CN107084993A - Double camera single-station positive and negative vision inspection apparatus - Google Patents

Double camera single-station positive and negative vision inspection apparatus Download PDF

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Publication number
CN107084993A
CN107084993A CN201710473907.3A CN201710473907A CN107084993A CN 107084993 A CN107084993 A CN 107084993A CN 201710473907 A CN201710473907 A CN 201710473907A CN 107084993 A CN107084993 A CN 107084993A
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CN
China
Prior art keywords
light source
camera
testee
inspection apparatus
vision inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201710473907.3A
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Chinese (zh)
Inventor
肖上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Wuxi Jiuxiao Technology Co Ltd
Original Assignee
Wuxi Jiuxiao Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wuxi Jiuxiao Technology Co Ltd filed Critical Wuxi Jiuxiao Technology Co Ltd
Priority to CN201710473907.3A priority Critical patent/CN107084993A/en
Publication of CN107084993A publication Critical patent/CN107084993A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • G01N2021/8841Illumination and detection on two sides of object

Abstract

The present invention relates to a kind of vision inspection apparatus, especially double camera single-station positive and negative vision inspection apparatus, including upper camera, lower camera, light source assembly and reflection subassembly;The upper camera is located at the side of testee, the reflection subassembly is located at the opposite side of testee, the lower camera is located at the side of reflection subassembly, and the light source assembly is separately mounted to the both sides of testee, and respectively positioned at the side of upper camera and the side of reflection subassembly;Camera lens is respectively arranged with the upper camera and lower camera, the upper camera shoots the side of testee, and lower camera shoots the opposite side of testee by reflection subassembly.Multistation vision system is incorporated into a station by the double camera single-station positive and negative vision inspection apparatus that the present invention is provided, and compact conformation, installation and debugging convenience, reliability are high.

Description

Double camera single-station positive and negative vision inspection apparatus
Technical field
The present invention relates to a kind of vision inspection apparatus, especially double camera single-station positive and negative vision inspection apparatus.
Background technology
For some objects to be detected, because its is horizontal and vertical relatively large sized, under same camera, different surfaces The operating distance needed is widely different, even if can be imaged, and the light path difference of obverse and reverse is also larger, and this results in existing Big depth of field camera lens is unable to reach a camera while the tow sides of detection object;Detection method general at present is all a phase Machine takes a station and detects a face, if necessary to detection tow sides even multiaspect, it is necessary to taken using multiple cameras Multiple station detections, the installing space for so resulting in mechanism is very big, while needing Duo Tao mechanisms to install module, many set circuit moulds Group, increases mounting complexity, causes poor reliability.
The content of the invention
To solve the above problems, the present invention provides a kind of compact conformation, installation and debugging are convenient, once can detect tested simultaneously The double camera single-station positive and negative vision inspection apparatus of two relative sides of object, concrete technical scheme is:
Double camera single-station positive and negative vision inspection apparatus, including upper camera, lower camera, light source assembly and reflection subassembly;It is described Upper camera is located at the side of testee, and the reflection subassembly is located at the opposite side of testee, and the lower camera is located at reflection The side of component, the light source assembly is separately mounted to the both sides of testee, and respectively positioned at the side of upper camera and reflection The side of component;Camera lens is respectively arranged with the upper camera and lower camera, the upper camera shoots the side of testee, lower camera The opposite side of testee is shot by reflection subassembly.
It is preferred that, the light source assembly includes coaxial light source, annular light source, bar shaped combined light source, coaxial light source and annular Any of light source, coaxial light source and bar shaped combined light source;The coaxial light source and annular light source are installed side by side, coaxial light source Light source center and annular light source light source center on the same axis, the annular light source be located at testee side;Institute State coaxial light source and bar shaped combined light source is installed side by side, the light source center of coaxial light source exists with the light source center of bar shaped combined light source On same axis, the bar shaped combined light source is located at the side of testee.
It is preferred that, the bar shaped combined light source includes no less than two strip sources, and the strip source composition is parallel The bar shaped combined light source of bar shaped combined light source or regular polygon.
Further, it is respectively arranged with polarizer on the annular light source and bar shaped combined light source.
It is preferred that, the reflection subassembly is included in the upper reflex block and lower reflex block being symmetrically installed, the upper reflex block On the same axis, the center of the center of the lower reflex block and lower camera is in same axis for the inspection center of the heart and testee On, the another side of the testee is reflexed on lower reflex block by upper reflex block, and lower reflex block is reflexed on lower camera.
Further, the upper reflex block and lower reflex block are speculum or reflecting prism.
It is preferred that, the upper camera and lower camera are arranged on guide rail by sliding block, guide rail be separately mounted to bottom plate and On crossbeam.
It is preferred that, the upper camera and lower extended loop is respectively arranged between camera and camera lens.
It is preferred that, the side of the camera lens of the upper camera and lower camera is respectively arranged with shading ring, and the shading ring is located at tested The side of object.
Further, polariscope is housed between the camera lens and shading ring.
Reflection subassembly is just will to be imaged onto lower phase to the back side of the testee of upper camera by light catoptric imaging principle On machine.Reflection subassembly is made up of the upper reflex block and lower reflex block being symmetrically installed, and the reflecting surface of two reflex blocks forms an angle, The reflecting surface of reflex block, to the reflecting surface of lower reflex block, is then descended in the back side of testee by the reflective surface of upper reflex block The camera lens of lower camera is re-reflected into, lower camera shoots the back side of testee.
Two relative sides of light source assembly irradiation testee.
Coaxial light source is there is provided the illumination than conventional light source evenly, while avoiding the reflective of object therefore improving machine The accuracy and reappearance of device vision.Coaxial light source(Diffuse coaxial lightses, metal flat diffusing reflection lighting source)There is provided than passing The illumination of system light source evenly, therefore improve the accuracy and reappearance of machine vision.Uniform illumination plane, glossiness table Face, strengthens scribing, depression, or embossed features;It is contrasted in minute surface, diffusion and/or sorbent surface, reduction transparent outer cover or screening The transmitance of cover material.Coaxial lightses are mainly for detection of the very serious planar object of reflective degree, such as glass.Coaxial light source can Highlight body surface out-of-flatness, the interference for overcoming surface reflection to cause, mainly for detection of the damaging of object flat smooth surface, Scuffing, crackle and foreign matter.High-density array LED, brightness is greatly improved;Unique radiator structure, extends the life-span, improves stable Property;Senior plated film spectroscope, reduces light loss;Imaging clearly, brightness uniformity.It is high that coaxial light source optimum is used for reflectance Object, such as metal, glass, film, the scuffing detection on chip surface;The damage testing of chip and silicon wafer, Mark point locations; Pack bar code identification.
Coaxial light source includes spectroscope and one piece of area source, and spectroscopical main function is that the light for sending area source is anti- Penetrate and be irradiated to body surface, the light that body surface is reflected can enter camera lens through spectroscope, axis light is mainly use In the feature for improving body defects.
Annular light source is the light source of an annular, and annular light source is used to detect the print character on testee.LED gusts Arrange into it is coniform testee surface is radiated at oblique angle, a small region is illuminated by diffusing reflection mode, operating distance is in 10- During 15MM, the light source can highlight the change of testee edge and height, and the prominent part for being difficult to see clearly originally, is side Edge detection, the ideal chose carved characters with damage check of metal surface.
Two strip sources are parallel when bar shaped combined light source uses two strip sources installs, and constitutes parallel bar shaped combination Light source;Using triangularity light source during three strip sources, square light source is constituted during using four strip sources, using five bars Regular pentagon bar shaped combined light source is constituted during shape light source.
Extended loop is to ensure different FOV(The angle of visual field)Adapt to different materials.
Shading ring is in order to avoid ambient light is disturbed, it is ensured that image brightness uniformity.
Sliding block and guide rail are used for the position for adjusting camera, conveniently reach optimal imaging effect.
Polarizer and polariscope reduce and eliminated the reflective of luminous object surface.
Light source assembly irradiates two relative sides of testee respectively, the side of upper camera calibration testee, i.e., just Face, the light that the head-on reflection of testee goes out is imaged on by lens focus on the sensitive chip of upper camera, so as to form quilt Survey the direct picture of object;Lower camera detects the opposite side of testee, the i.e. back side, the light of light source assembly by reflection subassembly The back side of testee is irradiated to, the light that testee is reflected reflexes to lower camera by two pieces of reflex blocks being symmetrically installed Lens focus, on the sensitive chip for being then imaged on lower camera, so as to form the back side image of testee.
Mechanism installing space is small, and installation and debugging are convenient, and double camera single-station positive and negative vision inspection apparatus is anti-by prism Penetrate imaging to observe reverse side, front is observed by direct capture, while the front and rear relative two sides of testee is detected, so that Can be with sufficiently effective saving mechanism space, while meeting Product checking demand.Each type objects of detection, bag can be widely used in Include but be not limited only to:Semiconductor product such as IC components, discrete component, photoelectric cell, memory etc., and machining Part, product of rubber and plastic, glassware etc.;It can be widely applied to different field, such as industrial production, food processing, automobile making, thing Stream, traffic, pharmacy medical science, aviation, military affairs etc..
Compared with prior art the invention has the advantages that:
Multistation vision system is incorporated into a station by the double camera single-station positive and negative vision inspection apparatus that the present invention is provided, Compact conformation, installation and debugging convenience, reliability are high.
Figure of description
Fig. 1 is the structural representation of the present invention;
Fig. 2 is the shooting principle schematic of the present invention.
Embodiment
In conjunction with accompanying drawing, the invention will be further described.
Embodiment one
As shown in figure 1, upper camera 11 is arranged on crossbeam 44, lower camera 12 is arranged on bottom plate 41, upper camera 11 and lower camera 12 are located at same one end of bottom plate 41;Reflection subassembly 33 is arranged on the other end of bottom plate 41, and testee 3 is located at the He of reflection subassembly 33 Between upper camera 11;The light source assembly is separately mounted on one end of camera 11 and reflection subassembly 33, i.e., light source assembly is pacified Mounted in the both sides of testee 3, the relative both sides of light source assembly irradiation testee 3;On the upper camera 11 and lower camera 12 Camera lens 14 is respectively arranged with, the upper camera 11 shoots the side of testee 3, and lower camera 12 shoots measured object by reflection subassembly 33 The opposite side of body 3.
Reflection subassembly 33 includes the upper reflector 31 and lower speculum 32 being symmetrically installed, and the center of upper reflector 31 is with being tested On the same axis, the center of the center of lower speculum 32 and lower camera 12 on the same axis, is tested for the inspection center of object 3 The another side of object 3 is reflexed on lower speculum 32 by upper reflector 31, and lower speculum 32 is reflexed on lower camera 12.
Light source assembly uses coaxial light source 22, and the center of coaxial light source 22 is with the inspection center of testee 3 in same axle On line.The center of coaxial light source 22 is also respectively with the center of camera lens 14 of upper camera 11 and the center of upper reflector 31 in same axis On.
As shown in Fig. 2 light source assembly irradiates two relative sides of testee 3 respectively, upper camera 11 detects measured object The side of body 3, i.e., it is positive, the light that the head-on reflection of testee 3 goes out by the focal imaging of camera lens 14 upper camera 11 sense On optical chip, so as to form the direct picture of testee 3;Lower camera 12 detects the another of testee 3 by reflection subassembly 33 Side, the i.e. back side, the light of light source assembly are irradiated to the back side of testee 3, and the light that testee 3 is reflected is by symmetrical The camera lens 14 that the upper reflector 31 of installation and lower speculum 32 reflex to lower camera 12 is focused on, and is then imaged on the sense of lower camera 12 On optical chip, so as to form the back side image of testee 3.
Embodiment two
On the basis of above-described embodiment, in addition to annular light source 21, coaxial light source 22 and the installation side by side of annular light source 21, coaxially The light source center of light source 22 and the light source center of annular light source 21 on the same axis, the detection of light source center and testee 3 Center is on the same axis;Annular light source 21 is located at the side of testee 3, annular light source 21 and the common irradiation of coaxial light source 22 Testee 3, makes the imaging of testee 3 clear.
Embodiment three
On the basis of above-described embodiment, extended loop 13 is respectively arranged between upper camera 11 and lower camera 12 and camera lens 14.
Example IV
On the basis of above-described embodiment, the side of the camera lens 14 of upper camera 11 and lower camera 12 is respectively arranged with shading ring 15, described Shading ring 15 is located at the side of testee 3, i.e. camera, extended loop 13, camera lens 14 and shading ring 15 is installed successively.

Claims (10)

1. double camera single-station positive and negative vision inspection apparatus, it is characterised in that including upper camera(11), lower camera(12), light Source component and reflection subassembly(33);The upper camera(11)Positioned at testee(3)Side, the reflection subassembly(33)It is located at Testee(3)Opposite side, the lower camera(12)Positioned at reflection subassembly(33)Side, the light source assembly is respectively mounted In testee(3)Both sides, and respectively be located at upper camera(11)Side and reflection subassembly(33)Side;The upper camera (11)With lower camera(12)On be respectively arranged with camera lens(14), the upper camera(11)Shoot testee(3)Side, lower camera (12)Pass through reflection subassembly(33)Shoot testee(3)Opposite side.
2. double camera single-station positive and negative vision inspection apparatus according to claim 1, it is characterised in that the light source group Part includes coaxial light source(22), annular light source(21), bar shaped combined light source, coaxial light source(22)And annular light source(21), it is coaxial Light source(22)Any of with bar shaped combined light source;The coaxial light source(22)And annular light source(21)Install side by side, coaxially Light source(22)Light source center and annular light source(21)Light source center on the same axis, the annular light source(21)Positioned at quilt Survey object(3)Side;The coaxial light source(22)Installed side by side with bar shaped combined light source, coaxial light source(22)Light source center With the light source center of bar shaped combined light source on the same axis, the bar shaped combined light source is located at testee(3)Side.
3. double camera single-station positive and negative vision inspection apparatus according to claim 2, it is characterised in that the bar shaped group Closing light source includes the bar of no less than two strip sources, the parallel bar shaped combined light source of the strip source composition or regular polygon Shape combined light source.
4. the double camera single-station positive and negative vision inspection apparatus according to Claims 2 or 3, it is characterised in that the ring Shape light source(21)Polarizer is respectively arranged with bar shaped combined light source.
5. double camera single-station positive and negative vision inspection apparatus according to claim 1, it is characterised in that the reflection group Part(33)Including the upper reflex block and lower reflex block being symmetrically installed, the center of the upper reflex block and testee(3)Detection Center on the same axis, the center of the lower reflex block and lower camera(12)Center on the same axis, the measured object Body(3)Another side reflexed to by upper reflex block on lower reflex block, lower reflex block reflexes to lower camera(12)On.
6. double camera single-station positive and negative vision inspection apparatus according to claim 5, it is characterised in that the upper reflection Block and lower reflex block are speculum or reflecting prism.
7. double camera single-station positive and negative vision inspection apparatus according to claim 1, it is characterised in that the upper camera Pass through sliding block with lower camera(42)Installed in guide rail(43)On, guide rail(43)It is separately mounted to bottom plate(41)And crossbeam(44) On.
8. double camera single-station positive and negative vision inspection apparatus according to claim 1, it is characterised in that the upper camera (11)With lower camera(12)With camera lens(14)Between be respectively arranged with extended loop(13).
9. the double camera single-station positive and negative vision inspection apparatus according to claim 1 or 8, it is characterised in that on described Camera(11)With lower camera(12)Camera lens(14)Side be respectively arranged with shading ring(15), the shading ring(15)Positioned at measured object Body(3)Side.
10. double camera single-station positive and negative vision inspection apparatus according to claim 9, it is characterised in that the camera lens (14)And shading ring(15)Between be equipped with polariscope.
CN201710473907.3A 2017-06-21 2017-06-21 Double camera single-station positive and negative vision inspection apparatus Pending CN107084993A (en)

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Application Number Priority Date Filing Date Title
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Application Number Priority Date Filing Date Title
CN201710473907.3A CN107084993A (en) 2017-06-21 2017-06-21 Double camera single-station positive and negative vision inspection apparatus

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108596173A (en) * 2018-04-19 2018-09-28 长春理工大学 One camera full view wire size real-time distinguishing apparatus and its detection method
CN109142375A (en) * 2018-08-20 2019-01-04 宁波市智能制造产业研究院 A kind of high accuracy vision detection system and method for target
CN111380579A (en) * 2020-04-30 2020-07-07 征图新视(江苏)科技股份有限公司 Visual detection method and system for mobile phone camera glass
CN112033971A (en) * 2020-08-05 2020-12-04 同济大学 Visual flaw detection system and method
CN112791989A (en) * 2021-03-29 2021-05-14 常州三点零智能制造有限公司 Automatic license plate detection method and device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108596173A (en) * 2018-04-19 2018-09-28 长春理工大学 One camera full view wire size real-time distinguishing apparatus and its detection method
CN109142375A (en) * 2018-08-20 2019-01-04 宁波市智能制造产业研究院 A kind of high accuracy vision detection system and method for target
CN111380579A (en) * 2020-04-30 2020-07-07 征图新视(江苏)科技股份有限公司 Visual detection method and system for mobile phone camera glass
CN112033971A (en) * 2020-08-05 2020-12-04 同济大学 Visual flaw detection system and method
CN112791989A (en) * 2021-03-29 2021-05-14 常州三点零智能制造有限公司 Automatic license plate detection method and device
CN112791989B (en) * 2021-03-29 2021-07-13 常州三点零智能制造有限公司 Automatic license plate detection method and device

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