CN117056146B - Testing device, method and medium compatible with SSD of multiple different protocols simultaneously - Google Patents
Testing device, method and medium compatible with SSD of multiple different protocols simultaneously Download PDFInfo
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- 238000012360 testing method Methods 0.000 title claims abstract description 140
- 238000000034 method Methods 0.000 title claims abstract description 23
- 238000013515 script Methods 0.000 claims abstract description 51
- 238000013403 standard screening design Methods 0.000 claims abstract description 47
- 238000001514 detection method Methods 0.000 claims description 6
- 238000010998 test method Methods 0.000 claims description 6
- 230000007958 sleep Effects 0.000 claims description 5
- 238000005070 sampling Methods 0.000 claims description 4
- 238000004891 communication Methods 0.000 claims description 3
- 238000004590 computer program Methods 0.000 claims description 3
- 239000007787 solid Substances 0.000 abstract description 24
- 238000012545 processing Methods 0.000 description 6
- 230000007547 defect Effects 0.000 description 4
- 230000006870 function Effects 0.000 description 4
- 238000011161 development Methods 0.000 description 3
- 230000009977 dual effect Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012216 screening Methods 0.000 description 2
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- 230000003287 optical effect Effects 0.000 description 1
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Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
- G06F11/2635—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers using a storage for the test inputs, e.g. test ROM, script files
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
Abstract
The invention discloses a testing device compatible with SSDs of a plurality of different protocols at the same time, which comprises a signal control board, wherein a plurality of compatible interfaces are arranged, and the compatible interfaces are used for simultaneously accessing SSDs of at least two different protocols; the PC test host is connected with the signal control board and runs at least one test script; the test script obtains the protocol of each SSD, and the protocol type of each SSD is identified by comparing signals of all protocols through a protocol detection program in the test script; and the test program in the test script performs corresponding signal test according to the protocol type. The method and the device can realize in-band and out-of-band testing of three SSDs with different protocols simultaneously, improve the flexibility and operability of solid state disk testing, facilitate the management and control of the solid state disk testing flow, reduce the requirement of switching the testing platform because of hardware limitation, reduce the links of manual operation, greatly improve the testing efficiency, and reduce the testing time and additional interference factors caused by manual operation.
Description
Technical Field
The invention relates to the technical field of hard disk testing, in particular to a testing device, a method and a medium which are compatible with SSDs of various different protocols simultaneously.
Background
With the development of SSD (Solid STATE DISK or Solid STATE DRIVE) storage technology, the read-write speed of the SSD is faster and faster. The latest protocol standard of the solid state disk is NVME (Non-Volatile Memory Express, nonvolatile memory), but for historical reasons, the traditional SATA (SERIAL ADVANCED TechnologyAttachment ) protocol and the SAS (SERIAL ATTACHED SCSI, serial attached SCSI interface) protocol still have a high market proportion and cannot be eliminated in a short period of time. So the solid state disk of three protocols of SATA, SAS and NVMe can exist and develop in parallel. Aiming at the test principle that the server industry supports the solid state disk back plate in SATA, SAS and NVMe modes, the function realization and detection in the multiple modes of SATA, SAS and NVMe are required to be covered.
The conventional solid state disk test method is shown in fig. 1: the PC test host is used for testing any one or two protocols of SATA, SAS and NVMe separately, the SATA solid state disk is tested by adopting a SATA test adapter plate, the SAS solid state disk is tested by adopting a SAS adapter plate, the NVMe solid state disk is tested by adopting an NVMe test adapter plate, and the three adapter plates are of separate protocols and cannot be compatible with respective out-of-band signal tests, so that in-band tests are generally only carried out, and out-of-band tests are skipped, so that in-band and out-of-band compatible tests cannot be carried out together.
The traditional solid state disk testing method has the following defects:
1. The solid state disk tests of three protocols of SATA, SAS and NVMe cannot be compatible together, the test operation is required to be independently carried out through the hardware adapter plates with the three protocols being independent, the test is complex and time-consuming, and the influence of human factors exists.
2. In-band and out-of-band tests of three protocols cannot be combined on the same test platform, and in-band and out-of-band tests are compatible, so that the solid state disk test switching efficiency of the three protocols is low, hardware needs to be replaced, errors are prone to occurring, and the test coverage is low.
Disclosure of Invention
In order to overcome the defects of the conventional solid state disk testing method in the background technology, the invention aims to provide the SSD testing device which can be compatible with SATA, SAS, NVMe or other protocols at the same time, and particularly, the testing device can identify the SSD protocol type first and then call the testing scripts corresponding to different protocols for testing. In addition, the testing device can be compatible with in-band and out-of-band tests at the same time, namely, the testing device can realize in-band and out-of-band tests of SSDs with three different protocols at the same time, so that SSD tests are simpler and more convenient, and the testing efficiency, the testing coverage rate and the testing accuracy rate of SSDs are obviously improved.
In order to achieve the above purpose, the invention adopts the following technical scheme:
in a first aspect of the present invention, there is provided a test device compatible with multiple different protocol SSDs simultaneously, comprising:
the signal control board is provided with a plurality of compatible interfaces, and the compatible interfaces are used for simultaneously accessing SSDs of at least two different protocols; for example, the compatible interface is used for accessing the first protocol SSD, the second protocol SSD and the third protocol SSD simultaneously;
the PC test host is connected with the signal control board, and runs at least one test script;
The test script obtains the protocol of each SSD, and the protocol type of each SSD is identified by comparing signals of all protocols through a protocol detection program in the test script;
And the test program in the test script performs corresponding signal test according to the protocol type.
Compared with the prior art, the invention has the beneficial effects that: the integrated compatibility of three protocols of the solid state disk SATA, the SAS and the NVMe is realized through the signal control board, the automatic screening of three protocol types of the SATA, the SAS and the NVMe can be realized through a software script identification method under the condition of not switching hardware, and the in-band signal test and the out-of-band signal test of the corresponding SATA, SAS and NVMe are switched according to the protocol types, namely, the testing device can realize the in-band and out-of-band test of three SSDs with different protocols at the same time, so that the flexibility and the operability of the solid state disk test are greatly improved, the management and control of the solid state disk test flow are facilitated, the requirement of switching a test platform due to hardware limitation is reduced, the link of manual operation is reduced, the test efficiency is greatly improved, and the test time and the extra interference factors caused by the manual operation are reduced.
In some possible embodiments, the signal control board includes:
the power supply control module is used for switching the power supply voltage according to the protocol type so as to supply power to each SSD;
Identifying each SSD after power supply by using an SSD identification program in the test script, and executing an error reporting program in the test script on the SSD which cannot be identified;
the protocol control module is used for switching in-band signal test programs of corresponding protocol types in the test script according to the identified protocol types of the SSD;
And the communication control module is used for switching the out-of-band signal test program of the corresponding protocol type in the test script according to the identified protocol type of the SSD.
In some possible implementations, identifying the protocol type of each SSD includes the steps of:
Acquiring one or more in-band signals or out-of-band signals of a first protocol, a second protocol and a third protocol respectively;
By comparing one or more of in-band signals or out-of-band signals of all protocols, determining that the protocol type of the first protocol is SATA, the protocol type of the second protocol is SAS, and the protocol type of the third protocol is NVMe.
In some possible embodiments, the supply voltage of the SATA SSD and SAS SSD is 5V, and the supply voltage of the NVMe SSD is 12V or 3.3V, respectively.
In some possible embodiments, the out-of-band signal includes one or more of a GPIO level detection signal, a voltage/current sampling signal, a reset signal, a sleep signal, a power down signal, a clock signal, and a UART signal.
In a second aspect of the present invention, a method for testing SSDs compatible with multiple different protocols simultaneously is provided, comprising the steps of:
Loading a test script, and acquiring a protocol corresponding to each SSD through the test script, wherein the protocol comprises a first protocol, a second protocol and a third protocol;
Comparing signals of all protocols through a protocol detection program in the test script, and identifying the protocol type of each protocol;
Switching a power supply voltage according to the protocol type to supply power to each SSD;
Detecting whether the SSD after power supply can be identified or not through an SSD identification program in the test script, and if so, running an in-band signal or an out-of-band signal test program in the test script corresponding to the protocol type according to the identified protocol type of the SSD; if the test script is not recognized, executing the error reporting program in the test script.
In some possible embodiments, determining the protocol type of each SSD includes the steps of:
Acquiring one or more in-band signals or out-of-band signals of a first protocol, a second protocol and a third protocol respectively;
By comparing one or more of in-band signals or out-of-band signals of all protocols, determining that the protocol type of the first protocol is SATA, the protocol type of the second protocol is SAS, and the protocol type of the third protocol is NVMe.
In some possible embodiments, the supply voltage of the SATA SSD and SAS SSD is 5V, and the supply voltage of the NVMe SSD is 12V or 3.3V, respectively.
In some possible embodiments, the out-of-band signal includes one or more of a GPIO level detection signal, a voltage/current sampling signal, a reset signal, a sleep signal, a power down signal, a clock signal, and a UART signal.
In a third aspect of the present invention, there is provided a computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements the steps of the above-described test method compatible with multiple different protocol SSDs simultaneously.
Drawings
FIG. 1 is a flow chart of a conventional solid state disk test method;
FIG. 2 is a schematic structural diagram of a testing device compatible with SSDs of multiple different protocols in embodiment 1 of the present invention;
FIG. 3 is a flowchart illustrating the overall steps of a method for simultaneously testing SSDs compatible with multiple different protocols according to embodiment 2 of the present invention;
FIG. 4 is a flowchart illustrating the detailed steps of a method for testing SSDs compatible with multiple different protocols in accordance with embodiment 2 of the present invention;
FIG. 5 is a flowchart showing the steps of the method for identifying the protocol type of each protocol in embodiment 2 of the present invention;
Detailed Description
The preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings so that the advantages and features of the present invention can be more easily understood by those skilled in the art, thereby making clear and defining the scope of the present invention.
Referring to fig. 2, in this embodiment, a testing apparatus compatible with multiple SSDs of different protocols simultaneously includes:
The signal control board is provided with a plurality of compatible interfaces, and the compatible interfaces are used for simultaneously accessing SSDs of at least two different protocols; for example, the compatible interface is used for accessing the first protocol SSD, the second protocol SSD and the third protocol SSD simultaneously; the PC test host is connected with the signal control board, and runs at least one test script; and the test script acquires the protocol of each SSD, and the protocol type of each SSD is identified by comparing signals of all the protocols through a protocol detection program in the test script.
Specifically, identifying the protocol type of each SSD includes the steps of: acquiring one or more in-band signals or out-of-band signals of a first protocol, a second protocol and a third protocol respectively; by comparing one or more of in-band signals or out-of-band signals of all protocols, determining that the protocol type of the first protocol is SATA, the protocol type of the second protocol is SAS, and the protocol type of the third protocol is NVMe.
The in-band signals of SATA are specifically as follows: SATA Tx+ (transmitting positive level signal 0), SATA Tx- (transmitting negative level signal 0), SATA Rx+ (receiving positive level signal 0), SATA Rx- (receiving negative level signal 0)
The SAS in-band signals are specifically as follows: SAS Tx0+ (transmit positive signal 0), sas_tx0- (transmit negative signal 0), sas_rx0+ (receive positive signal 0), sas_rx0- (receive negative signal 0), SAS Tx1+ (transmit positive signal 1), sas_tx1- (transmit negative signal 1), SAS Rx1+ (receive positive signal 1), sas_rx1- (receive negative signal 1)
The in-band signal of NVMe is specifically as follows: PCIE REFCLK + (reference clock positive-stage signal), PCIE REFCLK- (reference clock negative-stage signal), PCIe Tx0+ (transmit positive-stage signal 0), PCIe_Tx0- (transmit negative-stage signal 0), PCIe_Rx0+ (receive positive-stage signal 0), PCIe_Rx0- (receive negative-stage signal 0), PCIe Tx1+ (transmit positive-stage signal 1), PCIe Tx1+ (receive positive-stage signal 1), PCIe_Rx1- (receive negative-stage signal 1), PCIe Tx2+ (transmit positive-stage signal 2), PCIe_Tx2+ (transmit negative-stage signal 2), PCIe_Rx2- (receive negative-stage signal 2), PCIe Tx3+ (transmit positive-stage signal 2), PCIe Tx3+ (transmit negative-stage signal 3), PCIe Rx3+ (receive positive-stage signal 3), PCIe_Rx3- (receive negative-stage signal 3)
The out-of-band signals of SATA are specifically as follows: devslp (deep sleep control), activity (work instruction Signal)
The SAS out-of-band signals are specifically as follows: power Disable, DAS (device on indication)
The out-of-band signal of NVMe is specifically as follows: perST (hardware reset Signal), ifDet (interface detection), CLKREQ (Clock on off control), SMBus Clock, SMBus Data (System management bus Data), dualPortEn (Dual Port Enable)
Since there is a significant difference between in-band and out-of-band signals of three protocols of SATA, SAS, and NVMe, different protocol types can be identified based on the signal difference. For example, SATA and SAS have no hardware reset signal, while NVMe has a hardware reset signal; the low power consumption of SATA and SAS is divided into Partial/Slumber, and the low power consumption of NVMe is divided into L1.1/L1.2.SATA has no clocking and NVMe has clocking; SATA and SAS have no dual port enable control, whereas NVMe has dual port enable control; SATA and SAS do not have an SMBus "system management bus", whereas NVMe has a system management bus.
And testing the corresponding in-band signal or out-of-band signal by the test program in the test script according to the protocol type.
In some embodiments, the signal control board comprises:
The power supply control module is used for switching the power supply voltage according to the protocol type so as to supply power to each SSD to meet the power supply requirements of SSDs of different protocols, specifically, the power supply voltage of the SATA SSD and the SAS SSD is 5V respectively, and the power supply voltage of the NVMe SSD is 12V or 3.3V.
Identifying each SSD after power supply by using an SSD identification program in the test script, and executing an error reporting program in the test script on the SSD which cannot be identified;
the protocol control module is used for switching in-band signal test programs of corresponding protocol types in the test script according to the identified protocol types of the SSD;
And the communication control module is used for switching the out-of-band signal test program of the corresponding protocol type in the test script according to the identified protocol type of the SSD.
The integrated compatible connection of the SATA, SAS and NVMe solid state drives is realized through the compatible interface of the signal control board, three protocol types of the SATA, SAS and NVMe solid state drives can be automatically screened through the test script of software under the condition of not switching hardware, and the in-band signal test program and the out-of-band signal test program of the corresponding SATA, SAS and NVMe are switched according to the protocol types, so that the in-band test and the out-of-band test of the SATA, SAS and NVMe are completed on the same platform in one step, the flexibility and the operability of the solid state drive test are greatly improved, the management and the control of the solid state drive test flow are facilitated, the requirement of switching the test platform due to hardware limitation is reduced, the link of manual operation is reduced, the test efficiency is greatly improved, and the test time and the extra interference factors caused by the manual operation are reduced.
The solid state disk reliability test and the production test are complicated if the in-band signal test and the out-of-band signal test are performed separately, and unnecessary errors are caused by manual operation in the middle. If the in-band signal test and the out-of-band signal test are combined together and automatic screening and protocol switching are realized, the test efficiency and the test accuracy are greatly improved.
The test method compatible with multiple SSDs of different protocols in the embodiment 2 is applied to the test device, and is shown in fig. 3 and fig. 4, and specifically includes the following steps:
S1: loading a test script, and acquiring a protocol corresponding to each SSD through the test script, wherein the protocol comprises a first protocol, a second protocol and a third protocol.
S2: and comparing signals of all protocols through a protocol detection program in the test script, and identifying the protocol type of each protocol. Specifically, referring to fig. 5, identifying the protocol type of each protocol includes the following steps:
S21: one or more of in-band signals or out-of-band signals of the first protocol, the second protocol and the third protocol are acquired respectively.
S22: by comparing one or more of in-band signals or out-of-band signals of all protocols, determining that the protocol type of the first protocol is SATA, the protocol type of the second protocol is SAS, and the protocol type of the third protocol is NVMe.
S3: and switching the power supply voltage according to the protocol type to supply power to each SSD.
S4: and detecting whether the SSD after power supply can be identified or not through an SSD identification program in the test script.
If the SSD can be identified, running an in-band signal or out-of-band signal test program corresponding to the protocol type in the test script according to the identified protocol type of the SSD; if the test script is not recognized, executing the error reporting program in the test script.
In example 2, the supply voltages of the SATA SSD and the SAS SSD were 5V and the supply voltage of the nvme SSD was 12V or 3.3V, respectively.
In embodiment 2, the out-of-band signal includes one or more of a GPIO level detection signal, a voltage/current sampling signal, a reset signal, a sleep signal, a power down signal, a clock signal, and a UART signal.
Embodiment 3 provides a computer readable storage medium, on which a computer program is stored, which when executed by a processor implements the steps of the above-described testing method compatible with multiple different protocols SSD at the same time.
The storage medium stores program instructions capable of implementing all the methods described above, wherein the program instructions may be stored in the storage medium in the form of a software product, and include several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) or a processor (processor) to perform all or part of the steps of the methods described in the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), a magnetic disk, an optical disk, or other various media capable of storing program codes, or a terminal device such as a computer, a server, a mobile phone, a tablet, or the like.
The processor may also be referred to as a CPU (Central Processing Unit ). The processor may be an integrated circuit chip having signal processing capabilities. The processor may also be:
DSP (DIGITAL SIGNAL Processor ) which is a Processor composed of large-scale or very large-scale integrated circuit chips for completing a certain signal processing task is gradually developed to meet the requirement of high-speed real-time signal processing task, along with the development of integrated circuit technology and digital signal processing algorithm, the implementation method of the digital signal Processor is continuously changed, and the processing function is continuously improved and expanded
An ASIC (Application SPECIFIC INTEGRATED Circuit, application specific integrated Circuit, i.e., application specific integrated Circuit, refers to an integrated Circuit that is designed and manufactured to meet the needs of a particular user and a particular electronic system.
FPGAs (field programmable gate arrays, field Programmable GATE ARRAY) are a further development on the basis of programmable devices such as PALs (Programmable Array Logic ), GAL (GENERIC ARRAY logic, general array logic) and the like. The programmable device is used as a semi-custom circuit in the field of Application Specific Integrated Circuits (ASICs), which not only solves the defect of custom circuits, but also overcomes the defect of limited gate circuits of the original programmable device.
It should be appreciated that in the above description of exemplary embodiments of the invention, various features of the invention are sometimes grouped together in a single embodiment, figure, or description thereof for the purpose of streamlining the disclosure and aiding in the understanding of one or more of the various inventive aspects. However, the disclosed method should not be construed as reflecting the intention that: i.e., the claimed invention requires more features than are expressly recited in each claim. Rather, as the following claims reflect, inventive aspects lie in less than all features of a single foregoing disclosed embodiment. Thus, the claims following the detailed description are hereby expressly incorporated into this detailed description, with each claim standing on its own as a separate embodiment of this invention.
Those skilled in the art will appreciate that the modules or units or components of the devices in the examples disclosed herein may be arranged in a device as described in this embodiment, or alternatively may be located in one or more devices different from the devices in this example. The modules in the foregoing examples may be combined into one module or may be further divided into a plurality of sub-modules.
Those skilled in the art will appreciate that the modules in the apparatus of the embodiments may be adaptively changed and disposed in one or more apparatuses different from the embodiments. The modules or units or components of the embodiments may be combined into one module or unit or component and, furthermore, they may be divided into a plurality of sub-modules or sub-units or sub-components. Any combination of all features disclosed in this specification (including any accompanying claims, abstract and drawings), and all of the processes or units of any method or apparatus so disclosed, may be used in combination, except insofar as at least some of such features and/or processes or units are mutually exclusive. Each feature disclosed in this specification (including any accompanying claims, abstract and drawings), may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise.
Furthermore, those skilled in the art will appreciate that while some embodiments described herein include some features but not others included in other embodiments, combinations of features of different embodiments are meant to be within the scope of the invention and form different embodiments. For example, in the following claims, any of the claimed embodiments can be used in any combination.
Furthermore, some of the embodiments are described herein as methods or combinations of method elements that may be implemented by a processor of a computer system or by other means of performing the functions. Thus, a processor with the necessary instructions for implementing the described method or method element forms a means for implementing the method or method element. Furthermore, the elements of the apparatus embodiments described herein are examples of the following apparatus: the apparatus is for carrying out the functions performed by the elements for carrying out the objects of the invention.
As used herein, unless otherwise specified the use of the ordinal terms "first," "second," "third," etc., to describe a general object merely denote different instances of like objects, and are not intended to imply that the objects so described must have a given order, either temporally, spatially, in ranking, or in any other manner.
While the invention has been described with respect to a limited number of embodiments, those skilled in the art, having benefit of the above description, will appreciate that other embodiments are contemplated within the scope of the invention as described herein. Furthermore, it should be noted that the language used in the specification has been principally selected for readability and instructional purposes, and may not have been selected to delineate or circumscribe the inventive subject matter. Accordingly, many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the appended claims. The disclosure of the present invention is intended to be illustrative, but not limiting, of the scope of the invention, which is defined by the appended claims.
The above embodiments are only for illustrating the technical concept and features of the present invention, and are intended to enable those skilled in the art to understand the content of the present invention and to implement the same, but are not intended to limit the scope of the present invention, and all equivalent changes or modifications made according to the spirit of the present invention should be included in the scope of the present invention.
Claims (5)
1. Simultaneously compatible multiple different protocol SSD's testing arrangement, its characterized in that includes:
The signal control board is provided with a plurality of compatible interfaces, and the compatible interfaces are used for simultaneously accessing SSDs of at least two different protocols;
the PC test host is connected with the signal control board, and runs at least one test script;
The test script obtains the protocol of each SSD, and the protocol type of each SSD is identified by comparing signals of all protocols through a protocol detection program in the test script;
the test program in the test script performs corresponding signal test according to the protocol type;
wherein the signal control board comprises:
the power supply control module is used for switching the power supply voltage according to the protocol type so as to supply power to each SSD;
Identifying each SSD after power supply by using an SSD identification program in the test script, and executing an error reporting program in the test script on the SSD which cannot be identified;
the protocol control module is used for switching in-band signal test programs of corresponding protocol types in the test script according to the identified protocol types of the SSD;
the communication control module is used for switching out-of-band signal test programs of the corresponding protocol types in the test script according to the protocol types of the identifiable SSD; the out-of-band signal comprises one or more of GPIO level detection signals, voltage/current sampling signals, reset signals, sleep signals, power down signals, clock signals and UART signals;
When the compatible interface accesses the first protocol SSD, the second protocol SSD and the third protocol SSD simultaneously, the identification of the protocol type of each SSD comprises the following steps:
Acquiring one or more in-band signals or out-of-band signals of a first protocol, a second protocol and a third protocol respectively;
By comparing one or more of in-band signals or out-of-band signals of all protocols, determining that the protocol type of the first protocol is SATA, the protocol type of the second protocol is SAS, and the protocol type of the third protocol is NVMe.
2. The test device of claim 1, wherein the SATA SSD and SAS SSD have a supply voltage of 5V and the NVMe SSD has a supply voltage of 12V or 3.3V, respectively.
3. The test method compatible with SSD of a plurality of different protocols is characterized in that the test device of claim 1 is adopted, and the method comprises the following steps:
Loading a test script, and acquiring a protocol corresponding to each SSD through the test script, wherein the protocol comprises a first protocol, a second protocol and a third protocol;
Comparing signals of all protocols through a protocol detection program in the test script, and identifying the protocol type of each protocol;
Switching a power supply voltage according to the protocol type to supply power to each SSD;
Detecting whether the SSD after power supply can be identified or not through an SSD identification program in the test script, and if so, running an in-band signal or an out-of-band signal test program in the test script corresponding to the protocol type according to the identified protocol type of the SSD; if the test script is not recognized, executing the error reporting program in the test script.
4. The testing method of claim 3, wherein the SATA SSD and SAS SSD have a supply voltage of 5V and the NVMe SSD has a supply voltage of 12V or 3.3V, respectively.
5. A computer readable storage medium, characterized in that it has stored thereon a computer program which, when executed by a processor, implements the steps of the test method of any of claims 3-4 compatible with multiple different protocols SSD at the same time.
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