CN116938353A - Non-contact testing method and system for near field communication device - Google Patents

Abstract

A non-contact test method and system for near field communication device are provided. The non-contact test method of the near field communication device comprises a test device coupling step, a detection step and a comparison step; the test device coupling step is to couple the test device to the near field communication device; the testing device is coupled with the near field communication device to generate a loop loss value; the detection step is to drive a network analyzer to generate a loop loss curve; the comparison step is to compare whether the loop loss curve is located in the abnormal loop loss free zone to generate a test result; when the loop loss curve is positioned in the loop loss interval without abnormality, the test result is that the near field communication device is in a normal state; when the loop loss curve is located outside the loop loss interval without abnormality, the test result is that the near field communication device is in an abnormal state. The non-contact testing method and the system thereof of the near field communication device detect the loop loss curve of the near field communication device in a coupling mode and filter the near field communication device in an abnormal state.

Description

Non-contact testing method and system for near field communication device

Technical field

The present invention relates to a non-contact testing method and system of a communication device, and in particular to a non-contact testing method and system of a near field communication device.

Background technique

After the near field communication (NFC) product is manufactured, it must be functionally tested before leaving the factory to ensure that the product can operate normally. The well-known test board physically contacts the near field communication product through a probe to conduct electrical and communication function testing. . However, since the test board is in physical contact with the near field communication product, the test board must be equipped with an additional matching circuit to match the impedance of the near field communication product. Therefore, if the difference between the test value of an abnormal product and the test value of normal state is small, it may be regarded as the error tolerance value of impedance matching and judged as a normal product. Figure 1 is a schematic diagram of a loop loss curve for testing near field communication products using a known test board. The loop loss curve in the abnormal state of double-layer flexible circuit board attachment is similar to the loop loss curve in the normal state. That is, the known test board cannot detect the abnormal attachment of the double-layer flexible circuit board in near field communication products.

It can be seen from this that there is currently a lack of a non-contact testing method and system for near field communication devices that can detect subtle numerical changes and have high sensitivity on the market, so relevant industry players are looking for a solution.

Contents of the invention

Therefore, an object of the present invention is to provide a non-contact testing method and system for a near field communication device, which tests whether the near field communication device is abnormal by coupling the test device to the near field communication device.

An embodiment of the method aspect of the present invention provides a non-contact testing method for a near field communication device, for testing a near field communication device. The non-contact testing method of a near field communication device includes a test device coupling step, a detection step and a comparison step. The test device coupling step is to couple a test device to the near field communication device. The test device is coupled to the near field communication device to generate at least one return loss (Return Loss) value. The detection step is to drive a network analyzer to generate a loop loss curve based on at least one loop loss value. The comparison step is to drive a processor to compare whether the loop loss curve is in a non-abnormal loop loss interval and generate a test result. When the loop loss curve is within the non-abnormal loop loss range, the test result is that the near field communication device is in a normal state; when the loop loss curve is outside the non-abnormal loop loss range, the test result is that the near field communication device is in an abnormal state.

Thereby, the non-contact testing method of the near field communication device of the present invention detects the loop loss curve of the near field communication device in a coupling manner, and filters out the near field communication device in an abnormal state.

According to an embodiment of the structural aspect of the present invention, a non-contact testing system for a near field communication device is provided for testing a near field communication device. A non-contact test system for a near field communication device includes a test device, a network analyzer and a processor. The test device is used to couple the near field communication device. At least one loop loss value is generated when the test device is coupled to the near field communication device. The network analyzer is electrically connected to the test device and generates a loop loss curve based on at least one loop loss value. The processor is electrically connected to the network analyzer and used to compare whether the loop loss curve is within a non-abnormal loop loss interval to generate a test result. When the loop loss curve is within the non-abnormal loop loss range, the test result is that the near field communication device is in a normal state; when the loop loss curve is outside the non-abnormal loop loss range, the test result is that the near field communication device is in an abnormal state.

Thereby, the non-contact testing system of the near field communication device of the present invention detects the loop loss curve of the near field communication device in a coupling manner, and filters out the near field communication device in an abnormal state.

Description of the drawings

Figure 1 shows a schematic diagram of the loop loss curve of a known test board for testing near field communication products;

FIG. 2 illustrates a flow chart of a non-contact testing method of a near field communication device according to the first embodiment of the present invention;

FIG. 3 is a schematic diagram of the test device coupling steps of the non-contact testing method of the near field communication device according to the embodiment of FIG. 2;

Figure 4 is a schematic diagram illustrating a normal state loop loss curve of the non-contact testing method of the near field communication device according to the embodiment of Figure 2;

Figure 5 is a schematic diagram illustrating a loop loss curve in an abnormal state according to the non-contact testing method of the near field communication device according to the embodiment of Figure 2; and

FIG. 6 is a schematic diagram of a non-contact testing system for a near field communication device according to a second embodiment of the present invention.

Description of main component symbols:

S10 Non-Contact Test Method

S02 Test Device Coupling Steps

S04 detection steps

S06 Comparison steps

10 Near field communication device

13 antenna

100 non-contact testing system

110 Test device

112 coils

120 Network Analyzer

130 processor

RL loop loss curve

NL No abnormal loop loss interval

d spacing

Detailed ways

Various embodiments of the present invention will be described below with reference to the accompanying drawings. For the sake of clarity, many practical details will be explained together in the following narrative. However, it will be understood that these practical details should not limit the invention. That is to say, in some embodiments of the present invention, these practical details are not necessary. In addition, for the purpose of simplifying the drawings, some well-known and conventional structures and components are illustrated in a simple schematic manner in the drawings; and repeated components may be represented by the same numbers.

In addition, when one element (or unit or module, etc.) is "connected" to another element herein, it can mean that the element is directly connected to the other element, or it can also mean that one element is indirectly connected to the other element. This means that there are other elements between the element and the other element. When it is stated that an element is "directly connected" to another element, it means that no other elements are interposed between said element and the other element. Terms such as first, second, third, etc. are only used to describe different components without limiting the components themselves. Therefore, the first component can also be renamed the second component. Moreover, the combination of components/units/circuit in this article is not a commonly known, conventional or well-known combination in this field. Whether the component/unit/circuit itself is well-known cannot be used to determine whether its combination relationship is easily understood by ordinary people in the technical field. Technicians can do it easily.

Please refer to FIGS. 2 to 5 . FIG. 2 illustrates a flow chart of the non-contact testing method S10 of the near field communication device 10 according to the first embodiment of the present invention; FIG. 3 illustrates the near field communication device according to the embodiment of FIG. 2 A schematic diagram of the test device coupling step S02 of the non-contact test method S10 of 10; Figure 4 is a schematic diagram of the normal state loop loss curve RL of the non-contact test method S10 of the near field communication device 10 according to the embodiment of Figure 2; And FIG. 5 is a schematic diagram illustrating the loop loss curve RL of the abnormal state according to the non-contact testing method S10 of the near field communication device 10 in the embodiment of FIG. 2 . The non-contact testing method S10 of the near field communication device 10 is used to test a near field communication device 10 . The non-contact testing method S10 of the near field communication device 10 includes a testing device coupling step S02, a detection step S04 and a comparison step S06. The test device coupling step S02 is to couple a test device 110 to the near field communication device 10 . The test device 110 is coupled to the near field communication device 10 to generate at least one return loss (Return Loss) value. The detection step S04 is to drive a network analyzer 120 (see FIG. 6 ) to generate a loop loss curve RL based on at least one loop loss value. The comparison step S06 is to drive a processor 130 (see FIG. 6 ) to compare whether the loop loss curve RL is located in an abnormal loop loss interval NL to generate a test result. When the loop loss curve RL is within the no-abnormal loop loss interval NL, the test result is that the near field communication device 10 is in a normal state; when the loop loss curve RL is outside the no-abnormal loop loss interval NL, the test result is that the near field communication device 10 is in a normal state. 10 is in an abnormal state. Thereby, the non-contact testing method S10 of the near field communication device 10 of the present invention detects the loop loss curve RL of the near field communication device 10 in a coupling manner, and detects the near field communication device 10 in an abnormal state.

In detail, the test device 110 is coupled to the near field communication device 10 and measures the loop loss values (dB) of the near field communication device 10 at different frequencies (f). The loop loss curve RL is formed by connecting the loop loss values of the near field communication device 10 at different frequencies. The abnormal loop loss-free interval NL is used to define the loop loss value range of the near field communication device 10 that can operate normally at a specific frequency. As shown in FIG. 4 , the loop loss curve RL in the normal state is located in the area limited by the abnormal loop loss interval NL. In this embodiment, the near field communication device 10 in the normal state has a loop loss when the frequency is between 63 MHz and 75 MHz. The loss value is less than -8dB; when the frequency is between 75MHz and 78MHz, the loop loss value is less than -22dB; when the frequency is between 78MHz and 83MHz, the loop loss value is between -6dB and -22dB; when the frequency is between 83MHz and At 86MHz, the loop loss value is less than -22dB; when the frequency is greater than 86MHz, the loop loss value is less than -8dB.

Specifically, the abnormal state includes one of an open circuit state, a short circuit state, a gold finger broken state, a double-layer flexible circuit board attachment abnormal state, and a double-layer ferrite attachment abnormal state. When the near field communication device 10 is in the above-mentioned abnormal state, the loop loss curve RL can be shown in FIG. 5 . When the near field communication device 10 is in an open circuit state or a short circuit state, the loop loss value is always zero. When the near field communication device 10 is in at least one of the broken gold finger state, the abnormal state of double-layer flexible circuit board attachment, or the abnormal state of double-layer ferrite attachment, the loop loss curve RL will always be consistent with the abnormal loop loss interval NL. intersection, that is, when the near field communication device 10 is in a broken gold finger state, an abnormal state of double-layer flexible circuit board attachment, or an abnormal state of double-layer ferrite attachment, the loop loss value detected at a specific frequency exceeds that of the near field communication device 10 . The value at which the field communication device 10 can operate normally. In addition, when the near field communication device 10 is in at least two of the aforementioned abnormal states at the same time (for example, the golden finger is broken and the double-layer flexible circuit board is attached abnormally), the loop loss curve RL of the near field communication device 10 will also change. Intersects with the abnormal loop loss interval NL. Thereby, the non-contact testing method S10 of the near field communication device 10 of the present invention can detect abnormalities caused by the double-layer flexible circuit board attachment and the double-layer ferrite attachment that are slightly different from the normal state. Abnormality, and when multiple abnormal states occur in the near field communication device 10, the cause of the abnormality of the near field communication device 10 can also be determined through the loop loss curve RL.

Please refer to FIGS. 4 to 6 . FIG. 6 is a schematic diagram of a non-contact testing system 100 for a near field communication device 10 according to a second embodiment of the present invention. The non-contact testing system 100 of the near field communication device 10 is used to test a near field communication device 10 . The non-contact test system 100 of the near field communication device 10 includes a test device 110, a network analyzer 120 and a processor 130. The test device 110 is used to couple the near field communication device 10 . When the test device 110 is coupled to the near field communication device 10, at least one loop loss value is generated. The network analyzer 120 is electrically connected to the test device 110 and generates a loop loss curve RL based on at least one loop loss value. The processor 130 is electrically connected to the network analyzer 120 and is used to compare whether the loop loss curve RL is located in an abnormal loop loss interval NL to generate a test result. When the loop loss curve RL is within the no-abnormal loop loss interval NL, the test result is that the near field communication device 10 is in a normal state; when the loop loss curve RL is outside the no-abnormal loop loss interval NL, the test result is that the near field communication device 10 is in a normal state. 10 is in an abnormal state. In this way, the non-contact test system 100 of the near field communication device 10 of the present invention is coupled to the near field communication device 10 by the test device 110, thereby avoiding a reduction in detection sensitivity due to the physical connection between the test device 110 and the near field communication device 10 through the matching circuit.

The distance d between the near field communication device 10 and the test device 110 is greater than 0 mm and less than or equal to 2 mm. In other embodiments of the present invention, the test device can be installed at a fixed position of a test machine, and the near field communication device can be installed on a fixture that can move up and down on the test machine to adjust the near field communication device and the test machine. The coupling spacing at which the test device is to be tested.

The test device 110 may include a coil 112 , and the near field communication device 10 may include an antenna 13 , and the coil 112 corresponds to the antenna 13 . The shape of the coil 112 of the test device 110 is similar to the shape of the antenna 13 of the near field communication device 10 , and the area of the test device 110 is larger than that of the near field communication device 10 . In other words, the area of the coil 112 of the test device 110 covers the area of the antenna 13 of the near field communication device 10 .

Specifically, the near field communication device 10 can be a near field communication antenna 13 or an electronic device provided with a near field communication control chip; the test device 110 can be a test circuit board provided with a coil 112; the processor 130 can be a microprocessing unit , central processing unit or other electronic computing processor; the test device 110 can be connected to the network analyzer 120 through a radio frequency cable (RF cable), but the present invention is not limited to this.

As can be seen from the above embodiments, the present invention has the following advantages. First, the non-contact testing method of the near field communication device of the present invention detects the loop loss curve of the near field communication device in a coupling manner, and detects the near field in an abnormal state. Communication devices; secondly, the non-contact testing method of near field communication devices can detect abnormalities caused by double-layer flexible circuit board attachment and double-layer ferrite attachment that are slightly different from the normal state. And when multiple abnormal states occur in the near field communication device, the cause of the abnormality of the near field communication device can also be determined through the loop loss curve; thirdly, the non-contact test system of the near field communication device of the present invention is coupled to the near field communication device by the test device. The field communication device avoids reducing the detection sensitivity due to the physical connection between the test device and the near field communication device through the matching circuit.

Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention. Any person skilled in the art should be able to make various modifications and modifications without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention should be determined by the scope of the appended claims.

Claims (10)

1. A non-contact testing method of a near field communication device. The non-contact testing method of the near field communication device is used to test a near field communication device. The non-contact testing method of the near field communication device includes: A test device coupling step, the test device coupling step is to couple a test device to the near field communication device, wherein the test device couples the near field communication device to generate at least one loop loss value; A detection step, the detection step is to drive a network analyzer to generate a loop loss curve based on the at least one loop loss value; and A comparison step, the comparison step is to drive a processor to compare whether the loop loss curve is in a non-abnormal loop loss interval and generate a test result; Wherein, when the loop loss curve is within the no-abnormal loop loss interval, the test result is that the near field communication device is in a normal state; when the loop loss curve is outside the no-abnormal loop loss interval, the test result is The near field communication device is in an abnormal state. 2. The non-contact testing method of a near field communication device as claimed in claim 1, wherein the distance between the near field communication device and the test device is greater than 0 mm and less than or equal to 2 mm. 3. The non-contact testing method of a near field communication device as claimed in claim 1, wherein the testing device includes a coil, the near field communication device includes an antenna, and the coil corresponds to the antenna. 4. The non-contact testing method of a near field communication device as claimed in claim 3, wherein the shape of the coil of the testing device is similar to the shape of the antenna of the near field communication device, and the area of the testing device is larger than the shape of the antenna. The area of the near field communication device. 5. The non-contact testing method of a near field communication device as claimed in claim 1, wherein the abnormal state includes an open circuit state, a short circuit state, a gold finger broken state, and a double-layer flexible circuit board attachment abnormal state. And one with an abnormal state of double-layer ferrite adhesion. 6. A non-contact test system for a near field communication device. The non-contact test system of the near field communication device is used to test a near field communication device. The non-contact test system of the near field communication device includes: A test device, the test device is used to couple the near field communication device, wherein the test device generates at least one loop loss value when coupling the near field communication device; A network analyzer electrically connected to the test device and generating a loop loss curve based on the at least one loop loss value; and A processor electrically connected to the network analyzer and used to compare whether the loop loss curve is in a non-abnormal loop loss interval and generate a test result; Wherein, when the loop loss curve is within the no-abnormal loop loss interval, the test result is that the near field communication device is in a normal state; when the loop loss curve is outside the no-abnormal loop loss interval, the test result is The near field communication device is in an abnormal state. 7. The non-contact testing system of a near field communication device as claimed in claim 6, wherein the distance between the near field communication device and the testing device is greater than 0 mm and less than or equal to 2 mm. 8. The non-contact testing system of a near field communication device as claimed in claim 6, wherein the testing device includes a coil, the near field communication device includes an antenna, and the coil corresponds to the antenna. 9. The non-contact testing system of a near field communication device as claimed in claim 8, wherein the shape of the coil of the testing device is similar to the shape of the antenna of the near field communication device, and the area of the testing device is larger than the shape of the antenna. The area of the near field communication device. 10. The non-contact testing system of a near field communication device as claimed in claim 6, wherein the abnormal state includes an open circuit state, a short circuit state, a gold finger broken state, and a double-layer flexible circuit board attachment abnormal state. And one with an abnormal state of double-layer ferrite adhesion.