CN117031252B - Impedance testing device and method - Google Patents
Impedance testing device and method Download PDFInfo
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- CN117031252B CN117031252B CN202311010832.7A CN202311010832A CN117031252B CN 117031252 B CN117031252 B CN 117031252B CN 202311010832 A CN202311010832 A CN 202311010832A CN 117031252 B CN117031252 B CN 117031252B
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- 238000012360 testing method Methods 0.000 title claims abstract description 160
- 238000000034 method Methods 0.000 title abstract description 16
- 239000000463 material Substances 0.000 claims abstract description 6
- 230000005540 biological transmission Effects 0.000 claims description 24
- 239000000523 sample Substances 0.000 claims description 15
- 238000006073 displacement reaction Methods 0.000 claims description 9
- 238000007599 discharging Methods 0.000 claims description 8
- 230000000712 assembly Effects 0.000 claims description 5
- 238000000429 assembly Methods 0.000 claims description 5
- 238000001125 extrusion Methods 0.000 claims description 4
- 230000000149 penetrating effect Effects 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000012840 feeding operation Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention discloses an impedance testing device and method, which relate to the technical field of impedance testing and have the technical scheme that the impedance testing device comprises a workbench, a testing mechanism, an indexing mechanism and a clamping mechanism, wherein the indexing mechanism is arranged on the workbench, the indexing mechanism comprises a supporting plate, a supporting protruding rod is fixedly connected to one side of the supporting plate, which faces the workbench, of the supporting plate, a guide rail is arranged at one end of the supporting plate, which faces the supporting plate, the supporting protruding rod is in sliding connection with the guide rail, a material supporting groove is arranged at one end of the supporting plate, which is close to the edge of the workbench, and is used for placing a workpiece to be tested, the indexing mechanism is used for transferring the supporting plate from a loading position to a testing position, and the clamping mechanism is arranged on the supporting plate. The device has the advantages that the device enables the supporting plate to transfer the workpiece to be tested from the loading position to the testing position through the arrangement of the indexing mechanism and the clamping mechanism, and the workpiece is clamped and fixed automatically before testing, so that the testing precision is ensured.
Description
Technical Field
The invention relates to the technical field of impedance testing, in particular to an impedance testing device and an impedance testing method.
Background
In recent years, with rapid development of electronic products such as desktop computers, notebook computers, mobile phones, digital televisions, set-top boxes, consumer electronics (MP 3, MP4, game machines, digital cameras, etc.), communication devices, and automotive electronics, signal transmission frequencies and speeds thereof are higher and higher, and strict characteristic impedance test requirements are put on circuit boards (PCBs) used.
The characteristic impedance of the circuit of the PCB board is related to the physical dimensions of the circuit on the board, the PCB manufacturing materials, the processing technique, etc., and may be different from batch to batch. In order to control the line impedance, PCB manufacturers need to perform a strict characteristic impedance test on each PCB produced to check whether it meets the design and production requirements; and the manufacturer can adjust or compensate the characteristic impedance of PCBs in different batches by changing the line width, the lamination thickness, controlling etching and other methods according to the test result, thereby meeting the requirements of customers on the control precision of the characteristic impedance of the PCB.
At present, the existing impedance testing device needs to manually feed and discharge a workpiece to be tested, and the testing mode is low in efficiency.
Disclosure of Invention
Aiming at the defects existing in the prior art, the invention aims to provide an impedance testing device and an impedance testing method, which aim to solve the technical problems.
In order to achieve the above purpose, the present invention provides the following technical solutions: an impedance testing apparatus for impedance testing a workpiece to be tested, comprising:
the side end of the workbench is fixedly connected with a cantilever;
the testing mechanism is arranged on the cantilever and is used for testing a workpiece to be tested;
the indexing mechanism is arranged on the workbench and comprises a supporting plate, one side of the supporting plate, facing the workbench, is fixedly connected with a supporting convex rod, one end of the workbench, facing the supporting plate, is provided with a guide rail, the supporting convex rod is in sliding connection with the guide rail, one end, close to the edge of the workbench, of the supporting plate is provided with a material supporting groove, the material supporting groove is used for placing a workpiece to be tested, and the indexing mechanism is used for transferring the supporting plate from a loading position to a testing position;
the clamping mechanism comprises a fan-shaped disc, a wane, a first spring, an eccentric wheel, an extruding plate and a clamping component, wherein an upright post is fixedly connected to the cantilever, one end of the upright post, which is far away from the cantilever, is fixedly connected with the fan-shaped disc, wherein the radius size of the fan-shaped disc, which is close to the position of the testing mechanism, is larger than that of the fan-shaped disc, which is far away from the position of the testing mechanism, in the rotating direction of the supporting plate, the eccentric wheel is rotationally connected with a bracket, the bracket is fixedly connected to the supporting plate, the wane is fixedly connected with the wane at the side end of the eccentric wheel, one side of the wane, which is far away from the supporting plate, is in friction and interference fit with the arc surface of the fan-shaped disc, the wane is fixedly connected with the first spring at the side, one end of the first spring, which is far away from the wane, is fixedly connected with a fixing block, the fixed block is fixedly arranged on the supporting plate, the circumferential surface of the eccentric wheel is in friction contact with the extruding plate, the clamping assemblies are in two groups, the two groups of clamping assemblies are symmetrically arranged on the supporting plate, each clamping assembly comprises a first connecting rod, a second spring and a clamping plate, one end of each first connecting rod is fixedly connected to the extruding plate, the other end of each first connecting rod penetrates through the supporting plate and is in sliding connection with the supporting plate, a sliding groove is formed in one side, close to the first connecting rod, of each clamping plate, one end, penetrating through the supporting plate, of each first connecting rod is in sliding connection with the corresponding sliding groove, the clamping plates are in sliding connection with the supporting plate, the highest position of each sliding groove is close to the corresponding supporting groove along the sliding direction of the corresponding first connecting rod and the supporting plate, and the lowest position of each sliding groove is far away from the corresponding supporting groove;
when the supporting plate for supporting the workpiece to be tested rotates to the arc surface of the fan-shaped plate to be in friction and interference with the rocker, and the supporting plate is located at the test position, one end of the first connecting rod, which is in sliding connection with the sliding groove, moves to the maximum displacement in the direction close to the lowest point of the sliding groove, and the two clamping plates move to be in friction and interference with the workpiece to be tested in opposite directions, so that the workpiece to be tested is clamped and fixed.
Preferably, the indexing mechanism further comprises an intermittent driving assembly, an indexing frame and a connecting plate, wherein the intermittent driving assembly is arranged on the workbench, the intermittent driving assembly is in transmission connection with the indexing frame, one end of the indexing frame, far away from the rotating axis of the indexing frame, is rotationally connected with the connecting plate, the connecting plate is fixedly connected with the supporting plate, one side of the supporting plate, facing the workbench, is fixedly connected with a supporting convex rod, and one end of the workbench, facing the supporting plate, is provided with a guide rail, and the supporting convex rod is in sliding connection with the guide rail.
Preferably, the intermittent drive assembly comprises a second motor, a first rotary table, a limit column and a second rotary table, wherein the second motor is arranged on the workbench, the first rotary table is fixedly connected to an output shaft of the second motor, the limit column is fixedly connected to a side end of the first rotary table, the distance between the axial lead of the limit column and the axial lead of the first rotary table is larger than the radius of the first rotary table, a limit groove is formed in the second rotary table, the limit column is in sliding fit with the limit groove, the second rotary table is fixedly connected to a main shaft, one end of the main shaft, close to the workbench, is in rotary connection with the workbench, and one end, far away from the workbench, of the main shaft is fixedly connected with a rotary frame.
Preferably, the testing mechanism comprises a hydraulic cylinder, a telescopic rod, a mounting seat and a testing probe, wherein the hydraulic cylinder is fixedly arranged on the cantilever, the telescopic rod is fixedly connected with the output end of the hydraulic cylinder, the mounting seat is fixedly connected with one end of the telescopic rod, which is far away from the hydraulic cylinder, and the testing probe is fixedly arranged on one side, facing the workbench, of the mounting seat.
Preferably, the impedance testing apparatus further includes:
the conveying mechanism is arranged on one side of the workbench and is used for conveying the workpiece to be tested to the pushing position;
the pushing mechanism is arranged between the testing mechanism and the conveying mechanism and is used for pushing the workpiece to be tested on the conveying mechanism onto the supporting plate.
Preferably, the conveying mechanism comprises a first motor, a conveying belt and side baffles, the conveying belt is sleeved on a plurality of driving rollers, the side baffles are respectively arranged at two axial ends of each driving roller, the two axial ends of each driving roller are respectively and rotatably connected with the side baffles, and the output end of the first motor is fixedly connected with the input end of one driving roller.
Preferably, the pushing mechanism comprises a second connecting rod, a first rack, a first gear, a transmission shaft, a second gear, a second rack and a pushing plate, one end of the second connecting rod is fixedly connected with the telescopic rod, the other end of the second connecting rod is fixedly connected with the first rack, a guide post is fixedly connected to the side baffle, the first rack penetrates through the guide post and is in sliding connection with the guide post, the arrangement direction of the first rack is parallel to the telescopic direction of the telescopic rod, the first gear is meshed with the first gear, the output end of the first gear is fixedly connected with the transmission shaft, one end of the transmission shaft, far away from the first gear, is fixedly connected with the second gear, the second gear is meshed with the second rack, one end of the second rack, close to the supporting plate, is fixedly connected with the pushing plate, the side end of the second rack is fixedly connected with the guide rod, the guide rod penetrates through a side baffle, far away from one side of the workbench, is in sliding connection with the side baffle, the arrangement direction of the second rack is intersected with the arrangement direction of the first rack, and the arrangement direction of the second rack is meshed with the first rack, the position of the corresponding pushing plate is provided with a groove;
when the test probe moves to the maximum displacement in the direction away from the hydraulic cylinder, the pushing plate passes through the groove in the direction close to the workbench and moves to the maximum displacement, and the pushing plate is used for pushing the to-be-tested workpiece positioned at the pushing position on the conveying belt to the supporting plate positioned at the feeding position.
Preferably, the impedance testing device further comprises a collecting box, wherein the collecting box is arranged on one side of the workbench, the end face of the workbench, facing the supporting plate, comprises a plane and a concave surface, and the concave surface of the workbench is arranged at a position, close to the collecting box, of the workbench;
when the supporting convex rod slides from the guide rail at the plane position of the workbench to the guide rail at the concave position of the workbench, the connecting plate rotates to the discharging position along the direction close to the workbench around the axial lead position of the connecting plate rotationally connected with the rotating frame, and the collecting box is used for collecting the tested workpiece supported on the supporting plate and subjected to test.
The invention also provides an impedance testing method which is applied to the impedance testing device.
Preferably, the impedance testing method comprises the following steps:
step one: placing a workpiece to be tested on a supporting plate positioned at a loading position, wherein the workpiece to be tested is positioned between two clamping plates;
step two: the indexing mechanism conveys the workpiece to be tested to a testing position from a loading position, the fan-shaped disc is in friction and interference with the rocker, and when the rocker rotates to a maximum angle around the rotating axis of the eccentric wheel, the two clamping plates move in opposite directions until the clamping plates are contacted with the workpiece to be tested, so that the clamping and fixing of the workpiece to be tested are realized;
step three: starting a testing mechanism to perform impedance testing on the workpiece to be tested positioned at the testing position;
step four: the indexing mechanism continues to drive, the tested workpiece is moved out of the testing position, the fan-shaped disc and the seesaw are arranged at intervals, and the clamping plate reversely moves to the initial position, so that the clamping and fixing of the tested workpiece are relieved, and the impedance test of the workpiece to be tested is completed.
Compared with the prior art, the technical scheme provided by the embodiment of the invention has at least the following beneficial effects:
1. according to the device, the indexing mechanism, the testing mechanism and the clamping mechanism are arranged, the supporting plate is transferred to the testing position from the loading position through the indexing mechanism, in the process, the clamping mechanism is clamped and fixed on the workpiece to be tested by virtue of friction interference fit between the fan-shaped disc in the clamping mechanism and the rocker, the workpiece to be tested is clamped and fixed before the workpiece to be tested is tested, the workpiece is prevented from shifting and deflecting, the testing precision is ensured on the side face, and therefore impedance testing is further carried out on the workpiece to be tested by virtue of the testing mechanism;
2. in addition, the device is also provided with a pushing mechanism and a conveying mechanism, the conveying mechanism is used for conveying the workpiece to be tested to a pushing position, when the mounting seat of the telescopic rod in the testing mechanism, which is provided with the test probe in a transmission manner, moves towards the supporting plate close to the testing position, the telescopic rod drives the pushing mechanism to operate, so that the pushing plate pushes the workpiece to be tested which is conveyed to the pushing position under interception to the supporting plate positioned at the feeding position, and the feeding is completed, so that the feeding work and the testing work are synchronously carried out, and the working efficiency is improved;
3. and after the test is finished, under the continuous rotation of the indexing mechanism, the indexing frame continuously and intermittently rotates to enable the supporting plate positioned at the test position to rotate to the blanking position, in the process, the supporting convex rod fixedly connected to the supporting plate slides to the guide rail on the concave surface of the workbench from the guide rail on the plane of the workbench, so that the supporting plate positioned at the blanking position inclines, and under the reset action of the first spring and the second spring, the clamping plate releases the clamping fixation of the workpiece, so that the workpiece positioned at the blanking position slides into the collecting box, thereby realizing automatic collection.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, it being obvious that the drawings described below are only some embodiments of the present invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic three-dimensional structure diagram of a view angle of an impedance testing apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic three-dimensional structure of another view angle of an impedance testing apparatus according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a partial structure of a positioning mechanism in an impedance testing apparatus according to an embodiment of the present invention;
fig. 4 is a schematic diagram of a partial structure of a conveying mechanism and a pushing mechanism in an impedance testing apparatus according to an embodiment of the present invention;
FIG. 5 is an enlarged schematic view of the structure shown at A in FIG. 2;
FIG. 6 is a schematic diagram of a structure of a clamping mechanism in a device for testing impedance according to an embodiment of the present invention;
fig. 7 is a schematic diagram of a partial structure of a clamping mechanism in an impedance testing apparatus according to an embodiment of the present invention.
Reference numerals:
1. a work table; 2. a conveying mechanism; 21. a conveyor belt; 22. side baffles; 23. a first motor; 24. a groove; 3. a testing mechanism; 31. a hydraulic cylinder; 32. a telescopic rod; 33. a mounting base; 34. a test probe; 4. a clamping mechanism; 41. a column; 42. a fan-shaped disc; 43. a seesaw; 44. a first spring; 45. a fixed block; 46. an eccentric wheel; 47. a bracket; 48. an extrusion plate; 49. a first connecting rod; 410. a chute; 411. a clamping plate; 412. a second spring; 5. an indexing mechanism; 51. a second motor; 52. a limit column; 53. a main shaft; 54. a first turntable; 55. a rotating frame; 56. a second turntable; 57. a limit groove; 58. a connecting plate; 59. a supporting plate; 6. a pushing mechanism; 61. a guide post; 62. a second connecting rod; 63. a first rack; 64. a first gear; 65. a transmission shaft; 66. a second gear; 67. a guide rod; 68. a second rack; 69. a pushing plate; 7. a collection box; 8. a cantilever; 9. supporting the convex rod; 10. and a guide rail.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is evident that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In the description of the present invention, it should be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like indicate orientations or positional relationships based on the orientation or positional relationships shown in the drawings, merely to facilitate describing the present invention and simplify the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the present invention.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature. In the description of the present invention, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
An embodiment of an impedance testing apparatus according to the present invention will be further described with reference to fig. 1 to 7.
As shown in fig. 1 to 7, an impedance testing apparatus according to an embodiment of the present invention is configured to perform impedance testing on a workpiece to be tested, and the workpiece to be tested is an exemplary PCB, and includes:
the workbench 1, the side end of the workbench 1 is fixedly connected with a cantilever 8;
the testing mechanism 3, the testing mechanism 3 is installed on the cantilever 8, the testing mechanism 3 is used for testing a workpiece to be tested, as shown in fig. 1, the testing mechanism 3 comprises a hydraulic cylinder 31, a telescopic rod 32, a mounting seat 33 and a testing probe 34, the hydraulic cylinder 31 is fixedly installed on the cantilever 8, the output end of the hydraulic cylinder 31 is fixedly connected with the telescopic rod 32, one end of the telescopic rod 32, which is far away from the hydraulic cylinder 31, is fixedly connected with the mounting seat 33, one side of the mounting seat 33, which faces the workbench 1, is fixedly provided with the testing probe 34, and the telescopic rod 32 drives the testing probe 34 installed on the mounting seat 33 to move to the direction, which is close to the workpiece to be tested, to the needle head of the testing probe 34 to be contacted with the contact point to be tested of the workpiece to be tested, so as to realize the testing of the workpiece to be tested;
the indexing mechanism 5 is arranged on the workbench 1, the indexing mechanism 5 comprises a supporting plate 59, a supporting groove is formed in one end, close to the edge position of the workbench 1, of the supporting plate 59, the supporting groove is used for placing a workpiece to be tested, the indexing mechanism 5 is used for transferring the supporting plate 59 from a loading position to a testing position, the testing position is a position where the supporting plate 59 is located when rotating below the testing mechanism 3, and the loading position is a position where the supporting plate 59 intermittently stops before rotating to the testing position, as shown in fig. 2;
the clamping mechanism 4, the clamping mechanism 4 includes a fan-shaped disc 42, a wane 43, a first spring 44, an eccentric wheel 46, a squeeze plate 48 and a clamping component, a stand column 41 is fixedly connected to the cantilever 8, one end of the stand column 41 away from the cantilever 8 is fixedly connected with the fan-shaped disc 42, wherein, as shown in fig. 7, in the rotating direction of the supporting plate 59, the radial dimension of the fan-shaped disc 42 close to the position of the testing mechanism 3 is larger than the radial dimension of the fan-shaped disc 42 away from the position of the testing mechanism 3, namely, in the rotating direction of the supporting plate 59, the radial dimension of the fan-shaped disc 42 is gradually increased, the eccentric wheel 46 is rotationally connected with a bracket 47, the bracket 47 is fixedly connected to the supporting plate 59, the side end of the eccentric wheel 46 is fixedly connected with a wane 43, one side of the wane 43 away from the supporting plate 59 is in friction and interference fit with the circular arc surface of the fan-shaped disc 42, the side of the wane 43 facing the supporting plate 59 is fixedly connected with a first spring 44, the first spring 44 is fixedly connected with the fixed block 45 at one end far away from the rocker 43, the fixed block 45 is fixedly arranged on the supporting plate 59, the circumference surface of the eccentric wheel 46 is in friction contact with the extruding plate 48, two groups of clamping assemblies are symmetrically arranged on the supporting plate 59, each clamping assembly comprises a first connecting rod 49, a second spring 412 and a clamping plate 411, one end of the first connecting rod 49 is fixedly connected on the extruding plate 48, the other end of the first connecting rod 49 penetrates through the supporting plate 59 and is in sliding connection with the supporting plate 59, a sliding groove 410 is formed at one side, close to the first connecting rod 49, of the clamping plate 411 penetrates through one end in the supporting plate 59 and is in sliding connection with the supporting plate 59, the highest position of the sliding groove 410 is close to the supporting groove along the sliding direction of the first connecting rod 49 and the supporting plate 59, the lowest point of the chute 410 is located away from the holding chute;
when the supporting plate 59 supporting the workpiece to be tested rotates until the arc surface of the fan-shaped plate 42 is in friction and interference with the rocker 43, and the supporting plate 59 is located at the testing position, one end of the first connecting rod 49 slidably connected with the sliding groove 410 moves to the maximum displacement in the direction close to the lowest point of the sliding groove 410, and the two clamping plates 411 move linearly in opposite directions until friction and interference with the workpiece to be tested are achieved, so that the workpiece to be tested is clamped and fixed.
In the above embodiment, as shown in fig. 1 to 3, by way of example, the indexing mechanism 5 further includes an intermittent driving assembly, an indexing frame 55 and a connecting plate 58, the intermittent driving assembly is mounted on the workbench 1, the intermittent driving assembly is in transmission connection with the indexing frame 55, one end of the indexing frame 55 away from the rotation axis of the indexing frame 55 is in rotation connection with the connecting plate 58, the connecting plate 58 is fixedly connected with the supporting plate 59, wherein, one side of the supporting plate 59 facing the workbench 1 is fixedly connected with the supporting protruding rod 9, and one end of the workbench 1 facing the supporting plate 59 is provided with the guide rail 10, and the supporting protruding rod 9 is in sliding connection with the guide rail 10;
as shown in fig. 3, the intermittent driving assembly includes a second motor 51, a first rotating disc 54, a limiting post 52, and a second rotating disc 56, where the second motor 51 is installed on the workbench 1, the output shaft of the second motor 51 is fixedly connected with the first rotating disc 54, the side end of the first rotating disc 54 is fixedly connected with the limiting post 52, the distance between the axis of the limiting post 52 and the axis of the first rotating disc 54 is greater than the radius of the first rotating disc 54, the second rotating disc 56 is provided with a limiting groove 57, the limiting post 52 is in sliding fit with the limiting groove 57, the second rotating disc 56 is fixedly connected with the main shaft 53, one end of the main shaft 53 close to the workbench 1 is rotationally connected with the workbench 1, and one end of the main shaft 53 far from the workbench 1 is fixedly connected with a rotating frame 55.
In the above embodiment, the workpiece to be tested is placed on the pallet 59 located at the loading position, and the pallet 59 located at the loading position is transferred to the testing position under the transmission of the indexing mechanism 5, so that the station conversion of the workpiece to be tested is realized, so that the workpiece to be tested is tested. Under the driving of the second motor 51, the first turntable 54 drives the limit post 52 to intermittently and periodically slidingly cooperate with the limit groove 57, so that when the limit post 52 is slidingly connected with the limit groove 57, the second turntable 56 rotates, and when the limit post 52 is intermittently arranged with the limit groove 57, the second turntable 56 stops rotating, so that the second turntable 56 drives the index rest 55 to periodically and intermittently rotate, and the index rest 55 drives the supporting plate 59 to periodically and intermittently rotate through the connecting plate 58, and the supporting plate 59 is ensured to be kept stable in the process of moving the supporting plate 59 from the loading position to the testing position under the sliding constraint of the supporting convex rod 9 and the guide rail 10 in the rotating process. With continued reference to fig. 2, 5 and 6, the supporting plate 59 located below the testing mechanism 3 is located at the testing position, and in the rotating direction of the supporting plate 59, in the process that the supporting plate 59 rotates from the loading position to the testing position, the fan-shaped disc 42 is in friction interference with the rocker 43, the rocker 43 rotates around the rotating axis position of the eccentric wheel 46 to compress the first spring 44, and meanwhile, the eccentric wheel 46 extrudes the extrusion plate 48, so that the extrusion plate 48 drives the clamping plate 411 to move to friction interference with the workpiece to be tested in the direction close to the workpiece to be tested through the first connecting rod 49, so that the workpiece to be tested is clamped and fixed, the workpiece to be tested is ensured to be fixed before impedance testing, offset dislocation of the workpiece to be tested cannot occur in the testing process, and the testing precision is improved.
In one embodiment, with continued reference to fig. 2 and 4, the apparatus of the present invention further includes a conveying mechanism 2 and a pushing mechanism 6, the conveying mechanism 2 is mounted on one side of the workbench 1, the conveying mechanism 2 is used for conveying the workpiece to be tested to the pushing position, the pushing mechanism 6 is mounted between the testing mechanism 3 and the conveying mechanism 2, and the pushing mechanism 6 is used for pushing the workpiece to be tested on the conveying mechanism 2 onto the supporting plate 59.
As shown in fig. 4, the conveying mechanism 2 includes a first motor 23, a conveying belt 21 and a side baffle 22, the conveying belt 21 is sleeved on a plurality of driving rollers (not shown in the figure), the side baffles 22 are respectively arranged at two axial ends of the driving rollers, the two axial ends of the driving rollers are respectively connected with the side baffles 22 in a rotating manner, the output end of the first motor 23 is fixedly connected with the input end of one driving roller, the driving rollers driven by the first motor 23 actively rotate, the driving rollers drive the conveying belt to rotate under the action of friction force, and the conveying belt further drives the other driving roller to rotate under the action of friction force, so that the conveying belt can continuously rotate to convey the workpiece to be tested, wherein the conveying belt can be a conveying belt.
As shown in fig. 2 and fig. 4, the pushing mechanism 6 includes a second connecting rod 62, a first rack 63, a first gear 64, a transmission shaft 65, a second gear 66, a second rack 68 and a pushing plate 69, one end of the second connecting rod 62 is fixedly connected with the telescopic rod 32, the other end of the second connecting rod 62 is fixedly connected with the first rack 63, a guide post 61 is fixedly connected to the side baffle 22, the first rack 63 penetrates through the guide post 61 and is slidably connected with the guide post 61, wherein the arrangement direction of the first rack 63 is parallel to the telescopic direction of the telescopic rod 32, the first rack 63 is meshed and transmitted with the first gear 64, the output end of the first gear 64 is fixedly connected with the transmission shaft 65, one end of the transmission shaft 65, which is far away from the first gear 64, is fixedly connected with the second gear 66, the second rack 68 is meshed and transmitted with the second rack 68, one end of the second rack 68, which is close to the supporting plate 59, is fixedly connected with the first rack 63, the side baffle 22 arranged at one side of the second rack 68 penetrates through the side baffle 22, which is far away from the workbench 1, and is slidably connected with the side baffle 22, wherein the second rack 68 is arranged along the direction of the first rack 68, and the upper side of the first rack 68 is correspondingly arranged along the direction of the first rack 64, and the upper side of the first rack 68 is arranged along the direction of the direction, which is upwards crossed;
when the test mechanism 3 performs test operation on a workpiece to be tested, namely, when the test probe 34 moves to the maximum displacement in the direction away from the hydraulic cylinder 31, the second connecting rod 62 moves synchronously with the telescopic rod 32, the second connecting rod 62 drives the first rack 63, the first rack 63 is meshed with the first gear 64, the first gear 64 is meshed with the second rack 68 through the transmission of the transmission shaft 65, the second gear 66 is meshed with the transmission of the second gear 68, finally, the pushing plate 69 passes through the groove 24 in the direction close to the workbench 1 and moves to the maximum displacement, and the pushing plate 69 is used for pushing the workpiece to be tested on the conveying belt 21 at the pushing position onto the supporting plate 59 at the feeding position, wherein, as shown in fig. 4, the pushing plate 69 is provided with a baffle plate in the conveying direction along the conveying belt 21, the workpiece to be tested is intercepted by the pushing plate 69, and further conveying of the workpiece to be tested can be effectively blocked. The impedance testing device in the embodiment can realize synchronous feeding operation and testing operation, and greatly improves the working efficiency.
As shown in fig. 1 and 2, the impedance testing apparatus further includes a collecting box 7, the collecting box 7 is disposed on one side of the table 1, wherein an end surface of the table 1 facing the pallet 59 includes a flat surface and a concave surface, and the concave surface of the table 1 is disposed at a position where the table 1 is close to the collecting box 7, as shown in a schematic structure between the positions of broken lines in fig. 1 and 2;
when the supporting plate 59 moves from the loading position to the testing position, the supporting convex rod 9 is in sliding connection with the guide rail 10 on the plane position of the workbench 1;
when the supporting convex rod 9 slides from the guide rail 10 at the plane position of the workbench 1 to the guide rail 10 at the concave position of the workbench 1, the connecting plate 58 rotates to the discharging position around the axis line position of the connecting plate 58 rotationally connected with the rotating frame 55 towards the direction close to the workbench 1 under the action of the gravity of the supporting plate 59 and the components mounted on the supporting plate 59, so that the supporting groove of the supporting plate 59 rotating to the discharging position inclines, the tested workpiece slides into the collecting box 7, and the collecting box 7 is used for collecting the tested workpiece supported on the supporting plate 59.
In other embodiments, the collection box 7 may be replaced with a transport assembly, as the working environment requires, to allow the tested workpiece to slide down onto the transport assembly for further transport to the next process site. And are not limited herein.
The invention also provides an impedance testing method, which is applied to the impedance testing device.
In one case of the present embodiment, the impedance testing method includes the steps of:
step one: placing the workpiece to be tested on the pallet 59 at the loading position with the workpiece to be tested between the two clamping plates 411;
step two: the indexing mechanism 5 conveys the workpiece to be tested to a testing position from a loading position, the fan-shaped disc 42 is in friction and interference with the rocker 43, and when the rocker 43 rotates to a maximum angle around the rotation axis of the eccentric wheel 46, the two clamping plates 411 move in opposite directions until the clamping plates 411 contact with the workpiece to be tested, so that the clamping and fixing of the workpiece to be tested are realized;
step three: starting a testing mechanism 3 to perform impedance testing on the workpiece to be tested positioned at the testing position;
step four: the indexing mechanism 5 continues to drive, the tested workpiece is moved out of the testing position, the fan-shaped disc 42 and the rocker 43 are arranged at intervals, the clamping plate 411 reversely moves to the initial position, so that the clamping and fixing of the tested workpiece are relieved, and the impedance test of the workpiece to be tested is completed.
Working principle: according to the impedance testing device provided by the invention, a plurality of workpieces to be tested are placed on a conveying belt 21 through the arrangement of a conveying mechanism 2, a pushing mechanism 6, an indexing mechanism 5, a clamping mechanism 4 and a testing mechanism 3, the workpieces to be tested such as a PCB circuit board are conveyed to a pushing position through the conveying mechanism 2, firstly, a supporting plate 59 supporting the workpieces to be tested is subjected to indexing conveying from the feeding position to the testing position through the indexing mechanism 5, the indexing frame 55 is subjected to intermittent periodic rotation through the transmission of an intermittent driving assembly, the indexing frame 55 drives the supporting plate 59 to rotate through a connecting plate 58, the supporting convex rod 9 fixedly connected with the supporting plate 59 is in sliding connection with a guide rail 10 on a plane of a workbench 1 in the process of indexing the supporting plate 59 from the feeding position to the testing position, the stable rotation of the supporting plate 59 is ensured, the radius size of a fan-shaped disc 42 is gradually increased along the rotation direction of the supporting plate 59, the fan-shaped disc 43 is gradually pressed by the fan-shaped disc 42 and rotates around the rotation axis line of the fan-shaped disc 46 in the direction of the eccentric wheel 59, the eccentric wheel 46 is made to move towards the direction close to the eccentric wheel 59, the eccentric disc 46 is pressed by the fan-shaped disc 42, and the eccentric disc is further pressed towards the first connecting rod 48, the eccentric disc is pressed towards the eccentric disc to the rotating direction of the testing disc to be positioned towards the testing eccentric wheel, the side of the workpiece to be tested is not in the direction, and the stable rotation is prevented from being displaced towards the testing position, and the testing precision is further kept towards the connecting rod to be positioned against the eccentric plate to be positioned;
then, the testing mechanism 3 is started, the telescopic rod 32 is driven by the hydraulic cylinder 31, the telescopic rod drives the mounting seat 33 to move towards the direction close to the workpiece to be tested positioned below the testing mechanism 3, and the test probe 34 mounted on the mounting seat 33 is in friction and interference with a test contact point on the workpiece to be tested, so that the test of the workpiece to be tested is realized;
in addition, in the process that the test probe 34 moves towards the direction close to the workpiece to be tested, the second connecting rod 62 moves downwards along with the telescopic rod 32 synchronously, the second connecting rod 62 drives the first rack 63 to be meshed with the first gear 64 for transmission, and the second gear 66 is meshed with the second rack 68 for transmission through the transmission of the transmission shaft 65, so that the pushing plate 69 pushes the blocked workpiece to be tested positioned at the pushing position, the workpiece to be tested is pushed onto the supporting plate 59 positioned at the feeding position to finish feeding, and the feeding work and the testing work are synchronously carried out, so that the working efficiency is greatly improved;
in addition, under the transmission of the indexing mechanism 5, the indexing frame 55 continues to intermittently and periodically rotate, so that the supporting plate 59 supporting the tested workpiece rotates to a discharging position along with the indexing frame 55 through the connecting plate 58, in the process that the supporting plate 59 supporting the tested workpiece rotates to the discharging position from the testing position, the fan-shaped disc 42 and the rocker 43 are arranged at intervals, the rocker 43 is restored to the initial position of the rocker 43 under the reset action of the first spring 44, the two clamping plates 411 slide towards the direction far away from the workpiece under the reset action of the second spring 412 until the clamping fixation of the workpiece is released, the supporting protruding rod 9 slides into the guide rail 10 at the concave position of the workbench 1 from the guide rail 10 at the plane position of the workbench 1, at this time, the supporting groove of the supporting plate 59 positioned at the discharging position inclines, the tested workpiece slides into the collecting box 7, so that the automatic collection of the tested workpiece is realized, the labor cost is reduced, each supporting plate 59 sequentially passes through the feeding position, the testing position and the discharging position, the work procedure is guaranteed, the continuity of the device is improved, and the work efficiency is guaranteed.
The above description is only a preferred embodiment of the present invention, and the protection scope of the present invention is not limited to the above examples, and all technical solutions belonging to the concept of the present invention belong to the protection scope of the present invention. It should be noted that modifications and adaptations to the present invention may occur to one skilled in the art without departing from the principles of the present invention and are intended to be within the scope of the present invention.
Claims (10)
1. An impedance testing apparatus for impedance testing a workpiece to be tested, comprising:
the workbench (1), the side end of the workbench (1) is fixedly connected with a cantilever (8);
the testing mechanism (3) is arranged on the cantilever (8), and the testing mechanism (3) is used for testing a workpiece to be tested;
the indexing mechanism (5) is arranged on the workbench (1), the indexing mechanism (5) comprises a supporting plate (59), a material supporting groove is formed in one end, close to the edge position of the workbench (1), of the supporting plate (59), the material supporting groove is used for placing a workpiece to be tested, and the indexing mechanism (5) is used for conveying the supporting plate (59) from a feeding position to a testing position;
the clamping mechanism (4), the clamping mechanism (4) comprises a fan-shaped disc (42), a wane (43), a first spring (44), an eccentric wheel (46), an extrusion plate (48) and a clamping assembly, fixedly connected with stand column (41) on the cantilever (8), one end of the stand column (41) away from the cantilever (8) is fixedly connected with the fan-shaped disc (42), wherein, in the rotation direction of the support plate (59), the radial dimension of the position of the fan-shaped disc (42) close to the testing mechanism (3) is larger than the radial dimension of the fan-shaped disc (42) away from the testing mechanism (3), in the rotation direction of the support plate (59), the radial dimension of the fan-shaped disc (42) is gradually increased, the eccentric wheel (46) is rotationally connected with a bracket (47), the bracket (47) is fixedly connected with the support plate (59), one side end of the eccentric wheel (46) is fixedly connected with the wane (43), one side of the wane (43) away from the support plate (59) is in friction fit with the circular arc surface of the fan-shaped disc (42), one side of the wane (43) facing to one side of the support plate (59) is fixedly connected with the first spring (44), one end of the first spring (45) is fixedly connected with the support plate (45), the eccentric wheel (46) is characterized in that two groups of clamping assemblies are arranged on the extruding plate (48) in a friction manner, the two groups of clamping assemblies are symmetrically arranged on the supporting plate (59), each clamping assembly comprises a first connecting rod (49), a second spring (412) and a clamping plate (411), one end of each first connecting rod (49) is fixedly connected to the extruding plate (48), the other end of each first connecting rod (49) penetrates through the supporting plate (59) and is in sliding connection with the supporting plate (59), a sliding groove (410) is formed in one side, close to the first connecting rod (49), of each clamping plate (411), one end, penetrating through the supporting plate (59), of each first connecting rod (49) is in sliding connection with the corresponding supporting plate (59), the highest point of each sliding groove (410) is arranged close to the corresponding supporting groove along the sliding direction of the corresponding first connecting rod (49) and the supporting plate (59), and the lowest point of each sliding groove (410) is arranged far away from the corresponding supporting groove;
when the supporting plate (59) supporting the workpiece to be tested rotates to the point that the arc surface of the fan-shaped disc (42) is in friction and interference with the rocker (43), and the supporting plate (59) is located at the test position, one end of the first connecting rod (49) in sliding connection with the sliding groove (410) moves to the maximum displacement in the direction close to the lowest point of the sliding groove (410), and the two clamping plates (411) move to be in opposite directions and linearly in friction and interference with the workpiece to be tested, so that the workpiece to be tested is clamped and fixed.
2. An impedance testing device according to claim 1, wherein the indexing mechanism (5) further comprises an intermittent driving assembly, an indexing frame (55) and a connecting plate (58), the intermittent driving assembly is arranged on the workbench (1), the indexing frame (55) is connected with the intermittent driving assembly in a transmission mode, one end, away from a rotation axis of the indexing frame (55), of the indexing frame (55) is rotatably connected with the connecting plate (58), the connecting plate (58) is fixedly connected with the supporting plate (59), one side, facing the workbench (1), of the supporting plate (59) is fixedly connected with a supporting protruding rod (9), one end, facing the supporting plate (59), of the workbench (1) is provided with a guide rail (10), and the supporting protruding rod (9) is in sliding connection with the guide rail (10).
3. The impedance testing device according to claim 2, wherein the intermittent driving assembly comprises a second motor (51), a first rotating disc (54), a limiting column (52) and a second rotating disc (56), the second motor (51) is installed on the workbench (1), the first rotating disc (54) is fixedly connected to an output shaft of the second motor (51), the limiting column (52) is fixedly connected to a side end of the first rotating disc (54), the distance between the axial line of the limiting column (52) and the axial line of the first rotating disc (54) is larger than the radius of the first rotating disc (54), a limiting groove (57) is formed in the second rotating disc (56), the limiting column (52) is in sliding fit with the limiting groove (57), the second rotating disc (56) is fixedly connected to the main shaft (53), one end, close to the workbench (1), of the main shaft (53) is rotatably connected to the workbench (1), and one end, far away from the workbench (1), of the main shaft (53) is fixedly connected with a rotating frame (55).
4. An impedance testing device according to claim 1, characterized in that the testing mechanism (3) comprises a hydraulic cylinder (31), a telescopic rod (32), a mounting seat (33) and a testing probe (34), the hydraulic cylinder (31) is fixedly mounted on the cantilever (8), the telescopic rod (32) is fixedly connected with the output end of the hydraulic cylinder (31), one end, far away from the hydraulic cylinder (31), of the telescopic rod (32) is fixedly connected with the mounting seat (33), and the testing probe (34) is fixedly mounted on one side, facing the workbench (1), of the mounting seat (33).
5. The impedance testing device of claim 4, further comprising:
the conveying mechanism (2) is arranged on one side, close to the feeding position, of the workbench (1), and the conveying mechanism (2) is used for conveying the workpiece to be tested to the pushing position;
the pushing mechanism (6), pushing mechanism (6) is installed between testing mechanism (3) and conveying mechanism (2), pushing mechanism (6) are used for being used for carrying the work piece to be tested on conveying mechanism (2) to on layer board (59).
6. The impedance testing device according to claim 5, wherein the conveying mechanism (2) comprises a first motor (23), a conveying belt (21) and side baffles (22), the conveying belt (21) is sleeved on a plurality of driving rollers, the side baffles (22) are respectively arranged at two axial ends of the driving rollers, the two axial ends of the driving rollers are respectively and rotatably connected with the side baffles (22), and the output end of the first motor (23) is fixedly connected with the input end of one driving roller.
7. The impedance testing device according to claim 6, wherein the pushing mechanism (6) comprises a second connecting rod (62), a first rack (63), a first gear (64), a transmission shaft (65), a second gear (66), a second rack (68) and a pushing plate (69), one end of the second connecting rod (62) is fixedly connected with the telescopic rod (32), the other end of the second connecting rod (62) is fixedly connected with the first rack (63), the side baffle plate (22) is fixedly connected with a guide post (61), the first rack (63) penetrates through the guide post (61) and is in sliding connection with the guide post (61), the first rack (63) is arranged in a direction parallel to the telescopic direction of the telescopic rod (32), the first rack (63) is meshed with the first gear (64), the output end of the first gear (64) is fixedly connected with the transmission shaft (65), one end, far away from the first gear (64), of the transmission shaft (65) is fixedly connected with the second gear (66), the second gear (66) is meshed with the second rack (68), the second rack (68) is connected with the pushing plate (68) near the first rack (59), the guide rod (67) penetrates through a side baffle plate (22) arranged at one side far away from the workbench (1) and is in sliding connection with the side baffle plate (22), wherein the arrangement direction of the second rack (68) is intersected with the arrangement direction of the first rack (63), and a groove (24) is formed in the position, corresponding to the pushing plate (69), on the side baffle plate (22) along the arrangement direction of the second rack (68);
when the test probe (34) moves to the maximum displacement in the direction away from the hydraulic cylinder (31), the pushing plate (69) passes through the groove (24) in the direction close to the workbench (1) and moves to the maximum displacement, and the pushing plate (69) is used for pushing the workpiece to be tested, which is positioned at the pushing position, on the conveyor belt (21) onto the supporting plate (59) positioned at the loading position.
8. An impedance testing device according to claim 2, characterized in that the impedance testing device further comprises a collecting tank (7), the collecting tank (7) being arranged on one side of the table (1), wherein the end surface of the table (1) facing the pallet (59) comprises a plane and a concave surface, the concave surface of the table (1) being arranged at a position of the table (1) close to the collecting tank (7);
when the supporting convex rod (9) slides from the guide rail (10) at the plane position of the workbench (1) to the guide rail (10) at the concave position of the workbench (1), the connecting plate (58) rotates to the discharging position along the direction approaching the workbench (1) around the axial lead position of the rotating connection of the connecting plate (58) and the rotating frame (55), and the collecting box (7) is used for collecting the tested workpieces supported on the supporting plate (59) and subjected to test.
9. An impedance testing method, characterized in that the impedance testing method is applied to an impedance testing apparatus according to any one of claims 1-8.
10. An impedance testing method according to claim 9, characterized in that the impedance testing method comprises the steps of:
step one: placing a workpiece to be tested on a supporting plate (59) positioned at a feeding position, wherein the workpiece to be tested is positioned between two clamping plates (411);
step two: the indexing mechanism (5) conveys a workpiece to be tested to a testing position from a loading position, the fan-shaped disc (42) is in friction and interference with the rocker (43), and when the rocker (43) rotates to a maximum angle around the rotating axis of the eccentric wheel (46), the two clamping plates (411) move in opposite directions until the clamping plates (411) are in contact with the workpiece to be tested, so that the workpiece to be tested is clamped and fixed;
step three: starting a testing mechanism (3) to perform impedance test on the workpiece to be tested positioned at the testing position;
step four: the indexing mechanism (5) continues to drive, the tested workpiece is moved out of the testing position, the fan-shaped disc (42) and the rocker (43) are arranged at intervals, the clamping plate (411) reversely moves to the initial position, so that the clamping and fixing of the tested workpiece are relieved, and the impedance test of the workpiece to be tested is completed.
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