CN117434412A - Testing device for power device - Google Patents
Testing device for power device Download PDFInfo
- Publication number
- CN117434412A CN117434412A CN202311284509.9A CN202311284509A CN117434412A CN 117434412 A CN117434412 A CN 117434412A CN 202311284509 A CN202311284509 A CN 202311284509A CN 117434412 A CN117434412 A CN 117434412A
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- power device
- pin
- tested
- test
- main body
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- 238000012360 testing method Methods 0.000 title claims abstract description 163
- 238000004806 packaging method and process Methods 0.000 claims abstract description 10
- 230000004308 accommodation Effects 0.000 claims description 19
- 238000003825 pressing Methods 0.000 claims description 11
- 238000004891 communication Methods 0.000 claims description 3
- 230000003068 static effect Effects 0.000 description 10
- 238000010586 diagram Methods 0.000 description 4
- 238000001125 extrusion Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a testing device of a power device, which comprises: a test board; the packaging body is arranged on the test board and is internally used for setting a power device to be tested, a test pin is arranged in the packaging body, one end of the test pin is suitable for being electrically connected with the power device to be tested, and the other end of the test pin is electrically connected with the test board. Therefore, the packaging body is arranged on the test board and used for setting the power device to be tested, and the test pins are arranged in the packaging body and used for electrically connecting the power device to be tested with the test board, so that the power device to be tested can be easily connected with the test board, the suitability between the power device to be tested and the test board can be improved, and the power device to be tested can be conveniently tested through the test board.
Description
Technical Field
The invention relates to the technical field of testing, in particular to a testing device of a power device.
Background
In the production of power devices, electrical performance of the packaged power devices needs to be tested, wherein static test needs to be connected with the power devices to be tested through a power device analyzer so as to test the static electrical performance of the power devices to be tested.
In the prior art, a power device packaged by a patch cannot be directly adapted to a power device static analyzer due to the structural specificity of the power device, so that a general power device static analyzer cannot perform static test on the patch power device.
Disclosure of Invention
The present invention aims to solve at least one of the technical problems existing in the prior art. It is therefore an object of the present invention to provide a power device testing apparatus that can improve the feasibility of static testing of power devices.
According to the embodiment of the invention, the testing device of the power device comprises: a test board; the packaging body is arranged on the test board and is internally used for setting a power device to be tested, a test pin is arranged in the packaging body, one end of the test pin is suitable for being electrically connected with the power device to be tested, and the other end of the test pin is electrically connected with the test board.
Therefore, the packaging body is arranged on the test board and used for setting the power device to be tested, and the test pins are arranged in the packaging body and used for electrically connecting the power device to be tested with the test board, so that the power device to be tested can be easily connected with the test board, the suitability between the power device to be tested and the test board can be improved, and the power device to be tested can be conveniently tested through the test board.
In some examples of the present invention, the test pins include a first pin and a second pin, the first pin is disposed to extend vertically and has a lower end electrically connected to the test board, one end of the second pin is flexibly connected to an upper end of the first pin, and the other end of the second pin is adapted to be pressed downward by a power device to be tested and is electrically connected to the power device to be tested.
In some examples of the present invention, a first accommodating groove and a second accommodating groove are provided inside the package body, the second accommodating groove is provided at one side of the first accommodating groove and is communicated with the first accommodating groove, the first accommodating groove is used for providing a power device to be tested, the first pin is provided in the second accommodating groove, and the second pin at least partially extends into the first accommodating groove.
In some examples of the present invention, the upper and lower sides of the second receiving groove are both opened, the lower end of the first pin passes through the lower side of the second receiving groove and is electrically connected with the test board, and the second pin protrudes into the first receiving groove from the upper side of the second receiving groove.
In some examples of the present invention, the plurality of test pins and the plurality of second accommodating grooves are in one-to-one correspondence.
In some examples of the present invention, the package includes a main body portion in which the first receiving groove and the second receiving groove are disposed, and a cover plate portion that covers an upper side of the main body portion and is adapted to press-fit with a power device to be tested inside the main body portion.
In some examples of the present invention, a pressing block is disposed on the cover plate portion, and the pressing block is disposed to protrude downward and is used for pressing a power device to be tested inside the main body portion.
In some examples of the present invention, a first clamping portion is provided on the main body portion, a second clamping portion is provided on the cover plate portion, one of the first clamping portion and the second clamping portion is a buckle, and the other is a clamping groove, and the buckle and the clamping groove are detachably clamped and matched.
In some examples of the present invention, a chuck member is provided at one side of the main body portion, and a lower end of the chuck member extends to a lower end of the first receiving groove and is adapted to abut against a power device to be tested, and the chuck member is rotatable toward an outer side away from the first receiving groove, so that the lower end of the chuck member selectively pries the power device to be tested upward.
In some examples of the present invention, the chuck member includes a handle portion rotatably provided at one side of the main body portion, a rotating portion provided at a lower end of the rotating portion and adapted to be in abutting engagement with a lower side of the power device to be tested, and an abutting portion provided at an upper side of the rotating portion.
Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.
Drawings
The foregoing and/or additional aspects and advantages of the invention will become apparent and may be better understood from the following description of embodiments taken in conjunction with the accompanying drawings in which:
FIG. 1 is a schematic diagram of a test apparatus according to an embodiment of the invention;
FIG. 2 is an exploded view of a test device according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of another view of a test apparatus according to an embodiment of the invention;
FIG. 4 is a schematic diagram of another view of a test apparatus according to an embodiment of the invention;
FIG. 5 is a schematic diagram of another view of a test apparatus according to an embodiment of the invention;
FIG. 6 is a cross-sectional view taken along the direction A-A in FIG. 5;
FIG. 7 is a partial schematic view of a package according to an embodiment of the invention;
FIG. 8 is a partial schematic view of another view of a package according to an embodiment of the invention;
FIG. 9 is a partial schematic view of a package according to an embodiment of the invention;
fig. 10 is a partial schematic view of another view of a package according to an embodiment of the present invention.
Reference numerals:
100. a testing device; 200. a power device;
10. a test board;
20. a package; 21. testing pins; 211. a first pin; 212. a second pin; 22. a first accommodation groove; 23. a second accommodation groove; 24. a main body portion; 241. a first clamping part; 242. a chuck member; 2421. a handle portion; 2422. a rotating part; 2423. an abutting portion; 25. a cover plate portion; 251. briquetting; 252. and the second clamping part.
Detailed Description
Embodiments of the present invention will be described in detail below, by way of example with reference to the accompanying drawings.
The following describes a testing apparatus 100 of a power device 200 according to an embodiment of the present invention with reference to fig. 1 to 10, where the testing apparatus 100 in the embodiment of the present invention may facilitate static testing of a chip-mounted power device 200.
As shown in fig. 1 to 10, a test apparatus 100 of a power device 200 according to the present invention may mainly include: the test board 10 and the package 20, wherein the package 20 is disposed on the test board 10 and is internally used for disposing the power device 200 to be tested, the package 20 is internally provided with a test pin 21, one end of the test pin 21 is suitable for being electrically connected with the power device 200 to be tested, and the other end is electrically connected with the test board 10. Specifically, the test board 10 is a circuit board that can be used to design a circuit for testing the power device 200 to be tested. The package 20 can be used for setting the power device 200 to be tested, and can provide stable and reliable setting positions for the power device 200 to be tested, so as to ensure the structural stability of the power device 200 to be tested in the test, and further ensure the validity of the test result. In an embodiment of the present invention, the apparatus for testing the power device 200 includes, but is not limited to, a B1506 test apparatus, which may be used to test the static electrical performance of the power device 200 to be tested.
Further, the package 20 is disposed on the test board 10, and the test board 10 not only can provide a stable and reliable location for the package 20, but also can facilitate direct electrical connection between the package 20 and the test board 10, so as to reduce connection difficulty between the package 20 and the test board 10 and improve efficiency of the power device 200. The package 20 is provided with a test pin 21, and the test pin 21 is made of metal and can be used for transmitting electrical signals in electrical connection. The package 20 can provide stable and reliable setting positions for the test pins 21, and can ensure the structural reliability of the test pins 21 when the power device 200 to be tested is tested.
Further, one end of the test pin 21 is adapted to be electrically connected to the power device 200 to be tested, so that a circuit between the test pin 21 and the power device 200 to be tested can be conducted, and a current can smoothly flow through the test pin 21 and the power device 200 to be tested. The other end of the test pin 21 is electrically connected with the test board 10, so that a circuit between the test pin 21 and the test board 10 is conducted, current can smoothly flow through the test pin 21 and the test board 10, and then the power device 200 to be tested is electrically connected with the test board 10, and the circuit between the power device 200 to be tested and the test board 10 is conducted, so that the power device 200 to be tested can be tested through the test board 10.
In the prior art, a power device packaged by a patch cannot be adapted to B test equipment due to the structural specificity of the power device, so that the power device packaged by the patch is difficult to complete static test. In the embodiment of the present invention, the power device 200 to be tested can be electrically connected with the test pins 21 in the package 20, and can be fixed on the test board 10 through the package 20, so that not only the static test operability of the power device 200 to be tested can be improved, but also the structural stability of the power device 200 to be tested in the test apparatus 100 can be ensured.
Therefore, the package 20 is arranged on the test board 10 for arranging the power device 200 to be tested, and the test pins 21 are arranged in the package 20 for electrically connecting the power device 200 to be tested with the test board 10, so that the power device 200 to be tested can be easily connected with the test board 10, the suitability between the power device 200 to be tested and the test board 10 can be improved, and the test of the power device 200 to be tested can be conveniently completed through the test board 10.
As shown in fig. 2, the test pins 21 include a first pin 211 and a second pin 212, the first pin 211 is vertically extended, and the lower end is electrically connected with the test board 10, one end of the second pin 212 is flexibly connected with the upper end of the first pin 211, and the other end of the second pin 212 is adapted to be pressed downward by the power device 200 to be tested and is electrically connected with the power device 200 to be tested. Specifically, the test pins 21 include a first pin 211 and a second pin 212, where the first pin 211 is disposed along a vertical extension, so that the first pin 211 may conveniently pass through the package 20, and the lower end is electrically connected to the test board 10, so as to implement circuit conduction between the test pins 21 and the test board 10. One end of the second pin 212 is connected with the upper end of the first pin 211, so that current can be guaranteed to be conducted between the second pin 212 and the first pin 211, and the second pin 212 is bent, so that the second pin 212 can be electrically connected with the power device 200 to be tested.
As shown in fig. 2 and 8, the package 20 is internally provided with a first receiving groove 22 and a second receiving groove 23, the second receiving groove 23 is disposed at one side of the first receiving groove 22 and is in communication with the first receiving groove 22, the first receiving groove 22 is used for disposing the power device 200 to be tested, the first pin 211 is disposed in the second receiving groove 23, and the second pin 212 at least partially extends into the first receiving groove 22. Specifically, the first accommodating groove 22 and the second accommodating groove 23 are disposed in the package body 20, so that the power device 200 and the test pin 21 to be tested can be conveniently disposed in the package body 20, and structural reliability of the power device 200 and the test pin 21 to be tested in the package body 20 is ensured. The second receiving groove 23 is disposed at one side of the first receiving groove 22, and the first receiving groove 22 is used for disposing the power device 200 to be tested, and the second receiving groove 23 is used for disposing the test pin 21, so that the test pin 21 can be disposed at one side of the power device 200 to be tested, so that the test pin 21 is electrically connected with the power device 200 to be tested.
Further, the second accommodating groove 23 is communicated with the first accommodating groove 22, so that the power device 200 to be tested and the test pin 21 can be ensured to be simultaneously arranged in the package body 20, and the electrical connection between the test pin 21 and the power device 200 to be tested can be realized, so that the circuit connectivity between the power device 200 to be tested and the test pin 21 can be ensured. The first pin 211 is disposed in the second accommodating groove 23, so that the test pin 21 is disposed in the second accommodating groove 23, the second accommodating groove 23 can limit the first pin 211 and prevent the test pin 21 from displacing in the package 20, thereby improving the reliability of connection between the package 20 and the test pin 21 of the power device 200 to be tested. The second pins 212 at least partially protrude into the first receiving grooves 22, and the convenience of electrically connecting the power device 200 to be tested with the test pins 21 can be improved.
As shown in fig. 2, 3, 4 and 6, both upper and lower sides of the second receiving groove 23 are opened, the lower end of the first pin 211 passes through the lower side of the second receiving groove 23 and is electrically connected with the test board 10, and the second pin 212 protrudes into the first receiving groove 22 from the upper side of the second receiving groove 23. Specifically, the upper and lower sides of the second accommodating groove 23 are all open, so that the first pin 211 can penetrate into the second accommodating groove 23 from the upper side of the second accommodating groove 23 and then penetrate out from the lower side of the second accommodating groove 23, thus not only facilitating the electrical connection between the lower end of the first pin 211 and the test board 10, but also facilitating the connection between the upper end of the first pin 211 and the second pin 212, so as to ensure that both ends of the first pin 211 can be electrically connected. One end of the second pin 212 is electrically connected to the upper end of the first pin 211, and the other end extends out of the upper side of the second accommodating groove 23 and extends into the first accommodating groove 22, so that the second pin can be electrically connected to the power device 200 to be tested in the first accommodating groove 22, and current flow between the power device 200 to be tested and the test board 10 is realized.
As shown in fig. 2, 3 and 4, the number of the test pins 21 is plural, the number of the second accommodation grooves 23 is plural, and the plurality of test pins 21 and the plurality of second accommodation grooves 23 are in one-to-one correspondence. Specifically, in the embodiment of the present invention, the package 20 is provided with a plurality of test pins 21, and the plurality of test pins 21 are used for connecting the test board 10 and the power device 200 to be tested, so that a current loop is formed between the test board 10 and the power device 200 to be tested, so as to ensure conduction of the test circuit. The number of the second accommodating slots is multiple, and the plurality of test pins 21 are in one-to-one correspondence with the plurality of second accommodating slots 23, so that the plurality of test pins 21 can be independently arranged in the package body 20, and mutual interference of currents on the plurality of test pins 21 can be prevented, so that normal operation of a current loop among the test device 100, the power device 200 to be tested and the test board 10 can be ensured, and the test feasibility of the power device 200 to be tested is ensured.
As shown in fig. 1, 2, 3, 4 and 6, the package 20 includes a main body 24 and a cover plate 25, a first receiving groove 22 and a second receiving groove 23 are disposed in the main body 24, and the cover plate 25 is covered on the upper side of the main body 24 and is adapted to be press-fitted with the power device 200 to be tested in the main body 24. Specifically, the package 20 is divided into the main body portion 24 and the cover plate portion 25, and the main body portion 24 can provide stable and reliable arrangement positions for the first accommodation groove 22 and the second accommodation groove 23, and can ensure structural stability of the first accommodation groove 22 and the second accommodation groove 23 in the package 20. During testing, the lower end of the test pin 21 can pass through the second accommodating groove 23 and be connected with the test board 10, so that the first pin 211 is arranged in the second accommodating groove 23, the second pin 212 stretches into the first accommodating groove 22, the power device 200 to be tested is put into the first accommodating groove 22, and the second pin 212 is pressed downwards until the second pin 212 is tightly attached to the main body 24. Then, the cover plate portion 25 is covered on the upper side of the main body portion 24 to press the power device 200 to be tested, preventing the power device 200 to be tested from being ejected from the second accommodation groove 23. When the cover plate portion 25 is disposed on the upper side of the main body portion 24, it is in press fit with the power device 200 to be tested in the main body portion 24, so that the power device 200 to be tested can be fixed in the package 20, and the reliability of the power device 200 to be tested in the testing device 100 can be ensured.
As shown in fig. 9 and 10, the cover plate portion 25 is provided with a pressing block 251, and the pressing block 251 is provided to protrude downward and is used for pressing the power device 200 to be tested inside the main body portion 24. Specifically, when the cover plate portion 25 is covered on the main body portion 24, a pressing block 251 is disposed at a position, corresponding to the first accommodating groove 22, on the lower side of the cover plate portion 25, the pressing block 251 protrudes downwards, and can be in contact with the upper end of the power device 200 to be tested and is in extrusion fit with the power device 200 to be tested, so that the lower end of the power device 200 to be tested can be in extrusion fit with the second pin 212, the reliability of electrical connection between the power device 200 to be tested and the test pin 21 can be improved, and the stability of communication of a circuit between the test equipment and the power device 200 to be tested can be improved.
As shown in fig. 2, 8 and 9, the main body 24 is provided with a first clamping portion 241, the cover 25 is provided with a second clamping portion 252, one of the first clamping portion 241 and the second clamping portion 252 is a buckle, and the other is a clamping groove, and the buckle and the clamping groove are detachably clamped and matched. Specifically, the main body portion 24 may provide a stable and reliable setting position for the first clamping portion 241, the cover plate portion 25 may provide a stable and reliable setting position for the second clamping portion 252, and when the cover plate portion 25 is covered on the upper end of the main body portion 24, the cover plate portion 25 and the main body portion 24 are in clamping fit through the first clamping portion 241 and the second clamping portion 252, so as to implement fastening between the main body portion 24 and the cover plate portion 25. One of the first clamping portion 241 and the second clamping portion 252 is a clamping buckle, the other is a clamping groove, and the clamping buckle and the clamping groove are simple in structure and convenient to process, and are beneficial to improving production convenience of the testing device 100. The clamping fit of the buckle and the clamping groove is simple and reliable, the convenience of the clamping fit of the main body part 24 and the cover plate part 25 can be improved, and the clamping reliability of the main body part 24 and the cover plate part 25 is ensured.
Further, the buckle and the clamping groove are detachably clamped and matched, so that the main body part 24 and the cover plate part 25 can be conveniently clamped and assembled, and the main body part 24 and the cover plate part 25 can be easily disassembled, so that different power devices 200 to be tested can be repeatedly placed in the package body 20, the repeated use of the testing device 100 is facilitated, the testing efficiency of the power devices 200 can be improved, and the testing cost of the power devices 200 can be reduced.
As shown in fig. 4, 6, 7 and 8, a grip piece 242 is disposed at one side of the main body 24, and a lower end of the grip piece 242 extends to a lower end of the first receiving groove 22 and is adapted to be abutted against the power device 200 to be tested, and the grip piece 242 can be rotated toward an outer side far from the first receiving groove 22, so that the lower end of the grip piece 242 can selectively pry the power device 200 to be tested upward. Specifically, the main body 24 may provide a stable and reliable setting position for the collet piece 242, the lower end of the collet piece 242 extends to the lower end of the first accommodating groove 22, and after the power device 200 to be tested is placed in the first accommodating groove 22, the lower end of the collet piece 242 may abut against the power device 200, so that force may be transmitted between the collet piece 242 and the power device 200.
After the testing of the power device 200 is completed, the cover plate part 25 is opened, the clamping head piece 242 rotates towards the outer side far away from the first accommodating groove 22, so that the lower end of the clamping head piece 242 can pry the power device 200 upwards, the power device 200 can be taken out of the first accommodating groove 22 conveniently, the power device 200 to be tested can be replaced conveniently, the quick replacement of a test sample is realized, the testing efficiency of the power device 200 can be improved, and the batch testing of the power device 200 can be realized.
As shown in fig. 4, 6, 7 and 8, the chuck member 242 includes a handle portion 2421, a rotating portion 2422 and an abutting portion 2423, the rotating portion 2422 is rotatably disposed on one side of the main body portion 24, the abutting portion 2423 is disposed at a lower end of the rotating portion 2422 and adapted to be in abutting engagement with a lower side of the power device 200 to be tested, and the handle portion 2421 is disposed on an upper side of the rotating portion 2422. Specifically, the rotating portion 2422 of the collet piece 242 is rotatably disposed on one side of the main body 24, so that the collet piece 242 can be rotatably connected with the main body 24, so that not only can the collet piece 242 be disposed on one side of the first receiving groove 22 in the main body 24, but also the collet piece 242 can be freely rotated at a fixed position on the main body 24, so that the collet piece 242 can selectively pry up the power device 200 to be tested. The abutment portion 2423 of the collet 242 is disposed at the lower end of the rotation portion 2422, so that the abutment portion 2423 and the rotation portion 2422 can rotate together.
Further, when the abutment 2423 is in abutment engagement with the underside of the power device 200 to be tested, the power device 200 to be tested can be pried up by the rotation of the abutment 2423, so as to facilitate the removal of the power device 200. The handle portion 2421 on the chuck member 242 is disposed on the upper side of the rotating portion 2422, and the upper end of the handle portion 2421 protrudes from the upper side of the main body portion 24, and the handle portion 2421 can be used for driving the rotating portion 2422 to rotate so as to drive the abutting portion 2423 to rotate, so that the handle portion 2421 can be conveniently pushed to rotate towards the outer side far away from the first accommodating groove 22 by hand, the replacement convenience of the power device 200 to be tested can be improved, and the efficiency of replacing the test sample can be improved.
In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "circumferential", "radial", "circumferential", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings are merely for convenience in describing the present invention and simplify the description, and do not indicate or imply that the device or element being referred to must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the present invention.
In the description of the present specification, reference to the terms "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples.
While embodiments of the present invention have been shown and described, it will be understood by those of ordinary skill in the art that: many changes, modifications, substitutions and variations may be made to the embodiments without departing from the spirit and principles of the invention, the scope of which is defined by the claims and their equivalents.
Claims (10)
1. A power device testing apparatus, comprising:
a test board;
the packaging body is arranged on the test board and is internally used for setting a power device to be tested, a test pin is arranged in the packaging body, one end of the test pin is suitable for being electrically connected with the power device to be tested, and the other end of the test pin is electrically connected with the test board.
2. The device testing apparatus according to claim 1, wherein the testing pin comprises a first pin and a second pin, the first pin is vertically extended and arranged, the lower end of the first pin is electrically connected with the testing board, one end of the second pin is flexibly connected with the upper end of the first pin, and the other end of the second pin is suitable for being pressed downwards by the power device to be tested and is electrically connected with the power device to be tested.
3. The power device testing apparatus according to claim 2, wherein a first accommodation groove and a second accommodation groove are provided inside the package body, the second accommodation groove is provided on one side of the first accommodation groove and is in communication with the first accommodation groove, the first accommodation groove is used for providing a power device to be tested, the first pin is provided in the second accommodation groove, and the second pin at least partially extends into the first accommodation groove.
4. The apparatus according to claim 3, wherein the upper and lower sides of the second receiving groove are opened, the lower end of the first pin passes through the lower side of the second receiving groove and is electrically connected with the test board, and the second pin protrudes from the upper side of the second receiving groove into the first receiving groove.
5. The apparatus of claim 3, wherein the plurality of test pins and the plurality of second receiving grooves are in one-to-one correspondence with each other.
6. The power device testing apparatus according to claim 3, wherein the package body includes a main body portion in which the first accommodation groove and the second accommodation groove are provided, and a cover plate portion that covers an upper side of the main body portion and is adapted to press-fit with the power device to be tested inside the main body portion.
7. The power device testing apparatus according to claim 6, wherein a pressing block is provided on the cover plate portion, the pressing block being provided to protrude downward and being used for pressing the power device to be tested inside the main body portion.
8. The device for testing a power device according to claim 6, wherein a first clamping portion is provided on the main body portion, a second clamping portion is provided on the cover plate portion, one of the first clamping portion and the second clamping portion is a buckle, and the other is a clamping groove, and the buckle and the clamping groove are detachably clamped and matched.
9. The power device testing apparatus according to claim 6, wherein a grip member is provided at one side of the main body portion, a lower end of the grip member extends to a lower end of the first receiving groove and is adapted to abut against a power device to be tested, and the grip member is rotatable toward an outer side away from the first receiving groove, so that the lower end of the grip member selectively pries the power device to be tested upward.
10. The power device testing apparatus according to claim 9, wherein the grip member includes a handle portion, a rotating portion and an abutting portion, the rotating portion is rotatably provided at one side of the main body portion, the abutting portion is provided at a lower end of the rotating portion and adapted to be in abutting engagement with a lower side of the power device to be tested, and the handle portion is provided at an upper side of the rotating portion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311284509.9A CN117434412A (en) | 2023-09-28 | 2023-09-28 | Testing device for power device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311284509.9A CN117434412A (en) | 2023-09-28 | 2023-09-28 | Testing device for power device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN117434412A true CN117434412A (en) | 2024-01-23 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202311284509.9A Pending CN117434412A (en) | 2023-09-28 | 2023-09-28 | Testing device for power device |
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| CN (1) | CN117434412A (en) |
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| CN111579956A (en) * | 2020-04-08 | 2020-08-25 | 上海精密计量测试研究所 | Adjustable surface-mounted packaged semiconductor device clamp and testing method |
| CN212031537U (en) * | 2020-02-19 | 2020-11-27 | 珠海格力电器股份有限公司 | Chip test pin switching mechanism and chip test device |
| CN217787175U (en) * | 2022-06-28 | 2022-11-11 | 张家港意发功率半导体有限公司 | Patch type GaN power device test keysets |
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2023
- 2023-09-28 CN CN202311284509.9A patent/CN117434412A/en active Pending
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| CN101604000A (en) * | 2008-06-09 | 2009-12-16 | 富士通微电子株式会社 | The proving installation of electronic unit is with the method for testing of parts and this electronic unit |
| CN201340434Y (en) * | 2009-01-22 | 2009-11-04 | 无锡天和电子有限公司 | Test jig used in mounting type packaged semiconductor power device |
| CN204154753U (en) * | 2014-09-17 | 2015-02-11 | 常熟实盈光学科技有限公司 | A kind of novel encapsulated chip testing jig |
| CN104316859A (en) * | 2014-11-06 | 2015-01-28 | 山东华芯半导体有限公司 | Chip testing equipment with high universality |
| CN209486246U (en) * | 2019-01-18 | 2019-10-11 | 乐山无线电股份有限公司 | A kind of testing piece and test device for SMD power device |
| CN212031537U (en) * | 2020-02-19 | 2020-11-27 | 珠海格力电器股份有限公司 | Chip test pin switching mechanism and chip test device |
| CN111579956A (en) * | 2020-04-08 | 2020-08-25 | 上海精密计量测试研究所 | Adjustable surface-mounted packaged semiconductor device clamp and testing method |
| CN217787175U (en) * | 2022-06-28 | 2022-11-11 | 张家港意发功率半导体有限公司 | Patch type GaN power device test keysets |
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