CN117007871A - System and method for testing intrinsic radiation characteristics of antenna to be tested - Google Patents
System and method for testing intrinsic radiation characteristics of antenna to be tested Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
Abstract
The invention provides a system and a method for testing the intrinsic radiation characteristics of an antenna to be tested, wherein the system comprises a probe; the antenna to be measured is self-radiated and de-embedded through the probe to obtain the intrinsic radiation characteristic of the antenna to be measured; or the antenna to be measured obtains the intrinsic radiation characteristic of the antenna to be measured through the radiation calibration of the probe. The invention can effectively separate the self-radiation of the radio frequency probe from the intrinsic radiation of the antenna to be tested, is favorable for accurately acquiring the self-radiation characteristic of the radio frequency probe, and improves the accuracy of the test of the intrinsic radiation characteristic of the antenna to be tested.
Description
Technical Field
The invention relates to the technical field of antenna testing, in particular to a system and a method for testing the intrinsic radiation characteristics of an antenna to be tested. In particular, it relates to an accurate calibration method for the intrinsic radiation characteristics of an antenna to be measured and a radiation calibration kit.
Background
Since the 1990 s, the advent of highly integrated wireless systems has greatly driven the development of industries such as wireless communication, detection, imaging, sensing, etc. Antennas are also becoming increasingly important components of the wireless systems, and packaging antennas (all called Antenna-in-Package, aiP for short) based on packaging materials and processes, on-Chip antennas (all called Antenna-on-Chip, aoC for short) based on semiconductor materials and processes, on-screen antennas (all called Antenna-on-Display, aoD for short) based on transparent materials and processes, and the like are sequentially presented. The antennas have some integrated characteristics, and the integrated antennas will be mainstream antennas in the mobile world of 5G and future 5G. The mobile phone is embedded in your mobile phone, and provides brand new and unusual high-quality user experience for you; the automobile can be installed on a car driven by you, so that safe, stable and smooth driving and navigation are guaranteed; and the method can be used in everything and industrial Internet to improve the productivity. However, the advent of integrated antennas has also presented significant challenges for testing in the development and production stages.
Probes are the primary feed solution for conducting tests on integrated antennas. Probes are known to be developed for testing integrated circuits. The test of the circuit does not involve radiation, so that the open probe can test the circuit characteristics (especially the impedance characteristic parameters of the circuit) more accurately though the circuit is de-embedded (calibrated). However, the antenna to be tested is required to test the radiation characteristics. The open probe itself radiates and thus affects the radiation testing of the antenna to be tested. The smaller the radiation of the probe itself should be, the better when the antenna radiation is tested with the probe feed. Or the probe may be regarded as an antenna, the smaller the antenna gain should be. Thus, when selecting the probe used, it is necessary to calibrate the radiation characteristic of the probe as an antenna.
There is no standardized set of solutions for calibrating the self-radiation characteristics of probes in the industry. If the conventional impedance standard substrate (Impedance Standard Substrate is simply called ISS in english) for performing circuit de-embedding matching on the probe is directly utilized, the radiation de-embedding and the radiation characteristic calibration on the probe are inaccurate. The conventional impedance standard substrate has integrated therein a plurality of groups of Short circuits (s=short), open circuits (o=open), vias (t=through), and matching loads (l=load). Because each set of calibration circuits is located at a different location on the substrate, when probes are mounted on circuits that are identical in circuit properties but are located at different locations, different self-emissions are produced, with the result that the calibrated probe radiation characteristics will be different.
Besides, besides self-radiation of the probe, the shell of the probe and numerous other testing devices in the testing environment can generate electromagnetic interference effects such as reflection/scattering/diffraction on the intrinsic radiation of the antenna to be tested, which can bring great challenges to accurate testing of the radiation characteristics of the antenna to be tested, and the industry has not progressed on how to obtain the accurate intrinsic radiation characteristics of the antenna to be tested.
Chinese patent publication No. CN110741264a discloses a method and system for testing an antenna comprising a plurality of radiating elements, wherein an array of one or more probes is placed in front of the antenna to be tested, and wherein the following steps are performed: the RF signals transmitted by the antenna under test or the array of one or more probes are acquired by the array of one or more probes or by the radiating elements of the antenna under test, the transmitted signals are back-propagation reconstructed by computing the signals received by the individual probes of the array of one or more probes or the radiating elements of the antenna under test, and the signals so reconstructed or parameters thereof are tested to detect potential defects of the antenna.
Aiming at the related technology, the inventor considers that the method is easy to generate electromagnetic interference effect on the intrinsic radiation of the antenna to be tested, and the accuracy of the radiation characteristic test of the antenna to be tested is lower.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide a system and a method for testing the intrinsic radiation characteristics of an antenna to be tested.
The invention provides a test system for the intrinsic radiation characteristics of an antenna to be tested, which comprises a probe;
the antenna to be measured is self-radiated and de-embedded through the probe to obtain the intrinsic radiation characteristic of the antenna to be measured;
or,
and the antenna to be measured obtains the intrinsic radiation characteristic of the antenna to be measured through the radiation calibration of the probe.
Preferably, the system further comprises a negative radiation antenna to be measured;
the negative-phase radiation antenna to be measured is an auxiliary antenna which enables the radiation field of the antenna to be measured to realize radiation phase reversal;
feeding the antenna to be tested by the probe to obtain radiation characteristic data of the antenna to be tested;
the probe feeds the negative radiation antenna to be measured to obtain radiation characteristic data of the negative radiation antenna to be measured;
and dividing the subtraction operation of the radiation characteristic data of the antenna to be detected and the radiation characteristic data of the negative radiation antenna to be detected by two to obtain the intrinsic radiation characteristic of the antenna to be detected.
Preferably, the system further comprises a radiation standard kit comprising a radiation standard antenna and a negative radiation standard antenna;
the radiation standard antenna is an antenna which is matched with the probe in impedance;
The negative-phase radiation standard antenna is an auxiliary antenna which enables a radiation field of the radiation standard antenna to realize radiation phase reversal;
the probe feeds the radiation standard antenna to obtain radiation characteristic data of the radiation standard antenna;
the probe feeds the negative radiation standard antenna to obtain radiation characteristic data of the negative radiation standard antenna;
the radiation characteristic data of the radiation standard antenna and the radiation characteristic data of the negative radiation standard antenna are divided by two after being added, so that the self-radiation characteristic of the probe is obtained;
feeding the antenna to be tested by the probe to obtain radiation characteristic data of the antenna to be tested;
and the radiation characteristic data of the detection antenna eliminates the self-radiation characteristic of the probe to obtain the intrinsic radiation characteristic of the antenna to be detected.
Preferably, the system further comprises an impedance calibration kit;
the probe feeds the matched load element of the impedance calibration kit to obtain the self-radiation characteristic of the probe;
feeding the antenna to be tested by the probe to obtain radiation characteristic data of the antenna to be tested;
and the radiation characteristic data of the detection antenna eliminates the self-radiation characteristic of the probe to obtain the intrinsic radiation characteristic of the antenna to be detected.
Preferably, the radiator on the antenna to be measured and the radiator on the antenna to be measured irradiated by the negative phase can rotate.
Preferably, the radiator on the radiation standard antenna and the radiator on the negative phase radiation standard antenna can rotate.
According to the method for testing the intrinsic radiation characteristics of the antenna to be tested, provided by the invention, a system for testing the intrinsic radiation characteristics of the antenna to be tested is applied, and the method comprises the following steps:
a first acquisition step of intrinsic radiation characteristics: the antenna to be measured is self-radiated and de-embedded through the probe to obtain the intrinsic radiation characteristic of the antenna to be measured;
or,
a second acquisition step of intrinsic radiation characteristics: and the antenna to be measured obtains the intrinsic radiation characteristic of the antenna to be measured through the radiation calibration of the probe.
Preferably, the first acquisition step of the intrinsic radiation characteristic includes the steps of:
the method comprises the following steps of obtaining antenna data to be tested: feeding the antenna to be tested by the probe to obtain radiation characteristic data of the antenna to be tested;
the data acquisition step of the antenna to be measured of negative radiation: the probe feeds the negative radiation antenna to be measured to obtain radiation characteristic data of the negative radiation antenna to be measured;
a first calculation step of intrinsic radiation characteristics: and dividing the subtraction operation of the radiation characteristic data of the antenna to be detected and the radiation characteristic data of the negative radiation antenna to be detected by two to obtain the intrinsic radiation characteristic of the antenna to be detected.
Preferably, the second acquisition step of the intrinsic radiation characteristic includes the steps of:
A radiation standard antenna data acquisition step: the probe feeds the radiation standard antenna to obtain radiation characteristic data of the radiation standard antenna;
negative radiation standard antenna data acquisition: the probe feeds the negative radiation standard antenna to obtain radiation characteristic data of the negative radiation standard antenna;
a first acquisition step of self-radiation characteristics: the radiation characteristic data of the radiation standard antenna and the radiation characteristic data of the negative radiation standard antenna are divided by two after being added, so that the self-radiation characteristic of the probe is obtained;
the method comprises the following steps of obtaining antenna data to be tested: feeding the antenna to be tested by the probe to obtain radiation characteristic data of the antenna to be tested;
a second calculation step of the intrinsic radiation characteristics: and the radiation characteristic data of the detection antenna eliminates the self-radiation characteristic of the probe to obtain the intrinsic radiation characteristic of the antenna to be detected.
Preferably, the second acquisition step of the intrinsic radiation characteristic includes the steps of:
a second acquisition step of self-radiation characteristics: the probe feeds the matched load element of the impedance calibration kit to obtain the self-radiation characteristic of the probe;
the method comprises the following steps of obtaining antenna data to be tested: feeding the antenna to be tested by the probe to obtain radiation characteristic data of the antenna to be tested;
a second calculation step of the intrinsic radiation characteristics: and the radiation characteristic data of the detection antenna eliminates the self-radiation characteristic of the probe to obtain the intrinsic radiation characteristic of the antenna to be detected.
Compared with the prior art, the invention has the following beneficial effects:
1. the invention optimizes the probe impedance calibration, and provides a brand new probe radiation de-embedding method, a radiation calibration method and a calibration kit based on the radiation field idea besides the traditional calibration de-embedding idea based on the road, which are beneficial to improving the accuracy of the radiation characteristic test of the antenna to be tested;
2. the invention provides the design method of the auxiliary antenna and the auxiliary radiation standard suite matched with the probe radiation influence removal method, and the method is simple and convenient and easy to realize, and can well realize the established effect;
3. the invention improves the traditional method for calibrating the probe radiation by using the impedance calibration substrate, fills the technical loopholes, perfects and advances the antenna test industry.
Drawings
Other features, objects and advantages of the present invention will become more apparent upon reading of the detailed description of non-limiting embodiments, given with reference to the accompanying drawings in which:
fig. 1 is a conceptual diagram of a short circuit according to an embodiment of the present invention;
FIG. 2 is a conceptual diagram of an open circuit according to an embodiment of the present invention;
FIG. 3 is a conceptual diagram of a via according to an embodiment of the invention;
fig. 4 is a conceptual diagram of a matching load circuit according to an embodiment of the present invention;
Fig. 5 is a conceptual diagram of an antenna to be tested (as a radiation standard antenna in a radiation calibration method) according to an embodiment of the present invention;
fig. 6 is a conceptual diagram of a negative phase antenna to be measured (as a negative phase radiation standard antenna in the radiation calibration method) according to an embodiment of the present invention;
fig. 7 is a conceptual diagram of an antenna to be tested of a rotating radiator according to an embodiment of the present invention;
fig. 8 is a conceptual diagram of a negative phase antenna to be tested of a rotating radiator according to an embodiment of the present invention;
FIG. 9 is an E-plane co-polarization pattern of a radiating standard antenna and a negative radiating standard antenna without a probe according to the present invention;
FIG. 10 is a cross polarization pattern of the E-plane of a radiating standard antenna and a negative radiating standard antenna without a probe according to the present invention;
FIG. 11 is an H-plane co-polarization pattern of a radiating standard antenna and a negative radiating standard antenna without a probe according to the present invention;
FIG. 12 is a cross polarization pattern of the H-plane of a radiating standard antenna and a negative radiating standard antenna without a probe according to the present invention;
FIG. 13 is a graph of E-plane co-polarized radiation characteristics for a radiation standard antenna and a negative radiation standard antenna with a probe according to the present invention;
FIG. 14 is a graph of the cross polarization direction of the E-plane of the radiation standard antenna and the negative radiation standard antenna and the cross polarization radiation characteristic calibration value of the E-plane of the probe when the probe is provided;
FIG. 15 is a graph of the H-plane co-polarized radiation characteristics of a radiation standard antenna and a negative radiation standard antenna with a probe according to the present invention;
FIG. 16 is a plot of radiation characteristics of cross polarization of the H-plane of the radiation standard antenna and the negative radiation standard antenna with a probe according to the present invention;
FIG. 17 is an E-plane co-polarization pattern of an antenna to be tested after probe influence is removed by a probe radiation de-embedding method according to the present invention;
FIG. 18 is a cross polarization pattern of the E-plane of the antenna under test after probe influence is removed by the probe radiation de-embedding method of the present invention;
FIG. 19 is a H-plane co-polarization pattern of the antenna under test after probe influence is removed by the probe radiation de-embedding method of the present invention;
FIG. 20 is a cross polarization pattern of the H-plane of the antenna under test after probe influence is removed by the probe radiation de-embedding method of the present invention.
Detailed Description
The present invention will be described in detail with reference to specific examples. The following examples will assist those skilled in the art in further understanding the present invention, but are not intended to limit the invention in any way. It should be noted that variations and modifications could be made by those skilled in the art without departing from the inventive concept. These are all within the scope of the present invention.
The embodiment of the invention discloses a system for testing the intrinsic radiation characteristics of an antenna to be tested, which comprises a probe as shown in fig. 5 and 6; the antenna to be measured is self-radiated and de-embedded through the probe to obtain the intrinsic radiation characteristic of the antenna to be measured. Or the antenna to be measured obtains the intrinsic radiation characteristic of the antenna to be measured through the radiation calibration of the probe.
The condition that the antenna to be measured obtains the intrinsic radiation characteristic of the antenna to be measured through probe self-radiation de-embedding: the system also comprises an antenna to be measured by negative radiation; the negative phase radiation antenna to be measured is an auxiliary antenna which enables the radiation field of the antenna to be measured to realize radiation phase reversal; feeding the antenna to be tested by the probe to obtain radiation characteristic data of the antenna to be tested; the probe feeds the negative radiation antenna to be measured to obtain radiation characteristic data of the negative radiation antenna to be measured; and dividing the subtraction operation of the radiation characteristic data of the antenna to be detected and the radiation characteristic data of the negative radiation antenna to be detected by two to obtain the intrinsic radiation characteristic of the antenna to be detected. As shown in fig. 7, the radiator on the antenna to be measured and the radiator on the antenna to be measured radiating in the negative phase can rotate.
The antenna to be measured obtains the first condition of the intrinsic radiation characteristic of the antenna to be measured through probe radiation calibration: the system also includes a radiation standard kit including a radiation standard antenna and a negative radiation standard antenna; the radiation standard antenna is an antenna which is matched with the probe in impedance; the negative-phase radiation standard antenna is an auxiliary antenna which enables the radiation field of the radiation standard antenna to realize radiation phase reversal; the probe feeds the radiation standard antenna to obtain radiation characteristic data of the radiation standard antenna; the probe feeds the negative radiation standard antenna to obtain radiation characteristic data of the negative radiation standard antenna; the radiation characteristic data of the radiation standard antenna and the radiation characteristic data of the negative radiation standard antenna are divided by two after being added, so that the self-radiation characteristic of the probe is obtained; feeding the antenna to be tested by the probe to obtain radiation characteristic data of the antenna to be tested; and the radiation characteristic data of the detection antenna eliminates the self-radiation characteristic of the probe to obtain the intrinsic radiation characteristic of the antenna to be detected. As shown in fig. 8, the radiator on the radiation standard antenna and the radiator on the negative phase radiation standard antenna can rotate.
The antenna to be measured obtains the second condition of the intrinsic radiation characteristic of the antenna to be measured through probe radiation calibration: the system also includes an impedance calibration kit. The probe feeds a matched load element (matched load circuit) of the impedance calibration kit to obtain the self-radiation characteristic of the probe; feeding the antenna to be tested by the probe to obtain radiation characteristic data of the antenna to be tested; and the radiation characteristic data of the detection antenna eliminates the self-radiation characteristic of the probe to obtain the intrinsic radiation characteristic of the antenna to be detected.
The embodiment of the invention also discloses a method for testing the intrinsic radiation characteristics of the antenna to be tested, as shown in fig. 5 and 6, a system for testing the intrinsic radiation characteristics of the antenna to be tested is applied, and the method comprises the following steps: a first acquisition step of intrinsic radiation characteristics: the antenna to be measured is self-radiated and de-embedded through the probe to obtain the intrinsic radiation characteristic of the antenna to be measured. Alternatively, the intrinsic radiation characteristic second acquisition step: and the antenna to be measured obtains the intrinsic radiation characteristic of the antenna to be measured through the radiation calibration of the probe.
The first acquisition step of the intrinsic radiation characteristic comprises the steps of: the method comprises the following steps of obtaining antenna data to be tested: and feeding the antenna to be tested by the probe to obtain radiation characteristic data of the antenna to be tested.
The data acquisition step of the antenna to be measured of negative radiation: and feeding the negative radiation antenna to be measured by the probe to obtain radiation characteristic data of the negative radiation antenna to be measured.
A first calculation step of intrinsic radiation characteristics: and dividing the subtraction operation of the radiation characteristic data of the antenna to be detected and the radiation characteristic data of the negative radiation antenna to be detected by two to obtain the intrinsic radiation characteristic of the antenna to be detected.
The second acquisition step of the intrinsic radiation characteristic includes the following steps (case one): a radiation standard antenna data acquisition step: and feeding the radiation standard antenna by the probe to obtain radiation characteristic data of the radiation standard antenna.
Negative radiation standard antenna data acquisition: and feeding the negative radiation standard antenna by the probe to obtain radiation characteristic data of the negative radiation standard antenna.
A first acquisition step of self-radiation characteristics: and dividing the radiation characteristic data of the radiation standard antenna and the radiation characteristic data of the negative radiation standard antenna by two after carrying out addition operation to obtain the self-radiation characteristic of the probe.
The method comprises the following steps of obtaining antenna data to be tested: and feeding the antenna to be tested by the probe to obtain radiation characteristic data of the antenna to be tested.
A second calculation step of the intrinsic radiation characteristics: and the radiation characteristic data of the detection antenna eliminates the self-radiation characteristic of the probe to obtain the intrinsic radiation characteristic of the antenna to be detected.
The second acquisition step of the intrinsic radiation characteristic includes the following steps (case two): a second acquisition step of self-radiation characteristics: the probe feeds the matching load element of the impedance calibration kit, resulting in the self-radiating characteristics of the probe.
The method comprises the following steps of obtaining antenna data to be tested: and feeding the antenna to be tested by the probe to obtain radiation characteristic data of the antenna to be tested.
A second calculation step of the intrinsic radiation characteristics: and the radiation characteristic data of the detection antenna eliminates the self-radiation characteristic of the probe to obtain the intrinsic radiation characteristic of the antenna to be detected.
The embodiment of the invention also discloses an accurate calibration method and a radiation calibration kit for the intrinsic radiation characteristics of the antenna to be tested, and as shown in fig. 5 and 6, the method and the kit are a data processing method and a radiation calibration kit for the radiation characteristics.
The data processing method of the radiation characteristics comprises the following two operation modes: principle of data subtraction (data subtraction operation): the first object may be achieved by dividing the first set of radiation characteristic data by 2 after a subtraction operation.
The first set of radiation characteristic data refers to radiation characteristic data of the antenna to be measured fed by the probe and radiated by negative phase. The first target refers to the intrinsic radiation characteristic of the antenna to be measured after the antenna to be measured fed by the probe is determined and the probe is removed from the self-radiation.
The design principle of the negative-phase radiation antenna to be tested is that an auxiliary antenna which uses a certain means to enable the radiation field of the antenna to be tested to realize phase reversal, for example, a typical microstrip patch antenna working at 28GHz is considered as shown in fig. 5, a corresponding negative-phase radiation antenna to be tested is considered as shown in fig. 6, and through reasonable design, a phase difference of about 180 degrees exists only between a feed port and a transmission line between a radiation unit, so that after the probe feeds the group of antennas, if the probe tip is regarded as a phase reference point of the transmission line, the two antennas to be tested can present radiation far fields with the same amplitude and opposite phases in far fields. Therefore, the radiation of the probe is constant, the radiation of the antenna to be tested and the radiation of the antenna to be tested of negative phase radiation are in opposite phase, subtraction operation is carried out on the two radiation characteristic data obtained by testing, the radiation of the probe is directly counteracted, the rest is the twice magnitude of the intrinsic radiation of the antenna to be tested, and the radiation characteristic of the antenna to be tested after the self radiation of the probe is removed can be obtained after dividing by 2. This way of achieving the first objective by pure data post-processing is called probe radiation de-embedding method. The complete process is called probe self-radiation deblock.
Principle of data addition (data addition operation): the second object can be achieved by dividing the second set of radiation characteristic data by 2 after the addition operation. The second set of radiation characteristic data refers to radiation characteristic data of the radiation standard antenna of the probe feed and radiation characteristic data of the negative phase radiation standard antenna of the probe feed. The second object is to determine the self-radiative properties of the probe. The negative phase radiation standard antenna refers to an auxiliary antenna which uses a certain means to enable a radiation field of the radiation standard antenna to realize phase reversal. A radiating standard antenna refers to any form of antenna that can establish a good impedance match with the probe.
A radiation standard antenna, theoretically any antenna form can be used as the radiation standard antenna. Fig. 5 shows an implementation example of a typical radiation standard antenna. The negative phase radiation standard antenna is designed based on an auxiliary antenna which uses a certain means to realize phase reversal compared with the radiation field of the radiation standard antenna. For example, in the negative-phase radiation standard antenna shown in fig. 6, compared with the radiation standard antenna, the microstrip transmission line has a phase difference of 180 degrees, if the probe tip is regarded as the phase reference point of the transmission line, the two radiation standard antennas can present radiation far fields with the same amplitude and opposite phases in the far field, and the design principle is well met. After the radiation characteristics of the two radiation standard antennas obtained by the test are added, the radiation fields of the probe are overlapped to be twice of the radiation fields of the probe, and the radiation fields of the standard antennas are offset and eliminated. Therefore, the addition operation is divided by 2 to mark the radiation of the probe.
The second objective may further apply operations to achieve the first objective.
The set of several sets of radiation standard antennas and negative phase radiation standard antennas used is referred to as a radiation calibration kit.
The radiation calibration means is a technical means for eliminating the self-radiation characteristic of the probe from the radiation characteristic data of the antenna to be tested by using the prepared self-radiation data of the probe.
After the probe radiation is determined, operation can be further applied to obtain the intrinsic radiation of the antenna to be tested. The complete process is called radiocalibration. And (3) carrying out probe type feed test on the antenna to be tested to obtain radiation characteristic data, subtracting the determined probe self-radiation data, and eliminating the probe self-radiation from the radiation characteristic data of the antenna to be tested.
The probe may also directly feed and test the matching load element of the impedance calibration kit to achieve the second objective. An example of a matched load element for which the probe shown in fig. 4 is adapted, has a transmission line termination with a pair of 100 omega sheet resistances in parallel. The self-radiation characteristic of the probe can be approximately simulated by matching the probe feed with the load element, wherein the input impedance of the probe end and the antenna to be tested is similar, but the self-radiation characteristic of the probe is not radiated by a radiator.
The antenna to be detected and the negative phase antenna to be detected in the data subtraction principle and the radiation standard antenna and the radiator on the negative phase radiation standard antenna in the data addition principle can be reasonably rotated, so that the influence caused by probe reflection and the asymmetric position condition of the radiator on the substrate are reduced. Taking the radiation standard antenna of the rotary radiator shown in fig. 7 and the negative phase radiation standard antenna of the rotary radiator shown in fig. 8 as an example: since the microstrip patch antenna in the case is not located at the center of the substrate, distortion of radiation characteristics may occur. In addition, when the radiation is scanned in a plane facing the probe metal housing, the radiation is subjected to intense reflection by the probe housing. In order to solve the problem, the microstrip patch antenna is rotated by 90 degrees around the feeding metal post below the microstrip patch antenna in the case, so that the influence of the problem is greatly reduced. The subsequent operations are not different from the steps in the data subtraction principle and the data addition principle. In practical application, the antenna form and case of the designer may be different, but the similar related problems can be solved only by using the ideas provided in the case.
The probe radiation de-embedding method and the radiation calibration method are compared with each other in the aspect of acquiring the intrinsic radiation of the antenna to be detected: the probe radiation de-embedding method needs to additionally process negative phase antennas to be detected aiming at each antenna to be detected, and has high complexity and high cost, but the method has good reliability. The radiation calibration method only needs to use a radiation standard kit to calibrate the self-radiation characteristic of the probe once, and the data can be used for calibrating radiation data when any kind and any number of antennas to be tested are tested by the same probe later, so that the reliability is inferior to that of a direct probe radiation de-embedding method.
Comparison of the data addition principle and the method for directly testing the matched load element in the self-radiation of the calibration probe: the method for matching the load element by the probe feed is very simple and easy to operate, but has poor reliability, for example, the impedance error of the film resistor based on LTCC is very high, the radiation characteristics of the probe are greatly different when the probe feeds elements with different input impedance, and therefore, the radiation of the probe calibrated by the method has larger error; the self-radiation method of the data addition calibration probe has high reliability, because the used radiation standard antenna is easier to ensure the accuracy and consistency of input impedance compared with a film resistor. The disadvantage is that at least two radiating standard antennas need to be probe fed, which is a high operational complexity.
The probe impedance calibration kit and the radiation calibration kit adopted by the method comprise the following hardware: a probe impedance calibration kit comprising: short circuit, open circuit, pass and match load circuit. A radiation calibration kit comprising: a radiation standard antenna, a negative phase radiation standard antenna, a radiation standard antenna of a preferred rotating radiator and a negative phase radiation standard antenna of a rotating radiator.
Only the input impedance characteristics of the circuit are different among the four probe circuit calibration elements represented by the short circuit, the open circuit, the via and the matching load circuit contained in the probe impedance calibration kit, and the other hardware characteristics such as substrate materials, processing technology, feed circuit structures and the like are basically the same. Minor errors are acceptable.
The probe radiation de-nesting kit is characterized by the following: the radiation standard antenna, the negative phase radiation standard antenna, the antenna to be measured of the preferred rotating radiator and the four probe radiation de-embedding elements represented by the negative phase antenna to be measured of the rotating radiator are preferably basically the same in hardware characteristics such as substrate materials, processing technology, feed circuit structures and the like. Fig. 1 to 8 are external forms of the illustrated kit. As shown in fig. 1, a conceptual diagram of a short circuit. As shown in fig. 2, a conceptual diagram of an open circuit. As shown in fig. 3, a conceptual diagram of the pathway. As shown in fig. 4, a conceptual diagram of the matching load circuit. As shown in fig. 5, a conceptual diagram of a radiation standard antenna. As shown in fig. 6, a conceptual diagram of a negative phase radiation standard antenna. As shown in fig. 7, a conceptual diagram of a radiation standard antenna of the rotary radiator (probe structure is only schematic and is not included in the kit). As shown in fig. 8, a conceptual diagram of a negative-phase radiation standard antenna of a rotary radiator (probe structure is only schematic and is not included in the kit). The positional relationship between the feed port and the patch antenna is identical between the radiation standard antenna (of the rotary radiator) and the negative phase radiation standard antenna (of the rotary radiator), except that the electrical lengths of the transmission lines between the feed port and the patch antenna are different. The parameters such as the gain, the radiation efficiency and the like of the antenna are basically consistent, and the difference is that the radiation amplitude of the radiation standard antenna (of the rotary radiator) is the same as the radiation amplitude of the negative phase radiation standard antenna (of the rotary radiator) and the phase is opposite; the radiation of the original radiation standard antenna and the radiation standard antenna of the rotating radiator are rotated by a certain angle around the axis formed by the feed post of the patch antenna.
For example, a microstrip patch antenna of the present example, other types of antenna types may be used to design a radiation standard set; the example uses a radio frequency probe with a probe tip in a ground-signal-ground mode, and other probe with a probe tip mode such as ground-signal, ground-signal-ground and the like can use the invention; the invention uses a strip transmission line as an example to achieve radiation phase inversion, and other types of transmission lines may be used. In addition, any phase shift circuit that provides the desired phase shift of the radiation, whether active or passive, may be used to design the radiation standard kit. The above-described similar schemes are all equivalent to the examples given in the present invention.
Calibrating the radiation characteristics of the probe: the open probe itself radiates, so the probe can be considered an antenna. How the antenna radiation characteristics are calibrated has not been decided. Some perform radiation characteristic calibration under the condition that the probe is in an open circuit, and some perform radiation characteristic calibration under the condition that the probe is connected with a matched load on a traditional impedance standard substrate. When the probe is in an open circuit, the state difference between the probe and the actual use of the probe is huge, and when the probe is connected with a matching load for testing, the matching load in the traditional impedance standard substrate is closely distributed, an electromagnetic coupling effect exists between the matching load and the probe, and the calibrated probe radiation has larger error. In addition, the radiation generated by the matching circuits at different locations on the probe termination substrate is also different, and thus the probe thus calibrated lacks reliability from radiation.
The calibration of the self-radiation characteristic of the probe is performed under the condition that the probe is connected with a matching load, but the self-radiation characteristic of the probe is calibrated by using two schemes of the impedance calibration kit or the radiation calibration kit instead of the matching load on the traditional impedance standard substrate matched with the calibration of the probe circuit. The specific measurement and calibration process is as follows: scheme one, using the impedance calibration kit of the present invention: and feeding a matched load circuit in the impedance calibration kit by using a probe, and performing radiation characteristic test to obtain test data. This data can be considered as the self-radiative properties of the probe. In general, this approach has been able to characterize the self-radiation properties of the probe with sufficient accuracy and to select probes with good radiation properties very quickly. When it is desired to calibrate the radiation characteristics of the probe in a manner closest to the actual use of the probe in some specific application scenarios, it is necessary to follow the following scheme II. Scheme II, use the radiation calibration kit of our invention to cooperate with the data addition principle to carry on: firstly, a probe is used for feeding a radiation standard antenna, and radiation characteristic test is carried out to obtain a group of data. And then feeding the negative phase radiation standard antenna by using a probe, and then carrying out radiation characteristic test to obtain another group of data. Since the radiation standard antenna in the radiation calibration kit has exactly the same radiator as the negative phase radiation standard antenna, the only difference is that the radiation phases of the antennas differ by 180 ° (demonstrated in fig. 9, 10, 11 and 12). As shown in fig. 9, the E-plane co-polarization pattern of the microstrip patch antenna of the standard radiation antenna and the standard negative radiation antenna without the probe is shown. As shown in fig. 10, the E-plane cross polarization pattern of the microstrip patch antenna of the radiation standard antenna and the negative phase radiation standard antenna without the probe is shown. As shown in fig. 11, the H-plane co-polarization pattern of the microstrip patch antenna of the radiation standard antenna and the negative phase radiation standard antenna without the probe is shown. As shown in fig. 12, the cross polarization pattern of the H-plane of the microstrip patch antenna of the radiation standard antenna and the negative phase radiation standard antenna without the probe is shown. It can be verified that the radiation fields of the radiation standard antenna and the negative phase radiation standard antenna are basically equivalent and opposite, because the resultant value obtained by performing data addition operation on the two sets of data is basically 0. The E-plane and H-plane are determined based on the characteristics of the patch antenna itself in this case. The E-plane of a patch antenna refers to a section plane passing through the maximum radiation direction of the antenna and parallel to the electric field vector, and is called the E-plane. The H plane is similar, and a section plane passing through the maximum radiation direction of the antenna and parallel to the magnetic field vector is called an H plane.
The probe is then loaded onto a radiation standard kit for testing or simulation, and the self-radiation characteristic of the probe when the probe is terminated with the antenna to be tested can be obtained by using the principle of data addition on the radiation characteristic data, namely, dividing the two groups of data by 2 after adding, wherein the part of the intrinsic radiation contribution of the antenna is counteracted at the data end. As shown in fig. 13, the co-polarization patterns and effects of the radiation E-plane of the radiation standard antenna and the negative radiation standard antenna fed by the probe are shown in the data addition principle. As shown in fig. 14, the data addition principle is shown to process the radiation E-plane cross pattern and effect of the radiation standard antenna and the negative phase radiation standard antenna fed by the probe. As shown in fig. 15, the radiation H-plane co-polarization pattern and effect of the radiation standard antenna and the negative phase radiation standard antenna fed by the probe are processed by the data addition principle. As shown in fig. 16, the data addition principle is shown to process the radiation H-plane cross polarization patterns and effects of the radiation standard antenna and the negative phase radiation standard antenna fed by the probe. The probe radiation direction map determination results are shown by the solid lines marked with circles in fig. 13, 14, 15 and 16. The solid lines marked with five stars in the figure are theoretical reference values of the radiation characteristics of the probe, and they are very good in agreement with the solid lines marked with circles, which indicates that the radiation calibration kit and the subsequent data processing method of the invention can effectively measure and calibrate the radiation of the probe and give correct results.
Intrinsic radiation of the antenna to be measured is obtained: the intrinsic radiation characteristic of the antenna to be measured can be achieved in two ways. The first way is: a radiation calibration method. Based on the radiation characteristics of the probe obtained by the data addition principle, the measured value of the radiation characteristics of the antenna to be measured is further processed. The radiation calibration method only needs to use the radiation standard kit to calibrate the self-radiation characteristic of the probe once, and the data can be used for calibrating radiation data when the same probe is used for testing any kind and any number of antennas to be tested later. The specific implementation mode is that the probe is used for testing the radiation characteristics of the antenna to be tested, and a group of data is obtained. The previously calibrated and stored probe radiation data is then subtracted from the data. This method is very simple and efficient, but less reliable than the second method below.
The second way is: probe radiation de-embedding method. Based on the data subtraction principle, the self-radiation characteristic part of the probe is directly removed from the radiation test result of the antenna to be tested. The specific process is as follows: firstly, a probe is used for feeding an antenna to be detected, and radiation characteristics of the antenna to be detected are measured to obtain a group of data. And then feeding the negative phase antenna to be measured by using a probe, and then carrying out radiation characteristic test to obtain another group of data. And finally, the intrinsic radiation characteristics of the antenna to be measured after probe radiation is removed can be obtained by utilizing the data subtraction principle, namely, subtracting two groups of data and dividing the two groups of data by 2. As shown in fig. 17, the E-plane co-polarization pattern of the antenna under test after removal of the probe radiation effect is shown. As shown in fig. 18, the E-plane cross polarization pattern of the antenna to be tested after the probe radiation influence is removed is shown. As shown in fig. 19, the H-plane co-polarization pattern of the antenna to be tested is shown after the probe radiation influence is removed. As shown in fig. 20, the cross polarization pattern of the H-plane of the antenna to be tested after the probe radiation influence is removed is shown. The result of the data addition principle is shown by the solid lines marked with circles in fig. 17, 18, 19 and 20. The solid lines with the five-pointed star marks in the figure are theoretical reference values of the intrinsic radiation of the antenna to be measured, and the solid lines with the five-pointed star marks are very good in coincidence with the solid lines with the circle marks, so that the probe radiation components can be effectively removed from the radiation pattern measurement result of the antenna to be measured based on the data subtraction principle of the invention. However, as can be seen from a comparison of fig. 17 and 19, the E-plane pattern is strongly distorted and the H-plane pattern is quite perfect. This is because the E-plane is just opposite to the probe metal case and is strongly subject to electromagnetic interference such as reflection, whereas the H-plane is orthogonal to the E-plane and is weakly subject to interference such as reflection by the probe. Based on the above knowledge, the following method for further eliminating probe housing interference is produced.
The basic method is to use the antenna to be measured of the rotary radiator and the negative phase antenna to be measured of the rotary radiator, and the basic design principle is to adjust the radiation surface of the antenna to be measured to be parallel to the main reflection surface of the probe metal shell by adjustment. In this example, the radiation E surface of the antenna to be tested of interest is severely affected by the reflection of the probe, and then the microstrip patch radiator can be rotated by 90 ° around the lower Fang Kuidian column of the antenna, so as to obtain the antenna to be tested of the rotating radiator and the negative phase antenna to be tested of the rotating radiator. Thus, the radiation E surfaces of the antenna to be tested and the negative phase antenna to be tested which are originally subjected to serious electromagnetic interference rotate to a plane which is minimally interfered by the probe shell. The method of operation of subsequent probe radiation deblock was as before completely consistent.
In summary, the intrinsic radiation characteristics of the complete E surface and H surface of the microstrip patch antenna to be tested of the example can be obtained after the probe radiation and the electromagnetic interference of the probe shell are removed.
The operation means is the same as the operation means for performing the de-embedding calibration of the probe to the probe tip by using the short circuit, the open circuit and the matched load on the conventional impedance standard substrate. We have devised a set of impedance calibration kits as shown in fig. 1 to 4. The probe impedance calibration kit has the advantages that the probe impedance calibration kit element is the same as or similar to the hardware characteristics of the substrate material, the processing technology, the feed circuit and the like of the antenna to be tested, and the cost is lower than that of the traditional impedance standard substrate. The probe may use a probe impedance calibration kit to achieve calibration of the circuit characteristics of the probe.
The invention optimizes probe impedance calibration and provides a brand new probe radiation de-embedding sleeve member and method based on the radiation field idea besides the traditional de-embedding idea based on the road. The novel method comprises the following steps: more reliable probe impedance calibration method, accurate probe radiation characteristic calibration method and real measurement method of the intrinsic radiation characteristic of the antenna to be measured (eliminating the reflection/scattering/diffraction equivalent of equipment in the test environment to the radiation of the antenna to be measured). The invention relates to an antenna test based on probe feeding. The invention comprises a probe impedance calibration and radiation calibration kit and a precise test method for the radiation characteristics of a probe and the intrinsic radiation characteristics of a probe-fed antenna to be tested. The influence of the test environment and the probe on the antenna test result can be thoroughly eliminated by using the calibration kit and the data post-processing method of the invention, so that the real radiation characteristics of the probe and the antenna to be tested are obtained.
The invention provides a radiation calibration kit and a method for testing the intrinsic radiation characteristics of an antenna to be tested, comprising a probe radiation de-embedding method or a radiation calibration method: probe radiation de-embedding method: the method comprises the steps of performing probe type feeding and testing on an antenna to be tested and an auxiliary antenna by using a probe, and determining the intrinsic radiation characteristics of the antenna to be tested according to test data; the radiation calibration method comprises the following steps: and (3) performing probe feeding and testing on the radiation calibration kit by using a probe to obtain self-radiation characteristic test data of the probe. And processing and determining the intrinsic radiation characteristics of the antenna to be tested according to the test data of the antenna to be tested. The invention can effectively separate the self-radiation of the radio frequency probe from the intrinsic radiation of the antenna to be tested, is favorable for accurately acquiring the self-radiation characteristic of the radio frequency probe, and improves the accuracy of the test of the intrinsic radiation characteristic of the antenna to be tested. The invention relates to a probe impedance calibration and radiation calibration kit and a probe self-radiation characteristic and a probe-fed accurate test method for the intrinsic radiation characteristic of an antenna to be tested.
In the description of the present application, it should be understood that the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, are merely for convenience in describing the present application and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present application.
The foregoing describes specific embodiments of the present application. It is to be understood that the application is not limited to the particular embodiments described above, and that various changes or modifications may be made by those skilled in the art within the scope of the appended claims without affecting the spirit of the application. The embodiments of the application and the features of the embodiments may be combined with each other arbitrarily without conflict.
Claims (10)
1. The system for testing the intrinsic radiation characteristics of the antenna to be tested is characterized by comprising a probe;
the antenna to be measured is self-radiated and de-embedded through the probe to obtain the intrinsic radiation characteristic of the antenna to be measured;
or,
and the antenna to be measured obtains the intrinsic radiation characteristic of the antenna to be measured through the radiation calibration of the probe.
2. The system for testing the intrinsic radiation characteristics of an antenna to be tested according to claim 1, further comprising negatively radiating the antenna to be tested;
the negative-phase radiation antenna to be measured is an auxiliary antenna which enables the radiation field of the antenna to be measured to realize radiation phase reversal;
feeding the antenna to be tested by the probe to obtain radiation characteristic data of the antenna to be tested;
the probe feeds the negative radiation antenna to be measured to obtain radiation characteristic data of the negative radiation antenna to be measured;
and dividing the subtraction operation of the radiation characteristic data of the antenna to be detected and the radiation characteristic data of the negative radiation antenna to be detected by two to obtain the intrinsic radiation characteristic of the antenna to be detected.
3. The system for testing the intrinsic radiation characteristics of an antenna to be tested according to claim 1, further comprising a radiation standard kit comprising a radiation standard antenna and a negative radiation standard antenna;
the radiation standard antenna is an antenna which is matched with the probe in impedance;
the negative-phase radiation standard antenna is an auxiliary antenna which enables a radiation field of the radiation standard antenna to realize radiation phase reversal;
the probe feeds the radiation standard antenna to obtain radiation characteristic data of the radiation standard antenna;
The probe feeds the negative radiation standard antenna to obtain radiation characteristic data of the negative radiation standard antenna;
the radiation characteristic data of the radiation standard antenna and the radiation characteristic data of the negative radiation standard antenna are divided by two after being added, so that the self-radiation characteristic of the probe is obtained;
feeding the antenna to be tested by the probe to obtain radiation characteristic data of the antenna to be tested;
and the radiation characteristic data of the detection antenna eliminates the self-radiation characteristic of the probe to obtain the intrinsic radiation characteristic of the antenna to be detected.
4. The system for testing the intrinsic radiation characteristics of an antenna to be tested according to claim 1, further comprising an impedance calibration kit;
the probe feeds the matched load element of the impedance calibration kit to obtain the self-radiation characteristic of the probe;
feeding the antenna to be tested by the probe to obtain radiation characteristic data of the antenna to be tested;
and the radiation characteristic data of the detection antenna eliminates the self-radiation characteristic of the probe to obtain the intrinsic radiation characteristic of the antenna to be detected.
5. The system for testing the intrinsic radiation characteristics of an antenna to be tested according to claim 2, wherein the radiator on the antenna to be tested and the radiator on the antenna to be tested by negative phase radiation are rotatable.
6. A system for testing the intrinsic radiation characteristics of an antenna to be tested according to claim 3, wherein the radiator on the radiation standard antenna and the radiator on the negative phase radiation standard antenna are rotatable.
7. A method for testing the intrinsic radiation characteristics of an antenna to be tested, characterized in that the system for testing the intrinsic radiation characteristics of the antenna to be tested according to any one of claims 1 to 6 is applied, comprising the following steps:
a first acquisition step of intrinsic radiation characteristics: the antenna to be measured is self-radiated and de-embedded through the probe to obtain the intrinsic radiation characteristic of the antenna to be measured;
or,
a second acquisition step of intrinsic radiation characteristics: and the antenna to be measured obtains the intrinsic radiation characteristic of the antenna to be measured through the radiation calibration of the probe.
8. The method for testing the eigen-radiation characteristics of an antenna to be tested according to claim 7, wherein said first acquisition step of eigen-radiation characteristics comprises the steps of:
the method comprises the following steps of obtaining antenna data to be tested: feeding the antenna to be tested by the probe to obtain radiation characteristic data of the antenna to be tested;
the data acquisition step of the antenna to be measured of negative radiation: the probe feeds the negative radiation antenna to be measured to obtain radiation characteristic data of the negative radiation antenna to be measured;
a first calculation step of intrinsic radiation characteristics: and dividing the subtraction operation of the radiation characteristic data of the antenna to be detected and the radiation characteristic data of the negative radiation antenna to be detected by two to obtain the intrinsic radiation characteristic of the antenna to be detected.
9. The method for testing the eigen-radiation characteristics of an antenna to be tested according to claim 7, wherein said second acquisition step of eigen-radiation characteristics comprises the steps of:
a radiation standard antenna data acquisition step: the probe feeds the radiation standard antenna to obtain radiation characteristic data of the radiation standard antenna;
negative radiation standard antenna data acquisition: the probe feeds the negative radiation standard antenna to obtain radiation characteristic data of the negative radiation standard antenna;
a first acquisition step of self-radiation characteristics: the radiation characteristic data of the radiation standard antenna and the radiation characteristic data of the negative radiation standard antenna are divided by two after being added, so that the self-radiation characteristic of the probe is obtained;
the method comprises the following steps of obtaining antenna data to be tested: feeding the antenna to be tested by the probe to obtain radiation characteristic data of the antenna to be tested;
a second calculation step of the intrinsic radiation characteristics: and the radiation characteristic data of the detection antenna eliminates the self-radiation characteristic of the probe to obtain the intrinsic radiation characteristic of the antenna to be detected.
10. The method for testing the eigen-radiation characteristics of an antenna to be tested according to claim 7, wherein said second acquisition step of eigen-radiation characteristics comprises the steps of:
A second acquisition step of self-radiation characteristics: the probe feeds the matched load element of the impedance calibration kit to obtain the self-radiation characteristic of the probe;
the method comprises the following steps of obtaining antenna data to be tested: feeding the antenna to be tested by the probe to obtain radiation characteristic data of the antenna to be tested;
a second calculation step of the intrinsic radiation characteristics: and the radiation characteristic data of the detection antenna eliminates the self-radiation characteristic of the probe to obtain the intrinsic radiation characteristic of the antenna to be detected.
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