CN117168632B - Laser pulse width single-shot autocorrelation measuring device and calibration method thereof - Google Patents

Laser pulse width single-shot autocorrelation measuring device and calibration method thereof Download PDF

Info

Publication number
CN117168632B
CN117168632B CN202310827220.0A CN202310827220A CN117168632B CN 117168632 B CN117168632 B CN 117168632B CN 202310827220 A CN202310827220 A CN 202310827220A CN 117168632 B CN117168632 B CN 117168632B
Authority
CN
China
Prior art keywords
light
laser
fresnel prism
camera
pulse width
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202310827220.0A
Other languages
Chinese (zh)
Other versions
CN117168632A (en
Inventor
赵研英
耿易星
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Peking University
Original Assignee
Peking University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Peking University filed Critical Peking University
Priority to CN202310827220.0A priority Critical patent/CN117168632B/en
Publication of CN117168632A publication Critical patent/CN117168632A/en
Application granted granted Critical
Publication of CN117168632B publication Critical patent/CN117168632B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

The invention discloses a laser pulse width single-shot autocorrelation measuring device and a calibration method thereof. The invention adopts the Fresnel prism with small angle and the calibration sheet to replace the interferometer and the lens combination of the traditional second-order correlator, simplifies the structure of the device, ensures the simple structure, low cost and high precision of the equipment; the sum frequency effect is utilized, and the conversion from time information to space information is realized by utilizing a nonlinear autocorrelation method, so that the single-shot measurement of the ultra-fast ultra-strong laser pulse width is realized, and the single-shot measurement can be performed in a single-shot mode; the method of embedding the calibration sheet is adopted for calibration, so that complex operation of multipoint calibration is avoided, and the calibration operation can be omitted in the subsequent measurement after one calibration; the self-adaptive junction of the frequency doubling crystal is automatically adjusted through data processing by utilizing the characteristic that lasers with different calibers are different at the junction of the splitting beam of the Fresnel prism; the laser dispersion is roughly regulated by utilizing the frequency multiplication effect, so that preliminary guidance is made for measuring the shortest pulse width of the laser by the second-order correlator.

Description

Laser pulse width single-shot autocorrelation measuring device and calibration method thereof
Technical Field
The invention relates to an ultrafast super-strong laser technology, in particular to a laser pulse width single-shot autocorrelation measuring device and a calibration method thereof.
Background
After the chirped laser pulse amplification system (CPA) is proposed, the peak power of the laser device is developed in a leap way, and the peak power of the laser pulse can reach a plurality PW (10 15 W), the light intensity of the laser pulse can reach 10 22 W/cm 2 . Such intense field laser pulses are widely used in laser-target interactions. In the interaction of the laser with the target, pulse width as an important parameter characterizing the laser has a significant impact on experimental phenomena. It is a significant task to diagnose the laser pulse width quickly and efficiently.
Currently, the repetition rate of the laser in the Baitai watt (TW) and the clapping watt (PW) is more than 0.1 to 10Hz, and the pulse width is usually in the magnitude of femtosecond. Because the response time of the existing photoelectric device is also at the picosecond level, the photoelectric device cannot directly measure the pulse width of the femtosecond laser, and the diagnostic method requiring a scanning technology cannot meet the requirement of rapid measurement.
Currently, only the nonlinear effects of light and medium can be used to achieve the measurement, with three most common methods: autocorrelation, frequency-resolved optical switching (FROG), and self-referenced spectral phase coherent direct electric field reconstruction (SPIDER). The frequency resolution optical switching method and the self-reference spectrum phase coherent electric field direct reconstruction method can measure more time domain information such as chirp, phase and the like. They have the disadvantages of complex algorithms, long time consumption, complex equipment and difficult operation, respectively.
A diagram of a conventional autocorrelation measuring apparatus is shown in fig. 1. The principle is that the main laser is divided into two paths by the beam splitting device 11, one path is reflected by the third reflecting mirror 14 and the fourth reflecting mirror 15, the other path is reflected by the first reflecting mirror 12 and the second reflecting mirror 13 respectively, the beams are combined by the beam combining device 16, focused by the focusing mirror 17, and the combined beams are converged in the nonlinear crystal to generate sum frequency light, filtered by the filter 19 and transmitted to the detecting device 110 for measurement. And introducing delay into one path of light, and measuring the change of the sum frequency light intensity along with the delay to calculate the width of the pulse. The method needs continuous change of delay, consumes long time and cannot realize single-shot measurement. Meanwhile, in order to continuously adjust the delay, the required light path is complex, and the number of optical elements is large, so that the cost is increased, the size is increased, the operation is difficult and the error is large.
Disclosure of Invention
Aiming at the problems existing in the prior art, the invention provides the laser pulse width single-shot autocorrelation measuring device and the calibration method thereof, which realize the single-shot measurement of the ultra-short ultra-strong pulse width, and have the advantages of large bandwidth, low cost, convenient carrying, stable work and high measurement precision.
An object of the present invention is to provide a laser pulse width single-shot autocorrelation measuring apparatus.
The laser pulse width single-shot autocorrelation measuring device of the invention comprises: the device comprises a Fresnel prism, a nonlinear crystal, a crystal translation stage, a detector, a calibration piece translation stage, a first camera, a second camera and an instrument box; the instrument box is a hollow shell, and the Fresnel prism, the nonlinear crystal, the detector and the calibration sheet are arranged in the instrument box; a light inlet hole is formed in one side wall of the instrument box, and a first observation window and a second observation window are arranged on the side wall opposite to the light inlet hole; in the instrument boxAnd set up fresnel prism in just being located before going into the unthreaded hole, fresnel prism's base angle is θ, and the bore of going into the unthreaded hole is bigger than fresnel prism's bore, guarantees that the logical plain noodles of fresnel prism will not be sheltered from to the income unthreaded hole, and fresnel prism will divide the beam and close the dual function of beam combination to integrate: the Fresnel prism divides the laser to be measured into two beams, and simultaneously combines the split beams at an included angle 2 alpha, wherein alpha=arcsin (n 0 sinθ)-θ,n 0 Refractive index of the Fresnel prism; the combined light forms sum frequency light in a nonlinear crystal, the sum frequency light is received by a detector, the nonlinear crystal is placed on a crystal translation stage, and the crystal translation stage can drive the nonlinear crystal to translate back and forth along the direction of an optical axis; the calibration sheet is placed on the calibration sheet translation stage, and the calibration sheet is completely positioned outside the optical path when moving out of the optical path through the calibration sheet translation stage moving out of the optical path or moving into the optical path; when the calibration sheet moves into the light path, the calibration sheet is positioned between the light inlet hole and the Fresnel prism, at the moment, one side of the calibration sheet is parallel to the edge of the Fresnel prism, half of incident light passes through the calibration sheet, all light passing through the calibration sheet passes through the Fresnel prism and then is transmitted to the second observation window, and the other half of light which does not pass through the calibration sheet passes through the Fresnel prism and then is transmitted to the first observation window, and the light beams are observed from the outside of the instrument box through the first observation window and the second observation window and are beaten at the position of the observation window; and a first camera and a second camera are respectively arranged at the first observation window and the second observation window, and the first camera and the second camera respectively image the first observation window and the second observation window.
The detector adopts a CCD camera. The first observation window and the second observation window are made of ground glass.
The distance between the Fresnel prism and the light inlet is less than 2cm; the size of the light-passing surface of the Fresnel prism is a 0 ×a 0 The middle of the Fresnel prism is thick, the two sides of the Fresnel prism are thin, the thickest part in the middle is the edge of the Fresnel prism, and the thinnest part is b 0 ,b 0 <300μm,a 0 Less than 20mm, and more than 5 DEG and less than 8 deg. The base angle theta of the Fresnel prism is too small, the beam combination angle alpha of the Fresnel prism after beam splitting is too small, so that the whole equipment is too long, and the light space interference after beam combination is not beneficial to pulse width measurement; fresnel (Fresnel)The base angle theta of the prism is too large, the front tilt of the light wave after beam splitting is serious, and the pulse width measurement is influenced, so the distance between the nonlinear crystal and the Fresnel prismPreferably->At this time, the light passing area of the Fresnel prism is fully utilized, so that the measurable range is the widest.
Distance between detector and nonlinear crystalTherefore, the sum frequency light and the fundamental frequency light are ensured to be fully separated in space, and the fundamental frequency light cannot enter the detector to interfere with measurement.
The actual thickness of the standard piece is more than 100 μm and less than 200 μm, and the material is an optical material with a refractive index of 1.3-1.7, preferably fused silica.
Another object of the present invention is to provide a laser pulse width measurement method of a laser pulse width single-shot autocorrelation measurement apparatus.
The invention discloses a laser pulse width single-shot autocorrelation measuring device, which is used for measuring factory parameters before measuring the laser pulse width, and comprises the following steps:
1) And (3) primary debugging:
a) Determining the distance between a nonlinear crystal and a fresnel prism
b) After laser is incident to the Fresnel prism, the laser is split and combined, sum frequency light is generated in the nonlinear crystal, the sum frequency light is detected by a detector, and a sum frequency signal is obtained on the detector;
2) And (5) factory calibration:
a) After the primary debugging is finished, the caliber D of the light spot is larger than or equal to a 0 The laser of the laser is debugged, and the positions of light spots on the first camera and the second camera at the moment are respectively recorded as Z 1 And Z 2 The method comprises the steps of carrying out a first treatment on the surface of the Recording the size of a light spot on the first camera or the second camera as D';
b) The distance between the nonlinear crystal and the fresnel prism is recorded as a at this time.
Wherein, in step a) of step 1), the distance between the nonlinear crystal and the fresnel prism is determined, comprising the steps of:
i. the calibration sheet is moved out of the light path through the calibration sheet translation stage;
ii, the caliber D of the light spot is larger than or equal to a 0 Is debugged by laser of (1), and the caliber D of a light spot is more than or equal to a 0 The laser of the laser beam enters the laser pulse width single-shot autocorrelation measuring device through the light inlet hole, light spots are formed on the first observation window and the second observation window respectively, and the light spots are received through the first camera and the second camera;
translating the laser pulse width single-shot autocorrelation measuring device along the direction perpendicular to the incident laser to make the light spot sizes received by the first camera and the second camera identical;
adjusting the position of the nonlinear crystal in the direction of the optical axis such that the distance between the nonlinear crystal and the fresnel prism
The factory parameter measurement is only executed when the first debugging is performed, and the pulse width of the laser pulse is measured after the factory parameter measurement is completed.
The invention relates to a laser pulse width measuring method of a laser pulse width single-shot autocorrelation measuring device, which comprises the following steps:
1) Frequency multiplication crystal position determination:
a) The calibration sheet is moved out of the light path through the calibration sheet translation stage;
b) The laser to be measured enters the laser pulse width single-shot autocorrelation measuring device through the light entrance hole, light spots on the first camera and the second camera are observed, and the center positions of the light spots received by the first camera and the second camera are Z respectively 1t And Z 2t Reading spots on the first and second cameras, respectivelyThe size is D 1t And D 2t
c) The size of the light spot on the first camera and the second camera is made to satisfy (1-D by translating the laser pulse width single-shot autocorrelation measuring apparatus in a direction perpendicular to the incident laser th )×D 2t <D 1t <(1+D th )×D 2t ,D th Is a spot difference threshold, or such that the positions of the spots on the first and second cameras satisfy (1-D th )×|Z 2t -Z 2 |<|Z 1t -Z 1 |<(1+D th )×|Z 2t -Z 2 |;
d) The spot size D is obtained by the first camera or the second camera 1t Or D 2t Calculating according to the size of the light spot at the moment to obtain the distance A between the nonlinear crystal and the Fresnel prism after adjustment t =A×D 1t /D', or A t =A×
D 2t D', moving the crystal translation stage towards the Fresnel prismOr->
2) Acquiring sum frequency signals:
after the laser to be measured is incident to the Fresnel prism, the laser is split and combined, sum frequency light is generated in the nonlinear crystal, the sum frequency light is detected by a detector, and a sum frequency signal is obtained on the detector;
the sum frequency signal obtained by the detector is in a vertical strip shape, the long side of the sum frequency signal is defined as the sum frequency light direction, any row of numerical values perpendicular to the sum frequency light direction are selected, the drawing is carried out, the abscissa is the coordinate value of the pixel position of each row, and the ordinate is the intensity of the sum frequency signal acquired by each row of pixels;
3) Single pixel corresponds to delay calibration:
a) The standard sheet is positioned outside the light path, and the pixel position with the strongest light spot formed by the recorded sum frequency light on the detector is p;
b) The calibration sheet is moved into the light path through the calibration sheet translation stage, at the moment, the light spot formed by the sum frequency light on the detector moves a distance, the strongest pixel position of the light spot at the moment is recorded as q, and the number k of pixels moving the light spot is equal to the number of pixels moving the light spot;
c) Calculating the placement of the calibration sheet introduces a pulse delay t 1 = (n-1) d/c, d is the thickness of the standard piece, n is the refractive index of the standard piece, and the corresponding delay tau of a single pixel is calculated 1 =t 1 K, delay τ with single pixel correspondence 1 As the resolution of the laser pulse width single-shot autocorrelation measuring device, c is the speed of light;
4) Measuring the pulse width of the laser pulse:
a) The calibration sheet is moved out of the light path through the calibration sheet translation stage;
b) The laser to be measured enters a laser pulse width single-emission autocorrelation measuring device through an entrance aperture, a sum frequency light is generated in a nonlinear crystal by splitting and combining beams through a Fresnel prism, a sum frequency signal is obtained by a detector, a line of the strongest numerical value of the sum frequency signal is taken along the direction vertical to the sum frequency light, a graph is drawn, the transverse coordinate is the coordinate value of the pixel position of each line, namely the spatial position of the detector, the vertical coordinate is the intensity of the sum frequency signal, the half-height full-width pixel number K of the sum frequency signal is calculated, and the half-height full-width time of the sum frequency signal is Kτ 1
c) Obtaining the laser pulse width t=Kτ by using the convolution factor W 1 /W。
In step 3) c), the spot difference threshold D th 5 to 20 percent.
The dispersion influences the laser pulse width, the laser pulse width influences the frequency multiplication efficiency, the shorter the laser pulse width is, the higher the frequency multiplication efficiency is, so that the laser pulse width can be changed by adjusting the dispersion, and the output frequency multiplication light is strongest, and the dispersion of a laser system can be adjusted by judging the intensity of the frequency multiplication light, so that the laser pulse is shortest in the nonlinear crystal position. The laser pulse width single-shot autocorrelation measuring device further comprises a light filter, the light filter is high in reflection of fundamental frequency light and high in transmission of self-frequency doubling light, the light filter is placed on a light filter translation table, and the light filter is driven to be positioned in front of the first observation window or moved out of the light path through the light filter translation table.
The factory parameter measurement is only carried out when the first debugging is carried out, and after the factory parameter measurement is finished, the laser pulse width single-shot autocorrelation measuring device is used for measuring the shortest laser pulse width.
The invention relates to a laser pulse width single-shot autocorrelation measuring device for measuring the shortest laser pulse width, which comprises the following steps:
1) Frequency multiplication crystal position determination:
a) The calibration sheet is moved out of the optical path through the calibration sheet translation stage, and the optical filter is moved out of the optical path;
b) The laser to be measured enters the laser pulse width single-shot autocorrelation measuring device through the light entrance hole, light spots on the first camera and the second camera are observed, and the center positions of the light spots received by the first camera and the second camera are Z respectively 1t And Z 2t The light spot sizes of the first camera and the second camera are respectively read as D 1t And D 2t
c) The size of the light spot on the first camera and the second camera is made to satisfy (1-D by translating the laser pulse width single-shot autocorrelation measuring apparatus in a direction perpendicular to the incident laser th )×D 2t <D 1t <(1+D th )×D 2t ,D th Is a spot difference threshold, or such that the positions of the spots on the first and second cameras satisfy (1-D th )×|Z 2t -Z 2 |<|Z 1t -Z 1 |<(1+D th )×|Z 2t -Z 2 |;
d) The spot size D is obtained by the first camera or the second camera 1t Or D 2t Calculating according to the size of the light spot at the moment to obtain the distance A between the nonlinear crystal and the Fresnel prism after adjustment t =A×D 1t either/D' or A t =A×D 2t D', moving the crystal translation stage towards the Fresnel prismOr->
2) Coarse adjustment of laser system dispersion:
a) Moving the optical filter to the front of the first observation window through the optical filter translation table;
b) The laser to be measured is incident into the Fresnel prism and then is divided into two beams, the two beams respectively pass through the nonlinear crystal and generate self-frequency doubling light in the nonlinear crystal, one beam only keeps the self-frequency doubling light to irradiate the first observation window through the optical filter, and the other beam irradiates the second observation window;
c) Receiving self-frequency multiplication light on a first camera, adjusting laser energy to enable the first camera to obtain light spot data, reading the light spot data and taking the highest pixel value;
d) Changing the dispersion of the laser system, wherein the spot data in the step 2) c) is changed, and when the dispersion compensation of the laser system is optimal, the received self-frequency doubling light on the first camera is strongest; stopping changing the laser system dispersion at the position with the maximum pixel value, taking the laser system dispersion at the moment as the laser system dispersion after coarse adjustment, and entering the step 5); reducing laser energy if the first camera signal is saturated during changing the laser system dispersion;
3) Acquiring sum frequency signals:
after the laser to be measured is incident to the Fresnel prism, the laser is split and combined, sum frequency light is generated in the nonlinear crystal, the sum frequency light is detected by a detector, and a sum frequency signal is obtained on the detector;
4) Single pixel corresponds to delay calibration:
a) The standard sheet is positioned outside the light path, and the pixel position with the strongest light spot formed by the recorded sum frequency light on the detector is p;
b) The calibration sheet is moved into the light path through the calibration sheet translation stage, at the moment, the light spot formed by the sum frequency light on the detector moves a distance, the strongest pixel position of the light spot at the moment is recorded as q, and the number k of pixels moving the light spot is equal to the number of pixels moving the light spot;
c) Calculating the placement of the calibration sheet introduces a pulse delay t 1 = (n-1) d/c, d is the thickness of the standard piece, and the corresponding delay tau of the single pixel is calculated 1 =t 1 K, delay τ with single pixel correspondence 1 As the resolution of the laser pulse width single-shot autocorrelation measuring device;
5) Obtaining the shortest laser pulse width:
a) The calibration sheet is moved out of the light path through the calibration sheet translation stage;
b) The laser to be measured enters a laser pulse width single-emission autocorrelation measuring device through an entrance aperture, a sum frequency light is generated in a nonlinear crystal by splitting and combining beams through a Fresnel prism, a sum frequency signal is obtained by a detector, a line of the strongest numerical value of the sum frequency signal is taken along the direction vertical to the sum frequency light, a graph is drawn, the transverse coordinate is the coordinate value of the pixel position of each line, namely the spatial position of the detector, the vertical coordinate is the intensity of the sum frequency signal, the half-height full-width pixel number K of the sum frequency signal is calculated, and the half-height full-width time of the sum frequency signal is Kτ 1
c) Obtaining the laser pulse width t=Kτ by using the convolution factor W 1 /W;
d) The laser system dispersion is further adjusted so that the measured data of the laser pulse width is shortest, thereby obtaining the shortest laser pulse width of the laser system.
The invention has the advantages that:
(1) Simple structure, with low costs and the precision is high:
the invention adopts the Fresnel prism with small angle and the calibration sheet to replace the interferometer and the lens combination of the traditional second-order correlator, so that the structure of the device is greatly simplified, and the simple structure, low cost and high precision of the equipment are ensured;
(2) Single shot measurement, simple and quick operation and no debugging:
the sum frequency effect is utilized, and the conversion from time information to space information is realized by utilizing a nonlinear autocorrelation method, so that the single-shot measurement of the ultra-fast ultra-strong laser pulse width is realized, and the measurement can be performed in a single-shot mode by utilizing an intensity autocorrelation method; the method of embedding the calibration sheet is adopted for calibration, so that complex operation of multipoint calibration is avoided, and the calibration operation can be omitted in the follow-up measurement for the fixed detection module after one calibration; in the pulse width measurement, the pulse width can be directly calculated by only measuring the full width of the sum frequency light half maximum;
(3) Self-adapting light spots with different aperture diameters:
the feature of the splitting and combining of the Fresnel prism is that the laser intersection points of different calibers are different, and the feature of the splitting and combining of the Fresnel prism is utilized to automatically adjust the frequency doubling crystal to go to the self-adaptive intersection point through data processing;
(4) The laser pulse width adjustment method is used for laser pulse width adjustment guidance:
in the laser debugging stage, the pulse width of the optical pulse is unknown, and the laser dispersion is roughly regulated by utilizing the frequency doubling effect, so that preliminary guidance is provided for measuring the shortest pulse width of the laser by the second-order correlator.
Drawings
FIG. 1 is a schematic diagram of a conventional autocorrelation apparatus;
FIG. 2 is a schematic diagram of a single-shot laser pulse width autocorrelation measurement apparatus in accordance with one embodiment of the present invention;
FIG. 3 is a schematic view of a Fresnel prism of a first embodiment of a single-shot laser pulse width autocorrelation measuring apparatus of the present invention, wherein (a) is a top view and (b) is a front view;
FIG. 4 is a schematic calibration diagram of a laser pulse width single-shot autocorrelation measurement apparatus of the present invention;
FIG. 5 is a schematic diagram of incident laser light with different aperture of the laser pulse width single-shot autocorrelation measuring apparatus of the present invention;
fig. 6 is a schematic diagram of a second embodiment of a laser pulse width single-shot autocorrelation measuring apparatus of the present invention.
Detailed Description
The invention will be further elucidated by means of specific embodiments in conjunction with the accompanying drawings.
As shown in fig. 2, the laser pulse width single-shot autocorrelation measuring apparatus of the present embodiment includes: fresnel prism 21, nonlinear crystal 22, crystal translation stage, detector 23, calibration sheet 24, calibration sheet translation stage, and instrument box 25; wherein the instrument box 25 is a hollow shell, and the Fresnel prism 21, the nonlinear crystal 22, the detector 23 and the calibration sheet 24 are arranged in the instrument box 25; one side wall of the instrument box 25 is provided with a light inlet hole 20 for enteringA first viewing window 26 and a second viewing window 27 are mounted on opposite side walls of the aperture 20; the Fresnel prism 21 is arranged in the instrument box 25 and positioned in front of the light inlet hole 20, the base angle of the Fresnel prism is theta, the caliber of the light inlet hole is larger than that of the Fresnel prism 21, the light inlet hole 20 is ensured not to shade the light passing surface of the Fresnel prism 21, and the Fresnel prism 21 integrates the dual functions of beam splitting and beam combining: the fresnel prism 21 divides the laser to be measured into two beams, and simultaneously combines the divided beams at an angle 2α, where α=arcsin (n 0 sinθ)-θ,n 0 A refractive index of the fresnel prism 21; the combined light forms sum frequency light in the nonlinear crystal 22, the sum frequency light is received by the detector 23, the nonlinear crystal 22 is placed on a crystal translation stage, and the crystal translation stage can drive the nonlinear crystal to translate back and forth along the direction of the optical axis; the calibration sheet 24 is placed on a calibration sheet translation stage, and the calibration sheet 24 is completely located outside the optical path when moving out of the optical path, as shown by the solid line frame in fig. 2, by moving out of the optical path or moving into the optical path by the calibration sheet translation stage in the direction shown by the black arrow in fig. 2; when the calibration sheet 24 is moved into the optical path, as shown by the broken line frame in fig. 2, the calibration sheet 24 is positioned between the light entrance hole 20 and the fresnel prism 21, at this time, one side of the calibration sheet 24 is parallel to the edge of the fresnel prism 21, half of the incident light passes through the calibration sheet 24, and all the light passing through the calibration sheet 24 passes through the fresnel prism 21 and then is transmitted to the second observation window 27, and the other half of the light not passing through the calibration sheet 24 passes through the fresnel prism 21 and then is transmitted to the first observation window 26, and the light beam is observed from the outside of the instrument box 25 to the positions of the windows through the first observation window 26 and the second observation window 27, respectively.
As shown in fig. 3, the fresnel prism 21 is less than 2cm from the light entrance aperture 20; the size of the light-passing surface of the Fresnel prism is a 0 ×a 0 The middle of the Fresnel prism is thick, the two sides of the Fresnel prism are thin, the thickest part in the middle is the edge of the Fresnel prism, and the thinnest part is b 0 ,b 0 <300μm,a 0 Less than 20mm, and more than 5 DEG and less than 8 deg. The base angle theta of the Fresnel prism is too small, the beam combination angle alpha of the Fresnel prism after beam splitting is too small, so that the whole equipment is too long, and the light space interference after beam combination is not beneficial to pulse width measurement; fresnel prism base angle theta is too largeThe large, split wavefront tilt is severe, affecting pulse width measurement, and hence the distance between the nonlinear crystal 22 and the fresnel prism At this time, the light passing area of the Fresnel prism is fully utilized, so that the measurable range is the widest.
In this embodiment, the detector employs a CCD camera; the first observation window 26 and the second observation window 27 are made of frosted glass; the material of the standard piece is fused quartz.
By changing the detectors with different resolutions and pixel sizes, the measurement scenes of different laser pulse widths can be satisfied, and three scheme settings are listed as follows:
scheme one: the laser pulse width of the laser pulse is measured to be 20fs-300fs, and the central wavelength is 800nm plus or minus 100nm. The detector pixel size was 2.2 μm by 2.2 μm with a resolution of 1280×960.
Fresnel prism base angle θ=6°, the material being fused silica.
The nonlinear crystal is barium metaborate BBO, the BBO has a cross-sectional dimension of 10mm×10mm and a thickness of 100 μm.
The resolution of the device is 0.7fs/pixel, and the measuring range is 600fs.
The transmission element will have a broadened pulse width, the fresnel prism and BBO in the device will have a broadened pulse width, and the correlator of the structure will introduce a measurement error of less than 5% when measuring pulses in the 20fs-300fs range.
Scheme II: the Gaussian laser pulse with the pulse width of 300fs-700fs is measured, and the central wavelength is 800nm plus or minus 100nm. The detector pixel size was 6 μm by 6 μm with a resolution of 1280×960.
Fresnel prism base angle θ=6°, the material being fused silica.
The nonlinear crystal is BBO, the cross-sectional dimension of BBO is 10mm multiplied by 10mm, and the thickness is Wie mu m.
The resolution of the device was 1.9fs/pixel and the measurement range was 1700fs.
The transmission element will have a broadened pulse width, the fresnel prism and BBO in the device will have a broadened pulse width, and the correlator of the structure will introduce a measurement error of less than 0.0002% when measuring pulses in the range of 300fs-700 fs.
Scheme III: the Gaussian laser pulse with the pulse width of 800fs-1200fs is measured, and the central wavelength is 800nm plus or minus 100nm. The detector pixel size was 9 μm by 9 μm with a resolution of 1280×960.
Fresnel prism base angle θ=6°, the material being fused silica.
The nonlinear crystal is BBO, the cross-sectional dimension of BBO is 10mm multiplied by 10mm, and the thickness is 500 mu m.
The resolution of the device was 2.8fs/pixel and the measurement scale was 2500fs.
The transmission element will have a broadened pulse width, the fresnel prism and BBO in the device will have a broadened pulse width, and the correlator of the structure will introduce a measurement error of less than 0.000003% when measuring pulses in the range of 800fs-1200 fs.
As can be seen from the above three cases, the thickness of the fresnel prism and the thickness of the nonlinear crystal set according to the present invention all bring about small systematic errors.
Before measuring the pulse width of the laser pulse, the factory parameter measurement is needed to be carried out on the single-shot autocorrelation measuring device of the pulse width of the laser pulse, and the method comprises the following steps:
1) And (3) primary debugging:
a) Determining the distance between the nonlinear crystal and the fresnel prism:
i. the calibration sheet is moved out of the light path;
ii, the caliber D of the light spot is larger than or equal to a 0 Is debugged by laser of the laser beam, and the caliber of a light spot is more than or equal to a 0 The laser of the laser beam enters the laser pulse width single-shot autocorrelation measuring device through the light inlet hole, light spots are formed on the first observation window and the second observation window respectively, and the light spots are received through the first camera and the second camera;
translating the laser pulse width single-shot autocorrelation measuring device along the direction perpendicular to the incident laser to make the light spot sizes received by the first camera and the second camera identical;
adjusting the position of the nonlinear crystal in the direction of the optical axis such that the distance between the nonlinear crystal and the fresnel prism
b) After laser is incident to the Fresnel prism, the laser is split and combined, sum frequency light is generated in the nonlinear crystal, the sum frequency light is detected by a detector, and a sum frequency signal is obtained on the detector;
2) And (5) factory calibration:
a) After the primary debugging is finished, the caliber D of the light spot is larger than or equal to a 0 The laser of the laser is debugged, and the positions of light spots on the first camera and the second camera at the moment are respectively recorded as Z 1 And Z 2 The method comprises the steps of carrying out a first treatment on the surface of the Recording the size of a light spot on a first camera as D';
b) The distance between the nonlinear crystal and the fresnel prism is recorded as a at this time.
Example 1
The factory parameter measurement is only executed when the first debugging is performed, and after the factory parameter measurement is completed, the laser pulse width measurement method of the laser pulse width single-shot autocorrelation measurement device of the embodiment, as shown in fig. 5, comprises the following steps:
1) Frequency multiplication crystal position determination:
a) The calibration sheet is moved out of the light path through the calibration sheet translation stage;
b) The laser to be measured enters the laser pulse width single-shot autocorrelation measuring device through the light entrance hole, light spots on the first camera and the second camera are observed, and the center positions of the light spots received by the first camera and the second camera are Z respectively 1t And Z 2t The light spot sizes of the first camera and the second camera are respectively read as D 1t And D 2t
c) The size of the light spot on the first camera and the second camera meets (1-10%) D by translating the laser pulse width single-shot autocorrelation measuring device along the direction perpendicular to the incident laser 2t <D 1t <(1+10%)D 2t The bookSpot difference threshold D in the embodiment th 10% or so that the positions of the spots on the first and second cameras satisfy (1-10%) ×|z 2t -Z 2 |<|Z 1t -Z 1 |<(1+10%)×|Z 2t -Z 2 |;
d) The spot size D is obtained by the first camera 1t Calculating according to the size of the light spot at the moment to obtain the distance A between the nonlinear crystal and the Fresnel prism after adjustment t =A×D 1t D', moving the crystal translation stage towards the Fresnel prism
2) Acquiring sum frequency signals:
after the laser to be measured is incident to the Fresnel prism, the laser is split and combined, sum frequency light is generated in the nonlinear crystal, the sum frequency light is detected by a detector, and a sum frequency signal is obtained on the detector;
3) Individual pixels correspond to delay calibration as shown in fig. 4:
a) The standard sheet is positioned outside the light path, and the pixel position with the strongest light spot formed by the recorded sum frequency light on the detector is p;
b) The calibration sheet is moved into the light path through the calibration sheet translation stage, at the moment, the light spot formed by the sum frequency light on the detector moves a distance, the strongest pixel position of the light spot at the moment is recorded as q, and the number k of pixels moving the light spot is equal to the number of pixels moving the light spot;
c) Calculating the placement of the calibration sheet introduces a pulse delay t 1 = (n-1) d/c, d is the thickness of the standard piece, n is the refractive index of the standard piece, and the corresponding delay tau of a single pixel is calculated 1 =t 1 K, delay τ with single pixel correspondence 1 As the resolution of the laser pulse width single-shot autocorrelation measuring device;
4) Measuring the pulse width of the laser pulse:
a) The calibration sheet is moved out of the light path through the calibration sheet translation stage;
b) The laser to be measured enters the laser pulse width single-shot autocorrelation measuring device through the light entrance hole, and is split and combined in a nonlinear way through the Fresnel prismGenerating sum frequency light in a crystal, obtaining a sum frequency signal by a detector, taking the strongest value of a row of sum frequency signals along the direction perpendicular to the sum frequency light, drawing, wherein the transverse coordinate is the coordinate value of each row of pixel positions, namely the spatial position of the detector, the vertical coordinate is the intensity of the sum frequency signal, searching data with the value larger than half of the highest value to the left and right sides respectively at the highest value of the intensity of the sum frequency signal, the number of the statistical data is the number K of half-height full-width pixels, and the half-height full-width time of the sum frequency signal is Kτ 1
c) Obtaining the laser pulse width t=Kτ by using the convolution factor W 1 and/W, the measured laser is gaussian pulse, and w=1.414.
Example two
The dispersion influences the laser pulse width, the laser pulse width influences the frequency multiplication efficiency, the shorter the laser pulse width is, the higher the frequency multiplication efficiency is, so that the laser pulse width can be changed by adjusting the dispersion, and the output frequency multiplication light is strongest, and the dispersion of a laser system can be adjusted by judging the intensity of the frequency multiplication light, so that the laser pulse is shortest in the nonlinear crystal position. The laser pulse width single-shot autocorrelation measuring device further comprises a filter 28, the filter is highly reflective to fundamental frequency light and highly transmissive to self-frequency-doubling light, the filter is placed on a filter translation stage, and the filter is driven to be positioned in front of the first observation window or moved out of the light path through the filter translation stage.
After the measurement of the factory parameters is completed, the laser pulse width single-shot autocorrelation measuring device of the present embodiment is used for measuring the shortest laser pulse width method, as shown in fig. 6, and includes the following steps:
1) Frequency multiplication crystal position determination:
a) The calibration sheet is moved out of the optical path through the calibration sheet translation stage, and the optical filter is moved out of the optical path;
b) The laser to be measured enters the laser pulse width single-shot autocorrelation measuring device through the light entrance hole, light spots on the first camera and the second camera are observed, and the center positions of the light spots received by the first camera and the second camera are Z respectively 1t And Z 2t The light spot sizes of the first camera and the second camera are respectively read as D 1t And D 2t
c) The size of the light spot on the first camera and the second camera is made to satisfy (1-D by translating the laser pulse width single-shot autocorrelation measuring apparatus in a direction perpendicular to the incident laser th )D 2t <D 1t <(1+1D th )D 2t ,D th Is a spot difference threshold, or such that the positions of the spots on the first and second cameras satisfy (1-D th )×|Z 2t -Z 2 |<|Z 1t -Z 1 |<(1+1D th )×|Z 2t -Z 2 |;
d) The spot size D is obtained by the first camera 1t Calculating according to the size of the light spot at the moment to obtain the distance A between the nonlinear crystal and the Fresnel prism after adjustment t =A×D 1t D', moving the crystal translation stage towards the Fresnel prism
2) Coarse adjustment of laser system dispersion:
a) Moving the optical filter to the front of the first observation window through the optical filter translation table;
b) The laser to be measured is incident into the Fresnel prism and then is divided into two beams, the two beams respectively pass through the nonlinear crystal and generate self-frequency doubling light in the nonlinear crystal, one beam only keeps the self-frequency doubling light to irradiate the first observation window through the optical filter, and the other beam irradiates the second observation window;
c) Receiving self-frequency multiplication light on a first camera, adjusting laser energy to enable the first camera to obtain light spot data, reading the light spot data and taking the highest pixel value;
d) Changing the dispersion of the laser system, wherein the spot data in the step 2) c) is changed, and when the dispersion compensation of the laser system is optimal, the received self-frequency doubling light on the first camera is strongest; stopping changing the laser system dispersion at the position with the maximum pixel value, taking the laser system dispersion at the moment as the laser system dispersion after coarse adjustment, and entering the step 5); reducing laser energy if the first camera signal is saturated during changing the laser system dispersion;
3) Acquiring sum frequency signals:
after the laser to be measured is incident to the Fresnel prism, the laser is split and combined, sum frequency light is generated in the nonlinear crystal, the sum frequency light is detected by a detector, and a sum frequency signal is obtained on the detector;
4) Single pixel corresponds to delay calibration:
a) The standard sheet is positioned outside the light path, and the pixel position with the strongest light spot formed by the recorded sum frequency light on the detector is p;
b) The calibration sheet is moved into the light path through the calibration sheet translation stage, at the moment, the light spot formed by the sum frequency light on the detector moves a distance, the strongest pixel position of the light spot at the moment is recorded as q, and the number k of pixels moving the light spot is equal to the number of pixels moving the light spot;
c) Calculating the placement of the calibration sheet introduces a pulse delay t 1 = (n-1) d/c, d is the thickness of the standard piece, and the corresponding delay tau of the single pixel is calculated 1 =t 1 K, delay τ with single pixel correspondence 1 As the resolution of the laser pulse width single-shot autocorrelation measuring device;
5) Obtaining the shortest laser pulse width:
a) The calibration sheet is moved out of the light path through the calibration sheet translation stage;
b) The laser to be measured enters a laser pulse width single-emission autocorrelation measuring device through an entrance aperture, a sum frequency light is generated in a nonlinear crystal by splitting and combining beams through a Fresnel prism, a sum frequency signal is obtained by a detector, a line of the strongest numerical value of the sum frequency signal is taken along the direction vertical to the sum frequency light, a graph is drawn, the transverse coordinate is the coordinate value of the pixel position of each line, namely the spatial position of the detector, the vertical coordinate is the intensity of the sum frequency signal, the half-height full-width pixel number K of the sum frequency signal is calculated, and the half-height full-width time of the sum frequency signal is Kτ 1
c) Obtaining the laser pulse width t=Kτ by using the convolution factor W 1 W, measured laser is gaussian pulse, w=1.414;
d) The laser system dispersion is further adjusted so that the measured data of the laser pulse width is shortest, thereby obtaining the shortest laser pulse width of the laser system.
Finally, it should be noted that the examples are disclosed for the purpose of aiding in the further understanding of the present invention, but those skilled in the art will appreciate that: various alternatives and modifications are possible without departing from the spirit and scope of the invention and the appended claims. Therefore, the invention should not be limited to the disclosed embodiments, but rather the scope of the invention is defined by the appended claims.

Claims (7)

1. A laser pulse width measurement method of a laser pulse width single-shot autocorrelation measurement apparatus, the laser pulse width single-shot autocorrelation measurement apparatus comprising: the device comprises a Fresnel prism, a nonlinear crystal, a crystal translation stage, a detector, a calibration piece translation stage, a first camera, a second camera and an instrument box; the instrument box is a hollow shell, and the Fresnel prism, the nonlinear crystal, the detector and the calibration sheet are arranged in the instrument box; a light inlet hole is formed in one side wall of the instrument box, and a first observation window and a second observation window are arranged on the side wall opposite to the light inlet hole; the Fresnel prism is arranged in the instrument box and positioned in front of the light inlet hole, the base angle of the Fresnel prism is theta, the caliber of the light inlet hole is larger than that of the Fresnel prism, the light inlet hole is ensured not to shade the light passing surface of the Fresnel prism, and the Fresnel prism integrates the dual functions of beam splitting and beam combining: the Fresnel prism divides the laser to be measured into two beams, and simultaneously combines the split beams at an included angle 2 alpha, wherein alpha=arcsin (n 0 sinθ)-θ,n 0 Refractive index of the Fresnel prism; the combined light forms sum frequency light in a nonlinear crystal, the sum frequency light is received by a detector, the nonlinear crystal is placed on a crystal translation stage, and the crystal translation stage can drive the nonlinear crystal to translate back and forth along the direction of an optical axis; the calibration sheet is placed on the calibration sheet translation stage, and the calibration sheet is completely positioned outside the optical path when moving out of the optical path through the calibration sheet translation stage moving out of the optical path or moving into the optical path; when the calibration sheet moves into the light path, the calibration sheet is positioned between the light inlet hole and the Fresnel prism, at the moment, one side of the calibration sheet is parallel to the edge of the Fresnel prism, half of the incident light passes through the calibration sheet, and all the light passing through the calibration sheet passes through the Fresnel prism and is transmittedThe other half of the light which does not pass through the standard sheet is transmitted to the first observation window after passing through the Fresnel prism, and the observation light beams respectively pass through the first observation window and the second observation window from the outside of the instrument box and are beaten at the positions of the observation windows; a first camera and a second camera are respectively arranged at the first observation window and the second observation window, and the first camera and the second camera respectively image the first observation window and the second observation window;
the method is characterized in that before measuring the pulse width of the laser pulse, factory parameter measurement is needed, and the method comprises the following steps:
1) And (3) primary debugging:
a) Determining the distance between a nonlinear crystal and a fresnel prisma 0 The side length of the light passing surface of the Fresnel prism;
b) After laser is incident to the Fresnel prism, the laser is split and combined, sum frequency light is generated in the nonlinear crystal, the sum frequency light is detected by a detector, and a sum frequency signal is obtained on the detector;
2) And (5) factory calibration:
a) After the primary debugging is finished, the caliber D of the light spot is larger than or equal to a 0 The laser of the laser is debugged, and the positions of light spots on the first camera and the second camera at the moment are respectively recorded as Z 1 And Z 2 The method comprises the steps of carrying out a first treatment on the surface of the Recording the size of the light spot on the first camera or the second camera as D
b) At the moment, the distance between the nonlinear crystal and the Fresnel prism is recorded as A;
the laser pulse width measurement method comprises the following steps:
1) Nonlinear crystal position determination:
a) The calibration sheet is moved out of the light path through the calibration sheet translation stage;
b) The laser to be measured enters the laser pulse width single-shot autocorrelation measuring device through the light entrance hole, light spots on the first camera and the second camera are observed, and the center positions of the light spots received by the first camera and the second camera are Z respectively 1t And Z 2t
The light spot sizes of the first camera and the second camera are respectively read as D 1t And D 2t
c) The size of the light spot on the first camera and the second camera is made to satisfy (1-D by translating the laser pulse width single-shot autocorrelation measuring apparatus in a direction perpendicular to the incident laser th )×D 2t <D 1t <(1+D th )×D 2t ,D th Is a spot difference threshold, or such that the positions of the spots on the first and second cameras satisfy (1-D th )×|Z 2t -Z 2 |<|Z 1t -Z 1 |<(1+D th )×|Z 2t -Z 2 |;
d) The spot size D is obtained by the first camera or the second camera 1t Or D 2t Calculating according to the size of the light spot at the moment to obtain the distance A between the nonlinear crystal and the Fresnel prism after adjustment t =A×D 1t /D Or A t =A×D 2t /D The crystal translation stage is moved towards the Fresnel prismOr->
2) Acquiring sum frequency signals:
after the laser to be measured is incident to the Fresnel prism, the laser is split and combined, sum frequency light is generated in the nonlinear crystal, the sum frequency light is detected by a detector, and a sum frequency signal is obtained on the detector;
the sum frequency signal obtained by the detector is in a vertical strip shape, the long side of the sum frequency signal is defined as the sum frequency light direction, any row of numerical values perpendicular to the sum frequency light direction are selected, the drawing is carried out, the abscissa is the coordinate value of the pixel position of each row, and the ordinate is the intensity of the sum frequency signal acquired by each row of pixels;
3) Single pixel corresponds to delay calibration:
a) The standard sheet is positioned outside the light path, and the pixel position with the strongest light spot formed by the recorded sum frequency light on the detector is p;
b) The calibration sheet is moved into the light path through the calibration sheet translation stage, at the moment, the light spot formed by the sum frequency light on the detector moves a distance, the strongest pixel position of the light spot at the moment is recorded as q, and the number k of pixels moving the light spot is equal to the number of pixels moving the light spot;
c) Calculating the placement of the calibration sheet introduces a pulse delay t 1 = (n-1) d/c, d is the thickness of the standard piece, n is the refractive index of the standard piece, and the corresponding delay tau of a single pixel is calculated 1 =t 1 K, delay τ with single pixel correspondence 1 As the resolution of the laser pulse width single-shot autocorrelation measuring device, c is the speed of light;
4) Measuring the pulse width of the laser pulse:
a) The calibration sheet is moved out of the light path through the calibration sheet translation stage;
b) The laser to be measured enters a laser pulse width single-emission autocorrelation measuring device through an entrance aperture, a sum frequency light is generated in a nonlinear crystal by splitting and combining beams through a Fresnel prism, a sum frequency signal is obtained by a detector, a line of the strongest numerical value of the sum frequency signal is taken along the direction vertical to the sum frequency light, a graph is drawn, the transverse coordinate is the coordinate value of the pixel position of each line, namely the spatial position of the detector, the vertical coordinate is the intensity of the sum frequency signal, the half-height full-width pixel number K of the sum frequency signal is calculated, and the half-height full-width time of the sum frequency signal is Kτ 1
c) Obtaining the laser pulse width t=Kτ by using the convolution factor W 1 /W。
2. The laser pulse width measurement method according to claim 1, wherein determining the distance between the nonlinear crystal and the fresnel prism comprises the steps of:
i. the calibration sheet is moved out of the light path through the calibration sheet translation stage;
ii, the caliber D of the light spot is larger than or equal to a 0 Is debugged by laser of (1), and the caliber D of a light spot is more than or equal to a 0 The laser of the laser beam enters the laser pulse width single-shot autocorrelation measuring device through the light entrance hole, light spots are respectively formed on the first observation window and the second observation window and pass through the first observation windowA camera and a second camera receive the light spots;
translating the laser pulse width single-shot autocorrelation measuring device along the direction perpendicular to the incident laser to make the light spot sizes received by the first camera and the second camera identical;
adjusting the position of the nonlinear crystal in the direction of the optical axis such that the distance between the nonlinear crystal and the fresnel prism
3. The method of claim 1, wherein the fresnel prism is less than 2cm from the entrance aperture.
4. The method for measuring pulse width of laser pulse according to claim 1, wherein the size of the light passing surface of the fresnel prism is a 0 ×a 0 The middle of the Fresnel prism is thick, the two sides of the Fresnel prism are thin, the thickest part in the middle is the edge of the Fresnel prism, and the thinnest part is b 0
b 0 <300μm,a 0 <20mm,5°<θ<8°。
5. The method of measuring pulse width of laser pulse according to claim 1, wherein a distance between the nonlinear crystal and fresnel prism
6. The method of claim 1, wherein the distance between the detector and the nonlinear crystal is
7. The method for measuring the pulse width of the laser pulse according to claim 1, wherein the thickness of the calibration sheet is more than 100 μm and less than 200 μm, and the material is an optical material with a refractive index of 1.3-1.7.
CN202310827220.0A 2023-07-07 2023-07-07 Laser pulse width single-shot autocorrelation measuring device and calibration method thereof Active CN117168632B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202310827220.0A CN117168632B (en) 2023-07-07 2023-07-07 Laser pulse width single-shot autocorrelation measuring device and calibration method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202310827220.0A CN117168632B (en) 2023-07-07 2023-07-07 Laser pulse width single-shot autocorrelation measuring device and calibration method thereof

Publications (2)

Publication Number Publication Date
CN117168632A CN117168632A (en) 2023-12-05
CN117168632B true CN117168632B (en) 2024-02-27

Family

ID=88940103

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202310827220.0A Active CN117168632B (en) 2023-07-07 2023-07-07 Laser pulse width single-shot autocorrelation measuring device and calibration method thereof

Country Status (1)

Country Link
CN (1) CN117168632B (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016156391A1 (en) * 2015-03-31 2016-10-06 Université de Bourgogne Device and method for characterising a femtosecond laser pulse
CN109738078A (en) * 2019-01-16 2019-05-10 中国工程物理研究院激光聚变研究中心 A kind of single-shot time autocorrelation measurement device
CN212844018U (en) * 2020-05-22 2021-03-30 广州市固润光电科技有限公司 Laser pulse autocorrelator
CN115014547A (en) * 2022-06-24 2022-09-06 西华师范大学 Autocorrelator optical system and laser pulse width measuring device
CN115900976A (en) * 2023-01-06 2023-04-04 中国科学院空天信息创新研究院 Femtosecond laser pulse width measuring device and method

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11086192B2 (en) * 2019-03-15 2021-08-10 Shanghai Institute Of Optics And Fine Mechanics, Chinese Academy Of Sciences Single shot autocorrelator for measuring the duration of an ultrashort pulse in the far field

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016156391A1 (en) * 2015-03-31 2016-10-06 Université de Bourgogne Device and method for characterising a femtosecond laser pulse
CN109738078A (en) * 2019-01-16 2019-05-10 中国工程物理研究院激光聚变研究中心 A kind of single-shot time autocorrelation measurement device
CN212844018U (en) * 2020-05-22 2021-03-30 广州市固润光电科技有限公司 Laser pulse autocorrelator
CN115014547A (en) * 2022-06-24 2022-09-06 西华师范大学 Autocorrelator optical system and laser pulse width measuring device
CN115900976A (en) * 2023-01-06 2023-04-04 中国科学院空天信息创新研究院 Femtosecond laser pulse width measuring device and method

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
刘承香 ; 刘春平 ; 龙井华 ; 阮双琛 ; .光脉冲测量系统中菲涅尔双棱镜参数设计.深圳大学学报(理工版).2009,(第01期),全文. *
赵研英 ; 耿易星 ; 李荣凤 ; .实时飞秒激光单次测量研究.激光技术.2017,第41卷(第03期),全文. *

Also Published As

Publication number Publication date
CN117168632A (en) 2023-12-05

Similar Documents

Publication Publication Date Title
CN103335819B (en) Device and method for optical detection of high-precision pyramid prism
CN102169050B (en) Comprehensive measurement method for reflectivity
CN102564611B (en) High-power laser wave front measuring instrument and wave front measuring method
CN108332866B (en) Wavefront on-line rapid reconstruction device and method based on amplitude modulation
AU640058B2 (en) Method and apparatus for determining the optical quality of a transparent plate
CN107884079B (en) Single-shot ultrashort laser pulse width measuring device and measuring method
CN111443062B (en) Device and method for detecting transient refractive index ultrafast of semiconductor material
WO2019047330A1 (en) Grating wavefront inclined dispersion compensation device
CN113029969A (en) Measuring device and measuring method for anisotropic nonlinear optical characteristics
US7817270B2 (en) Nanosecond flash photolysis system
CN114440800A (en) Method for accurately measuring effective area of light spot in laser damage threshold test
CN110095416B (en) Metal molten pool laser absorption rate distribution on-line measuring system and method
CN109060151B (en) Subnanosecond laser pulse contrast measuring device
CN106248636B (en) A method of measurement material nonlinearity absorption curve
CN117102712B (en) Laser processing quality monitoring system, method, processing device and readable storage medium
CN102944313A (en) Multifunctional femtosecond laser pulse measuring device
CN117168632B (en) Laser pulse width single-shot autocorrelation measuring device and calibration method thereof
CN105203223A (en) Device for measuring temperature of flame through one-dimensional scanning on basis of CARS
CN116908135A (en) Broadband terahertz Bessel beam transmission detection device and detection imaging method
JP2022526846A (en) Devices and methods for determining the focal position of a laser beam
CN106404695B (en) Spectrophotometer
CN105259743A (en) Automatic detection device and detection method of varifocal time of electronic control varifocal lens
US6172785B1 (en) Light-scanning device
CN116907662A (en) Ultrafast and superstrong laser pulse width single-shot measuring device and calibration method thereof
CN116907661A (en) Device and method for measuring pulse width of ultra-fast and ultra-strong laser pulse in single shot with high dynamic range

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant