CN116302959A - Defect analysis method and device for test item and storage medium - Google Patents

Defect analysis method and device for test item and storage medium Download PDF

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Publication number
CN116302959A
CN116302959A CN202310078361.7A CN202310078361A CN116302959A CN 116302959 A CN116302959 A CN 116302959A CN 202310078361 A CN202310078361 A CN 202310078361A CN 116302959 A CN116302959 A CN 116302959A
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test
defect
item
type
tested
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张兴格
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Quandou Digital Technology Co ltd
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Quandou Digital Technology Co ltd
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Priority to CN202310078361.7A priority Critical patent/CN116302959A/en
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3668—Software testing
    • G06F11/3672—Test management
    • G06F11/3684—Test management for test design, e.g. generating new test cases
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3668—Software testing
    • G06F11/3672—Test management
    • G06F11/3688—Test management for test execution, e.g. scheduling of test suites
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30—Computing systems specially adapted for manufacturing

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The invention discloses a defect analysis method and device for a test item and a storage medium, and relates to the technical field of item testing. The defect analysis method of the test item comprises the following steps: constructing a test requirement of a project to be tested; determining a test case corresponding to the test requirement based on a pre-established mapping relation table; determining at least one first defect type corresponding to the test case based on the mapping relation table, and sending the at least one first defect type to the test terminal so that a tester at the test terminal can test the item to be tested; the mapping relation table records mapping relations among different test cases, test requirements and defect types. The defect analysis method, the defect analysis device and the storage medium for the test item can determine the possible defect types of the test item, so that guidance is provided for the test of the tester, and the tester can test the possible defect types in a targeted manner.

Description

Defect analysis method and device for test item and storage medium
Technical Field
The invention belongs to the technical field of project testing, and particularly relates to a defect analysis method and device for a test project and a storage medium.
Background
Compared with the traditional software test, the agile test emphasizes continuous improvement, and is continuously adjusted and designed according to the actual condition of the project or the change of the user demand, so that continuous feedback on the test quality is more needed in the test process, and the problems in the test can be found timely through the test process and the result evaluation test work.
At present, most of tests on items to be tested are carried out according to personal experience of testers, and defects of the items to be tested are tested, so that the tests are carried out slowly due to lack of standard test management tools, and smooth progress of the items is not facilitated.
Therefore, how to provide an effective solution to test items to be tested by a tester has become a problem to be solved in the prior art.
Disclosure of Invention
The present invention is directed to a method, an apparatus and a storage medium for analyzing defects of a test item, which are used for solving the above problems in the prior art.
In order to achieve the above purpose, the present invention adopts the following technical scheme:
in a first aspect, the present invention provides a defect analysis method for a test item, including:
constructing a test requirement of a project to be tested, wherein the test requirement records functions to be tested;
determining a test case corresponding to the test requirement based on a pre-established mapping relation table;
determining at least one first defect type corresponding to the test case based on the mapping relation table, and sending the at least one first defect type to a test terminal so that a tester at the test terminal can test the item to be tested;
the mapping relation table records mapping relations among different test cases, test requirements and defect types.
In one possible design, the method further comprises:
and sending a defect prediction generation reason and a defect reference solution corresponding to each defect type in the at least one first defect type to the test end.
In one possible design, after the at least one first defect type is sent to the test end, the method further includes:
receiving at least one second defect type which is sent by the testing end and is determined after the test is carried out on the item to be tested;
if a third defect type which does not match the defect type in the at least one first defect type exists in the at least one second defect type, adding the third defect type into the mapping relation table, and associating the third defect type with the test requirement to update the mapping relation table.
In one possible design, the method further comprises:
and counting quality measurement data for carrying out defect analysis on different types of test items according to the defect types determined by the historical test items of each type and the defect types determined by the test terminal after testing the historical test items of each type, wherein the quality measurement data comprises defect false alarm rate and/or defect missing rate.
In one possible design, the method further comprises:
and visually displaying the quality measurement data.
In one possible design, the functions that need to be tested include whether login access is normal, whether the function of the input box is normal, and/or whether the search function is normal.
In a second aspect, the present invention provides a defect analysis device for a test item, including:
the construction unit is used for constructing the test requirement of the item to be tested, and the function to be tested is recorded in the test requirement;
the determining unit is used for determining the test case corresponding to the test requirement based on a pre-established mapping relation table; and
determining at least one first defect type corresponding to the test case based on the mapping relation table, and sending the at least one first defect type to a test terminal so that a tester at the test terminal can test the item to be tested;
the mapping relation table records mapping relations among different test cases, test requirements and defect types.
In one possible design, the defect analysis device of the test item further includes:
and the sending unit is used for sending the defect prediction generation reason and the defect reference solution corresponding to each defect type in the at least one first defect type to the testing end.
In one possible design, the defect analysis device of the test item further includes:
the receiving unit is used for receiving at least one second defect type which is sent by the testing end and is determined after the testing is carried out on the item to be tested after the at least one first defect type is sent to the testing end;
a judging unit configured to judge whether a third defect type that does not match a defect type in the at least one first defect type exists in the at least one second defect type;
an adding association unit, configured to, if a third defect type that does not match the defect type in the at least one first defect type exists in the at least one second defect type, add the third defect type to the mapping table, and associate the third defect type with the test requirement to update the mapping table.
In one possible design, the defect analysis device of the test item further includes:
the statistics unit is used for counting quality measurement data for carrying out defect analysis on different types of test items according to the defect types determined by the historical test items of each type and the defect types determined by the test terminal after the test is carried out on the historical test items of each type, wherein the quality measurement data comprises defect false alarm rate and/or defect missing rate.
In one possible design, the defect analysis device of the test item further includes:
and the display unit is used for visually displaying the quality measurement data.
In one possible design, the functions that need to be tested include whether login access is normal, whether the function of the input box is normal, and/or whether the search function is normal.
In a third aspect, the present invention provides a defect analysis device for a test item, comprising a memory, a processor and a transceiver, which are communicatively connected in sequence, wherein the memory is configured to store a computer program, the transceiver is configured to send and receive messages, and the processor is configured to read the computer program and perform the defect analysis method for the test item according to the first aspect.
In a fourth aspect, the present invention provides a computer readable storage medium having instructions stored thereon which, when executed on a computer, perform the method of defect analysis of a test item according to the first aspect.
In a fifth aspect, the present invention provides a computer program product comprising instructions which, when run on a computer, cause the computer to perform the method of defect analysis of a test item according to the first aspect.
The beneficial effects are that:
according to the defect analysis scheme of the test item, the test requirement of the test item to be tested is built; determining a test case corresponding to the test requirement based on a pre-established mapping relation table; determining at least one first defect type corresponding to the test case based on the mapping relation table, and sending the at least one first defect type to the test terminal so that a tester at the test terminal can test the item to be tested; the mapping relation table records mapping relations among different test cases, test requirements and defect types. Therefore, the possible defect types of the test items can be determined according to the mapping relations among different test cases, test requirements and defect types recorded in the jet relation table, so that guidance is provided for testing by testers, the testers can test the possible defect types in a targeted manner, the test efficiency and the test quality are improved, the smooth progress of the items is ensured, and the practical application and popularization are facilitated.
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FIG. 1 is a flow chart of a method for analyzing defects of a test item according to an embodiment of the present application;
FIG. 2 is a schematic structural diagram of a defect analysis device for test items according to an embodiment of the present disclosure;
fig. 3 is a schematic structural diagram of a defect analysis device according to another test item according to an embodiment of the present application.
Detailed Description
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the present invention will be briefly described below with reference to the accompanying drawings and the description of the embodiments or the prior art, and it is obvious that the following description of the structure of the drawings is only some embodiments of the present invention, and other drawings can be obtained according to these drawings without inventive effort to a person skilled in the art. It should be noted that the description of these examples is for aiding in understanding the present invention, but is not intended to limit the present invention.
It will be understood that, although the terms first, second, etc. may be used herein to describe various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element from another element. For example, a first element could be termed a second element, and, similarly, a second element could be termed a first element, without departing from the scope of example embodiments of the present invention.
It should be understood that for the term "and/or" that may appear herein, it is merely one association relationship that describes an associated object, meaning that there may be three relationships, e.g., a and/or B, may represent: a alone, B alone, and both a and B; for the term "/and" that may appear herein, which is descriptive of another associative object relationship, it means that there may be two relationships, e.g., a/and B, it may be expressed that: a alone, a alone and B alone; in addition, for the character "/" that may appear herein, it is generally indicated that the context associated object is an "or" relationship.
In order to facilitate a tester to test a project to be tested, the embodiment of the application provides a defect analysis method, a defect analysis device and a storage medium of the test project.
The defect analysis method for the test item provided in the application embodiment can be applied to a user terminal, wherein a test management tool is integrated on the user terminal, and the user terminal can be, but is not limited to, a personal computer, a smart phone, a tablet computer, a laptop portable computer, a personal digital assistant (personal digital assistant, PDA) and the like.
It is understood that the execution bodies do not constitute limitations on the embodiments of the present application.
The defect analysis method of the test item provided in the embodiment of the present application will be described in detail below.
As shown in fig. 1, the first aspect of the present embodiment provides a defect analysis method of a test item, which may include, but is not limited to, the following steps S101-S102.
S101, constructing test requirements of the items to be tested.
The defect analysis method for the test item provided by the embodiment of the application can be used for analyzing possible defects of the test item, in particular to analyzing possible defects of the test item in the agile test process.
In the embodiment of the application, when the item to be tested needs to be tested, corresponding test requirements can be built according to different items.
The test requirement records the function to be tested, which may include, but is not limited to, whether login access is normal, whether the function of the input box is normal, whether the search function is normal, and/or the like.
S102, determining a test case corresponding to the test requirement based on a pre-established mapping relation table.
In the embodiment of the application, a mapping relation table is pre-established, and mapping relations among different test cases, test requirements and defect types are recorded in the mapping relation table. Different test cases can be developed according to different test requirements, and corresponding defect types can be generated according to the different test cases in the process of testing through the test cases. Therefore, in the embodiment of the application, the test requirements corresponding to different test cases can be associated by establishing the mapping relation table, and the defect types possibly corresponding to the test cases in the test process can be associated.
In this embodiment of the present application, a mapping relationship table may be established according to a history test record, for example, in the history test record, for test requirements A1 and A2 of a test item, test is performed by a test case B1, and defect types corresponding to defects found in the test item during the test process performed on the test item by the test case B1 are respectively provided with defect types C1 and C2. Then test case B1 may be associated with test requirements A1 and A2, respectively, in a mapping table while test case B1 is associated with defect types C1 and C2, respectively, in a mapping table.
After the test requirement of the item to be tested is established, the test case corresponding to the test requirement can be found from the mapping relation table according to the test requirement of the item to be tested.
S103, determining at least one first defect type corresponding to the test case based on the mapping relation table, and sending the at least one first defect type to the test terminal so that a tester at the test terminal can test the item to be tested.
The mapping relation table records mapping relations among different test cases, test requirements and defect types, so that at least one first defect type corresponding to the test cases can be determined according to the mapping relation table. And after determining at least one first defect type corresponding to the test case, the method sends the at least one first defect type to the test terminal so as to inform a tester of the test terminal of possible defect types of the item to be tested, thereby providing guidance for the test of the tester, so that the tester can test the possible defect types in a targeted manner, thereby effectively improving the test efficiency and the test quality and ensuring the smooth progress of the item.
In one or more embodiments, the defect prediction generation reasons and defect reference solutions corresponding to each defect type may also be counted according to the historical test records. At least one first defect type is sent to the testing end so as to be convenient for the testing end, and meanwhile, a defect prediction generation reason and a defect reference solution corresponding to each defect type in the at least one first defect type can be sent to the testing end so as to provide reference for testing personnel of the testing end.
After testing the item to be tested, if the tester determines that at least one second defect type exists in the item to be tested, the at least one second defect type can be sent to the user terminal through the testing terminal, at the moment, the user terminal receives the at least one second defect type which is sent by the testing terminal and is determined after testing the item to be tested, and judges whether a third defect type which is not matched with the defect type in the at least one first defect type exists in the at least one second defect type. If a third defect type which does not match the defect type in the at least one first defect type exists in the at least one second defect type, the third defect type is added into a mapping relation table, and the mapping relation table is updated by associating the third defect type with the test requirement. Thus, when the test finds a new defect type, the mapping relation table can be automatically updated.
Further, in this embodiment of the present application, quality metric data for performing defect analysis on different types of test items may be counted according to the defect types determined for each type of historical test items and the defect types determined after testing for each type of historical test items sent by the test end, where the quality metric data includes, but is not limited to, a defect false alarm rate and/or a defect leakage rate.
In addition, after the quality measurement data of defect analysis is counted for different types of test projects, the counted quality measurement data can be visually displayed.
In summary, the defect analysis method for the test item provided by the embodiment of the present application constructs the test requirement of the test item to be tested; determining a test case corresponding to the test requirement based on a pre-established mapping relation table; determining at least one first defect type corresponding to the test case based on the mapping relation table, and sending the at least one first defect type to the test terminal so that a tester at the test terminal can test the item to be tested; the mapping relation table records mapping relations among different test cases, test requirements and defect types. Therefore, the possible defect types of the test items can be determined according to the mapping relations among different test cases, test requirements and defect types recorded in the jet relation table, so that guidance is provided for testing by testers, the testers can test the possible defect types in a targeted manner, the test efficiency and the test quality are improved, the smooth progress of the items is ensured, and the practical application and popularization are facilitated. Meanwhile, the defect prediction generation reasons and defect reference solutions corresponding to the defect types can be sent to the testing end, so that references are provided for testing personnel at the testing end. In addition, when the test finds a new defect type, the mapping relation table can be automatically updated.
Referring to fig. 2, a second aspect of the embodiments of the present application provides a defect analysis device for a test item, where the defect analysis device for a test item includes:
the construction unit is used for constructing the test requirement of the item to be tested, and the function to be tested is recorded in the test requirement;
the determining unit is used for determining the test case corresponding to the test requirement based on a pre-established mapping relation table; and
determining at least one first defect type corresponding to the test case based on the mapping relation table, and sending the at least one first defect type to a test terminal so that a tester at the test terminal can test the item to be tested;
the mapping relation table records mapping relations among different test cases, test requirements and defect types.
In one possible design, the defect analysis device of the test item further includes:
and the sending unit is used for sending the defect prediction generation reason and the defect reference solution corresponding to each defect type in the at least one first defect type to the testing end.
In one possible design, the defect analysis device of the test item further includes:
the receiving unit is used for receiving at least one second defect type which is sent by the testing end and is determined after the testing is carried out on the item to be tested after the at least one first defect type is sent to the testing end;
a judging unit configured to judge whether a third defect type that does not match a defect type in the at least one first defect type exists in the at least one second defect type;
an adding association unit, configured to, if a third defect type that does not match the defect type in the at least one first defect type exists in the at least one second defect type, add the third defect type to the mapping table, and associate the third defect type with the test requirement to update the mapping table.
In one possible design, the defect analysis device of the test item further includes:
the statistics unit is used for counting quality measurement data for carrying out defect analysis on different types of test items according to the defect types determined by the historical test items of each type and the defect types determined by the test terminal after the test is carried out on the historical test items of each type, wherein the quality measurement data comprises defect false alarm rate and/or defect missing rate.
In one possible design, the defect analysis device of the test item further includes:
and the display unit is used for visually displaying the quality measurement data.
In one possible design, the functions that need to be tested include whether login access is normal, whether the function of the input box is normal, and/or whether the search function is normal.
The working process, working details and technical effects of the device provided in the second aspect of the present embodiment may be referred to in the first aspect of the present embodiment, and are not described herein.
As shown in fig. 3, a third aspect of the embodiment of the present application provides another defect analysis device for a test item, which includes a memory, a processor and a transceiver that are sequentially communicatively connected, where the memory is configured to store a computer program, the transceiver is configured to send and receive a message, and the processor is configured to read the computer program, and perform the defect analysis method for the test item according to the first aspect of the embodiment.
By way of specific example, the Memory may include, but is not limited to, random Access Memory (RAM), read Only Memory (ROM), flash Memory (Flash Memory), first-in-first-out Memory (FIFO), and/or first-in-last-out Memory (FILO), etc.; the processor may not be limited to a processor adopting architecture such as a microprocessor, ARM (Advanced RISC Machines), X86, etc. of the model STM32F105 series or a processor integrating NPU (neural-network processing units); the transceiver may be, but is not limited to, a WiFi (wireless fidelity) wireless transceiver, a bluetooth wireless transceiver, a general packet radio service technology (General Packet Radio Service, GPRS) wireless transceiver, a ZigBee protocol (low power local area network protocol based on the ieee802.15.4 standard), a 3G transceiver, a 4G transceiver, and/or a 5G transceiver, etc.
A fourth aspect of the present embodiment provides a computer readable storage medium storing instructions comprising the method for analyzing defects of a test item according to the first aspect of the present embodiment, i.e. the computer readable storage medium has instructions stored thereon, which when executed on a computer, perform the method for analyzing defects of a test item according to the first aspect. The computer readable storage medium refers to a carrier for storing data, and may include, but is not limited to, a floppy disk, an optical disk, a hard disk, a flash Memory, and/or a Memory Stick (Memory Stick), etc., where the computer may be a general purpose computer, a special purpose computer, a computer network, or other programmable devices.
A fifth aspect of the present embodiment provides a computer program product comprising instructions which, when run on a computer, cause the computer to perform the method of defect analysis of test items according to the first aspect of the embodiment, wherein the computer may be a general purpose computer, a special purpose computer, a computer network, or other programmable device.
From the above description of the embodiments, it will be apparent to those skilled in the art that the embodiments may be implemented by means of software plus necessary general hardware platforms, or of course may be implemented by means of hardware. Based on this understanding, the above technical solution may be embodied essentially or in a part contributing to the prior art in the form of a software product, which may be stored in a computer readable storage medium, such as ROM/RAM, magnetic disk, optical disk, etc., comprising several instructions for causing a merging means of warehouse codes to perform the method described in the various embodiments or some parts of the embodiments.
Finally, it should be noted that: the foregoing description is only of the preferred embodiments of the invention and is not intended to limit the scope of the invention. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (10)

1. A method for defect analysis of a test item, comprising:
constructing a test requirement of a project to be tested, wherein the test requirement records functions to be tested;
determining a test case corresponding to the test requirement based on a pre-established mapping relation table;
determining at least one first defect type corresponding to the test case based on the mapping relation table, and sending the at least one first defect type to a test terminal so that a tester at the test terminal can test the item to be tested;
the mapping relation table records mapping relations among different test cases, test requirements and defect types.
2. The method of defect analysis of test items of claim 1, further comprising:
and sending a defect prediction generation reason and a defect reference solution corresponding to each defect type in the at least one first defect type to the test end.
3. The method of defect analysis of test items of claim 1, wherein after sending the at least one first defect type to a test end, the method further comprises:
receiving at least one second defect type which is sent by the testing end and is determined after the test is carried out on the item to be tested;
if a third defect type which does not match the defect type in the at least one first defect type exists in the at least one second defect type, adding the third defect type into the mapping relation table, and associating the third defect type with the test requirement to update the mapping relation table.
4. The method of defect analysis of test items of claim 1, further comprising:
and counting quality measurement data for carrying out defect analysis on different types of test items according to the defect types determined by the historical test items of each type and the defect types determined by the test terminal after testing the historical test items of each type, wherein the quality measurement data comprises defect false alarm rate and/or defect missing rate.
5. The method of defect analysis of test items of claim 4, further comprising:
and visually displaying the quality measurement data.
6. The defect analysis method of the test item according to claim 1, wherein the functions to be tested include whether login access is normal, whether function of an input box is normal, and/or whether search function is normal.
7. A defect analysis device for a test item, comprising:
the construction unit is used for constructing the test requirement of the item to be tested, and the function to be tested is recorded in the test requirement;
the determining unit is used for determining the test case corresponding to the test requirement based on a pre-established mapping relation table; and
determining at least one first defect type corresponding to the test case based on the mapping relation table, and sending the at least one first defect type to a test terminal so that a tester at the test terminal can test the item to be tested;
the mapping relation table records mapping relations among different test cases, test requirements and defect types.
8. The defect analysis device of the test item according to claim 7, wherein the defect analysis device of the test item further comprises:
and the sending unit is used for sending the defect prediction generation reason and the defect reference solution corresponding to each defect type in the at least one first defect type to the testing end.
9. A defect analysis device for test items, characterized by comprising a memory, a processor and a transceiver which are connected in turn in communication, wherein the memory is used for storing a computer program, the transceiver is used for receiving and transmitting messages, and the processor is used for reading the computer program and executing the defect analysis method for test items according to any one of claims 1-6.
10. A computer readable storage medium having instructions stored thereon which, when run on a computer, perform the method of defect analysis of a test item according to any one of claims 1 to 6.
CN202310078361.7A 2023-01-13 2023-01-13 Defect analysis method and device for test item and storage medium Pending CN116302959A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117318847A (en) * 2023-09-27 2023-12-29 北京唯得科技有限公司 Frequency shifting device testing method, system, device and medium

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117318847A (en) * 2023-09-27 2023-12-29 北京唯得科技有限公司 Frequency shifting device testing method, system, device and medium
CN117318847B (en) * 2023-09-27 2024-05-07 北京唯得科技有限公司 Frequency shifting device testing method, system, device and medium

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