CN117318847B - Frequency shifting device testing method, system, device and medium - Google Patents
Frequency shifting device testing method, system, device and medium Download PDFInfo
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/10—Monitoring; Testing of transmitters
- H04B17/15—Performance testing
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/20—Monitoring; Testing of receivers
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Abstract
The invention discloses a frequency shift device testing method, a system, a device and a medium, and relates to the technical field of device testing, wherein the method comprises the following steps: determining a testing parameter and a range corresponding to the testing parameter based on a testing item of the equipment to be tested; performing out-of-standard analysis on the signal processed by the equipment to be tested to obtain an analysis result; and judging whether the equipment to be tested is abnormal or not based on the analysis result and the range corresponding to the test parameter. According to the invention, a more accurate judgment basis can be provided for the follow-up by presetting the range corresponding to the test parameter, and in addition, the test item of the equipment to be tested is preset, so that the test can be performed in a targeted manner on one hand, and the test universality is improved on the other hand.
Description
Technical Field
The present invention relates to the field of device testing technologies, and in particular, to a method, a system, a device, and a medium for testing a frequency shift device.
Background
The hardware engineer tests one by one using the instrument individual modules. In the existing test process, the test is tedious, time-consuming and labor-consuming, non-intuitive, difficult to record and analyze data and other problems, so that the test process has no wide applicability.
Disclosure of Invention
Aiming at the defects of the prior art, the invention particularly aims at the problems of complex test, time and labor waste and the like, and particularly provides a frequency shifting device test method, a system, a device and a medium, which are as follows:
1) In a first aspect, the present invention provides a method for testing a frequency shift device, which specifically includes the following technical solutions:
S1, determining test parameters and a range corresponding to the test parameters based on test items of equipment to be tested;
s2, performing out-of-standard analysis on the signal processed by the equipment to be tested to obtain an analysis result;
and S3, judging whether the equipment to be tested is abnormal or not based on the analysis result and the range corresponding to the test parameter.
The frequency shifting device testing method provided by the invention has the beneficial effects that:
In addition, the testing items of the equipment to be tested are determined in advance, so that the testing can be performed in a targeted mode on the one hand, and the testing universality is improved on the other hand.
On the basis of the scheme, the invention can be improved as follows.
Further, the test parameters include: noise, spurs, flatness, and gain.
Further, the method further comprises the following steps:
s4, acquiring the power of the signal processed by the equipment to be tested, calculating a correction value through the power, and correcting the equipment to be tested based on the correction value.
Further, the S1 further includes:
And searching a test flow corresponding to the test item in a preset mapping table based on the test item of the equipment to be tested, and executing S2 to S3 based on the test flow.
2) In a second aspect, the present invention further provides a frequency shift device testing system, which has the following specific technical scheme:
the determining module is used for: determining a testing parameter and a range corresponding to the testing parameter based on a testing item of the equipment to be tested;
The analysis module is used for: performing out-of-standard analysis on the signal processed by the equipment to be tested to obtain an analysis result;
The judging module is used for: and judging whether the equipment to be tested is abnormal or not based on the analysis result and the range corresponding to the test parameter.
On the basis of the scheme, the invention can be improved as follows.
Further, the test parameters include: noise, spurs, flatness, and gain.
Further, the method further comprises the following steps:
the correction module is used for: and acquiring the power of the signal processed by the equipment to be tested, calculating a correction value through the power, and correcting the equipment to be tested based on the correction value.
Further, the determining module is further configured to:
And searching a test flow corresponding to the test item in a preset mapping table based on the test item of the equipment to be tested, and performing test processing according to the test flow through the analysis module and the judgment module.
3) In a third aspect, the present invention also provides a computer device comprising a processor coupled to a memory, the memory having stored therein at least one computer program, the at least one computer program being loaded and executed by the processor to cause the computer device to implement any of the methods described above.
4) In a fourth aspect, the present invention also provides a computer readable storage medium having stored therein at least one computer program, the at least one computer program being loaded and executed by a processor to cause a computer to carry out any of the methods described above.
It should be noted that, the technical solutions of the second aspect to the fourth aspect and the corresponding possible implementation manners of the present invention may refer to the technical effects of the first aspect and the corresponding possible implementation manners of the first aspect, which are not described herein.
Drawings
Other features, objects and advantages of the present invention will become more apparent upon reading of the detailed description of non-limiting embodiments, made with reference to the following drawings in which:
fig. 1 is a flow chart of a frequency shift device testing method according to an embodiment of the present invention;
FIG. 2 is a structural frame diagram of a frequency shifting device testing system according to an embodiment of the present invention;
Fig. 3 is a schematic diagram of a computer device structure of a frequency shift device testing method according to an embodiment of the present invention.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the present invention more apparent, the embodiments of the present invention will be described in further detail with reference to the accompanying drawings.
As shown in fig. 1, a frequency shift device testing method according to an embodiment of the present invention includes the following steps:
S1, determining test parameters and a range corresponding to the test parameters based on test items of equipment to be tested;
s2, performing out-of-standard analysis on the signal processed by the equipment to be tested to obtain an analysis result;
and S3, judging whether the equipment to be tested is abnormal or not based on the analysis result and the range corresponding to the test parameter.
The frequency shifting device testing method provided by the invention has the beneficial effects that:
In addition, the testing items of the equipment to be tested are determined in advance, so that the testing can be performed in a targeted mode on the one hand, and the testing universality is improved on the other hand.
S1, determining test parameters and a range corresponding to the test parameters based on test items of equipment to be tested, wherein the specific process comprises the following steps:
Devices under test include, but are not limited to: the test items are different according to the different devices to be tested, and when the devices to be tested are near-end machines, the test items can be: synchronous test or FSK module test;
The FSK module is Frequency-SHIFT KEYING Frequency shift keying, namely, the Frequency of a carrier wave is modulated by a digital signal;
the test items are composed of different test parameters, for example, when the test items are synchronous test items, the test parameters comprise information source sending frequency, power, threshold value and the like;
When the test item is an FSK module test, the test parameters comprise a frequency point, a bandwidth, an amplitude and a threshold value of the FSK module of the spectrum analyzer;
the range corresponding to the test parameters is generated according to different test items, and meanwhile, the attribute of the equipment to be tested needs to be considered, and the range can be manually adjusted;
For example: when the test item is the maximum downlink gain, the corresponding test parameters include transmission power, line loss, compensation value and the like, and the corresponding range of the test parameter power is-10 dBm to 20dBm: the range corresponding to the test parameter threshold is: -22dB to-14 dB.
In another embodiment, the scheme searches a preset mapping table for a test flow corresponding to a test item based on the test item of the device to be tested;
The preset mapping table is a mapping table which is built in advance and corresponds to different test items and test flows;
searching a preset mapping table correspondingly for a test flow corresponding to the name or the special mark according to the name or the special mark of the test item;
for example: when the test item is the uplink flatness, searching the uplink flatness of the test flow corresponding to the uplink flatness in a preset mapping table according to the name flatness of the test item;
The test flow may be:
The uplink flatness test flow is as follows: at the center frequency point, the frequency of the signal is: in the vicinity of 2595M, 5 frequency points are selected. The information source sends the 5 frequency points and specific power, the signals pass through the equipment to the frequency spectrograph, the power obtained by the 5 frequency points of the frequency spectrograph is read out, the flatness value is calculated through a specific algorithm, and then the flatness value is compared with a preset threshold value.
S2, performing out-of-standard analysis on the signal processed by the equipment to be tested, wherein the specific process for obtaining the analysis result is as follows:
S21, connecting a test instrument with the equipment to be tested and connecting the test instrument with a test program;
The test program is a program which is called in the program pool according to the test items and is used for executing test instructions corresponding to the test items;
The test instrument is an instrument for transmitting a signal source and can be a spectrometer;
The program pool integrates the testing flows of various devices, including the testing flows of the near-end machine, the far-end machine and the devices of various manufacturer models, and the program pool can update the testing flows periodically.
Remote machine (Remote Radio Unit, abbreviated as RRU): is usually placed at a high altitude or far away from a base station central processing unit (Centralized Processing Unit, CPU for short) to shorten the transmission distance, reduce the transmission loss and improve the system performance.
Near-end machine (Base Band Unit, abbreviated as BBU): the Central Processing Unit (CPU) in the base station is mainly responsible for the tasks of data receiving, demodulating, encoding, modulating, transmitting and the like, has the function of realizing software defined radio (Software Defined Radio, SDR for short) and ensures that the wireless communication has higher flexibility and expandability.
S22, different signals are sent to the equipment to be tested through the signal source according to the test flow and the test parameters, the equipment to be tested arrives at the test instrument after passing through the equipment to be tested, and the received signals are analyzed through the test instrument to obtain an analysis result;
analysis includes, but is not limited to:
For example: when the equipment to be tested is a remote terminal and the test flow is phase noise test, when the test parameter is-50 dB, the transmitting frequency and the power of the signal source are adjusted according to the content, a-10 dBm signal is sent to the equipment to be tested, after the equipment to be tested receives the signal, noise reduction processing is carried out on the signal to obtain a-80 dB result, the result is sent to a test instrument, and the test instrument compares the result with a threshold value to obtain a result meeting the phase noise requirement.
S3, based on the analysis result and the range corresponding to the test parameter, judging whether the equipment to be tested has abnormality or not specifically comprises the following steps:
and determining data in the analysis result, and judging whether the device to be tested is abnormal according to whether the data is in a range corresponding to the test parameters.
In another embodiment, the scheme can also perform the environment self-test of line loss and gain, and can realize the purpose of detecting the test environment by one key, and the specific process is as follows:
before each detection of the environment, the test equipment is replaced by standard equipment with measured parameters, and then the parameters of other equipment, such as line loss, can be deduced.
In another embodiment of the present solution, the present solution may further automatically correct a device to be tested having an abnormality, where the specific process is:
And reading the power of each signal through the test instrument, calculating to obtain a correction value, correcting the device to be tested based on the correction value, reading the power of the signal transmitted to the test instrument after correction again, judging whether the signal corresponding to the power is in a range corresponding to the test parameter, if so, not further adjusting, and if not, calculating the correction value again, and repeating the process.
The method for calculating the correction value comprises the following steps:
Step1, a reference power P10 is sent on a central frequency point, and power P11 is obtained in a spectrometer through equipment;
Obtaining a difference value Px=P11-P10;
Step 2, if the second time is expected to obtain P2, the transmission power is p20=px-P2, and the actual power P21 is obtained;
Comparing the difference value of P21 and P2, and reading the Ad (sampling) value of the device in a certain range;
And step 3, repeating the step2 for a plurality of times, reading a group of sampling values, and calculating a correction value through a formula algorithm (each product is slightly different).
The process of correcting the equipment to be detected through the correction value comprises the following steps:
Setting the correction value obtained in the above steps to the device, and then performing power tracking to verify the correction effect.
The power tracking is roughly as follows: transmittingA set of power data is read and compared with a threshold value, and the effect of the correction value is expected within a certain range.
In another embodiment of the scheme, the test result is uploaded to a database server, and the data can be analyzed by using the sql language or downloaded into an excel form for data analysis;
analysis refers to: analyzing the test result of a batch of products, and obtaining the test condition of the batch of products by counting the test data; the test cases include: failure rate or success rate.
For example, a test item of a certain frequency shift device is tested to obtain a failure rate, and a failure cause is deduced based on the failure rate.
In another embodiment of the scheme, errors in the test flow are uploaded to the factory mes system, so that maintenance, retest, scheduling, statistics and the like are facilitated.
The error occurring in the test flow is not particularly limited, and may be: network port test failure, synchronization test failure, FSK module test failure, attenuation excessive test failure or phase noise excessive test failure, etc.
Further, the test parameters include: noise, spurs, flatness, and gain.
Further, the method further comprises the following steps:
s4, acquiring the power of the signal processed by the equipment to be tested, calculating a correction value through the power, and correcting the equipment to be tested based on the correction value.
Further, the S1 further includes:
And searching a test flow corresponding to the test item in a preset mapping table based on the test item of the equipment to be tested, and executing S2 to S3 based on the test flow.
As shown in fig. 2, the present invention further provides a frequency shift device testing system 200, which has the following specific technical scheme:
The determining module 210 is configured to: determining a testing parameter and a range corresponding to the testing parameter based on a testing item of the equipment to be tested;
The analysis module 220 is configured to: performing out-of-standard analysis on the signal processed by the equipment to be tested to obtain an analysis result;
The judging module 230 is configured to: and judging whether the equipment to be tested is abnormal or not based on the analysis result and the range corresponding to the test parameter.
Further, the test parameters include: noise, spurs, flatness, and gain.
Further, the method further comprises the following steps:
the correction module is used for: and acquiring the power of the signal processed by the equipment to be tested, calculating a correction value through the power, and correcting the equipment to be tested based on the correction value.
Further, the determining module is further configured to:
And searching a test flow corresponding to the test item in a preset mapping table based on the test item of the equipment to be tested, and performing test processing according to the test flow through the analysis module and the judgment module.
In the above embodiments, although steps S1, S2, etc. are numbered, only specific embodiments of the present invention are given, and those skilled in the art may adjust the execution sequence of S1, S2, etc. according to the actual situation, which is also within the scope of the present invention, and it is understood that some embodiments may include some or all of the above embodiments.
It should be noted that, the beneficial effects of the frequency shifting device testing system 200 provided in the above embodiment are the same as those of the above frequency shifting device testing method, and are not described herein again. In addition, when the system provided in the above embodiment implements the functions thereof, only the division of the above functional modules is used as an example, in practical application, the above functional allocation may be implemented by different functional modules according to needs, that is, the system is divided into different functional modules according to practical situations, so as to implement all or part of the functions described above. In addition, the system and method embodiments provided in the foregoing embodiments belong to the same concept, and specific implementation processes thereof are detailed in the method embodiments and are not described herein again.
As shown in fig. 3, in a computer device 300 according to an embodiment of the present invention, the computer device 300 includes a processor 320, where the processor 320 is coupled to a memory 310, and at least one computer program 330 is stored in the memory 310, and the at least one computer program 330 is loaded and executed by the processor 320, so that the computer device 300 implements any of the frequency shift device testing methods described above, specifically:
The computer device 300 may include one or more processors 320 (Central Processing Units, CPU) and one or more memories 310, where the one or more memories 310 store at least one computer program 330, and the at least one computer program 330 is loaded and executed by the one or more processors 320, so that the computer device 300 implements a frequency shift device testing method provided in the above embodiment. Of course, the computer device 300 may also have a wired or wireless network interface, a keyboard, an input/output interface, and other components for implementing the functions of the device, which are not described herein.
A computer-readable storage medium according to an embodiment of the present invention stores at least one computer program therein, and the at least one computer program is loaded and executed by a processor to cause a computer to implement any one of the methods described above.
Alternatively, the computer readable storage medium may be a Read-Only Memory (ROM), a random access Memory (Random Access Memory, RAM), a compact disc Read-Only Memory (CD-ROM), a magnetic tape, a floppy disk, an optical data storage device, and the like.
In an exemplary embodiment, a computer program product or a computer program is also provided, the computer program product or computer program comprising computer instructions stored in a computer readable storage medium. The processor of the computer device reads the computer instructions from the computer-readable storage medium and executes the computer instructions to cause the computer device to perform any of the frequency shifting device testing methods described above.
It should be noted that the terms "first," "second," and the like in the description and in the claims are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. The order of use of similar objects may be interchanged where appropriate such that embodiments of the application described herein may be implemented in other sequences than those illustrated or otherwise described.
Those skilled in the art will appreciate that the present invention may be embodied as a system, method or computer program product, and that the disclosure may therefore be embodied in the form of: either entirely hardware, entirely software (including firmware, resident software, micro-code, etc.), or entirely software, or a combination of hardware and software, referred to herein generally as a "circuit," module "or" system. Furthermore, in some embodiments, the invention may also be embodied in the form of a computer program product in one or more computer-readable media, which contain computer-readable program code.
Any combination of one or more computer readable media may be employed. The computer readable medium may be a computer readable signal medium or a computer readable storage medium. The computer readable storage medium can be, for example, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples (a non-exhaustive list) of the computer-readable storage medium would include the following: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In this document, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.
While embodiments of the present invention have been shown and described above, it will be understood that the above embodiments are illustrative and not to be construed as limiting the invention, and that variations, modifications, alternatives and variations may be made to the above embodiments by one of ordinary skill in the art within the scope of the invention.
Claims (10)
1. A method for testing frequency shifting equipment, comprising:
S1, determining test parameters and a range corresponding to the test parameters based on test items of equipment to be tested;
s2, performing out-of-standard analysis on the signal processed by the equipment to be tested to obtain an analysis result;
S3, judging whether the equipment to be tested is abnormal or not based on the analysis result and the range corresponding to the test parameter;
s2, performing out-of-standard analysis on the signal processed by the equipment to be tested, wherein the obtained analysis result specifically comprises the following steps:
s21, connecting a test instrument with the equipment to be tested and connecting the test instrument with a test program;
S22, different signals are sent to the equipment to be tested through the signal source according to the test flow and the test parameters, the equipment to be tested arrives at the test instrument after passing through the equipment to be tested, and the received signals are analyzed through the test instrument to obtain an analysis result;
Analyzing the received signal includes: when the equipment to be tested is a remote terminal and the test flow is phase noise test, when the test parameter is-50 dB, the transmitting frequency and power of the signal source are adjusted, a-10 dBm signal is sent to the equipment to be tested, after the equipment to be tested receives the signal, noise reduction processing is carried out on the signal to obtain a-80 dB result, the result is sent to a test instrument, and the test instrument compares the result with a threshold value to obtain a result meeting the requirement of phase noise.
2. The method for testing a frequency shifting device according to claim 1, wherein the test parameters include: noise, spurs, flatness, and gain.
3. The method for testing a frequency shifting device according to claim 1, further comprising:
s4, acquiring the power of the signal processed by the equipment to be tested, calculating a correction value through the power, and correcting the equipment to be tested based on the correction value.
4. The method for testing a frequency shifting device according to claim 1, wherein S1 further comprises:
And searching a test flow corresponding to the test item in a preset mapping table based on the test item of the equipment to be tested, and executing S2 to S3 based on the test flow.
5. A frequency shifting device testing system, comprising:
the determining module is used for: determining a testing parameter and a range corresponding to the testing parameter based on a testing item of the equipment to be tested;
The analysis module is used for: performing out-of-standard analysis on the signal processed by the equipment to be tested to obtain an analysis result;
The judging module is used for: judging whether the equipment to be tested is abnormal or not based on the analysis result and the range corresponding to the test parameter;
Performing out-of-standard analysis on the signal processed by the equipment to be tested to obtain an analysis result specifically comprising:
Connecting a test instrument with the equipment to be tested and connecting the test instrument with a test program;
Different signals are sent to the equipment to be tested through the signal source according to the test flow and the test parameters, the signals reach the test instrument after passing through the equipment to be tested, and the received signals are analyzed through the test instrument to obtain an analysis result;
Analyzing the received signal includes: when the equipment to be tested is a remote terminal and the test flow is phase noise test, when the test parameter is-50 dB, the transmitting frequency and power of the signal source are adjusted, a-10 dBm signal is sent to the equipment to be tested, after the equipment to be tested receives the signal, noise reduction processing is carried out on the signal to obtain a-80 dB result, the result is sent to a test instrument, and the test instrument compares the result with a threshold value to obtain a result meeting the requirement of phase noise.
6. The frequency shifting device testing system of claim 5, wherein the test parameters comprise: noise, spurs, flatness, and gain.
7. The frequency shifting device testing system of claim 5, further comprising:
the correction module is used for: and acquiring the power of the signal processed by the equipment to be tested, calculating a correction value through the power, and correcting the equipment to be tested based on the correction value.
8. The frequency shifting device testing system of claim 5, wherein the determining module is further configured to:
And searching a test flow corresponding to the test item in a preset mapping table based on the test item of the equipment to be tested, and performing test processing according to the test flow through the analysis module and the judgment module.
9. A computer device, characterized in that it comprises a processor coupled to a memory, in which at least one computer program is stored, which is loaded and executed by the processor, in order to make it implement a frequency-shift device testing method according to any of claims 1 to 4.
10. A computer readable storage medium, wherein at least one computer program is stored in the computer readable storage medium, and the at least one computer program is loaded and executed by a processor, so that a computer implements a frequency shift device testing method according to any one of claims 1 to 4.
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Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1805313A (en) * | 2005-11-21 | 2006-07-19 | 海信集团有限公司 | Quick parallel radio frequency test system and test method for mobile terminals |
| CN103744010A (en) * | 2013-12-26 | 2014-04-23 | 中国电子科技集团公司第三十六研究所 | An automatic testing system and an automatic testing method of a continuous wave radio frequency power amplifier |
| CN110398638A (en) * | 2019-07-26 | 2019-11-01 | 成都天锐星通科技有限公司 | A kind of phased array antenna test method and phased array antenna test macro |
| CN111257629A (en) * | 2020-05-06 | 2020-06-09 | 南京笛儒新能源技术服务有限公司 | Portable new energy station power characteristic detection method, device and system |
| CN111563042A (en) * | 2020-05-09 | 2020-08-21 | 中国科学院微电子研究所 | Wireless performance test system and method applied to Wi-Fi5 chip |
| CN114489017A (en) * | 2022-01-28 | 2022-05-13 | 联合汽车电子（重庆）有限公司 | Universal multichannel ECU environment durability test system |
| KR20220133026A (en) * | 2021-03-24 | 2022-10-04 | 성균관대학교산학협력단 | A portable diagnostic device and method thereby |
| CN116008704A (en) * | 2023-01-03 | 2023-04-25 | 广州市德珑电子器件有限公司 | Safety regulation testing equipment and method for EMI power filter |
| CN116302959A (en) * | 2023-01-13 | 2023-06-23 | 荃豆数字科技有限公司 | Defect analysis method and device for test item and storage medium |
| CN116760485A (en) * | 2023-08-16 | 2023-09-15 | 北京华清瑞达科技有限公司 | Array antenna system radio frequency index test method and system |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103186439A (en) * | 2011-12-27 | 2013-07-03 | 鸿富锦精密工业（深圳）有限公司 | Server test system and server stability test method |
-
2023
- 2023-09-27 CN CN202311260936.3A patent/CN117318847B/en active Active
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1805313A (en) * | 2005-11-21 | 2006-07-19 | 海信集团有限公司 | Quick parallel radio frequency test system and test method for mobile terminals |
| CN103744010A (en) * | 2013-12-26 | 2014-04-23 | 中国电子科技集团公司第三十六研究所 | An automatic testing system and an automatic testing method of a continuous wave radio frequency power amplifier |
| CN110398638A (en) * | 2019-07-26 | 2019-11-01 | 成都天锐星通科技有限公司 | A kind of phased array antenna test method and phased array antenna test macro |
| CN111257629A (en) * | 2020-05-06 | 2020-06-09 | 南京笛儒新能源技术服务有限公司 | Portable new energy station power characteristic detection method, device and system |
| CN111563042A (en) * | 2020-05-09 | 2020-08-21 | 中国科学院微电子研究所 | Wireless performance test system and method applied to Wi-Fi5 chip |
| KR20220133026A (en) * | 2021-03-24 | 2022-10-04 | 성균관대학교산학협력단 | A portable diagnostic device and method thereby |
| CN114489017A (en) * | 2022-01-28 | 2022-05-13 | 联合汽车电子（重庆）有限公司 | Universal multichannel ECU environment durability test system |
| CN116008704A (en) * | 2023-01-03 | 2023-04-25 | 广州市德珑电子器件有限公司 | Safety regulation testing equipment and method for EMI power filter |
| CN116302959A (en) * | 2023-01-13 | 2023-06-23 | 荃豆数字科技有限公司 | Defect analysis method and device for test item and storage medium |
| CN116760485A (en) * | 2023-08-16 | 2023-09-15 | 北京华清瑞达科技有限公司 | Array antenna system radio frequency index test method and system |
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