CN117310422A - Initiating explosive device resistor performance test method and system - Google Patents
Initiating explosive device resistor performance test method and system Download PDFInfo
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- CN117310422A CN117310422A CN202311628749.6A CN202311628749A CN117310422A CN 117310422 A CN117310422 A CN 117310422A CN 202311628749 A CN202311628749 A CN 202311628749A CN 117310422 A CN117310422 A CN 117310422A
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- 238000000034 method Methods 0.000 title claims abstract description 49
- 239000002360 explosive Substances 0.000 title claims abstract description 32
- 230000000977 initiatory effect Effects 0.000 title claims abstract description 32
- 238000011056 performance test Methods 0.000 title claims description 7
- 238000012360 testing method Methods 0.000 claims abstract description 159
- 238000004519 manufacturing process Methods 0.000 claims abstract description 95
- 238000004458 analytical method Methods 0.000 claims abstract description 31
- 238000012545 processing Methods 0.000 claims abstract description 22
- 230000008569 process Effects 0.000 claims abstract description 11
- 238000013102 re-test Methods 0.000 claims abstract description 6
- 238000001816 cooling Methods 0.000 claims abstract description 4
- 230000002159 abnormal effect Effects 0.000 claims description 49
- 230000002950 deficient Effects 0.000 claims description 37
- 230000008439 repair process Effects 0.000 claims description 19
- 230000008859 change Effects 0.000 claims description 18
- 238000013461 design Methods 0.000 claims description 18
- 230000005856 abnormality Effects 0.000 claims description 9
- 238000004590 computer program Methods 0.000 claims description 8
- 238000003860 storage Methods 0.000 claims description 6
- 238000013101 initial test Methods 0.000 claims description 3
- 238000007781 pre-processing Methods 0.000 claims description 3
- 238000012216 screening Methods 0.000 claims description 3
- 238000010998 test method Methods 0.000 claims description 2
- 238000013523 data management Methods 0.000 abstract description 6
- 238000005457 optimization Methods 0.000 abstract description 5
- 238000007405 data analysis Methods 0.000 description 6
- 230000009286 beneficial effect Effects 0.000 description 5
- 238000007796 conventional method Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 230000006870 function Effects 0.000 description 3
- 238000003491 array Methods 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 206010063385 Intellectualisation Diseases 0.000 description 1
- 238000010835 comparative analysis Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 238000011282 treatment Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8803—Visual inspection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
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Abstract
The invention discloses a method and a system for testing the performance of a initiating explosive device resistor, which relate to the field of initiating explosive device resistor testing and comprise the steps of randomly selecting a resistor testing initial resistance value from a production finished product to obtain initial resistance data; performing limit electric shock test on the tested resistor, and re-testing the resistance value after cooling to normal temperature to obtain test resistance value data; and implementing processing measures according to the analysis result, and storing all data into a database. The method can accurately evaluate the performance of the resistor by carrying out detailed test on the initial resistance value and the resistance value after the limit electric impact of the resistor, can collect, process and analyze test data in real time by adopting an advanced data management and analysis method, provides powerful support for the optimization of the production process, and is provided with an automatic processing module which can automatically execute corresponding processing measures according to the test result, thereby greatly improving the test efficiency.
Description
Technical Field
The invention relates to the technical field of initiating explosive device resistor testing, in particular to a method and a system for testing the performance of an initiating explosive device resistor.
Background
The initiating explosive device resistor is a special electronic element and is widely applied to the fields of military industry, aerospace and the like, the initiating explosive device resistor must have extremely high reliability and stability due to the harsh working environment, the accurate and comprehensive test on the performance of the initiating explosive device resistor is extremely important in the production process, the traditional test method generally comprises the test on the initial resistance value of the resistor and the limit electric shock test, but the methods are relatively single and lag in terms of data management, analysis and treatment measures, so that the accuracy and the reliability of test results are limited, and the real-time optimization and adjustment on the production process are difficult.
Disclosure of Invention
The present invention has been made in view of the above-described problems occurring in the conventional initiating explosive device resistor performance test methods.
Therefore, the problem to be solved by the present invention is that the conventional method is relatively single and backward in terms of data management, analysis and processing measures, which limits the accuracy and reliability of the test results, and makes it difficult to optimize and adjust the production process in real time.
In order to solve the technical problems, the invention provides the following technical scheme: a initiating explosive device resistor performance test method comprises the steps of randomly selecting a resistor test initial resistance value from a production finished product to obtain initial resistance data;
performing limit electric shock test on the tested resistor, and re-testing the resistance value after cooling to normal temperature to obtain test resistance value data;
obtaining resistor design resistance data, analyzing the resistor production finished product performance by comparing the appearance and the resistance change of the resistor before and after the test, and obtaining an analysis result;
and implementing processing measures according to the analysis result, and storing all data into a database.
As a preferable scheme of the initiating explosive device resistor performance testing method, the method comprises the following steps: the resistors are randomly selected from finished products of the resistors with intact outside, all the resistors are independently installed on a resistance testing device for testing after being numbered according to sequence, the resistance testing device is calibrated in advance, initial resistance data of the resistor testing is collected, and initial testing information is attached to the initial resistance data and stored in a database.
As a preferable scheme of the initiating explosive device resistor performance testing method, the method comprises the following steps: the limit electric shock test is carried out on the tested resistor, namely the resistor is electrified for 0.2-0.3s with 200 times of rated power, the whole electrifying process is recorded, after the electrifying process is finished, the resistor is cooled to normal temperature, the resistor is used for carrying out resistance test by using the same resistance test device, test resistance data are collected, and secondary test information is attached to the resistor and stored in a database.
As a preferable scheme of the initiating explosive device resistor performance testing method, the method comprises the following steps: after the ultimate electric shock test, resistor screening is performed by observing the appearance of the resistor, if the surface of the resistor is damaged or broken after the ultimate electric shock test, the mark of the resistor is recorded as a defective product, the resistor is screened out from the secondary resistance test, and meanwhile, the initial resistance test data of the marked resistor are deleted.
As a preferable scheme of the initiating explosive device resistor performance testing method, the method comprises the following steps: after the test system acquires the resistor design resistance data, the resistor design resistance data and the initial resistance data are compared and analyzed, and the resistor performance is judged:
if the difference of all the resistance data of the resistor is within the allowable deviation range, recording the mark of the resistor as a finished product, and classifying and recording all the resistance data of the resistor under the mark of the resistor for convenient reference;
if the difference between the resistor test resistance data and the initial resistance data exceeds the allowable deviation range and the difference between the resistor test resistance data and the initial resistance data exceeds the allowable deviation range as well as the design resistance data, recording the marks of the resistors as defective products, synchronously transmitting all the resistance data of the resistors and the limit electric shock test records to staff for analyzing the generation reasons of the defective products of the resistors;
if the difference between the resistor test resistance data and the initial resistance data is within the allowable deviation range, but the difference between the resistor test resistance data and the initial resistance data exceeds the allowable deviation range, retesting the resistor, wherein the test condition is the same as that of the initial resistance test of the resistor, comparing and analyzing the retest result with the initial resistance data and the design resistance data again, if the comparison result is consistent with the last comparison result, marking the resistor as abnormal, transmitting all the test data and the comparison result of the resistor to a worker for analyzing the abnormal reasons of the resistor, and if the comparison result shows that the difference between all the resistance data of the resistor is within the allowable range, marking the resistor mark as a finished product and checking the resistor test condition to analyze the abnormal reasons of the resistor for the initial comparison.
As a preferable scheme of the initiating explosive device resistor performance testing method, the method comprises the following steps: and after all the resistance data of the resistors are compared, the testing system collects data for centralized statistics, calculates the defective rate according to the number of defective marks and the total number of the tested resistors, and draws a resistor performance change trend chart according to the change of the resistance data for displaying:
if the system calculates that the defective rate of the resistor is smaller than or equal to a set value and the variation trend of the performance of the resistor is stable, judging that the finished product of the resistor is not abnormal, and sending a notification that the finished product of the resistor is not abnormal to a resistor production line and staff by the system, allowing the resistor production line to continue the production of the resistor and attaching factory permission to the finished product of the resistor;
if the system calculates that the defective rate of the resistor is smaller than or equal to a set value but the variation trend of the resistor performance is obvious, judging that the finished resistor product is not abnormal, if the finished resistor product is abnormal, sending a notification for reducing the production efficiency to the resistor production line by the system, sending a notification for checking the resistor production line to a worker, slowing down the production speed of the resistor production line by the system, if the worker does not find the abnormality after checking the production line, replying the production line to the system, sending a notification for recovering the production efficiency to the resistor production line again, if the worker finds the abnormality after checking the production line, replying the abnormal notification to the system, sending a notification for suspending the production to the resistor production line by the system, carrying out the adjustment and repair work of the production line by the worker, sending a repair notification to the system by the worker after the repair is completed, and recovering the operation of the resistor production line by the system again;
if the defective rate of the resistor is smaller than or equal to the set value, the system modifies the abnormal resistor product into no abnormal one, and re-performs the operation of the resistor production line, and sends an abnormal cancellation notice to the staff, if the re-inspected defective resistor product is still larger than the set value, the system determines the abnormal resistor product, recovers the finished resistor product, notifies the staff to overhaul the resistor production line for finding the reason of the abnormal resistor production, and after the staff repairs the abnormal resistor production line, sends a repair notice to the system, and the system resumes the operation of the resistor production line and generates abnormal data to be recorded in the database.
As a preferable scheme of the initiating explosive device resistor performance testing method, the method comprises the following steps: the data comprises resistor design resistance data, initial resistance data, test resistance data, resistor defective rate, performance change trend chart, abnormal data of resistor production lines and repair records of workers, and the database regularly backs up and stores the data.
Another object of the present invention is to provide a test system of the initiating explosive device resistor performance test method, which includes a test module, an acquisition module, an analysis module, and a processing module;
the testing module is used for carrying out resistance test and ultimate electric shock test on the resistor finished product;
the acquisition module is used for acquiring the resistor finished product resistance test data, preprocessing the data, and facilitating the system to collect the data for analysis;
the analysis module is used for carrying out centralized analysis on all the test data of the resistor acquired by the acquisition module and judging the performance change trend of the resistor;
the processing module is used for implementing corresponding processing measures according to the analysis result obtained by the analysis module and storing the processing data into a database.
A computer device, comprising: a memory and a processor; the memory stores a computer program characterized in that: and the processor executes the computer program to realize the steps of the initiating explosive device resistor performance testing method.
A computer-readable storage medium having stored thereon a computer program, characterized by: the computer program when executed by a processor implements the steps of the initiating explosive device resistor performance testing method.
The invention has the beneficial effects that: the invention can accurately evaluate the performance of the resistor by carrying out detailed test on the initial resistance value and the resistance value after the limit electric impact of the resistor, can collect, process and analyze test data in real time by adopting an advanced data management and analysis method, provides powerful support for the optimization of the production process, and is provided with an automatic processing module which can automatically execute corresponding processing measures according to the test result, thereby greatly improving the test efficiency.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flow chart of a method for testing the performance of an initiating explosive device resistor.
Fig. 2 is a schematic diagram of a system for testing the performance of an initiating explosive device resistor.
Detailed Description
In order that the above-recited objects, features and advantages of the present invention will become more readily apparent, a more particular description of the invention will be rendered by reference to specific embodiments thereof which are illustrated in the appended drawings.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention, but the present invention may be practiced in other ways other than those described herein, and persons skilled in the art will readily appreciate that the present invention is not limited to the specific embodiments disclosed below.
Further, reference herein to "one embodiment" or "an embodiment" means that a particular feature, structure, or characteristic can be included in at least one implementation of the invention. The appearances of the phrase "in one embodiment" in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments.
Example 1
Referring to fig. 1, a first embodiment of the present invention provides a method for testing the performance of an initiating explosive device resistor, which includes the following steps:
s1, randomly selecting a resistor test initial resistance value from a production finished product to obtain initial resistance data;
it should be noted that the resistors to be tested are finished products of resistors which are selected from the finished products of resistors and are undamaged outside randomly, all the resistors are independently installed on a resistance testing device for testing after being numbered in sequence, the resistance testing device is calibrated in advance, initial resistance data of the resistor testing is collected, and initial testing information is attached to the initial resistance data and stored in a database.
S2, performing limit electric shock test on the tested resistor, and retesting the resistance value after cooling to normal temperature to obtain test resistance value data;
it should be noted that, the limit electric shock test is performed on the tested resistor, namely, the resistor is electrified for 0.2-0.3s with 200 times of rated power, the whole electrifying process is recorded, after the electrifying process is completed, the resistor is cooled to normal temperature, then the resistor is subjected to resistance test by using the same resistance test device, test resistance data are collected, and secondary test information is attached to be stored in a database.
The method has the advantages that the limit electric shock test is carried out in a mode of 0.2-0.3 seconds when the rated power of 200 times is electrified, the severe working conditions possibly encountered by the resistor in actual use can be simulated, the stability and reliability of the resistor are facilitated to be deeply evaluated, the resistor is cooled to the normal temperature after the test is completed, the resistance test is carried out, the recovery performance and the long-term stability of the resistor after the limit electric shock test are evaluated, all test data and information can be collected and stored in a database, the test data can be conveniently analyzed and researched in detail later, the test history of each resistor can be conveniently tracked and managed, and the method has important significance in continuously optimizing the product performance and improving the production and manufacturing level.
S3, the testing system acquires resistor design resistance data, and the appearance and resistance change of the resistors before and after the testing are compared to analyze the performance of finished products produced by the resistors, so that an analysis result is obtained;
it should be noted that, after the ultimate electric shock test, resistor screening is performed by observing the appearance of the resistor, if the surface of the resistor is damaged or broken after the ultimate electric shock test, the resistor is marked as a defective product and the resistor is screened out from the secondary resistance test, and the initial resistance test data of the marked resistor is deleted.
It should also be noted that, after the test system obtains the resistor design resistance data, the test system performs comparative analysis with the initial resistance data and the test resistance data to determine the resistor performance:
if the difference of all the resistance data of the resistor is within the allowable deviation range, recording the mark of the resistor as a finished product, and classifying and recording all the resistance data of the resistor under the mark of the resistor for convenient reference;
if the difference between the resistor test resistance data and the initial resistance data exceeds the allowable deviation range and the difference between the resistor test resistance data and the initial resistance data exceeds the allowable deviation range as well as the design resistance data, recording the marks of the resistors as defective products, synchronously transmitting all the resistance data of the resistors and the limit electric shock test records to staff for analyzing the generation reasons of the defective products of the resistors;
if the difference between the resistor test resistance data and the initial resistance data is within the allowable deviation range, but the difference between the resistor test resistance data and the initial resistance data exceeds the allowable deviation range, retesting the resistor, wherein the test condition is the same as that of the initial resistance test of the resistor, comparing and analyzing the retest result with the initial resistance data and the design resistance data again, if the comparison result is consistent with the last comparison result, marking the resistor as abnormal, transmitting all the test data and the comparison result of the resistor to a worker for analyzing the abnormal reasons of the resistor, and if the comparison result shows that the difference between all the resistance data of the resistor is within the allowable range, marking the resistor mark as a finished product and checking the resistor test condition to analyze the abnormal reasons of the resistor for the initial comparison.
By comprehensively comparing and analyzing the design resistance data, the initial resistance data and the test resistance data after the ultimate electric shock test, the performance state of the resistor can be judged more accurately, the real-time monitoring and recording of the test data of the resistor in different stages are facilitated, the real-time mastering of the performance change of the resistor is facilitated, the recording and the storage of all relevant test data and analysis results are facilitated, and sufficient data support is provided for the later performance analysis and improvement.
S4, implementing processing measures according to analysis results, and storing all data into a database;
it should be noted that, after all the resistance data of the resistors are compared, the test system collects data for centralized statistics, calculates the defective rate according to the number of defective marks and the total number of the tested resistors, and draws a resistor performance change trend chart according to the change of the resistance data for display:
if the system calculates that the defective rate of the resistor is smaller than or equal to a set value and the variation trend of the performance of the resistor is stable, judging that the finished resistor product is not abnormal, and sending a notification that the finished resistor product is not abnormal to a resistor production line and staff by the system, allowing the resistor production line to continue to produce the resistor and the finished resistor product to leave a factory;
if the system calculates that the defective rate of the resistor is smaller than or equal to a set value but the variation trend of the resistor performance is obvious, judging that the finished resistor product is not abnormal, if the finished resistor product is abnormal, sending a notification for reducing the production efficiency to the resistor production line by the system, sending a notification for checking the resistor production line to a worker, slowing down the production speed of the resistor production line by the system, if the worker does not find the abnormality after checking the production line, replying the production line to the system, sending a notification for recovering the production efficiency to the resistor production line again, if the worker finds the abnormality after checking the production line, replying the abnormal notification to the system, sending a notification for suspending the production to the resistor production line by the system, carrying out the adjustment and repair work of the production line by the worker, sending a repair notification to the system by the worker after the repair is completed, and recovering the operation of the resistor production line by the system again;
if the defective rate of the resistor is smaller than or equal to the set value, the system modifies the abnormal resistor production into no abnormal one, and re-performs the operation of the resistor production line, and sends an abnormal cancellation notice to the staff, if the defective rate of the re-checked resistor is still larger than the set value, the system determines the abnormal resistor production line, recovers the finished resistor product, notifies the staff to repair the resistor production line for finding the reason of the abnormal resistor production, and sends a repair notice to the system after the staff repairs the abnormal resistor production line, and the system resumes the operation of the resistor production line and generates abnormal data to be recorded in the database.
In the process of producing the resistor in a factory, the general defective rate is kept at 1%, so that the set value can be 1%, the system automatically calculates the defective rate and the performance change trend of the resistor, thereby realizing quick and intelligent decision, reducing the need of manual intervention, being capable of detecting potential abnormal conditions in early stage in the production process by monitoring the defective rate and the performance change trend of the resistor, being beneficial to taking measures in time, reducing the defective rate, and being capable of sending out notification for reducing the production efficiency and slowing down the production speed to ensure the product quality for the condition that the performance change trend is obvious. This helps to prevent the rise of the defective rate and reduce the generation of defective products, and when the defective rate is greater than the set value, the system takes the measure of three re-checks, and improves the accuracy of judging the finished product performance of the resistor by taking the average data. The method is beneficial to reducing the possibility of misjudgment, and the whole data analysis and processing flow is beneficial to realizing the automation, the intellectualization and the high efficiency of the resistor production, and simultaneously improves the stability of the product quality and reduces the risk and the cost in the production.
It should also be noted that storing all data in a database includes resistor design resistance data, initial resistance data, test resistance data, resistor failure rate, performance trend graphs, resistor production line anomaly data, and worker repair records, the database periodically backing up the data.
Example 2
Referring to fig. 2, in a second embodiment of the present invention, which is different from the previous embodiment, there is provided a initiating explosive device resistor performance test system, wherein: the device comprises a testing module, an acquisition module, an analysis module and a processing module;
the testing module is used for carrying out resistance test and ultimate electric shock test on the resistor finished product;
the acquisition module is used for acquiring the resistor finished product resistance test data, preprocessing the data, and facilitating the system to collect the data for analysis;
the analysis module is used for carrying out centralized analysis on all the test data of the resistor acquired by the acquisition module and judging the performance change trend of the resistor;
the processing module is used for implementing corresponding processing measures according to the analysis result obtained by the analysis module and storing the processing data into a database.
The functions, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention may be embodied essentially or in a part contributing to the prior art or in a part of the technical solution, in the form of a software product stored in a storage medium, comprising several instructions for causing a computer device (which may be a personal computer, a server, a network device, etc.) to perform all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), a magnetic disk, or an optical disk, or other various media capable of storing program codes.
Logic and/or steps represented in the flowcharts or otherwise described herein, e.g., a ordered listing of executable instructions for implementing logical functions, can be embodied in any computer-readable medium for use by or in connection with an instruction execution system, apparatus, or device, such as a computer-based system, processor-containing system, or other system that can fetch the instructions from the instruction execution system, apparatus, or device and execute the instructions. For the purposes of this description, a "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device.
More specific examples (a non-exhaustive list) of the computer-readable medium would include the following: an electrical connection (electronic device) having one or more wires, a portable computer diskette (magnetic device), a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM). In addition, the computer readable medium may even be paper or other suitable medium on which the program is printed, as the program may be electronically captured, via, for instance, optical scanning of the paper or other medium, then compiled, interpreted or otherwise processed in a suitable manner, if necessary, and then stored in a computer memory.
It is to be understood that portions of the present invention may be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, the various steps or methods may be implemented in software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, may be implemented using any one or combination of the following techniques, as is known in the art: discrete logic circuits having logic gates for implementing logic functions on data signals, application specific integrated circuits having suitable combinational logic gates, programmable Gate Arrays (PGAs), field Programmable Gate Arrays (FPGAs), and the like.
Example 3
For the third embodiment of the present invention, which is different from the first two embodiments, in order to verify the advantageous effects of the method of the present invention, it is demonstrated by comparing the method of the present invention with the conventional method, and the comparison results are shown in the following table.
Table 1: comparison table of the method of the invention and the traditional method
| Conventional method | The method of the invention | |
| Abnormality detection | Essentially rely on manual discovery of anomalies | Automatic abnormality detection, early detection and problem solving |
| Data managementAnd analyzing | Data is typically manually collated and analyzed | Automated data management and analysis, greater efficiency and accuracy |
| Analysis of cause of abnormality | Additional effort and time is required to analyze and resolve anomalies | Automatically recording abnormal data and reasons and accelerating problem solving process |
| Data recording and backup | Data records are often not comprehensive enough to be reviewed and analyzed | All data are recorded completely and are backed up regularly, so that the data are convenient to review and track |
| Production process optimization | It is difficult to optimize the production process in real time | Real-time feedback and data analysis help optimize the production process |
Table 2: experimental comparison table of the method and the traditional method
| Exception handling efficiency | Inspection accuracy | User satisfactionDegree of | |
| Conventional method | High height | 98.1% | 96.4% |
| The method of the invention | Lower level | 90.6% | 87.3% |
Compared with the traditional method, the method has obvious advantages in the aspects of data acquisition, data accuracy, anomaly detection, production efficiency, data management and analysis, defective rate, anomaly cause analysis, data recording and backup, product quality and stability, production process optimization and the like, and the method improves the efficiency, quality and stability of resistor production through an automatic and intelligent process, is beneficial to reducing cost and risk, and improves the competitiveness of a production line.
It should be noted that the above embodiments are only for illustrating the technical solution of the present invention and not for limiting the same, and although the present invention has been described in detail with reference to the preferred embodiments, it should be understood by those skilled in the art that the technical solution of the present invention may be modified or substituted without departing from the spirit and scope of the technical solution of the present invention, which is intended to be covered in the scope of the claims of the present invention.
Claims (10)
1. A method for testing the performance of an initiating explosive device resistor is characterized by comprising the following steps of: comprising the steps of (a) a step of,
randomly selecting a resistor test initial resistance value from the production finished product to obtain initial resistance data;
performing limit electric shock test on the tested resistor, and re-testing the resistance value after cooling to normal temperature to obtain test resistance value data;
the testing system acquires resistor design resistance data, and analyzes the resistor production finished product performance by comparing the appearance and the resistance change of the resistor before and after the test to obtain an analysis result;
and implementing processing measures according to the analysis result, and storing all data into a database.
2. The initiating explosive device resistor performance testing method as recited in claim 1, wherein: the resistors are randomly selected from finished products of the resistors with intact outside, all the resistors are independently installed on a resistance testing device for testing after being numbered according to sequence, the resistance testing device is calibrated in advance, initial resistance data of the resistor testing is collected, and initial testing information is attached to the initial resistance data and stored in a database.
3. The initiating explosive device resistor performance testing method as recited in claim 2, wherein: the limit electric shock test is carried out on the tested resistor, namely the resistor is electrified for 0.2-0.3s with 200 times of rated power, the whole electrifying process is recorded, after the electrifying process is finished, the resistor is cooled to normal temperature, the resistor is used for carrying out resistance test by using the same resistance test device, test resistance data are collected, and secondary test information is attached to the resistor and stored in a database.
4. A method of testing the performance of an initiating explosive device resistor as recited in claim 3, wherein: after the ultimate electric shock test, resistor screening is performed by observing the appearance of the resistor, if the surface of the resistor is damaged or broken after the ultimate electric shock test, the mark of the resistor is recorded as a defective product, the resistor is screened out from the secondary resistance test, and meanwhile, the initial resistance test data of the marked resistor are deleted.
5. The initiating explosive device resistor performance testing method as recited in claim 4, wherein: after the test system acquires the resistor design resistance data, the resistor design resistance data and the initial resistance data are compared and analyzed, and the resistor performance is judged:
if the difference of all the resistance data of the resistor is within the allowable deviation range, recording the mark of the resistor as a finished product, and classifying and recording all the resistance data of the resistor under the mark of the resistor for convenient reference;
if the difference between the resistor test resistance data and the initial resistance data exceeds the allowable deviation range and the difference between the resistor test resistance data and the initial resistance data exceeds the allowable deviation range as well as the design resistance data, recording the marks of the resistors as defective products, synchronously transmitting all the resistance data of the resistors and the limit electric shock test records to staff for analyzing the generation reasons of the defective products of the resistors;
if the difference between the resistor test resistance data and the initial resistance data is within the allowable deviation range, but the difference between the resistor test resistance data and the initial resistance data exceeds the allowable deviation range, retesting the resistor, wherein the test condition is the same as that of the initial resistance test of the resistor, comparing and analyzing the retest result with the initial resistance data and the design resistance data again, if the comparison result is consistent with the last comparison result, marking the resistor as abnormal, transmitting all the test data and the comparison result of the resistor to a worker for analyzing the abnormal reasons of the resistor, and if the comparison result shows that the difference between all the resistance data of the resistor is within the allowable range, marking the resistor mark as a finished product and checking the resistor test condition to analyze the abnormal reasons of the resistor for the initial comparison.
6. The initiating explosive device resistor performance testing method as recited in claim 5, wherein: and after all the resistance data of the resistors are compared, the testing system collects data for centralized statistics, calculates the defective rate according to the number of defective marks and the total number of the tested resistors, and draws a resistor performance change trend chart according to the change of the resistance data for displaying:
if the system calculates that the defective rate of the resistor is smaller than or equal to a set value and the variation trend of the performance of the resistor is stable, judging that the finished product of the resistor is not abnormal, and sending a notification that the finished product of the resistor is not abnormal to a resistor production line and staff by the system, allowing the resistor production line to continue the production of the resistor and attaching factory permission to the finished product of the resistor;
if the system calculates that the defective rate of the resistor is smaller than or equal to a set value but the variation trend of the resistor performance is obvious, judging that the finished resistor product is not abnormal, if the finished resistor product is abnormal, sending a notification for reducing the production efficiency to the resistor production line by the system, sending a notification for checking the resistor production line to a worker, slowing down the production speed of the resistor production line by the system, if the worker does not find the abnormality after checking the production line, replying the production line to the system, sending a notification for recovering the production efficiency to the resistor production line again, if the worker finds the abnormality after checking the production line, replying the abnormal notification to the system, sending a notification for suspending the production to the resistor production line by the system, carrying out the adjustment and repair work of the production line by the worker, sending a repair notification to the system by the worker after the repair is completed, and recovering the operation of the resistor production line by the system again;
if the defective rate of the resistor is smaller than or equal to the set value, the system modifies the abnormal resistor product into no abnormal one, and re-performs the operation of the resistor production line, and sends an abnormal cancellation notice to the staff, if the re-inspected defective resistor product is still larger than the set value, the system determines the abnormal resistor product, recovers the finished resistor product, notifies the staff to overhaul the resistor production line for finding the reason of the abnormal resistor production, and after the staff repairs the abnormal resistor production line, sends a repair notice to the system, and the system resumes the operation of the resistor production line and generates abnormal data to be recorded in the database.
7. The initiating explosive device resistor performance testing method as recited in claim 6, wherein: the data comprises resistor design resistance data, initial resistance data, test resistance data, resistor defective rate, performance change trend chart, abnormal data of resistor production lines and repair records of workers, and the database regularly backs up and stores the data.
8. A test system employing the initiating explosive device resistor performance test method as defined in any one of claims 1 to 7, wherein: the device comprises a testing module, an acquisition module, an analysis module and a processing module;
the testing module is used for carrying out resistance test and ultimate electric shock test on the resistor finished product;
the acquisition module is used for acquiring the resistor finished product resistance test data, preprocessing the data, and facilitating the system to collect the data for analysis;
the analysis module is used for carrying out centralized analysis on all the test data of the resistor acquired by the acquisition module and judging the performance change trend of the resistor;
the processing module is used for implementing corresponding processing measures according to the analysis result obtained by the analysis module and storing the processing data into a database.
9. A computer device, comprising: a memory and a processor; the memory stores a computer program characterized in that: the processor, when executing the computer program, implements the steps of the method of any one of claims 1 to 7.
10. A computer-readable storage medium having stored thereon a computer program, characterized by: the computer program implementing the steps of the method of any of claims 1 to 7 when executed by a processor.
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