CN117194123A

CN117194123A - RAID card testing method, testing device and testing jig board

Info

Publication number: CN117194123A
Application number: CN202311083278.5A
Authority: CN
Inventors: 袁斌; 于泉泉; 贾生鹏; 王龙罡
Original assignee: Suzhou Inspur Intelligent Technology Co Ltd
Current assignee: Suzhou Inspur Intelligent Technology Co Ltd
Priority date: 2023-08-25
Filing date: 2023-08-25
Publication date: 2023-12-08

Abstract

The invention provides a RAID card testing method, a testing device and a testing jig board, wherein the method comprises the following steps: receiving configuration information of a RAID card sent by an upper computer, and determining a test mode of the RAID card as a configuration test mode; managing the RAID card through a target management protocol, and reading the RAID card to obtain RAID card configuration, disk type and disk sequence information; and comparing the configuration information of the RAID card sent by the upper computer with the configuration information, the disk type and the disk sequence information of the RAID card to obtain a configuration test result. According to the invention, the test jig board is respectively connected with the RAID card and the upper computer, so that the automatic test of the RAID card is realized, and the accuracy and the test efficiency of the identification of the RAID card configuration item are improved.

Description

RAID card testing method, testing device and testing jig board

Technical Field

The present invention relates to the field of server technologies, and in particular, to a RAID card testing method, testing apparatus, and testing jig board.

Background

With the continuous development of computer technology, the performance requirements of informatization services and increasingly powerful cloud computing services on servers are increasing. In a server, a RAID card is used as a bridge for connecting hard disks, and the performance of the RAID card has a direct influence on the whole storage architecture, so that during development and use of the RAID card, it is often necessary to check and test projects such as RAID card configuration and performance.

At present, whether RAID card configuration options are correct or not is checked, and a technician is required to manually check the check items; in the process of testing the performance of the RAID card, a technician is required to continuously input a command to advance the process of testing the RAID card, for example: checking whether each configuration option of the RAID card is correct under the BIOS; the RAID card and hard disk mounting process requires a technician to input a command to complete, and the subsequent testing process also requires the technician to push through the command; i.e., the entire inspection and testing process requires the involvement of a technician, who cannot inspect and test the RAID card configuration options and performance.

Disclosure of Invention

The invention provides a RAID card testing method, a testing device and a testing jig plate, which are used for solving the defect that the whole checking and testing process in the prior art needs the participation of technicians, but cannot check and test RAID card configuration options and performances, realizing the automatic testing of RAID cards and improving the accuracy and testing efficiency of RAID card configuration item identification.

The invention provides a RAID card testing method, which is applied to a testing jig board, and comprises the following steps:

receiving configuration information of a RAID card sent by an upper computer, and determining a test mode of the RAID card as a configuration test mode;

managing the RAID card through a target management protocol, and reading the RAID card to obtain RAID card configuration, disk type and disk sequence information;

and comparing the configuration information of the RAID card sent by the upper computer with the configuration information, the disk type and the disk sequence information of the RAID card to obtain a configuration test result.

According to the RAID card testing method provided by the invention, the method further comprises the following steps:

receiving performance information of a RAID card sent by an upper computer, and determining a test mode of the RAID card as a performance test mode;

managing the RAID card through the target management protocol, and configuring a group RAID mode corresponding to the RAID card;

and carrying out data exchange on the RAID, and simulating performance test of the RAID card under each configuration to obtain a performance test result.

According to the RAID card testing method provided by the invention, the testing jig board comprises an FPGA module and a connector module;

the method further comprises the steps of:

and the FPGA module configures an interface of the connector module connection side as a target management protocol, and transmits the bit information of the simulated hard disk backboard to the RAID card through a target pin.

According to the RAID card testing method provided by the invention, the testing jig plate comprises an optical port module;

the method further comprises the steps of:

and receiving test data sent by the upper computer based on the optical port module, and sending a configuration test result or a performance test result of the generated RAID card to the upper computer through the optical port module so as to realize optical port communication between the upper computer and the test jig board.

According to the method for testing the RAID card provided by the invention, the performance test of the RAID card under each configuration is simulated to obtain a performance test result, and the method comprises the following steps:

simulating a first number of first hard disks and a second number of second hard disks;

and performing performance test under the configuration of each communication protocol and each bandwidth compatible with the PCIE link to obtain the performance test result.

The invention also provides a RAID card testing device applied to the testing jig board, comprising:

the receiving unit is used for receiving the configuration information of the RAID card sent by the upper computer and determining the test mode of the RAID card as a configuration test mode;

the reading unit is used for managing the RAID card through a target management protocol, reading the RAID card and obtaining RAID card configuration, disk type and disk sequence information;

and the testing unit is used for comparing the configuration information of the RAID card sent by the upper computer with the configuration information of the RAID card, the disk type and the disk sequence information to obtain a configuration testing result.

The invention also provides a test jig plate, comprising: the optical port connecting module is connected with the FPGA module, and the FPGA module is connected with the peripheral circuit module;

the peripheral circuit module comprises a first clamping groove and a second clamping groove; the FPGA module is connected with the RAID card golden finger through the first clamping groove in an uplink manner, and is connected with the connector through the second clamping groove in a downlink manner so as to simulate the on-site information of the hard disk backboard and send the on-site information to the RAID card;

the optical port connection module is used for carrying out data interaction with external equipment.

According to the test jig board provided by the invention, the peripheral circuit module further comprises a control circuit, wherein the control circuit is used for controlling the power-on and power-off time sequence management of the FPGA module and controlling the power-on and power-off functions of the second clamping groove so as to realize the hot plug of the RAID card.

The invention also provides an electronic device comprising a memory, a processor and a computer program stored on the memory and capable of running on the processor, wherein the processor realizes the RAID card testing method according to any one of the above when executing the program.

The present invention also provides a non-transitory computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements a RAID card testing method as described in any of the above.

The invention also provides a computer program product comprising a computer program which when executed by a processor implements a RAID card testing method as described in any of the preceding.

According to the RAID card testing method, testing device and testing jig board provided by the invention, the configuration information of the RAID card sent by the upper computer is received, the testing mode of the RAID card is determined to be the configuration testing mode, the RAID card is managed through the target management protocol, the RAID card is read to obtain the configuration information, the disk type and the disk sequence information of the RAID card, the configuration information of the RAID card sent by the upper computer is compared with the configuration information, the disk type and the disk sequence information of the RAID card to obtain the configuration testing result, and the testing jig board is respectively connected with the RAID card and the upper computer, so that the automatic testing of the RAID card is realized, and the accuracy and the testing efficiency of the identification of the configuration items of the RAID card are improved.

Drawings

In order to more clearly illustrate the invention or the technical solutions of the prior art, the following description will briefly explain the drawings used in the embodiments or the description of the prior art, and it is obvious that the drawings in the following description are some embodiments of the invention, and other drawings can be obtained according to the drawings without inventive effort for a person skilled in the art.

FIG. 1 is a schematic flow chart of a RAID card test method provided by the present invention;

FIG. 2 is a second flow chart of a RAID card test method according to the present invention;

FIG. 3 is a third flow chart of a RAID card test method according to the present invention;

FIG. 4 is a schematic diagram of a RAID card test device according to the present invention;

FIG. 5 is a schematic diagram of a test fixture board according to the present invention;

FIG. 6 is a schematic diagram of a test fixture board according to the present invention;

fig. 7 is a schematic structural diagram of an electronic device provided by the present invention.

Detailed Description

For the purpose of making the objects, technical solutions and advantages of the present invention more apparent, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is apparent that the described embodiments are some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.

At present, whether RAID card configuration options are correct or not is checked, and a technician is required to manually check the check items; in the process of testing the performance of the RAID card, a technician is required to continuously input a command to advance the process of testing the RAID card, for example: 1. checking whether each configuration option of the RAID card is correct under the BIOS; 2. the RAID card and hard disk mounting process requires a technician to input a command to complete, and the subsequent testing process also requires the technician to push through the command; i.e., the entire inspection and testing process requires the involvement of a technician, who cannot inspect and test the RAID card configuration options and performance.

Referring to fig. 1, the RAID card testing method provided by the present invention is applied to a testing jig board, and the method includes the following steps:

step 110, receiving configuration information of a RAID card sent by an upper computer, and determining a test mode of the RAID card as a configuration test mode;

step 120, managing the RAID card through a target management protocol, and reading the RAID card to obtain RAID card configuration, disk type and disk sequence information;

and 130, comparing the configuration information of the RAID card sent by the upper computer with the configuration information of the RAID card, the disk type and the disk sequence information to obtain a configuration test result.

In step 110, the upper computer is a computer that performs control, management, and data processing tasks in a computing system, and generally refers to a computer that communicates with and interacts with peripheral devices, embedded systems, or other lower devices.

The upper computer sends the configuration information of the RAID card to the test jig board, and the test jig board sets the test mode of the RAID card to be the configuration test mode.

The RAID card is then managed by a target management protocol, which may be MCTP or PBSI, via step 120 described above.

Note that MCTP (Management Component Transport Protocol) is an open standard protocol for managing communications between devices. PBSI (Platform BIOS Serial Interfaces) is an interface protocol for communicating with the Basic Input Output System (BIOS) of a computer platform.

MCTP is a protocol for managing communications between devices for remote management and monitoring of hardware components in a computer system. And PBSI is an interface protocol for serial communication with the BIOS of a computer platform for controlling and configuring system features and functions.

And then reading the RAID card to obtain RAID card configuration, disk type and disk sequence information.

The configuration of the RAID card includes information of RAID level, for example, RAID 0, RAID 1, RAID 5, etc., which determines the storage and protection modes of data in the hard disk array.

Information that the disk type is of the hard disk drive type, such as SATA (serial ATA), SAS (serial attached SCSI), NVMe (nonvolatile memory express), etc., is important for determining the interface and performance characteristics of the hard disk drive.

The disk order information in the RAID card configuration describes the physical location or order of the hard disk drives in the array, with the disk order indicating the number or identifier of the hard disk drive in order to properly manage and operate the RAID array.

Finally, through the step 130, the configuration information of the RAID card sent by the upper computer is compared with the read configuration, disk type and disk sequence information of the RAID card to obtain a configuration test result, so as to realize the automatic test of the RAID card.

Optionally, the method further comprises:

The embodiment is a performance test process of the RAID card.

It should be noted that, the performance test procedure in this embodiment is different from the configuration test procedure in the above embodiment, and in the performance test in this embodiment, performance information needs to be sent to the test jig board by the host computer, and the test jig board needs to configure the RAID card.

In this embodiment, first, information about performance of the RAID card sent by the host computer is received, and a test mode is set to a performance test mode. The RAID card is then managed, again using the target management protocol in the above embodiment, and the group RAID mode of the RAID card is configured.

It should be noted that, the group RAID mode refers to a manner of configuring a plurality of hard disk drives in a RAID array to achieve data redundancy, performance optimization, or both, and the group RAID mode determines how the hard disk drives are combined together and form a logical RAID array.

Illustratively, common group RAID modes include the following:

RAID 0: RAID 0 mode combines multiple hard disk drives into one large capacity virtual drive, and uniformly distributes data across the drives in a data striping (striping) manner. Therefore, the data reading and writing performance can be improved, but the redundant backup function is not provided, and the data is completely lost due to the fact that one hard disk drive fails.

RAID 1: RAID 1 mode requires at least two hard disk drives to be mirrored in pairs, i.e., each data is written to both drives simultaneously. RAID 1 provides data redundancy and fault tolerance, and may continue to operate using data in mirrored drives in the event of a failure of one hard disk drive.

RAID 5: the RAID 5 mode requires at least three hard disk drives and uses data striping and parity (parity) to distribute the data across the drives. Parity data is used to recover lost data when a certain drive fails. RAID 5 provides better read-write performance and data redundancy functions.

RAID 6: RAID 6 mode extends the concept of RAID 5, providing a higher level of data redundancy and fault tolerance using striping and double parity across at least four hard disk drives. RAID 6 can tolerate failures of both hard disk drives simultaneously.

And finally, carrying out data exchange on RAID by using the determined group RAID mode, and simulating performance test of the RAID card under each configuration to obtain a performance test result.

According to the RAID card testing method, the performance information of the RAID card sent by the upper computer is received, the RAID card is subjected to performance testing by configuring the corresponding RAID mode of the RAID, so that the testing result of the RAID card is obtained, the problem that the performance testing is performed by using the server platform, the building cost of the testing platform is high, and the testing of different disk types needs to be manually replaced is solved, and the performance testing efficiency of the RAID card is improved.

Further, the test jig board comprises an FPGA module and a connector module;

the method further comprises the steps of:

Specifically, in this embodiment, the FPGA module of the test fixture board configures the interface on the Slimline connection side to be of a PCIE/SAS/SATA protocol type, and simulates the in-place information of the hard disk back plate to the RAID card through SGPIO/VPP.

It should be noted that, corresponding pins of the FPGA module are connected with the PCIE SLOT card SLOT and the Slimline connector, SGPIO signals of the Slimline connector are connected with GPIO pins of the FPGA, so as to support SPGIO lighting and VPP lighting, and simulate different backboard in-place signals, NVME disc in-place signals, and the like.

Note that the Slimline connector is a connector type commonly used in an FPGA (field programmable gate array). Slimline connectors are generally compact in design, have smaller dimensions and low insertion force, and are suitable for application scenarios with high-density layout and space constraints. The Slimline connector can be used for connecting signal transmission between the FPGA and other external devices or modules. It typically provides a plurality of pins (pins), each carrying a different signal line, e.g., clock, data, control signals, etc.

According to the RAID card testing method provided by the invention, the SGPIO/VPP simulates the bit information of the hard disk backboard to the RAID card so as to ensure that the RAID card correctly identifies and manages the state of the slot panel (such as a hard disk drive), thereby helping the RAID card to accurately judge whether the slot panel exists or not and whether the slot panel is correctly positioned or not, and carrying out corresponding configuration and operation. By providing accurate slot panel status information, the RAID card is assisted in properly managing and configuring the hard disk drive, improving reliability, stability, and operability of the system.

Further, the test jig plate comprises an optical port module;

the method further comprises the steps of:

Specifically, in this embodiment, the test fixture board supports the QSFP28 optical port, and may be connected to a server, a computer, a switch, etc. through the optical port, so that information such as test data in the upper computer may be transferred to the fixture board through the optical port, and a test report of the fixture board to RAID may also be transferred through the optical port.

It should be noted that the QSFP28 optical port in this embodiment is only one exemplary optical port. And the QSFP28 optical port is a high-speed network connection interface for transmitting data and communications. QSFP28, which represents a Quad Small Form-factor plug 28, is a Small-sized Pluggable module with four channels, each supporting a maximum transmission rate of 28Gbps (or up to 56Gbps when PAM4 modulation techniques are employed).

The QSFP28 optical port is typically used for high-bandwidth connections between high-performance computing, data centers, cloud computing, and network equipment, and may be used for long-distance transmission over optical fibers, or short-distance transmission over copper cables, to provide high-bandwidth data transmission capability.

Further, the simulating the performance test of the RAID card under each configuration to obtain a performance test result includes:

Specifically, the test fixture board in this embodiment simulates a maximum of 16 SAS/SATA disks and 4 hard disks of NVME X4, and can be compatible with SAS/SATA/PCIE protocols through PCIE links, so as to complete support of read-write functions under different protocols and different bandwidths, thereby obtaining performance test results of the RAID card.

Note that SAS (Serial Attached SCSI) and SATA (Serial ATA) are common storage interfaces for connecting hard disk drives and other storage devices. One jig board may simulate multiple SAS/SATA disks for testing, data transmission, etc. Among the information you provide, the jig board supports a maximum of 16 SAS/SATA disks.

In addition, the jig plate also supports at most 4 hard disks of NVMe (Non-Volatile Memory Express) x 4. NVMe is a high-performance storage interface, designed specifically for Solid State Disks (SSD). Each NVMe hard disk is connected with the jig board through a PCIe x4 interface, so that higher transmission speed and lower delay are provided.

The test fixture board in this embodiment can simulate a maximum of 16 SAS/SATA disks and 4 NVMe x4 hard disks simultaneously, and is used for testing and connecting these storage devices, so that the storage device test requirements can be met at a certain scale and high-performance data transmission capability can be provided.

Referring to fig. 2, the performance test process of the RAID card test method provided in the present invention in fig. 2 includes the following steps:

step 210, the upper computer inputs relevant configuration information of the RAID of the jig board, and sets a corresponding test mode;

220, the jig board FPGA configures an interface of the Slimline connection side into protocol types such as PCIE/SAS/SATA, and simulates the in-place information of the hard disk backboard to the RAID card through SGPIO/VPP;

230, managing the RAID card through MCTP/PBSI, and reading each configuration option and basic function of the RAID card;

and 240, the jig board compares the information such as the configuration, the disk type, the disk sequence and the like of the read RAID card with the information input by the upper computer, and outputs a test result.

Referring to fig. 3, the configuration test process of the RAID card test method provided in the present invention in fig. 3 includes the following steps:

step 310, the upper computer inputs relevant information of the RAID of the jig board, and sets a corresponding test mode;

step 320, the jig board FPGA configures the interface of the Slimline connection side as protocol types such as PCIE/SAS/SATA, and simulates the in-place information of the hard disk back plate to the RAID card through SGPIO/VPP;

step 330, managing the RAID card through MCTP/PBSI, and configuring a group RAID mode corresponding to the RAID card;

and 340, exchanging data between the jig board and the RAID card, and simulating performance tests under various configurations.

The RAID card testing device provided by the invention is described below, and the RAID card testing device described below and the RAID card testing method described above can be referred to correspondingly.

Referring to fig. 4, the present invention provides a RAID card testing apparatus applied to a test jig board, the apparatus comprising:

a receiving unit 410, configured to receive configuration information of a RAID card sent by an upper computer, and determine that a test mode of the RAID card is a configuration test mode;

a reading unit 420, configured to manage the RAID card through a target management protocol, and read the RAID card to obtain RAID card configuration, disk type, and disk sequence information;

and the testing unit 430 is configured to compare the configuration information of the RAID card sent by the upper computer with the RAID card configuration, the disk type, and the disk sequence information, to obtain a configuration test result.

In the receiving unit 410, the upper computer refers to a computer that performs control, management, and data processing tasks in a computing system, and generally refers to a computer that communicates with and interacts with peripheral devices, embedded systems, or other lower devices.

The RAID card is then managed by the above-described reading unit 420 through a target management protocol, which may be MCTP or PBSI protocol.

And finally, comparing the configuration information of the RAID card sent by the upper computer with the RAID card configuration, the disk type and the disk sequence information obtained by reading through the testing unit 430 to obtain a configuration testing result, thereby realizing the automatic testing of the RAID card.

According to the RAID card testing device, the configuration information of the RAID card sent by the upper computer is received, the testing mode of the RAID card is determined to be the configuration testing mode, the RAID card is managed through the target management protocol, the RAID card is read to obtain the configuration information, the disk type and the disk sequence information of the RAID card, the configuration information of the RAID card, the disk type and the disk sequence information sent by the upper computer are compared to obtain the configuration testing result, and the testing jig board is respectively connected with the RAID card and the upper computer, so that the automatic testing of the RAID card is realized, and the accuracy and the testing efficiency of the identification of the configuration items of the RAID card are improved.

In some alternative embodiments, the apparatus further comprises a performance testing unit for:

In some alternative embodiments, the test fixture board includes an FPGA module and a connector module;

the device further comprises an on-site information sending unit, wherein the on-site information sending unit is used for:

In some optional embodiments, the test fixture plate includes an optical port module;

the apparatus further comprises a communication unit for:

In some optional embodiments, the simulating the performance test of the RAID card under each configuration, to obtain a performance test result includes:

Referring to fig. 5, the present invention further provides a test jig board, including: the optical port connection module 510, the FPGA module 520 and the peripheral circuit module 530 are connected with each other, and the FPGA module is connected with the peripheral circuit module;

It should be noted that, the firmware of the FPGA module is compatible with MCTP/PBSI protocol, and can check all information of RAID, such as master control chip model, firmware version, board card temperature, configuration options, in-place information of the disk, and disk sequence, and compare with the information of the standard RAID card of the type of database, and output test results.

It should be noted that, the first card SLOT is an uplink PCIE SLOT card SLOT, and the second card SLOT is a downlink connector card SLOT.

An upstream PCIE SLOT is an interface for connecting an external device to a computer motherboard. Are commonly used to insert expansion cards into a computer motherboard to provide additional functionality or performance. In the upstream PCIE SLOT, data is transferred over a PCI Express (PCIE) bus. Such interfaces use high-speed serial communications to transfer data and have a higher bandwidth and lower latency.

In this embodiment, the RAID is inserted through the uplink PCIE SLOT card SLOT to perform connection, and in other embodiments, other various types of expansion cards, such as Graphics Processing Units (GPUs), network adapters, storage controllers, and sound cards, may be inserted, where the expansion cards may enhance performance, functions, and connection options of the computer.

The test jig board can perform performance test with the configured RAID card through uplink and downlink PCIE links, such as read-write speed test under different RAID modes, and the like.

Further, the peripheral circuit module further comprises a control circuit, and the control circuit is used for controlling power-on and power-off time sequence management of the FPGA module and controlling power-on and power-off functions of the second card slot so as to realize hot plug of the RAID card.

In this embodiment, the power management module, i.e. the control circuit, is built in the test jig board, and the PCIE SLOT card SLOT can be independently powered on and off, so as to implement hot plug of the RAID card on the jig board, reduce the time for replacing the RAID, and improve efficiency.

Referring to fig. 6, fig. 6 is a chip topology diagram of the test fixture board provided by the present invention.

The test jig board comprises a core main control circuit: high performance FPGA (such as Intel AGFB027R25A2E 3E) and peripheral circuits thereof are used as cores; the periphery of the FPGA is provided with 9 DRAMs, namely a dynamic random access memory with an ECC error correction function, so that data for performance test can be cached in the FPGA; through the PCIE Gen4 function supported by the FAPGA, corresponding pins and PCIE SLOT card SLOTs are connected with a Slimline connector, SGPIO signals of the Slimline connector are connected with GPIO pins of an FPGA, SPGIO lighting and VPP electric lamps are supported, and different backboard in-place signals, NVME disc in-place signals and the like can be simulated.

It should be noted that SGPIO (Serial General Purpose Input/Output) and VPP (Voltage Programming Pin) are interfaces and signals for communicating with external devices. In some hardware architectures, SGPIO may be used to transfer backplane bit information to RAID cards. The RAID card in this embodiment needs to acquire information on whether or not the hard disk drive is present in order to properly configure and manage the RAID array.

CPLD control circuit: the CPLD is mainly responsible for the power on and off time sequence management of the FPGA and controlling the power on and off function of the PCIE SLOT card SLOT to finish the hot plug function of the RAID card on the jig board;

the optical port connection module: the test fixture supports a QSFP28 optical port, can be connected with equipment such as a server, a computer, a switch and the like through the optical port, can transmit information such as test data in an upper computer to a fixture board through the optical port, and can transmit test reports and the like of RAID (redundant array of independent disks) through the optical port.

Fig. 7 illustrates a physical schematic diagram of an electronic device, as shown in fig. 7, which may include: processor 710, communication interface (Communications Interface) 720, memory 730, and communication bus 740, wherein processor 710, communication interface 720, memory 730 communicate with each other via communication bus 740. Processor 710 may invoke logic instructions in memory 730 to perform a RAID card test method comprising:

Further, the logic instructions in the memory 730 described above may be implemented in the form of software functional units and may be stored in a computer readable storage medium when sold or used as a stand alone product. Based on this understanding, the technical solution of the present invention may be embodied essentially or in a part contributing to the prior art or in a part of the technical solution, in the form of a software product stored in a storage medium, comprising several instructions for causing a computer device (which may be a personal computer, a server, a network device, etc.) to perform all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), a magnetic disk, or an optical disk, or other various media capable of storing program codes.

In another aspect, the present invention also provides a computer program product, where the computer program product includes a computer program, where the computer program can be stored on a non-transitory computer readable storage medium, and when the computer program is executed by a processor, the computer can execute a RAID card testing method provided by the above methods, and the method includes:

In yet another aspect, the present invention also provides a non-transitory computer readable storage medium having stored thereon a computer program which, when executed by a processor, is implemented to perform a RAID card testing method provided by the above methods, the method comprising:

The apparatus embodiments described above are merely illustrative, wherein the elements illustrated as separate elements may or may not be physically separate, and the elements shown as elements may or may not be physical elements, may be located in one place, or may be distributed over a plurality of network elements. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment. Those of ordinary skill in the art will understand and implement the present invention without undue burden.

From the above description of the embodiments, it will be apparent to those skilled in the art that the embodiments may be implemented by means of software plus necessary general hardware platforms, or of course may be implemented by means of hardware. Based on this understanding, the foregoing technical solution may be embodied essentially or in a part contributing to the prior art in the form of a software product, which may be stored in a computer readable storage medium, such as ROM/RAM, a magnetic disk, an optical disk, etc., including several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the method described in the respective embodiments or some parts of the embodiments.

Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and are not limiting; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A RAID card testing method, applied to a test jig board, comprising:

2. The RAID card testing method of claim 1, wherein the method further comprises:

3. The RAID card testing method of claim 1 or 2 wherein the test jig board comprises an FPGA module and a connector module;

the method further comprises the steps of:

4. The RAID card testing method of claim 1 or 2 wherein the test jig board comprises an optical port module;

the method further comprises the steps of:

5. The method for testing a RAID card according to claim 2, wherein simulating performance testing of the RAID card under each configuration to obtain a performance test result comprises:

6. A RAID card testing apparatus for use with a test fixture board, the apparatus comprising:

7. A test jig board, comprising: the optical port connecting module is connected with the FPGA module, and the FPGA module is connected with the peripheral circuit module;

8. The test fixture board of claim 7, wherein the peripheral circuit module further comprises a control circuit for controlling power up and power down timing management of the FPGA module and controlling power up and power down functions of the second card slot to implement hot plug of the RAID card.

9. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements the RAID card testing method of any of claims 1 to 5 when the program is executed by the processor.

10. A non-transitory computer readable storage medium having stored thereon a computer program, which when executed by a processor implements the RAID card testing method of any of claims 1 to 5.