CN117642649A

CN117642649A - Measuring device and movable platform

Info

Publication number: CN117642649A
Application number: CN202180100182.8A
Authority: CN
Inventors: 卢栋; 刘辰煜; 甘汝婷
Original assignee: SZ DJI Technology Co Ltd
Current assignee: SZ DJI Technology Co Ltd
Priority date: 2021-07-21
Filing date: 2021-07-21
Publication date: 2024-03-01
Also published as: WO2023000217A1

Abstract

A measuring device (1000) and a movable platform (2000). The measuring device (1000) comprises a ranging module (100) and a scanning module (300). The plurality of chips (121) in the light emitter (10) of the ranging module (100) are distributed on two sides of the collimation element (40) of the ranging module (100) relative to the equivalent central axis of the light emitter (10), and each chip (121) is obliquely arranged relative to the equivalent central axis so as to improve the uniformity of light rays emitted by the measuring device (1000).

Description

Measuring device and movable platform

Technical Field

The present disclosure relates to the field of measurement technologies, and in particular, to a measurement device and a movable platform.

Background

For the ranging module, emergent light is generally used by directly collimating a laser tube, and received light is converged to a detector through a receiving lens for direct use, so that the most direct and simple use mode can cause the problems of large emergent light spots, low energy utilization rate, scattered stray light in the detector and the like, and the energy utilization rate of the system is low.

Disclosure of Invention

The embodiment of the application provides a measuring device and a movable platform.

The measuring device of the embodiment of the application comprises a ranging module and a scanning module. The distance measuring module comprises a light emitter, a light receiver, a light receiving and transmitting path distinguishing element and a collimating element, wherein the light emitter comprises a light path turning element and a plurality of luminous chips which are packaged in the same space, the chips are distributed along the slow axis of each chip, the chips are distributed on two sides of the collimating element relative to the equivalent central axis of the light emitter, each chip is obliquely arranged relative to the equivalent central axis, at least part of the chips are different in inclination angle relative to the equivalent central axis, the reflecting surface of the light path turning element is used for reflecting light beams emitted by the luminous chips and then emitting from the light emitter, and the light receiving and transmitting path distinguishing element is positioned between the light emitter and the collimating element. The scanning module comprises at least two moving optical elements, and each moving optical element is used for changing the optical path of an incident light beam. The light beam emitted by the light emitter passes through the receiving and transmitting light path distinguishing element and the collimating element and is incident to the scanning module, the scanning module is used for scanning and emitting the light beam collimated by the collimating element, and the return light reflected by the object sequentially passes through the scanning module, the collimating element and the receiving and transmitting light path distinguishing element and then is incident to the light receiver.

The movable platform of the implementation of the application comprises a measuring device and a movable platform body, wherein the measuring device is installed on the movable platform body. The measuring device comprises a ranging module and a scanning module. The distance measuring module comprises a light emitter, a light receiver, a light receiving and transmitting path distinguishing element and a collimating element, wherein the light emitter comprises a light path turning element and a plurality of luminous chips which are packaged in the same space, the chips are distributed along the slow axis of each chip, the chips are distributed on two sides of the collimating element relative to the equivalent central axis of the light emitter, each chip is obliquely arranged relative to the equivalent central axis, at least part of the chips are different in inclination angle relative to the equivalent central axis, the reflecting surface of the light path turning element is used for reflecting light beams emitted by the luminous chips and then emitting from the light emitter, and the light receiving and transmitting path distinguishing element is positioned between the light emitter and the collimating element. The scanning module comprises at least two moving optical elements, and each moving optical element is used for changing the optical path of an incident light beam. The light beam emitted by the light emitter passes through the receiving and transmitting light path distinguishing element and the collimating element and is incident to the scanning module, the scanning module is used for scanning and emitting the light beam collimated by the collimating element, and the return light reflected by the object sequentially passes through the scanning module, the collimating element and the receiving and transmitting light path distinguishing element and then is incident to the light receiver.

In the measuring device and the movable platform of the embodiment of the application, the plurality of chips of the ranging module are distributed on two sides of the equivalent central axis of the collimating element relative to the light emitter, each chip is obliquely arranged relative to the equivalent central axis, and at least part of chips are different in inclination angle relative to the equivalent central axis, so that light rays emitted by each chip can be incident to the collimating element through the receiving-transmitting light path distinguishing element with the same or close optical power, and the measuring device has higher energy utilization rate.

Another measurement device of an embodiment of the present application includes a ranging module and a scanning module. The distance measuring module comprises a light emitter, a light receiver, a light receiving and transmitting path distinguishing element and a collimating element, wherein the light emitter is used for emitting light beams, and the light receiving and transmitting path distinguishing element is positioned between the light emitter and the collimating element. The scanning module comprises a first prism and a second prism, wherein the first prism and the second prism are used for changing the light path of a light beam incident to the scanning module, each scanning module comprises a plurality of wedge-shaped structures, the wedge-shaped structures are connected in sequence, and a step surface is formed at each connecting position. The light beam emitted by the light emitter passes through the receiving and transmitting light path distinguishing element and the collimating element and is incident to the scanning module, the scanning module is used for scanning and emergent light beams collimated by the collimating element, and return light reflected by an object sequentially passes through the scanning module, the collimating element and the receiving and transmitting light path distinguishing element and then is incident to the light receiver.

The movable platform of the implementation of the application comprises a measuring device and a movable platform body, wherein the measuring device is installed on the movable platform body. The measuring device comprises a ranging module and a scanning module. The distance measuring module comprises a light emitter, a light receiver, a light receiving and transmitting path distinguishing element and a collimation element, wherein the light emitter is used for emitting light beams, and the light receiving and transmitting path distinguishing element is positioned between the light emitter and the collimation element. The scanning module comprises a first prism and a second prism, wherein the first prism and the second prism are used for changing the light path of a light beam incident to the scanning module, each scanning module comprises a plurality of wedge-shaped structures, the wedge-shaped structures are connected in sequence, and a step surface is formed at each connecting position. The light beam emitted by the light emitter passes through the receiving and transmitting light path distinguishing element and the collimating element and is incident to the scanning module, the scanning module is used for scanning and emergent light beams collimated by the collimating element, and return light reflected by an object sequentially passes through the scanning module, the collimating element and the receiving and transmitting light path distinguishing element and then is incident to the light receiver.

In measuring device and movable platform of this embodiment, scanning module is including having a plurality of wedge structure's first prism and second prism, can make the light that is reemitted from measuring device scan according to predetermined route to and can make the return light that measuring device received object reflection reduce the stray light scattering when scanning module gets into range finding module, make measuring device have higher energy utilization.

Additional aspects and advantages of embodiments of the application will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of embodiments of the application.

Drawings

The foregoing and/or additional aspects and advantages of the present application will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings, in which:

FIG. 1 is a schematic structural view of a measurement device according to certain embodiments of the present application;

FIG. 2 is a schematic diagram of a ranging module according to some embodiments of the present application;

FIG. 3 is a schematic structural view of a light emitter according to certain embodiments of the present application;

FIG. 4 is a schematic diagram of a ranging module according to some embodiments of the present application;

FIG. 5 is a schematic diagram of a ranging module according to some embodiments of the present application;

FIG. 6 is a schematic diagram of the distribution of light intensity and distance on the light emitting side of a chip according to some embodiments of the present application;

FIG. 7 is a schematic view of a scene of a ranging module emitting light according to some embodiments of the present application;

FIG. 8 is a schematic view of a scene of a ranging module emitting light according to some embodiments of the present application;

FIG. 9 is a schematic diagram of a scenario in which a ranging module emits light according to some embodiments;

FIG. 10 is a schematic view of a scene of a ranging module emitting light according to some embodiments of the present application;

FIG. 11 is a schematic structural view of a light emitter according to certain embodiments of the present application;

FIG. 12 is a schematic structural view of an optical receiver according to certain embodiments of the present application;

FIG. 13 is a schematic structural view of a cover plate according to certain embodiments of the present application;

FIG. 14 is a schematic partial cross-sectional view of a measurement device according to certain embodiments of the present application;

FIG. 15 is a schematic view of the structure of a first prism or a second prism according to certain embodiments of the present disclosure;

FIG. 16 is a schematic partial cross-sectional view of a scanning module according to some embodiments of the present application;

FIG. 17 is a schematic view of the structure of a first prism or a second prism according to certain embodiments of the present disclosure;

FIG. 18 is a schematic view of the structure of a first prism or a second prism according to some embodiments of the present application;

FIG. 19 is a schematic structural view of a third prism according to some embodiments of the present application;

FIG. 20 is a schematic structural view of a measurement device according to certain embodiments of the present application;

FIG. 21 is a schematic structural view of a light transmissive member according to certain embodiments of the present disclosure;

FIG. 22 is a schematic structural view of a light transmissive member according to certain embodiments of the present disclosure;

FIG. 23 is a schematic structural view of a light transmissive member according to certain embodiments of the present disclosure;

FIG. 24 is a schematic view of the structure of a light transmissive member according to certain embodiments of the present disclosure;

fig. 25 is a schematic structural view of a movable platform according to some embodiments of the present application.

Detailed Description

Embodiments of the present application are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are exemplary only for the purpose of explaining the present application and are not to be construed as limiting the present application.

In the description of the present application, it should be understood that the terms "thickness," "upper," "top," "bottom," "inner," "outer," and the like indicate an orientation or a positional relationship based on that shown in the drawings, and are merely for convenience of description and to simplify the description, rather than to indicate or imply that the devices or elements being referred to must have a particular orientation, be configured and operated in a particular orientation, and thus should not be construed as limiting the present application. Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more features. In the description of the present application, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.

In the description of the present application, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically connected, electrically connected or can be communicated with each other; can be directly connected or indirectly connected through an intermediate medium, and can be communicated with the inside of two elements or the interaction relationship of the two elements.

The following disclosure provides many different embodiments or examples for implementing different structures of the present application. In order to simplify the disclosure of the present application, the components and arrangements of specific examples are described below. Of course, they are merely examples and are not intended to limit the present application. Furthermore, the present application may repeat reference numerals and/or letters in the various examples, which are for the purpose of brevity and clarity, and which do not in themselves indicate the relationship between the various embodiments and/or arrangements discussed. In addition, the present application provides examples of various specific processes and materials, but one of ordinary skill in the art may recognize the application of other processes and/or the use of other materials.

Referring to fig. 1 to 3, a measuring device 1000 is provided in an embodiment of the present application, and the measuring device 1000 includes a ranging module 100 and a scanning module 300.

The ranging module 100 comprises a light emitter 10, a light receiver 20, a light receiving and transmitting path distinguishing element 30 and a collimating element 40, wherein the light emitter 10 comprises a light path turning element 11 and a plurality of luminous chips 121 which are packaged in the same space, the chips 121 are distributed along a slow axis S of each chip 121, the chips 121 are distributed on two sides of the collimating element 40 relative to an equivalent central axis O2 of the light emitter 10, each chip 121 is obliquely arranged relative to the equivalent central axis O2, at least part of chips 121 are different in inclination angle relative to the equivalent central axis O2, a reflecting surface 111 of the light path turning element 11 is used for reflecting light beams emitted by the luminous chips 121 and then emitting the light beams from the light emitter 10, and the light receiving and transmitting path distinguishing element 30 is positioned between the light emitter 10 and the collimating element 40.

The scanning module 300 includes at least two moving optical elements 310, each moving optical element 310 for changing the optical path of an incident light beam.

The light beam emitted from the light emitter 10 is incident to the scanning module 300 through the light receiving and transmitting path distinguishing element 30 and the collimating element 40, the scanning module 300 is used for scanning and emitting the light beam collimated by the collimating element 40, and the return light reflected by the object is incident to the light receiver 20 after sequentially passing through the scanning module 300, the collimating element 40 and the light receiving and transmitting path distinguishing element 30.

The light emitting chips 121 may be semiconductor chips 121, each of the chips 121 may be arranged in a direction identical to a direction of a slow axis S of each of the chips 121, and although the inclination angle of each of the chips 121 with respect to the equivalent central axis is different, the direction of the slow axis S of each of the chips 121 is also different, but the direction of the slow axis S of each of the chips 121 is approximately equivalent, and it may be considered that each of the chips 121 has a common slow axis S1, the arrangement direction of the plurality of chips 121 extends along the slow axis S1, and the light emitting side 1211 of each of the chips 121 faces the same side.

The light path turning element 11 may be a mirror for reflecting the light emitted from each chip 121 to the transceiving light path distinguishing element 30. The light passing through the light receiving/transmitting path distinguishing element 30 sequentially passes through the collimating element 40 and the scanning module 300 and then exits to the outside of the measuring device 1000, and then reaches the object.

The scanning module 300 can scan and project the light emitted from the measuring device 1000 to an object within a certain range, and can receive the return light reflected from the object. The scanning module 300 changes the optical path of the light beam incident to the scanning module 300 through the two moving optical elements 310, so that the light beam emitted from the measuring device 1000 can scan along a preset path, and the stray light scattering is reduced in the process that the return light reflected from the object enters the ranging module 100 through the scanning module 300, thereby improving the energy utilization rate of the measuring device 1000.

The collimating element 40 may be a collimating lens or other element capable of collimating light, and may be used to collect return light reflected by an object, so that the light receiver 20 can receive return light with a certain intensity. The measuring device 1000 may calculate the distance between the measuring device 1000 and the object according to the Time of light emitted by the light emitter 10, the Time of return light received by the light receiver 20, and the propagation speed of the light, using the principle of Time of Flight (TOF) ranging.

Referring to fig. 4, in one embodiment, the transceiver optical path differentiating element 30 includes a light transmitting portion 31 and a light reflecting portion 32. The light transmitting portion 31 is a partial region of the light transmission/reception path dividing element 30 facing the collimating element 40 and/or facing the light emitter 10, and the partial region may be a middle region of the light transmission/reception path dividing element 30 or may be a region extending a certain length from the center of the light transmission/reception path dividing element 30 to the periphery. Specifically, the light-transmitting portion 31 may include a light-transmitting hole or a light-transmitting film layer, and is capable of transmitting light between the light emitter 10 and the collimating element 40. The light reflecting portion 32 is disposed on a surface of the light receiving/transmitting path differentiating element 30 facing the collimating element 40, and surrounds the light transmitting portion 31. The light reflecting portion 32 may include a reflecting mirror or a reflecting film layer, and can reflect the return light of the object after being reflected by the object and passing through the scanning module 300 and the collimating element 40 in sequence to the light receiver 20. Thus, the light receiving/transmitting path differentiating element 30 can differentiate the light emitting path formed by the light emitted by the light emitter 10 and the light receiving path formed by the return light reflected by the object entering the measuring device 1000. That is, the light emitted by the light emitter 10 can pass through the light receiving/transmitting path differentiating element 30, and sequentially pass through the collimating element 40 and the scanning module 300 to be emitted to the object. The return light reflected from the object sequentially passes through the scanning module 300 and the collimating element 40, and is reflected to the light receiver 20 by the light receiving/transmitting path distinguishing element 30.

The equivalent central axis O2 is explained by way of example with reference to fig. 2 and 4. The equivalent center axis of the collimator lens refers to the propagation path of the light ray propagating along the center axis O1 of the collimator element 40 after passing through one plane or sequentially through at least two reflecting mirror surfaces. For example, the light beam propagating along the central axis O1 of the collimation 40 sequentially reflects from the light receiving/transmitting path differentiating element 30 and the reflecting surface 111 and propagates along the central axis O2, where the central axis O2 is an axis connected to the central axis O1 and has a different extending direction from the central axis O1, for example, the central axis O1 extends along the first direction X, the central axis O2 extends along the second direction Y, and the first direction X is different from the second direction Y, and the central axis O2 is an equivalent central axis of the collimation element 40 relative to the light emitter 10. That is, the light ray propagating along the equivalent central axis O2 can propagate along the central axis O1 of the collimating element 40 after being reflected by the reflecting surface 111.

Referring to fig. 5, in another embodiment, the transceiver optical path differentiating element 30 includes a light reflecting portion 32. The light reflecting portion 32 is provided on a surface of the light receiving/transmitting path discriminating element 30 facing the collimating element 40. The light reflecting portion 32 may include a mirror or a reflective film layer capable of reflecting light emitted from the light emitter 10 to the collimating element 40. The reflected light of the object, which sequentially passes through the scanning module 300 and the collimating element 40, is blocked by the light receiving/transmitting path distinguishing element 30, and the other part can enter the light receiver 20. Thus, the light receiving/transmitting path differentiating element 30 can differentiate the light emitting path formed by the light emitted by the light emitter 10 and the light receiving path formed by the return light reflected by the object entering the measuring device 1000.

Referring to fig. 2 and 5, the collimating element 40 is capable of collimating and emitting the light beam emitted from the light emitter 10. The collimating element 40 is also capable of converging return light reflected back by the object to the light receiver 20.

Referring to fig. 2 and 3, the plurality of chips 121 are disposed on two sides of the collimating element 40 opposite to the equivalent central axis O2 of the light emitter 10, each chip 121 is disposed obliquely with respect to the equivalent central axis O2, specifically, the light emitting side 1211 of each chip 121 is inclined toward the direction close to the equivalent central axis O2, the inclination angle of the chips 121 with respect to the equivalent central axis O2 is a vector, that is, the same value of the angle may have positive and negative fractions, for example, the inclination angle of one chip 121 is +1°, and the inclination angle of the other chip 121 is-1 °. Thus, when the light rays emitted by the chips 121 reach the collimating element 40 after being reflected by the light path turning element 11, the energy of the light rays entering the collimating element 40 at each angle is relatively close, and the energy uniformity is relatively high. In addition, the light emitting side 1211 of each chip 121 is inclined toward the direction approaching the equivalent central axis O2, and the outgoing light of each chip 121 arranged at the edge can also enter the straight element 40 to improve the energy utilization. It should be noted that, the inclination angle herein may be an angle between the central axis 1214 of the chip 121 and the equivalent central axis O2, or an angle between one side 1212 of the chip 121 and the equivalent central axis O2, or an angle between the other side 1213 of the chip 121 and the equivalent central axis O2, and only needs to meet the unified calculation standard of inclination angles of the chips 121 relative to the equivalent central axis O2.

Referring to fig. 6, an axis O4 is a central axis of the light emitting side 1211 of the chip 121. The light intensity of the light emitted from the chip 121 is gaussian at the light emitting side 1211 of the chip 121. Among them, the light intensity is highest at the center of the light emitting side 1211 of the chip 121, and the light intensity is gradually reduced toward both sides of the light emitting side 1211 from the center axis O4 of the light emitting side 1211. Since the light receiver 20 is difficult to generate the response signal when the light with smaller light intensity is incident on the light receiver 20, the distance between the measuring device 1000 and the object is calculated mainly by using the time when the light emitter 10 emits light and the time when the light receiver 20 receives the light with enough light intensity to generate the response signal when the measuring device 1000 measures the distance by using the principle of the flight time. When the light emitted by the light emitter 10 passes through the light receiving/transmitting path distinguishing element 30, the light receiving/transmitting path distinguishing element 30 can guide a part of the light with higher light intensity to the collimating element 40, so as to improve the energy utilization rate of the measuring device 1000.

Referring to fig. 4 and fig. 7, fig. 7 omits the process of turning the light emitted from the chip 121 by the light path turning element 11, and illustrates that the light emitted from the chip 121 is directly emitted toward the light receiving/transmitting path differentiating element 30, and the effect is the same as that of the light emitted from the chip 121 after being turned by the light path turning element 11 and then incident on the light receiving/transmitting path differentiating element 30. The light transmitting portion 31 of the light-emitting path discriminating element 30 is for transmitting outgoing light, and the light reflecting portion 32 is for reflecting return light to the light receiver 20. In order to avoid that the receiving of the reflected light by the receiver 20 is too small, which results in a decrease of the detection distance of the measuring device 1000, the duty ratio of the light transmitting portion 31 of the light receiving and transmitting path differentiating element 30 transmitting the outgoing light cannot be too large, so that enough area of the light reflecting portion 32 is left for reflecting the reflected light, and the area where the light reflecting portion 32 is located cannot transmit the outgoing light, which can shade the outgoing light at some angles. Referring to fig. 3, on the premise that there is shielding, the chips 121 are obliquely arranged to emit light, so that shielding of the light emitted from the light emitter 10 by the light reflecting portion 32 can be reduced, and uniformity of light energy of the light emitted by the chips 121 after being collimated by the collimating element 40 can be improved.

Referring to fig. 5 and 8, fig. 8 also omits the process of turning the light emitted from the chip 121 by the light path turning element 11, and illustrates that the light emitted from the chip 121 is directly emitted toward the light receiving/transmitting path distinguishing element 30, and the effect is the same as that of the light emitted from the chip 121 after being turned by the light path turning element 11 and then incident on the light receiving/transmitting path distinguishing element 30. The transceiving optical path discriminating element 30 illustrated in fig. 8 includes a light reflecting portion 32 for reflecting outgoing light from the light emitter 10 to the collimating element 40. As illustrated in fig. 5, return light reflected from the object passes through the collimating element 40 and enters the light receiver 20. If the size of the light receiving/transmitting path discriminating element 30 is too large, the return light may be blocked. To avoid that too little reception of return light by the receiver 20 results in a reduced detection distance of the measuring device 1000, the size of the transceiving optical path discrimination element 30 should not be too large. Referring to fig. 3, when the size of the light receiving and transmitting path distinguishing element 30 is fixed, the chips 121 are arranged to emit light in an inclined manner, so that it is ensured that the emitted light from the light emitter 10 can enter the light receiving and transmitting path distinguishing element 30 to be reflected to the collimating element 40 through the light receiving and transmitting path distinguishing element 30; it is also possible to improve uniformity of light energy of light emitted from each chip 121 after being collimated by the collimating element 40.

Referring to fig. 3, 9, and 10, each chip 121 is disposed obliquely with respect to the equivalent central axis, and at least some chips 121 are disposed at different angles with respect to the equivalent central axis O2. For example, as shown in fig. 9, if the inclination angles of the chips 121 with respect to the equivalent central axis O2 are the same, the proportion of the light rays that can pass through the transceiving optical path distinguishing element 30 is not uniform among the light rays emitted from each chip 121 toward the transceiving optical path distinguishing element 30, resulting in lower uniformity of the light rays that pass through the transceiving optical path distinguishing element 30, specifically, the intensity of the light rays that pass through the transceiving optical path distinguishing element 30 (light transmitting portion 31) by the chips 121 near the equivalent central axis O2 is greater than the intensity of the light rays that pass through the transceiving optical path distinguishing element 30 (light transmitting portion 31) by the chips 121 far from the equivalent central axis O2. As shown in fig. 10, the inclination angles of the partial chips 121 with respect to the equivalent central axis O2 are different, specifically, on one side of the equivalent central axis O2, the inclination angles of the chips 121 with respect to the equivalent central axis O2, which are different from the equivalent central axis O2, are different, so that the proportion of the light rays passing through the light receiving/transmitting path distinguishing element 30 in the light rays emitted by the chips 121 can be adjusted according to the inclination angles of the chips 121 with respect to the equivalent central axis O2 by adjusting the inclination angles of the chips 121 with respect to the equivalent central axis O2, and the proportion of the light rays passing through the light receiving/transmitting path distinguishing element 30 in the light rays emitted by the light receiving/transmitting path distinguishing element 30 is consistent or close (i.e., the light power is the same or close), so that the light rays sequentially passing through the collimating element 40 and the scanning module 300 have higher uniformity. When the light emitted from the measuring device 1000 has higher uniformity, the measuring device 1000 can have higher measurement accuracy.

In summary, in the measuring device 1000 of the present embodiment, the light emitted by the light emitter 10 sequentially passes through the light receiving and transmitting path distinguishing element 30, the collimating element 40 and the scanning module 300 and then exits to the object, the plurality of chips 121 in the light emitter 10 are distributed on two sides of the collimating element 40 relative to the equivalent central axis O2 of the light emitter 10, each chip 121 is obliquely arranged relative to the equivalent central axis O2, and at least part of the chips 121 are different in inclination angle relative to the equivalent central axis O2, so that the light emitted by each chip 121 can enter the collimating element 40 through the light receiving and transmitting path distinguishing element 30 with the same or similar optical power, the light exiting after sequentially passing through the collimating element 40 and the scanning module 300 has higher uniformity, and the measuring device 1000 has higher energy utilization rate, so as to improve the measurement accuracy of the measuring device 1000.

Further description is provided below with reference to the accompanying drawings.

Referring to fig. 2, 3, 6 and 7, the inclination angle of the chip 121 with respect to the equivalent central axis O2 is larger as the chip is further away from the equivalent central axis O2 on one side of the equivalent central axis O2. The inclination angle of the chips 121 with respect to the equivalent central axis O2 is gradually increased, so as to ensure that the part of the light emitted by each chip 121 with higher energy can be guided to the collimating element 40 by the light receiving/transmitting path distinguishing element 30, that is, the light receiving/transmitting path distinguishing element 30 can make the light emitted by each chip 121 pass through with the same or similar light power. Specifically, referring to fig. 9, light emitted from the chip 121 passes through the light transmitting portion 31 of the light receiving/transmitting path distinguishing element 30. If the angles of inclination of the chips 121 with respect to the equivalent central axis O2 are not gradually increased, for example, the angles are the same, as shown in fig. 9, the light-receiving/light-path distinguishing element 30 can only ensure that the portion with higher energy in the light emitted from one chip 121 can pass through the light-transmitting portion 31, and the portion with higher energy in the light emitted from the light-emitting side of the other chip 121 can possibly be blocked by the light-receiving/light-path distinguishing element 30. Referring to fig. 10, when the inclination angle of the chip 121 with respect to the equivalent central axis O2 is gradually increased, the portion of the light emitted from the light emitting side 1211 of each chip 121, which has higher energy, can pass through the light transmitting portion 31, is increased compared with the scheme of fig. 9, that is, the more the chip 121 is further from the equivalent central axis O2, the more the inclination angle is required to ensure that the portion of the light emitted from the light emitting side 1211, which has higher energy, can pass through the light transmitting portion 31. In the embodiment of the present application, the light emitted by each chip 121 can be incident to the collimating element 40 through the light receiving/transmitting path differentiating element 30 with the same or similar optical power, so that the light emitted after passing through the collimating element 40 and the scanning module 300 in sequence has higher uniformity.

Referring to fig. 3, in some embodiments, the inclination angle of each chip 121 with respect to the equivalent central axis O2 may be in the range of [0.5 °,8.0 ° ]. For example, the inclination angle of each chip 121 with respect to the equivalent central axis O2 is 0.5 °, 1.0 °, 1.5 °, 2.0 °, 2.5 °, 3.0 °, 3.5 °, 4.0 °, 4.5 °, 5.0 °, 5.5 °, 6.0 °, 6.5 °, 7.0 °, 7.5 °, or 8.0 °, etc., which are not specifically illustrated herein.

The inclination angle of each chip 121 with respect to the equivalent central axis O2 may be an included angle between the first side 1212 of the chip 121 and the equivalent central axis O2; or the angle between the second side 1213 of the chip 121 and the equivalent central axis O2; the angle between the central axis 1213 of the chip 121 and the equivalent central axis O2 may also be, but is not limited to, this.

If the inclination angle is smaller than 0.5 °, it is difficult for the outgoing path of the light to pass through the transmission/reception optical path distinguishing element 30, and it is difficult to ensure high uniformity of the light passing through the transmission/reception optical path distinguishing element 30. If the inclination angle is larger than 8.0 °, it is also difficult for light to pass through the transmission/reception optical path distinguishing element 30, and it is difficult to ensure high uniformity of light passing through the transmission/reception optical path distinguishing element 30. When the inclination angle of each chip 121 with respect to the equivalent center axis O2 is [0.5 °,8.0 ° ], the light rays passing through the transceiving optical path distinguishing element 30 have high uniformity. The range of inclination angle is the range of absolute value of inclination angle, for example, when the value of inclination angle is 0.5 °, the inclination angle vector may be +0.5° (e.g., α1 in fig. 3) or-0.5 ° (e.g., α1' in fig. 3).

Referring to fig. 3, in some embodiments, the plurality of chips 121 are symmetrically arranged about the equivalent central axis O2. In one embodiment, the light emitter 10 includes a plurality of chip pairs, with two chips 121 in each chip pair being symmetrical about an equivalent central axis O2. For example, on one side of the equivalent center axis O2, the inclination angle of one chip 121 is +1°, and on the other side of the equivalent center axis O2, chips 121 with an inclination angle of-1 ° symmetrical with respect to the chip 121 with an inclination angle of +1° are provided, and chips 121 with inclination angles of +1° and-1 ° are a symmetrical chip pair. The light emitted by the symmetrically arranged chips 121 can pass through the transceiving optical path distinguishing element 30 with the same optical power, so that the light passing through the transceiving optical path distinguishing element 30 has higher uniformity.

With continued reference to fig. 3, in some embodiments, the light emitter 10 sequentially includes, along a direction away from the equivalent central axis O2, a first chip pair 122, a second chip pair 123, and a third chip pair 124, where the range of inclination angles of the chips 121 in the first chip pair 122 with respect to the equivalent central axis O2 is [0.5 °,1.5 ° ], the range of inclination angles of the chips 121 in the second chip pair 123 with respect to the equivalent central axis O2 is [2.5 °,4.0 ° ], and the range of inclination angles of the chips 121 in the third chip pair 124 with respect to the equivalent central axis O2 is [6.0 °,8.0 ° ]. In this way, the light emitted from the three pairs of chips 122, 123, 124 through the transceiving optical path distinguishing element 30 can have high uniformity.

Referring to fig. 2 and 3, in some embodiments, the reflecting surface 111 may be a one-dimensional concave free-form surface for compressing the divergence angle of the light beams emitted from the chips 121 in the fast axis direction. For example, the fast axis direction of the chip 121 shown in fig. 5 is the first direction X, after the light beams emitted by the chips 121 are incident on the reflecting surface 111 along the second direction Y, the light beams are reflected by the reflecting surface 111 toward the first direction X, and at the same time, the divergence angle of the light beams along the first direction X is compressed, so that the energy of the light beams is more concentrated. When the energy of the light beam incident on the light receiving/transmitting path distinguishing element 30 along the first direction X is more concentrated, it can be further ensured that the light beam with high energy passes through the light receiving/transmitting path distinguishing element 30 and sequentially passes through the collimating element 40 and the scanning module 300 and then exits to the object, thereby improving the energy utilization rate of the measuring device 1000.

Referring to fig. 2 and 3, in some embodiments, the optical path turning element 11 may include a reflecting surface 111, and a plurality of chips 121 are aligned along the slow axis S1, and each chip 121 corresponds to the reflecting surface 111. Specifically, the light emitting side 1211 of each chip 121 corresponds to the reflecting surface 111, and the light emitted from one or more chips 121 toward the reflecting surface 111 is reflected to form a light beam emitted from the light emitter 10.

Further, the light emitter 10 may include an edge-emitting laser 12, and the plurality of chips 121 arranged in a row are light-emitting chips 121 of the edge-emitting laser 12. The plurality of chips 121 are aligned in a line along the slow axis S1, and each chip 121 corresponds to the reflecting surface 111, and corresponds to the light emitting side 1211 of one side emitting laser 12 to the reflecting surface 111.

Referring to fig. 11, in some embodiments, the optical path turning element 11 may include two reflecting surfaces 111, and the chips 121 are arranged in two rows along the slow axis S1 (as shown in fig. 3), and each row of chips 121 corresponds to one reflecting surface 111. The two parallel rows are not required to be strictly parallel, and it is sufficient that the two slow axes S1 of the two rows of chips 121 (i.e., the direction in which the chips 121 are arranged and extend) are parallel. When the light emitted from the two arrays of chips 121 forms one beam to be emitted from the light emitter 10, the light intensity of the beam emitted from the light emitter 10 can be increased without increasing the length of the light emitter 10 in the slow axis S1 direction, while forming an expandable area array light source. When the light rays emitted from the two rows of chips 121 respectively form two light beams to be emitted from the light emitter 10, the light emitter 10 can emit two light beams having the same or close optical power without increasing the length of the light emitter 10 in the slow axis S1 direction.

Further, the light emitter 10 may include two edge-emitting lasers 12, and the plurality of chips 121 arranged in a row in each column are light-emitting chips 121 of one edge-emitting laser 12. The light emitting sides 1211 of the two edge emitting lasers 12 correspond to the two reflecting surfaces 111, respectively. Wherein, as shown in fig. 11, the two reflecting surfaces 111 may be located at opposite sides of the optical path turning element 11; of course, the two reflecting surfaces 111 may be located on two adjacent sides of the optical path turning element 11. In addition, the number of the reflection surfaces 111 is not limited to two, but may be three, four, or even more, and correspondingly, the number of the edge-emitting lasers 12 is not limited to two, but may be three, four, or even more, and in this case, the plurality of chips 121 arranged in a row on each edge-emitting laser 12 corresponds to one reflection surface 111.

Referring to fig. 2, in some embodiments, the optical path turning element 11 may be made of a material with a low thermal expansion coefficient. When the chip 121 emits light, heat is often generated, and the optical path turning element 11 made of a material with a low thermal expansion coefficient is not easy to be deformed by heat, so that the deviation of the propagation path of the light reflected by the optical path turning element 11 caused by the deformation of the optical path turning element 11 due to heat can be avoided.

In some embodiments, the reflecting surface 111 of the optical path turning element 11 may be provided with a reflective coating to enhance the reflectivity of the reflecting surface 111. The reflective coating may be a metal reflective coating of the type gold, aluminum, copper, or silver plating, or a highly reflective dielectric coating of glass, to name but a few.

Referring to fig. 2 or 3, in some embodiments, the light emitter 10 may further include a base 13, and the chip 121 or the edge-emitting laser 12 is mounted on the base 13 through a heat sink 14. The optical path turning element 11 is mounted to the base 13 using a bonding process. The heat sink 14 may be a high thermal conductivity material having a certain thickness, such as CuW alloy, ceramic, cuMo alloy, silicon carbide, copper diamond mixed material, etc., which are not illustrated herein. The heat conductivity of the heat sink 14 of the high heat conduction material is greater than 150, so that the heat generated by the chip 121 can be effectively led out, the chip 121 can be ensured to maintain the preset power operation, and the chip 121 is prevented from heating and the heat is not led out in time to influence the normal operation of the chip 121. The contact surface of the optical path turning element 11 with the base 13 may be gold-plated and bonded and fixed with the base 13 to ensure that the optical path turning element 11 is firmly mounted on the base 13.

Referring to fig. 2 or fig. 3, in some embodiments, the base 13 is provided with a receiving cavity 15, and the plurality of chips 121 and the optical path turning element 11 are received in the receiving cavity 15. The light emitter 10 may further include a light-transmissive cover 16, the cover 16 being mounted to the base 13 and sealing the receiving cavity 15. That is, the accommodating cavity 15 and the cover 16 encapsulate the plurality of chips 121 and the optical path turning element 11 in the same space. The light emitted by the chip 121 is only emitted from the cover 16, so as to avoid the stray light from diffusing to other positions inside the measuring device 1000 to cause pollution. The accommodating cavity 15 and the cover 16 also play a role in protecting the plurality of chips 121 and the optical path turning elements 11, prevent pollutants such as water vapor, dust and the like from entering the light emitter 10, realize an airtight wall, and also prevent the chips 121 and the optical path turning elements 11 from being scratched, bumped and other physical damages.

The light receiver 20 may include a light receiving unit 21, referring to fig. 1, 4 and 12, in some embodiments, the light beam reflected by the object is collected by the collimating element 40 to the light receiving/transmitting path differentiating element 30 after passing through the scanning module 300, and the light receiving unit 21 is configured to receive the return light reflected by the light reflecting portion 32 of the light receiving/transmitting path differentiating element 30. Referring to fig. 5 and 12, in another embodiment, the light beam reflected by the object is directly converged by the collimating element 40 to the light receiver 20 after passing through the scanning module 300, and the light receiving unit 21 is configured to receive the light converged by the collimating element 40.

The light receiving unit 21 may be an avalanche photodiode (Avalanche Photo Diode, APD) or a single photon avalanche diode (Single Photon Avalanche Diode, SPAD) to record the moment when the return light reflected by the object reaches the light receiver 20, thereby enabling the measurement apparatus 1000 to calculate the distance between the measurement apparatus 1000 and the object according to the time-of-flight ranging method.

In some embodiments, the number of light receiving units 21 corresponds to the number of chips 121. For example, the number of the chips 121 is 6, and the number of the light receiving units 21 is also 6, and each light receiving unit 21 corresponds to receiving return light emitted from one chip 121 and reflected back by an object.

Referring to fig. 12, in some embodiments, the light receiver 20 may further include a substrate 22, and the light receiving unit 21 is mounted to the substrate 22 through an adhesive or bonding process. Specifically, the light receiving unit 21 is mounted to the substrate 22 by a high-heat glue, silver paste, or alloy material bonding or bonding process. The substrate 22 may be made of ceramic, and the light receiving unit 21 is bonded or bonded to the substrate 22 made of ceramic material by using a high-temperature adhesive, silver paste, or alloy material, which is very tight and facilitates heat dissipation of the light receiving unit 21. The heat dissipation performance of the ceramic substrate 22 is also good.

With continued reference to fig. 12, in some embodiments, the optical receiver 20 may further include a temperature sensor 23, the temperature sensor 23 being mounted to the substrate 22 by an adhesive or bonding process and configured to detect a temperature within the substrate 22. The temperature sensor 23 is used for detecting the temperature of the light receiver 20, so as to adjust the working state of the measuring device 1000 according to the real-time temperature of the light receiver 20 in time, so as to ensure that the measuring accuracy is not affected by temperature variation. The temperature sensor 23 is also used for calibrating the operating temperature of the light receiving unit 21, so as to adjust the temperature coefficient of the light receiver 20 in time, and make the light receiving unit 21 operate at the calibrated temperature.

More specifically, the temperature sensor 23 may be mounted to the substrate 22 by a high-heat glue, silver paste, or alloy material bonding or bonding process to ensure a secure mounting of the temperature sensor 23.

In some embodiments, the substrate 22 is provided with a receiving groove 24, the light receiving unit 21 and the temperature sensor 23 are received in the receiving groove 24, and the light receiver 20 may further include a light-transmitting cover plate 25, where the cover plate 25 is mounted on the substrate 22 by an adhesive or bonding process and seals the receiving groove 24. The housing groove 24 and the cover plate 25 also protect the light receiving unit 21 and the temperature sensor 23 from contaminants such as water and dust entering the light receiver 20, and also prevent the light receiving unit 21 and the temperature sensor 23 from physical damage such as scratches and crashes.

Referring to fig. 13, in some embodiments, the cover 25 may be a narrowband filter, including a first side 251 and a second side 251 opposite to each other, where the first side 251 of the cover 25 is close to the accommodating groove 24, the cover 25 includes a light-transmitting region 253 and an absorbing region 254, and the first side 251 and/or the second side 252 of the light-transmitting region 253 are provided with a band-pass anti-reflection film layer for transmitting light beams with wavelengths ranging from 870nm to 950nm, and light beams outside the wavelength range are rapidly absorbed; the first side 251 and/or the second side 252 of the absorbing zone 254 are provided with an ink layer for absorbing the light beam. In this way, the cover plate 25 can have an effect of filtering the external background light and the self-stray light, and only allows the return light reflected from the object satisfying the condition (the wavelength range is 870nm to 950 nm) to pass therethrough, so as to improve the signal-to-noise ratio of the measuring apparatus 1000.

In some embodiments, the cover 25 may further include a marking area 255, where the marking area 255 is an area provided with a mark, and the marking area 255 may include a pattern, a word, a symbol, etc. drawn on a plane; marks such as patterns, characters, symbols and the like formed by the depressions can also be included; it may also include raised patterns, text, symbols, etc., without limitation.

Correspondingly, the substrate 22 further comprises fool-proof marks (not shown), which may be marks such as patterns, characters, symbols, etc. drawn on a plane; marks such as patterns, characters, symbols and the like formed by recessing can also be used; the marks may be, but not limited to, patterns, characters, symbols, and the like formed by the protrusions. When the cover plate 25 is installed, the marks of the mark areas 255 of the cover plate 25 are aligned with the fool-proof marks of the base 22 to ensure that the cover plate 25 is installed on the base 22 at the correct installation position and angle.

In certain embodiments, the temperature sensor 23 corresponds to the absorption zone 254. The ink layer in the absorption region 254 can absorb the light beam, so that the influence of the light beam on the temperature sensor 23 can be avoided, and the temperature sensor 23 corresponds to the ink layer, so that the temperature measurement result of the temperature sensor 23 can be ensured not to be influenced by the photo-thermal effect.

Referring to fig. 1 and 14, fig. 14 is a partial cross-sectional view of the scan module 300 and the collimating element 40, wherein the scan module 300 in fig. 14 only shows the optical element 310 closest to the outside. In some embodiments, the optical element 310 includes a first prism 311 and a second prism 312. Referring to fig. 15, each of the first prism 311 and the second prism 312 includes a plurality of (two or more, the same applies below) wedge structures 314, and the plurality of wedge structures 314 are connected in sequence, and a step surface 315 is formed at each connection.

Wedge structure 314 enables an angular offset of the passing light beam. When the two optical elements 310 with the wedge-shaped structures 314 perform rotational movement, the outgoing direction of the light beams sequentially passing through the two optical elements 310 can be adjusted by adjusting the rotational speeds of the two optical elements 310 within a certain range, and the water passing is the direction in which the scanning module 300 receives the return light. By using this principle, the scanning path of the light beam emitted to the object through the scanning module 300 and the receiving path of the return light reflected from the object by the scanning module 300 can be controlled, so as to perform the ranging in a predetermined path, for example, the measuring device 1000 can perform the radar function, and perform the ranging on the object in a predetermined area according to a predetermined frequency.

The first prism 311 and the second prism 312 each include a plurality of wedge-shaped structures 314 that meet one another in sequence, with a step surface 315 formed at each of the interfaces. Compared with a prism with only one wedge structure 314, the prism comprising a plurality of wedge structures 314 can have smaller volume under the condition of achieving the same optical performance, and the interval between the prisms can be smaller, thereby being beneficial to realizing the light and thin scanning module 300.

In some embodiments, the wedge-shaped structures 314 of the first prism 311 and the wedge-shaped structures 314 of the second prism 312 are disposed opposite to each other, so that the paths of the light rays emitted from the measuring device 1000 after passing through the first prism 311 and the second prism 312 sequentially change along with the rotation of the first prism 311 and the second prism 312, so that the object can be scanned within a certain range.

Referring to fig. 1, 14 and 15, in some embodiments, the wedge faces of the plurality of wedge structures 314 on the first prism 311 are parallel. That is, each wedge structure 314 has the same deflection effect on the passing light beam, so as to ensure that the light beam passing through the first prism 311 has better uniformity, and avoid the first prism 311 dividing the passing light beam into a plurality of light beams emitted in different directions. Similarly, in some embodiments, the wedge faces of the plurality of wedge structures 314 on the second prism 312 are parallel to ensure better uniformity of the light beam passing through the second prism 312.

Referring to fig. 15, 17 or 18, in some embodiments, each wedge structure 314 includes a first face 3141 and a second face 3142 that are opposite, and the first face 3141 of the wedge structure 314 and/or the second face 3142 of the wedge structure 314 may be provided with an anti-reflection film layer for transmitting light beams having wavelengths in the range 870nm to 950 nm.

That is, the ranging module 100 can emit high-power infrared light with a wavelength ranging from 870nm to 950nm to the scanning module 300, and the first surface 3141 of the wedge structure 314 and/or the second surface 3142 of the wedge structure 314 are provided with an anti-reflection film layer to increase the transmittance of the high-power infrared light with a wavelength ranging from 870nm to 950nm, and the transmittance of the high-power infrared light can exceed 98%, so that the light loss of the infrared light emitted from the measuring device 1000 and incident on the object is minimized. After the infrared light with the wavelength ranging from 870nm to 950nm is reflected by the object and then re-enters the scanning module 300, the anti-reflection film layer can also increase the transmittance of the return light to ensure that the light receiver 20 can receive the return light with a certain optical power, that is, the light loss of the return light received by the light receiver 20 is minimum.

With continued reference to fig. 15, 17, or 18, in some embodiments, each of the first prism 311 and the second prism 312 includes a side 316, one end of the side 316 is a circumferential surface 3161, and the other end of the side is a plane 3162, which corresponds to the outer circle of the first prism 311 and/or the second prism 312 being cut by the plane 3162 to form an arc. The outer circle of the first prism 311 and/or the second prism 312 is a circle with the same curvature as the circumferential surface 3161 of the first prism 311 and/or the second prism 312 and the same radius as the radius of the circular outline formed by the circumferential surface 3161.

When the first prism 311 and/or the second prism 312 are rotated, since the first prism 311 and/or the second prism 312 includes a plurality of wedge structures 314, it is necessary to provide the first prism 311 and/or the second prism 312 with a corresponding weight in order to ensure the rotation balance of the first prism 311 and/or the second prism 312. The design that one end of the side surface of the first prism 311 and/or the second prism 312 is a circumferential surface 3161, and the other end of the side surface 316 is a plane 3162 can reduce the volume of the prism, and facilitate providing the weight for the prism, so that it is easier to ensure that the first prism 311 and/or the second prism 312 maintain balance during rotation.

In some embodiments, the plane 3162 of the side 316 is parallel to the plane of the step surface 315, and the outer arc segment cut off by the plane 3162 is the arc segment on the thinnest side of the wedge structure 314, and the refractive power of the thinner side of the wedge structure 314 is weaker, so that the wedge structure 314 reduces part of the material on the thinner side, and can improve the refractive power of the prism while reducing the volume of the prism.

In some embodiments, the apertures of the first prism 311 and/or the second prism 312 are each in the range of 30mm,45 mm. For example, the aperture of the first prism 311 and/or the second prism 312 may be 30mm, 31mm, 32mm, 33mm, 34mm, 35mm, 36mm, 37mm, 38mm, 39mm, 40mm, 41mm, 42mm, 43mm, 44mm, 45mm, or the like, which are not exemplified herein. Wherein, the caliber is the diameter of the outer circle of the first prism 311 or the second prism 312. The aperture ranges of the first prism 311 and/or the second prism 312 are [30mm,45mm ], so that the light and thin of the scanning module 300 is not affected by the overlarge aperture, and the optical performances such as the refractive power, the permeability and the like of the first prism 311 and/or the second prism 312 are not up to standard due to the overlarge aperture.

In one embodiment, the aperture of the first prism 311 is larger than that of the second prism 312, and since the aperture of the first prism 311 is designed to be larger than that of the second prism 312 for objects outside the measuring device 100 than the second prism 312, the first prism 311 can receive a larger range of return light, and the light reaching the second prism 312 after passing through the first prism 311 is refracted, so that the second prism 312 with a smaller aperture than that of the first prism 311 can also be designed to receive all the return light passing through the first prism 311, and meanwhile, the material of the second prism 312 is saved, and the volume and weight are reduced.

In yet another embodiment, the caliber of the first prism 311 is equal to the caliber of the second prism 312, so as to facilitate unified production, assembly, debugging, weighting, etc. of the first prism 311 and the second prism 312.

In some embodiments, the wedge angles of the first prism 311 and/or the second prism 312 are each in the range of [7 °,24 ° ]. The wedge angle may be considered as the angle between the first face 3141 and the second face 3142 of the wedge structure 314. For example, the wedge angle of the first prism 311 and/or the second prism 312 may have a value of 7 °, 9 °, 11 °, 13 °, 15 °, 18 °, 19 °, 20 °, 21 °, 22 °, 23 °,24 °, or the like, which are not specifically described herein. The wedge angles of the first prism 311 and/or the second prism 312 are in the range of [7 degrees, 24 degrees ], which can ensure that the refractive power range of the first prism 311 and/or the second prism 312 is suitable, and the energy dispersion of the light rays emitted by the scanning module 300 caused by overlarge refractive power can not be avoided, so that the return light energy of the emitted light rays reflected by an object is lower and is difficult to be responded by the light receiver 20; the scanning range of the light emitted by the scanning module 300 is too small due to the too small light folding capability, so that the measurement efficiency of the measurement device 1000 is low. Further, the wedge angles of the first prism 311 and/or the second prism 312 are all in the range of [18 °,24 ° ], so as to ensure that the measuring device 1000 has high measuring efficiency.

In some embodiments, the refractive index of the first prism 311 and/or the second prism 312 is in the range of [1.72,1.84]. For example, the refractive index of the first prism 311 and/or the second prism 312 may be 1.72, 1.73, 1.74, 1.75, 1.76, 1.77, 1.78, 1.79, 1.80, 1.81, 1.82, 1.83, or 1.84, etc., which are not specifically mentioned herein. The refractive index ranges of the first prism 311 and/or the second prism 312 are [1.72,1.84], so that the energy of the light emitted by the scanning module 300 is concentrated, and the situation that the light receiver 20 cannot generate a signal even if receiving the return light due to the lower return light energy of the light with excessively dispersed energy after being incident on the object is avoided; it is also possible to ensure that the light emitted through the scanning module 300 has a sufficient scanning range, that is, the light emitted after being deflected by the first prism 311 and the second prism 312 can be irradiated (scanned) to an object of a sufficient range within a predetermined scanning time, so as to ensure that the measuring device 1000 has a high measuring efficiency.

Referring to fig. 15, 17 or 18, in some embodiments, the step surface 315 may be a plane, and the plane step surface 315 is convenient for processing, so as to improve production efficiency.

In some embodiments, the step surface 315 is a curved surface. For example, the step surface 315 may be a curved surface that is convex. Since a portion of the light beam from the light source incident on the step surface 315 may be reflected by the step surface 315 and then received by the light receiver, interference with detection of the measuring device 1000 may be caused. The step surface is set to be a curved surface, so that the light beam reflected by the step surface exits at a large angle, the energy received by the light receiver is greatly reduced, and the interference on detection is reduced.

In some embodiments, the roughness of the step surface 315 is in the range of (0 μm,50.0 μm), for example, 1.0 μm, 3.3 μm, 5.3 μm, 6.3 μm, 8.3 μm, 10.0 μm, 12.5 μm, 15.2 μm, 17.5 μm, 20.0 μm, 25.0 μm, 30.0 μm, 35.0 μm, 40.0 μm, 45.0 μm,50.0 μm, etc., and roughening the step surface 315 reduces the reflective power of the step surface 315 within the range of (0 μm,50 μm), thereby reducing the formation of stray light and improving the detection accuracy of the measuring device 1000.

In some embodiments, the step surface 315 is provided with an ink layer having a reflectivity of less than 4% to reduce the reflective power of the step surface 315, thereby reducing the formation of stray light to improve the detection accuracy of the measurement device 1000.

Referring to fig. 1, 14, and 15, in some embodiments, the scanning module 300 further includes a first bearing 320, where the first bearing 320 is disposed through the first prism 311. Specifically, the first prism 311 may be provided with a first through hole 3111, and the first bearing 320 is disposed through the first through hole 3111. Further, the scanning module 300 further includes a rotating shaft 340, the inner ring of the first bearing 320 is sleeved on the rotating shaft 340, the outer ring of the first bearing 320 is matched with the first through hole 3111, the inner ring of the first bearing 320 does not rotate, the outer ring of the first bearing 320 can rotate relative to the rotating shaft 340, and the first prism 311 can rotate relative to the rotating shaft 340.

Referring to fig. 14, in some embodiments, the scan module 300 may further include a yoke 350 disposed around the rotation axis 340. The yoke 350 may be used to drive the first prism 311 to rotate about the rotation axis 340. In some embodiments, the yoke 350 is provided with a heating coil. When the rotation speed of the first prism 311 is within the range of [4000rpm,10000rpm ], the heating coil is energized to generate heat, and the air current generated when the first prism 311 rotates at the rotation speed of [4000rpm,10000rpm ] can blow the heat generated by the heating coil toward the light-passing member 700 as shown in fig. 1, thereby eliminating the mist on the light-passing member 700.

With continued reference to fig. 1, 14, and 15, in some embodiments, the scanning module 300 may further include a second bearing 330, where the second bearing 330 extends through the second prism 312. Specifically, the second prism 312 may be provided with a second through hole 3121, and the second bearing 330 penetrates the second through hole 3121. Further, the inner ring of the second bearing 330 is sleeved on the rotating shaft 340, the outer ring of the second bearing 330 is matched with the second through hole 3121, the inner ring of the second bearing 330 does not rotate, the outer ring of the second bearing 330 can rotate relative to the rotating shaft 340 (or the inner ring of the second bearing 330), so that the second prism 312 can rotate relative to the rotating shaft 340, for example, rotate around the rotating shaft 340 under the driving of the yoke 350.

Referring to fig. 16, in another embodiment, the scan module 300 may further include a rotor, for example, the rotor may be a yoke 350. The second bearing 330 is disposed around the side 316 of the second prism 312. The outer ring of the second bearing 330 does not rotate, the inner ring of the second bearing 330 is sleeved on the magnetic yoke 350, the magnetic yoke 350 is connected with the second prism 312, and when the magnetic yoke 350 rotates relative to the outer ring of the second bearing 330, the second prism 312 is driven to rotate relative to the outer ring of the second bearing 330.

Referring to fig. 15, in some embodiments, the step surface 315 of the first prism 311 may be one. Referring to fig. 14, the first bearing 320 passes through the step surface 315. Specifically, to enable the first prism 311 to uniformly rotate, a first through hole 3111 is formed at the center of the outer circumference of the first prism 311, and the first bearing 320 passes through the first through hole 3111. The first prism 311 includes two wedge structures 314, a step surface 315 is formed between the two wedge structures 314, and the two wedge structures 314 are close in size, so that the step surface 315 is close to the diameter position of the outer circle of the first prism 311, and then the first bearing 320 passes through the step surface 315. The two wedge structures 314 are close in size, so that the first prism 311 can meet the requirements (such as the requirements of the vehicle regulations) on the optical properties such as refractive power and transmission power, and the volume of the first prism 311 can be smaller, thereby realizing the light and thin of the scanning module 300. Similarly, the step surface 315 of the second prism 312 may be one, the second bearing 330 passes through the step surface 315, and the two wedge structures 314 of the second prism 312 are close in size, so that the volume of the second prism 312 can be made smaller, thereby realizing the light and thin scanning module 300.

Referring to fig. 14 and 17, in some embodiments, the step surface 315 of the first prism 311 may be one, and the step surface 315 avoids the first bearing 320. Specifically, the first prism 311 includes two wedge structures 314, a step surface 315 is formed between the two wedge structures 314, and the two wedge structures 314 are one with a size that is smaller and larger, so that the step surface 315 can avoid the center of the outer circle of the first prism 311, thereby avoiding the first bearing 320 penetrating the first through hole 3111. The step surface 315 avoids the first prism 311 of the first bearing 320, which is easy to process and shape, and the roughening treatment is convenient, so that the processing efficiency can be improved. In addition, the first through hole 3111 is formed on the larger wedge structure 314, so that the material consumption of the larger wedge structure 314 is reduced, and the weights of the two wedge structures 314 can be close to each other, so as to balance the first prism 311, and facilitate maintaining uniform rotation of the first prism 311. Similarly, the step surface 315 of the second prism 312 may be one, and the step surface 315 avoids the second bearing 330, thereby facilitating processing of the step surface 315 of the second prism 312 and weighting of the second prism 312.

Referring to fig. 18, in some embodiments, the step surfaces 315 of the first prism 311 may include at least two step surfaces 315 that each avoid the first bearing 320 (as shown in fig. 14). For example, the first prism 311 includes three wedge structures 314, and two step surfaces 315 are formed between the three wedge structures 314; for another example, the first prism 311 includes four wedge structures 314, and three step surfaces 315 are formed between the four wedge structures 314; for another example, the first prism 311 includes five wedge structures 314, four step surfaces 315 formed between the five wedge structures 314, and so on, which are not illustrated herein. That is, the first prism 311 may include n+1 wedge structures 314, with n step faces 315 formed between the n+1 wedge structures 314, where n.gtoreq.2. The more the number of the wedge structures 314 is, the higher the receiving efficiency of the first prism 311 when receiving the return light is, and the smaller the inter-axis distance between the first prism 311 and the second prism 312 is, so that the light and thin scanning module 300 can be realized and the receiving efficiency of receiving the return light can be improved. In addition, when the number of the wedge structures 314 is large, the first prisms 311 may be manufactured in an open mold manner to further improve the processing efficiency of the first prisms 311. Each step surface 315 avoids the first bearing 320, i.e., each step surface 315 avoids the first through hole 3111, so as to facilitate mold-opening molding of the first prism 311. Similarly, the step surfaces 315 of the second prism 312 may include at least two, each step surface 315 avoiding the second bearing 330 (as shown in fig. 14), so that the receiving efficiency of the second prism 312 when receiving the return light is improved, the inter-axis distance between the first prism 311 and the second prism 312 is reduced, and the mold-opening molding of the second prism 312 is facilitated.

Referring to fig. 14, in some embodiments, the first bearing 320 is offset from the central axis O1 of the collimating element 40. For example, as shown in fig. 14, the collimating element 40 corresponds to a portion of the first prism 311 on the upper side of the first bearing 320. At this time, the light can pass between the portion of the first prism 311 above the first bearing 320 and the collimating element 40 (exit to the object/entrance to the ranging module 100). When the first prism 311 rotates around the rotation axis 340, a part of the area of the first prism 311 enters the position corresponding to the collimating element 40 on the upper side of the first bearing 320, and a part of the area leaves the position corresponding to the collimating element 40 on the upper side of the first bearing 320, so that the prism thickness of the position of the first prism 311 corresponding to the collimating element 40 is changed, that is, the refractive power of the portion corresponding to the collimating element 40 and the first prism 311 is changed, so as to change the path of the light emitted from the scanning module 300 or change the path of the return light received by the scanning module 300, thereby changing the scanning/receiving area of the measuring device 1000. In this way, the collimating element 40 can be offset from the position of the first bearing 320 where no light passes, so as to avoid the first bearing 320 shielding the collimating element 40.

Further, the distance L1 between the central axis O5 of the first bearing 320 and the central axis O1 of the collimating element 40 is 1/4 to 1/3 of the diameter of the collimating element 40. For example, the diameter of the collimating element 40 is 24mm, and L1 is in the range of 6mm,8 mm. The distance L1 between the central axis O5 of the first bearing 320 and the central axis O1 of the collimating element 40 is between 1/4 and 1/3 of the diameter of the collimating element 40, which can reduce the shielding of the light emitted to the object through the scanning module 300 by the collimating element 40 by the first bearing 320, and reduce the shielding of the return light entering the collimating element 40 after being reflected by the object by the first bearing 320.

Further, the central axis of the second bearing 330 is coaxial with the central axis of the first bearing 320, and is the central axis O5. The distance L2 between the central axis O5 of the second bearing 330 and the central axis O1 of the collimating element 40 is 1/4-1/3 of the diameter of the collimating element 40 to reduce the shielding of the light exiting/entering the collimating element 40 by the second bearing 330.

Referring to fig. 19 and 20, in some embodiments, the optical element 310 may further include a third prism 313, and the return light reflected by the object sequentially passes through the first prism 311, the second prism 312, the third prism 313, the collimating element 40 and the light receiving/transmitting path distinguishing element 30, and then is incident on the light receiver 20, where the third prism 313 is a prism with a wedge-shaped structure as a whole. The third prism 313 can be used to adjust the shape of the light spot formed by the light emitted from the scanning module 300. Specifically, the third prism 313 may be used to adjust the shape (such as a point cloud pattern shape) of the spot track formed by the light emitted from the scanning module 300 in the period to be approximately elliptical, and the distribution of the spots (point cloud) is denser in the elliptical track, so as to ensure that each position in the measuring range of the measuring device 1000 can be scanned, thereby reducing missed measurement.

Referring to fig. 19, in some embodiments, the third prism 313 may include a first surface 3131, a second surface 3132, and a side surface 316 connecting the first surface 3131 and the second surface 3132, where the first surface 3131 of the third prism 313 is close to the collimating element 40 and inclined with respect to the central axis O6 of the third prism 313, the second surface 3132 of the third prism 313 is perpendicular to the central axis O6 of the third prism 313, one end of the side surface 316 is a circumferential surface 3161, and the other end of the side surface 316 is a plane 3162, which may be regarded as a segment of the plane 3162 cut off the outer circle of the third prism 313.

In some embodiments, the scanning module 300 may further include a third bearing (not shown), and the third prism 313 may be rotatable with respect to the third bearing. In one embodiment, similar to the structure shown in fig. 14, the third prism 313 further includes a third through hole 3133, an inner ring of the third bearing is sleeved on the rotation shaft 340 and does not rotate relative to the rotation shaft 340, an outer ring of the third bearing is matched with the third through hole 3133, and the third prism 313 can rotate together with the outer ring of the third bearing relative to the inner ring of the third bearing. In another embodiment, similar to the structure shown in fig. 16, the scanning module 300 may further include a rotor, and a third bearing is disposed around the side 316 of the third prism 313. The outer ring of the third bearing does not rotate, the inner ring of the third bearing is sleeved on the rotor, the rotor is connected with the third prism 313, for example, the rotor is a magnetic yoke sleeved with the third prism 313, and when the rotor and the inner ring of the third bearing rotate together relative to the outer ring of the third bearing, the third prism 313 also rotates relative to the outer ring of the third bearing.

Referring to fig. 19, in some embodiments, the first surface 3131 of the third prism 313 and/or the second surface 3132 of the third prism 313 may be provided with an anti-reflection film layer for transmitting a light beam with a wavelength ranging from 870nm to 950nm, so as to increase the transmittance of the high-power infrared light passing through the scanning module 300.

Referring to fig. 20, in some embodiments, the refractive indexes of the first prism 311, the second prism 312, and the third prism 313 are all in the range of [1.55,2], so that the measuring device 1000 has a suitable scanning range, and the light emitted from the measuring device 1000 can have suitable energy to meet the measurement requirement. Further, the refractive index of the third prism 313 is in the range of [1.55,1.65], for example, the refractive index of the third prism 313 is 1.55, 1.56, 1.57, 1.58, 1.59, 1.60, 1.61, 1.62, 1.63, 1.64, 1.65, etc., which are not illustrated herein, so as to adjust the track of the light spot formed by the light emitted from the scanning module 300, so that the track of the light spot is denser in a predetermined time, thereby reducing missing detection.

In some embodiments, the wedge angles of the refractive indexes of the first prism 311, the second prism 312 and the third prism 313 are all in the range of [7 °,24 ° ], so as to ensure that the first prism 311, the second prism 312 and the third prism 313 have appropriate refractive powers, and the light transmittance of the first prism 311, the second prism 312 and the third prism 313 can be more than 98%. The wedge angle of each wedge structure 314 of the first prism 311 and the second prism 312 is larger than the wedge angle of the third prism 313, so that the third prism 313 is suitable for adjusting the track of the light spot formed by the light emitted from the scanning module 300, and the track of the light spot in the preset time is not sparse due to smaller adjustment amplitude and no obvious effect. Further, the wedge angle of the third prism 313 is in the range of [7 °,10 ° ], for example, the wedge angle of the third prism 313 is in the range of 7 °, 8 °, 9 °, or 10 °, which is not illustrated herein, to further ensure that the adjustment range of the track of the light spot formed by the light beam emitted from the scanning module 300 by the third prism 313 is suitable, and the wedge angle of the third prism 313 can be understood as the included angle between the first surface 3131 and the second surface 3132.

In some embodiments, the refractive powers of the first prism 311, the second prism 312, and the third prism 313 are sequentially reduced, so that the return light reflected from the object enters the scanning module 300, sequentially passes through the first prism 311, the second prism 312, and the third prism 313, and then enters the collimating element 40, and the first prism 311 with the largest refractive power receives the return light first, so that the return light in a larger range can sequentially pass through the second prism 312 and the third prism 313 under the refractive action of the first prism 311 and then enter the collimating element 40. The third prism 313 having the smallest refractive power is closest to the collimating element 40 so that the return light can be accurately incident to the collimating element 40.

In some embodiments, the rotational speed of the third prism 313 may be in the range of [500rpm,1300rpm ], for example, the rotational speed of the third prism 313 may be 500rpm, 600rpm, 700rpm, 800rpm, 900rpm, 1000rpm, 1100rpm, 1200rpm, 1300rpm, etc., which are not exemplified herein.

In one embodiment, when the measurement apparatus 1000 performs non-repeated scanning, the first prism 311 and the second prism 312 rotate in opposite directions at the same speed, the rotational speed of the first prism 311 and the second prism 312 is M times that of the third prism 313, and M is a non-integer between (8, 13), for example, M is 8.02, 8.57, 9.14, 9.77, 10.98, 11.21, 11.36, 12.42, or 12.82, etc., which are not specifically mentioned herein. In this way, the light rays emitted after passing through the first prism 311, the second prism 312, and the third prism 313 in order can scan the object along a non-repeated path (vector path) within a predetermined time, so that the scanning paths can be more dense to avoid missed detection.

In another embodiment, when the measuring device 1000 performs repeated scanning, the first prism 311 and the second prism 312 rotate in opposite directions at equal speed, the rotation speed of the first prism 311 and the second prism 312 is N times that of the third prism 313, N is an integer between [8, 14], for example N is one of 8, 9, 10, 11, 12, 13, or 14. In this way, the light rays emitted after passing through the first prism 311, the second prism 312 and the third prism 313 in sequence can scan the object along the repeated path within a predetermined time, so that the same position can be repeatedly scanned for a plurality of times within the predetermined time, and the detection precision of a certain position can be improved.

Referring to fig. 1, in some embodiments, the measuring device 1000 may further include a housing 500, where the housing 500 is used for accommodating the ranging module 100 and the scanning module 300, the housing 500 includes a body 510 and a light-transmitting member 700 disposed on the body 510, and the light-transmitting member 700 is used for allowing a light beam emitted from the scanning module 300 to pass out of the housing 500 and for allowing a return light reflected by an object to pass into the housing 500.

Referring to fig. 21, the light-transmitting member 700 may include a first surface 710 and a second surface 720 opposite to each other, where the first surface 710 of the light-transmitting member 700 is close to the scanning module 300. That is, the light emitted from the measuring device 1000 sequentially passes through the first surface 710 and the second surface 720 of the light transmitting member 700, and the return light reflected from the object sequentially passes through the second surface 720 and the first surface 710 of the light transmitting member 700.

In some embodiments, the aspect ratio of the light-transmitting member 700 may enable the size of the light-transmitting member 700 to match with the elliptical scan field of view of the measuring device 1000, so that the consumable is not wasted due to the too large length or width of the light-transmitting member 700, and the light emitted from the scanning module 300 due to the too small length or width of the light-transmitting member 700 is not blocked by the light-transmitting member 700 and cannot be emitted out of the housing 500.

In certain embodiments, the thickness of the light transmissive element 700 may range from [3.0mm,4.5mm ], e.g., a thickness of 3.0mm, 3.1mm, 3.2mm, 3.3mm, 3.4mm, 3.5mm, 3.6mm, 3.7mm, 3.8mm, 3.9mm, 4.0mm, 4.1mm, 4.2mm, 4.3mm, 4.4mm, 4.5mm, etc., as not specifically recited herein. If the thickness of the light-transmitting member 700 is less than 2.0mm, it is difficult to secure the mechanical strength of the light-transmitting member 700, resulting in easy damage of the light-transmitting member 700 after collision. If the thickness of the light-transmitting member 700 is greater than 4.5mm, the light-transmitting member 700 is not easy to be thinned, and the transmittance of light is reduced.

In some embodiments, the hardness of the light transmitting member 700 may be greater than 9H, so as to ensure that the light transmitting member 700 has a certain mechanical strength, is resistant to impact and collision, and meets the vehicle standard.

In some embodiments, the light transmissive member 700 may include a single layer of glass that is tempered to enable the thickness of the light transmissive member 700 to be controlled within the range of [2.0mm,4.5mm ] while satisfying a hardness of greater than 9H.

In some embodiments, the first surface 710 of the light transmitting member 700 is sequentially provided with a black film layer, an ITO (indium tin oxide) film layer, a conductive layer, a protective layer and an anti-reflection film layer, that is, the black film layer is disposed on the first surface 710, the ITO film layer is disposed on the black film layer, the conductive layer is disposed on the ITO film layer to enable the ITO film layer to be located between the conductive layer and the black film layer, the protective layer is disposed on the conductive layer to enable the conductive layer to be located between the protective layer and the ITO film layer, and the anti-reflection film layer is disposed on the protective layer, which is also the same as the sequential arrangement hereinafter, and will not be explained in detail. The second surface 720 of the light transmitting member 700 is sequentially provided with an antireflection film layer and an anti-fingerprint film layer and/or a hardening film, wherein the antireflection film layer is used for transmitting light beams with the wavelength range of 870 nm-952 nm, and the hardening film can improve the surface hardness of glass, so that the glass is more wear-resistant and scratch-resistant. The black film layer can change the color of the light transmitting member 700, and can also play a certain role in filtering light, so that the visible light and the near infrared light attenuate to the transmittance of less than 8% when passing through. The ITO film layer is used for defogging of the light transmitting member 700. The ITO film layer is connected with the conductive layer, and when the ITO film layer is electrified through the conductive layer, the ITO film layer can generate heat, so that fog of the light transmitting member 700 is dispersed. The protective layer is used for protecting the conductive layer to prevent the conductive layer from being scratched, bumped, oxidized and other damages. The anti-reflection film layer can increase the transmittance of the infrared light of the light transmitting element 700, so that the transmittance of the high-power infrared light is more than 90%. The anti-fingerprint film layer can prevent dirt such as fingerprint, oil, dust and the like from adhering to the second surface of the light transmission member 700, and prevent the dirt from adhering to affect the measurement of the measurement device 1000.

In some embodiments, the peripheral edges of the light-transmitting member 700 are not coated with a film, so that the peripheral edges of the light-transmitting member 700 are in a transparent and light-transmitting state, and when the light-transmitting member 700 is installed, the installation state of the light-transmitting member 700 can be conveniently observed through the transparent and light-transmitting peripheral edges, and the light-transmitting member 700 can be conveniently controlled to be installed in place.

With continued reference to fig. 21, in some embodiments, the light-transmitting member 700 may further include a side surface 730, the side surface 730 of the light-transmitting member 700 connects the first surface 710 of the light-transmitting member 700 and the second surface 720 of the light-transmitting member 700, and the side surface 730 of the light-transmitting member 700 may be provided with a buffer member 740, where the buffer member 740 contacts the body 510. In some embodiments, either the first face 710 of the light transmissive member 700 or the second face 720 of the light transmissive member 700 is provided with an annular buffer member 740 (only a portion of which is shown in fig. 21). The buffer member 740 may be made of rubber, foam, plastic, or silica gel, and can play a role in buffering when the light-transmitting member 700 collides, so as to reduce the impact force of the collision, thereby protecting the light-transmitting member 700.

Referring to fig. 22, in some embodiments, an ITO film, a conductive layer, and an anti-reflection film are sequentially disposed on a first surface 710 of the light transmitting member 700, and an anti-reflection film and an anti-fingerprint film are sequentially disposed on a second surface 720 of the light transmitting member 700. Wherein the conductive layer is provided with a heating element 750, for example a resistive wire or a silver paste layer. Referring to fig. 21, compared to the light transmitting member 700 illustrated in fig. 21, the difference is that: the light transmitting member 700 illustrated in fig. 22 has the ITO film removed, and the heating element added, so that the heating element is heated by energizing the conductive layer to realize defogging, which is less difficult and less costly than the light transmitting member 700 illustrated in fig. 20.

In some embodiments, the heating element encloses an annular light-passing aperture for passing the light beam therethrough to avoid the heating element from blocking light.

Referring to fig. 23, in some embodiments, the light-transmitting member 700 may include a first glass 760, a second glass 770, and an interlayer 780 connecting the first glass 760 and the second glass 770, the first glass 760 is closer to the scanning module 300 than the second glass 770, the first face 710 of the light-transmitting member 700 is disposed on the first glass 760, the second face 720 of the light-transmitting member 700 is disposed on the second glass 770, the first glass 760 is a dark glass, a black film is coated on a side of the first glass 760 adjacent to the interlayer 780, and/or a black film is coated on a side of the second glass 770 adjacent to the interlayer 780. The film arrangement on the first side 710 of the light transmissive member 700 may be the same as the film arrangement on the first side 710 of fig. 21, and the film arrangement on the second side 720 of the light transmissive member 700 may be the same as the film arrangement on the second side 720 of fig. 21; of course, the film arrangement on the first side 710 of the light transmissive member 700 may be the same as the film arrangement on the first side 710 of fig. 22, and the film arrangement on the second side 720 of the light transmissive member 700 may be the same as the film arrangement on the second side 720 of fig. 22.

In one example, the first surface 710 of the light transmitting member 700 illustrated in fig. 23 is sequentially provided with an ITO film layer, a conductive layer, a protective layer, and an anti-reflection film layer. The second glass 770 is tempered glass, and an anti-reflection film layer and an anti-fingerprint film layer are sequentially arranged on the second surface 720 of the light transmitting member 700. In the light-transmitting member 700 illustrated in fig. 23, the strength of the light-transmitting member 700 can be controlled by adjusting the degree of tempering of the second glass 770; the color of light transmissive element 700 can be adjusted by plating a black film of a particular color on the side of intermediate layer 780 adjacent first glass 760 and/or adjacent second glass 770; the defogging function of the light transmitting member 700 can be turned on by energizing the conductive layer of the second glass 770; the buffer capacity of the light transmitting member 700 can be adjusted by selecting different materials such as a high-permeability glue layer, a high-molecular resin layer, and the like to make the intermediate layer 780; in summary, the strength, extension, defogging and buffering capabilities of the light transmitting member 700 can be respectively regulated and controlled according to requirements.

Referring to fig. 24, in some embodiments, the light transmissive member 700 is plastic glass, such as infrared plastic, e.g., PC, PEI, etc. The light transmitting member 700 made of plastic glass material can be formed by die opening or injection molding, and has simple process and lower cost. The first surface 710 of the light-transmitting member 700 is sequentially provided with a black film layer, an ITO film layer, a conductive layer, a protective layer and an anti-reflection film layer, and the second surface 720 of the light-transmitting member 700 is sequentially provided with an anti-reflection film layer and an anti-fingerprint film layer, so as to realize the same function as the light-transmitting member 700 illustrated in fig. 21.

Further, in some embodiments, the first face 710 of the light transmissive element 700 is planar and the second face 720 of the light transmissive element 700 is curved with a radius of curvature of [60mm,150mm ], such as 60mm, 73mm, 84mm, 95mm, 106mm, 117mm, 128mm, 139mm, 141mm, 150mm, etc., not specifically illustrated herein. The radius of curvature of the second surface 720 of the light-transmitting member 700 is within the range of [60mm,150mm ], so that the included angle between the emergent light of different angles emergent from the light-transmitting member 700 and the normal line of any position of the light-transmitting member 700 is ensured to be less than 30 degrees, the requirement of film coating of the light-transmitting member 700 is reduced, and the passing rate of the light-transmitting member 700 is easy to exceed 90%. Referring to fig. 21, in some embodiments, the light transmitting member 700 illustrated in fig. 23 may remove the ITO film layer and provide a heating element on the conductive layer to reduce the cost.

Referring to fig. 1, the present application further provides a measurement device 1000. The measuring device 1000 includes a ranging module 100 and a scanning module 300. The ranging module 100 includes a light emitter 10, a light receiver 20, a light receiving/transmitting path distinguishing element 30, and a collimating element 40, where the light emitter 10 is used to emit a light beam, and the light receiving/transmitting path distinguishing element 30 is located between the light emitter 10 and the collimating element 40. The scanning module 300 includes a first prism 311 and a second prism 312, where the first prism 311 and the second prism 312 are used to change the optical path of the light beam incident on the scanning module 300, and each of the first prism and the second prism includes a plurality of wedge structures 314, and the plurality of wedge structures 314 are connected in sequence, and a step surface 315 is formed at each connection. The light beam emitted by the light emitter 10 is incident to the scanning module 300 through the light receiving and transmitting path distinguishing element 30 and the collimating element 40, the scanning module 300 is used for scanning and emitting the light beam collimated by the collimating element 40, and the return light reflected by the object is incident to the light receiver 20 after sequentially passing through the scanning module 300, the collimating element 40 and the light receiving and transmitting path distinguishing element 30.

The scanning module 300 of the measuring device 1000 includes a first prism 311 and a second prism 312 having a plurality of wedge structures 314, which can reduce the volume of the first prism 311 and the second prism 312 while the optical properties such as transmittance, refractive index, refractive power, etc. of the first prism 311 and the second prism 312 meet the requirements, and can shorten the axial distance between the first prism 311 and the second prism 312, thereby realizing the light and thin of the scanning module 300. In the prism with the same volume, the first prism 311 and the second prism 312 with the plurality of wedge structures 314 are adopted to change the light path of the light beam incident to the scanning module 300, and the deflection degree of the light beams in all directions in the light beam passing through the scanning module 300 is close to that of the light beams passing through the first prism 311 and the second prism 312, so that the light beams emitted to the object after passing through the scanning module 300 have better uniformity. The light emitted from the measuring device 1000 can be more concentrated and the formed light spots are denser by the change effect of the scanning module 300 on the light path of the light beam incident to the scanning module 300, so that the energy utilization rate of the measuring device 1000 on the emitted light is improved; and can reduce stray light scattering when the return light reflected by the object received by the measuring device 1000 enters the ranging module 100 through the scanning module 300, thereby improving the energy utilization rate of the return light by the measuring device 1000.

Referring to fig. 25, the present application provides a mobile platform 2000, where the mobile platform 2000 includes the measuring device 1000 and the mobile platform body 2100 according to any of the above embodiments, and the measuring device 1000 is mounted on the mobile platform body 2100.

The mobile platform 2000 may be an automobile, an airplane, a ship, an unmanned aerial vehicle, a five-kernel ship, an unmanned vehicle, an intelligent robot, etc., without limitation. In particular, the measurement device 1000 according to any of the above embodiments is designed to meet the vehicle standard, and can be applied to a vehicle such as a fuel-powered vehicle, an electric-powered vehicle, a hybrid vehicle, or the like. The movable platform body 2100 may be equipped with one or more measuring devices 1000 to detect the environment around the movable platform 2000, so that the movable platform 2000 can avoid obstacles, switch travel paths, etc. according to the detection of the measuring devices 1000.

In the description of the present specification, reference to the terms "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

Claims

A measurement device, the measurement device comprising:

the distance measuring module comprises a light emitter, a light receiver, a light receiving and transmitting path distinguishing element and a collimating element, wherein the light emitter comprises a light path turning element and a plurality of luminous chips which are packaged in the same space, the chips are distributed along the slow axis of each chip, the chips are distributed on two sides of the collimating element relative to the equivalent central axis of the light emitter, each chip is obliquely arranged relative to the equivalent central axis, at least part of the chips are different in inclination angle relative to the equivalent central axis, the reflecting surface of the light path turning element is used for reflecting light beams emitted by the luminous chips and then emitting the light beams from the light emitter, and the light receiving and transmitting path distinguishing element is positioned between the light emitter and the collimating element; and

The scanning module comprises at least two moving optical elements, and each moving optical element is used for changing the light path of an incident light beam; wherein:

the light beam emitted by the light emitter passes through the receiving and transmitting light path distinguishing element and the collimating element and is incident to the scanning module, the scanning module is used for scanning and emitting the light beam collimated by the collimating element, and the return light reflected by the object sequentially passes through the scanning module, the collimating element and the receiving and transmitting light path distinguishing element and then is incident to the light receiver.
The measuring device of claim 1, wherein the reflecting surface is a one-dimensional concave free-form surface for compressing divergence angles of light beams emitted from the plurality of chips in a fast axis direction.
The measuring device according to claim 2, wherein,

the chips are arranged in a row, the reflecting surface is one, and each chip corresponds to the reflecting surface; or (b)

The chips are arranged in two rows side by side, the number of the reflecting surfaces is two, and each row of chips corresponds to one reflecting surface.
The measurement device according to claim 1, wherein the chip farther from the equivalent center axis is inclined at a larger angle with respect to the equivalent center axis on one side of the equivalent center axis.
The measurement device of claim 1, wherein the inclination angle of each chip with respect to the equivalent central axis has a value in the range of [0.5 °,8 ° ].
The measurement device of claim 1, wherein a plurality of the chips are symmetrically arranged about the equivalent central axis.
The measurement device of claim 6, wherein the light emitter comprises, in order along a direction away from the equivalent central axis, a first chip pair, a second chip pair, and a third chip pair, wherein the inclination angle of the chips in the first chip pair with respect to the equivalent central axis has a value range of [0.5 °,1.5 ° ], the inclination angle of the chips in the second chip pair with respect to the equivalent central axis has a value range of [2.5 °,4.0 ° ], and the inclination angle of the chips in the third chip pair with respect to the equivalent central axis has a value range of [6.0 °,8.0 ° ].
The measuring device of claim 1, wherein the optical path turning element is made of a material having a low thermal expansion coefficient, and the reflecting surface of the optical path turning element is provided with a reflective coating.
The measurement device of claim 1, wherein the light emitter further comprises a base, the chip is mounted to the base by a heat sink patch, and the light path turning element is mounted to the base using a bonding process.
The measurement device of claim 1, wherein the light receiver further comprises a substrate and a temperature sensor mounted to the substrate by an adhesive or bonding process and configured to detect a temperature within the substrate.
The measurement device of claim 10, wherein the substrate is provided with a receiving groove, the light receiver and the temperature sensor are received in the receiving groove, the light receiver further comprises a light-transmitting cover plate, and the cover plate is mounted on the substrate and seals the receiving groove through an adhesion or bonding process.
The measuring device of claim 11, wherein the cover plate comprises a first side and a second side opposite to each other, the first side of the cover plate is close to the accommodating groove, the cover plate comprises a light transmitting area and an absorbing area, the first side and/or the second side of the light transmitting area is provided with an antireflection film layer, the antireflection film layer is used for transmitting light beams with the wavelength range of 870 nm-950 nm, and the first side and/or the second side of the absorbing area is provided with an ink layer, and the ink layer is used for absorbing the light beams.
The measurement device of claim 1, wherein the optical element comprises a first prism and a second prism, each of the first prism and the second prism comprising a plurality of wedge structures, the plurality of wedge structures being connected in sequence and forming a step surface at each connection.
The measurement device of claim 13, wherein the wedge faces of the plurality of wedge structures on the first prism are parallel; the wedge faces of the plurality of wedge-shaped structures on the second prism are parallel.
The measurement device of claim 13, wherein the scanning module further comprises a first bearing, the first bearing passing through the first prism, the step surface being one, the first bearing passing through the step surface.
The measurement device of claim 13, wherein the scanning module further comprises a first bearing passing through the first prism, the step surface comprising at least two, each step surface avoiding the first bearing.
A measuring device according to claim 15 or 16, wherein the first bearing is offset from the central axis of the collimating element.
The measurement device of claim 17, wherein a distance between a central axis of the first bearing and a central axis of the collimating element is 1/4 to 1/3 of a diameter of the collimating element.
The measuring device of claim 13, wherein the scanning module further comprises a third prism, the return light reflected by the object sequentially passes through the first prism, the second prism, the third prism, the collimating element and the light receiving/transmitting path distinguishing element and then enters the light receiver, and the third prism is a prism with a wedge-shaped structure as a whole.
The measurement device of claim 19, wherein the refractive indices of the first prism, the second prism, and the third prism are each in the range of [1.55,2.0]; the refractive index of the third prism is smaller than that of the second prism and smaller than that of the first prism, the value range of the wedge angle of each wedge-shaped structure in the first prism and the second prism is [7 degrees, 24 degrees ], and the value range of the wedge angle of the third prism is [7 degrees, 24 degrees ]; the wedge angle of each wedge-shaped structure is larger than the wedge angle of the third prism.
The measurement device of claim 13, wherein the step surface is planar or curved.
The measurement device according to claim 13, wherein the roughness of the step surface has a value in the range of (0 μm,50 μm).
The measurement device of claim 13, wherein the step surface is provided with an ink layer having a reflectivity of less than 4%.
The measuring device of claim 1, further comprising a housing for housing the ranging module and the scanning module, wherein the housing comprises a body and a light transmitting member disposed on the body, and the light transmitting member is configured to allow a light beam emitted from the scanning module to pass out of the housing and allow return light reflected by an object to pass into the housing.
The measuring device of claim 24, wherein the light-transmitting member comprises a first surface and a second surface opposite to each other, the first surface of the light-transmitting member is close to the scanning module, the first surface of the light-transmitting member is sequentially provided with a black film layer, an ITO film layer, a conductive layer, a protective layer and an antireflection film layer, the second surface of the light-transmitting member is sequentially provided with an antireflection film layer and an anti-fingerprint film layer, and the antireflection film layer is used for transmitting light beams with a wavelength range of 870nm to 952 nm.
The measurement device of claim 25, wherein the light transmissive element has a hardness greater than 9H.
The measurement device of claim 25, wherein the light-passing member further comprises a side surface connecting the first surface of the light-passing member and the second surface of the light-passing member, the side surface of the light-passing member being provided with a buffer member, the buffer member being in contact with the body; or, the first surface of the light-passing member or the second surface of the light-passing member is provided with an annular buffer member.
The measuring device of claim 24, wherein the light transmitting member comprises a first surface and a second surface opposite to each other, the first surface of the light transmitting member is close to the scanning module, the first surface of the light transmitting member is sequentially provided with an ITO film layer, a conductive layer, and an antireflection film layer, the second surface of the light transmitting member is sequentially provided with an antireflection film layer and an anti-fingerprint film layer, and the antireflection film layer is used for transmitting light beams with wavelengths ranging from 870nm to 952 nm.
The measurement device of claim 25, wherein the light transmissive element comprises a first glass, a second glass, and an intermediate layer connecting the first glass and the second glass, the first glass is closer to the scanning module than the second glass, the first surface of the light transmissive element is positioned on the first glass, the second surface of the light transmissive element is positioned on the second glass, the first glass is a dark glass, and a black film is plated on a side of the first glass adjacent to the intermediate layer and/or a black film is plated on a side of the second glass adjacent to the intermediate layer.
The measurement device of any one of claims 24 to 29, wherein the first face of the light-passing member is provided with a heating element, the heating element enclosing an annular light-passing aperture for passing a light beam therethrough.
A measurement device, the measurement device comprising:

the distance measuring module comprises a light emitter, a light receiver, a light receiving and transmitting path distinguishing element and a collimation element, wherein the light emitter is used for emitting light beams, and the light receiving and transmitting path distinguishing element is positioned between the light emitter and the collimation element; and

The scanning module, the scanning module includes first prism and second prism, first prism with the second prism is used for changing the incident to the light path of the light beam of scanning module, and all includes a plurality of wedge structures, and a plurality of wedge structure meets in proper order to be formed with the step face in every department of meeting, wherein:

the light beam emitted by the light emitter is incident to the scanning module through the light receiving and transmitting path distinguishing element and the collimating element, the scanning module is used for scanning and emergent light beams collimated by the collimating element, and return light reflected by an object sequentially passes through the scanning module, the collimating element and the light receiving and transmitting path distinguishing element and then is incident to the light receiver.
The measurement device of claim 31, wherein the wedge faces of the plurality of wedge structures on the first prism are parallel; the wedge faces of the plurality of wedge-shaped structures on the second prism are parallel.
The measurement device of claim 31, wherein the scanning module further comprises a first bearing, the first bearing passing through the first prism, the step surface being one, the first bearing passing through the step surface.
The measurement device of claim 31, wherein the scanning module further comprises a first bearing passing through the first prism, the step surface comprising at least two, each step surface avoiding the first bearing.
A measuring device according to claim 33 or 34, wherein the first bearing is offset from the central axis of the collimating element.
The measurement device of claim 35, wherein a distance between a central axis of the first bearing and a central axis of the collimating element is 1/4 to 1/3 of a diameter of the collimating element.
The measuring device of claim 31, wherein the scanning module further comprises a third prism, and the return light reflected by the object sequentially passes through the first prism, the second prism, the third prism, the collimating element and the light receiving/transmitting path distinguishing element and then enters the light receiver, and the third prism is a prism with a wedge-shaped structure as a whole.
The measurement device of claim 37, wherein the first prism, the second prism, and the third prism each have a refractive index in the range of [1.55,2], the third prism has a refractive index less than the refractive index of the second prism and less than the refractive index of the first prism, the first prism and the second prism each have a wedge angle in the range of [7 °,24 ° ], and the third prism has a wedge angle in the range of [7 °,24 ° ]; the wedge angle of each wedge-shaped structure is larger than the wedge angle of the third prism.
The measurement device of claim 31, wherein the step surface is planar or curved.
The measurement device according to claim 31, wherein the roughness of the step surface has a value in the range of (0 μm,50 μm).
The measurement device of claim 31, wherein the step surface is provided with an ink layer having a reflectivity of less than 4%.
The measuring device of claim 31, wherein the light emitter comprises a light path turning element and a plurality of luminous chips which are packaged in the same space, the chips are distributed along the slow axis of each chip, the chips are distributed on two sides of the collimating element relative to the equivalent central axis of the light emitter, each chip is obliquely arranged relative to the equivalent central axis, at least part of the chips are different in inclination angle relative to the equivalent central axis, and the reflecting surface of the light path turning element is used for reflecting light beams emitted by the luminous chips and then emitting the light beams from the light emitter.
A measuring device according to claim 42 wherein the reflecting surface is a one-dimensional concave free-form surface for compressing the divergence angle of the light beams emitted from the plurality of chips in the fast axis direction.
The measuring device of claim 43, wherein the measuring device comprises a sensor,

the chips are arranged in a row, the reflecting surface is one, and each chip corresponds to the reflecting surface; or (b)

The chips are arranged in two rows side by side, the number of the reflecting surfaces is two, and each row of chips corresponds to one reflecting surface.
The measuring apparatus of claim 42, wherein the farther from the equivalent center axis the chip is inclined at a larger angle with respect to the equivalent center axis on one side of the equivalent center axis.
The measurement device of claim 42 wherein the angle of inclination of each of the chips relative to the equivalent central axis is in the range of [0.5 °,8 ° ].
The measurement device of claim 42 wherein a plurality of said chips are symmetrically arranged about said equivalent central axis.
The measurement device of claim 31, wherein the light emitter comprises, in order along a direction away from the equivalent central axis, a first chip pair, a second chip pair, and a third chip pair, wherein the chips in the first chip pair are inclined at an angle ranging from [0.5 °,1.5 ° ], the chips in the second chip pair are inclined at an angle ranging from [2.5 °,4.0 ° ], and the chips in the third chip pair are inclined at an angle ranging from [6.0 °,8.0 ° ] with respect to the equivalent central axis.
The measuring apparatus of claim 42, wherein the optical path turning element is made of a material having a low thermal expansion coefficient, and the reflecting surface of the optical path turning element is provided with a reflective coating.
The measurement device of claim 42 wherein the light emitter further comprises a base, the chip being mounted to the base by a heat sink patch, the light path turning element being mounted to the base using a bonding process.
The measurement device of claim 42, wherein the light receiver further comprises a substrate and a temperature sensor mounted to the substrate by an adhesive or bonding process and configured to detect a temperature within the substrate.
The measuring device of claim 51, wherein the base is provided with a receiving groove, the light receiver and the temperature sensor are received in the receiving groove, the light receiver further comprises a light-transmitting cover plate, and the cover plate is mounted on the base and seals the receiving groove through an adhesion or bonding process.
The device of claim 52, wherein the cover plate comprises a first side and a second side opposite to each other, the first side of the cover plate is adjacent to the receiving groove, the cover plate comprises a light transmitting area and an absorbing area, the first side and/or the second side of the light transmitting area is provided with an antireflection film layer, the antireflection film layer is used for transmitting light beams with wavelengths ranging from 870nm to 950nm, and the first side and/or the second side of the absorbing area is provided with an ink layer, and the ink layer is used for absorbing the light beams.
The measurement device of claim 31, further comprising a housing for housing the ranging module and the scanning module, wherein the housing comprises a body and a light transmitting member disposed on the body, and the light transmitting member is configured to allow a light beam emitted from the scanning module to pass out of the housing and allow return light reflected by an object to pass into the housing.
The measuring device of claim 54, wherein the light transmissive element comprises a first surface and a second surface opposite to each other, the first surface of the light transmissive element is close to the scanning module, the first surface of the light transmissive element is sequentially provided with a black film layer, an ITO film layer, a conductive layer, a protective layer and an antireflection film layer, the second surface of the light transmissive element is sequentially provided with an antireflection film layer and an anti-fingerprint film layer, and the antireflection film layer is used for transmitting light beams with a wavelength range of 870nm to 952 nm.
The measurement device of claim 54 wherein the light transmissive element has a hardness greater than 9H.
The measuring device of claim 54, wherein the light transmissive element further comprises a side surface connecting the first surface of the light transmissive element and the second surface of the light transmissive element, the side surface of the light transmissive element being provided with a buffer element, the buffer element being in contact with the body; or, the first surface of the light-passing member or the second surface of the light-passing member is provided with an annular buffer member.
The measuring device of claim 54, wherein the light transmissive element comprises a first surface and a second surface opposite to each other, the first surface of the light transmissive element is adjacent to the scanning module, the first surface of the light transmissive element is sequentially provided with an ITO film layer, a conductive layer, and an anti-reflection film layer, the second surface of the light transmissive element is sequentially provided with an anti-reflection film layer and an anti-fingerprint film layer, and the anti-reflection film layer is used for transmitting light beams with wavelengths ranging from 870nm to 952 nm.
The device of claim 55, wherein the light transmissive element comprises a first glass, a second glass, and an intermediate layer connecting the first glass and the second glass, the first glass is closer to the scanning module than the second glass, the first surface of the light transmissive element is positioned on the first glass, the second surface of the light transmissive element is positioned on the second glass, the first glass is a dark glass, and a black film is coated on a side of the first glass adjacent to the intermediate layer and/or a black film is coated on a side of the second glass adjacent to the intermediate layer.
The measurement device of any one of claims 54 to 59 wherein the first face of the light transmissive member is provided with a heating element which encloses an annular light transmissive aperture for the passage of a light beam.
A movable platform, comprising: the measuring device and moveable platform body of any one of claims 1-60, wherein the measuring device is mounted to the moveable platform body.