CN117443851A - Chip test seat cleaning device, cleaning head of cleaning device and chip test equipment - Google Patents
Chip test seat cleaning device, cleaning head of cleaning device and chip test equipment Download PDFInfo
- Publication number
- CN117443851A CN117443851A CN202311702497.7A CN202311702497A CN117443851A CN 117443851 A CN117443851 A CN 117443851A CN 202311702497 A CN202311702497 A CN 202311702497A CN 117443851 A CN117443851 A CN 117443851A
- Authority
- CN
- China
- Prior art keywords
- cleaning
- chip test
- head
- brush head
- cleaning member
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004140 cleaning Methods 0.000 title claims abstract description 240
- 238000012360 testing method Methods 0.000 title claims abstract description 82
- 230000001070 adhesive effect Effects 0.000 claims description 6
- 239000000853 adhesive Substances 0.000 claims description 4
- 230000006698 induction Effects 0.000 claims description 4
- 230000002093 peripheral effect Effects 0.000 claims description 3
- 239000003292 glue Substances 0.000 description 9
- 239000000463 material Substances 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 238000007789 sealing Methods 0.000 description 5
- 238000012546 transfer Methods 0.000 description 5
- 239000000306 component Substances 0.000 description 3
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 239000003344 environmental pollutant Substances 0.000 description 2
- 231100000719 pollutant Toxicity 0.000 description 2
- 239000002861 polymer material Substances 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000006978 adaptation Effects 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000008094 contradictory effect Effects 0.000 description 1
- 239000008358 core component Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- -1 dirt Substances 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011990 functional testing Methods 0.000 description 1
- 239000004519 grease Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000741 silica gel Substances 0.000 description 1
- 229910002027 silica gel Inorganic materials 0.000 description 1
- 239000007779 soft material Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B5/00—Cleaning by methods involving the use of air flow or gas flow
- B08B5/04—Cleaning by suction, with or without auxiliary action
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
- B08B7/02—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by distortion, beating, or vibration of the surface to be cleaned
- B08B7/026—Using sound waves
- B08B7/028—Using ultrasounds
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
- B08B7/04—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by a combination of operations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Cleaning In General (AREA)
Abstract
The invention discloses a cleaning head of a chip test seat cleaning device, which comprises: a cleaning member main body; the cleaning piece, with the connection can be dismantled to the cleaning piece main part, the cleaning piece includes brush head, brush head pole and threaded rod, the one end of brush head pole with the brush head is connected, the other end of brush head pole with the threaded rod is connected, the threaded rod with cleaning piece main part threaded connection, the cleaning piece is equipped with runs through the brush head pole with the passageway of threaded rod, the passageway is used for supplying gas to flow. According to the cleaning head of the chip test seat cleaning device, when the cleaning head needs to be replaced, the cleaning head is taken down, meanwhile, the cleaning piece is taken down from the cleaning piece main body in a rotating mode, the cleaning piece main body does not need to be replaced, replacement can be completed only by replacing a new cleaning piece, the cleaning piece main body can be matched with the cleaning piece with various specifications to meet cleaning requirements, and only the cleaning piece part needs to be replaced when the cleaning piece main body is replaced, so that cleaning cost is reduced.
Description
Technical Field
The invention relates to the technical field of chip testing equipment, in particular to a chip testing seat cleaning device, a cleaning head of the cleaning device and chip testing equipment.
Background
Semiconductor chips are the core components of modern electronic devices, which have the advantages of high speed, high density, low power consumption, etc. In order to ensure the performance and reliability of the chip, the chip needs to be subjected to various tests such as functional tests, burn-in tests, fault analysis, and the like before shipment. These tests require the use of specialized test seats, which, as the service life of the test seats increases, and are reused, generate many impurities, such as dust, dirt, grease, oxides, etc., inside them. If the test seat is not cleaned in time, the through rate of the chip test is affected, and even the chip is damaged or fails. Therefore, cleaning of the test seat is important.
At present, since the chip test pursues the same test, the same machine has a plurality of test sites, if the machine needs to be cleaned and is required to be stopped for maintenance, more manpower and material resources are required, and the productivity of the equipment is also affected.
Disclosure of Invention
The invention mainly aims to provide a cleaning head of a chip test seat cleaning device, and aims to solve the technical problems that more manpower and material resources are needed for cleaning a chip test seat at present and the productivity of equipment is affected.
To achieve the above object, the present invention provides a cleaning head of a chip test socket cleaning device, the cleaning head of the chip test socket cleaning device comprising:
a cleaning member main body;
the cleaning piece, with the connection can be dismantled to the cleaning piece main part, the cleaning piece includes brush head, brush head pole and threaded rod, the one end of brush head pole with the brush head is connected, the other end of brush head pole with the threaded rod is connected, the threaded rod with cleaning piece main part threaded connection, the cleaning piece is equipped with runs through the brush head pole with the passageway of threaded rod, the passageway is used for supplying gas to flow.
In some embodiments, the cleaning member body is provided with a plurality of mounting holes, a plurality of the mounting holes are positioned on one side of the cleaning member body away from the cleaning member, and a plurality of the mounting holes are respectively provided with a magnet.
In some embodiments, the magnet is glued to the mounting hole by a high temperature glue.
In some embodiments, the cleaning element body is provided with a protrusion located at a peripheral edge of the cleaning element body.
In some embodiments, the cleaning member body is provided with a positioning hole, and the positioning hole is positioned on one side of the cleaning member body away from the cleaning member.
In some embodiments, the cleaning member body is provided with a clamping groove, and the clamping groove is an annular clamping groove formed on the outer side surface of the cleaning member body.
In some embodiments, the cleaning element body is provided with a through hole, the through hole being connected to the channel.
The invention also provides a chip test seat cleaning device which comprises the cleaning head of the chip test seat cleaning device.
The invention also provides a chip testing device, comprising:
the chip test seat is internally provided with an induction element;
the transferring manipulator is used for transferring the chip test seat cleaning device into the chip test seat;
and the chip test seat cleaning device.
The cleaning head of the chip test seat cleaning device is used for being matched with the cleaning device to clean the chip test seat, the cleaning head is arranged on the chip test seat cleaning device, the channel of the cleaning piece is connected with the air pipe of the cleaning device, pollutants on the chip test seat are discharged through the vacuum air channel, when the chip test seat cleaning device needs to replace the cleaning head, the cleaning head is taken down, meanwhile, the cleaning piece is taken down from the cleaning piece body in a rotating mode, the cleaning piece body does not need to be replaced, the replacement can be completed only by replacing a new cleaning piece, the cleaning piece body of the chip test seat cleaning device can be matched with cleaning pieces of various specifications to meet cleaning requirements, only the cleaning piece part needs to be replaced when the cleaning piece body is replaced, the replacement of the cleaning piece body is not involved, the waste of resources is reduced, and the cleaning cost is reduced.
Drawings
FIG. 1 is a schematic diagram of a cleaning head of a cleaning device for a chip test socket according to an embodiment of the invention;
FIG. 2 is a schematic view of a cleaning element of a cleaning head according to an embodiment of the present invention;
FIG. 3 is a schematic view of a cleaning member main body of a cleaning head according to an embodiment of the present invention;
fig. 4 is an exploded view of a cleaning head of a chip test seat cleaning apparatus according to an embodiment of the invention.
Detailed Description
The following description of the embodiments of the present invention will be made more clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be noted that all directional indicators (such as up, down, left, right, front, and rear … …) in the embodiments of the present invention are merely used to explain the relative positional relationship, movement, etc. between the components in a particular posture (as shown in the drawings), and if the particular posture is changed, the directional indicator is changed accordingly.
It will also be understood that when an element is referred to as being "mounted" or "disposed" on another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present.
Furthermore, the description of "first," "second," etc. in this disclosure is for descriptive purposes only and is not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In addition, the technical solutions of the embodiments may be combined with each other, but it is necessary to base that the technical solutions can be realized by those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should be considered to be absent and not within the scope of protection claimed in the present invention.
The invention provides a cleaning head of a chip test seat cleaning device, referring to fig. 1 to 4, the cleaning head of the chip test seat cleaning device comprises:
a cleaning member main body 100;
the cleaning member 200 is detachably connected with the cleaning member main body 100, the cleaning member 200 comprises a brush head 210, a brush head rod 220 and a threaded rod 230, one end of the brush head rod 220 is connected with the brush head 210, the other end of the brush head rod 220 is connected with the threaded rod 230, the threaded rod 230 is in threaded connection with the cleaning member main body 100, the cleaning member 200 is provided with a channel 240 penetrating the brush head 210, the brush head rod 220 and the threaded rod 230, and the channel 240 is used for gas flow.
In this embodiment, the cleaning head of the chip test seat cleaning device is detachably mounted on the chip test seat cleaning device, the chip test seat cleaning device is mounted on the transfer manipulator, in the cleaning process, the transfer manipulator is moved to the position of the chip test seat cleaning device, and the chip test seat cleaning device is transported to the chip test seat to be cleaned, so as to clean the chip test seat, when the chip test seats with different specifications are required to be cleaned, the cleaning head of the chip test seat cleaning device needs to be replaced, the cleaning member main body 100 is taken down, meanwhile, the cleaning member 200 is rotationally taken down from the cleaning member main body 100, and replacement is completed by replacing a new cleaning member 200, which is quite convenient. The detachable cleaning piece 200 can be matched with chip test seats of various specifications to meet cleaning requirements, the cleaning head is easy to replace, only the cleaning piece 200 part is needed to be replaced during replacement, replacement of the cleaning piece main body 100 is not involved, and waste of resources is reduced. Alternatively, the cleaning member main body 100 may be made of stainless steel or other materials which are not easy to rust and clean, so that durability and usability are ensured, the cleaning member 200 may be made of soft materials, softness and cleaning efficiency are ensured, and other materials may be used for the cleaning member 200 according to actual needs. The end of the threaded rod 230 connected with the cleaning member main body 100 is provided with a sealing ring 231, and the sealing ring 231 is used for preventing gas from leaking from the joint of the threaded rod 230 and the cleaning member main body 100, so as to ensure the stability and the sealing performance of the cleaning head, and optionally, the sealing ring 231 can be made of rubber, silica gel or other high polymer materials so as to ensure the wear resistance, the high temperature resistance and the sealing performance thereof.
The channel 240 of the cleaning member 200 is connected to the air pipe of the cleaning device, and dirt and foreign matters are sucked by the brush head 210 in vacuum to be cleaned, the channel 240 preferably has a circular cross section, but is not limited to a circular cross section, and can have other cross sections, and meanwhile, the channel 240 is preferably arranged at the center of the brush head 210, so that the air can uniformly flow in the channel 240. Of course, in other embodiments, the brush head 210 may be driven to vibrate by an ultrasonic motor to achieve cleaning. An ultrasonic motor is a motor which converts microscopic deformation of a material into macroscopic motion of a rotor through mechanical resonance amplification and friction coupling by using inverse piezoelectric effect and ultrasonic vibration of a piezoelectric material. Such vibrations may be transmitted to the brush head 210 by mechanical means or by friction coupling, so that they generate minute vibrations of high frequency, thereby achieving a cleaning effect.
The cleaning head of the chip test seat cleaning device is used for being matched with the cleaning device to clean the chip test seat, the cleaning head is arranged on the chip test seat cleaning device, the channel 240 of the cleaning piece 200 is connected with the air pipe of the cleaning device, pollutants on the chip test seat are discharged through the vacuum air channel, when the chip test seat cleaning device needs to replace the cleaning head, the cleaning head is taken down, meanwhile, the cleaning piece 200 is rotationally taken down from the cleaning piece main body 100, the cleaning piece main body 100 does not need to be replaced, the replacement is completed only by replacing a new cleaning piece 200, and the cleaning piece main body 100 of the chip test seat cleaning device can be matched with the cleaning piece 200 with various specifications to meet the cleaning requirement, and only the cleaning piece 200 part needs to be replaced when the cleaning piece main body 100 is replaced, so that the cleaning cost is reduced.
In some embodiments, referring to fig. 3, the cleaning member body 100 is provided with a plurality of mounting holes 110, the plurality of mounting holes 110 are located at a side of the cleaning member body 100 remote from the cleaning member 200, and the plurality of mounting holes 110 are respectively provided with magnets 111.
In this embodiment, the cleaning member main body 100 is magnetically attracted to the cleaning device by the magnet 111, so that the cleaning member main body 100 can be firmly mounted to the cleaning device, and the cleaning member main body 100 can be easily removed from the cleaning device when the cleaning head needs to be replaced, wherein the shape and size of the mounting hole 110 are adapted to the shape and size of the magnet 111.
In some embodiments, the magnet 111 is adhered to the mounting hole 110 by high temperature adhesive.
In this embodiment, the magnet 111 is adhered to the mounting hole 110 by the high-temperature adhesive, so that the magnet 111 can be firmly mounted in the mounting hole 110, and the high-temperature adhesive can increase the adsorption force between the magnet 111 and the mounting hole 110, so that the magnet 111 can be more stably mounted in the mounting hole 110. Alternatively, the high-temperature glue may be a two-component high-temperature glue, the magnet 111 is placed in the mounting hole 110, then the two-component high-temperature glue is mixed according to a certain proportion and then coated on the contact surface of the magnet 111 and the mounting hole 110, and after the high-temperature glue is cured, the magnet 111 can be firmly adhered in the mounting hole 110. Of course, according to practical needs, the high-temperature glue may be made of other types of polymer materials, so long as the magnet 111 can be firmly adhered in the mounting hole 110. The contact surface between the magnet 111 and the mounting hole 110 needs to be cleaned to secure the adhesive effect of the high temperature glue. Meanwhile, it is necessary to ensure uniformity and thickness of the coating when the high temperature glue is applied to the contact surface of the magnet 111 and the mounting hole 110, so as to ensure the adhesive effect of the high temperature glue.
In some embodiments, referring to fig. 3, the cleaning member body 100 is provided with a protrusion 120, and the protrusion 120 is located at a peripheral edge of the cleaning member body 100.
In this embodiment, when the cleaning head needs to be replaced, the transfer manipulator moves the cleaning device to the cleaning head rack in the cleaning head replacement area, when the protruding member 120 of the cleaning member main body 100 touches the sensor of the cleaning head rack, it indicates that the cleaning head exists in this position, and then the transfer manipulator drives the cleaning device to separate from the cleaning head, so as to replace the cleaning member 200, alternatively, the protruding member 120 may use an induction pin, which may be set according to practical situations.
In some embodiments, referring to fig. 3, the cleaning member body 100 is provided with a positioning hole 130, and the positioning hole 130 is located at a side of the cleaning member body 100 remote from the cleaning member 200.
In this embodiment, the cleaning device and the cleaning member main body 100 can be firmly connected together by inserting the positioning pin of the cleaning device into the positioning hole 130 of the cleaning member main body 100, and optionally, the number and the size of the positioning holes 130 can be adjusted according to the actual situation so as to meet the actual requirement. Meanwhile, the positioning hole 130 may also have a circular, square or other shape, so long as it can be adapted to the positioning pin of the cleaning device.
In some embodiments, referring to fig. 3, the cleaning member body 100 is provided with a clamping groove 140, and the clamping groove 140 is an annular clamping groove formed on the outer side surface of the cleaning member body 100.
In this embodiment, when the cleaning head needs to be replaced, the clamping groove 140 of the cleaning member main body 100 is clamped with the cleaning head rack in the replacement area, and then the transferring manipulator drives the cleaning device to move upwards to be separated from the cleaning head, so as to replace the cleaning member 200. Preferably, the clamping groove 140 is an annular clamping groove to achieve a quick clamping fit of the cleaning head with the cleaning head holder.
In some embodiments, referring to fig. 3, the cleaning member body 100 is provided with a through hole 150, and the through hole 150 is connected with the channel 240.
In this embodiment, the through holes 150 of the cleaning member body 100 are connected with the channels 240, so that the fluidity of the gas inside the cleaning member body 100 is increased, and the gas can more smoothly flow through the channels 240, thereby making the cleaning member 200 exert more excellent cleaning effect. Optionally, the size of the through hole 150 can be adjusted according to the actual requirement of the cleaning head and the flow rate of the gas so as to meet the actual requirement.
The invention also provides a chip test seat cleaning device which comprises the cleaning head of the chip test seat cleaning device. The specific structure of the cleaning head of the cleaning device for the chip test seat refers to the above embodiments, and because the cleaning device for the chip test seat adopts all the technical solutions of all the embodiments, at least has all the technical effects brought by the technical solutions of the embodiments, and the detailed description is omitted herein.
The chip testing device further provided by the invention comprises a chip testing seat, a transferring manipulator and a chip testing seat cleaning device, wherein the specific structure of the chip testing seat cleaning device refers to the embodiment, and as the chip testing device adopts all the technical schemes of all the embodiments, the chip testing device at least has all the technical effects brought by the technical schemes of the embodiments, and the specific structure of the chip testing seat cleaning device is not repeated herein. The chip test seat is internally provided with an induction element, and the transfer manipulator is used for transferring the chip test seat cleaning device into the chip test seat.
The above description of the preferred embodiments of the present invention should not be taken as limiting the scope of the invention, but rather should be understood to cover all modifications, variations and adaptations of the present invention using its general principles and the following detailed description and the accompanying drawings, or the direct/indirect application of the present invention to other relevant arts and technologies.
Claims (9)
1. A cleaning head for a chip test socket cleaning apparatus, comprising:
a cleaning member main body;
the cleaning piece, with the connection can be dismantled to the cleaning piece main part, the cleaning piece includes brush head, brush head pole and threaded rod, the one end of brush head pole with the brush head is connected, the other end of brush head pole with the threaded rod is connected, the threaded rod with cleaning piece main part threaded connection, the cleaning piece is equipped with runs through the brush head pole with the passageway of threaded rod, the passageway is used for supplying gas to flow.
2. The cleaning head of claim 1, wherein the cleaning member body is provided with a plurality of mounting holes, the plurality of mounting holes are positioned on a side of the cleaning member body away from the cleaning member, and the plurality of mounting holes are respectively provided with a magnet.
3. The cleaning head of the chip test seat cleaning apparatus according to claim 2, wherein the magnet is adhered to the mounting hole by high temperature adhesive.
4. The cleaning head of the chip test seat cleaning apparatus according to claim 1, wherein the cleaning member main body is provided with a protrusion member located at a peripheral edge of the cleaning member main body.
5. The cleaning head of claim 1, wherein the cleaning member body is provided with a positioning hole, and the positioning hole is located at a side of the cleaning member body away from the cleaning member.
6. The cleaning head of claim 1, wherein the cleaning member body is provided with a clamping groove, and the clamping groove is an annular clamping groove formed on an outer side surface of the cleaning member body.
7. The cleaning head of a chip test socket cleaning apparatus according to claim 1, wherein the cleaning member body is provided with a through hole, the through hole being connected with the passage.
8. A chip test socket cleaning apparatus comprising a cleaning head of a chip test socket cleaning apparatus as claimed in any one of claims 1 to 7.
9. A chip testing apparatus, comprising:
the chip test seat is internally provided with an induction element;
the transferring manipulator is used for transferring the chip test seat cleaning device into the chip test seat;
and the chip test socket cleaning apparatus of claim 8.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311702497.7A CN117443851A (en) | 2023-12-11 | 2023-12-11 | Chip test seat cleaning device, cleaning head of cleaning device and chip test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311702497.7A CN117443851A (en) | 2023-12-11 | 2023-12-11 | Chip test seat cleaning device, cleaning head of cleaning device and chip test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN117443851A true CN117443851A (en) | 2024-01-26 |
Family
ID=89595105
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202311702497.7A Pending CN117443851A (en) | 2023-12-11 | 2023-12-11 | Chip test seat cleaning device, cleaning head of cleaning device and chip test equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN117443851A (en) |
-
2023
- 2023-12-11 CN CN202311702497.7A patent/CN117443851A/en active Pending
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