CN116907795B - Multi-dimensional characterization method and device for leaky plasmon mode - Google Patents
Multi-dimensional characterization method and device for leaky plasmon mode Download PDFInfo
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Abstract
The invention discloses a multi-dimensional characterization method and device for a leaky plasmon mode, which are characterized in that a solution with a silver nanowire plasmon waveguide is spin-coated on a cover glass, excitation and collection of the leaky mode of the plasmon waveguide are realized by utilizing an oil immersion objective lens to converge continuous white light, a self-built microscopic angle resolution spectrometer with momentum space and real space selective area analysis capability is based, and a leaky mode microscope is combined to realize simultaneous resolution of momentum and energy of a one-dimensional plasmon waveguide so as to acquire information such as momentum space distribution, polarization, dispersion relation and the like of the leaky mode of the waveguide. The invention provides a universal and convenient scheme for researching the spectral properties of one-dimensional plasmon waveguide and other similar micro-nano structure systems.
Description
Technical Field
The invention relates to the field of micro-nano measurement, in particular to a multi-dimensional characterization method and device for a leakage plasmon mode based on oil immersion Fourier angle resolution imaging and spectrum technology.
Background
Along with the progress of micro-nano processing technology, the device performance is improved, the power consumption and the cost are reduced through miniaturization and integration of the photoelectric device, and the micro-nano processing technology is an unavoidable development trend of the future photoelectronic industry and has important research significance. However, with the failure of moore's law, the integration platform using dielectric materials will face serious development bottlenecks, especially in the field of optical chips, and it is very important to find a development platform which is expected to develop in a long way.
The surface plasmon is a collective oscillation wave formed by coupling free electrons in metal and an incident light field, and compared with a dielectric structure, the surface plasmon has the biggest advantage of breaking through the optical diffraction limit, thereby realizing unprecedented high integration and performance improvement of the photoelectric element. Meanwhile, due to the strong light field binding capacity of the surface plasmon, huge electromagnetic field near field enhancement can be provided in the nanometer or even picometer range, and the interaction between light and substances can be remarkably improved. Based on the above advantages, plasmonic photonics has been widely used in the fields of micro-nano light source, biomedical and imaging, sensing and detection, and many long-felt developments have been made.
As an important component unit of the surface plasmon integrated optical device, the metal nanowire waveguide has been widely studied due to its simple mode, especially the noble metal silver plasmon waveguide, and is often used as a model for researching the optical properties of the metal plasmon waveguide due to the advantages of low transmission loss, easy preparation, good single crystal property and the like.
It is well known that the transmission mode of a silver nanowire waveguide is dependent on the surrounding dielectric environment and the waveguide diameter, for example, by changing the diameter of the silver nanowire waveguide, the electromagnetic field mode order and the number of modes of the plasmonic waveguide can be controlled, and when the dielectric constant around the waveguide is changed, the mode dispersion of the plasmons can be regulated.
It should be emphasized that the dispersion relation of the surface plasmon waveguide is one of the important means for researching the mode optical properties of the surface plasmon waveguide, and can provide important theoretical and experimental references for the plasmon waveguide in the aspects of the application of designing the interaction between light and substances, optimizing the performance of photoelectric devices, constructing an optical integrated chip and the like.
However, at present, there are many theoretical works about the research on the dispersion and the related properties of the one-dimensional plasmon waveguide, the experimental results are relatively few, especially the measurement of the dispersion of the leakage mode plasmon, and a rapid characterization means is still lacking, and the previous experimental measurement depends on fourier imaging and single-frequency scanning technologies, which is time-consuming in operation and has many inconveniences.
Disclosure of Invention
The invention mainly aims at a multidimensional characterization method and a multidimensional characterization device for a leakage plasmon mode based on oil immersion Fourier angle resolution imaging and spectrum technology, which have simple structures and are rapid to measure.
The technical scheme adopted by the invention is as follows:
the multi-dimensional characterization method of the leaky plasmon mode comprises the following steps:
spin-coating a solution containing silver nanowires on a clean cover glass to obtain uniform and discrete single plasmon waveguide, and exciting plasmon modes from the waveguide end by utilizing white light;
exciting and collecting signals of single plasmon waveguides which are uniformly separated through an oil immersion objective lens;
the signals are converged by the oil immersion objective lens and the lens to form real space imaging of the silver nanowire, and the real space imaging is subjected to area selection by utilizing a first slit with adjustable position and size to extract the signals to be researched;
at the momentum space imaging position behind the first slit, continuing to perform area selection analysis on the momentum space signal in the specific transmission direction by utilizing the second slit with adjustable position and size;
amplifying the momentum space signal passing through the second slit by using a 4f optical system and projecting the momentum space signal into a grating spectrometer for dispersion analysis;
the reflecting mirror can be turned over and placed in front of the 4f optical system, the signals of the lenses are deflected by 90 degrees by the reflecting mirror to be reflected to the other lenses and converged on the imaging camera, and the switching between real space imaging and momentum space Fourier imaging is realized by moving the position of the imaging camera.
The reflecting mirror is turned over, and the signal of the second slit directly passes through the 4f optical system and is subjected to an angle-resolved spectrum test by a spectrometer;
and analyzing real space imaging, momentum space Fourier imaging and spectrum to obtain multi-dimensional characterization of the leakage plasmon mode.
By adopting the technical scheme, the thickness of the cover glass is less than 0.2mm.
With the technical scheme, the imaging camera is placed on the displacement table capable of moving rapidly.
By adopting the technical scheme, the light from the halogen lamp light source is collimated and converged to the silver nanowire waveguide end through the oil immersion objective lens, and the polarization direction of the excited light is regulated and controlled to be parallel to the nanowire waveguide through the linear polarizer so as to improve the excitation efficiency of the plasmon.
By adopting the technical scheme, the propagated leakage plasmon signal is selected by using the adjustable first slit, so that the influence of in-situ excitation background light and the background light scattered from the other end head of the waveguide on experimental results is reduced.
The invention also provides a multi-dimensional characterization device of the leakage plasmon mode, which comprises:
a white light source;
a cover glass is spin-coated with a solution containing silver nanowires to obtain uniform and discrete single plasmon waveguide, and a plasmon mode is excited from the waveguide end by utilizing white light;
the oil immersion objective lens is used for exciting and collecting signals of single plasmon waveguides which are uniformly and separately arranged;
the first lens is arranged behind the oil immersion objective lens and is used for real-space imaging of the silver nanowires;
the first slit is adjustable in position and size and is used for selecting a region for real space imaging and extracting a signal to be researched;
the second slit is adjustable in position and size, is arranged at the momentum space imaging position behind the first slit and is used for continuously carrying out area selection analysis on momentum space signals in a specific transmission direction;
the 4f optical system is used for amplifying the momentum space signal passing through the second slit and projecting the momentum space signal into the grating spectrometer for dispersion analysis;
the Fourier-real space imaging system comprises a second lens and a reflecting mirror, wherein the reflecting mirror can be turned over and is arranged in front of the 4f optical system, signals of the first lens are deflected by 90 degrees by the reflecting mirror to be reflected to the second lens and converged on an imaging camera, and the switching between real space imaging and momentum space Fourier imaging is realized by moving the position of the imaging camera; when the reflector is turned over, the signal of the second slit directly enters the spectrometer through the 4f optical system so as to perform an angle-resolved spectrum test.
With the technical proposal, the white light source is a halogen lamp.
By adopting the technical scheme, the device further comprises a linear polarizer for regulating and controlling the polarization direction of the excited light to be parallel to the nano waveguide so as to improve the excitation efficiency of the plasmon.
By adopting the technical scheme, the device also comprises a displacement table capable of moving rapidly, and an imaging camera is placed on the displacement table.
With the above technical solution, the 4f optical system includes two lenses.
The invention has the beneficial effects that: the invention provides multidimensional spectroscopy characterization technologies such as polarization analysis, real space imaging, momentum space imaging, modal dispersion measurement and the like for light cone external light information based on the oil immersion objective lens, and successfully realizes omnibearing spectrum measurement of a leakage plasmon mode.
In addition, the imaging camera is arranged on the guide rail table capable of moving rapidly, real space imaging and Fourier imaging can be switched rapidly, redundancy of an experimental device is reduced, and the equipment is integrated and efficient.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions of the prior art, the following description will briefly explain the drawings used in the embodiments or the description of the prior art, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic structural diagram of an oil immersion Fourier imaging technology and angle resolution spectroscopy technology-based combined device according to an embodiment of the invention;
FIG. 2a is a photograph of a silver nanowire waveguide selected for experimental use in an embodiment of the present invention;
FIG. 2b is a real space imaging of leakage modes with collection polarization in the case of vertical waveguides in accordance with an embodiment of the present invention;
FIG. 2c is a real space imaging of leakage modes with collection polarization in the case of parallel waveguides in an embodiment of the present invention;
FIG. 3a is a Fourier image of a collection polarization in the case of parallel waveguides for a leaky mode in accordance with an embodiment of the invention;
FIG. 3b is a Fourier image of the collection polarization of a leaky mode with vertical waveguides in accordance with an embodiment of the invention;
FIG. 4 is a graph of a dispersion spectrum revealing plasmonic modes in an embodiment of the invention;
FIG. 5 is a flowchart of a multi-dimensional characterization method of revealing plasmonic modes, according to an embodiment of the invention;
in the figure: 11-a lens; 12-lens; 13-a lens; 14-a lens; 15-a mirror; 21-a slit; 22-slit.
Detailed Description
The present invention will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present invention more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
Example 1
According to the invention, a solution with a silver nanowire plasmon waveguide is mainly spin-coated on a cover glass, excitation and collection of a plasmon waveguide leakage mode are realized by utilizing an oil immersion objective lens to converge continuous white light on the other side of a sample, a self-built microscopic angle resolution spectrum test system with momentum space and real space selective area analysis capability is based, and a one-dimensional plasmon waveguide momentum and energy simultaneous resolution is realized by combining a leakage mode microscope, so that information such as momentum space distribution, polarization, dispersion relation and the like of the leakage mode of the waveguide is obtained.
As shown in fig. 1, the multi-dimensional characterization device for revealing a plasmon mode according to an embodiment of the present invention includes:
a white light source;
a cover glass is spin-coated with a solution containing silver nanowires to obtain uniform and discrete single plasmon waveguide, and a plasmon mode is excited from the waveguide end by utilizing white light;
the oil immersion objective lens is used for exciting and collecting signals of single plasmon waveguides which are uniformly and separately arranged;
a lens 11, which is arranged behind the oil immersion objective lens and is used for real space imaging of the silver nanowires;
the slit 21 is adjustable in position and size and is used for selecting a region for real space imaging and extracting a signal to be researched;
the slit 22 is adjustable in position and size, is arranged at a momentum space imaging position behind the slit 21 and is used for continuously carrying out area selection analysis on momentum space signals in a specific transmission direction;
a 4f optical system for amplifying the momentum space signal passing through the slit 22 and projecting into a grating spectrometer for dispersion analysis; the 4f optical system includes a lens 12 and a lens 13;
the Fourier-real space imaging system comprises a lens 14 and a reflecting mirror 15, wherein the reflecting mirror can be turned over and is arranged in front of the 4f optical system, signals of the lens 11 are deflected by 90 degrees to be reflected to the lens 14 and converged on an imaging camera, and the switching between real space imaging and momentum space Fourier imaging is realized by moving the position of the imaging camera; when the mirror is turned over, the signal from the slit 22 enters the spectrometer directly through the 4f optical system for angular resolved spectroscopic testing.
Because the plasmon leakage mode is light cone angle external radiation, the invention selects the oil immersed objective lens as the excitation and collection lens. Because the numerical aperture ratio of the oil immersed objective lens is larger, the corresponding collection angle is larger, and the optical signals radiated to space from the evanescent optical field can be collected and analyzed, namely the surface plasmon signals in the patent. The signal can form real space imaging of silver nanowires through the lens 11, the real space imaging is selected by utilizing the slit 21 with adjustable position and size, the signal to be researched is extracted, and the measuring signal-to-noise ratio is improved. A position behind the slit 21 is a momentum space imaging position, and the signal of a specific transmission direction (momentum) can be selectively analyzed by using the adjustable slit 22.
The momentum space is then amplified using a 4f optical system and projected into a grating spectrometer for dispersion analysis. In addition, the imaging camera is placed on a fast moving displacement stage by placing a reversible mirror in front of the 4f optical system and focusing the signal onto the imaging camera through lens 14. Because the convergence points of the real space imaging and the Fourier space imaging are different after passing through the lens 14, the convenient switching between real space imaging analysis and momentum space Fourier imaging can be realized by moving the displacement platform.
According to the embodiment, through the matching of the lenses, on one hand, the angle resolution and the real space resolution of the whole system are high, and on the other hand, the real space imaging position and the Fourier imaging position can be separated in space, so that the real space and Fourier space selective analysis can be carried out.
Example 2
This embodiment is a multi-dimensional characterization method based on the leaky plasmon mode of embodiment 1, as shown in fig. 5, comprising the steps of:
s1, spin-coating a solution containing silver nanowires on a clean cover glass to obtain uniform and discrete single plasmon waveguide, and exciting a plasmon mode from the waveguide end by utilizing white light;
s2, exciting and collecting signals of single plasmon waveguides which are uniformly separated through the oil immersion objective lens;
s3, forming real space imaging of the silver nanowires after the signals pass through the oil immersion objective lens and the lens, selecting a region of the real space imaging by utilizing a first slit with adjustable position and size, and extracting the signals to be researched;
s4, continuously analyzing the selected area of the momentum space signal in the specific transmission direction by using a second slit with adjustable position and size at the momentum space imaging position behind the first slit;
s5, amplifying the momentum space signal passing through the second slit by using a 4f optical system, and projecting the momentum space signal into a grating spectrometer for dispersion analysis;
s6, a reflecting mirror can be turned over and placed in front of the 4f optical system, signals of the lenses are deflected by 90 degrees through the reflecting mirror to be reflected to the other lenses and converged on an imaging camera, and switching between real space imaging and momentum space Fourier imaging is achieved through moving the position of the imaging camera.
S7, turning the reflector, wherein the signal of the second slit directly passes through the 4f optical system and is subjected to an angle-resolved spectrum test by a spectrometer;
and S8, analyzing real space imaging, momentum space Fourier imaging and spectrum to obtain multi-dimensional characterization of the leakage plasmon mode.
Further, the imaging camera is placed on a rapidly movable displacement stage. Because the convergence points of the real space imaging and the Fourier space imaging are different after passing through the lens 4, the convenient switching of the real space imaging analysis and the momentum space Fourier imaging can be realized by moving the displacement platform.
Specifically, the light from the halogen lamp light source can be collimated and converged to the silver nanowire waveguide end through the oil immersion objective lens, and the polarization direction of the excited light is regulated and controlled to be parallel to the nanowire waveguide through the linear polarizer so as to improve the excitation efficiency of the plasmon.
The propagated leakage plasmon signal can be selected by using the adjustable first slit, so that the influence of in-situ excitation background light and the background light scattered by the other end of the waveguide on experimental results is reduced.
Example 3
This embodiment is based on embodiment 1, and not only can the dispersion relation of plasmon leakage modes be obtained in one step, but also information of polarization, dispersion, fourier space imaging distribution, and the like of the relevant modes can be provided.
In the embodiment, silver nanowires are selected as plasmon waveguides, the silver nanowires are prepared by a chemical liquid phase synthesis method, the propagation loss of single crystals is small, and the crystallization time is controlled so that the length of the waveguides is more than 10 mu m and the diameter is about 200nm.
The solution containing silver nanowires is spin-coated on a clean cover glass (the thickness is smaller than 0.2mm, and the thickness is selected to be 0.17mm in the embodiment), so that single plasmon waveguide which is evenly and separately obtained. The spectrum and Fourier imaging device with the angle resolution capability based on the oil immersed objective lens which is built independently is shown in fig. 1, and as the plasmon leakage mode is light cone angle external radiation, the system selects the oil immersed objective lens as an excitation and collection lens.
The signal can form real space imaging of silver nanowires at the position of 150mm behind the lens 11 by passing through the lens 11 (the lens 11 is a one-inch double-glued convex lens with the same size and model, the focal length f1=150 mm and is arranged at the position 300mm away from the back focal plane of the objective lens), the real space imaging is selected by utilizing the slit 21 with adjustable position and size, the signal to be researched is extracted, and the measuring signal to noise ratio is improved. 150mm after the slit 21 is the momentum space imaging position, and the adjustable slit 22 can be used for carrying out selective analysis on signals of specific transmission directions (momentums).
The momentum space is then amplified by a 4f system and projected into a grating spectrometer for dispersion analysis (wherein the 4f system in this experimental scheme selects a focal length f2=50 mm of lens 12 and a focal length f3=175 mm of lens 13). In addition, by placing a reversible mirror in front of the lens 12 and converging the signal through the lens 14 (focal length f4=125 mm) onto an imaging camera, the imaging camera is placed on a rapidly movable displacement stage.
Because the convergence points of the real space imaging and the Fourier space imaging are different after passing through the lens 14, the convenient switching between real space imaging analysis and momentum space Fourier imaging can be realized by moving the displacement platform.
In order to obtain a dispersion curve in a broadband range of the plasmon, light from a halogen lamp light source is collimated and converged to the end of a silver nanowire waveguide through an oil immersion objective lens, and the polarization direction of excitation light is regulated and controlled to be parallel to the nanowire waveguide through a linear polarizer so as to improve the excitation efficiency of the plasmon.
The nanowire waveguide is searched on an imaging camera for bright field microscopic imaging as shown in fig. 2a. The plasmon modes are excited from the waveguide end by using white light, and transmission imaging of the leaky plasmon modes under different polarization collection conditions is observed, as shown in fig. 2b and fig. 2c, which shows that the leaky plasmons radiate out on two sides of the nanowire waveguide and have different spatial polarization distribution.
Changing the position of the camera to spatially image the momentum of the leaky mode as shown in fig. 3a and 3b, it can be seen from its fourier imaging that the leaky signal exhibits a symmetrical distribution in the direction perpendicular to the nanowire waveguide, indicating that the leaky mode has a specific momentum value in the direction of the plasmonic waveguide, which is also characteristic of directional transmission of plasmons along the waveguide.
In order to quantitatively analyze the dispersion relation of the leaky plasmons, the propagated leaky plasmons signals are selected by using the adjustable slits 21, so that the influence of in-situ excitation background light and the background light scattered out of the other end of the waveguide on experimental results is reduced.
Meanwhile, the reflecting mirror is folded down, and the signal light from the selected area enters the spectrometer through the lenses 12 and 13 to perform an angle-resolved spectrum test, and the result is shown in fig. 4, and can be better matched with the result of the prior theoretical simulation. The results prove that the system can comprehensively carry out imaging analysis on the plasmon leakage mode in spectrum, polarization, real space and momentum space, and provides a convenient omnibearing means for representing the similar leakage evanescent light field mode.
In conclusion, the invention provides a research scheme for a leakage mode in a one-dimensional plasmon waveguide based on the oil immersion Fourier angle resolution imaging and spectrum characterization combined technology, provides a direct experimental measurement result for the optical dispersion of a sub-wavelength metal waveguide mode, and provides more convenient and reliable technical support for micro-nano-scale spectroscopy research. The invention provides a universal and convenient scheme for researching the spectral properties of one-dimensional plasmon waveguide and other similar micro-nano structure systems.
It should be noted that each step/component described in the present application may be split into more steps/components, or two or more steps/components or part of the operations of the steps/components may be combined into new steps/components, as needed for implementation, to achieve the object of the present invention.
The sequence numbers of the steps in the above embodiments do not mean the order of execution, and the execution order of the processes should be determined by the functions and the internal logic, and should not be construed as limiting the implementation process of the embodiments of the present application.
It will be understood that modifications and variations will be apparent to those skilled in the art from the foregoing description, and it is intended that all such modifications and variations be included within the scope of the following claims.
Claims (10)
1. The multi-dimensional characterization method of the leaky plasmon mode is characterized by comprising the following steps of:
spin-coating a solution containing silver nanowires on a clean cover glass to obtain uniform and discrete single plasmon waveguide, and exciting plasmon modes from the waveguide end by utilizing white light;
exciting and collecting signals of single plasmon waveguides which are uniformly separated through an oil immersion objective lens;
the signals are converged by the oil immersion objective lens and the lens to form real space imaging of the silver nanowire, and the real space imaging is subjected to area selection by utilizing a first slit with adjustable position and size to extract the signals to be researched;
at the momentum space imaging position behind the first slit, continuing to perform area selection analysis on the momentum space signal in the specific transmission direction by utilizing the second slit with adjustable position and size;
amplifying the momentum space signal passing through the second slit by using a 4f optical system and projecting the momentum space signal into a grating spectrometer for dispersion analysis;
the reflecting mirror can be turned over and placed in front of the 4f optical system, signals of the lenses are deflected by 90 degrees through the reflecting mirror to be reflected to the other lenses and converged on the imaging camera, and the switching between real space imaging and momentum space Fourier imaging is realized by moving the position of the imaging camera;
the reflecting mirror is turned over, and the signal of the second slit directly passes through the 4f optical system and is subjected to an angle-resolved spectrum test by a spectrometer;
and analyzing real space imaging, momentum space Fourier imaging and spectrum to obtain multi-dimensional characterization of the leakage plasmon mode.
2. The method of multi-dimensional characterization of leaky plasmon mode according to claim 1, wherein the coverslip thickness is less than 0.2mm.
3. The method of multi-dimensional characterization of leaky plasmon mode according to claim 1, wherein the imaging camera is placed on a rapidly movable displacement table.
4. The multi-dimensional characterization method of leaky plasmonic modes according to claim 1, wherein light from a halogen lamp light source is collimated and converged to a silver nanowire waveguide end through an oil immersion objective lens, and the polarization direction of excitation light is regulated and controlled to be parallel to the nanowire waveguide through a linear polarizer so as to improve the excitation efficiency of plasmons.
5. The method of claim 1, wherein the propagating leaky plasmon signal is selected by using an adjustable first slit to reduce the influence of in-situ excitation background light and the background light scattered from the other end of the waveguide on experimental results.
6. A multi-dimensional characterization device revealing plasmonic modes, comprising:
a white light source;
a cover glass is spin-coated with a solution containing silver nanowires to obtain uniform and discrete single plasmon waveguide, and a plasmon mode is excited from the waveguide end by utilizing white light;
the oil immersion objective lens is used for exciting and collecting signals of single plasmon waveguides which are uniformly and separately arranged;
the first lens is arranged behind the oil immersion objective lens and is used for real-space imaging of the silver nanowires;
the first slit is adjustable in position and size and is used for selecting a region for real space imaging and extracting a signal to be researched;
the second slit is adjustable in position and size, is arranged at the momentum space imaging position behind the first slit and is used for continuously carrying out area selection analysis on momentum space signals in a specific transmission direction;
the 4f optical system is used for amplifying the momentum space signal passing through the second slit and projecting the momentum space signal into the grating spectrometer for dispersion analysis;
the Fourier-real space imaging system comprises a second lens and a reflecting mirror, wherein the reflecting mirror can be turned over and is arranged in front of the 4f optical system, signals of the first lens are deflected by 90 degrees by the reflecting mirror to be reflected to the second lens and converged on an imaging camera, and the switching between real space imaging and momentum space Fourier imaging is realized by moving the position of the imaging camera; when the reflector is turned over, the signal of the second slit directly enters the spectrometer through the 4f optical system so as to perform an angle-resolved spectrum test.
7. The leaky plasmonic mode multi-dimensional characterization device of claim 6, wherein the white light source is a halogen lamp.
8. The leaky plasmonic mode multi-dimensional characterization device of claim 7, further comprising a linear polarizer for modulating a polarization direction of the excitation light parallel to the nano-waveguide to increase an excitation efficiency of the plasmons.
9. The leaky plasmon mode multi-dimensional characterization device of claim 6, further comprising a rapidly movable displacement table upon which the imaging camera is disposed.
10. The leaky plasmonic mode multi-dimensional characterization device of claim 6, wherein the 4f optical system includes two lenses.
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013171120A (en) * | 2012-02-20 | 2013-09-02 | Hamamatsu Photonics Kk | Surface plasmon device |
| CN112557262A (en) * | 2019-09-26 | 2021-03-26 | 中国科学院微电子研究所 | Detection method and detection device for single nano-particles |
| CN113418604A (en) * | 2021-07-30 | 2021-09-21 | 中国科学院上海微系统与信息技术研究所 | Bloch surface wave exciter, nano-particle spectrometer and measuring method thereof |
| CN115184279A (en) * | 2022-07-04 | 2022-10-14 | 北京理工大学 | Microscopic angle resolution spectrum measuring system for realizing variable angle excitation based on reflector |
| CN115951448A (en) * | 2022-11-10 | 2023-04-11 | 武汉量子技术研究院 | On-chip integrated AR display element system and method based on reverse design wavelength demultiplexing |
-
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- 2023-06-26 CN CN202310764312.9A patent/CN116907795B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013171120A (en) * | 2012-02-20 | 2013-09-02 | Hamamatsu Photonics Kk | Surface plasmon device |
| CN112557262A (en) * | 2019-09-26 | 2021-03-26 | 中国科学院微电子研究所 | Detection method and detection device for single nano-particles |
| CN113418604A (en) * | 2021-07-30 | 2021-09-21 | 中国科学院上海微系统与信息技术研究所 | Bloch surface wave exciter, nano-particle spectrometer and measuring method thereof |
| CN115184279A (en) * | 2022-07-04 | 2022-10-14 | 北京理工大学 | Microscopic angle resolution spectrum measuring system for realizing variable angle excitation based on reflector |
| CN115951448A (en) * | 2022-11-10 | 2023-04-11 | 武汉量子技术研究院 | On-chip integrated AR display element system and method based on reverse design wavelength demultiplexing |
Non-Patent Citations (2)
| Title |
|---|
| 金属微结构纳米线中等离激元传播和分光特性;徐地虎等;《物理学报》;第64卷(第09期);第142-153页 * |
| 银纳米线表面等离子体激元导光的研究;张旭等;《光学学报》;第36卷(第01期);第269-273页 * |
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