CN115900976A - Femtosecond laser pulse width measuring device and method - Google Patents
Femtosecond laser pulse width measuring device and method Download PDFInfo
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- CN115900976A CN115900976A CN202310015471.9A CN202310015471A CN115900976A CN 115900976 A CN115900976 A CN 115900976A CN 202310015471 A CN202310015471 A CN 202310015471A CN 115900976 A CN115900976 A CN 115900976A
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- QBLDFAIABQKINO-UHFFFAOYSA-N barium borate Chemical compound [Ba+2].[O-]B=O.[O-]B=O QBLDFAIABQKINO-UHFFFAOYSA-N 0.000 description 1
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Abstract
The invention relates to the technical field of ultrashort pulse measurement, in particular to a device and a method for measuring the pulse width of femtosecond laser, wherein the device for measuring the pulse width of the femtosecond laser comprises a Cassegrain system, a Fresnel biprism, a frequency doubling crystal, an imaging instrument and a computer which are sequentially arranged; the Cassegrain system is used for focusing an input light beam, the Fresnel biprism is used for dividing the light beam into two beams, the two beams of light are converged at different position points of the frequency doubling crystal, and time delay is generated; the converged light beams generate a second harmonic effect on the frequency doubling crystal, the generated second harmonic passes through the concave mirror and then is imaged on an imaging instrument, and finally a pulse width result is obtained by utilizing a correlation algorithm.
Description
Technical Field
The invention relates to the technical field of ultrashort pulse measurement, in particular to a device and a method for measuring the pulse width of femtosecond laser.
Background
The ultrashort pulse laser is widely applied to strategic high-technology fields of remote distance measurement, precise detection, space safety, front-edge scientific exploration and the like. The pulse width as a key parameter of the laser time domain is directly related to the power density of the used pulse and the performance of the ultrafast laser, and is particularly important for real-time measurement of the laser pulse width in the research and application of the laser.
For the measurement of the femtosecond-order pulse width, there are indirect measurement methods, mainly an autocorrelation measurement method and a frequency-resolved optical switching method (FROG), in addition to a direct measurement method in which measurement is performed by a high-speed oscilloscope and a high-speed fringe camera.
The strength autocorrelation method can test femtosecond magnitude, but has many defects. The distribution curve obtained by the intensity autocorrelation method cannot distinguish different pulses contained therein; the relevant information of the pulse phase and the frequency domain cannot be reflected; the pulse width is calculated by assuming the pulse shape and having no pulse phase testing capability.
A frequency-resolved optical switching method (FROG) is applied to pulse width testing of a femtosecond laser, the existing method is a single FROG method, an optical component selected by the method is a transmission element, and dispersion is inevitably caused by the transmission element, so that the accuracy of pulse width testing is influenced.
Disclosure of Invention
The invention provides a femtosecond laser pulse width measuring device, which is used for overcoming the defects of an indirect measuring device method for femtosecond pulse width in the prior art and realizing accurate measurement of the femtosecond pulse width.
The invention provides a femtosecond laser pulse width measuring device, which comprises a Cassegrain system, a Fresnel biprism, a frequency doubling crystal, an imaging instrument and a computer which are arranged in sequence;
the Cassegrain system is used for expanding and focusing a femtosecond laser beam to be detected; the Fresnel biprism is arranged on the light beam output side of the Cassegrain system, and the output light beam of the Cassegrain system irradiates the Fresnel biprism; the Fresnel biprism is positioned between the Cassegrain system and the frequency doubling crystal; the light beams passing through the Fresnel biprism irradiate on the frequency doubling crystal, a spectral image is displayed on the imaging instrument after passing through the frequency doubling crystal, the imaging instrument is connected with the computer, and the computer analyzes and iteratively calculates the spectral image of the imaging instrument.
And a concave mirror is arranged between the frequency doubling crystal and the imaging instrument, the concave mirror and the frequency doubling crystal are arranged in a non-parallel way, and light beams passing through the frequency doubling crystal are reflected into the imaging instrument through the concave mirror.
The two groups of concave mirrors are arranged in parallel and oppositely, and light beams passing through the frequency doubling crystal are reflected by the two groups of concave mirrors in sequence and then enter the imaging instrument.
And the frequency doubling crystal is positioned at the focal position of the output light beam of the Cassegrain system.
The Fresnel biprism can move between the Cassegrain system and the frequency doubling crystal, and the distance between the Fresnel biprism and the frequency doubling crystal is adjusted.
The frequency doubling crystal is a BBO crystal, and the thickness of the BBO crystal is 4mm to 6mm.
The imaging instrument is a CCD image sensor.
A femtosecond laser pulse width measurement method comprises the following steps:
the method comprises the following steps: injecting femtosecond laser to be detected into a Cassegrain system for beam expansion and focusing;
step two: the Fresnel biprism divides the light beam passing through the Cassegrain system into two beams, and the two beams are converged to a frequency doubling crystal;
step three: the frequency doubling crystal performs fundamental frequency light frequency doubling on the light beam and enables the frequency doubled light to be separated according to wavelength in space;
step four: reflecting the frequency-doubled light obtained in the step three by a concave mirror to enter an imaging instrument for imaging;
step five: and analyzing and iterative calculation are carried out on the image on the imaging instrument by a computer, and the pulse width of the femtosecond laser to be detected is calculated by adopting a generalized projection algorithm.
In the second step, in the process of splitting the light beam by the Fresnel biprism, time delays of different sizes are provided by adjusting the distance between the Fresnel biprism and the frequency doubling crystal, and pulse widths of different sizes are tested.
In the fourth step, in the reflecting process of the concave mirror, the distance and the angle between the concave mirror and the frequency doubling crystal are adjusted, so that the imaging instrument can obtain clear imaging.
The femtosecond laser pulse width measuring device provided by the invention is used for focusing an input light beam through a Cassegrain system, and dividing the light beam into two beams through a Fresnel biprism, so that the two beams of light are converged at different positions of a frequency doubling crystal to generate time delay; the converged light beam generates a second harmonic effect on the frequency doubling crystal, the generated second harmonic passes through the concave mirror and then is imaged on an imaging instrument, and finally a pulse width result is obtained by utilizing a correlation algorithm.
Drawings
In order to more clearly illustrate the technical solutions of the present invention or the prior art, the drawings needed for the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and those skilled in the art can also obtain other drawings according to the drawings without creative efforts.
Fig. 1 is a schematic view of a measurement process of a femtosecond laser pulse width measurement device provided by the invention.
Reference numerals:
1. the Cassegrain system; 2. a Fresnel biprism; 3. frequency doubling crystals; 4. an imaging instrument; 5. a computer; 6. a concave mirror.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the embodiments of the present invention, it should be noted that the terms "center", "longitudinal", "lateral", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience in describing the embodiments of the present invention and simplifying the description, but do not indicate or imply that the referred devices or elements must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the embodiments of the present invention.
In embodiments of the invention, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through intervening media. Also, a first feature "on," "above," and "over" a second feature may be directly on or obliquely above the second feature, or simply mean that the first feature is at a higher level than the second feature. A first feature "under," "beneath," and "under" a second feature may be directly under or obliquely under the second feature, or may simply mean that the first feature is at a lesser elevation than the second feature.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of an embodiment of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.
One embodiment of the present invention provides a femtosecond laser pulse width measurement apparatus, as shown in fig. 1, including a cassegrain system 1, a fresnel biprism 2, a frequency doubling crystal 3, an imaging instrument 4 and a computer 5, which are sequentially arranged; the Cassegrain system 1 is used for expanding and focusing a femtosecond laser beam to be detected; a Fresnel biprism 2 is arranged on the light beam output side of the Cassegrain system 1, and the output light beam of the Cassegrain system 1 irradiates the Fresnel biprism 2; the Fresnel biprism 2 is positioned between the Cassegrain system 1 and the frequency doubling crystal 3; the light beams passing through the Fresnel biprism 2 irradiate on the frequency doubling crystal 3, a spectral image is displayed on the imaging instrument 4 after passing through the frequency doubling crystal 3, the imaging instrument 4 is connected with the computer 5, and the spectral image of the imaging instrument 4 is analyzed and iteratively calculated by the computer 5.
In this embodiment, the cassegrain system 1 is configured to focus an input light beam, so that the input light beam is a line spot in the vertical direction; the Fresnel biprism 2 divides the light beam into two beams, and the two beams of light are converged at different positions of the frequency doubling crystal 3, so that for any point position of the light beam on the frequency doubling crystal 3, the paths of the two beams of light divided by the Fresnel biprism 2 reaching the position have difference, the reaching time has time difference, time delay is correspondingly realized along the vertical direction of the light beam, and finally, the delay effect is more obvious when the light beam formed on the frequency doubling crystal 3 upwards or downwards from the middle position. For any point position of the light beam on the frequency doubling crystal 3, one of the two light beams is used as a detection light, the other light beam is used as an optical switch, the two light beams with time delay interact in the frequency doubling crystal 3 in a certain polarization direction and an incident angle to realize frequency conversion and generate a second harmonic effect, the generated second harmonic is imaged by an imaging instrument 4 to display corresponding spectral components under different time delays, and the computer 5 can obtain the amplitude and phase quantitative information of the laser to be detected by utilizing an iterative algorithm of a generalized projection algorithm to obtain a pulse width result. In the structure of the embodiment, the cassegrain system 1 adopts a total reflection structure, so that the influence of chromatic dispersion on the pulse width test can be reduced, the result is more accurate, and the transmission effect is better compared with that of a cylindrical mirror in the prior art.
On the basis of the above embodiment, in order to enable the light beam to clearly image on the imaging instrument 4 after passing through the frequency doubling crystal 3, the distance between the imaging instrument 4 and the frequency doubling crystal 3 can be adjusted, and the linear arrangement can make the whole device occupy a longer space. This kind of setting, will image clearly at imaging instrument 4, no longer need adjust imaging instrument 4 and double frequency crystal 3 between the distance, only need adjust concave mirror 6 and double frequency crystal 3 or concave mirror 6 and imaging instrument 4 the distance can, because the reflection effect of concave mirror 6 for the route of light beam becomes and does not add the twice length under the concave mirror 6 circumstances, has halved the required distance between imaging instrument 4 and the double frequency crystal 3 to a certain extent, makes the device finally save space.
In order to save more space and more conveniently obtain clear images at the imaging instrument 4, in this embodiment, the concave mirrors 6 have two sets, two sets of concave mirrors 6 are parallel and are arranged oppositely, the light beam passing through the frequency doubling crystal 3 enters the imaging instrument 4 after being reflected by the two sets of concave mirrors 6 in sequence, the two sets of concave mirrors 6 which are parallel and arranged oppositely need to be consistent when being adjusted, the two sets of concave mirrors 6 are always parallel and opposite, one set of concave mirrors 6 is used for adjusting the horizontal direction focusing of the light beam, the other set is used for adjusting the vertical direction focusing of the light beam, the two sets of concave mirrors 6 are matched for use by adjusting the inclination angle of the concave mirror 6 and the distance between the concave mirror 6 and the imaging instrument 4 or the frequency doubling crystal 3, and the clear spectral images can be obtained at the imaging instrument 4 more conveniently compared with the structural adjustment of one set of concave mirrors 6.
In addition to the function of expanding the beam, the cassegrain system 1 of the present invention also has a key function of focusing, and the light beam passing through the cassegrain system 1 can focus the light beam, so that the energy of the light beam arriving on the frequency doubling crystal 3 is converged, the intensity is higher, and the effect of the frequency doubling crystal 3 can be exerted better. The Fresnel biprism 2 can move between the Cassegrain system 1 and the frequency doubling crystal 3, the distance between the Fresnel biprism 2 and the frequency doubling crystal 3 is adjusted, the light beam display effect on the frequency doubling crystal 3 can be adjusted, the distance between the Fresnel biprism 2 and the frequency doubling crystal 3 can correspond to femtosecond laser pulses with different pulse widths, the distance between the Fresnel biprism 2 and the frequency doubling crystal 3 is adjusted according to the femtosecond laser pulse width, the smaller the pulse width is, the smaller the distance between the Fresnel biprism 2 and the frequency doubling crystal 3 can be, conversely, if the pulse width is larger, the larger the distance between the Fresnel biprism 2 and the frequency doubling crystal 3 can be adjusted to be larger, and therefore, the required clear interference light beam effect can be obtained on the frequency doubling crystal 3.
In the femtosecond laser pulse width measuring device provided by the invention, the frequency doubling crystal 3 is a nonlinear optical crystal for frequency doubling effect, and the characteristics of non-central symmetry, high transparency to fundamental frequency waves and frequency doubling waves, large secondary nonlinear electric polarization coefficient, phase matching capability, good optical uniformity and high damage threshold value of the nonlinear optical crystal are mainly utilized, so that the converged light beams can generate second harmonic effect (frequency doubling effect) on the frequency doubling crystal 3 for frequency doubling of the fundamental frequency light and separating the frequency doubling light according to wavelength in space. In this embodiment, the frequency doubling crystal 3 can be a BBO crystal, and the thickness of the BBO crystal is 4mm to 6mm.
The BBO crystal (barium metaborate crystal) has extremely wide light transmission range, extremely low absorption coefficient, weaker piezoelectric ringing effect, higher extinction ratio, larger phase matching angle, higher light damage resistance threshold, broadband temperature matching and excellent optical uniformity compared with other electro-optical modulation crystals, is favorable for improving the stability of laser output power, and is preferred in the invention.
In the femtosecond laser pulse width measuring device provided by the invention, the imaging instrument 4 is used for displaying a spectrum image on the imaging instrument, so that the iterative calculation is conveniently carried out by using the computer 5 to obtain pulse width data, and in the embodiment, the imaging instrument 4 can be a CCD image sensor.
A CCD image sensor, in which photoelectric conversion is performed by arranging a large number of light receiving elements formed on a single silicon substrate. When the light receiving element is irradiated with light, electric charges are generated by the light energy, and the main operation is to transfer the electric charges to the outside through the CCD element. In some cases, a separate photodiode is used as a light receiving element.
The imaging device 4 here may also be an image visualization means made of a photodiode or a fast-response photocell.
The method for measuring the femtosecond laser pulse width provided by the invention is described below, and the method for measuring the femtosecond laser pulse width described below and the device for measuring the femtosecond laser pulse width described above can be referred to correspondingly.
The embodiment provides a method for measuring the pulse width of a femtosecond laser, which is shown in fig. 1 and comprises the following steps:
the method comprises the following steps: and (3) injecting the femtosecond laser to be detected into the Cassegrain system 1 for beam expansion and focusing.
Step two: the Fresnel biprism 2 divides the light beam passing through the Cassegrain system 1 into two beams, and the two beams are converged to a frequency doubling crystal 3; in the process of splitting the light beam by the Fresnel biprism 2, the distance between the Fresnel biprism 2 and the frequency doubling crystal 3 is adjusted, so that the light beam split by the Fresnel biprism 2 can be clearly displayed on the frequency doubling crystal 3.
Step three: the frequency doubling crystal 3 doubles the frequency of the fundamental frequency light of the light beam and spatially separates the doubled frequency light by wavelength.
Step four: reflecting the frequency-doubled light obtained in the step three by a concave mirror 6 to enter an imaging instrument 4 for imaging, and recording spectral space distribution; in the reflection process of the concave mirror 6, the imaging instrument 4 can be clearly imaged by adjusting the distance and the angle between the concave mirror 6 and the frequency doubling crystal 3. In fig. 1, there are two concave mirrors 6, one for focusing the frequency-doubled light beam in the horizontal direction; the other is used for focusing the frequency doubling light beam in the numerical direction; and the inclination angles of the two concave mirrors 6 and the distance between the two concave mirrors 6 and the frequency doubling crystal 3 or the imaging instrument 4 are adjusted to obtain a clear spectral image on the imaging instrument 4.
Step five: the computer 5 analyzes and iterates the spectral image on the imaging instrument 4, and calculates the femtosecond laser pulse width to be measured by adopting a generalized projection algorithm.
In summary, according to the femtosecond laser pulse width measurement device provided by the present invention, a laser beam passes through the cassegrain system 1 after being expanded, and is focused vertically, the fresnel biprism 2 divides the passing beam into two beams, and converges the two beams onto the frequency doubling crystal 3 to generate a frequency doubling signal, the frequency doubling signal is reflected to the imaging instrument 4 via the two concave mirrors 6 for imaging, and finally, the computer 5 obtains a pulse width test result by using a correlation algorithm. Compared with the prior art, the method has the advantages that the influence of chromatic dispersion on the pulse width test can be reduced by adopting a total reflection type structure, and the result is more accurate.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, and not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. The femtosecond laser pulse width measuring device is characterized by comprising a Cassegrain system (1), a Fresnel biprism (2), a frequency doubling crystal (3), an imaging instrument (4) and a computer (5) which are arranged in sequence;
the Cassegrain system (1) is used for expanding and focusing a femtosecond laser beam to be detected; the Fresnel biprism (2) is arranged on the light beam output side of the Cassegrain system (1), and the output light beam of the Cassegrain system (1) irradiates on the Fresnel biprism (2); the Fresnel biprism (2) is positioned between the Cassegrain system (1) and the frequency doubling crystal (3); the light beams passing through the Fresnel biprism (2) are irradiated on the frequency doubling crystal (3), a spectral image is presented on the imaging instrument (4) after passing through the frequency doubling crystal (3), the imaging instrument (4) is connected with the computer (5), and the spectral image of the imaging instrument (4) is analyzed and iteratively calculated by the computer (5).
2. The femtosecond laser pulse width measurement device according to claim 1, wherein: a concave mirror (6) is arranged between the frequency doubling crystal (3) and the imaging instrument (4), the concave mirror (6) and the frequency doubling crystal (3) are arranged in a non-parallel mode, and light beams passing through the frequency doubling crystal (3) are reflected into the imaging instrument (4) through the concave mirror (6).
3. The femtosecond laser pulse width measurement device according to claim 2, wherein: the two groups of concave mirrors (6) are arranged in parallel and oppositely, and light beams passing through the frequency doubling crystal (3) enter the imaging instrument (4) after being reflected by the two groups of concave mirrors (6) in sequence.
4. The femtosecond laser pulse width measurement device according to claim 1, 2 or 3, characterized in that: the frequency doubling crystal (3) is positioned at the focal position of the output light beam of the Cassegrain system (1).
5. The femtosecond laser pulse width measurement device according to claim 4, wherein: the Fresnel biprism (2) can move between the Cassegrain system (1) and the frequency doubling crystal (3), and the distance between the Fresnel biprism (2) and the frequency doubling crystal (3) is adjusted.
6. The femtosecond laser pulse width measurement device according to claim 4, wherein: the frequency doubling crystal (3) is a BBO crystal, and the thickness of the BBO crystal is 4mm to 6mm.
7. The femtosecond laser pulse width measurement device according to claim 4, wherein: the imaging instrument (4) is a CCD image sensor.
8. A femtosecond laser pulse width measurement method is characterized by comprising the following steps:
the method comprises the following steps: injecting femtosecond laser to be detected into a Cassegrain system (1) for beam expanding and focusing;
step two: the Fresnel biprism (2) divides the light beam passing through the Cassegrain system (1) into two beams, and the two beams are converged to a frequency doubling crystal (3);
step three: the frequency doubling crystal (3) performs fundamental frequency light frequency doubling on the light beam and enables frequency doubled light to be separated according to wavelength in space;
step four: reflecting the frequency-doubled light obtained in the step three by a concave mirror (6) to enter an imaging instrument (4) for imaging;
step five: and (3) analyzing and iteratively calculating the image on the imaging instrument (4) by using a computer (5), and calculating the pulse width of the femtosecond laser to be detected by adopting a generalized projection algorithm.
9. The femtosecond laser pulse width measurement method according to claim 8, characterized in that: in the second step, in the process of splitting the light beam by the Fresnel biprism (2), time delays of different sizes are provided by adjusting the distance between the Fresnel biprism (2) and the frequency doubling crystal (3), and pulse widths of different sizes are tested.
10. The femtosecond laser pulse width measurement method according to claim 8, characterized in that: in the fourth step, in the reflection process of the concave mirror (6), the imaging instrument (4) can be clearly imaged by adjusting the distance and the angle between the concave mirror (6) and the frequency doubling crystal (3).
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN117168632A (en) * | 2023-07-07 | 2023-12-05 | 北京大学 | Laser pulse width single-shot autocorrelation measuring device and calibration method thereof |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102353465A (en) * | 2011-09-30 | 2012-02-15 | 湖南大学 | Time pulse width measurement system for ultrashort pulses in different spatial positions and measurement method thereof |
CN107884078A (en) * | 2016-09-29 | 2018-04-06 | 上海菜牛光电科技有限公司 | A kind of integrated frequency resolved optical gating ultrashort pulse tester |
CN110535008A (en) * | 2019-08-26 | 2019-12-03 | 中国科学院上海光学精密机械研究所 | Compensate the achromatism grating stretcher of configuration off axis based on total reflection telescopic system |
-
2023
- 2023-01-06 CN CN202310015471.9A patent/CN115900976A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102353465A (en) * | 2011-09-30 | 2012-02-15 | 湖南大学 | Time pulse width measurement system for ultrashort pulses in different spatial positions and measurement method thereof |
CN107884078A (en) * | 2016-09-29 | 2018-04-06 | 上海菜牛光电科技有限公司 | A kind of integrated frequency resolved optical gating ultrashort pulse tester |
CN110535008A (en) * | 2019-08-26 | 2019-12-03 | 中国科学院上海光学精密机械研究所 | Compensate the achromatism grating stretcher of configuration off axis based on total reflection telescopic system |
Non-Patent Citations (3)
Title |
---|
庞泽: "基于二次谐波的超短脉冲测量技术研究", 万方学位论文 * |
李林: "现代光学设计", 北京理工大学出版社, pages: 9 * |
程广真: "全反式超短脉冲测量系统的光学设计研究", 万方学位论文, pages 1 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN117168632A (en) * | 2023-07-07 | 2023-12-05 | 北京大学 | Laser pulse width single-shot autocorrelation measuring device and calibration method thereof |
CN117168632B (en) * | 2023-07-07 | 2024-02-27 | 北京大学 | Laser pulse width single-shot autocorrelation measuring device and calibration method thereof |
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