CN116938353A - Non-contact test method and system for near field communication device - Google Patents
Non-contact test method and system for near field communication device Download PDFInfo
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- CN116938353A CN116938353A CN202210338272.7A CN202210338272A CN116938353A CN 116938353 A CN116938353 A CN 116938353A CN 202210338272 A CN202210338272 A CN 202210338272A CN 116938353 A CN116938353 A CN 116938353A
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- 238000004891 communication Methods 0.000 title claims abstract description 131
- 238000010998 test method Methods 0.000 title claims abstract description 7
- 238000012360 testing method Methods 0.000 claims abstract description 133
- 230000002159 abnormal effect Effects 0.000 claims abstract description 45
- 230000008878 coupling Effects 0.000 claims abstract description 21
- 238000010168 coupling process Methods 0.000 claims abstract description 21
- 238000005859 coupling reaction Methods 0.000 claims abstract description 21
- 230000005856 abnormality Effects 0.000 claims abstract description 14
- 238000001514 detection method Methods 0.000 claims abstract description 8
- 229910000859 α-Fe Inorganic materials 0.000 claims description 7
- 238000000034 method Methods 0.000 claims description 6
- 239000002355 dual-layer Substances 0.000 claims 4
- 238000010586 diagram Methods 0.000 description 10
- 230000035945 sensitivity Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/0082—Monitoring; Testing using service channels; using auxiliary channels
- H04B17/0085—Monitoring; Testing using service channels; using auxiliary channels using test signal generators
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B5/00—Near-field transmission systems, e.g. inductive or capacitive transmission systems
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- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
Abstract
A non-contact test method and system for near field communication device are provided. The non-contact test method of the near field communication device comprises a test device coupling step, a detection step and a comparison step; the test device coupling step is to couple the test device to the near field communication device; the testing device is coupled with the near field communication device to generate a loop loss value; the detection step is to drive a network analyzer to generate a loop loss curve; the comparison step is to compare whether the loop loss curve is located in the abnormal loop loss free zone to generate a test result; when the loop loss curve is positioned in the loop loss interval without abnormality, the test result is that the near field communication device is in a normal state; when the loop loss curve is located outside the loop loss interval without abnormality, the test result is that the near field communication device is in an abnormal state. The non-contact testing method and the system thereof of the near field communication device detect the loop loss curve of the near field communication device in a coupling mode and filter the near field communication device in an abnormal state.
Description
Technical Field
The present invention relates to a non-contact testing method and system for a communication device, and more particularly, to a non-contact testing method and system for a near field communication device.
Background
After the near field communication (Near Field Communication; NFC) product is manufactured, a function test is performed before shipping to ensure that the product can operate normally, and a well-known test board is used for performing an electrical and communication function test by physically contacting the near field communication product through a probe. However, since the test board is in physical contact with the near field communication product, the test board must be additionally provided with a matching circuit for impedance matching with the near field communication product. Therefore, if the difference between the test value of the abnormal product and the test value of the normal state is small, the abnormal product may be determined as the normal product by considering the error tolerance of the impedance matching. Fig. 1 is a schematic diagram showing a circuit loss curve of a conventional test board for testing near field communication products. The loop loss curve of the double-layer flexible circuit board in the abnormal adhesion state is similar to the loop loss curve of the double-layer flexible circuit board in the normal state, namely, the conventional test board cannot detect the abnormal adhesion of the double-layer flexible circuit board in the near field communication product.
Therefore, there is a lack of a non-contact testing method and system for near field communication devices with high sensitivity for detecting small value variations in the market, so that the related industries are seeking solutions.
Disclosure of Invention
It is therefore an object of the present invention to provide a non-contact testing method and system for a near field communication device, which can test whether the near field communication device is abnormal by coupling the testing device to the near field communication device.
According to one embodiment of the present invention, a method for testing a near field communication device is provided. The non-contact testing method of the near field communication device comprises a testing device coupling step, a detection step and a comparison step. The test device coupling step is to couple a test device to the near field communication device. The testing device is coupled to the near field communication device to generate at least one loop Loss (Return Loss) value. The detecting step is to drive a network analyzer to generate a loop loss curve according to at least one loop loss value. The comparing step is to drive a processor to compare whether the loop loss curve is located in the abnormal loop loss free zone to generate a test result. When the loop loss curve is positioned in the loop loss interval without abnormality, the test result is that the near field communication device is in a normal state; when the loop loss curve is located outside the loop loss interval without abnormality, the test result is that the near field communication device is in an abnormal state.
Therefore, the non-contact testing method of the near field communication device detects the loop loss curve of the near field communication device in a coupling mode and filters the near field communication device in an abnormal state.
According to one embodiment of the present invention, a non-contact testing system of a near field communication device is provided for testing a near field communication device. The non-contact test system of the near field communication device comprises a test device, a network analyzer and a processor. The testing device is used for coupling the near field communication device. The testing device generates at least one loop loss value when coupling the near field communication device. The network analyzer is electrically connected with the testing device and generates a loop loss curve according to at least one loop loss value. The processor is electrically connected with the network analyzer and is used for comparing whether the loop loss curve is located in an abnormal loop loss free zone or not to generate a test result. When the loop loss curve is positioned in the loop loss interval without abnormality, the test result is that the near field communication device is in a normal state; when the loop loss curve is located outside the loop loss interval without abnormality, the test result is that the near field communication device is in an abnormal state.
Therefore, the non-contact testing system of the near field communication device detects the loop loss curve of the near field communication device in a coupling mode and filters the near field communication device in an abnormal state.
Drawings
FIG. 1 is a schematic diagram showing a circuit loss curve of a conventional test board for testing a near field communication product;
fig. 2 is a flowchart illustrating a non-contact testing method of a near field communication device according to a first embodiment of the invention;
FIG. 3 is a schematic diagram showing a coupling step of a testing device of a non-contact testing method of the near field communication device according to the embodiment of FIG. 2;
FIG. 4 is a schematic diagram showing a loop loss curve of a normal state of a non-contact testing method of the near field communication device according to the embodiment of FIG. 2;
FIG. 5 is a schematic diagram showing a loop loss curve of an abnormal state of a non-contact testing method of the near field communication device according to the embodiment of FIG. 2; and
fig. 6 is a schematic diagram of a non-contact testing system of a near field communication device according to a second embodiment of the invention.
Description of main reference numerals:
s10 non-contact test method
S02 test device coupling step
S04 detection step
S06 comparison step
10. Near field communication device
13. Antenna
100. Non-contact test system
110. Test device
112. Coil
120. Network analyzer
130. Processor and method for controlling the same
RL Loop loss curve
NL no-abnormal loop loss interval
d spacing
Detailed Description
Various embodiments of the present invention will be described below with reference to the accompanying drawings. For purposes of clarity, many practical details will be set forth in the following description. However, it should be understood that these practical details are not to be taken as limiting the invention. That is, in some embodiments of the invention, these practical details are unnecessary. Moreover, for the purpose of simplifying the drawings, some well known and conventional structures and elements are shown in the drawings in a simplified schematic manner; and repeated elements will likely be indicated by identical reference numerals.
In addition, when an element (or unit, module, etc.) is "connected" to another element, it may mean that the element is directly connected to the other element, or it may mean that the element is indirectly connected to the other element, i.e., there are other elements interposed between the element and the other element. When an element is referred to as being "directly connected" to another element, it can be directly connected to the other element or intervening elements may be present. The terms first, second, third and the like are used for describing different elements only, and are not limited to the elements themselves, so that the first element can also be modified as the second element. And combinations of elements/units/circuits herein are not generally known, conventional or well known in the art, it is not possible to determine whether a combination relationship thereof is easily accomplished by one of ordinary skill in the art by whether the elements/units/circuits are known per se.
Referring to fig. 2 to 5, fig. 2 is a flowchart illustrating a non-contact testing method S10 of the near field communication device 10 according to a first embodiment of the invention; fig. 3 is a schematic diagram illustrating a test device coupling step S02 of the non-contact test method S10 of the near field communication device 10 according to the embodiment of fig. 2; fig. 4 is a schematic diagram showing a loop loss curve RL of a normal state of the non-contact testing method S10 of the near field communication device 10 according to the embodiment of fig. 2; fig. 5 is a schematic diagram showing a loop loss curve RL of an abnormal state of the non-contact testing method S10 of the near field communication device 10 according to the embodiment of fig. 2. The non-contact testing method S10 of the near field communication device 10 is used for testing a near field communication device 10. The non-contact testing method S10 of the near field communication device 10 includes a testing device coupling step S02, a detecting step S04, and a comparing step S06. The test device coupling step S02 is to couple a test device 110 to the near field communication device 10. The test device 110 is coupled to the near field communication device 10 to generate at least one loop Loss (Return Loss) value. The detecting step S04 is to drive a network analyzer 120 (see fig. 6) to generate a loop loss curve RL according to at least one loop loss value. In the comparing step S06, a processor 130 (see fig. 6) is driven to compare whether the loop loss curve RL is located in the no-abnormal loop loss zone NL to generate a test result. When the loop loss curve RL is within the loop loss interval NL without anomaly, the test result is that the near-field communication device 10 is in a normal state; when the loop loss curve RL is outside the loop loss interval NL, the test result is that the near-field communication device 10 is in an abnormal state. Thus, the non-contact testing method S10 of the near field communication device 10 of the present invention detects the loop loss curve RL of the near field communication device 10 in a coupling manner, and detects the near field communication device 10 in an abnormal state.
In detail, the test device 110 is coupled to the near field communication device 10 and measures loop loss values (dB) of the near field communication device 10 at different frequencies (f). The loop loss curve RL is formed by connecting loop loss values of the near field communication device 10 at different frequencies. The no abnormal loop loss interval NL is used to define a loop loss value range for a specific frequency of the normally functioning near field communication device 10. As shown in fig. 4, the loop loss curve RL in the normal state is located in the area limited by the abnormal loop loss free zone NL, and in this embodiment, the loop loss value of the near-field communication device 10 in the normal state is less than-8 dB when the frequency is between 63MHz and 75 MHz; when the frequency is between 75MHz and 78MHz, the loop loss value is smaller than-22 dB; when the frequency is between 78MHz and 83MHz, the loop loss value is between-6 dB and-22 dB; when the frequency is between 83MHz and 86MHz, the loop loss value is smaller than-22 dB; at frequencies greater than 86MHz, the loop loss value is less than-8 dB.
Specifically, the abnormal state includes one of an open state, a short state, a golden finger broken state, a double-layer flexible circuit board attaching abnormal state, and a double-layer ferrite attaching abnormal state. When the near field communication device 10 is in the abnormal state, the loop loss curve RL may be as shown in fig. 5. When the near field communication device 10 is in the open state or the short state, the loop loss value is constant to zero. When the near field communication device 10 is at least one of the golden finger broken state, the double-layer flexible circuit board attached abnormal state or the double-layer ferrite attached abnormal state, the loop loss curve RL intersects with the non-abnormal loop loss section NL, that is, when the near field communication device 10 is at the golden finger broken state, the double-layer flexible circuit board attached abnormal state or the double-layer ferrite attached abnormal state, the loop loss value detected at the specific frequency exceeds the value at which the near field communication device 10 can normally work. In addition, when the near field communication device 10 is in at least two of the abnormal states (e.g., the golden finger broken state and the double-layer flexible circuit board attached abnormal state), the loop loss curve RL of the near field communication device 10 also intersects the abnormal loop loss free section NL. Therefore, the non-contact testing method S10 of the near field communication device 10 of the present invention can detect the abnormality caused by the adhesion of the double-layer flexible circuit board and the abnormality caused by the adhesion of the double-layer ferrite, and can determine the abnormality cause of the near field communication device 10 through the loop loss curve RL when the near field communication device 10 has a plurality of abnormal states.
Referring to fig. 4 to 6, fig. 6 is a schematic diagram of a non-contact testing system 100 of a near field communication device 10 according to a second embodiment of the invention. The non-contact testing system 100 of the near field communication device 10 is used for testing a near field communication device 10. The non-contact testing system 100 of the near field communication device 10 comprises a testing device 110, a network analyzer 120 and a processor 130. The test device 110 is used to couple the near field communication device 10. The test device 110 generates at least one loop loss value when coupled to the near field communication device 10. The network analyzer 120 is electrically connected to the testing device 110, and generates a loop loss curve RL according to at least one loop loss value. The processor 130 is electrically connected to the network analyzer 120 and is used for comparing whether the loop loss curve RL is located in the abnormal loop loss free zone NL to generate a test result. When the loop loss curve RL is within the loop loss interval NL without anomaly, the test result is that the near-field communication device 10 is in a normal state; when the loop loss curve RL is outside the loop loss interval NL, the test result is that the near-field communication device 10 is in an abnormal state. Therefore, the non-contact test system 100 of the near field communication device 10 of the present invention is coupled to the near field communication device 10 by the test device 110, so as to avoid the detection sensitivity from being reduced due to the physical connection between the test device 110 and the near field communication device 10 through the matching circuit.
The distance d between the near field communication device 10 and the testing device 110 is greater than 0 mm and less than or equal to 2 mm. In other embodiments of the present invention, the testing device may be disposed at a fixed position of a testing machine, and the near field communication device may be disposed on a fixture of the testing machine that is capable of moving up and down, so as to adjust a coupling distance between the near field communication device and the testing device when the testing device is to perform testing.
The test device 110 may include a coil 112, and the near field communication device 10 may include an antenna 13, where the coil 112 corresponds to the antenna 13. The shape of the coil 112 of the test device 110 is similar to the shape of the antenna 13 of the near field communication device 10, and the area of the test device 110 is larger than the area of the near field communication device 10. In other words, the area of the coil 112 of the test device 110 covers the area of the antenna 13 of the near field communication device 10.
Specifically, the near field communication device 10 may be a near field communication antenna 13 or an electronic device provided with a near field communication control chip; the test device 110 may be a test circuit board provided with a coil 112; the processor 130 may be a microprocessor, a central processing unit, or other electronic computing processor; the testing device 110 may be connected to the network analyzer 120 through a radio frequency cable (RF cable), but the invention is not limited thereto.
As can be seen from the above embodiments, the present invention has the following advantages, in one aspect, the non-contact testing method of the near field communication device of the present invention detects a loop loss curve of the near field communication device in a coupling manner, and detects the near field communication device in an abnormal state; secondly, the non-contact testing method of the near field communication device can detect the abnormality caused by the adhesion of the double-layer flexible circuit board and the abnormality caused by the adhesion of the double-layer ferrite, and when the near field communication device has a plurality of abnormal states, the abnormality reason of the near field communication device can be judged through a loop loss curve; thirdly, the non-contact test system of the near field communication device is characterized in that the test device is coupled with the near field communication device, so that the detection sensitivity is prevented from being reduced due to the fact that the test device is physically connected with the near field communication device through the matching circuit.
While the present invention has been described with reference to the embodiments, it should be understood that the invention is not limited thereto, but various changes and modifications can be made by one skilled in the art without departing from the spirit and scope of the present invention, and the scope of the present invention is defined by the appended claims.
Claims (10)
1. A non-contact test method of a near field communication device is used for testing the near field communication device, and comprises the following steps:
a test device coupling step of coupling a test device to the near field communication device, wherein the test device is coupled to the near field communication device to generate at least one loop loss value;
a detection step, wherein the detection step is to drive a network analyzer to generate a loop loss curve according to the at least one loop loss value; and
a comparison step, wherein the comparison step is to drive a processor to compare whether the loop loss curve is located in an abnormal loop loss free zone so as to generate a test result;
when the loop loss curve is located in the loop loss interval without abnormality, the test result is that the near field communication device is in a normal state; when the loop loss curve is located outside the loop loss interval without anomaly, the test result is that the near field communication device is in an anomaly state.
2. The method of claim 1, wherein the distance between the near field communication device and the testing device is greater than 0 mm and less than or equal to 2 mm.
3. The method of claim 1, wherein the testing device comprises a coil, the near field communication device comprises an antenna, and the coil corresponds to the antenna.
4. The method of claim 3, wherein the coil of the test device has a shape similar to that of the antenna of the near field communication device, and the area of the test device is larger than that of the near field communication device.
5. The method of claim 1, wherein the abnormal state comprises one of an open state, a short state, a golden finger broken state, a dual-layer flexible circuit board attaching abnormal state, and a dual-layer ferrite attaching abnormal state.
6. A non-contact test system of a near field communication device for testing a near field communication device, the non-contact test system of the near field communication device comprising:
a testing device for coupling the near field communication device, wherein the testing device generates at least one loop loss value when coupled with the near field communication device;
the network analyzer is electrically connected with the testing device and generates a loop loss curve according to the at least one loop loss value; and
the processor is electrically connected with the network analyzer and is used for comparing whether the loop loss curve is positioned in an abnormal loop loss-free interval or not to generate a test result;
when the loop loss curve is located in the loop loss interval without abnormality, the test result is that the near field communication device is in a normal state; when the loop loss curve is located outside the loop loss interval without anomaly, the test result is that the near field communication device is in an anomaly state.
7. The non-contact test system of claim 6, wherein the distance between the near field communication device and the test device is greater than 0 mm and less than or equal to 2 mm.
8. The non-contact testing system of claim 6, wherein the testing device comprises a coil, the near field communication device comprising an antenna, the coil corresponding to the antenna.
9. The non-contact test system of claim 8, wherein the coil of the test device has a shape similar to the shape of the antenna of the near field communication device and the area of the test device is larger than the area of the near field communication device.
10. The system of claim 6, wherein the abnormal state comprises one of an open state, a short state, a golden finger broken state, a dual-layer flexible circuit board attaching abnormal state, and a dual-layer ferrite attaching abnormal state.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210338272.7A CN116938353A (en) | 2022-04-01 | 2022-04-01 | Non-contact test method and system for near field communication device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210338272.7A CN116938353A (en) | 2022-04-01 | 2022-04-01 | Non-contact test method and system for near field communication device |
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| Publication Number | Publication Date |
|---|---|
| CN116938353A true CN116938353A (en) | 2023-10-24 |
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| CN202210338272.7A Pending CN116938353A (en) | 2022-04-01 | 2022-04-01 | Non-contact test method and system for near field communication device |
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- 2022-04-01 CN CN202210338272.7A patent/CN116938353A/en active Pending
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