CN116930207A - Display method for synchronously amplifying field of view of display area and real-time area - Google Patents

Display method for synchronously amplifying field of view of display area and real-time area Download PDF

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Publication number
CN116930207A
CN116930207A CN202310911904.9A CN202310911904A CN116930207A CN 116930207 A CN116930207 A CN 116930207A CN 202310911904 A CN202310911904 A CN 202310911904A CN 116930207 A CN116930207 A CN 116930207A
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China
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image
area
real
defect
time
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CN202310911904.9A
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CN116930207B (en
Inventor
朱磊
张弛
刘远刚
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Shanghai Gantu Network Technology Co Ltd
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Shanghai Gantu Network Technology Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N2021/0106General arrangement of respective parts
    • G01N2021/0112Apparatus in one mechanical, optical or electronic block
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques

Abstract

The application discloses a display method for synchronously amplifying the visual field of a display area and a real-time area, which relates to the field of image display, and is used for amplifying a target defect image in the image display area in response to receiving a selection operation of the target defect image in the image display area, so as to generate an amplified image in the image display area; responding to the amplifying operation of the target defect image, and moving the line scanning camera to the corresponding defect area on the PCB to scan the image; and synchronously displaying the scanned real-time image in a real-time visual field area, comparing the scanned real-time image with the enlarged image in the image display area, and receiving screening marking operation of a recheck operator on the target defect image. The method for synchronously displaying the display area and the real-time visual field area can carry out matching verification on the defects, eliminate the problem of machine false identification, and correspondingly improve the rechecking efficiency and accuracy compared with a manual mode of semi-rechecking the PCB.

Description

Display method for synchronously amplifying field of view of display area and real-time area
Technical Field
The embodiment of the application relates to the field of AOI image detection, in particular to a display method for synchronously amplifying fields of vision of a display area and a real-time area.
Background
The PCB, also called a printed circuit board, is a carrier for electrically connecting electronic components, and defects, blemishes, and flaws are inevitably generated during the PCB production process. Pcs is the smallest constituent particle or unit of composition of a PCB, which includes several electronic components, and is typically provided on a complete PCB. Although the PCB needs to be automatically scanned and filtered by a machine in the early production stage, the defects identified by the machine need to be rechecked manually in the later production stage so as to screen the PCB meeting the conditions and carry out the subsequent production process.
In the related art, the operation process of manual rechecking requires personnel to check images recognized by a machine one by one, specifically, the defect images are amplified and then matched with a field PCB (printed circuit board) for verification, so that the detection precision is ensured. The manual rechecking mode needs to consider the problems of the size of the PCB and the image display precision, a rechecker needs to continuously adjust the cameras one by one and observe the actual PCB image and the defect prominence, the operation efficiency is low, and the rechecking precision is not high.
Disclosure of Invention
The embodiment of the application provides a display method for synchronously amplifying the visual fields of a display area and a real-time area, which solves the problem of low rechecking efficiency of PCB defects.
In one aspect, the present application provides a display method for synchronously amplifying a field of view of a display area and a real-time area, the method comprising:
in response to receiving a selection operation of a target defect image in an image display area, performing amplification processing on the target defect image, and generating an amplified image in the image display area; the image size and the image resolution of the enlarged image are larger than those of the target defect image; the target defect images are pcs defect images scanned on a PCB by a line scanning camera and identified by a machine, and each target defect image comprises at least one defect point;
responding to the amplifying operation of the target defect image, and moving a line scanning camera to a corresponding defect area on the PCB to scan the image;
and amplifying and displaying the real-time image obtained by scanning in a real-time visual field area, comparing the real-time image with the amplified image in the image display area, and receiving screening marking operation of a recheck operator on the target defect image.
Optionally, the image display area and the real-time field area are located on the same review operation interface, and the image display area and the real-time field area are displayed side by side or are displayed in an up-down arrangement;
a defective image display list is arranged in the image display area, wherein a plurality of defective images which are recognized and intercepted by a machine are listed; the real-time field of view displays a scanned image transmitted by a line scan camera.
Optionally, the display list further includes pcs number information, picture classification information, defect type information and identification results; the ps number information is used for indicating the pcs of the defect images corresponding to the PCS on the PCB, the picture classification information is used for indicating the position areas of the defects on the PCS, the defect type information is used for indicating the types of the defects identified by the machine, the identification result is used for indicating the target PCS or the PCB as the defect materials, and the recheck personnel are used for rechecking confirmation and material screening;
and displaying the corresponding pcs number information, picture classification information, defect type information and identification results in all the defect images in the display list.
Optionally, the defect image establishes a position index label based on the pcs number and the picture classification information; when the target defect image in the image display area is selected, the line scanning camera performs positioning and image scanning according to a target position index tag corresponding to the target defect image.
Optionally, when the target defect image in the image display area is selected, enlarging the target defect image to a target resolution and a target size, and displaying the target defect image in the image display area; the magnified image is displayed in a masking layer overlying the uppermost layer of the image display area.
Optionally, the defect point/area in the defect image is located at the center of the image; and the line scanning camera is used for positioning and scanning the amplified image according to the target resolution and the target size to obtain the real-time image, the real-time image is displayed in the real-time visual field area, and the defect point/area is positioned in the center of the image for display.
Optionally, a camera fine tuning area is further provided in the review operation interface, and an operation control for controlling fine tuning of the line scanning camera in each spatial dimension is provided for adjusting an image frame of the real-time visual field area;
and when the size of the real-time image obtained by scanning is larger than the maximum display size of the real-time visual field, adjusting the position of the line scanning camera by operating a control, and displaying the boundary image of the real-time image in the real-time visual field.
In another aspect, the present application provides a display device for synchronously magnifying a field of view of a display area and a real-time area, the device comprising:
the image generation module is used for carrying out amplification processing on the target defect image in the image display area in response to receiving the selection operation on the target defect image in the image display area, and generating an amplified image in the image display area; the image size and the image resolution of the enlarged image are larger than those of the target defect image; the target defect images are pcs defect images scanned on a PCB by a line scanning camera and identified by a machine, and each target defect image comprises at least one defect point;
the image amplifying module is used for responding to the amplifying operation of the target defect image, and moving the line scanning camera to the corresponding defect area on the PCB to scan the image;
and the display operation module is used for amplifying and displaying the real-time image obtained by scanning in a real-time visual field area, comparing the real-time image with the amplified image in the image display area and receiving screening marking operation of a recheck operator on the target defect image.
In yet another aspect, the present application provides a computer device, where the computer device includes a processor and a memory, where the memory stores at least one instruction, at least one program, a code set, or an instruction set, and the at least one instruction, the at least one program, the code set, or the instruction set is loaded and executed by the processor to implement the display method for synchronously amplifying a field of view of a display area and a real-time area in the above aspect.
In yet another aspect, the present application provides a computer readable storage medium having stored therein at least one instruction, at least one program, a code set, or an instruction set, where the at least one instruction, the at least one program, the code set, or the instruction set is loaded and executed by a processor to implement the display method for synchronously magnifying a field of view of a display area and a real-time area according to the above aspect.
The technical scheme provided by the embodiment of the application has the beneficial effects that at least: the display area is arranged on the computer review interface so as to quickly preview and display the defect image identified by the machine primary inspection, and when the target defect image is selected, the display area is enlarged and displayed, and meanwhile, the line scanning camera is controlled to move to a corresponding position for scanning the real-time image aiming at the target defect image and display the real-time image in the real-time visual field area of the review interface.
Drawings
FIG. 1 is a diagram of a display system for synchronously magnifying the field of view of a display area and a real-time area according to an embodiment of the present application;
FIG. 2 is a flowchart of a display method for synchronously amplifying the field of view of a display area and a real-time area according to an embodiment of the present application;
FIG. 3 is an interface schematic diagram of a review operator interface display presentation area and a real-time field of view area;
FIG. 4 is a schematic diagram of an interface showing an enlarged image of a display area;
FIG. 5 is an interface schematic diagram showing a region and a real-time field of view synchronous magnification defect image;
FIG. 6 is a schematic diagram of a scene of displaying a defect image in a display area when the embodiment display method is applied to golden finger defect detection;
FIG. 7 is a schematic view of a scene showing a target defect map selected and a magnified image mask layer generated;
FIG. 8 is a diagram of a display device with a display area and a real-time area with a synchronously enlarged view field;
fig. 9 is a block diagram of a computer device according to an exemplary embodiment of the present application.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the present application more apparent, the embodiments of the present application will be described in further detail with reference to the accompanying drawings.
References herein to "a plurality" means two or more. "and/or", describes an association relationship of an association object, and indicates that there may be three relationships, for example, a and/or B, and may indicate: a exists alone, A and B exist together, and B exists alone. The character "/" generally indicates that the context-dependent object is an "or" relationship.
The application provides a display system for synchronously amplifying the visual field of a display area and a real-time area, which is shown in fig. 1, and comprises computer equipment, a line scanning camera and a PCB (printed circuit board) for rechecking, wherein communication connection is established between the line scanning camera and the computer equipment and is used for transmitting operation instructions and real-time image pictures scanned by the camera. The computer equipment is controlled by a recheck operator, the interface is a recheck operation interface, the recheck operation interface displays a defect image which is recognized by the machine for primary inspection, the defect image needs the recheck operator for secondary recheck, and the defect of each pcs on the PCB is confirmed. It should be noted that, the defect picture displayed on the retest operation interface for retest operator selection may be determined after the first scanning and machine identification by the line scanning camera, or may be transmitted to the computer device after the machine identification determination in the front end or other production processes. The recheck is required to check the defect type of each defect image to screen, correct, discard, etc.
Fig. 2 is a flowchart of a display method for synchronously amplifying fields of view of a display area and a real-time area, which includes the following steps:
s201, in response to receiving a selection operation of the target defect image in the image display area, amplifying the target defect image, and generating an amplified image in the image display area.
Referring to fig. 3, the review operation interface is a screen displayed on a computer interface, the image display area is located in an area of the interface, and the image display area displays a plurality of defect images, wherein the defect images are pcs defect images scanned on a PCB and identified by a machine, and each defect image comprises at least one identified defect point. Defects are expressed in various forms, such as damage, omission or deviation of components, and the problems affecting production and PCB functions can be detected for manual rechecking by a rechecker. The number of defect images displayed in the image display area is determined according to the setting of the image size by an operator, for example, in the case that the image display area is fixed, the smaller the preview size of each defect image is, the greater the number of defect images that can be previewed in the area is. In one possible implementation, the preview display is performed in a four-grid or nine-grid format within the image display area, as one possible display format of the review interface listed in fig. 3.
In order to facilitate interface observation, the defect image previewed and displayed in a four-grid or nine-grid form is a thumbnail or a thumbnail preview, and when a retest selects a target defect image therein, the target defect image is displayed in an enlarged manner. The magnified image has an image size and image resolution greater than the original target defect image, facilitating the observation of defect points and defect details, e.g., from 800 x 800 magnification to 1600 x 1600 resolution display.
S202, in response to the amplifying operation of the target defect image, the line scanning camera is moved to the corresponding defect area on the PCB to scan the image.
The purpose of the recheck is to prevent false detection of the machine, so that the recheck is only required to perform matching check on the real-time image. For the computer equipment, after the recheck operator selects to amplify the target defect image, an instruction is sent to the line scanning camera, so that the camera moves to the corresponding defect area on the PCB again to scan the image, and then the image is displayed on the recheck operation interface and is compared with the amplified image of the target defect image.
S203, synchronously displaying the real-time image obtained by scanning in a real-time visual field area, comparing the real-time image with the enlarged image in the image display area, and receiving screening marking operation of the object defect image by a recheck.
The purpose of screening the marks is to confirm the defects of the machine initially identified, such as confirming the defects or false detection, or pass the machine under the condition of small defect problem and small influence of the whole function, and discard the marks when the defect problem has large influence on the whole function.
The display of the real-time field area is the picture acquired by the camera at the current moment, so that the false detection situation of the camera can be eliminated, and even the newly generated defect is marked. In one possible embodiment, the resolution setting of the real-time image displayed in the real-time field of view and the resolution of the magnified image may be unified, which also facilitates comparative viewing. Because the line scanning camera can move and scan in all dimensions of the PCB, a real-time image matched with the enlarged image can be obtained through focusing, angle adjustment and other operations.
In summary, in the embodiment of the application, the display area is set on the computer recheck interface to rapidly preview and display the defect image identified by the machine initial inspection, and when the target defect image is selected, the display area is enlarged and displayed, and meanwhile, the line scanning camera is controlled to move to a corresponding position to scan the real-time image aiming at the target defect image and display the real-time image in the real-time visual field area of the recheck interface.
As shown in fig. 3, the real-time field of view area and the image display area are both located side by side on the same review operation interface, or the image display area and the real-time field of view area are displayed in an up-down arrangement, and a defective image display list is arranged in the image display area, wherein a plurality of defective images (in the form of four-bar or nine-bar etc.) identified and intercepted by a machine are listed. The defect image display list displays detailed information according to functions such as ps number information, picture classification information, defect type information, recognition results, and the like in the display list.
The ps serial number information is used for indicating that the defect image corresponds to a ps sequence on the PCB, and because the ps serial number and positioning are needed in the PCB stamping and realizing process, the re-inspection directly uses the ps serial number information of the PCB, for example, the ps 005 and the ps 008 are identified, and the defect is detected.
The picture classification information is used to indicate the location area of the defect on the pcs, which are typically populated with components, chips, silicon boards, printed text, etc., as each pcs defines the area size, similar to a complete integrated circuit board. The defect type can be lack of components or too many components during stamping, and the components are inclined or deviate from target positions, cracks of a silicon plate, text leakage, inclination and other problems. In one possible real-time manner, the machine identification automatically confirms the defect type, and the intercepted pictures are displayed in a classified manner in the list, so that the recheck can conveniently identify the pictures.
The identification result is used for indicating that the target pcs or the PCB is defective, for example, the identification result NG indicates that the target pcs or the PCB is not passed, and a recheck operator rechecks the defective picture of NG under normal conditions, and when rechecks the defective picture, the recheck operator can correct the mark of the defective picture to OK, otherwise, the recheck operator confirms the defective picture as a problem plate and is used for screening the materials.
All the defect images in the display list are displayed with the corresponding pcs number information, picture classification information, defect type information and identification result, so that the retest can conveniently manually enlarge the images one by one for verification.
As shown in fig. 4, when the retest selects the target defect image in the image presentation area, the computer device enlarges the target defect image to a target resolution and a target size and overlays the uppermost presentation displayed in the image presentation area in the form of a mask layer. The aim of this operation is to make it easy for the rechecker to see clearly the machine identification and the content information of the intercepted image, checking whether the identification is wrong. In one possible embodiment, the cut defect image is cut at the geometric center of the defect image, i.e. the blemish/defect map is at the center of the defect image, so that the normal area around the blemish can be observed to the maximum. As in fig. 4, the missing component image is placed in the center of the frame at a target size of 900 x 900 resolution. Correspondingly, the real-time image displayed in the real-time visual field area is also displayed by taking the defect point as the geometric center.
When the image display area displays the amplified image, the line scanning camera repair needs to immediately act to acquire and display the corresponding image on the PCB in the real-time visual field area. When the computer equipment generates a display list, a position index label is established based on the pcs number and the picture classification information of the defect image, and the position index label is used for performing interactive operation with the line scanning camera. That is, the line scan camera performs mobile positioning and scanning of the image according to the transferred position index tag. Of course, to ensure consistency of the matching images, the target size and target resolution may also be added to the location index tag. The line scanning camera moves to a target pcs according to the number of the pcs, and then positions to specific position areas of the pcs, such as a character printing area, a component area or a chip area, according to the picture classification information. The target size and the target resolution are used for adjusting the focal length, the angle and other gestures of the camera, and restoring and magnifying the visual picture with consistent images.
In some other embodiments, real-time frames with different resolutions and different sizes can be selected, so long as the comparison and verification can be conveniently performed by a retest. The resolution adjustment control can be further arranged in the real-time visual field area, and the retest manually adjusts the picture amplification proportion in the real-time visual field area according to picture conditions so as to meet personalized requirements.
In order to achieve the optimal visual effect, the area of the image display area in the recheck interface is larger than that of the real-time visual field area, and therefore more preview pictures can be displayed in the display list as much as possible, rechecks can intuitively know how many defects are recognized on the same pcs according to the pcs number information, and the recheck work is roughly mastered. Based on this, when the resolution or the image size is consistent with the enlarged image, if the enlarged image is larger and is larger than the maximum display size of the real-time field of view, the situation that the complete real-time image cannot be observed may occur, the frame of the real-time field of view is set up, the retest cannot intuitively peep the review, and then fine adjustment is needed for the real-time image or the line scan camera.
As shown in fig. 5, a camera fine adjustment area is further provided in the review operation interface, where an operation control for controlling fine adjustment of the line scan camera in each spatial dimension is provided for adjusting an image frame of the real-time field of view area. The operation controls can be up, down, left, right and the like, and the operation controls can control the line scanning camera to slightly move in the corresponding direction so as to display the picture boundary information.
The captured image is usually larger than the size of the magnified image when the line scan camera is in a controlled pose, but is cut out in a consistent manner when displayed. The process of fine tuning the camera through the computer control inevitably generates certain delay and has complex operation. Therefore, the original image scanned by the line scanning camera can be stored by default, when the problem of incomplete display of the size occurs, the fine adjustment of the operation control means the moving operation of the stored original image, the boundary image can be displayed in a targeted manner, and even the pcs information outside the enlarged image can be observed.
Fig. 6 is a schematic view of a scene showing a defect image in a display area when the embodiment display method is applied to golden finger defect detection, wherein pcs listed with pcs005 number identify all defect types and corresponding defect images. Meanwhile, a pcs or a PCB board is considered to detect a large number of defect images, so that a quick searching display control is arranged at the bottom of the display area. In one possible implementation, when the rechecker determines that a certain defect image is detected correctly, the rechecker confirms that the defect image after confirmation is automatically checked out, and the subsequent defect images are automatically refreshed and displayed in an array. When the "NG" detection is faulty, the rechecker modifies the "NG" to "OK" or other form to correct the machine false detection. Optionally, the "confidence information" may also be displayed in the display list, to indicate the accuracy of identifying the defect type by the machine defect identifying and detecting algorithm, where the larger the value is, the higher the certainty factor of identifying the defect is, and the retest operator may filter the display list by setting the confidence threshold, and only retest the defect image with a lower value of the confidence, so as to improve the retest efficiency under the condition that the retest rate is satisfied and the pcs function is not affected.
FIG. 7 is a schematic view of a scene in which a target defect map is selected and a magnified image mask layer is generated, the schematic view displaying information of the defect image at the uppermost layer of the image, and a close control is set. And after the matching of the retest is completed, clicking a control to restore the display list state, and then marking the display list state.
Fig. 8 shows a display device for synchronously magnifying fields of view of a display area and a real-time area, which includes:
the image generation module is used for carrying out amplification processing on the target defect image in the image display area in response to receiving the selection operation on the target defect image in the image display area, and generating an amplified image in the image display area; the image size and the image resolution of the enlarged image are larger than those of the target defect image; the target defect images are pcs defect images scanned on a PCB by a line scanning camera and identified by a machine, and each target defect image comprises at least one defect point;
the image amplifying module is used for responding to the amplifying operation of the target defect image, and moving the line scanning camera to the corresponding defect area on the PCB to scan the image;
and the display operation module is used for synchronously displaying the real-time image obtained by scanning in the real-time visual field area, comparing the real-time image with the enlarged image in the image display area and receiving screening marking operation of a recheck operator on the target defect image.
In addition, the application also provides a computer device, which comprises a processor and a memory, wherein at least one instruction, at least one section of program, code set or instruction set is stored in the memory, and the at least one instruction, the at least one section of program, the code set or instruction set is loaded and executed by the processor to realize the display method for synchronously amplifying the field of view of the display area and the real-time area.
In addition, the application also provides a computer readable storage medium, wherein at least one instruction, at least one section of program, code set or instruction set is stored in the readable storage medium, and the at least one instruction, the at least one section of program, the code set or instruction set is loaded and executed by a processor to realize the display method for synchronously amplifying the field of view of the display area and the real-time area.
The display device for synchronously amplifying the fields of view of the display area and the real-time area provided by the embodiment of the application can be applied to the display method for synchronously amplifying the fields of view of the display area and the real-time area provided by the embodiment of the application, and the related details refer to the embodiment of the method, so that the implementation principle and the technical effect are similar, and are not repeated.
It should be noted that, when the display device for synchronously amplifying the field of view of the display area and the field of view of the real-time area provided in the embodiment of the present application performs panoramic and local preview display, only the division of the above functional modules/functional units is used for illustration, and in practical application, the above functional allocation may be completed by different functional modules/functional units according to needs, that is, the internal structure of the display device for synchronously amplifying the field of view of the display area and the field of view of the real-time area is divided into different functional modules/functional units, so as to complete all or part of the functions described above. In addition, the implementation of the display method for synchronously amplifying the fields of the display area and the real-time area provided by the embodiment of the method and the implementation of the display device for synchronously amplifying the fields of the display area and the real-time area provided by the embodiment of the method belong to the same concept, and the specific implementation process of the display device for synchronously amplifying the fields of the display area and the real-time area provided by the embodiment of the method is detailed in the embodiment of the method and is not repeated here.
Fig. 9 shows a block diagram of a computer device according to an exemplary embodiment of the present application. Is a computer device such as a desktop computer, a notebook computer, a palm computer, a cloud server, and the like. The computer device may include, but is not limited to, a processor and a memory. Wherein the processor and the memory may be connected by a bus or other means. The processor may be a central processing unit (Central Processing Unit, CPU). The processor may also be other general purpose processors, digital signal processors (Digital Signal Processor, DSP), application specific integrated circuits (Application Specific Integrated Circuit, ASIC), field programmable gate arrays (Field-Programmable Gate Array, FPGA) or other programmable logic devices, graphics processors (Graphics Processing Unit, GPU), embedded Neural network processors (Neural-network Processing Unit, NPU) or other specialized deep learning coprocessors, discrete gate or transistor logic devices, discrete hardware components, or a combination of the above.
The processor may include one or more processing cores, such as a 4-core processor, an 8-core processor, and the like. The processor may be implemented in at least one hardware form of DSP (Digital Signal Processing ), FPGA (Field-Programmable Gate Array, field programmable gate array), PLA (Programmable Logic Array ). The processor 1701 may also include a main processor and a coprocessor, the main processor being a processor for processing data in an awake state, also referred to as a CPU (Central Processing Unit ); a coprocessor is a low-power processor for processing data in a standby state. In some embodiments, the processor may be integrated with a GPU (Graphics Processing Unit, image processor) for taking care of rendering and rendering of the content that the display screen is required to display. In some embodiments, the processor may also include an AI (Artificial Intelligence ) processor for processing computing operations related to machine learning.
The memory is used as a non-transitory computer readable storage medium for storing non-transitory software programs, non-transitory computer executable programs, and modules, such as program instructions/modules corresponding to the methods in the above embodiments of the present application. The processor executes various functional applications of the processor and data processing, i.e., implements the methods of the method embodiments described above, by running non-transitory software programs, instructions, and modules stored in memory. The memory may include a memory program area and a memory data area, wherein the memory program area may store an operating system, at least one application program required for a function; the storage data area may store data created by the processor, etc. In addition, the memory may include high-speed random access memory, and may also include non-transitory memory, such as at least one magnetic disk storage device, flash memory device, or other non-transitory solid state storage device. In some implementations, the memory optionally includes memory remotely located relative to the processor, the remote memory being connectable to the processor through a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
In some embodiments, the computer device may further optionally include: a peripheral interface and at least one peripheral. The processor, memory, and peripheral interfaces may be connected by buses or signal lines. The individual peripheral devices may be connected to the peripheral device interface via buses, signal lines or circuit boards. Specifically, the peripheral device includes: at least one of a radio frequency circuit, a display screen and a keyboard.
The peripheral interface may be used to connect at least one Input/Output (I/O) related peripheral to the processor and the memory. In some embodiments, the processor, memory, and peripheral interfaces are integrated on the same chip or circuit board; in some other embodiments, either or both of the processor, memory, and peripheral interface may be implemented on separate chips or circuit boards, which is not limiting in this embodiment.
The display screen is used to display a UI (User Interface). The UI may include graphics, text, icons, video, and any combination thereof. When the display is a touch display, the display also has the ability to collect touch signals at or above the surface of the display. The touch signal may be input to the processor for processing as a control signal. At this time, the display screen may also be used to provide virtual buttons and/or virtual keyboards, also referred to as soft buttons and/or soft keyboards. In some embodiments, the display screen may be one, disposed on the front panel of the computer device; in other embodiments, the display screen may be at least two, respectively disposed on different surfaces of the computer device or in a folded design; in other embodiments, the display may be a flexible display disposed on a curved surface or a folded surface of the computer device. Even more, the display screen may be arranged in a non-rectangular irregular pattern, i.e. a shaped screen. The display screen may be made of LCD (Liquid Crystal Display ), OLED (Organic Light-Emitting Diode) or other materials.
The power supply is used to power the various components in the computer device. The power source may be alternating current, direct current, disposable or rechargeable. When the power source comprises a rechargeable battery, the rechargeable battery may be a wired rechargeable battery or a wireless rechargeable battery. The wired rechargeable battery is a battery charged through a wired line, and the wireless rechargeable battery is a battery charged through a wireless coil. The rechargeable battery may also be used to support fast charge technology.
Those skilled in the art will appreciate that the architecture shown in fig. 9 is not limiting of the computer device and may include more or fewer components than shown, or may combine certain components, or employ a different arrangement of components.
The embodiment of the application also discloses a computer readable storage medium. In particular, a computer readable storage medium is used for storing a computer program which, when executed by a processor, implements the method of the above-described method embodiments. It will be appreciated by those skilled in the art that implementing all or part of the above-described methods according to the present application may be implemented by a computer program for instructing relevant hardware, and the program may be stored in a computer readable storage medium, and the program may include the steps of the above-described embodiments of the methods when executed. Wherein the storage medium may be a magnetic Disk, an optical Disk, a Read-Only Memory (ROM), a random access Memory (Random Access Memory, RAM), a Flash Memory (Flash Memory), a Hard Disk (HDD), or a Solid State Drive (SSD); the storage medium may also comprise a combination of memories of the kind described above.
The present embodiment is only for explanation of the present application and is not to be construed as limiting the present application, and modifications to the present embodiment, which may not creatively contribute to the present application as required by those skilled in the art after reading the present specification, are all protected by patent laws within the scope of claims of the present application.

Claims (10)

1. A display method for synchronously amplifying fields of view of a display area and a real-time area, the method comprising:
in response to receiving a selection operation of a target defect image in an image display area, performing amplification processing on the target defect image, and generating an amplified image in the image display area; the image size and the image resolution of the enlarged image are larger than those of the target defect image; the target defect images are pcs defect images scanned on a PCB by a line scanning camera and identified by a machine, and each target defect image comprises at least one defect point;
responding to the amplifying operation of the target defect image, and moving a line scanning camera to a corresponding defect area on the PCB to scan the image;
and synchronously displaying the scanned real-time image in a real-time visual field area, comparing the scanned real-time image with the enlarged image in the image display area, and receiving screening marking operation of a recheck operator on the target defect image.
2. The method of claim 1, wherein the image display area and the real-time field of view area are located on the same review interface, the image display area and the real-time field of view area being displayed side-by-side or in a top-to-bottom arrangement;
a defective image display list is arranged in the image display area, wherein a plurality of defective images which are recognized and intercepted by a machine are listed; the real-time field of view displays a scanned image transmitted by a line scan camera.
3. The method according to claim 2, wherein the display list further comprises pcs number information, picture classification information, defect type information, and recognition results; the ps number information is used for indicating the pcs of the defect images corresponding to the PCS on the PCB, the picture classification information is used for indicating the position areas of the defects on the PCS, the defect type information is used for indicating the types of the defects identified by the machine, the identification result is used for indicating the target PCS or the PCB as the defect materials, and the recheck personnel are used for rechecking confirmation and material screening;
and displaying the corresponding pcs number information, picture classification information, defect type information and identification results in all the defect images in the display list.
4. A method according to claim 3, wherein the defect image builds a location index tag based on the pcs number and picture classification information; when the target defect image in the image display area is selected, the line scanning camera performs positioning and image scanning according to a target position index tag corresponding to the target defect image.
5. The method of claim 1, wherein when the target defect image in the image presentation area is selected, the target defect image is enlarged to a target resolution and target size and presented in the image presentation area; the magnified image is displayed in a masking layer overlying the uppermost layer of the image display area.
6. The method of claim 5, wherein a defect point/area in the defect image is located at an image center position; and the line scanning camera is used for positioning and scanning the amplified image according to the target resolution and the target size to obtain the real-time image, the real-time image is displayed in the real-time visual field area, and the defect point/area is positioned in the center of the image for display.
7. The method of claim 6, wherein a camera fine adjustment area is further provided in the review operation interface, and wherein an operation control for controlling fine adjustment of the line scan camera in each spatial dimension is provided for adjusting an image frame of the real-time field of view area;
and when the size of the real-time image obtained by scanning is larger than the maximum display size of the real-time visual field, adjusting the position of the line scanning camera by operating a control, and displaying the boundary image of the real-time image in the real-time visual field.
8. A display device for synchronously magnifying the field of view of a display area and a real-time area, the device comprising:
the image generation module is used for carrying out amplification processing on the target defect image in the image display area in response to receiving the selection operation on the target defect image in the image display area, and generating an amplified image in the image display area; the image size and the image resolution of the enlarged image are larger than those of the target defect image; the target defect images are pcs defect images scanned on a PCB by a line scanning camera and identified by a machine, and each target defect image comprises at least one defect point;
the image amplifying module is used for responding to the amplifying operation of the target defect image, and moving the line scanning camera to the corresponding defect area on the PCB to scan the image;
and the display operation module is used for synchronously displaying the real-time image obtained by scanning in the real-time visual field area, comparing the real-time image with the enlarged image in the image display area and receiving screening marking operation of a recheck operator on the target defect image.
9. A computer device comprising a processor and a memory, wherein the memory stores at least one instruction, at least one program, a set of codes, or a set of instructions, the at least one instruction, the at least one program, the set of codes, or the set of instructions being loaded and executed by the processor to implement a display method for synchronously magnifying a field of view of a presentation area and a real-time area according to any one of claims 1 to 7.
10. A computer readable storage medium having stored therein at least one instruction, at least one program, code set, or instruction set, the at least one instruction, the at least one program, the code set, or instruction set being loaded and executed by a processor to implement a display method of synchronously magnifying a field of view of a presentation area and a real-time area according to any one of claims 1 to 7.
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