CN117548431A - Chip test seat cleaning device, cleaning head of cleaning device and chip test equipment - Google Patents

Chip test seat cleaning device, cleaning head of cleaning device and chip test equipment Download PDF

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Publication number
CN117548431A
CN117548431A CN202311702526.XA CN202311702526A CN117548431A CN 117548431 A CN117548431 A CN 117548431A CN 202311702526 A CN202311702526 A CN 202311702526A CN 117548431 A CN117548431 A CN 117548431A
Authority
CN
China
Prior art keywords
cleaning
chip test
test seat
cleaning device
head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202311702526.XA
Other languages
Chinese (zh)
Inventor
徐永刚
彭瑞
童炜
孙成思
何瀚
王灿
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chengdu Statan Testing Technology Co ltd
Original Assignee
Chengdu Statan Testing Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chengdu Statan Testing Technology Co ltd filed Critical Chengdu Statan Testing Technology Co ltd
Priority to CN202311702526.XA priority Critical patent/CN117548431A/en
Publication of CN117548431A publication Critical patent/CN117548431A/en
Pending legal-status Critical Current

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Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B13/00—Accessories or details of general applicability for machines or apparatus for cleaning
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B5/00—Cleaning by methods involving the use of air flow or gas flow
    • B08B5/04—Cleaning by suction, with or without auxiliary action
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
    • B08B7/0028—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by adhesive surfaces
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
    • B08B7/04—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by a combination of operations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Cleaning In General (AREA)

Abstract

The invention discloses a cleaning head of a chip test seat cleaning device, which comprises: a cleaning member main body; one end of the connecting rod is integrally provided with a first threaded rod, the other end of the connecting rod is integrally provided with a second threaded rod, and the first threaded rod is in threaded connection with the cleaning piece main body; and the cleaning piece is in threaded connection with the second threaded rod, one side, away from the second threaded rod, of the cleaning piece is a cleaning surface, and the cleaning surface is used for cleaning pollutants on the chip test seat. The cleaning head of the chip test seat cleaning device is used for being matched with the cleaning device to clean the chip test seat, the cleaning head is arranged on the chip test seat cleaning device to clean pollutants on the chip test seat through the cleaning surface, the cleaning piece main body of the chip test seat cleaning device can be matched with cleaning pieces of various specifications to meet cleaning requirements, only the cleaning piece part is required to be replaced when the cleaning piece main body is replaced, and the cleaning piece main body is not required to be replaced, so that the cleaning cost is reduced.

Description

Chip test seat cleaning device, cleaning head of cleaning device and chip test equipment
Technical Field
The invention relates to the technical field of chip testing equipment, in particular to a chip testing seat cleaning device, a cleaning head of the cleaning device and chip testing equipment.
Background
Semiconductor chips are the core components of modern electronic devices, which have the advantages of high speed, high density, low power consumption, etc. In order to ensure the performance and reliability of the chip, the chip needs to be subjected to various tests such as functional tests, burn-in tests, fault analysis, and the like before shipment. These tests require the use of specialized test seats, which, as the service life of the test seats increases, and are reused, generate many impurities, such as dust, dirt, grease, oxides, etc., inside them. If the test seat is not cleaned in time, the accuracy of the chip test is affected, and even the chip is damaged or fails. Therefore, cleaning of the test seat is important.
At present, since the chip test seat has a large number of different specifications, the cleaning heads of different cleaning devices need to be replaced each time the chip test seat is cleaned to meet the cleaning requirement, so that the cleaning cost is high.
Disclosure of Invention
The invention mainly aims to provide a cleaning head of a chip test seat cleaning device, and aims to solve the technical problem that the cleaning cost is high because the cleaning head of different cleaning devices is required to be equipped for cleaning the chip test seat at present.
To achieve the above object, the present invention provides a cleaning head of a chip test socket cleaning device, the cleaning head of the chip test socket cleaning device comprising:
a cleaning member main body;
the cleaning piece comprises a cleaning piece main body, a connecting rod, a first threaded rod, a second threaded rod and a cleaning piece, wherein one end of the connecting rod is integrally formed with the first threaded rod, and the other end of the connecting rod is integrally formed with the second threaded rod;
the cleaning piece is in threaded connection with the second threaded rod, one side of the cleaning piece, which is far away from the second threaded rod, is a cleaning surface, and the cleaning surface is used for cleaning pollutants on the chip test seat.
In some embodiments, the cleaning member body is provided with a plurality of mounting holes, a plurality of the mounting holes are positioned on one side of the cleaning member body away from the cleaning member, and a plurality of the mounting holes are respectively provided with a magnet.
In some embodiments, the magnet is glued to the mounting hole by a high temperature glue.
In some embodiments, the cleaning member body is provided with a protruding member, the protruding member is located at the peripheral edge of the cleaning member body, and the protruding member is used for contacting with the chip test seat cleaning device to perform cleaning head in-place sensing.
In some embodiments, the cleaning member body is provided with a positioning hole, the positioning hole is located at one side of the cleaning member body away from the cleaning member, and the positioning hole is used for being in plug-in fit with the chip test seat cleaning device.
In some embodiments, the cleaning member body is provided with a clamping groove, the clamping groove is an annular clamping groove formed on the outer side surface of the cleaning member body, and the clamping groove is used for clamping and matching with the chip test seat cleaning device.
The invention also provides a chip test seat cleaning device which comprises the cleaning head of the chip test seat cleaning device.
The invention further provides a chip testing device, comprising:
the chip test seat is internally provided with an induction element;
the transferring manipulator is used for transferring the chip test seat cleaning device into the chip test seat;
and the chip test seat cleaning device.
In some embodiments, the chip test seat further comprises a dust collection device, wherein an execution end of the dust collection device is communicated with the inside of the chip test seat and is used for sucking impurities in the chip test seat.
The cleaning head of the chip test seat cleaning device is used for being matched with the cleaning device to clean the chip test seat, the cleaning head is arranged on the chip test seat cleaning device, pollutants on the chip test seat are cleaned through the cleaning surface, when the chip test seat cleaning device needs to replace the cleaning head, the cleaning head is taken down, meanwhile, the cleaning piece is taken down from the cleaning piece main body, the cleaning piece main body is not needed to be replaced, and the replacement can be completed only by replacing a new cleaning piece.
Drawings
FIG. 1 is a schematic diagram of a cleaning head of a cleaning device for a chip test socket according to an embodiment of the invention;
FIG. 2 is a schematic view of a cleaning element of a cleaning head according to an embodiment of the present invention;
FIG. 3 is a schematic view of a connecting rod of a cleaning head according to an embodiment of the present invention;
FIG. 4 is an exploded view of a cleaning head of a cleaning device for a chip test socket according to an embodiment of the present invention;
fig. 5 is a schematic view showing a structure of a cleaning member main body of a cleaning head according to an embodiment of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made more clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be noted that all directional indicators (such as up, down, left, right, front, and rear … …) in the embodiments of the present invention are merely used to explain the relative positional relationship, movement, etc. between the components in a particular posture (as shown in the drawings), and if the particular posture is changed, the directional indicator is changed accordingly.
It will also be understood that when an element is referred to as being "mounted" or "disposed" on another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present.
Furthermore, the description of "first," "second," etc. in this disclosure is for descriptive purposes only and is not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In addition, the technical solutions of the embodiments may be combined with each other, but it is necessary to base that the technical solutions can be realized by those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should be considered to be absent and not within the scope of protection claimed in the present invention.
The invention provides a cleaning head of a chip test seat cleaning device, referring to fig. 1 to 4, the cleaning head of the chip test seat cleaning device comprises:
a cleaning member main body 100;
the connecting rod 200, one end of the connecting rod 200 is integrally formed with a first threaded rod 210, the other end of the connecting rod is integrally formed with a second threaded rod 220, and the first threaded rod 210 is in threaded connection with the cleaning member main body 100;
the cleaning member 300 is in threaded connection with the second threaded rod 220, and a cleaning surface 310 is arranged on one side, away from the second threaded rod 220, of the cleaning member 300, and the cleaning surface 310 is used for cleaning pollutants on the chip test seat.
In this embodiment, the cleaning head of the chip test seat cleaning device is detachably mounted on the chip test seat cleaning device, the chip test seat cleaning device is mounted on the transfer manipulator, in the cleaning process, the transfer manipulator is moved to the position of the chip test seat cleaning device, and the chip test seat cleaning device is transported to the chip test seat to be cleaned, so as to clean the chip test seat, when the chip test seats with different specifications are required to be cleaned, the cleaning head of the chip test seat cleaning device needs to be replaced, the cleaning member main body 100 is taken down, meanwhile, the cleaning member 300 is rotationally taken down from the cleaning member main body 100, and replacement is completed by replacing a new cleaning member 300, which is quite convenient. The detachable cleaning piece 300 can be adapted to chip test seats of various specifications to meet cleaning requirements, and the cleaning head is easy to replace, and only the cleaning piece 300 part is required to be replaced during replacement, so that replacement of the cleaning piece main body 100 is not involved, and waste of resources is reduced. Alternatively, the cleaning member main body 100 may be made of stainless steel or other materials which are not easy to rust and clean, so as to ensure durability and usability, the cleaning member 300 may be made of sponge or silica gel, so as to ensure softness and cleaning efficiency, and of course, other materials may be used for the cleaning member 300 according to actual needs. Alternatively, the cleaning member 300 may be an ash dipping member, where the ash dipping member includes an ash dipping cleaning surface for dipping contaminants on the chip test socket, and when the ash dipping member cleans the chip test socket, the ash dipping cleaning surface 310 of the ash dipping member contacts with the inner wall and the pin surface of the chip test socket, so as to dip and remove impurities such as tin slag, oxide layer and the like on the inner wall and the pin surface of the chip test socket.
The connecting rod 200 is respectively in threaded connection with the cleaning member main body 100 and the cleaning member 300, and the cleaning member main body 100 and the cleaning member 300 are connected through the connecting rod 200, so that the stability of the cleaning member 300 can be improved, and the cleaning member 300 is prevented from shaking or falling off in the cleaning process. The cleaning element 300 is in threaded connection with the second threaded rod 220, so that quick replacement of the cleaning element 300 can be realized, a sealing ring 211 is arranged at one end, connected with the cleaning element main body 100, of the first threaded rod 210, the sealing ring 211 is used for tightly matching the first threaded rod 210 with the cleaning element main body 100, and therefore stability and tightness of the cleaning head are ensured, and optionally, rubber, silica gel or other high polymer materials can be adopted for the sealing ring 211 so as to ensure wear resistance, high temperature resistance and tightness.
The cleaning head of the chip test seat cleaning device is used for being matched with the cleaning device to clean the chip test seat, the cleaning head is arranged on the chip test seat cleaning device, pollutants on the chip test seat are cleaned through the cleaning surface 310, when the cleaning head of the chip test seat cleaning device needs to be replaced, the cleaning head is taken down, meanwhile, the cleaning piece 300 is taken down from the cleaning piece main body 100, the cleaning piece main body 100 does not need to be replaced, the replacement can be completed only by replacing a new cleaning piece 300, the cleaning piece main body 100 of the chip test seat cleaning device can be matched with the cleaning pieces 300 with various specifications to meet the cleaning requirements, and only the cleaning piece 300 part needs to be replaced when the cleaning piece main body 100 is replaced, so that the cleaning cost is reduced.
In some embodiments, referring to fig. 5, the cleaning member body 100 is provided with a plurality of mounting holes 110, the plurality of mounting holes 110 are located at a side of the cleaning member body 100 remote from the cleaning member 200, and the plurality of mounting holes 110 are respectively provided with magnets 111.
In this embodiment, the cleaning member main body 100 is magnetically attracted to the cleaning device by the magnet 111, so that the cleaning member main body 100 can be firmly mounted to the cleaning device, and the cleaning member main body 100 can be easily removed from the cleaning device when the cleaning head needs to be replaced, wherein the shape and size of the mounting hole 110 are adapted to the shape and size of the magnet 111.
In some embodiments, the magnet 111 is adhered to the mounting hole 110 by high temperature adhesive.
In this embodiment, the magnet 111 is adhered to the mounting hole 110 by the high-temperature adhesive, so that the magnet 111 can be firmly mounted in the mounting hole 110, and the high-temperature adhesive can increase the adsorption force between the magnet 111 and the mounting hole 110, so that the magnet 111 can be more stably mounted in the mounting hole 110. Alternatively, the high-temperature glue may be a two-component high-temperature glue, the magnet 111 is placed in the mounting hole 110, then the two-component high-temperature glue is mixed according to a certain proportion and then coated on the contact surface of the magnet 111 and the mounting hole 110, and after the high-temperature glue is cured, the magnet 111 can be firmly adhered in the mounting hole 110. Of course, according to practical needs, the high-temperature glue may be made of other types of polymer materials, so long as the magnet 111 can be firmly adhered in the mounting hole 110. The contact surface between the magnet 111 and the mounting hole 110 needs to be cleaned to secure the adhesive effect of the high temperature glue. Meanwhile, it is necessary to ensure uniformity and thickness of the coating when the high temperature glue is applied to the contact surface of the magnet 111 and the mounting hole 110, so as to ensure the adhesive effect of the high temperature glue.
In some embodiments, referring to fig. 5, the cleaning member body 100 is provided with a protrusion 120, the protrusion 120 is located at a peripheral edge of the cleaning member body 100, and the protrusion 120 is used to contact with the chip test socket cleaning device for performing the cleaning head in-place sensing.
In this embodiment, when the cleaning head needs to be replaced, the transfer manipulator moves the cleaning device to the cleaning head rack in the cleaning head replacement area, when the protruding member 120 of the cleaning member main body 100 touches the sensor of the cleaning head rack, it indicates that the cleaning head exists in this position, and then the transfer manipulator drives the cleaning device to separate from the cleaning head, so as to replace the cleaning member 300, alternatively, the protruding member 120 may use an induction pin, which may be set according to practical situations.
In some embodiments, referring to fig. 5, the cleaning member body 100 is provided with a positioning hole 130, and the positioning hole 130 is located on a side of the cleaning member body 100 away from the cleaning member 300, and the positioning hole is used for plugging and matching with the chip test socket cleaning device.
In this embodiment, the cleaning device and the cleaning member main body 100 can be firmly connected together by inserting the positioning pin of the cleaning device into the positioning hole 130 of the cleaning member main body 100, and optionally, the number and the size of the positioning holes 130 can be adjusted according to the actual situation so as to meet the actual requirement. Meanwhile, the positioning hole 130 may also have a circular, square or other shape, so long as it can be adapted to the positioning pin of the cleaning device.
In some embodiments, referring to fig. 5, the cleaning member body 100 is provided with a clamping groove 140, and the clamping groove 140 is an annular clamping groove formed on the outer side surface of the cleaning member body 100, and the clamping groove is used for clamping and matching with the chip test seat cleaning device.
In this embodiment, when the cleaning head needs to be replaced, the clamping groove 140 of the cleaning member main body 100 is clamped with the cleaning head rack in the replacement area, and then the transferring manipulator drives the cleaning device to move upwards to be separated from the cleaning head, so as to replace the cleaning member 300, and after replacement, the transferring manipulator drives the cleaning device to move downwards to enable the cleaning device and the cleaning head to be successfully attracted, and at the moment, the transferring manipulator moves out of the cleaning device transversely to complete the head replacement operation. Preferably, the clamping groove 140 is an annular clamping groove to achieve a quick clamping fit of the cleaning head with the cleaning head holder.
The invention also provides a chip test seat cleaning device which comprises the cleaning head of the chip test seat cleaning device. The specific structure of the cleaning head of the cleaning device for the chip test seat refers to the above embodiments, and because the cleaning device for the chip test seat adopts all the technical solutions of all the embodiments, at least has all the technical effects brought by the technical solutions of the embodiments, and the detailed description is omitted herein.
The chip testing device further provided by the invention comprises a chip testing seat, a transferring manipulator and a chip testing seat cleaning device, wherein the specific structure of the chip testing seat cleaning device refers to the embodiment, and as the chip testing device adopts all the technical schemes of all the embodiments, the chip testing device at least has all the technical effects brought by the technical schemes of the embodiments, and the specific structure of the chip testing seat cleaning device is not repeated herein. The chip test seat is internally provided with an induction element, the transfer manipulator is used for transferring the chip test seat cleaning device into the chip test seat for cleaning, when the cleaning head needs to be replaced, the transfer manipulator transfers the chip test seat cleaning device to a cleaning head replacement area, the clamping groove 140 of the cleaning piece main body 100 is clamped with a cleaning head placing frame of the replacement area, when the protruding piece 120 of the cleaning piece main body 100 touches a sensor of the cleaning head placing frame, the cleaning head exists at the position, and then the transfer manipulator drives a positioning pin of the cleaning device to be separated from a positioning hole 130 of the cleaning piece main body 100, so that the cleaning piece 300 is replaced; after the cleaning member 300 is replaced, the transferring manipulator drives the positioning pin of the cleaning device to be inserted into the positioning hole 130 of the cleaning member main body 100, and makes the cleaning member main body 100 magnetically attracted with the cleaning device, and after successful attraction, the transferring manipulator drives the cleaning device to move out transversely, so that the clamping groove 140 of the cleaning member main body 100 is separated from the cleaning head placing frame, and the cleaning head replacement operation is completed.
In some embodiments, the chip test equipment further comprises a dust collection device, specifically, an execution end of the dust collection device is communicated with the inside of the chip test seat and is used for sucking impurities in the chip test seat, so that the dust collection device can clean up impurities such as tin slag more rapidly under the cooperation of the cleaning head of the chip test seat cleaning device, and the cleaning efficiency and the cleaning effect are further improved.
The above description of the preferred embodiments of the present invention should not be taken as limiting the scope of the invention, but rather should be understood to cover all modifications, variations and adaptations of the present invention using its general principles and the following detailed description and the accompanying drawings, or the direct/indirect application of the present invention to other relevant arts and technologies.

Claims (9)

1. A cleaning head for a chip test socket cleaning apparatus, comprising:
a cleaning member main body;
the cleaning piece comprises a cleaning piece main body, a connecting rod, a first threaded rod, a second threaded rod and a cleaning piece, wherein one end of the connecting rod is integrally formed with the first threaded rod, and the other end of the connecting rod is integrally formed with the second threaded rod;
the cleaning piece is in threaded connection with the second threaded rod, one side of the cleaning piece, which is far away from the second threaded rod, is a cleaning surface, and the cleaning surface is used for cleaning pollutants on the chip test seat.
2. The cleaning head of claim 1, wherein the cleaning member body is provided with a plurality of mounting holes, the plurality of mounting holes are positioned on a side of the cleaning member body away from the cleaning member, and the plurality of mounting holes are respectively provided with a magnet.
3. The cleaning head of the chip test seat cleaning apparatus according to claim 2, wherein the magnet is adhered to the mounting hole by high temperature adhesive.
4. The cleaning head of the chip test seat cleaning device according to claim 1, wherein the cleaning member main body is provided with a protruding member, the protruding member is located at a peripheral edge of the cleaning member main body, and the protruding member is used for contacting with the chip test seat cleaning device to perform in-place sensing of the cleaning head.
5. The cleaning head of claim 1, wherein the cleaning member body has a positioning hole, the positioning hole is located on a side of the cleaning member body away from the cleaning member, and the positioning hole is configured to be in plug-in fit with the cleaning device of the chip test socket.
6. The cleaning head of claim 1, wherein the cleaning member body is provided with a clamping groove, the clamping groove is an annular clamping groove formed on an outer side surface of the cleaning member body, and the clamping groove is used for clamping and matching with the cleaning device of the chip testing seat.
7. A chip test socket cleaning apparatus comprising a cleaning head of a chip test socket cleaning apparatus as claimed in any one of claims 1 to 6.
8. A chip testing apparatus, comprising:
the chip test seat is internally provided with an induction element;
the transferring manipulator is used for transferring the chip test seat cleaning device into the chip test seat;
and the chip test seat cleaning apparatus of claim 7.
9. The chip testing apparatus according to claim 8, further comprising a dust suction device, an execution end of the dust suction device being in communication with the inside of the chip test socket for sucking impurities in the chip test socket.
CN202311702526.XA 2023-12-11 2023-12-11 Chip test seat cleaning device, cleaning head of cleaning device and chip test equipment Pending CN117548431A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202311702526.XA CN117548431A (en) 2023-12-11 2023-12-11 Chip test seat cleaning device, cleaning head of cleaning device and chip test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202311702526.XA CN117548431A (en) 2023-12-11 2023-12-11 Chip test seat cleaning device, cleaning head of cleaning device and chip test equipment

Publications (1)

Publication Number Publication Date
CN117548431A true CN117548431A (en) 2024-02-13

Family

ID=89820576

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202311702526.XA Pending CN117548431A (en) 2023-12-11 2023-12-11 Chip test seat cleaning device, cleaning head of cleaning device and chip test equipment

Country Status (1)

Country Link
CN (1) CN117548431A (en)

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