CN116520102A - Resistance card endurance energy test method, device, equipment and storage medium - Google Patents
Resistance card endurance energy test method, device, equipment and storage medium Download PDFInfo
- Publication number
- CN116520102A CN116520102A CN202310465998.1A CN202310465998A CN116520102A CN 116520102 A CN116520102 A CN 116520102A CN 202310465998 A CN202310465998 A CN 202310465998A CN 116520102 A CN116520102 A CN 116520102A
- Authority
- CN
- China
- Prior art keywords
- resistor
- group
- iteration
- impact current
- energy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010998 test method Methods 0.000 title abstract description 11
- 238000012360 testing method Methods 0.000 claims abstract description 272
- 238000000034 method Methods 0.000 claims abstract description 33
- 101100134058 Caenorhabditis elegans nth-1 gene Proteins 0.000 claims abstract description 7
- 238000005259 measurement Methods 0.000 claims description 34
- 230000003247 decreasing effect Effects 0.000 claims description 5
- 229910044991 metal oxide Inorganic materials 0.000 claims description 4
- 150000004706 metal oxides Chemical class 0.000 claims description 4
- 125000004122 cyclic group Chemical group 0.000 abstract description 6
- 230000000694 effects Effects 0.000 abstract description 3
- 238000002474 experimental method Methods 0.000 description 5
- 230000015556 catabolic process Effects 0.000 description 2
- 238000011217 control strategy Methods 0.000 description 2
- 238000009863 impact test Methods 0.000 description 2
- 238000012795 verification Methods 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
Abstract
The application provides a resistance card endurance energy test method, a resistance card endurance energy test device, resistance card endurance energy test equipment and a storage medium. When the method is executed, a plurality of resistor sheets are selected to obtain initial values of the resistor sheets respectively; the initial value comprises a reference voltage, residual voltage and initial energy value, then impact current tests are respectively carried out on a plurality of resistance sheets based on the set energy value to obtain an ith group of impact current test results, and the loop iteration is carried out until the nth group of impact current test results do not meet the iteration condition, and the energy value of the nth-1 group or the nth group of impact current test is used as the limit energy tolerance value of the resistance sheet. And the test operation of different rounds is carried out based on different test results in a cyclic iteration mode, so that the effect of obtaining the limit energy tolerance value of the lightning arrester resistor disc under different waveforms and durations is achieved. Thus, various relations between the impulse current waveform and the resistance of the resistor can be obtained, and support is provided for the selection and engineering application of the resistor.
Description
Technical Field
The application relates to the technical field of power systems, in particular to a resistance card tolerance energy test method, a device, equipment and a storage medium.
Background
Along with the sustainable development of social economy in China, the dependence of power users on electric energy is stronger, and the requirements on the power supply reliability of a power system are higher. Distribution network lines are widely distributed, and the number of equipment is numerous. If a power distribution network located in a multiple lightning strike area is extremely easy to trip after lightning strike, the line can be broken and a distribution transformer can be damaged when serious. At present, lightning overvoltage is protected by installing a lightning arrester on a distribution line to reduce the tripping rate, but lightning protection failure is caused by insufficient tolerance of the lightning arrester. Thus, it is highly desirable to test the lightning arrester or the resistance card in the lightning arrester for lightning current resistance before the lightning arrester of the distribution network line is put into service.
Due to external overvoltage or system internal overvoltage, the lightning arrester can be subjected to various waveform impact currents in actual operation, particularly the lightning arrester operating in a high-voltage direct-current transmission engineering converter station, and the selected resistor disc is required to perform energy tolerance screening test according to relevant standards (GB 11032, GB/T22389, GB/T25083, GB/T6115.2 and GB/T25309).
However, the resistance-piece energy tolerance method specified in the current relevant standards is a test verification method of energy, and the waveform and duration of overvoltage in the power system are related to the type, topology and control strategy of the power system, the duration of different waveforms ranges from microseconds to hundreds of milliseconds, and the characteristics of the resistance piece for tolerance energy under different waveforms and durations are different, so that a resistance-piece tolerance energy measurement method is needed to obtain the corresponding limit tolerance energy of the resistance piece under different waveforms and durations.
Disclosure of Invention
In view of this, the present application provides a resistive patch withstand energy test method, apparatus, device and storage medium that is aimed at measuring the ultimate withstand energy of a resistive patch for different waveforms and durations, providing data support for the selection of resistive patches and arrester design.
In a first aspect, the present application provides a method of resistance-chip withstand energy testing, the method comprising:
selecting a plurality of resistor sheets to obtain initial values of the resistor sheets respectively; the initial value comprises a reference voltage, residual voltage and energy value; the reference voltage and the residual voltage are obtained through measurement; the energy value is calculated based on the specification of each resistor disc;
Respectively carrying out impact current tests on the plurality of resistance cards based on the set energy values to obtain an ith group of impact current test results, and carrying out loop iteration until the nth group of impact current test results do not meet the iteration conditions, wherein the set energy value of the nth-1 group or the nth group of impact current tests is used as the limit energy tolerance value of the resistance cards; the set energy values are respectively provided by corresponding different types of impulse current waveforms; the set energy value is obtained by calculation of an initial energy value and iteration times, i is a positive integer greater than or equal to 1, and n is a positive integer greater than or equal to i.
Optionally, the iterating through the nth group of the impact current test results in a loop until the iteration condition is not satisfied includes:
judging whether the i-th group impact current test result meets iteration conditions according to the i-th group impact current test result;
if the ith group of impact current test results meet the iteration conditions, continuing to carry out loop iteration;
and if the i-th group of impact current test results do not meet the iteration conditions, taking the i-th group of impact current test results as the n-th group of impact current test results which do not meet the iteration conditions.
Optionally, if the i-th group of impact current test results meet the iteration condition, continuing the loop iteration includes:
When the i-th group impact current test result meets the iteration condition, determining a loop iteration type met by the i-th group impact current test result; the loop iteration type comprises an energy increment iteration and an energy decrement iteration; wherein the condition of the energy increment iteration comprises that the plurality of resistor discs are free from mechanical damage and the related parameter variation of each resistor disc in the plurality of resistor discs is not more than 5%; the iteration condition of the energy decrementing iteration comprises that only one resistor sheet of the plurality of resistor sheets has mechanical damage and the related parameter variation of other resistor sheets of the plurality of resistor sheets except the mechanical damage is not more than 5%, or the plurality of resistor sheets does not have mechanical damage and only one resistor sheet has related parameter variation of more than 5%;
and calculating the energy value of the (i+1) th group according to the loop iteration type, and continuing the loop iteration.
Optionally, the set energy value is obtained by:
calculating to obtain a set energy value based on the initial energy value, the iteration step length and the iteration times:
W i ＝[1+(P-λ)ζ]W 0
wherein ζ is represented as an iteration step, P is represented as an energy increment iteration number, λ is represented as an energy decrement iteration number, i is a positive integer greater than or equal to 1, W 0 Is the initial energy value.
Optionally, the i-th group of impact current test results do not meet the iteration condition includes:
two or more of the plurality of resistor blocks are mechanically damaged, or the plurality of resistor blocks are not mechanically damaged, and the related parameter variation of two or more of the plurality of resistor blocks is more than 5%, or one of the plurality of resistor blocks is mechanically damaged, and the related parameter variation of one of the plurality of resistor blocks is more than 5%, or after energy decrementing iteration, the related parameter variation of the plurality of resistor blocks is not damaged, and is not more than 5%.
Optionally, the performing the impact current test on the plurality of resistor discs based on the set energy value to obtain an i-th set of impact current test results respectively includes:
respectively performing an ith group of impact current tests on the plurality of resistance cards based on the set energy value;
obtaining mechanical structure damage parameters of the resistance card of the ith group of impact current tests and related parameters of the resistance card of the ith group of impact current tests; the related parameters of the resistor disc of the i-th group of impact current test comprise the reference voltage of the resistor disc of the i-th group of impact current test and the residual voltage of the resistor disc of the i-th group of impact current test;
And obtaining the result of the i-th group of impact current test according to the mechanical structure parameters of the i-th group of impact current test resistor, the reference voltage of the i-th group of impact current test resistor and the residual voltage of the i-th group of impact current test resistor.
Optionally, the performing the i-th group of impact current tests on the plurality of resistive patches based on the set energy value includes:
respectively performing m×3 impact current tests on the plurality of resistance sheets based on the set energy value; wherein m is the number of test sequences of each group of impact current tests, and each sequence has 3 impact current tests; the interval between each impact current test is 50 s-60 s; the resistor was cooled to room temperature between each series of inrush current tests.
Optionally, the plurality of resistive patches are metal oxide resistive patches.
Optionally, the different types of impulse current waveforms specifically include:
the different types of impulse current waveforms are respectively 8/20 lightning impulse current, 0.1 ms-300 ms sine half-wave impulse current or 2 ms-100 ms square wave impulse current.
In a second aspect, the present application provides a resistance-card endurance energy testing apparatus, the apparatus comprising:
the first acquisition module is used for selecting a plurality of resistor discs to respectively acquire initial values of the resistor discs; the initial value comprises a reference voltage, residual voltage and an initial energy value; the reference voltage and the residual voltage are obtained through measurement; the initial energy value is calculated based on the specification of each resistor disc;
The second acquisition module is used for respectively carrying out impact current tests on the plurality of resistance sheets based on the set energy values to obtain an ith group of impact current test results, and carrying out loop iteration until the nth group of impact current test results do not meet the iteration conditions, wherein the energy value of the nth-1 group or the nth group of impact current test is used as the limit energy tolerance value of the resistance sheets; the set energy values are respectively provided by corresponding different types of impulse current waveforms; the set energy value is obtained by calculation of an initial energy value and iteration times, i is a positive integer greater than or equal to 1, and n is a positive integer greater than or equal to i.
In a third aspect, the present application provides an apparatus comprising a memory for storing instructions or code and a processor for executing the instructions or code to cause the apparatus to perform the resistive patch withstand energy test method of the first aspect.
In a fourth aspect, embodiments of the present application provide a computer storage medium having code stored therein, where when the code is executed, an apparatus executing the code implements the resistive patch withstand energy test method of the first aspect.
The application provides a resistance card endurance energy test method. When the method is executed, a plurality of resistor sheets are selected to obtain initial values of the resistor sheets respectively; the initial value comprises a reference voltage, residual voltage and an initial energy value; the reference voltage and the residual voltage are obtained through measurement; the initial energy value is calculated based on the specification of each resistor, then impact current tests are respectively carried out on a plurality of resistors based on the set energy value to obtain an ith group of impact current test results, and the iteration is circulated until the nth group of impact current test results do not meet the iteration condition, and then the energy value of the nth-1 group or the energy decrementing iteration nth group of impact current test is used as the limit energy tolerance value of the resistor; the set energy values are respectively provided by corresponding different types of impulse current waveforms; the set energy value is calculated by the initial energy value and the iteration times, i is a positive integer greater than or equal to 1, and n is a positive integer greater than or equal to i. In this way, test operations of different rounds are carried out based on different test results in a cyclic iteration mode, and the effect of obtaining the limit energy tolerance value of the lightning arrester resistor disc under different waveforms and durations is achieved. Thus, various relations between the impulse current waveform and the resistance of the resistor can be obtained, and support is provided for the selection and engineering application of the resistor.
Drawings
In order to more clearly illustrate the present embodiments or the technical solutions in the prior art, the drawings that are required for the embodiments or the description of the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flow chart of a method for testing resistance of a resistor according to an embodiment of the present disclosure;
FIG. 2 is a flowchart of an alternative method provided in the embodiment of the present application in step S102;
FIG. 3 is an alternative flow chart of a resistive patch energy tolerance test provided by an embodiment of the present application;
fig. 4 is a schematic structural diagram of a resistance card energy tolerance testing device according to an embodiment of the present application.
Detailed Description
In the related art, a single discrete current surge of energy is typically employed to withstand the arrester or the resistive sheet in the arrester. For example, conventional lightning arresters energy limit absorption capacity is rated in terms of a 2ms square wave. For another example, in the repeated transfer charge test, 20 current surges are performed using waveforms of 8/20 lightning surge current, 200 μs to 230 μs sinusoidal half-wave surge current, 2ms to 4ms square wave, or sinusoidal half-wave surge current. Specifically, the number of current surge was divided into 10 groups of 2 times each, and the surge current test was repeated. For another example, in the operation load test, 2 large current shocks may be performed using a 4/10 waveform.
However, the waveform and duration of the overvoltage in the power system are related to the type, the topological structure and the control strategy of the power system, the duration of the overvoltage varies from microseconds to hundreds of milliseconds, and the energy tolerance characteristics of the resistor sheet under the different waveforms and durations are different, so that the actual tolerance of the resistor sheet cannot be accurately determined when the resistor sheet of the lightning arrester is tested by adopting an energy test verification method. If the lightning arrester with insufficient tolerance is put into the actual operation process, the normal operation of the power grid is not facilitated, and even the tripping fault of the power grid is easier to cause.
According to research, initial values of the plurality of resistor discs are obtained respectively through selecting the plurality of resistor discs, then test operations of different rounds are carried out based on different test results in a cyclic iteration mode, and the ultimate energy tolerance value of the resistor disc of the lightning arrester under different waveforms and durations can be obtained. Therefore, various relations between the impulse current waveform and the resistance energy of the resistance sheet can be obtained, and support is provided for the selection and engineering application of the resistance sheet.
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present application more clear, the technical solutions of the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is apparent that the described embodiments are only some embodiments of the present application, but not all embodiments. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure.
Fig. 1 is a flowchart of a method for testing resistance of a resistor according to an embodiment of the present application. As shown in fig. 1, a method for testing resistance-card tolerance energy provided in an embodiment of the present application may include:
s101: and selecting a plurality of resistor sheets to obtain initial values of the resistor sheets respectively.
In this embodiment, a plurality of resistor sheets are selected as resistor sheets to be measured, and initial values of each resistor sheet to be measured are obtained respectively. The initial value of the resistor to be tested at least comprises the reference voltage, residual voltage and initial energy value of the resistor to be tested.
The reference voltage and residual voltage acquisition mode for the resistor to be measured is generally obtained through measurement. Reference voltage (U) of resistor ref Reference voltage of an arrester) is divided into power frequency reference voltages (U) refAC ) And a DC reference voltage (U) refDC ). Power frequency reference voltage (U) of resistor refAC Power-frequency reference voltage of anarrester) is the power frequency voltage peak of the resistor divided by the power frequency reference current measured when the resistor chip passes through the resistor chipDC reference voltage (U) of resistor refDC DC reference voltage of an arrester) is the average value of the dc voltage of the arrester measured when the resistor disc passes the dc reference current. Residual voltage is the voltage peak between the terminals of the arrester when discharge current flows through it. For example, 5 resistor pieces are selected as resistor pieces to be measured, direct current 1mA reference voltage measurement and residual voltage measurement under 0.5kA impact current are respectively carried out, initial reference voltages and initial residual voltages are recorded, the initial reference voltages of the 5 resistor pieces are respectively 4.95kV, 4.96kV, 4.94kV, 4.96kV and 4.95kV, and the initial residual voltages of the 5 resistor pieces are respectively 6.22kV, 6.23kV, 6.22kV, 6.23kV and 6.20kV.
The initial energy value of the resistor to be measured is generally obtained by calculation. Specifically, first, basic parameters such as the model and size of the resistor disc to be measured, typical energy tolerance density under 2ms square wave impact current and the like are confirmed, and then, the initial energy value of each resistor disc to be measured is calculated.
The calculation formula of the initial energy value is expressed as:
W＝η×V
where η is expressed as the energy density of the resistor sheet at a square wave impact current of 2ms and V is expressed as the volume of the resistor sheet.
For example, it was confirmed that the resistance to be measured had a withstand energy density of 240J/cm 3 The volume of the resistor disc to be measured is 190cm 3 And calculating according to the calculation formula of the initial energy value to obtain the initial tolerance energy value of the resistance sheet to be measured, wherein the initial tolerance energy value is 45.6kJ.
And obtaining initial values of the plurality of resistor pieces through the determination of the reference voltage, the residual voltage and the initial energy values of the selected plurality of resistor pieces, so as to provide initial value data for reference and test when the resistor pieces are subjected to energy tolerance test.
Optionally, the plurality of resistive patches in the embodiments of the present application are metal oxide resistive patches.
S102: and respectively carrying out impulse current tests on the plurality of resistance cards based on the set energy values to obtain an ith group of impulse current test result, and carrying out loop iteration until the nth group of impulse current test result does not meet the iteration condition, wherein the energy value of the nth-1 group or the nth group of impulse current test is used as the limit energy tolerance value of the resistance cards.
In this embodiment, the impact current tests are performed on the plurality of resistance cards respectively through the set energy values, wherein each impact current test is performed on the plurality of resistance cards respectively based on a certain set energy value, and the current impact current test set is recorded as the ith set, whether the ith set result meets the iteration condition is judged according to the current set, i.e. the impact current test result of the ith set, and if the ith set result meets the iteration condition, the set energy value is updated based on the ith set result to continue the test. That is, the set energy value in the i-th set of impact current test is obtained from the i-1-th set of iteration times, initial energy value, and iteration step.
The energy value calculation of the i-th group can be expressed as:
W i ＝[1+(P-λ)ζ]W 0
wherein ζ is represented as an iteration step, P is represented as an energy increment iteration number, λ is represented as an energy decrement iteration number, i is a positive integer greater than or equal to 1, W 0 Is the initial energy value.
It will be appreciated that the smaller the preset step size, the more accurate the result of the ultimate energy tolerance for the resistor disc.
And (3) circularly performing the impact current test until the result of the nth group does not meet the iteration condition, and taking the energy value set by the last group of the impact current test of the nth group, namely the n-1 group or the n group of impact current test with energy decreasing iteration as the limit energy tolerance value of the resistor. Specifically, when the nth group of results does not satisfy the iteration condition, that is, the states of the plurality of resistance cards of the group of tests cannot satisfy the condition for performing the next test or the test results of the nth group of tests have reached the standard of the test results, the test may be stopped, and the limit energy tolerance value of the resistance card is determined according to the test results of the nth group of tests according to the specific test situation. For example, when the nth group test is an energy increment iteration, that is, the type of iteration of the set energy value on the basis of the previous time is to increase the energy value so that the test result of the nth group impact current test after the impact test does not meet the iteration condition, the set energy value of the n-1 th group impact current test is taken as the limit energy tolerance value of the resistor disc; when the nth group of tests are energy decreasing iterations, that is, the type of the iteration of the set energy value on the basis of the previous iteration is to reduce the energy value so that the test result of the nth group of impact current tests after the impact test does not meet the iteration condition, the set energy value of the nth group of impact current tests is taken as the limit energy tolerance value of the resistor.
In the present embodiment, the set energy values are provided by different types of impact current waveforms. It will be appreciated that since i represents the group sequence of the rush current test, i is a positive integer of 1 or more and n is a positive integer of i or more.
Optionally, the different types of impulse current waveforms are 8/20 lightning impulse current, 0.1 ms-300 ms sinusoidal half-wave impulse current, 2 ms-100 ms square wave impulse current respectively.
Optionally, in the process of performing the impact current test on the plurality of resistor pieces based on the set energy value to obtain the test result of the i-th group of impact current test, in order to obtain the test result of the i-th group of impact current test, the embodiment of the application first performs the i-th group of impact current test on the plurality of resistor pieces based on the set energy, and further obtains the mechanical structure damage parameter of the resistor piece of the i-th group of impact current test and the resistor piece related parameter of the i-th group of impact current test.
Specifically, the mechanical damage parameter refers to the number of the resistor sheets having mechanical damage such as breakdown, flashover or cracking after the impact current test, for example, the surface breakdown phenomenon occurs in one resistor sheet after the impact current test in 5 resistor sheets, and the mechanical damage parameter is considered to be 1 in the impact current test of the group.
Wherein the related parameters of the resistor disc of the i-th group of impact current tests comprise the reference voltage of the resistor disc of the i-th group of impact current tests and the residual voltage of the resistor disc of the i-th group of impact current tests. It should be noted that, in the embodiment of the present application, in order to ensure the accuracy of the measurement result of each set of the impact current test, the measurement of the relevant parameter after each set of the impact current test is performed based on the measurement condition of the initial value. For example, 5 resistor sheets selected in the above example are used as resistor sheets to be measured, direct current 1mA reference voltage measurement and residual voltage measurement under 0.5kA surge current are respectively performed, initial reference voltage and initial residual voltage are recorded, after the i-th set surge current test, direct current 1mA reference voltage measurement and residual voltage measurement under 0.5kA surge current are respectively performed on a plurality of resistor sheets, and reference voltage and residual voltage of the resistor sheets after the surge current test are obtained.
And obtaining an i-th group impact current test result according to the mechanical structure parameters of the i-th group impact current test resistor, the reference voltage of the i-th group impact current test resistor and the residual voltage of the i-th group impact current test resistor.
Alternatively, in the process of performing the impact current test on the plurality of resistive sheets based on the set energy value to obtain the test result of the i-th group, in order to ensure the reliability of the test result, it is necessary to perform repeated tests for the test process a plurality of times. Therefore, m×3 times of impact current tests can be respectively carried out on the plurality of resistor pieces based on the set energy value to obtain an i-th group of impact current test result, wherein m is the sequence number in each group of impact current tests, 3 times of continuous impact current tests are respectively carried out on the plurality of resistor pieces corresponding to the group by using the set energy value in the process of the m-th sequence of impact current tests, the interval between each impact current test is 50 s-60 s, and the resistor pieces between each test sequence are cooled to room temperature. For example, 5 resistor pieces can be selected, and impact current tests are respectively carried out on the 5 resistor pieces, wherein the test of each resistor piece is 67 test sequences in total, each test sequence comprises 3 continuous impact current tests, the interval between each test sequence is based on the condition that the sample is cooled to the ambient temperature, and the interval of each test does not exceed the set time; after completion of the test sequence, the reference voltage and the residual voltage of the resistor after completion of the rush current test are measured based on the same conditions of the initial values, respectively, for example, the direct current 1mA reference voltage and the residual voltage at the rush current of 0.5kA of each of the resistor after completion of the rush current test are measured according to the initial value measurement example described above, and the corresponding values are recorded.
Optionally, fig. 2 is a flowchart of an optional method provided in the embodiment of the present application in the step S102, where the step S102 is iterated until the n-th set of impact current test results do not satisfy the iteration condition specifically may include:
s1021: and judging whether the i-th group impact current test result meets the iteration condition according to the i-th group impact current test result.
S1022: if the i-th group impact current test result meets the iteration condition, continuing to carry out loop iteration.
In a specific embodiment, there are two types of loop iteration that can be performed, and in particular, there are two types of loop iteration types including energy increment iteration and energy decrement iteration. When the i-th group impact current test result meets the iteration condition, determining a loop iteration type met by the i-th group impact current test result; and then calculating the energy value of the (i+1) th group according to the loop iteration type, and continuing the loop iteration.
Wherein the condition of the energy increment iteration comprises that the plurality of resistance sheets are free from damage and the related parameter variation of each resistance sheet in the plurality of resistance sheets is not more than 5 percent. The condition of the energy decreasing iteration includes that only one of the plurality of resistive patches has mechanical damage and the related parameter variation of other resistive patches of the plurality of resistive patches except for the mechanical damage is not more than 5%, or that the plurality of resistive patches does not have mechanical damage and the related parameter variation of only one resistive patch is more than 5%.
Optionally, calculating the energy value of the (i+1) th group according to the loop iteration type, continuing the loop iteration, and calculating the set energy value based on the initial energy value, the iteration step length and the iteration times
S1023: and if the i-th group of impact current test results do not meet the iteration conditions, taking the i-th group of impact current test results as the n-th group of impact current test results which do not meet the iteration conditions.
In the above embodiment, based on different iteration conditions, the measurement result of the limit energy of the resistor disc is reasonably converged to the accurate value by two iteration modes of energy increment iteration and energy decrement, so that the final measurement result of the limit energy tolerance value of the resistor disc can be more accurate.
In a specific embodiment, the failure to meet the iteration condition of the i-th set of impact current test results includes that two or more of the plurality of resistive patches are mechanically damaged, or that the plurality of resistive patches are mechanically damaged and the variation of the relevant parameter of two or more of the plurality of resistive patches is greater than 5%, or that one of the plurality of resistive patches is mechanically damaged and the variation of the relevant parameter of one of the plurality of resistive patches is greater than 5%, or that after the energy decrementing iteration, the plurality of resistive patches are mechanically damaged and the variation of the relevant parameter is no greater than 5%.
In an alternative embodiment, 5 resistance cards can be selected, the 5 resistance cards are respectively subjected to the impact current test during the i-th group impact current test, after the impact current test is finished, the mechanical damage condition of the 5 resistance cards and the related parameters of the resistance cards in the group of tests are confirmed, wherein the mechanical damage of two resistance cards occurs, the i-th group impact current test result is proved to not meet the iteration condition, the i-th group impact current test result is taken as the n-th group impact current test result which does not meet the iteration condition, and the loop iteration output result is finished. It will be appreciated that after confirming that there are two resistive patches mechanically damaged in the set of test results, there is no need to measure the relevant parameters of other resistive patches that are not mechanically damaged.
In another alternative embodiment, 5 resistance cards can be selected, the 5 resistance cards are respectively subjected to the impact current test in the ith group of impact current test, after the impact current test is finished, the mechanical damage condition of the 5 resistance cards and the related parameters of the resistance cards in the group of test are confirmed, wherein the 5 resistance cards are not mechanically damaged, the related parameters of the resistance cards without mechanical damage are further measured, the variation of the related parameters of two or more resistance cards is more than 5%, the fact that the ith group of impact current test result does not meet the iteration condition is indicated, the ith group of impact current test result is taken as the nth group of impact current test result which does not meet the iteration condition, and the cyclic iteration output result is ended.
In yet another alternative embodiment, 5 resistance cards may be selected, the 5 resistance cards are respectively subjected to the impact current test in the ith group of impact current test, after the impact current test is finished, the mechanical damage condition of the 5 resistance cards in the test and the related parameters of the resistance cards are confirmed, wherein one resistance card is mechanically damaged, the related parameters of the resistance cards without mechanical damage are further measured, the variation of the related parameters of the resistance card is greater than 5%, it is indicated that the test result of the ith group of impact current does not meet the iteration condition, the test result of the ith group of impact current is taken as the test result of the nth group of impact current which does not meet the iteration condition, and the cyclic iteration output result is finished.
In yet another alternative embodiment, 5 resistance cards may be selected, the 5 resistance cards are respectively subjected to the impact current test when the i-th group of energy decrements iterated impact current test, after the impact current test is finished, the mechanical damage condition of the 5 resistance cards and the related parameters of the resistance cards in the group of tests are confirmed, wherein the 5 resistance cards are free of mechanical damage, the variation of the related parameters of the 5 resistance cards is further measured to be not more than 5%, which indicates that the i-th group of impact current test result does not meet the iteration condition, the i-th group of impact current test result is regarded as the n-th group of impact current test result which does not meet the iteration condition, and the loop iteration output result is finished.
In the embodiment, test operations of different rounds are carried out based on different test results in a cyclic iteration mode, and the effect of obtaining the limit energy tolerance value of the lightning arrester resistor disc under different waveforms and durations is achieved. Thus, various relations between the impulse current waveform and the resistance of the resistor can be obtained, and support is provided for the selection and engineering application of the resistor.
For the above solution, a specific embodiment is provided, in this embodiment, taking the loop iteration type as an energy increment iteration as an example, a flowchart for executing the resistance card tolerance energy test in this solution is described. As illustrated in fig. 3, fig. 3 is an alternative flow chart of a resistive patch energy tolerance test provided by an embodiment of the present application. It should be noted that the implementations presented in the following description are only exemplary and not representative of all implementations of the embodiments of the present application.
As shown in connection with fig. 3, the process of testing the ultimate energy resistance of the resistor based on the resistor resistance test method of the present application may include:
s301: the extracted 5 metal oxide resistors are subjected to direct current 1mA reference voltage measurement and residual voltage measurement under 0.5kA impact current to obtain initial energy values of the 5 resistors.
In the present embodiment, the resistance card has a withstand energy density η of 240J/cm 3 V is 190cm 3 Initial withstand energy value W of resistor 0 =45.6 kJ, ζ is expressed as an iteration step of 0.1, a rush current waveform of 60ms sinusoidal half-wave rush current, initial reference voltage and initial residual voltage measurementThe quantitative results are shown in Table 1.
S302: and (3) carrying out 67 multiplied by 3 impact current tests on the 5 resistor sheets respectively through loop iteration, wherein 3 impact currents exist in each test sequence, the interval between each test sequence is 50-60 s, and the resistor sheets between each test sequence are cooled to room temperature.
S303: the 5 resistance cards after the test were subjected to direct-current 1mA reference voltage measurement and residual voltage measurement under 0.5kA impact current.
The measurement results are shown in table 1.
TABLE 1
In Table 1, i represents a group sequence of the rush current test, a represents the number of resistive sheets, U ref Represents a reference voltage, U res The residual voltage is expressed in kV and DeltaU ref Represents the reference voltage variation, deltaU res Indicating the residual pressure variation.
S304: the impact current test result is obtained based on the measurement results of direct current 1mA reference voltage measurement and residual voltage measurement under 0.5kA impact current on the 5 resistance cards after the test.
In this example, the results of the rush current test are shown in table 2.
TABLE 2
In Table 2 above, i represents the series of groups of the rush current test, a represents the number of resistive patches, and P represents the energy increment iterationThe number of times, lambda, is expressed as the number of energy decreasing iterations, W i Is the set energy value. From the table, in the present loop iteration impact experiment, mechanical damage occurs to the two resistance sheets after the 5 th group impact current experiment, and the loop iteration is ended without meeting the iteration condition.
S305: and obtaining the limit energy tolerance value of the resistor according to the impact current test cycle result.
In the present embodiment, the energy tolerance limit value of the resistor sheet is set to W by the 4 th group 1 ＝59.28kJ。
For the above solution, a specific embodiment is provided, in this embodiment, taking a loop iteration type including an energy increment iteration and an energy decrement iteration as an example, the execution flow of the resistance card tolerance energy test in this solution is described. It should be noted that the implementations presented in the following description are only exemplary and not representative of all implementations of the embodiments of the present application.
The process of testing the ultimate energy tolerance of the resistor disc based on the resistor disc tolerance energy test method of the present application may include:
the steps performed in this embodiment are the same as those of steps S301 to S303 above, and in this embodiment, the resistance card withstand energy density η is 280J/cm 3 V is 125cm 3 Initial withstand energy value W of resistor 0 =35 kJ, ζ is expressed as an iteration step of 0.1, the rush current waveform is a 60ms sinusoidal half-wave rush current, and the initial reference voltage and initial residual voltage measurements are shown in table 3. The 5 pieces of resistance after the test were subjected to direct-current 1mA reference voltage measurement and residual voltage measurement at an impact current of 0.5kA, and the measurement results are shown in Table 3.
TABLE 3 Table 3
/>
According to the above description, the meaning of the letter symbol in this embodiment will not be described again.
The impact current test result is obtained based on the measurement results of direct current 1mA reference voltage measurement and residual voltage measurement under 0.5kA impact current on the 5 resistance cards after the test.
In this example, the results of the rush current test are shown in table 4.
According to the above description, the meaning of the letter symbol in this embodiment will not be described again. From the table, in the present loop iteration impact experiment, mechanical damage occurs to one resistor after the 4 th group impact current experiment, and the variation of the relevant parameters of other resistor except the mechanical damage is not more than 5%, so that the energy decrementing iteration is satisfied. After the group 5 energy decrementing iteration impact current test, no mechanical damage exists in the resistor disc, the variation of related parameters is not more than 5%, and the iteration condition is not satisfied to finish the loop iteration. In the current loop iteration impact experiment, the energy increment and the energy decrement iteration are carried out.
And obtaining the limit energy tolerance value of the resistor according to the impact current test cycle result.
In the present embodiment, the energy tolerance limit value of the resistor sheet is set to be W by the 5 th group 2 ＝42kJ。
The embodiments of the present application provide some specific implementations of a resistance card tolerance energy testing method, and based on this, the present application also provides a corresponding device. The apparatus provided in the embodiments of the present application will be described from the viewpoint of functional modularization.
Referring to the schematic structure of the resistive patch energy tolerance test apparatus 400 shown in fig. 4, the apparatus 400 includes a first acquisition module 401 and a second acquisition module 402.
A first obtaining module 401, configured to select a plurality of resistance cards to obtain initial values of the plurality of resistance cards respectively; the initial value comprises a reference voltage, residual voltage and an initial energy value; the reference voltage and the residual voltage are obtained through measurement; the initial energy value is calculated based on the specification of each resistor disc;
the second obtaining module 402 is configured to perform an impact current test on the plurality of resistance cards based on the set energy values to obtain an ith set of impact current test results, and iterate in a loop until the nth set of impact current test results do not satisfy the iteration conditions, and then take the energy value of the n-1 th set or the nth set of impact current test as a limit energy tolerance value of the resistance card; the set energy values are respectively provided by corresponding different types of impulse current waveforms; the set energy value is obtained by calculation of an initial energy value and iteration times, i is a positive integer greater than or equal to 1, and n is a positive integer greater than or equal to i.
The first obtaining module 402 includes:
the judging unit is used for judging whether the i-th group impact current test result meets iteration conditions according to the i-th group impact current test result;
the iteration unit is used for continuing to carry out loop iteration if the ith group of impact current test results meet the iteration conditions;
the first acquisition unit is used for taking the ith group of impact current test results as the nth group of impact current test results which do not meet the iteration conditions if the ith group of impact current test results do not meet the iteration conditions.
The first obtaining module 402 includes:
the test unit is used for respectively carrying out an i-th group impact current test on the plurality of resistance sheets based on the set energy value;
the second acquisition unit is used for acquiring the mechanical structure damage parameters of the resistance card of the ith group of impact current tests and the resistance card related parameters of the ith group of impact current tests; the related parameters of the resistor disc of the i-th group of impact current test comprise the reference voltage of the resistor disc of the i-th group of impact current test and the residual voltage of the resistor disc of the i-th group of impact current test;
and the third acquisition unit is used for obtaining the i-th group impact current test result according to the mechanical structure parameters of the i-th group impact current test resistor, the reference voltage of the i-th group impact current test resistor and the residual voltage of the i-th group impact current test resistor.
The embodiment of the application also provides corresponding equipment and a computer storage medium, which are used for realizing the scheme provided by the embodiment of the application.
The device comprises a memory and a processor, wherein the memory is used for storing instructions or codes, and the processor is used for executing the instructions or codes to enable the device to execute the resistance card tolerance energy testing method according to any embodiment of the application.
The computer storage medium has code stored therein, and when the code is executed, a device executing the code implements the resistive patch withstand energy test method described in any embodiment of the present application.
The "first" and "second" in the names of "first", "second" (where present) and the like in the embodiments of the present application are used for name identification only, and do not represent the first and second in sequence.
From the above description of embodiments, it will be apparent to those skilled in the art that all or part of the steps of the above described example methods may be implemented in software plus general hardware platforms. Based on such understanding, the technical solutions of the present application may be embodied in the form of a software product, which may be stored in a storage medium, such as a read-only memory (ROM)/RAM, a magnetic disk, an optical disk, or the like, including several instructions for causing a computer device (which may be a personal computer, a server, or a network communication device such as a router) to perform the methods described in the embodiments or some parts of the embodiments of the present application.
In this specification, each embodiment is described in a progressive manner, and identical and similar parts of each embodiment are all referred to each other, and each embodiment mainly describes differences from other embodiments. In particular, for the device embodiments, since they are substantially similar to the method embodiments, the description is relatively simple, and reference is made to the description of the method embodiments for relevant points. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment. Those of ordinary skill in the art will understand and implement the present invention without undue burden.
The foregoing is merely exemplary embodiments of the present application and is not intended to limit the scope of the present application.
Claims (10)
1. A method of resistance sheet withstand energy testing, the method comprising:
selecting a plurality of resistor sheets to obtain initial values of the resistor sheets respectively; the initial value comprises a reference voltage, residual voltage and an initial energy value; the reference voltage and the residual voltage are obtained through measurement; the initial energy value is calculated based on the specification of each resistor disc;
respectively carrying out impact current tests on the plurality of resistance cards based on the set energy values to obtain an ith group of impact current test results, and carrying out loop iteration until the nth group of impact current test results do not meet the iteration conditions, wherein the set energy value of the nth-1 group or the nth group of impact current tests is used as the limit energy tolerance value of the resistance cards; the set energy values are respectively provided by corresponding different types of impulse current waveforms; the set energy value is obtained by calculation of an initial energy value and iteration times, i is a positive integer greater than or equal to 1, and n is a positive integer greater than or equal to i.
2. The method of claim 1, wherein iterating through the loop until the nth set of impact current test results do not satisfy an iteration condition comprises:
judging whether the i-th group impact current test result meets iteration conditions according to the i-th group impact current test result;
if the ith group of impact current test results meet the iteration conditions, continuing to carry out loop iteration;
and if the i-th group of impact current test results do not meet the iteration conditions, taking the i-th group of impact current test results as the n-th group of impact current test results which do not meet the iteration conditions.
3. The method of claim 2, wherein if the i-th set of impact current test results satisfy the iteration condition, continuing the loop iteration comprises:
when the i-th group impact current test result meets the iteration condition, determining a loop iteration type met by the i-th group impact current test result; the loop iteration type comprises an energy increment iteration and an energy decrement iteration; wherein the condition of the energy increment iteration comprises that the plurality of resistor discs are free from mechanical damage and the related parameter variation of each resistor disc in the plurality of resistor discs is not more than 5%; the condition of the energy decreasing iteration comprises that only one resistor sheet in the plurality of resistor sheets has mechanical damage and the related parameter variation of other resistor sheets except the mechanical damage in the plurality of resistor sheets is not more than 5 percent, or the plurality of resistor sheets does not have mechanical damage and the related parameter variation of only one resistor sheet is more than 5 percent;
And calculating the energy value of the (i+1) th group according to the loop iteration type, and continuing the loop iteration.
4. The method according to claim 1, characterized in that the set energy value is obtained by:
calculating to obtain a set energy value based on the initial energy value, the iteration step length and the iteration times:
W i ＝[1+(P-λ)ζ]W 0
wherein ζ is represented as an iteration step, P is represented as an energy increment iteration number, λ is represented as an energy decrement iteration number, i is a positive integer, W 0 Is the initial energy value.
5. The method of claim 2, wherein the i-th set of rush current test results do not satisfy the iteration condition comprises:
two or more of the plurality of resistor blocks are mechanically damaged, or the plurality of resistor blocks are not mechanically damaged, and the related parameter variation of two or more of the plurality of resistor blocks is more than 5%, or one of the plurality of resistor blocks is mechanically damaged, and the related parameter variation of one of the plurality of resistor blocks is more than 5%, or after energy decrementing iteration, the related parameter variation of the plurality of resistor blocks is not damaged, and is not more than 5%.
6. The method of claim 1, wherein performing the respective inrush current tests on the plurality of resistive patches based on the set energy values to obtain an i-th set of inrush current test results, comprises:
respectively performing an ith group of impact current tests on the plurality of resistance cards based on the set energy value;
obtaining mechanical structure damage parameters of the resistance card of the ith group of impact current tests and related parameters of the resistance card of the ith group of impact current tests; the related parameters of the resistor disc of the i-th group of impact current test comprise the reference voltage of the resistor disc of the i-th group of impact current test and the residual voltage of the resistor disc of the i-th group of impact current test;
and obtaining the result of the i-th group of impact current test according to the mechanical structure parameters of the i-th group of impact current test resistor, the reference voltage of the i-th group of impact current test resistor and the residual voltage of the i-th group of impact current test resistor.
7. The method according to claim 1 or 6, wherein the performing an i-th group of rush current test on the plurality of resistive patches, respectively, based on the set energy value, comprises:
respectively performing m×3 impact current tests on the plurality of resistance sheets based on the set energy value; wherein m is the number of test sequences of each group of impact current tests, and each sequence has 3 impact current tests; the interval between each impact current test is 50 s-60 s; the resistor was cooled to room temperature between each series of inrush current tests.
8. The method of claim 1, wherein the plurality of resistive patches are metal oxide resistive patches.
9. The method according to claim 1, characterized in that said different types of impulse current waveforms comprise in particular:
the different types of impulse current waveforms are respectively 8/20 lightning impulse current, 0.1 ms-300 ms sine half-wave impulse current or 2 ms-100 ms square wave impulse current.
10. A resistive patch energy tolerance test apparatus, the apparatus comprising:
the first acquisition module is used for selecting a plurality of resistor discs to respectively acquire initial values of the resistor discs; the initial value comprises a reference voltage, residual voltage and an initial energy value; the reference voltage and the residual voltage are obtained through measurement; the initial energy value is calculated based on the specification of each resistor disc;
the second acquisition module is used for respectively carrying out impact current tests on the plurality of resistance sheets based on the set energy values to obtain an ith group of impact current test results, and carrying out loop iteration until the nth group of impact current test results do not meet the iteration conditions, wherein the energy value of the nth-1 group or the nth group of impact current test is used as the limit energy tolerance value of the resistance sheets; the set energy values are respectively provided by corresponding different types of impulse current waveforms; the set energy value is obtained by calculation of an initial energy value and iteration times, i is a positive integer greater than or equal to 1, and n is a positive integer greater than or equal to i.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310465998.1A CN116520102A (en) | 2023-04-26 | 2023-04-26 | Resistance card endurance energy test method, device, equipment and storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310465998.1A CN116520102A (en) | 2023-04-26 | 2023-04-26 | Resistance card endurance energy test method, device, equipment and storage medium |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN116520102A true CN116520102A (en) | 2023-08-01 |
Family
ID=87393522
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310465998.1A Pending CN116520102A (en) | 2023-04-26 | 2023-04-26 | Resistance card endurance energy test method, device, equipment and storage medium |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116520102A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117310422A (en) * | 2023-12-01 | 2023-12-29 | 四川永星电子有限公司 | Initiating explosive device resistor performance test method and system |
-
2023
- 2023-04-26 CN CN202310465998.1A patent/CN116520102A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117310422A (en) * | 2023-12-01 | 2023-12-29 | 四川永星电子有限公司 | Initiating explosive device resistor performance test method and system |
| CN117310422B (en) * | 2023-12-01 | 2024-02-23 | 四川永星电子有限公司 | Initiating explosive device resistor performance test method and system |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Magro et al. | Validation of ZnO surge arresters model for overvoltage studies | |
| CN110161304B (en) | Method for calculating absorbed energy and residual voltage of line arrester under action of multiple lightning | |
| CN103743968A (en) | Metal oxide arrester multiple-lightning-current withstand test method | |
| CN116520102A (en) | Resistance card endurance energy test method, device, equipment and storage medium | |
| CN108614213B (en) | Polarity test method for generator-transformer group differential protection | |
| Christodoulou et al. | Parameters' optimisation for surge arrester circuit models | |
| CN115718238A (en) | Saturable reactor iron core aging performance test method, reflection method and device | |
| Savic | Estimation of the surge arrester outage rate caused by lightning overvoltages | |
| CN107192917B (en) | The anti-short circuit capability experimental method and system of a kind of transformer under cumulative effect | |
| CN116184135A (en) | Analysis method and system for energy tolerance characteristics of resistor disc under multi-impact waveform | |
| CN110190617B (en) | Evaluation method, system, device and storage medium for multi-feed-in direct current power system | |
| Mardira et al. | A simplified lightning model for metal oxide surge arrester | |
| CN110765731B (en) | Lightning overvoltage simulation calculation method and device of current limiter and computer equipment | |
| Christodoulou et al. | Simulation of metal oxide surge arresters behavior | |
| CN110826255A (en) | Modeling method for winding coil component in electric equipment | |
| Zhou et al. | Impulse life evaluation method of MOV based on Weibull distribution | |
| Bezerra et al. | Evaluation of surge arrester models for overvoltage studies | |
| Rousseau et al. | Multiple shots on SPDs—Additional tests | |
| He et al. | Experimental validation of MOA simulation models for energy absorption estimation under different impulse currents | |
| Khanmiri et al. | Unipolar and bipolar degradation of low voltage Metal Oxide Varistors | |
| Lopes et al. | Lightning withstand of medium voltage cut-out fuses stressed by nonstandard impulse shapes experimental results | |
| CN109858077B (en) | Characteristic curve parameter identification method and system for operating impact lower voltage limiter | |
| CN111130069B (en) | Method and system for calculating direct current power grid line operation overvoltage | |
| Diaz et al. | Simulation and test on surge arrester in high-voltage laboratory | |
| CN112649694A (en) | Method for judging single-phase earth fault of small-current grounding system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |