CN117170193A - 决定方法、曝光方法、信息处理装置、存储介质、曝光装置以及物品制造方法 - Google Patents

决定方法、曝光方法、信息处理装置、存储介质、曝光装置以及物品制造方法 Download PDF

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Publication number
CN117170193A
CN117170193A CN202310626355.0A CN202310626355A CN117170193A CN 117170193 A CN117170193 A CN 117170193A CN 202310626355 A CN202310626355 A CN 202310626355A CN 117170193 A CN117170193 A CN 117170193A
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CN
China
Prior art keywords
exposure
measurement
model formula
optical system
projection optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202310626355.0A
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English (en)
Chinese (zh)
Inventor
栗田裕介
黑泽良昭
木村仁
北冈风太
小林宪矢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Publication of CN117170193A publication Critical patent/CN117170193A/zh
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70591Testing optical components
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70308Optical correction elements, filters or phase plates for manipulating imaging light, e.g. intensity, wavelength, polarisation, phase or image shift
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70716Stages
    • G03F7/70725Stages control

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
CN202310626355.0A 2022-06-03 2023-05-30 决定方法、曝光方法、信息处理装置、存储介质、曝光装置以及物品制造方法 Pending CN117170193A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022-091070 2022-06-03
JP2022091070A JP2023178029A (ja) 2022-06-03 2022-06-03 決定方法、露光方法、情報処理装置、プログラム、露光装置、および物品製造方法

Publications (1)

Publication Number Publication Date
CN117170193A true CN117170193A (zh) 2023-12-05

Family

ID=88934313

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202310626355.0A Pending CN117170193A (zh) 2022-06-03 2023-05-30 决定方法、曝光方法、信息处理装置、存储介质、曝光装置以及物品制造方法

Country Status (3)

Country Link
JP (1) JP2023178029A (ja)
KR (1) KR20230168129A (ja)
CN (1) CN117170193A (ja)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0447807A (ja) 1990-06-15 1992-02-18 Nec Corp アダプティブイコライザ
JPH11150053A (ja) 1997-11-18 1999-06-02 Nikon Corp 露光方法及び装置

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Publication number Publication date
KR20230168129A (ko) 2023-12-12
JP2023178029A (ja) 2023-12-14

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