CN117192419A - Power supply test system, method, equipment and storage medium - Google Patents
Power supply test system, method, equipment and storage medium Download PDFInfo
- Publication number
- CN117192419A CN117192419A CN202310964546.8A CN202310964546A CN117192419A CN 117192419 A CN117192419 A CN 117192419A CN 202310964546 A CN202310964546 A CN 202310964546A CN 117192419 A CN117192419 A CN 117192419A
- Authority
- CN
- China
- Prior art keywords
- circuit
- microprocessor
- current
- protection circuit
- power supply
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 101
- 238000000034 method Methods 0.000 title claims abstract description 15
- 238000001514 detection method Methods 0.000 claims description 16
- 238000010998 test method Methods 0.000 claims 1
- 230000006870 function Effects 0.000 description 22
- 238000010586 diagram Methods 0.000 description 10
- 238000005516 engineering process Methods 0.000 description 5
- 230000008901 benefit Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 238000012986 modification Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- 238000006467 substitution reaction Methods 0.000 description 4
- 230000008569 process Effects 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 238000003491 array Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 108010001267 Protein Subunits Proteins 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The application discloses a power supply test system, a method, equipment and a storage medium, wherein the system comprises terminal equipment and a power supply test load board card; the power supply test load board card comprises a microprocessor, a first current control circuit, a second current control circuit, a first protection circuit, a second protection circuit, a positive voltage constant current circuit and a negative voltage constant current circuit; the microprocessor is connected with the positive-voltage constant-current circuit through the first current control circuit, and the positive-voltage constant-current circuit is connected with the microprocessor through the first protection circuit; the microprocessor is connected with the negative-voltage constant-current circuit through a second current control circuit, and the negative-voltage constant-current circuit is connected with the microprocessor through a second protection circuit; the microprocessor and the positive pressure constant current circuit are used for connecting positive pressure input signals, and the microprocessor and the negative pressure constant current circuit are used for connecting negative pressure input signals; the terminal device is used for being connected with the microprocessor. The application provides flexible test conditions for the power supply to be tested with positive and negative voltages, and can be widely applied to the technical field of power supply test.
Description
Technical Field
The present application relates to the field of power testing technologies, and in particular, to a power testing system, a method, an apparatus, and a storage medium.
Background
With the continuous development and popularization of modern electronic technology, the requirements of avionics systems for flying devices are increasing. The power supply is used as an important component of the heart level of the avionics system, is a primary premise for ensuring the safe and stable operation of the flying equipment, and has increasingly strict test requirements.
In the related art, as the power, the voltage and the current output by the power supply are diversified, if the traditional resistor array test is used, various resistors with different powers and different resistance values are needed for measurement, the operation is very troublesome and inconvenient; moreover, the traditional resistor has low flexibility as a load, can test the single corresponding power supply, occupies large space and has almost no adjustable function.
In view of the above, there is a need to solve the technical problems in the prior art.
Disclosure of Invention
The present application aims to solve at least one of the technical problems existing in the related art to a certain extent.
It is therefore an object of embodiments of the present application to provide a power test system, a method, an apparatus and a storage medium.
In order to achieve the technical purpose, the technical scheme adopted by the embodiment of the application comprises the following steps:
in one aspect, an embodiment of the present application provides a power supply testing system, including: terminal equipment and a power supply test load board card;
the power supply test load board card comprises a microprocessor, a first current control circuit, a second current control circuit, a first protection circuit, a second protection circuit, a positive voltage constant current circuit and a negative voltage constant current circuit;
the microprocessor is connected with the positive-voltage constant-current circuit through the first current control circuit, and the positive-voltage constant-current circuit is connected with the microprocessor through the first protection circuit; the microprocessor is connected with the negative-voltage constant-current circuit through the second current control circuit, and the negative-voltage constant-current circuit is connected with the microprocessor through the second protection circuit;
the microprocessor and the positive pressure constant current circuit are used for connecting positive pressure input signals, and the microprocessor and the negative pressure constant current circuit are used for connecting negative pressure input signals;
the terminal equipment is used for being connected with the microprocessor.
In addition, the power supply testing system according to the above embodiment of the present application may further have the following additional technical features:
further, in an embodiment of the present application, the terminal device includes any one of a computer or a smart phone.
Further, in one embodiment of the present application, the terminal device includes a display unit and a setting unit; the setting unit is used for setting at least one of a current value, an overcurrent value, an overvoltage value or an excessive temperature value; the display unit is used for displaying at least one of a load voltage value, a load current value, a board card temperature value or a radiator temperature value.
Further, in one embodiment of the present application, the power test load board card further includes a first front-end protection circuit and a second front-end protection circuit;
the microprocessor and the positive-pressure constant-current circuit are connected with positive-pressure input signals through the first front-end protection circuit, and the microprocessor and the negative-pressure constant-current circuit are connected with negative-pressure input signals through the second front-end protection circuit.
Further, in one embodiment of the present application, the first front-end protection circuit includes a fuse circuit, a buffer start circuit, and an input detection circuit.
Further, in one embodiment of the present application, the first protection circuit includes a latch protection state circuit, an over-power protection circuit, an over-current protection circuit, and an over-voltage protection circuit.
Further, in one embodiment of the present application, the power test load board further includes a temperature detection circuit and a temperature protection circuit, the temperature detection circuit being connected to the microprocessor through the temperature protection circuit.
In another aspect, an embodiment of the present application provides a power testing method, configured to perform a power test by using the foregoing system, where the method includes:
receiving setting parameter information input by a user;
transmitting the set parameter information to the microprocessor to obtain test data detected by a power supply test load board card;
and displaying the test data.
In another aspect, an embodiment of the present application provides a terminal device, including:
at least one processor;
at least one memory for storing at least one program;
the at least one program, when executed by the at least one processor, causes the at least one processor to implement a power supply testing method as described above.
In another aspect, an embodiment of the present application further provides a computer readable storage medium storing a program executable by a processor, where the program executable by the processor is configured to implement the above-described power supply testing method when executed by the processor.
The advantages and benefits of the application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the application.
The embodiment of the application discloses a power supply test system, which comprises terminal equipment and a power supply test load board card; the power supply test load board card comprises a microprocessor, a first current control circuit, a second current control circuit, a first protection circuit, a second protection circuit, a positive voltage constant current circuit and a negative voltage constant current circuit; the microprocessor is connected with the positive-voltage constant-current circuit through the first current control circuit, and the positive-voltage constant-current circuit is connected with the microprocessor through the first protection circuit; the microprocessor is connected with the negative-voltage constant-current circuit through a second current control circuit, and the negative-voltage constant-current circuit is connected with the microprocessor through a second protection circuit; the microprocessor and the positive pressure constant current circuit are used for connecting positive pressure input signals, and the microprocessor and the negative pressure constant current circuit are used for connecting negative pressure input signals; the terminal device is used for being connected with the microprocessor. The system provides flexible test conditions for the power supply to be tested with positive and negative voltages, and can ensure the safety of operators, test equipment and the power supply to be tested.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following description is made with reference to the accompanying drawings of the embodiments of the present application or the related technical solutions in the prior art, and it should be understood that the drawings in the following description are only for convenience and clarity of describing some embodiments in the technical solutions of the present application, and other drawings may be obtained according to these drawings without the need of inventive labor for those skilled in the art.
Fig. 1 is a schematic structural diagram of a power test load board card according to an embodiment of the present application;
fig. 2 is an application schematic diagram of a power supply testing system according to an embodiment of the present application;
FIG. 3 is a schematic circuit diagram of a microprocessor of a power test load board card according to an embodiment of the present application;
fig. 4 is a schematic circuit diagram of a first front-end protection circuit of a power test load board card according to an embodiment of the present application;
fig. 5 is a schematic circuit diagram of a first protection circuit of a power test load board card according to an embodiment of the application;
FIG. 6 is a flowchart of a power testing method according to an embodiment of the present application;
fig. 7 is a schematic structural diagram of a terminal device according to an embodiment of the present application.
Detailed Description
The application will be further described with reference to the drawings and specific examples. The described embodiments should not be taken as limitations of the present application, and all other embodiments that would be obvious to one of ordinary skill in the art without making any inventive effort are intended to be within the scope of the present application.
In the following description, reference is made to "some embodiments" which describe a subset of all possible embodiments, but it is to be understood that "some embodiments" can be the same subset or different subsets of all possible embodiments and can be combined with one another without conflict.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing embodiments of the application only and is not intended to be limiting of the application.
Before describing the method provided by the embodiment of the present application, first, some background technologies related to the present application will be briefly described.
With the continuous development and popularization of modern electronic technology, the requirements of avionics systems for flying devices are increasing. The power supply is used as an important component of the heart level of the avionics system, is a primary premise for ensuring the safe and stable operation of the flying equipment, and has increasingly strict test requirements.
In the related art, as the power, the voltage and the current output by the power supply are diversified, if the traditional resistor array test is used, various resistors with different powers and different resistance values are needed for measurement, the operation is very troublesome and inconvenient; moreover, the traditional resistor has low flexibility as a load, can test the single corresponding power supply, occupies large space and has almost no adjustable function.
In view of this, the embodiment of the application provides a power supply testing system, which comprises a terminal device and a power supply testing load board card. Currently, there is no modularized high-power load board card on the market, which causes difficulty in testing the load carrying capacity of the power supply. The application aims to reduce the volume of power supply measuring equipment and provide a high-power program-controlled load board card which has the advantages of wide application range, high integration level, small volume, wide adjustable range, high stepping precision, capability of measuring positive and negative voltage power supplies and perfect protection mechanism, thereby improving the convenience and the versatility of power supply test.
The power test system provided in the embodiment of the application is described in detail below with reference to the accompanying drawings.
Specifically, referring to fig. 1, a power test load board according to an embodiment of the present application includes:
a microprocessor 13, a first current control circuit 3, a second current control circuit 9, a first protection circuit 5, a second protection circuit 10, a positive voltage constant current circuit 4 and a negative voltage constant current circuit 8;
the microprocessor 13 is connected with the positive voltage constant current circuit 4 through the first current control circuit 3, and the positive voltage constant current circuit 4 is connected with the microprocessor 13 through the first protection circuit 5; the microprocessor 13 is connected with the negative-pressure constant-current circuit 8 through the second current control circuit 9, and the negative-pressure constant-current circuit 8 is connected with the microprocessor 13 through the second protection circuit 10;
the microprocessor 13 and the positive pressure constant current circuit 4 are used for connecting the positive pressure input signal 1, and the microprocessor 13 and the negative pressure constant current circuit 8 are used for connecting the negative pressure input signal 12.
In some embodiments, the power test load board card further comprises a first front-end protection circuit 2 and a second front-end protection circuit 11;
the microprocessor 13 and the positive voltage constant current circuit 4 are connected with the positive voltage input signal 1 through the first front end protection circuit 2, and the microprocessor 13 and the negative voltage constant current circuit 8 are connected with the negative voltage input signal 12 through the second front end protection circuit 11.
In some embodiments, the power test load board card further comprises a temperature detection circuit 6 and a temperature protection circuit 7, wherein the temperature detection circuit 6 is connected to the microprocessor 13 through the temperature protection circuit 7.
The embodiment of the application provides a power supply test system, which comprises terminal equipment and a power supply test load board card, wherein the terminal equipment can be used for user operation to realize corresponding software functions; the board card can realize the test of the power supply equipment based on the instruction issued by the terminal equipment. Specifically, referring to fig. 2, fig. 2 shows an application schematic diagram of a power supply testing system provided in an embodiment of the present application, where in the application scenario, a terminal device may use a computer, and the computer may be used as a component of man-machine interaction, and may be equipped with a corresponding operating system and software. When the user uses the power supply to test the load board card, the power supply to be tested can be connected into the power supply to test the load board card, and then corresponding signals are issued in the computer by operation, so that the data such as the voltage value, the running current value, the temperature of the current board card and the like output by the current power supply to be tested are obtained, and the running current value, the overcurrent value and the overvoltage value are set. Here, the processor in the computer and the power test load board may communicate over the RS485 bus. The microprocessor 13 may receive corresponding instructions to adjust the operating state of the controllable high power load. By the embodiment of the application, an operator can reduce the workload of replacing the load and is also convenient for monitoring the state of the power supply to be tested. Of course, it will be appreciated that in other embodiments, the terminal device may also employ a smart phone, which is not limited by the present application.
Specifically, in the embodiments of the present application, each component of the power test load board card is described in detail below.
In the embodiment of the present application, the microprocessor 13 of the power test load board card may be formed by any one or more processor chips including an MCU (micro controller unit), a PLC (programmable logic controller), FPGA, CPLD, DSP, ARM, etc. For example, referring to fig. 3, fig. 3 shows a schematic circuit diagram of a microprocessor 13 according to an embodiment of the present application, where the microprocessor 13 in fig. 3 may be configured with an ATmega1284P chip. Of course, the specific chip selection can be flexibly adjusted according to the needs, and the embodiment of the application is not limited to this.
In the embodiment of the present application, the positive voltage input signal 1 is an input port of a positive power supply to be tested, the negative voltage input signal 12 is an input port of a negative power supply to be tested, the first front-end protection circuit 2 and the second front-end protection circuit 11 are used for providing a slow start function and a voltage detection function, specifically, referring to fig. 4, fig. 4 shows a schematic diagram of a front-end protection circuit, and the circuit may be formed by a fuse circuit, a buffer start circuit and an input detection circuit. The first current control circuit 3 is used for controlling the constant current value of the positive voltage constant current circuit 4, and the second current control circuit 9 is used for controlling the constant current value of the negative voltage constant current circuit 8. The positive voltage constant current circuit 4 and the negative voltage constant current circuit 8 can set the discharge current of the power supply to be tested. The first protection circuit 5 and the second protection circuit 10 are process protection circuits, and in the working process, when the current, the voltage or the power exceeds a certain value, a protection effect is generated. Specifically, referring to fig. 5, the first protection circuit 5 and the second protection circuit 10 may include a latch protection state circuit, an over-power protection circuit, an over-current protection circuit, and an over-voltage protection circuit.
The microprocessor 13 is mainly used for controlling and processing various acquired information, and is connected to the terminal equipment.
In the embodiment of the application, the terminal equipment can comprise a display unit and a setting unit; wherein the setting unit is used for setting at least one of a current value, an overcurrent value, an overvoltage value or an excessive temperature value; the display unit is used for displaying at least one of a load voltage value, a load current value, a board card temperature value or a radiator temperature value.
Specifically, in the embodiment of the present application, the setting unit may be configured by a plurality of sub-units, such as a set running current value, a set overcurrent value, a set overvoltage value, a set excessive temperature value, and the like. The display unit may be composed of a plurality of sub-units that display a load voltage value, a load current value, a board card temperature value, a heat sink temperature value, and the like.
For example, in some embodiments, the set run current value subunit may be used to set the load current value of the power supply under test. The overcurrent value setting subunit is used for setting the current value of overcurrent protection of the discharge current of the power supply to be tested. The overvoltage value setting subunit is used for setting the highest voltage value of the input power to be measured. The set too high Wen Zhizi unit is used to set the highest temperature value that allows the board card, heat sink. The display load voltage value subunit is used for displaying the voltage value of the current power supply to be tested. The display load current value subunit is used for displaying the discharge current value of the power supply to be tested in the gear stage. The display board temperature value subunit is used for displaying the current board temperature value. The radiator temperature value displaying subunit is used for displaying the current radiator temperature value. It can be understood that in the embodiment of the application, the operating software has abundant setting and display functions, so that an operator can easily operate and control the modularized high-power program control load board, and the operator can conveniently test the power supply to be tested.
In the embodiment of the application, the use flow of the power supply test load board card is as follows: the microprocessor 13 may set the limit values associated with the current control circuits based on the terminal device, where the current control circuits may include at least one of the first current control circuit 3 and the second current control circuit 9. The current control circuit controls constant current values of the positive voltage constant current circuit 4 and the negative voltage constant current circuit 8 in response to the data value of the microprocessor 13. The first front-end protection circuit 2 and the second front-end protection circuit 11 have a slow start function and a voltage detection function, the slow start function can ensure that the constant current circuit does not generate abrupt change, and the voltage detection function can detect whether the voltage input voltage exceeds a set value. The first protection circuit 5 is used for detecting the current, voltage and power in the positive voltage constant current circuit 4, and generates protection action once the current, voltage or power value exceeds a set value. The temperature detection circuit 6 is used for detecting the temperature of the board card and the radiator. The temperature protection circuit 7 can determine whether the current temperature exceeds the set value based on the value of the temperature detection circuit 6. The second front-end protection circuit 11 also has a slow start function and a voltage detection function, wherein the slow start function can ensure that the constant current circuit does not generate abrupt change, and the voltage detection function can detect whether the voltage input voltage exceeds a set value. The second protection circuit 10 is used for detecting the current, voltage or power in the negative voltage constant current circuit 8, and generates a protection action once the current, voltage or power value exceeds a set value.
The beneficial effects of the embodiments of the present application include, but are not limited to: the microcontroller is matched with the current control circuit to accurately control the constant current circuit, and hardware support is provided for high precision and stepping precision. The power supply test load board card can realize the input of positive and negative voltages, provides flexible test conditions for a power supply to be tested with positive and negative voltages, and ensures the safety of operators, test equipment and the power supply to be tested by various protection circuits.
Referring to fig. 6, fig. 6 is a schematic flow chart of a power testing method according to an embodiment of the present application, and referring to fig. 6, the power testing method includes but is not limited to:
step 110, receiving setting parameter information input by a user;
step 120, transmitting the set parameter information to the microprocessor to obtain test data detected by a power supply test load board card;
and 130, displaying the test data.
In the embodiment of the application, the user can realize the power supply test through the power supply test system. Specifically, the user may input corresponding setting parameter information through the terminal device, and may include, for example, setting a current value, setting an overcurrent value, setting an overvoltage value, setting an overtemperature value, and the like. After receiving the setting parameter information, the terminal equipment can transmit the setting parameter information to the microprocessor, and the microprocessor can realize the setting of relevant data at the power test load board card, thereby the power test can be realized.
In the power supply test process, the terminal equipment can acquire related data acquired at the power supply test load board card during the test, for example, the related data can comprise a load voltage value, a load current value, a board card temperature value, a display radiator temperature value and the like, and then the terminal equipment can display the values so as to facilitate the observation and the understanding of the working condition of the power supply to be tested by a user.
Referring to fig. 7, the embodiment of the application also discloses a terminal device, which includes:
at least one processor 201;
at least one memory 202 for storing at least one program;
the at least one program, when executed by the at least one processor 201, causes the at least one processor 201 to implement a power test system embodiment as shown in fig. 6.
It can be understood that the content of one power testing method embodiment shown in fig. 6 is applicable to the embodiment of the present terminal device, and the functions specifically implemented by the embodiment of the present terminal device are the same as those of one power testing method embodiment shown in fig. 6, and the beneficial effects achieved by the embodiment of one power testing method shown in fig. 6 are the same as those achieved by the embodiment of one power testing method shown in fig. 6.
The embodiment of the application also discloses a computer readable storage medium, in which a processor executable program is stored, which when executed by a processor is used to implement an embodiment of a power supply testing method as shown in fig. 6.
It will be appreciated that the content of one power testing method embodiment shown in fig. 6 is applicable to the present computer-readable storage medium embodiment, and the functions implemented by the present computer-readable storage medium embodiment are the same as those of one power testing method embodiment shown in fig. 6, and the advantages achieved by the present computer-readable storage medium embodiment are the same as those achieved by one power testing method embodiment shown in fig. 6.
In some alternative embodiments, the functions/acts noted in the block diagrams may occur out of the order noted in the operational illustrations. For example, two blocks shown in succession may in fact be executed substantially concurrently or the blocks may sometimes be executed in the reverse order, depending upon the functionality/acts involved. Furthermore, the embodiments presented and described in the flowcharts of the present application are provided by way of example in order to provide a more thorough understanding of the technology. The disclosed methods are not limited to the operations and logic flows presented herein. Alternative embodiments are contemplated in which the order of various operations is changed, and in which sub-operations described as part of a larger operation are performed independently.
Furthermore, while the application is described in the context of functional modules, it should be appreciated that, unless otherwise indicated, one or more of the functions and/or features may be integrated in a single physical system and/or software module or may be implemented in separate physical systems or software modules. It will also be appreciated that a detailed discussion of the actual implementation of each module is not necessary to an understanding of the present application. Rather, the actual implementation of the various functional modules in the systems disclosed herein will be apparent to engineers in ordinary skill in view of their attributes, functions, and internal relationships. Accordingly, one of ordinary skill in the art can implement the application as set forth in the claims without undue experimentation. It is also to be understood that the specific concepts disclosed are merely illustrative and are not intended to be limiting upon the scope of the application, which is to be defined in the appended claims and their full scope of equivalents.
The functions, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application may be embodied essentially or in a part contributing to the prior art or in a part of the technical solution in the form of a software product stored in a storage medium, comprising several instructions for causing a computer device (which may be a personal computer, a server, a network device, etc.) to perform all or part of the steps of the method of the embodiments of the present application. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), a magnetic disk, or an optical disk, or other various media capable of storing program codes.
Logic and/or steps represented in the flowcharts or otherwise described herein, e.g., a ordered listing of executable instructions for implementing logical functions, can be embodied in any computer-readable medium for use by or in connection with an instruction execution system, or device, such as a computer-based system, processor-containing system, or other system that can fetch the instructions from the instruction execution system, or device and execute the instructions. For the purposes of this description, a "computer-readable medium" can be any system that can contain, store, communicate, propagate, or transport the program for use by or in connection with the instruction execution system, or apparatus.
More specific examples (a non-exhaustive list) of the computer-readable medium would include the following: an electrical connection (electronic system) with one or more wires, a portable computer diskette (magnetic system), a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber system, and a portable compact disc read-only memory (CDROM). Additionally, the computer-readable medium may even be paper or other suitable medium upon which the program is printed, as the program may be electronically captured, via, for instance, optical scanning of the paper or other medium, then compiled, interpreted or otherwise processed in a suitable manner, if necessary, and then stored in a computer memory.
It is to be understood that portions of the present application may be implemented in hardware, software, firmware, or a combination thereof. In the above-described embodiments, the various steps or methods may be implemented in software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, may be implemented using any one or combination of the following techniques, as is well known in the art: discrete logic circuits having logic gates for implementing logic functions on data signals, application specific integrated circuits having suitable combinational logic gates, programmable Gate Arrays (PGAs), field Programmable Gate Arrays (FPGAs), and the like.
In the foregoing description of the present specification, reference has been made to the terms "one embodiment/example", "another embodiment/example", "certain embodiments/examples", and the like, means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
While embodiments of the present application have been shown and described, it will be understood by those of ordinary skill in the art that: many changes, modifications, substitutions and variations may be made to the embodiments without departing from the spirit and principles of the application, the scope of which is defined by the claims and their equivalents.
While the preferred embodiment of the present application has been described in detail, the present application is not limited to the embodiments, and those skilled in the art can make various equivalent modifications or substitutions without departing from the spirit of the present application, and these equivalent modifications or substitutions are intended to be included in the scope of the present application as defined in the appended claims
In the description of the present specification, reference to the term "one embodiment," "another embodiment," or "certain embodiments," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
While embodiments of the present application have been shown and described, it will be understood by those of ordinary skill in the art that: many changes, modifications, substitutions and variations may be made to the embodiments without departing from the spirit and principles of the application, the scope of which is defined by the claims and their equivalents.
Claims (10)
1. A power supply testing system, comprising: terminal equipment and a power supply test load board card;
the power supply test load board card comprises a microprocessor, a first current control circuit, a second current control circuit, a first protection circuit, a second protection circuit, a positive voltage constant current circuit and a negative voltage constant current circuit;
the microprocessor is connected with the positive-voltage constant-current circuit through the first current control circuit, and the positive-voltage constant-current circuit is connected with the microprocessor through the first protection circuit; the microprocessor is connected with the negative-voltage constant-current circuit through the second current control circuit, and the negative-voltage constant-current circuit is connected with the microprocessor through the second protection circuit;
the microprocessor and the positive pressure constant current circuit are used for connecting positive pressure input signals, and the microprocessor and the negative pressure constant current circuit are used for connecting negative pressure input signals;
the terminal equipment is used for being connected with the microprocessor.
2. The power test system of claim 1, wherein the terminal device comprises any one of a computer or a smart phone.
3. The power test system according to claim 1, wherein the terminal device includes a display unit and a setting unit; the setting unit is used for setting at least one of a current value, an overcurrent value, an overvoltage value or an excessive temperature value; the display unit is used for displaying at least one of a load voltage value, a load current value, a board card temperature value or a radiator temperature value.
4. The power test system of claim 1, wherein the power test load board further comprises a first front-end protection circuit and a second front-end protection circuit;
the microprocessor and the positive-pressure constant-current circuit are connected with positive-pressure input signals through the first front-end protection circuit, and the microprocessor and the negative-pressure constant-current circuit are connected with negative-pressure input signals through the second front-end protection circuit.
5. The power test system of claim 4, wherein the first front-end protection circuit comprises a fuse circuit, a buffer start circuit, and an input detection circuit.
6. The power test system of claim 1, wherein the first protection circuit comprises a latch protection state circuit, an over-power protection circuit, an over-current protection circuit, and an over-voltage protection circuit.
7. The power test system of claim 1, wherein the power test load board further comprises a temperature detection circuit and a temperature protection circuit, the temperature detection circuit being connected to the microprocessor through the temperature protection circuit.
8. A power testing method for performing a power test by the system of any one of claims 1-7, the method comprising:
receiving setting parameter information input by a user;
transmitting the set parameter information to the microprocessor to obtain test data detected by a power supply test load board card;
and displaying the test data.
9. A terminal device, comprising:
at least one processor;
at least one memory for storing at least one program;
the at least one program, when executed by the at least one processor, causes the at least one processor to implement a power test method as claimed in claim 8.
10. A computer-readable storage medium having stored therein a program executable by a processor, characterized in that: the processor executable program when executed by a processor is for implementing a power supply testing method as claimed in claim 8.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310964546.8A CN117192419A (en) | 2023-08-01 | 2023-08-01 | Power supply test system, method, equipment and storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310964546.8A CN117192419A (en) | 2023-08-01 | 2023-08-01 | Power supply test system, method, equipment and storage medium |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN117192419A true CN117192419A (en) | 2023-12-08 |
Family
ID=88985921
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310964546.8A Pending CN117192419A (en) | 2023-08-01 | 2023-08-01 | Power supply test system, method, equipment and storage medium |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN117192419A (en) |
-
2023
- 2023-08-01 CN CN202310964546.8A patent/CN117192419A/en active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101907689B (en) | Generation method and device of test circuit and power supply testing system | |
| CN105738836A (en) | DC/DC converter automatic test system | |
| CN109116266A (en) | The test method of power module | |
| CN104568227A (en) | Temperature sensing bulb detection circuit, method and device | |
| CN110658439B (en) | Test method and system for protection circuit | |
| CN112834898B (en) | Method, device and equipment for testing stability of power chip of storage device | |
| CN105823990B (en) | A kind of fictitious load for testing SOC power supplys | |
| CN105182270A (en) | Device and method of electric energy meter voltage-withstand test | |
| CN113777520A (en) | Test method, device, system and medium for board-mounted power supply overcurrent protection | |
| CN117192419A (en) | Power supply test system, method, equipment and storage medium | |
| CN103529285B (en) | A kind of testing apparatus of automated detection PCIE device power consumption | |
| CN107918090B (en) | TVS tube detection system and method | |
| CN203788304U (en) | Device for testing function of hardware interface | |
| CN220626617U (en) | Power supply test load board card | |
| CN211741880U (en) | Fiber laser control system based on power supply | |
| CN106546906A (en) | A kind of method and device of Power Integrity test | |
| CN211264169U (en) | Automatic testing device for logic control unit | |
| CN203537553U (en) | An Interface circuit realizing serial port and infrared multiplex functions | |
| CN113495208B (en) | Device, system and method for testing power supply circuit of packaged circuit board | |
| CN105180383A (en) | Communication mode control method and system and air conditioner debugging device | |
| CN205283387U (en) | IC verifies power of instrument | |
| CN117849597B (en) | Circuit board testing device | |
| CN109101376A (en) | A kind of USB speed measuring device and system | |
| CN216351051U (en) | Verification circuit of serial port chip test system | |
| CN216956151U (en) | NTC temperature monitoring and control circuit and NTC temperature monitoring and control terminal equipment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |