CN117169240A - Inner bottom surface defect detection device and detection method - Google Patents

Inner bottom surface defect detection device and detection method Download PDF

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Publication number
CN117169240A
CN117169240A CN202310977893.4A CN202310977893A CN117169240A CN 117169240 A CN117169240 A CN 117169240A CN 202310977893 A CN202310977893 A CN 202310977893A CN 117169240 A CN117169240 A CN 117169240A
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China
Prior art keywords
light source
inner bottom
light
image information
defect detection
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CN202310977893.4A
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Chinese (zh)
Inventor
吴平标
彭明
吴正军
杨延竹
于波
张华�
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Shenzhen Geling Jingrui Vision Co ltd
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Shenzhen Geling Jingrui Vision Co ltd
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Priority to CN202310977893.4A priority Critical patent/CN117169240A/en
Publication of CN117169240A publication Critical patent/CN117169240A/en
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Abstract

The invention discloses an inner bottom surface defect detection device and a detection method. Wherein the inner bottom surface defect detecting device includes: a bracket; the light source is connected to the bracket and is configured to generate parallel light, the parallel light is used for irradiating the inside of the box body, the parallel light irradiates to the inner bottom surface after being reflected at least once by the inner side surface of the box body, and the parallel light is emitted from the box body after being reflected at least once; the camera shooting assembly is connected to the bracket, the light source is arranged on one side of the camera shooting assembly, and the camera shooting assembly is used for shooting images of the inner bottom surface when the light source irradiates; the controller can detect the defects of the image shot by the shooting assembly, and the inner bottom surface defect detection device can detect the defects of the inner bottom surface of the box body with higher side walls comprehensively so as to improve the yield of the box body.

Description

Inner bottom surface defect detection device and detection method
Technical Field
The invention relates to the technical field of box body production and processing, in particular to an inner bottom surface defect detection device and a detection method.
Background
In the production process of the box body in the industrial scene, the inner bottom surface of the metal box body can be scratched or chipped due to the steps of production process, transportation, storage mode and the like. The box body can only leave the factory after the problems are processed, but because the bottom in the box body is surrounded by four side walls, the conventional scheme cannot effectively polish the bottom in multiple angles and multiple directions, and direct detection is very difficult.
Therefore, in the prior art, a line scanning camera is adopted to polish the inner bottom surface of the box body in combination with parallel light, and the defect detection is carried out according to the image, and the common detection method comprises two detection modes of bright field and dark field. If the inner bottom surface of the product is a flat surface, the reflected light can be regarded as macroscopically and uniformly reflected, when the inner bottom surface is defective (concave or convex), the light path of the reflected light can be dispersed in all directions, the light intensity of the defective part returned to the lens is reduced, the gray value (brightness) of the area can be lower than that of the surface without defects, and the defect-free inner bottom surface is judged by the brightness change. However, if the surface of the inner bottom surface of the product is rough, the inner bottom surface will have the effect of light and shade variation all the time, and defect identification cannot be performed according to the image, so that dark field detection is needed to be matched. And the light beam of the dark field detection method is obliquely input and output, if the inner bottom surface is a smooth surface, no light returns to the lens, and the picture effect is in a full dark state. If the inner bottom surface has dark field defects, the light beam is reflected based on the dark field defect surface, and the dark field defect position can be considered to be diffusely reflected by taking the plane of the inner bottom surface of the product as a reference surface. Because diffuse reflection occurs at the dark field defect position, partial light rays of the oblique incoming and outgoing light beams are reflected into the lens, a bright spot or a bright spot appears in effect, but if the side wall of the box body is too high, the oblique light rays cannot completely irradiate the inner bottom surface due to the blocking of the side wall of the box body, and thus the inner bottom surface cannot be completely dark field detected.
Disclosure of Invention
The present invention aims to solve at least one of the technical problems existing in the prior art. Therefore, the invention provides the inner bottom surface defect detection device which can detect the defects on the inner bottom surface of the box body with the higher side wall comprehensively.
The invention also provides a detection method using the inner bottom surface defect detection device.
An inner bottom surface defect detection apparatus according to an embodiment of the first aspect of the present invention includes:
a bracket;
the light source is connected to the bracket and is configured to generate parallel light, the parallel light is used for irradiating the inside of the box body, the parallel light irradiates the inner bottom surface after being reflected at least once by the inner side surface of the box body, and the parallel light is emitted from the box body after being reflected at least once;
the camera shooting assembly is connected to the bracket, the light source is arranged on one side of the camera shooting assembly, and the camera shooting assembly is used for acquiring image information of the inner bottom surface when the light source irradiates;
and a controller configured to perform defect detection based on the image information acquired by the image pickup assembly.
According to the inner bottom surface defect detection device provided by the embodiment of the invention, the inner bottom surface defect detection device has at least the following beneficial effects:
when the defect detection of the inner bottom surface is carried out on the box body, the box body is placed below the support, the support is at least provided with a camera shooting assembly and a light source, the camera shooting assembly is opposite to the inner bottom surface of the box body so as to shoot an image of the inner bottom surface, the light source is arranged on one side of the camera shooting assembly, when the defect detection is carried out, the light source emits parallel light towards the inner bottom surface of the box body, the parallel light irradiates the inner bottom surface of the box body after at least one reflection, and then is emitted from the box body after at least one reflection, in this process, the side wall of the box body cannot shield light, the light source and the camera shooting assembly cannot interfere with each other, and the parallel light can completely irradiate the inner bottom surface of the box body, so that dark field detection can be successfully completed.
According to some embodiments of the invention, the light sources are provided in a plurality, each of the light sources is arranged at intervals along the circumferential direction of the image pickup assembly, a projection plane parallel to the inner bottom surface is defined, and projections of optical axes of at least two of the light sources on the projection plane intersect.
According to some embodiments of the invention, the inner bottom surface defect detection device includes at least a first light source and a second light source, the projections of the optical axes of the first light source and the second light source on the projection surface intersect, the controller is configured to be capable of controlling the first light source to perform a first illumination operation and to control the image pickup assembly to acquire first image information after performing the first illumination operation, and to control the second light source to perform a second illumination operation and to control the image pickup assembly to acquire second image information after performing the second illumination operation, and to perform defect detection based on the first image information and the second image information.
According to some embodiments of the invention, the first light source and the second light source are located on two sides of the camera assembly respectively in a length direction of the box body.
According to some embodiments of the invention, the inner bottom surface defect detecting device includes at least a first light source, a second light source, a third light source, and a fourth light source, projections of optical axes of the first light source and the second light source on the projection surface intersect, projections of optical axes of the third light source and the fourth light source on the projection surface intersect, the controller is configured to be capable of controlling the first light source and the second light source to perform a first illumination operation and to control the image capturing assembly to acquire first image information after performing the first illumination operation, and to control the third light source and the fourth light source to perform a second illumination operation and to control the image capturing assembly to acquire second image information after performing the second illumination operation, and to be capable of performing defect detection based on the first image information and the second image information.
According to some embodiments of the invention, an angle between the parallel light rays emitted by the light source and the inner bottom surface is not smaller than 5 °.
An inner bottom surface defect detection apparatus according to an embodiment of the second aspect of the present invention includes:
a bracket;
the reflecting mirror is attached to the inner side surface of the box body;
the light source is connected with the bracket and is configured to generate parallel light, the parallel light irradiates the inside of the box body, and the parallel light irradiates the inner bottom surface after being reflected at least once by the reflecting mirror and is emitted from the box body after being reflected at least once;
the camera shooting assembly is connected to the bracket, the light source is arranged on one side of the camera shooting assembly, and the camera shooting assembly is used for acquiring image information of the inner bottom surface when the light source irradiates;
and a controller configured to perform defect detection based on the image information acquired by the image pickup assembly.
According to the inner bottom surface defect detection device of the embodiment of the invention, at least the following beneficial effects are achieved:
when the defect detection of the inner bottom surface is carried out on the box body, the box body is placed below the support, the reflecting mirror is arranged on the inner side surface of the box body, at least the camera shooting assembly and the light source are arranged on the support, the camera shooting assembly is opposite to the inner bottom surface of the box body so as to shoot an image of the inner bottom surface, the light source is arranged on one side of the camera shooting assembly, when the defect detection is carried out, the light source emits parallel light towards the inner bottom surface of the box body after at least one reflection of the reflecting mirror, and then the parallel light is emitted from the box body after at least one reflection.
According to some embodiments of the invention, the light sources are provided in a plurality, each of the light sources is arranged at intervals along the circumferential direction of the image pickup assembly, a projection plane parallel to the inner bottom surface is defined, and projections of optical axes of at least two of the light sources on the projection plane intersect.
According to a third aspect of the present invention, a detection method of an in-application bottom surface defect detection device includes:
the inner bottom surface defect detection device includes:
a bracket;
the light source is connected to the bracket and is configured to generate parallel light, the parallel light is used for irradiating the inside of the box body, the parallel light irradiates the inner bottom surface after being reflected at least once by the inner side surface of the box body, and the parallel light is emitted from the box body after being reflected at least once;
the camera shooting assembly is connected to the bracket, the light source is arranged on one side of the camera shooting assembly, and the camera shooting assembly is used for acquiring image information of the inner bottom surface when the light source irradiates;
a controller configured to perform defect detection based on image information acquired by the image pickup assembly;
the operation method is as follows:
placing the box body below the camera shooting assembly;
and performing defect detection by using the inner bottom surface defect detection device.
According to some embodiments of the present invention, the inner bottom surface defect detecting device includes at least a first light source, a second light source, a third light source, and a fourth light source, where projections of optical axes of the first light source and the second light source on the projection plane intersect, and where projections of optical axes of the third light source and the fourth light source on the projection plane intersect;
the defect detection step using the inner bottom surface defect detection device comprises the following steps:
the first light source and the second light source emit parallel light to irradiate;
the camera shooting assembly shoots to obtain first image information;
the third light source and the fourth light source emit parallel light to irradiate;
the camera shooting assembly shoots to obtain second image information;
the controller performs defect detection based on the first image information and the second image information.
Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.
Drawings
The invention is further described with reference to the accompanying drawings and examples, in which:
FIG. 1 is a schematic diagram of dark field detection in the prior art;
FIG. 2 is a schematic diagram of dark field detection in the prior art;
FIG. 3 is a schematic diagram of inner bottom surface detection in an embodiment of the present invention;
FIG. 4 is a schematic view showing the defect on the inner bottom surface and the parallel light rays in the embodiment of the invention;
FIG. 5 is a schematic view showing defects and non-parallel light rays on the inner bottom surface in an embodiment of the present invention;
FIG. 6 is a schematic diagram of an apparatus for detecting defects of an inner bottom surface according to an embodiment of the invention.
Reference numerals:
a light source 100;
a camera assembly 200;
a box 300, an inner bottom 310, and an inner side 320.
Detailed Description
Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are illustrative only and are not to be construed as limiting the invention.
In the description of the present invention, it should be understood that references to orientation descriptions such as upper, lower, front, rear, left, right, etc. are based on the orientation or positional relationship shown in the drawings, are merely for convenience of description of the present invention and to simplify the description, and do not indicate or imply that the apparatus or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present invention.
In the description of the present invention, the meaning of a number is one or more, the meaning of a number is two or more, and greater than, less than, exceeding, etc. are understood to exclude the present number, and the meaning of a number is understood to include the present number. The description of the first and second is for the purpose of distinguishing between technical features only and should not be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
In the description of the present invention, unless explicitly defined otherwise, terms such as arrangement, installation, connection, etc. should be construed broadly and the specific meaning of the terms in the present invention can be reasonably determined by a person skilled in the art in combination with the specific contents of the technical scheme.
In the description of the present invention, the descriptions of the terms "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present invention. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
The invention provides an inner bottom surface defect detection device and a detection method, wherein the inner bottom surface defect detection device can detect the inner bottom surface of a box body with a higher side wall in a dark field so as to ensure smooth production and processing. In order to achieve the above object, the device for detecting defects of an inner bottom surface provided by the invention comprises a bracket, a light source and an image pickup assembly, wherein the light source and the image pickup assembly are arranged on the bracket, the light source is arranged on one side of the bracket, the light source can emit parallel light towards the inner side surface of the box body, the parallel light is emitted to the inner bottom surface after being reflected at least once by the inner side surface, and the parallel light is emitted from the box body after being reflected at least once, and the image pickup assembly can pick up images of the inner bottom surface when the light source irradiates and then convey the images to a controller for defect detection. Embodiments of the present invention are specifically described below with reference to the accompanying drawings.
Referring to fig. 3 and 6, the internal bottom defect detecting device at least includes a bracket, a light source 100, a camera module 200 and a controller, wherein the bracket can at least support the camera module 200 and the light source 100, and the camera of the camera module 200 needs to be disposed towards the box 300, the camera module 200 needs to be disposed parallel to and spaced from the internal bottom 310 of the box 300 to ensure that the image information of the internal bottom 310 of the box 300 can be captured during defect detection, the light source 100 is disposed at one side of the camera module 200, and the light source 100 can generate parallel light, when the box 300 needs to detect defects, the light source 100 emits parallel light towards the box 300, and referring to fig. 3, the parallel light irradiates the inner side 320 of the box 300, and after the parallel light is reflected at least once from the inner side 320 of the box 300, the parallel light irradiates the inner bottom 310 of the box 300, and then after being reflected at least once from the box 300, the reflected parallel light needs to avoid the camera of the camera module 200, so that the dark field detection can be performed smoothly.
It should be noted that, in the industrial production process, the structure of the box 300 is various, when the sidewall of the box 300 is high (or when the ratio of the sidewall height to the bottom wall width of the box 300 is large), referring to fig. 1 and 2, the light source 100 is disposed at one side of the image capturing assembly 200, if the light is directly irradiated to the inner bottom surface 310 of the box 300, if it is required to ensure that the light is obliquely incident and obliquely incident, no matter how the box 300 moves or how the light source 100 moves, the inner bottom surface 310 of the box 300 has a region (a region a in fig. 1) that cannot be irradiated, and only a part of the region of the inner bottom surface 310 can be directly irradiated by the light source 100, so that the complete defect detection cannot be performed on the inner bottom surface 310. If the light is directly irradiated toward the area a, referring to fig. 2, the incident angle of the parallel light is large, and after the light irradiates the inner bottom surface 310, some light is directly reflected to the camera, so that the image information obtained by the camera assembly 200 will have a large range of bright spots, and the controller cannot perform dark field detection according to the image information. In summary, when the sidewall of the box 300 is higher, the method of directly irradiating the inner bottom surface 310 to perform dark field detection cannot perform complete dark field detection on the inner bottom surface 310, if scratches or chips exist on the inner bottom surface 310 of the box 300, the scratches or chips cannot be detected, so that the normal operation of the subsequent process is affected, and the yield of the produced box 300 is also reduced.
Referring to fig. 3, the inner bottom surface defect detecting device according to the present invention sets the light source 100 at one side of the camera module 200, adjusts the angle of the parallel light emitted by the light source 100, irradiates the inner bottom surface 310 after at least one reflection of the inner side surface 320 of the box 300, and emits the parallel light from the box 300 after at least one reflection, and can perform complete dark field detection on the inner bottom surface 310 of the box 300 by adjusting the position of the box 300 or the angle of the light emitted by the light source 100. Specifically, the light source 100 emits parallel light to the inner side 320 of the box 300, and emits the parallel light to the inner bottom 310 after at least one reflection, if the inner bottom 310 has a defect, the light will be diffusely reflected at the defect, and some light will enter the camera of the camera assembly 200 disposed parallel to the inner bottom 310, so that a cluster or a bright spot will appear in the image information of the inner bottom 310 acquired by the camera assembly 200, and the controller can determine that the inner bottom 310 has a defect according to the image information. Meanwhile, when the device for detecting defects of inner bottom surface 310 provided by the present invention is used to detect dark fields of inner bottom surface, the position of light source 100 or box 300 needs to be adjusted according to the specific structure of box 300, so as to avoid light after reflection from directly entering into the camera, and dark field detection can be performed normally. In summary, the inner bottom defect detecting device provided by the present invention can also perform complete dark field detection on the inner bottom 310 of the box 300 when facing the box 300 with higher side wall, so as to ensure smooth production and processing.
It should be noted that, in the present invention, the light source 100 of the inner bottom surface defect detection device is disposed at one side of the image capturing assembly 200, and can emit parallel light toward the inner side 320 of the box body 300, in the horizontal direction, the light source 100 and the image capturing assembly 200 can be designed to be farther, that is, the distance between the light source 100 and the image capturing assembly 200 can be designed to be larger, so that the image capturing assembly 200 can be replaced by a larger area camera from a smaller linear scanning camera (in order to avoid the influence between the light source 100 and the image capturing assembly 200, in the conventional dark field detection mode, a smaller linear scanning camera is adopted, and the linear scanning camera or the box body 300 needs to be continuously moved to obtain a complete image of the inner bottom surface 310, and the time required in the detection process is also longer).
In some embodiments, the light sources 100 can be disposed in multiple numbers, the multiple light sources 100 are disposed at intervals along the circumference of the image capturing assembly 200, the vertical distance from each light source 100 to the inner bottom surface 310 of the box body 300 is generally the same, that is, the multiple light sources 100 are disposed at the same height, for convenience of description, we define a projection plane parallel to the inner bottom surface 310 of the box body 300, and the projections of the optical axes of at least two light sources 100 on the projection plane intersect, so that when the defect detection is performed on the inner bottom surface 310, the defect parallel to the light can be prevented from being represented in the image information.
For the sake of understanding, we will consider, referring to fig. 4 and 5, assuming that the direction of the light is fixed, when the inner bottom surface 310 has a smooth linear scratch, for example, the direction of the light is parallel to the direction of the scratch, when the light is reflected by the inner bottom surface 310, the diffuse reflection at the scratch is weak, and at this time, the imaging effect is weak in the image information collected by the camera assembly 200, the controller can hardly recognize that the position has a scratch, and cannot recognize the length, depth and other information of the scratch. When the direction of the scratch and the direction of the light are not parallel, strong diffuse reflection occurs at the scratch position when the light irradiates the inner bottom surface 310, the light diverges to the periphery, and the camera assembly 200 can receive the reflected light when capturing the image information of the inner bottom surface 310, so that the shape and the size of the scratch are clearly shown on the image.
It can be understood that, when the plurality of light sources 100 are disposed, and the projections of the optical axes of at least two light sources 100 on the projection plane parallel to the inner bottom surface 310 intersect, even if the inner bottom surface 310 has scratches parallel to the light rays emitted by some of the light sources 100, at least has rays not parallel to the scratches, the scratches can be accurately displayed in the image acquired by the image capturing assembly 200, so that the accuracy of defect detection is improved.
In other embodiments, the plurality of light sources 100 may be further divided into a plurality of illuminations, that is, when each light source 100 irradiates, the image capturing assembly 200 obtains the image information once, so that when the inner bottom surface 310 of one box 300 is detected, the image information of the plurality of inner bottom surfaces 310 may be obtained, the controller may perform comparative analysis on the plurality of images, and comprehensive comparison may be performed, so as to more accurately identify the defects on the inner bottom surface 310, determine the types and sizes of the defects, and thus classify the box 300 according to the types of the defects, and ensure that the subsequent process may be performed better.
In some embodiments, the inner bottom surface defect detection device has at least a first light source and a second light source, and the optical axes of the first light source and the second light source intersect on a projection plane parallel to the inner bottom surface 310, that is, the light rays emitted by the first light source and the second light source are not parallel.
It can be understood that, when the first light source and the second light source are provided to detect the defects on the inner bottom surface 310 of the box 300, if the two light sources 100 illuminate simultaneously, the defects on the inner bottom surface 310 can be more clearly displayed on the image acquired by the image capturing assembly 200, so as to avoid the problem that the defects cannot be imaged.
If the two light sources 100 are illuminated twice, the image capturing assembly 200 also correspondingly obtains two images, and when each time of illumination, the image capturing assembly 200 can obtain one image information, specifically, when the first light source irradiates, the first image information is obtained, and when the second light source irradiates, the second image information is obtained, because the parallel light emitted by each light source 100 is not parallel, the defect of the inner bottom surface 310 can be well represented on each image information, the two image acquisitions are performed twice, the controller can comprehensively compare and analyze the two images, the possibility of error interpretation can be reduced, and the type of the defect can be well determined by the controller, so that the box 300 is classified according to the type of the defect.
In some embodiments, in the length direction of the box 300, the first light source and the second light source are respectively disposed at two sides of the image capturing assembly 200, so that when defect detection is performed, illumination can be performed from multiple angles, the illumination range can be larger, and then the acquired image information can better represent defects, so that the accuracy of defect detection is further improved.
In some embodiments, referring to fig. 6, in order to better detect defects on the inner bottom surface 310 of the box body 300, the light sources 100 are totally provided with 4 light sources, namely, a first light source, a second light source, a third light source and a fourth light source, each light source 100 is divided into two groups, each group has two light sources 100, wherein the first light source and the second light source are in a group, the third light source and the fourth light source are in a group, the first light source and the second light source are in a group, the optical axes of the first light source and the second light source are in a projection intersection on a projection plane parallel to the inner bottom surface 310, the third light source and the fourth light source are in a projection intersection on a projection plane parallel to the inner bottom surface 310, that is, the optical axes of the two light sources 100 in each group are in a projection plane parallel to the inner bottom surface 310, that is, the light rays emitted by the two light sources 100 in each group are not parallel, when the defect detection of the inner bottom surface 310 is performed, the box body 300 is placed under the camera assembly 200, the camera is just opposite to the inner bottom surface 310, the first light source and the second light source are started to irradiate the inner bottom surface 310, the first light source and the second light source on the inner bottom surface 310 on the projection plane to the projection plane of the inner bottom surface 310, when the light source and the light source is in the projection plane of the inner bottom surface 310, the light source is in a third light source and the image information is again, and the image information is further determined, and whether the defect information is determined by comparing the image information.
It can be understood that the parallel light rays emitted by the two light sources 100 in the same group are not parallel, and when two groups of such light sources 100 are arranged to identify defects on the inner bottom surface 310 of the box 300, the probability of misjudgment can be reduced by accurately identifying whether the inner bottom surface 310 of the box 300 has defects or not, and if the defects exist, the defects can be identified according to image information, so that the box 300 is classified according to the types of the defects, and the staff can conveniently perform subsequent operations on the defects according to the types of the defects on the inner bottom surface 310 of the box 300.
In some embodiments, the angle between the parallel light emitted by the light source 100 and the inner bottom surface 310 is not less than 5 °, it should be noted that the parallel light emitted by the light source 100 does not directly strike the inner bottom surface 310, but strikes the inner side surface 320 of the case 300, and the inner bottom surface 310 in the angle between the parallel light and the inner bottom surface 310 refers to an extension surface of the inner bottom surface 310, or may be understood as a projection surface parallel to the inner bottom surface 310. It can be understood that, the parallel light emitted by the light source 100 is reflected by the inner side 320 and then is emitted to the inner bottom 310, if the inner bottom 310 has a defect, the light irradiates the defect on the inner bottom 310, and diffuse emission occurs, when the camera assembly 200 acquires an image, the light is received from the defect, and a light spot is displayed on the image, so that the position and the size of the defect are reflected on the image. Although the inner side 320 of the case 300 can reflect light, the light is inevitably lost after multiple reflections, so the angle between the incident light (i.e. the parallel light emitted by the light source 100) and the inner bottom 310 is not preferably smaller than 5 °. To prevent the light from being depleted without being reflected to the inner bottom surface 310, thereby ensuring that defect detection can be smoothly performed.
According to the present invention, the inner bottom surface defect detecting device includes a bracket, a reflector, a light source 100, a camera assembly 200 and a controller, wherein the light source 100 and the camera assembly 200 are both disposed on the bracket, and the camera of the camera assembly 200 needs to be disposed towards the box 300, and the camera assembly 200 is generally required to be disposed parallel to and spaced from the inner bottom surface 310 of the box 300, so that the image information of the inner bottom surface 310 of the box 300 can be captured during defect detection, the light source 100 is disposed at one side of the camera assembly 200, and the light source 100 can generate parallel light, and when the box 300 needs to be detected for defects, the light source 100 emits parallel light towards the inner side surface 320 of the box 300, and the reflector is also disposed on the inner side surface 320 of the box 300.
Specifically, the parallel light emitted by the light source 100 irradiates the mirror on the inner side surface 320 of the box body 300, after being reflected at least once by the mirror, the parallel light irradiates the inner bottom surface 310 of the box body 300, and then is emitted from the box body 300 after being reflected at least once by the mirror, and it is noted that the parallel light emitted from the box body 300 after being reflected needs to avoid the camera of the camera assembly 200, and dark field detection can be smoothly performed. It can be appreciated that when the inner side 320 of the case 300 is rough or the reflectivity of the material of the case 300 is not high, the intensity of the light beam irradiated onto the inner side 320 of the case 300 after at least one reflection will be greatly reduced, and even if the inner side 310 has a defect, the light beam cannot be reflected on the image acquired by the image capturing device 200. Therefore, the inner side 320 of the case 300 is provided with a reflecting mirror, the light is emitted by the reflecting mirror and is emitted to the inner bottom 310, the light irradiates the inner bottom 310, if the inner bottom 310 has a defect, the light is diffusely reflected at the defect, the camera assembly 200 receives the diffusely reflected light at the defect, so that bright spots are displayed on the obtained image information, and whether the inner bottom 310 has the defect or not is determined and the defect is located according to the image information of the inner bottom 310.
In some embodiments, the light sources 100 can be disposed in multiple numbers, the multiple light sources 100 are disposed at intervals along the circumference of the image capturing assembly 200, the vertical distance from each light source 100 to the inner bottom surface 310 of the box body 300 is generally the same, that is, the multiple light sources 100 are disposed at the same height, for convenience of description, we define a projection plane parallel to the inner bottom surface 310 of the box body 300, and the projections of the optical axes of at least two light sources 100 on the projection plane intersect, so that when the defect detection is performed on the inner bottom surface 310, the defect parallel to the light can be prevented from being represented in the image information.
It can be understood that, when the plurality of light sources 100 are disposed, and the projections of the optical axes of at least two light sources 100 on the projection plane parallel to the inner bottom surface 310 intersect, even if the inner bottom surface 310 has scratches parallel to the light rays emitted by some of the light sources 100, at least has rays not parallel to the scratches, the scratches can be accurately displayed in the image acquired by the image capturing assembly 200, so that the accuracy of defect detection is improved. .
In other embodiments, the plurality of light sources 100 may be further divided into a plurality of illuminations, that is, when each light source 100 irradiates, the image capturing assembly 200 obtains the image information once, so that when the inner bottom surface 310 of one box 300 is detected, the image information of the plurality of inner bottom surfaces 310 may be obtained, the controller may perform comparative analysis on the plurality of images, and comprehensive comparison may be performed, so as to more accurately identify the defects on the inner bottom surface 310, determine the types and sizes of the defects, and thus classify the box 300 according to the types of the defects, and ensure that the subsequent process may be performed better.
In some embodiments, the inner bottom surface defect detection device has at least a first light source and a second light source, and the optical axes of the first light source and the second light source intersect on a projection plane parallel to the inner bottom surface 310, that is, the light rays emitted by the first light source and the second light source are not parallel.
It can be understood that, when the first light source and the second light source are provided to detect the defects on the inner bottom surface 310 of the box 300, if the two light sources 100 illuminate simultaneously, the defects on the inner bottom surface 310 can be more clearly displayed on the image acquired by the image capturing assembly 200, so as to avoid the problem that the defects cannot be imaged.
If the two light sources 100 are illuminated twice, the image capturing assembly 200 also correspondingly obtains two images, and when each time of illumination, the image capturing assembly 200 can obtain one image information, specifically, when the first light source irradiates, the first image information is obtained, and when the second light source irradiates, the second image information is obtained, because the parallel light emitted by each light source 100 is not parallel, the defect of the inner bottom surface 310 can be well represented on each image information, the two image acquisitions are performed twice, the controller can comprehensively compare and analyze the two images, the possibility of error interpretation can be reduced, and the type of the defect can be well determined by the controller, so that the box 300 is classified according to the type of the defect.
In some embodiments, in the length direction of the box 300, the first light source and the second light source are respectively disposed at two sides of the image capturing assembly 200, so that when defect detection is performed, illumination can be performed from multiple angles, the illumination range can be larger, and then the acquired image information can better represent defects, so that the accuracy of defect detection is further improved.
In some embodiments, referring to fig. 6, in order to better detect defects on the inner bottom surface 310 of the box body 300, the light sources 100 are totally provided with 4 light sources, namely, a first light source, a second light source, a third light source and a fourth light source, each light source 100 is divided into two groups, each group has two light sources 100, wherein the first light source and the second light source are in a group, the third light source and the fourth light source are in a group, the first light source and the second light source are in a group, the optical axes of the first light source and the second light source are in a projection intersection on a projection plane parallel to the inner bottom surface 310, the third light source and the fourth light source are in a projection intersection on a projection plane parallel to the inner bottom surface 310, that is, the optical axes of the two light sources 100 in each group are in a projection plane parallel to the inner bottom surface 310, that is, the light rays emitted by the two light sources 100 in each group are not parallel, when the defect detection of the inner bottom surface 310 is performed, the box body 300 is placed under the camera assembly 200, the camera is just opposite to the inner bottom surface 310, the first light source and the second light source are started to irradiate the inner bottom surface 310, the first light source and the second light source on the inner bottom surface 310 on the projection plane to the projection plane of the inner bottom surface 310, when the light source and the light source is in the projection plane of the inner bottom surface 310, the light source is in a third light source and the image information is again, and the image information is further determined, and whether the defect information is determined by comparing the image information.
It can be understood that the parallel light rays emitted by the two light sources 100 in the same group are not parallel, and when two groups of such light sources 100 are arranged to identify defects on the inner bottom surface 310 of the box 300, the probability of misjudgment can be reduced by accurately identifying whether the inner bottom surface 310 of the box 300 has defects or not, and if the defects exist, the defects can be identified according to image information, so that the box 300 is classified according to the types of the defects, and the staff can conveniently perform subsequent operations on the defects according to the types of the defects on the inner bottom surface 310 of the box 300.
According to a third aspect of the present invention, a detection method using the above-mentioned device for detecting defects of an inner bottom surface includes:
step one: placing the cartridge 300 under the camera assembly 200;
that is, the box 300 to be detected is placed under the inner bottom defect detecting device, and the camera of the camera assembly 200 needs to face the inner bottom 310 of the box 300, so as to ensure that the image information of the inner bottom 310 can be obtained.
Step two: performing defect detection by using an inner bottom surface defect detection device;
specifically, the light source 100 is started, the light source 100 emits parallel light to the inner side 320 of the box 300, the parallel light irradiates to the inner bottom 310 of the box 300 after being reflected by the inner side 320 or at least one reflection of a reflector on the inner side 320, if a defect exists on the inner bottom 310, the light is diffusely reflected at the defect, the camera assembly 200 can receive the light with partial diffuse reflection, bright spots can be presented on the acquired image information, and the controller can analyze the image information acquired by the camera assembly 200 to determine whether the inner bottom 310 of the box 300 has the defect. And in some embodiments the controller further has a signal generator through which the inspection results can be transmitted to a computer for reference by the staff.
In some embodiments, referring to fig. 6, for better defect detection on the inner bottom surface 310 of the case 300, the total number of light sources 100 is 4, namely, the first light source, the second light source, the third light source and the fourth light source, and each light source 100 is divided into two groups, each group has two light sources 100, wherein the first light source and the second light source are in one group, the third light source and the fourth light source are in one group, the projections of the optical axes of the first light source and the second light source on the projection plane parallel to the inner bottom surface 310 intersect, and the projections of the optical axes of the third light source and the fourth light source on the projection plane parallel to the inner bottom surface 310 intersect. The defect detecting step using the inner bottom surface defect detecting device further includes:
step one: the first light source and the second light source emit parallel light to irradiate;
any one of the light sources 100 is started, in the illustrated embodiment, two light sources 100 are irradiated, two non-parallel light beams are emitted to the inner side surface 320 of the box 300, the light beams are reflected at least once by the inner side surface 320 or the reflecting mirror and then irradiated to the inner bottom surface 310, and the light beams are emitted from the box 300 after at least one reflection, and it should be noted that the light beams emitted from the box 300 after the reflection need to avoid the camera of the camera assembly 200, so as to ensure that the defect detection can be performed smoothly.
Step two: the camera assembly 200 shoots to acquire first image information;
the image capturing assembly 200 performs a first image capturing when the inner bottom surface 310 is illuminated, that is, the first image information of the inner bottom surface 310 is collected, if the inner bottom surface 310 has a defect, the light will be diffusely reflected at the defect, the image capturing assembly 200 can receive the light reflected partially diffusely, and a bright spot will be presented on the first image information obtained.
Step three: the third light source and the fourth light source emit parallel light to irradiate;
the other group of light sources 100 is activated, and in the illustrated embodiment, two light sources 100 are irradiated, and two non-parallel light beams are emitted to the inner side surface 320 of the box 300, reflected at least once by the inner side surface 320 or the reflecting mirror, then irradiated to the inner bottom surface 310, and finally emitted from the box 300 after at least one reflection.
Step four: the camera assembly 200 shoots to acquire second image information;
the image capturing assembly 200 performs a second image capturing when the inner bottom surface 310 is illuminated, that is, the second image information of the inner bottom surface 310 is collected, if the inner bottom surface 310 has a defect, the light will be diffusely reflected at the defect, the image capturing assembly 200 can receive the light reflected by a part of the diffusely, and a bright spot will be presented on the obtained second image information.
Step five: the controller detects defects of the first image information and the second image information;
the controller can comprehensively compare and analyze the first image information and the second image information to determine whether the inner bottom surface 310 of the box 300 has a defect, and if so, can identify the defect according to the image information, determine what kind of defect is, and the size of the defect, and transmit the information to the computer. In some embodiments, the computer can also classify the box 300 according to the defect information, and the staff can perform different operations on the box 300 with different defect types according to the classification, so that the working efficiency is further improved, and the cost is saved.
The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made within the knowledge of one of ordinary skill in the art without departing from the spirit of the present invention. Furthermore, embodiments of the invention and features of the embodiments may be combined with each other without conflict.

Claims (10)

1. The utility model provides an interior bottom surface defect detection device for detect the interior bottom surface of box body, its characterized in that includes:
a bracket;
the light source is connected to the bracket and is configured to generate parallel light, the parallel light is used for irradiating the inside of the box body, the parallel light irradiates the inner bottom surface after being reflected at least once by the inner side surface of the box body, and the parallel light is emitted from the box body after being reflected at least once;
the camera shooting assembly is connected to the bracket, the light source is arranged on one side of the camera shooting assembly, and the camera shooting assembly is used for acquiring image information of the inner bottom surface when the light source irradiates;
and a controller configured to perform defect detection based on the image information acquired by the image pickup assembly.
2. The in-floor defect detection apparatus according to claim 1, wherein the light sources have a plurality of, each of the light sources is disposed at intervals along a circumferential direction of the image pickup assembly, a projection plane parallel to the in-floor is defined, and projections of optical axes of at least two of the light sources on the projection plane intersect.
3. The in-floor defect detection apparatus according to claim 2, wherein the in-floor defect detection apparatus includes at least a first light source and a second light source, projections of optical axes of the first light source and the second light source on the projection plane intersect, the controller is configured to be able to control the first light source to perform a first illumination operation and to control the image pickup assembly to acquire first image information after performing the first illumination operation, and to control the second light source to perform a second illumination operation and to control the image pickup assembly to acquire second image information after performing the second illumination operation, and to perform defect detection based on the first image information and the second image information.
4. The apparatus according to claim 3, wherein the first light source and the second light source are located on both sides of the image pickup assembly, respectively, in a longitudinal direction of the case.
5. The internal bottom surface defect detection apparatus according to claim 2, wherein the internal bottom surface defect detection apparatus includes at least a first light source, a second light source, a third light source, and a fourth light source, projections of optical axes of the first light source and the second light source on the projection surface intersect, projections of optical axes of the third light source and the fourth light source on the projection surface intersect, the controller is configured to be able to control the first light source and the second light source to perform a first illumination operation, and to control the image pickup assembly to acquire first image information after performing the first illumination operation, and to control the third light source and the fourth light source to perform a second illumination operation, and to control the image pickup assembly to acquire second image information after performing the second illumination operation, and to be able to perform defect detection based on the first image information and the second image information.
6. The device according to claim 1, wherein an angle between the parallel light rays emitted from the light source and the inner bottom surface is not less than 5 °.
7. The utility model provides an interior bottom surface defect detection device for detect the interior bottom surface of box body, its characterized in that includes:
a bracket;
the reflecting mirror is attached to the inner side surface of the box body;
the light source is connected with the bracket and is configured to generate parallel light, the parallel light irradiates the inside of the box body, and the parallel light irradiates the inner bottom surface after being reflected at least once by the reflecting mirror and is emitted from the box body after being reflected at least once;
the camera shooting assembly is connected to the bracket, the light source is arranged on one side of the camera shooting assembly, and the camera shooting assembly is used for acquiring image information of the inner bottom surface when the light source irradiates;
and a controller configured to perform defect detection based on the image information acquired by the image pickup assembly.
8. The in-floor defect detection apparatus according to claim 7, wherein the light sources have a plurality of, each of the light sources is disposed at intervals along a circumferential direction of the image pickup assembly, a projection plane parallel to the in-floor is defined, and projections of optical axes of at least two of the light sources on the projection plane intersect.
9. The detection method using the inner bottom surface defect detection device is characterized in that the inner bottom surface defect detection device comprises the following steps:
a bracket;
the light source is connected to the bracket and is configured to generate parallel light, the parallel light is used for irradiating the inside of the box body, the parallel light irradiates the inner bottom surface after being reflected at least once by the inner side surface of the box body, and the parallel light is emitted from the box body after being reflected at least once;
the camera shooting assembly is connected to the bracket, the light source is arranged on one side of the camera shooting assembly, and the camera shooting assembly is used for acquiring image information of the inner bottom surface when the light source irradiates;
a controller configured to perform defect detection based on image information acquired by the image pickup assembly;
the operation method is as follows:
placing the box body below the camera shooting assembly;
and performing defect detection by using the inner bottom surface defect detection device.
10. The inspection method according to claim 9, wherein the inner bottom surface defect inspection apparatus includes at least a first light source, a second light source, a third light source, and a fourth light source, projections of optical axes of the first light source and the second light source on the projection plane intersect, and projections of optical axes of the third light source and the fourth light source on the projection plane intersect;
the defect detection step using the inner bottom surface defect detection device comprises the following steps:
the first light source and the second light source emit parallel light to irradiate;
the camera shooting assembly shoots to obtain first image information;
the third light source and the fourth light source emit parallel light to irradiate;
the camera shooting assembly shoots to obtain second image information;
the controller performs defect detection based on the first image information and the second image information.
CN202310977893.4A 2023-08-04 2023-08-04 Inner bottom surface defect detection device and detection method Pending CN117169240A (en)

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Application Number Priority Date Filing Date Title
CN202310977893.4A CN117169240A (en) 2023-08-04 2023-08-04 Inner bottom surface defect detection device and detection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202310977893.4A CN117169240A (en) 2023-08-04 2023-08-04 Inner bottom surface defect detection device and detection method

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Publication Number Publication Date
CN117169240A true CN117169240A (en) 2023-12-05

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Country Link
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