CN117538718A - High-temperature high-humidity reverse bias test method, system, equipment and storage medium - Google Patents
High-temperature high-humidity reverse bias test method, system, equipment and storage medium Download PDFInfo
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Abstract
The application discloses a high-temperature high-humidity reverse bias test method, a system, equipment and a storage medium, comprising the following steps: acquiring target product information when a test instruction is received; generating a test limiting condition according to the target product information and generating a test strategy by combining a test instruction; acquiring area environment information of a current test area, and determining a temperature factor and a humidity factor; determining a temperature weight strategy according to the temperature factors, and determining a humidity weight strategy according to the humidity factors; generating a target test strategy according to the temperature weight strategy, the humidity weight strategy and the test strategy; testing a target product to obtain a test result; and generating an abnormal report according to the test result and sending the abnormal report to a preset port. The temperature factor and the humidity factor of the test area are obtained to adjust the test strategy, so that the accuracy of the semiconductor in the test process is improved, and the technical effect of avoiding error data is realized.
Description
Technical Field
The present disclosure relates to the field of semiconductor testing, and in particular, to a method, a system, an apparatus, and a storage medium for testing high temperature and high humidity reverse bias.
Background
The high-temperature high-humidity reverse bias test is an environmental aging test for a power semiconductor device. The following problems also exist in the existing reverse bias test: when temperature and humidity data are acquired before the reverse bias test is carried out, the data acquisition is inaccurate, so that poor data performance and unstable reverse bias data are caused.
Therefore, how to avoid erroneous data in the semiconductor reverse bias test is a technical problem to be solved.
Disclosure of Invention
In order to avoid error data in a semiconductor reverse bias test, the application provides a high-temperature high-humidity reverse bias test method, a system, equipment and a storage medium.
In a first aspect, the present application provides a high-temperature and high-humidity reverse bias testing method, which adopts the following technical scheme:
a high-temperature high-humidity reverse bias test method comprises the following steps:
when a test instruction is received, acquiring target product information of a target product in the test instruction;
generating a test limiting condition according to the target product information;
generating a test strategy according to the test instruction and the test limiting condition;
acquiring area environment information of a current test area, and acquiring a temperature factor and a humidity factor from the area environment information;
determining a temperature weight strategy according to the temperature factors, and determining a humidity weight strategy according to the humidity factors;
generating a target test strategy according to the temperature weight strategy, the humidity weight strategy and the test strategy;
testing the target product according to the target testing strategy and obtaining a testing result;
and when the test result is judged to be abnormal, generating a test abnormality report according to the test result and sending the test abnormality report to a preset port.
Optionally, the step of generating the test constraint condition according to the target product information includes:
acquiring material properties and use properties in the target product information;
generating a material testing constraint according to the material property;
generating a use test limiting condition according to the use attribute;
generating a test constraint according to the material test constraint and the usage test constraint.
Optionally, the step of generating the test constraint according to the material test constraint and the usage test constraint includes:
judging whether contradiction conditions exist according to the material test limiting conditions and the use test limiting conditions;
if yes, determining a contradiction factor set according to the contradiction condition;
determining a contradictory debugging strategy according to the contradictory factor set and determining a test limiting condition according to the contradictory debugging strategy;
if not, combining the material testing constraint and the usage testing constraint to generate a testing constraint.
Optionally, the step of generating a test policy according to the test instruction and the test constraint includes:
determining test detail information in the test instruction;
determining a target test set in a preset test option table according to the test detail information;
and generating a test strategy according to the target test set and the test limiting condition.
Optionally, the step of determining a temperature weight policy according to the temperature factor and determining a humidity weight policy according to the humidity factor at the same time includes:
acquiring a preset standard coefficient, wherein the preset standard coefficient comprises a temperature standard coefficient and a humidity standard coefficient;
determining a temperature deviation condition according to the temperature factor and the temperature standard coefficient, wherein the temperature deviation condition comprises a temperature deviation direction and a temperature deviation value;
determining a temperature weight strategy according to the temperature deviation direction and the temperature deviation value;
determining a humidity deviation condition according to the humidity factor and the humidity standard coefficient, wherein the humidity deviation condition comprises a humidity deviation direction and a humidity deviation value;
and determining a humidity weight strategy according to the humidity deviation direction and the humidity deviation value.
Optionally, the step of generating a target test policy according to the temperature weight policy, the humidity weight policy, and the test policy includes:
generating a comprehensive adjustment strategy according to the temperature weight strategy and the humidity weight strategy;
updating in the test strategy according to the comprehensive adjustment strategy, and acquiring an updated test strategy;
judging whether the current testing strategy meets the testing equipment function corresponding to the current testing area or not;
if yes, taking the current test strategy as a target test strategy;
if not, generating a target test strategy by combining the test equipment functions corresponding to the current test area.
Optionally, before the step of generating a test abnormality report according to the test result and sending the report to a preset port when the test result is determined to be abnormal, the method further includes:
generating a result coordinate system in a curve form according to the test result;
acquiring a preset test evaluation standard and evaluating the result coordinate system to generate an evaluation result;
and determining a test result according to the evaluation result.
In a second aspect, the present application provides a high temperature and high humidity reverse bias test system, the high temperature and high humidity reverse bias test system comprising:
the information acquisition module is used for acquiring target product information of a target product in the test instruction when the test instruction is received;
the test limiting condition module is used for generating a test limiting condition according to the target product information;
the test strategy module is used for generating a test strategy according to the test instruction and the test limiting condition;
the factor acquisition module is used for acquiring the area environment information of the current test area and acquiring a temperature factor and a humidity factor from the area environment information;
the weight strategy module is used for determining a temperature weight strategy according to the temperature factors and determining a humidity weight strategy according to the humidity factors;
the target test strategy module is used for generating a target test strategy according to the temperature weight strategy, the humidity weight strategy and the test strategy;
the test result module is used for testing the target product according to the target test strategy and obtaining a test result;
and the abnormality report module is used for generating a test abnormality report according to the test result and sending the test abnormality report to a preset port when the test result is judged to be abnormal.
In a third aspect, the present application provides a computer device, the device comprising: a memory, a processor that, when executing the computer instructions stored by the memory, performs the method as described above.
In a fourth aspect, the present application provides a computer readable storage medium comprising instructions which, when run on a computer, cause the computer to perform a method as described above.
In summary, the present application includes the following beneficial technical effects:
when a test instruction is received, acquiring target product information; generating a test limiting condition according to the target product information and generating a test strategy by combining a test instruction; acquiring area environment information of a current test area, and determining a temperature factor and a humidity factor in the area environment information; determining a temperature weight strategy according to the temperature factors, and determining a humidity weight strategy according to the humidity factors; generating a target test strategy according to the temperature weight strategy, the humidity weight strategy and the test strategy; testing the target product according to the target testing strategy to obtain a testing result; when the test result is abnormal, generating an abnormal report according to the test result and sending the abnormal report to a preset port. The temperature factor and the humidity factor of the test area are obtained to adjust the test strategy, and the finally generated target test strategy combines the deviation information in the current environment information, so that the accuracy of the semiconductor in the test process is improved, and the technical effect of avoiding error data is realized.
Drawings
FIG. 1 is a schematic diagram of a computer device architecture of a hardware operating environment according to an embodiment of the present application;
FIG. 2 is a schematic flow chart of a first embodiment of a high temperature and high humidity reverse bias test method of the present application;
FIG. 3 is a block diagram of a first embodiment of a high temperature high humidity reverse bias test system of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail by means of the accompanying drawings and examples. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the present application.
Referring to fig. 1, fig. 1 is a schematic diagram of a computer device structure of a hardware running environment according to an embodiment of the present application.
As shown in fig. 1, the computer device may include: a processor 1001, such as a central processing unit (Central Processing Unit, CPU), a communication bus 1002, a user interface 1003, a network interface 1004, a memory 1005. Wherein the communication bus 1002 is used to enable connected communication between these components. The user interface 1003 may include a Display, an input unit such as a Keyboard (Keyboard), and the optional user interface 1003 may further include a standard wired interface, a wireless interface. The network interface 1004 may optionally include a standard wired interface, a Wireless interface (e.g., a Wireless-Fidelity (Wi-Fi) interface). The Memory 1005 may be a high-speed random access Memory (Random Access Memory, RAM) or a stable nonvolatile Memory (NVM), such as a disk Memory. The memory 1005 may also optionally be a storage device separate from the processor 1001 described above.
Those skilled in the art will appreciate that the architecture shown in fig. 1 is not limiting of a computer device and may include more or fewer components than shown, or may combine certain components, or a different arrangement of components.
As shown in fig. 1, an operating system, a network communication module, a user interface module, and a high-temperature high-humidity reverse bias test program may be included in the memory 1005 as one type of storage medium.
In the computer device shown in fig. 1, the network interface 1004 is mainly used for data communication with a network server; the user interface 1003 is mainly used for data interaction with a user; the processor 1001 and the memory 1005 in the computer device may be provided in the computer device, where the computer device invokes the high-temperature and high-humidity reverse bias test program stored in the memory 1005 through the processor 1001, and executes the high-temperature and high-humidity reverse bias test method provided in the embodiment of the present application.
An embodiment of the application provides a high-temperature high-humidity reverse bias test method, referring to fig. 2, fig. 2 is a schematic flow chart of a first embodiment of the high-temperature high-humidity reverse bias test method.
In this embodiment, the high-temperature high-humidity reverse bias test method includes the following steps:
step S10: and when the test instruction is received, acquiring target product information of a target product in the test instruction.
It should be noted that, the test instruction in this embodiment refers to the quality of testing the semiconductor, and the test instruction may be automatically generated in the system according to the requirement, or may be manually input by a background person in a manner of opening the background authority.
It is understood that the target product is referred to as a target object, and in particular implementations, a target semiconductor object. A semiconductor (semiconductor) refers to a material having conductivity between that of a conductor and an insulator at normal temperature. Semiconductors are used in integrated circuits, consumer electronics, communication systems, photovoltaic power generation, lighting, high power conversion, etc., and diodes are devices fabricated using semiconductors. Common semiconductor materials are silicon, germanium, gallium arsenide, etc., silicon being one of the most influential applications of various semiconductor materials.
In a specific implementation, obtaining the target product information of the target product refers to determining a target parameter of a target to be tested when a test instruction is received, and obtaining the target product information in a traversing manner in the database of the embodiment according to the target parameter; or when the test instruction is received, the target product information carried in the test instruction is directly obtained.
It should be noted that, in this embodiment, the target product information is mainly used to combine the test purpose and the target product to accurately generate the test scheme in the subsequent test process, and the test strategy is not required to be generated by manually setting the test scheme. Therefore, the target product information is acquired to provide basic data about the product to be tested in the subsequent generation process of the test strategy to reasonably produce the test strategy.
Step S20: and generating test limiting conditions according to the target product information.
It should be noted that the test constraint refers to a condition for defining the highest and/or lowest test parameters during the test, for example: the highest temperature or the lowest temperature is tested.
In a specific implementation, the test of the semiconductor in this embodiment is a reverse bias test under a high temperature and high humidity state. The High Temperature Reverse Bias (HTRB) is used as an important link of the reliability test of the power device, and the accuracy and the function of the testing device determine the accuracy of the aging degree determination of the tested device.
It should be noted that, the generation of the test constraint condition according to the target product information is to perform the test in the stable state of the material by acquiring the upper test bearing limit and/or the lower test bearing limit information of the portion to be tested in the target product information.
Further, in order to improve the rationality in the process of generating the test constraint, the step of generating the test constraint according to the target product information includes: acquiring material properties and use properties in the target product information; generating material testing limiting conditions according to the material properties; generating a use test limiting condition according to the use attribute; the test constraints are generated based on the material test constraints and the usage test constraints.
It should be noted that the material attribute refers to an inherent attribute of each material in the structure of the target product during normal testing, and the usage attribute is a usage attribute corresponding to the component in the current testing environment. After determining the material properties, the conditions of the corresponding material property restrictions are matched, which conditions are mainly used for limiting the variable factors in the environment during the test. Similarly, the specific roles and functions of the component will be determined based on the usage attributes to match the corresponding usage test constraints.
It can be understood that when determining the policy test constraint according to the material attribute and determining the usage test constraint according to the usage attribute, the matching basis is a constraint mapping table that is entered in advance or manually imported in the background, where the constraint mapping table may be matched to the corresponding constraint factor according to the attribute, and the prioritized constraint is summarized to obtain a constraint set, which is referred to as a test constraint in this embodiment.
In a specific implementation, the step of generating the test constraints based on the material test constraints and using the test constraints comprises: judging whether contradiction conditions exist according to the material test limiting conditions and the use test limiting conditions; if yes, determining a contradiction factor set according to the contradiction condition; determining a contradictory debugging strategy according to the contradictory factor set and determining a test limiting condition according to the contradictory debugging strategy; if not, combining the material testing constraints and the use testing constraints to generate the testing constraints.
In the present embodiment, determining whether or not a contradictory condition exists refers to determining whether or not a numerical abnormality exists in the test constraint, for example: when the maximum temperature is not more than 20 degrees celsius according to the material limitation condition and the minimum temperature is not less than 30 degrees celsius according to the use of the test limitation condition, it is determined that a contradictory condition exists.
In specific implementation, when the contradiction condition is determined, the contradiction debugging strategy is determined through the contradiction factor set, the priority of each condition factor in the material test limiting condition and the practical test limiting condition is different by determining the current priority information for priority selection, the corresponding priority is set in a preset byte, and the filling of the preset byte can be set according to a system background manager or can be automatic.
Step S30: and generating a test strategy according to the test instruction and the test limiting condition.
It should be noted that, generating the test policy according to the test instruction and the test constraint condition refers to finally generating the test policy according to the test requirement in the test instruction and the test constraint condition.
Further, in order to improve the rationality of the test generation, the step of generating the test strategy according to the test instruction and the test limiting condition includes: determining test detail information in a test instruction; determining a target test set in a preset test option table according to the test detail information; and generating a test strategy according to the target test set and the test limiting conditions.
The test detail information in this embodiment refers to the test requirement details of the target semiconductor in the test, for example: testing its corresponding parameters in a high temperature environment or testing its response parameters in a high humidity environment.
Step S40: and acquiring the regional environment information of the current test region, and acquiring the temperature factor and the humidity factor from the regional environment information.
In this embodiment, the temperature factor refers to a temperature parameter, and the humidity factor refers to a humidity parameter. And determining the current environmental information which is not before the link for executing the test by acquiring the environmental information of the current test area. The objective basic temperature and humidity can be determined by acquiring the temperature factor and the humidity factor, so that the anti-interference item in the test is set to reasonably generate the test result.
Step S50: and determining a temperature weight strategy according to the temperature factors, and simultaneously determining a humidity weight strategy according to the humidity factors.
It should be noted that, determining the temperature weight adjustment policy according to the temperature factor refers to determining a specific temperature difference raised during the test link by determining temperature related information so as to eliminate a current test error. And similarly, the humidity weight strategy is determined according to the humidity factor by determining humidity related information to determine a specific humidity difference which is improved during a test link so as to eliminate the current test error.
Step S60: and generating a target test strategy according to the temperature weight strategy, the humidity weight strategy and the test strategy.
Further, in order to generate the target test policy, the step of generating the target test policy according to the temperature weight policy, the humidity weight policy and the test policy includes: generating a comprehensive adjustment strategy according to the temperature weight strategy and the humidity weight strategy; updating in the test strategy according to the comprehensive adjustment strategy, and acquiring the updated test strategy; judging whether the current test strategy meets the function of the test equipment corresponding to the current test area or not; if yes, taking the current test strategy as a target test strategy; if not, generating a target test strategy by combining the test equipment functions corresponding to the current test area.
It should be noted that, how to eliminate the deviation influence caused by the temperature and the humidity in the current test environment is obtained according to the temperature weight strategy and the humidity weight strategy. The test data acquired after eliminating the influence of the deviation will be more accurate, so the temperature weight strategy, the humidity weight strategy and the test strategy are combined to generate a target test strategy, and the target test strategy comprises a method for eliminating the temperature and humidity error phenomenon when the test is performed.
Step S70: and testing the target product according to the target testing strategy and obtaining a testing result.
Step S80: when the test result is judged to be abnormal, a test abnormality report is generated according to the test result and is sent to a preset port.
Further, in order to improve the judgment rationality of the test result, before the step of generating a test exception report according to the test result and sending the report to the preset port when the test result is judged to be abnormal, the method further comprises: generating a result coordinate system in a curve form according to the test result; acquiring a preset test evaluation standard and evaluating a result coordinate system to generate an evaluation result; and determining a test result according to the evaluation result.
It should be noted that, in this embodiment, a preset test evaluation standard is obtained and an evaluation result is performed on a result coordinate system to generate an evaluation result, and it is determined that the test result is obtained by first obtaining the preset test evaluation standard according to the evaluation result, where the preset test evaluation standard is obtained by importing corresponding standard test data; the evaluation of the resulting coordinate system is performed by determining the integral slope of the curve in the coordinate system to obtain the evaluation result.
When a test instruction is received, the embodiment obtains target product information; generating a test limiting condition according to the target product information and generating a test strategy by combining a test instruction; acquiring area environment information of a current test area, and determining a temperature factor and a humidity factor in the area environment information; determining a temperature weight strategy according to the temperature factors, and determining a humidity weight strategy according to the humidity factors; generating a target test strategy according to the temperature weight strategy, the humidity weight strategy and the test strategy; testing the target product according to the target testing strategy to obtain a testing result; when the test result is abnormal, generating an abnormal report according to the test result and sending the abnormal report to a preset port. The temperature factor and the humidity factor of the test area are obtained to adjust the test strategy, and the finally generated target test strategy combines the deviation information in the current environment information, so that the accuracy of the semiconductor in the test process is improved, and the technical effect of avoiding error data is realized.
In addition, the embodiment of the application also provides a computer readable storage medium, wherein the storage medium stores a program for high-temperature high-humidity reverse bias test, and the program for high-temperature high-humidity reverse bias test realizes the steps of the method for high-temperature high-humidity reverse bias test when being executed by a processor.
Referring to fig. 3, fig. 3 is a block diagram of a first embodiment of a high temperature and high humidity reverse bias test system according to the present application.
As shown in fig. 3, the high-temperature and high-humidity reverse bias test system provided in the embodiment of the present application includes:
the information acquisition module 10 is used for acquiring target product information of a target product in the test instruction when the test instruction is received;
a test constraint module 20 for generating a test constraint according to the target product information;
a test policy module 30 for generating a test policy according to the test instruction and the test constraint condition;
the factor obtaining module 40 is configured to obtain area environment information of a current test area, and obtain a temperature factor and a humidity factor from the area environment information;
a weight policy module 50 for determining a temperature weight policy based on the temperature factor and a humidity weight policy based on the humidity factor;
the target test policy module 60 is configured to generate a target test policy according to the temperature weight policy, the humidity weight policy, and the test policy;
the test result module 70 is configured to test a target product according to a target test policy and obtain a test result;
the abnormality report module 80 is configured to generate a test abnormality report according to the test result and send the report to the preset port when the test result is determined to be abnormal.
It should be understood that the foregoing is merely illustrative, and the technical solutions of the present application are not limited in any way, and those skilled in the art may set the technical solutions according to the needs in the specific application, and the present application is not limited thereto.
When a test instruction is received, the embodiment obtains target product information; generating a test limiting condition according to the target product information and generating a test strategy by combining a test instruction; acquiring area environment information of a current test area, and determining a temperature factor and a humidity factor in the area environment information; determining a temperature weight strategy according to the temperature factors, and determining a humidity weight strategy according to the humidity factors; generating a target test strategy according to the temperature weight strategy, the humidity weight strategy and the test strategy; testing the target product according to the target testing strategy to obtain a testing result; when the test result is abnormal, generating an abnormal report according to the test result and sending the abnormal report to a preset port. The temperature factor and the humidity factor of the test area are obtained to adjust the test strategy, and the finally generated target test strategy combines the deviation information in the current environment information, so that the accuracy of the semiconductor in the test process is improved, and the technical effect of avoiding error data is realized.
In one embodiment, the test constraint module 20 is further configured to obtain a material attribute and a usage attribute in the target product information; generating material testing limiting conditions according to the material properties; generating a use test limiting condition according to the use attribute; the test constraints are generated based on the material test constraints and the usage test constraints.
In one embodiment, the test limit condition module 20 is further configured to determine whether a contradictory condition exists according to the material test limit condition and the usage test limit condition; if yes, determining a contradiction factor set according to the contradiction condition; determining a contradictory debugging strategy according to the contradictory factor set and determining a test limiting condition according to the contradictory debugging strategy; if not, combining the material testing constraints and the use testing constraints to generate the testing constraints.
In one embodiment, the test policy module 30 is further configured to determine test detail information in the test instruction; determining a target test set in a preset test option table according to the test detail information; and generating a test strategy according to the target test set and the test limiting conditions.
In an embodiment, the weight policy module 50 is further configured to obtain a preset standard coefficient, where the preset standard coefficient includes a temperature standard coefficient and a humidity standard coefficient; determining a temperature deviation condition according to the temperature factor and the temperature standard coefficient, wherein the temperature deviation condition comprises a temperature deviation direction and a temperature deviation value; determining a temperature weight strategy according to the temperature deviation direction and the temperature deviation value; determining a humidity deviation condition according to the humidity factor and the humidity standard coefficient, wherein the humidity deviation condition comprises a humidity deviation direction and a humidity deviation value; and determining a humidity weight strategy according to the humidity deviation direction and the humidity deviation value.
In one embodiment, the target test policy module 60 is further configured to generate a comprehensive adjustment policy according to the temperature weight policy and the humidity weight policy; updating in the test strategy according to the comprehensive adjustment strategy, and acquiring the updated test strategy; judging whether the current test strategy meets the function of the test equipment corresponding to the current test area or not; if yes, taking the current test strategy as a target test strategy; if not, generating a target test strategy by combining the test equipment functions corresponding to the current test area.
In one embodiment, the anomaly reporting module 80 is further configured to generate a result coordinate system in the form of a curve according to the test result; acquiring a preset test evaluation standard and evaluating a result coordinate system to generate an evaluation result; and determining a test result according to the evaluation result.
It should be noted that the above-described working procedure is merely illustrative, and does not limit the scope of protection of the present application, and in practical application, a person skilled in the art may select part or all of them according to actual needs to achieve the purpose of the embodiment, which is not limited herein.
In addition, technical details not described in detail in the present embodiment may refer to the method for testing high temperature and high humidity reverse bias provided in any embodiment of the present application, which is not described herein again.
Furthermore, it should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or system that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or system. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or system that comprises the element.
The foregoing embodiment numbers of the present application are merely for describing, and do not represent advantages or disadvantages of the embodiments.
From the above description of the embodiments, it will be clear to those skilled in the art that the above-described embodiment method may be implemented by means of software plus a necessary general hardware platform, but of course may also be implemented by means of hardware, but in many cases the former is a preferred embodiment. Based on such understanding, the technical solution of the present application may be embodied essentially or what contributes to the prior art in the form of a software product stored in a storage medium (such as a Read high temperature and high humidity reverse bias test Memory (ROM)/RAM, magnetic disk, optical disc), which includes several instructions for causing a terminal device (which may be a mobile phone, a computer, a server, or a network device, etc.) to perform the method of the embodiments of the present application.
The foregoing description is only of the preferred embodiments of the present application, and is not intended to limit the scope of the claims, and all equivalent structures or equivalent processes using the descriptions and drawings of the present application, or direct or indirect application in other related technical fields are included in the scope of the claims of the present application.
Claims (10)
1. The high-temperature high-humidity reverse bias test method is characterized by comprising the following steps of:
when a test instruction is received, acquiring target product information of a target product in the test instruction;
generating a test limiting condition according to the target product information;
generating a test strategy according to the test instruction and the test limiting condition;
acquiring area environment information of a current test area, and acquiring a temperature factor and a humidity factor from the area environment information;
determining a temperature weight strategy according to the temperature factors, and determining a humidity weight strategy according to the humidity factors;
generating a target test strategy according to the temperature weight strategy, the humidity weight strategy and the test strategy;
testing the target product according to the target testing strategy and obtaining a testing result;
and when the test result is judged to be abnormal, generating a test abnormality report according to the test result and sending the test abnormality report to a preset port.
2. The method according to claim 1, wherein the step of generating the test constraint condition according to the target product information comprises:
acquiring material properties and use properties in the target product information;
generating a material testing constraint according to the material property;
generating a use test limiting condition according to the use attribute;
generating a test constraint according to the material test constraint and the usage test constraint.
3. The method of claim 2, wherein the step of generating the test constraints based on the material test constraints and the usage test constraints comprises:
judging whether contradiction conditions exist according to the material test limiting conditions and the use test limiting conditions;
if yes, determining a contradiction factor set according to the contradiction condition;
determining a contradictory debugging strategy according to the contradictory factor set and determining a test limiting condition according to the contradictory debugging strategy;
if not, combining the material testing constraint and the usage testing constraint to generate a testing constraint.
4. The method according to claim 1, wherein the step of generating a test strategy according to the test instruction and the test constraint condition comprises:
determining test detail information in the test instruction;
determining a target test set in a preset test option table according to the test detail information;
and generating a test strategy according to the target test set and the test limiting condition.
5. The method according to claim 1, wherein the step of determining a temperature weight strategy according to the temperature factor and determining a humidity weight strategy according to the humidity factor comprises:
acquiring a preset standard coefficient, wherein the preset standard coefficient comprises a temperature standard coefficient and a humidity standard coefficient;
determining a temperature deviation condition according to the temperature factor and the temperature standard coefficient, wherein the temperature deviation condition comprises a temperature deviation direction and a temperature deviation value;
determining a temperature weight strategy according to the temperature deviation direction and the temperature deviation value;
determining a humidity deviation condition according to the humidity factor and the humidity standard coefficient, wherein the humidity deviation condition comprises a humidity deviation direction and a humidity deviation value;
and determining a humidity weight strategy according to the humidity deviation direction and the humidity deviation value.
6. The method according to claim 1, wherein the step of generating a target test strategy according to the temperature weight strategy, the humidity weight strategy, and the test strategy comprises:
generating a comprehensive adjustment strategy according to the temperature weight strategy and the humidity weight strategy;
updating in the test strategy according to the comprehensive adjustment strategy, and acquiring an updated test strategy;
judging whether the current testing strategy meets the testing equipment function corresponding to the current testing area or not;
if yes, taking the current test strategy as a target test strategy;
if not, generating a target test strategy by combining the test equipment functions corresponding to the current test area.
7. The method for testing high temperature and high humidity reverse bias according to claim 1, wherein when the test result is abnormal, the method further comprises, before the step of generating a test abnormality report according to the test result and sending the report to a preset port:
generating a result coordinate system in a curve form according to the test result;
acquiring a preset test evaluation standard and evaluating the result coordinate system to generate an evaluation result;
and determining a test result according to the evaluation result.
8. The high-temperature high-humidity reverse bias test system is characterized by comprising:
the information acquisition module is used for acquiring target product information of a target product in the test instruction when the test instruction is received;
the test limiting condition module is used for generating a test limiting condition according to the target product information;
the test strategy module is used for generating a test strategy according to the test instruction and the test limiting condition;
the factor acquisition module is used for acquiring the area environment information of the current test area and acquiring a temperature factor and a humidity factor from the area environment information;
the weight strategy module is used for determining a temperature weight strategy according to the temperature factors and determining a humidity weight strategy according to the humidity factors;
the target test strategy module is used for generating a target test strategy according to the temperature weight strategy, the humidity weight strategy and the test strategy;
the test result module is used for testing the target product according to the target test strategy and obtaining a test result;
and the abnormality report module is used for generating a test abnormality report according to the test result and sending the test abnormality report to a preset port when the test result is judged to be abnormal.
9. A computer device, the device comprising: a memory, a processor which, when executing the computer instructions stored by the memory, performs the method of any one of claims 1 to 7.
10. A computer readable storage medium comprising instructions which, when run on a computer, cause the computer to perform the method of any one of claims 1 to 7.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113514746A (en) * | 2021-04-15 | 2021-10-19 | 华电(烟台)功率半导体技术研究院有限公司 | High-temperature high-humidity high-pressure reverse bias test system and method for high-voltage high-power device |
| CN214622914U (en) * | 2021-04-15 | 2021-11-05 | 华电(烟台)功率半导体技术研究院有限公司 | High-temperature high-humidity high-pressure reverse bias testing device of high-voltage high-power device |
| CN116298765A (en) * | 2023-04-18 | 2023-06-23 | 无锡芯力为半导体设备有限公司 | High-temperature high-humidity reverse bias test system |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113514746A (en) * | 2021-04-15 | 2021-10-19 | 华电(烟台)功率半导体技术研究院有限公司 | High-temperature high-humidity high-pressure reverse bias test system and method for high-voltage high-power device |
| CN214622914U (en) * | 2021-04-15 | 2021-11-05 | 华电(烟台)功率半导体技术研究院有限公司 | High-temperature high-humidity high-pressure reverse bias testing device of high-voltage high-power device |
| CN116298765A (en) * | 2023-04-18 | 2023-06-23 | 无锡芯力为半导体设备有限公司 | High-temperature high-humidity reverse bias test system |
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