reference channel corresponding to the electronic device to be calibrated, and a calibration test is performed on each non-reference channel according to the calibrated first power supply voltmeter of the reference channel. Therefore, all channels of each electronic device to be calibrated are calibrated according to the attribute of the electronic device to be calibrated to obtain the working parameters of the channels of each electronic device to be calibrated, so that when the electronic device works in any channel, the adjacent channel leakage ratio can meet the requirement, the power consumption of the radio frequency power amplifier is better, and the performance consistency of the electronic devices with the same attribute is improved.
Another embodiment of the present application provides an electronic device, including a processor and a memory; wherein the processor executes a program corresponding to the executable program code by reading the executable program code stored in the memory, so as to implement the electronic device calibration method according to an embodiment of the above aspect.
Another embodiment of the present application provides a non-transitory computer-readable storage medium, on which a computer program is stored, the computer program, when executed by a processor, implementing the electronic device calibration method according to an embodiment of the above-mentioned aspect.
Additional aspects and advantages of the present application will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the present application.
Drawings
The foregoing and/or additional aspects and advantages of the present application will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
fig. 1 is a schematic flowchart of an electronic device calibration method according to an embodiment of the present disclosure;
fig. 2 is a schematic flowchart of a method for performing calibration test on a reference channel of an electronic device according to an embodiment of the present disclosure;
fig. 3 is a schematic flowchart of another method for performing calibration test on a reference channel of an electronic device according to an embodiment of the present disclosure;
fig. 4 is a schematic flowchart of a method for performing calibration test on each non-reference channel of an electronic device to be calibrated respectively according to an embodiment of the present application;
fig. 5 is a schematic structural diagram of an electronic device calibration apparatus according to an embodiment of the present disclosure;
fig. 6 is a schematic structural diagram of another electronic device calibration apparatus according to an embodiment of the present disclosure;
fig. 7 is a schematic structural diagram of an electronic device according to an embodiment of the present application.
Detailed Description
Reference will now be made in detail to embodiments of the present application, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary and intended to be used for explaining the present application and should not be construed as limiting the present application.
An electronic device calibration method, apparatus, electronic device, and medium according to embodiments of the present application are described below with reference to the accompanying drawings.
The embodiments of the application provide an electronic device calibration method, which aims at the problems that in the related art, all channels of a radio frequency power amplifier of an electronic device adopt parameters of a reference channel, the leakage ratio of adjacent channels of partial channels is not satisfactory, or the power supply voltage of the radio frequency power amplifier is not minimum, so that the energy consumption is large, and all electronic devices of the same model adopt one set of working parameters of a prototype, so that the ACLR of channels of partial electronic devices is not satisfactory or the power consumption is large, so that the performances of the electronic devices of the same model are inconsistent.
According to the electronic equipment calibration method provided by the embodiment of the application, the calibration test is carried out on the reference channel according to the initial power supply voltmeter of the reference channel corresponding to the electronic equipment to be calibrated, and the calibration test is carried out on each non-reference channel according to the calibrated first power supply voltmeter of the reference channel. Therefore, all channels of each electronic device to be calibrated are calibrated according to the attribute of the electronic device to be calibrated to obtain the working parameters of the channels of each electronic device to be calibrated, so that when the electronic device works in any channel, the adjacent channel leakage ratio can meet the requirement, the power consumption of the radio frequency power amplifier is better, and the performance consistency of the electronic devices with the same attribute is improved.
Fig. 1 is a schematic flowchart of an electronic device calibration method according to an embodiment of the present disclosure.
The electronic device calibration method provided by the embodiment of the present application can be executed by the electronic device calibration apparatus provided by the present application, and the apparatus is configured in the electronic device to calibrate a reference channel and a non-reference channel of the electronic device to be calibrated.
The electronic device in this embodiment may be any hardware device having a radio frequency power amplifier, such as a mobile phone, a palm computer, and the like.
As shown in fig. 1, the electronic device calibration method includes:
In actual use, wireless communications typically have multiple bandwidths, each having multiple channels. For example, a handset typically has multiple bandwidths, such as 2G, 3G, and 4G, each having multiple channels, such as high, medium, and low.
In this embodiment, taking multiple channels in the same bandwidth as an example, for the same bandwidth, one channel may be selected from the multiple channels as a reference channel of the electronic device, for example, a channel with a middle frequency is selected as the reference channel, and channels other than the reference channel are referred to as non-reference channels.
In this embodiment, the attribute of the electronic device to be calibrated may be a model number of the electronic device, a product serial number, or any other identifier that can uniquely identify a type or model of the electronic device to be calibrated. And, the frequencies of the reference channels of the electronic devices of the same attribute are the same.
Since the radio frequency power amplifier can adjust the transmission power according to the communication environment, in order to save power consumption, the supply voltage of the radio frequency power amplifier can be adjusted according to the transmission power to reduce power consumption. In this embodiment, the initial power supply voltage meter includes each initial power supply voltage, that is, the initial power supply voltage meter has a plurality of initial power supply voltages.
When the initial power supply voltmeter of the reference channel corresponding to the electronic device to be calibrated is obtained, as a possible implementation manner, the power supply voltmeter of the reference channel of the test prototype can be used as the initial power supply voltmeter of the electronic device to be calibrated.
In practical use, in order to reduce the power consumption of the radio frequency power amplifier, as another possible implementation manner, before the initial power supply voltmeter is obtained, voltage tracking calibration or power tracking calibration may be performed on any electronic device having the same attribute as that of the electronic device to be calibrated, so as to determine the initial power supply voltmeter. Specifically, when the electronic device with the same attribute as the electronic device to be calibrated works in the reference channel, the power supply voltage and the radio frequency gain index are automatically adjusted according to the transmitting power of the radio frequency power amplifier, so that a mapping relation between the power supply voltage and the radio frequency gain index can be established, a power supply voltage meter is obtained, and the power supply voltage meter is used as an initial power supply voltage meter of the reference channel corresponding to the electronic device to be calibrated.
Through the initial power supply voltmeter determined according to the voltage tracking calibration or the power tracking calibration, when the electronic equipment works in a reference channel to emit high power, the electronic equipment can be supplied with power by adopting a large power supply voltage; when transmitting small power, a smaller supply voltage can be adopted, and the supply voltage of the radio frequency power amplifier dynamically changes along with the power output. Compared with a mode of adopting a fixed power supply voltage, the power consumption of the radio frequency power amplifier can be obviously reduced.
In practice, even though the performances of electronic components used by electronic devices with the same attribute may be different, the same channel of different electronic devices with the same attribute adopts the same set of operating parameters, and the problem that the channels of some electronic devices do not meet ACLR or the power of some electronic devices cannot reach a better value may occur, thereby causing inconsistent performances of electronic devices with the same attribute.
In this embodiment, after the initial power supply voltmeter is obtained, a calibration test is performed on the channels of the electronic device to be calibrated, so as to obtain the power supply voltmeter of each channel.
In this embodiment, a calibration test may be performed on a reference channel of the electronic device to be calibrated according to an initial power supply voltmeter of the reference channel, and a first power supply voltmeter corresponding to the reference channel of the electronic device to be calibrated is determined. The first power supply voltmeter comprises first power supply voltages.
In practice, a first power supply voltage corresponding to a reference channel of the electronic device to be calibrated may be determined according to an ACLR or a transmission power value obtained when the electronic device to be calibrated operates under the reference channel with a working parameter in the initial power supply voltmeter, so as to obtain a first power supply voltmeter.
In this embodiment, the reference channel of the electronic device to be calibrated is subjected to the calibration test according to the initial power supply voltmeter to obtain the first power supply voltmeter of the reference channel, so that the working parameters of the reference channel of each electronic device to be calibrated with the same attribute can be obtained, and the consistency of the performance of the electronic device to be calibrated with the same attribute when the electronic device to be calibrated works in the reference channel can be ensured.
In practice, all channels of the electronic device adopt parameters of a reference channel, and a problem that the adjacent channel leakage ratio of a part of channels does not meet requirements or the supply voltage of the radio frequency power amplifier does not reach the minimum, which causes large energy consumption easily occurs.
In this embodiment, after calibrating the reference channel, each non-reference channel may be calibrated according to the first power supply voltmeter of the reference channel, so as to obtain the second power supply voltmeter of each non-reference channel. The second power supply voltage meter comprises second power supply voltages.
When the calibration test is carried out on the non-reference channel, the electronic equipment to be calibrated can be controlled to work under the non-reference channel by using the parameters in the first power supply voltmeter so as to obtain the ACLR or the transmitting power value when the electronic equipment to be calibrated works under the non-reference channel by using the parameters in the first power supply voltmeter, and the second power supply voltage of the non-reference channel is determined according to the ACLR or the transmitting power value.
In this embodiment, each non-reference channel is calibrated according to the first power supply voltmeter of the reference channel to obtain the second power supply voltmeter of each non-reference channel, so that ACLR meets the requirement when the electronic device operates in the non-reference channel, and power consumption of the radio frequency power amplifier is better.
It should be noted that, in the embodiment of the present application, the process of performing the calibration test on the electronic device to be calibrated may be implemented at any stage of performing the complete machine test on the electronic device, for example, when performing the complete machine calibration test, the calibration test method provided by the present application is used to calibrate the working parameters corresponding to each channel of the electronic device, or the calibration test method provided by the present application is used to calibrate the working parameters corresponding to each channel of the electronic device at the non-signaling comprehensive test stage, and the like, which is not limited in this embodiment.
According to the electronic equipment calibration method, calibration test is carried out on the reference channel according to the initial power supply voltmeter of the reference channel corresponding to the electronic equipment to be calibrated, and calibration test is carried out on each non-reference channel according to the calibrated first power supply voltmeter of the reference channel. Therefore, all channels of each electronic device to be calibrated are calibrated according to the attribute of the electronic device to be calibrated to obtain the working parameters of the channels of each electronic device to be calibrated, so that when the electronic device works in any channel, the adjacent channel leakage ratio can meet the requirement, the power consumption of the radio frequency power amplifier is better, and the performance consistency of the electronic devices with the same attribute is improved.
On the basis of the above embodiment, the initial supply voltage table further includes an initial rf gain index corresponding to the initial supply voltage map. As a possible implementation manner for performing the calibration test on the reference channel of the electronic device in step 102, the first supply voltage of the reference channel may be determined according to the adjacent channel leakage ratio when the electronic device to be calibrated operates under the reference channel with the initial supply voltage and the initial rf gain index and transmits the preset power.
Fig. 2 is a flowchart illustrating a method for performing calibration test on a reference channel of an electronic device according to an embodiment of the present disclosure.
As shown in fig. 2, the method for performing calibration test on a reference channel of an electronic device includes:
ACLR is the ratio of the transmitted power to the power falling on the adjacent channel and is an indicator of the power of the rf power amplifier outside the channels specified for use. It can be appreciated that the larger the ACLR, the less the impact on the adjacent channels.
In this embodiment, the ACLR of the calibration electronic device, which operates under the reference channel with the initial power supply voltage and the initial rf gain index and transmits the predetermined power, is obtained to perform the power supply voltage compensation. Wherein the preset power can be set according to the requirement.
Specifically, a set of initial power supply voltage and initial rf gain index mapped to each other may be selected from an initial power supply voltmeter, the power supply voltage and the rf gain index of the electronic device to be calibrated are adjusted to the initial power supply voltage and the initial rf gain index, the electronic device to be calibrated is controlled to operate in a reference channel, and a preset power is transmitted, so as to obtain an ACLR when the electronic device to be calibrated operates in the reference channel with the initial power supply voltage and the initial rf gain index and transmits the preset power.
For example, the initial supply voltage and the initial rf gain index that are mapped to each other are selected to be 2.3V and 52dB, respectively, and the preset power is 20dBm, then the ACLR of the electronic device to be calibrated that operates under the reference channel at 2.3V and 52dB and emits 20dBm power is obtained.
In order to avoid that the radio frequency power amplifier operates in the current channel and has a large influence on the adjacent channel, the target ACLR can be set.
After acquiring the ACLR of the electronic equipment to be calibrated, which works under a reference channel with an initial power supply voltage and an initial radio frequency gain index and emits preset power, determining a first voltage compensation value corresponding to the reference channel according to the acquired ACLR and a target ACLR. Specifically, the obtained ACLR may be subtracted from the target ACLR, and then the difference may be multiplied by the first adjustment coefficient to obtain the first voltage compensation value of the reference channel. As shown in equations (1) and (2).
ΔACLR＝ACLR-ACLRtarget (1)
ΔVCCA＝x*ΔACLR (2)
The ACLR is the ACLR when the electronic equipment to be calibrated works under a reference channel by using an initial power supply voltage and an initial radio frequency gain index and transmits preset power; ACLRTarget is target ACLR; x is a first adjustment coefficient; delta VCCAThe first voltage compensation value is corresponding to the reference channel.
It should be noted that the adjustment coefficients x corresponding to the reference channels of different electronic devices to be calibrated may be the same or different. This embodiment is not limited to this.
In addition, since Δ ACLR calculated by the above formula (1) may be a positive number or a negative number, the first voltage compensation value calculated by the above formula (2) may be a positive number or a negative number.
In this embodiment, the first voltage compensation value of the reference channel is obtained according to the obtained ACLR and the target ACLR, which can ensure that the ACLR of the reference channel of the electronic device to be calibrated can meet the requirement.
In this embodiment, after the first voltage compensation value corresponding to the reference channel is obtained, the initial supply voltage and the first voltage compensation value may be added to obtain the first supply voltage of the reference channel.
Assuming that the initial supply voltage is VCC, the first voltage compensation value corresponding to the reference channel is Δ VCCAThen the supply voltage VCC of the reference channelAThis can be shown in equation (3).
VCCA＝VCC+ΔVCCA (3)
After the supply voltage of the reference channel is obtained, a first supply voltmeter corresponding to the reference channel of the electronic device to be calibrated can be obtained according to a mutual mapping relation between a plurality of groups of first supply voltages of the reference channel and the initial radio frequency gain index.
In this embodiment, a first voltage compensation is determined according to the ACLR when the electronic device to be calibrated operates under the reference channel with the initial power supply voltage and the initial radio frequency gain index and transmits the preset power, and the target ACLR, and the initial power supply voltage is compensated according to the first voltage compensation value, so that the compensated power supply voltage of the reference channel is compared with the power supply voltage directly using the initial power supply voltage as the reference channel, thereby not only ensuring that the ACLR of the reference channel meets the requirements, but also ensuring that the power consumption of the radio frequency power amplifier operates in the reference channel to be better.
In the above embodiment, the reference power range corresponding to the initial supply voltage map may be further included in the initial supply voltage table. In practice, when an initial power supply voltmeter is obtained, any electronic device with the same attribute as the electronic device to be calibrated can be controlled to operate under a reference channel, and when different power values are transmitted respectively, corresponding power supply voltage and radio frequency gain index are obtained, and a reference power range is formed according to the maximum transmission power value and the minimum transmission power value corresponding to the same power supply voltage and the same radio frequency gain index.
For example, when the transmission power is 20dBm, the corresponding supply voltage is 2.3V and the radio frequency gain index is 52 dB; the transmitted power is 21.8dBm, the corresponding supply voltage 2.3V and rf gain index are 52dB, the maximum value of the corresponding transmitted power is 21.8dBm, and the minimum value is 20dBm, then [20dBm, 21.8dBm ] can be taken as the reference power range of the corresponding supply voltage 2.3V and rf gain index 52 dB.
Therefore, the mapping relation of the reference power range, the initial supply voltage and the initial radio frequency gain index can be obtained. It can be understood that, by adjusting the power of the rf power amplifier, a plurality of sets of mutually mapped reference power ranges, initial supply voltages, and initial rf gain indices can be obtained, i.e., an initial supply voltage table can be obtained.
It will be appreciated that a set of initial supply voltages and initial rf gain indices correspond to a reference power range, indicating that when the power value transmitted by the electronic device is within the reference power range, the rf power amplifier may be powered using the initial supply voltage corresponding to the reference power range.
Before step 201, a predetermined power may be determined according to the reference power range. In a specific implementation, a value can be arbitrarily selected from the reference power range as the preset power. For example, a power value close to the lower limit of the reference power range is selected as the preset power.
In practice, when the communication environment is poor or the electronic device is far from the base station, the electronic device may need to transmit the maximum power within the reference power range to ensure the communication quality when operating under a certain power supply voltage and radio frequency gain index.
In this embodiment, the maximum power within the reference power range may be used as the preset power to obtain the ACLR when the to-be-calibrated electronic device operates in the reference channel with the initial supply voltage and the initial radio frequency gain index, so as to determine, according to the obtained ACLR and the target ACLR, the first supply voltage when the to-be-calibrated electronic device operates in the reference channel with the initial supply voltage and the initial radio frequency gain index and transmits the maximum power. Furthermore, a first power supply voltmeter corresponding to a reference channel of the electronic device to be calibrated can be obtained according to the multiple groups of initial power supply voltages, the initial radio frequency gain indexes and the mutual mapping relation between the first power supply voltages.
It can be understood that, since the ACLR at the maximum power of the reference channel meets the requirement, when the corresponding reference channel transmits a power signal smaller than the maximum power, the corresponding ACLR value also meets the requirement.
The initial supply voltage table in the above embodiment includes the initial supply voltage, the initial rf gain index, and the reference power range mapped to each other. As another possible implementation manner, the initial power supply voltage table may include an initial rf gain index and an initial power value corresponding to the initial power supply voltage mapping, that is, the initial power supply voltage table includes an initial power supply voltage, an initial rf gain index and an initial power value, which are mapped to each other.
When the initial power supply voltmeter is obtained, any electronic device with the same attribute as the electronic device to be calibrated can be controlled to work under the reference channel to obtain the corresponding power supply voltage and the radio frequency gain index, so that the mapping relation between the initial power supply voltage and the initial radio frequency gain index and the corresponding transmission power value is obtained.
For example, when the transmission power is 20.5dBm, the corresponding power supply voltage is 2.3V and the corresponding rf gain index is 52dB, and then the rf gain index is 52dB, the power supply voltage is 2.3V, and the transmission power value is 20.5 dBm.
It can be understood that, by adjusting the power of the rf power amplifier, a plurality of sets of initial power values, initial power supply voltages, and initial rf gain indexes mapped to each other may be obtained, i.e., an initial power supply voltage table may be obtained.
Based on the above, as another possible implementation manner for performing the calibration test on the reference channel of the electronic device in step 102, the first supply voltage of the reference channel may be determined according to the first power value transmitted when the electronic device to be calibrated operates on the reference channel at the initial radio frequency gain index.
Fig. 3 is a flowchart illustrating another method for performing calibration test on a reference channel of an electronic device according to an embodiment of the present disclosure.
As shown in fig. 3, the method for performing calibration test on a reference channel of an electronic device includes:
Specifically, a set of initial rf gain index, initial power supply voltage, and initial power value mapped to each other may be selected from an initial power supply voltmeter corresponding to a reference channel of the electronic device to be calibrated, the rf gain index of the electronic device to be calibrated is adjusted to the initial rf gain index, and the electronic device to be calibrated is controlled to operate in the reference channel, so as to obtain a first power value transmitted when the electronic device to be calibrated operates in the reference channel with the initial rf gain index.
For example, if the selected initial power supply voltage, the initial rf gain index, and the initial power value mapped to each other are 2.3V, 52dB, and 20.5dBm, respectively, the power value transmitted when the electronic device to be calibrated operates in the reference channel at the initial rf gain index of 52dB is obtained.
After a first power value transmitted when the electronic equipment to be calibrated works in a reference channel with an initial radio frequency gain index is obtained, a second voltage compensation value corresponding to the reference channel is determined according to the obtained first power value and the initial power value. Specifically, the obtained first power value and the initial power value may be subjected to difference, and then the difference is multiplied by the second adjustment coefficient, so as to obtain a second voltage compensation value of the reference channel. As shown in equations (4) and (5).
ΔP＝P-Pr (4)
ΔVCCp＝y*ΔP (5)
The method comprises the following steps that P is a first power value transmitted by electronic equipment to be calibrated when the electronic equipment works in a reference channel by using an initial radio frequency gain index; prRepresents an initial power value; Δ P is the difference between the first power value and the initial power value; y is a second adjustment coefficient; delta VCCpAnd the second voltage compensation value corresponding to the reference channel of the electronic equipment to be calibrated is represented.
It should be noted that the adjustment coefficients y corresponding to the reference channels of different electronic devices to be calibrated may be the same or different. This embodiment is not limited to this.
In addition, since Δ P calculated by the above formula (4) may be a positive number or a negative number, the second voltage compensation value Δ VCC calculated by the above formula (5) is correspondingly setpIt may also be a positive number or a negative number.
In this embodiment, the second voltage compensation value of the reference channel of the electronic device to be calibrated is obtained according to the obtained first power value and the initial power value, so that the ACLR of the reference channel can meet the requirement, and the power consumption of the radio frequency power amplifier can achieve a better level.
In this embodiment, after obtaining the second voltage compensation value corresponding to the reference channel of the electronic device to be calibrated, the second voltage compensation value and the initial power supply voltage corresponding to the initial rf gain index used when the first power value is obtained may be added to obtain the first power supply voltage of the reference channel. As shown in equation (6).
VCCp＝VCC+ΔVCCp (6)
Wherein VCC ispA first supply voltage for a reference channel of the electronic device to be calibrated, VCC being an initial supply voltage, Δ VCCpAnd the second voltage compensation value corresponds to a reference channel of the electronic equipment to be calibrated.
After the first power supply voltage of the reference channel is obtained, a mutual mapping relation among the first power value, the first power supply voltage of the reference channel and the initial radio frequency gain index can be obtained, and a first power supply voltage table is obtained according to multiple groups of mutually mapped first power values, the first power supply voltage of the reference channel and the initial radio frequency gain index.
In this embodiment, by determining the second voltage compensation value according to the first power value transmitted when the electronic device to be calibrated operates in the reference channel at the initial radio frequency gain index, and compensating the initial power supply voltage of the reference channel according to the second voltage compensation value, and using the compensated initial power supply voltage as the first power supply voltage of the reference channel of the electronic device to be calibrated, compared with directly using the initial power supply voltage as the power supply voltage of the reference channel of the electronic device to be calibrated, it is possible to ensure that the ACLR of the reference channel meets the requirements, and it is also possible to ensure that the power consumption of the radio frequency power amplifier operates in the reference channel is better.
On the basis of the above embodiment, it is assumed that the electronic device to be calibrated comprises N non-reference channels. After the first power supply voltmeter corresponding to the reference channel of the electronic device to be calibrated is determined, the N non-reference channels of the electronic device to be calibrated can be subjected to calibration test one by one according to the first power supply voltmeter, and the second power supply voltmeter corresponding to the N non-reference channels is determined.
In order to improve the test efficiency of the electronic device to be calibrated, as another possible implementation manner, M non-reference channels may be selected from N non-reference channels for performing a calibration test, where M is smaller than N. And then obtaining second supply voltage meters of the rest N-M non-reference channels according to the second supply voltage meters of the M non-reference channels.
Fig. 4 is a schematic flowchart of a method for performing calibration test on each non-reference channel of an electronic device to be calibrated according to an embodiment of the present application. As shown in fig. 4, the method for performing calibration test on each non-reference channel of the electronic device to be calibrated includes:
In this embodiment, the electronic device to be calibrated includes N non-reference channels, and M non-reference channels are selected from the N non-reference channels. And testing the M non-reference channels according to the first power supply voltmeter, and determining second power supply voltages respectively corresponding to the M non-reference channels of the electronic equipment to be calibrated.
When performing calibration tests on non-reference channels, it is similar to performing tests on reference channels.
As a possible implementation, the first supply voltage table includes an initial rf gain index and a reference power range corresponding to the first supply voltage map. Specifically, the ACLR of the electronic device to be calibrated, which operates on a non-reference channel with a first supply voltage and an initial rf gain index and transmits a predetermined power, is obtained. Wherein the preset power may be determined according to a reference power range included in the first power supply voltage meter.
And then, determining a third voltage compensation value corresponding to the non-reference channel according to the obtained ACLR and the target ACLR, and determining a second power supply voltage of the non-reference channel of the electronic equipment to be calibrated according to the first power supply voltage and the third voltage compensation value. Therefore, second supply voltages corresponding to the M non-reference channels can be obtained.
According to the method, for each non-reference channel in the M non-reference channels, multiple groups of mutually mapped second supply voltages, initial gain radio frequency indices, and reference power ranges may be obtained according to multiple groups of mutually mapped first supply voltages and initial gain radio frequency indices in the first supply voltage table. Therefore, a plurality of groups of second power supply voltages, initial gain radio frequency indexes and reference power ranges which are mapped with each other form a second power supply voltage meter corresponding to the non-reference channel.
The target ACLR of the non-reference channel may be the same as or different from the ACLR of the channel.
As another possible implementation manner, the first power supply voltage table includes an initial rf gain index and a first power value corresponding to the first power supply voltage map. Specifically, a second power value transmitted when the electronic device to be calibrated operates in a non-reference channel with an initial radio frequency gain index in a first power supply voltmeter is obtained. And determining a fourth voltage compensation value corresponding to the non-reference channel according to the second power value and the first power value. And then, determining a second supply voltage of the non-reference channel according to the first supply voltage and the fourth voltage compensation value.
According to the method, for each non-reference channel in the M non-reference channels, multiple groups of mutually mapped second power supply voltages, initial gain radio frequency indexes and second power values can be obtained according to multiple groups of mutually mapped first power supply voltages, initial gain radio frequency indexes and first power values in the first power supply voltage table. Therefore, a plurality of groups of second power supply voltages, initial gain radio frequency indexes and second power values which are mapped with each other form a second power supply voltage meter corresponding to the non-reference channel.
In this embodiment, the second power supply voltages corresponding to the N-M non-reference channels may be determined according to a frequency difference between adjacent non-reference channels.
Specifically, frequency differences between the jth non-reference channel and the jth-1 and jth +1 non-reference channels are calculated. And the jth non-reference channel is a non-reference channel needing to determine the second power supply voltage. The (j-1) th non-reference channel and the (j + 1) th non-reference channel are non-reference channels of a known second supply voltage.
And then, determining a second power supply voltage corresponding to the jth non-reference channel according to the frequency difference, a second power supply voltage corresponding to the jth-1 non-reference channel and a second power supply voltage corresponding to the jth +1 non-reference channel.
Suppose that the frequencies of the j-1 th, j-1 th and j +1 th non-reference channels are fj-1、fjAnd fj+1The corresponding second supply voltages are respectively Vj-1、VjAnd Vj+1. From equation (7), V can be obtainedj。
In this embodiment, the second power supply voltages of the remaining N-M non-reference channels in the N non-reference channels are determined by using the linear difference according to the second power supply voltages corresponding to the M non-reference channels, so that the calibration time of the electronic device can be saved. When the non-reference channels of the electronic device to be calibrated are calibrated, a part of the non-reference channels can be calibrated and tested first, and the rest non-reference channels are determined by the second power supply voltage corresponding to the calibrated non-reference channels, so that the calibration and test time of the non-reference channels can be greatly saved, and the calibration time of the electronic device to be calibrated is further saved.
In order to implement the foregoing embodiments, an electronic device calibration apparatus is further provided in an embodiment of the present application. Fig. 5 is a schematic structural diagram of an electronic device calibration apparatus according to an embodiment of the present application.
As shown in fig. 5, the electronic device calibration apparatus includes: an obtaining module 510, a first determining module 520, and a second determining module 530.
The obtaining module 510 is configured to obtain an initial power supply voltmeter of a reference channel corresponding to the electronic device to be calibrated according to an attribute of the electronic device to be calibrated, where the initial power supply voltmeter includes each initial power supply voltage;
the first determining module 520 is configured to perform a calibration test on a reference channel of the electronic device according to the initial power supply voltmeter, and determine a first power supply voltmeter corresponding to the reference channel of the electronic device to be calibrated;
the second determining module 530 is configured to perform calibration tests on the non-reference channels of the electronic device to be calibrated respectively according to the first power supply voltmeter, and determine second power supply voltmeters corresponding to the non-reference channels of the electronic device to be calibrated respectively.
Fig. 6 is a schematic structural diagram of another electronic device calibration apparatus according to an embodiment of the present application.
In a possible implementation manner of this embodiment, as shown in fig. 6, the apparatus further includes:
the third determining module 540 is configured to perform voltage tracking calibration or power tracking calibration on any electronic device having the same attribute as the electronic device to be calibrated before obtaining the initial power supply voltmeter of the reference channel corresponding to the electronic device to be calibrated according to the attribute of the electronic device to be calibrated, and determine the initial power supply voltmeter.
In a possible implementation manner of this embodiment, the initial power supply voltage table further includes an initial radio frequency gain index corresponding to the initial power supply voltage mapping; the first determination module 520 may include:
the first acquisition unit is used for acquiring the leakage ratio of adjacent channels when the electronic equipment to be calibrated works under a reference channel by using an initial power supply voltage and an initial radio frequency gain index and transmits preset power;
the first determining unit is used for determining a first voltage compensation value corresponding to the reference channel according to the adjacent channel leakage ratio and the target adjacent channel leakage ratio;
and the second determining unit is used for determining the first power supply voltage of the reference channel of the electronic equipment to be calibrated according to the initial power supply voltage and the first voltage compensation value.
In a possible implementation manner of this embodiment, the first determining unit is further configured to:
and determining a first voltage compensation value corresponding to the reference channel according to the difference value between the adjacent channel leakage ratio and the target adjacent channel leakage ratio and the first adjustment coefficient.
In a possible implementation manner of this embodiment, the initial supply voltage table further includes a reference power range corresponding to the initial supply voltage mapping; the first determination module 520 may further include:
and the third determining unit is used for determining the preset power according to the reference power range.
In a possible implementation manner of this embodiment, the initial power supply voltage table further includes an initial rf gain index and an initial power value corresponding to the initial power supply voltage mapping; the first determination module 520 may include:
the second obtaining unit is used for obtaining a first power value transmitted by the electronic equipment to be calibrated when the electronic equipment works in a reference channel by using the initial radio frequency gain index;
a fourth determining unit, configured to determine a second voltage compensation value corresponding to the reference channel according to the first power value and the initial power value;
and the fifth determining unit is used for determining the first supply voltage of the reference channel according to the initial supply voltage and the second voltage compensation value.
In a possible implementation manner of this embodiment, the fourth determining unit is further configured to:
and determining a second voltage compensation value corresponding to the reference channel according to the difference value of the first power value and the initial power value and the second adjustment coefficient.
In a possible implementation manner of this embodiment, the electronic device to be calibrated includes N non-reference channels; the second determining module 530 may include:
the sixth determining unit is configured to perform calibration test on the M non-reference channels of the electronic device to be calibrated, and determine second power supply voltages respectively corresponding to the M non-reference channels of the electronic device to be calibrated, where M is smaller than N;
and the seventh determining unit is used for determining the second power supply voltages corresponding to the N-M non-reference channels according to the second power supply voltages corresponding to the M non-reference channels.
In a possible implementation manner of this embodiment, the seventh determining unit is further configured to:
determining frequency difference values between the jth non-reference channel and the jth-1 and jth +1 non-reference channels respectively;
and determining a second power supply voltage corresponding to the jth non-reference channel according to the frequency difference, a second power supply voltage corresponding to the jth-1 non-reference channel and a second power supply voltage corresponding to the jth +1 non-reference channel.
The division of each module in the electronic device calibration apparatus is only used for illustration, and in other embodiments, the electronic device calibration apparatus may be divided into different modules as needed to complete all or part of the functions of the electronic device calibration apparatus.
It should be noted that the foregoing explanation of the embodiment of the electronic device calibration method is also applicable to the electronic device calibration apparatus of the embodiment, and therefore, the explanation is not repeated herein.
According to the electronic equipment calibration device, the initial power supply voltmeter of the reference channel corresponding to the electronic equipment to be calibrated is obtained according to the attribute of the electronic equipment to be calibrated, the reference channel of the electronic equipment to be calibrated is subjected to calibration test according to the initial power supply voltmeter, the first power supply voltmeter corresponding to the reference channel of the electronic equipment to be calibrated is determined, then, calibration test is respectively carried out on all non-reference channels of the electronic equipment to be calibrated according to the first power supply voltmeter of the reference channel, and the second power supply voltmeter corresponding to all non-reference channels of the electronic equipment to be calibrated is determined. In this embodiment, a calibration test is performed on the reference channel according to the initial power supply voltmeter of the reference channel corresponding to the electronic device to be calibrated, and a calibration test is performed on each non-reference channel according to the calibrated first power supply voltmeter of the reference channel. Therefore, all channels of each electronic device to be calibrated are calibrated according to the attribute of the electronic device to be calibrated to obtain the working parameters of the channels of each electronic device to be calibrated, so that when the electronic device works in any channel, the adjacent channel leakage ratio can meet the requirement, the power consumption of the radio frequency power amplifier is better, and the performance consistency of the electronic devices with the same attribute is improved.
In order to implement the above embodiments, an electronic device is also provided in the embodiments of the present application. Fig. 7 is a schematic structural diagram of an electronic device according to an embodiment of the present application.
As shown in fig. 7, the electronic apparatus includes: a processor 610 and a memory 620; wherein the processor 610 runs a program corresponding to the executable program code by reading the executable program code stored in the memory 620, for implementing the electronic device calibration method as described in the above embodiments.
In order to implement the foregoing embodiments, the present application further proposes a non-transitory computer-readable storage medium, on which a computer program is stored, and the computer program, when executed by a processor, implements the electronic device calibration method according to the foregoing embodiments.
In the description of the present specification, the terms "first", "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implying any number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature.
Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more executable instructions for implementing steps of a custom logic function or process, and alternate implementations are included within the scope of the preferred embodiment of the present application in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the present application.
The logic and/or steps represented in the flowcharts or otherwise described herein, e.g., an ordered listing of executable instructions that can be considered to implement logical functions, can be embodied in any computer-readable medium for use by or in connection with an instruction execution system, apparatus, or device, such as a computer-based system, processor-containing system, or other system that can fetch the instructions from the instruction execution system, apparatus, or device and execute the instructions. For the purposes of this description, a "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of the computer-readable medium would include the following: an electrical connection (electronic device) having one or more wires, a portable computer diskette (magnetic device), a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM). Additionally, the computer-readable medium could even be paper or another suitable medium upon which the program is printed, as the program can be electronically captured, via for instance optical scanning of the paper or other medium, then compiled, interpreted or otherwise processed in a suitable manner if necessary, and then stored in a computer memory.
In the above embodiments, the various steps or methods may be implemented in software or firmware stored in memory and executed by a suitable instruction execution system. If implemented in hardware, as in another embodiment, any one or combination of the following techniques, which are known in the art, may be used: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application specific integrated circuit having an appropriate combinational logic gate circuit, a Programmable Gate Array (PGA), a Field Programmable Gate Array (FPGA), or the like.
It will be understood by those skilled in the art that all or part of the steps carried by the method for implementing the above embodiments may be implemented by hardware related to instructions of a program, which may be stored in a computer readable storage medium, and when the program is executed, the program includes one or a combination of the steps of the method embodiments.
In addition, functional units in the embodiments of the present application may be integrated into one processing module, or each unit may exist alone physically, or two or more units are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode. The integrated module, if implemented in the form of a software functional module and sold or used as a stand-alone product, may also be stored in a computer readable storage medium.
The storage medium mentioned above may be a read-only memory, a magnetic or optical disk, etc. Although embodiments of the present application have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present application, and that variations, modifications, substitutions and alterations may be made to the above embodiments by those of ordinary skill in the art within the scope of the present application.
Claims (12)
1. An electronic device calibration method, comprising:
acquiring an initial power supply voltmeter of a reference channel corresponding to the electronic equipment to be calibrated according to the attribute of the electronic equipment to be calibrated, wherein the initial power supply voltmeter comprises each initial power supply voltage;
according to the initial power supply voltmeter, performing calibration test on a reference channel of the electronic equipment, and determining a first power supply voltmeter corresponding to the reference channel of the electronic equipment to be calibrated;
according to the first power supply voltmeter, respectively carrying out calibration test on each non-reference channel of the electronic equipment to be calibrated, and determining a second power supply voltmeter corresponding to each non-reference channel of the electronic equipment to be calibrated; determining a second supply voltage of a target non-reference channel according to a frequency difference value between the target non-reference channel and two adjacent non-reference channels of the target non-reference channel and the second supply voltage; the target non-reference signal is any one or more non-reference channels which are not adjacent to the reference channel in the non-reference channels.
2. The method of claim 1, wherein before obtaining an initial supply voltage table of a reference channel corresponding to the electronic device to be calibrated according to the attribute of the electronic device to be calibrated, the method comprises:
and carrying out voltage tracking calibration or power tracking calibration on any electronic equipment with the same attribute as the electronic equipment to be calibrated, and determining the initial power supply voltmeter.
3. The method of claim 1, wherein the initial supply voltage table further comprises an initial rf gain index corresponding to an initial supply voltage map;
the performing a calibration test on a reference channel of the electronic device includes:
acquiring the adjacent channel leakage ratio of the electronic equipment to be calibrated when the electronic equipment to be calibrated works under a reference channel by using the initial power supply voltage and the initial radio frequency gain index and transmits preset power;
determining a first voltage compensation value corresponding to the reference channel according to the adjacent channel leakage ratio and a target adjacent channel leakage ratio;
and determining a first power supply voltage of a reference channel of the electronic equipment to be calibrated according to the initial power supply voltage and the first voltage compensation value.
4. The method of claim 3, wherein said determining a first voltage offset value corresponding to said reference channel based on said adjacent channel leakage ratio and a target adjacent channel leakage ratio comprises:
and determining a first voltage compensation value corresponding to the reference channel according to the difference value between the adjacent channel leakage ratio and the target adjacent channel leakage ratio and a first adjustment coefficient.
5. The method of claim 3, wherein the initial supply voltage table further includes a reference power range corresponding to an initial supply voltage map;
before the obtaining of the adjacent channel leakage ratio when the electronic device operates under the reference channel at the initial supply voltage and transmits the preset power, the method further includes:
and determining the preset power according to the reference power range.
6. The method according to any of claims 1-5, wherein the initial power supply voltage table further comprises an initial RF gain index and an initial power value corresponding to an initial power supply voltage map;
the calibration test of the reference channel of the electronic device to be calibrated includes:
acquiring a first power value transmitted by the electronic equipment to be calibrated when the electronic equipment works in a reference channel according to the initial radio frequency gain index;
determining a second voltage compensation value corresponding to the reference channel according to the first power value and the initial power value;
and determining a first supply voltage of the reference channel according to the initial supply voltage and the second voltage compensation value.
7. The method of claim 6, wherein the determining a second voltage compensation value corresponding to the reference channel according to the first power value and the initial power value comprises:
and determining a second voltage compensation value corresponding to the reference channel according to the difference value of the first power value and the initial power value and a second adjustment coefficient.
8. The method of claim 6, wherein the electronic device to be calibrated comprises N non-reference channels;
the respectively performing calibration test on each non-reference channel of the electronic device to be calibrated includes:
performing calibration test on the M non-reference channels of the electronic equipment to be calibrated, and determining second power supply voltages respectively corresponding to the M non-reference channels of the electronic equipment to be calibrated, wherein M is smaller than N;
and determining second power supply voltages respectively corresponding to the N-M non-reference channels according to the second power supply voltages respectively corresponding to the M non-reference channels.
9. The method of claim 8, wherein the determining the second supply voltages for the N-M non-reference channels according to the second supply voltages for the M non-reference channels comprises:
determining frequency difference values between the jth non-reference channel and the jth-1 and jth +1 non-reference channels respectively;
and determining a second power supply voltage corresponding to the jth non-reference channel according to the frequency difference, a second power supply voltage corresponding to the jth-1 non-reference channel and a second power supply voltage corresponding to the jth +1 non-reference channel.
10. An electronic device calibration apparatus, comprising:
the calibration method comprises the steps that an obtaining module is used for obtaining an initial power supply voltmeter of a reference channel corresponding to electronic equipment to be calibrated according to the attribute of the electronic equipment to be calibrated, wherein the initial power supply voltmeter comprises initial power supply voltages;
the first determining module is used for performing calibration test on a reference channel of the electronic equipment according to the initial power supply voltmeter and determining a first power supply voltmeter corresponding to the reference channel of the electronic equipment to be calibrated;
a second determining module, configured to perform calibration tests on the non-reference channels of the electronic device to be calibrated respectively according to the first power supply voltmeter, and determine second power supply voltmeters corresponding to the non-reference channels of the electronic device to be calibrated respectively; determining a second supply voltage of a target non-reference channel according to a frequency difference value between the target non-reference channel and two adjacent non-reference channels of the target non-reference channel and the second supply voltage; the target non-reference signal is any one or more non-reference channels which are not adjacent to the reference channel in the non-reference channels.
11. An electronic device comprising a processor and a memory;
wherein the processor runs a program corresponding to the executable program code by reading the executable program code stored in the memory for implementing the electronic device calibration method as claimed in any one of claims 1 to 9.
12. A non-transitory computer readable storage medium having stored thereon a computer program, wherein the computer program, when executed by a processor, implements the electronic device calibration method of any of claims 1-9.
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| CN111064478B (en) * | 2019-12-16 | 2021-04-27 | 紫光展讯通信(惠州)有限公司 | Time delay calibration method, wireless radio frequency device and computer readable storage medium |
| CN112152648B (en) * | 2020-09-08 | 2022-08-12 | Oppo广东移动通信有限公司 | Radio frequency circuit, power adjusting method and communication terminal |
| CN112152734B (en) * | 2020-09-08 | 2022-08-09 | Oppo广东移动通信有限公司 | Information processing method, information processing apparatus, communication terminal, and computer-readable storage medium |
| CN112532053B (en) * | 2020-10-09 | 2022-03-29 | 中兴通讯股份有限公司 | Radio frequency power supply adjusting method, device, equipment and storage medium |
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| CN106549717A (en) * | 2015-09-23 | 2017-03-29 | 中兴通讯股份有限公司 | A kind of transmission power detection method and device |
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| CN101729029A (en) * | 2008-10-30 | 2010-06-09 | 苹果公司 | Electronic devices with calibrated radio frequency communications circuitry |
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