CN1168958C - Apparatus for measuring raster angle with linear CCD array to determine wavelength - Google Patents

Abstract

The present invention relates to a device for measuring rotation angles of a raster by a linear array CCD to determine wavelength. The present invention is composed of a light source, a reflective mirror, a splitting raster, a spectrum-measuring linear array CCD, a system for measuring rotation angles of a raster by the linear array CCD, an A/D data acquisition card and a computer, wherein the light source is arranged in a plane which is horizontal with the image sensitive plane of the angle-measuring linear array CCD and a middle line of the reflective mirror, and parallel light rays and horizontal lines form certain angles; the reflective mirror of a raster is a plane reflective mirror arranged on a plane raster; the mirror surface of the plane reflective mirror is in parallel with the plane of the raster. The spectral wavelength of the spectrum surface of a spectrograph can be calculated by measuring the rotation angle of the raster. As a result, the present invention overcomes additional errors caused by rotation mechanisms and rotation-amount measuring mechanisms of common spectrographs, so the spectrum measuring precision and speed of the spectrographs are higher.

Description

Device with measuring raster angle with linear CCD array to determine wavelength

Technical field

The invention belongs to measurement and analysis instrument, relate to a kind of device in particular with measuring raster angle with linear CCD array to determine wavelength.

Background technology

Existing various grating spectrum instrument, the normal sine that adopts stepper motor and precision lead screw to constitute is retouched mechanism and is driven grating rotating, the step number of rotating by the record stepper motor, and measure the rotational angle of grating in conjunction with the pitch of precision lead screw, to determine the spectral wavelength on the spectrum face.In addition, the grating chi of installation is also arranged on leading screw or hold micrometer displacement system such as grid chi, calculate the corner of grating again, measure the wavelength of spectrum face spectrum by the amount of spin of measuring sine sweep mechanism.Preceding a kind of method must be provided with the starting point of scanning mechanism, and must at first make sine sweep mechanism return zero (getting back to the starting point of scanning mechanism) after start.Spectrometer is after start like this, and machine will return Z-operation (whether tube shutter is in the precalculated position) earlier, and then scans step by step on the predetermined spectral position.Obviously, this spectrometer is time-consuming, and because the returning factors such as zero precision, the precision of precision lead screw, precision lead screw cooperate the backlash, the stepper motor that cause to lose to go on foot with nut and belt pulley skids and all will introduce the spectral measurement error of zero resetting device.Though a kind of method was returned the shortcoming that zero defective and belt pulley, stepper motor are lost step etc. before a kind of method in back had overcome,, it still can't resolve the problem that leading screw cooperates with nut.

Summary of the invention

The objective of the invention is to solve deficiency of the prior art, with the device of measuring raster angle with linear CCD array to determine wavelength.

Structure with the measuring raster angle with linear CCD array to determine wavelength device is as follows:

It is to be made of light source, reflective mirror, spectro-grating, survey spectrum line array CCD, line array CCD photometry grid corner system, A/D data collecting card and computing machine.

Light source is arranged on the center line of angle measurement line array CCD image sensing surface and reflective mirror to become in the same horizontal plane, and parallel rays and horizontal line have a certain degree; The grating reflective mirror is the plane mirror that is installed on the plane grating; The minute surface of plane mirror is parallel with grating planar.

Utilize line array CCD directly to measure the corner of grating rather than measure the corner of grating indirectly, calculate spectrometer spectrum face spectral wavelength by the grating corner of measuring.Like this, overcome the normal optical spectrometer, made spectrometer survey that the precision of spectrum is higher, speed is faster because of the additive error that rotating mechanism and amount of spin measuring mechanism are brought.

With the wavelength measurement mechanism of normal optical spectrometer relatively, with the method for the measurement device spectral wavelength of measuring raster angle with linear CCD array to determine wavelength following characteristics are arranged:

1, through angle measurement CCD with after surveying spectrum CCD combined calibrating, starting point M is just determined by unique, does not have the probabilistic problem of starting point, has eliminated the survey spectrum error that rotating mechanism and amount of spin measuring mechanism are introduced.

Line array CCD be used for dimensional measurement be very effectively, proven technique.Because it is strong that line array CCD itself has high resolving power, high sensitivity, location of pixels information, the characteristic of compact conformation and self-scanning thereof, so this measuring method often need not to dispose the complicated mechanical rotating mechanism, thereby has reduced error source, make measurement more convenient, accurate.

3. instrument need not carry out " return-to-zero " operation before each the use, and directly detected current blaze wavelength, had saved " return-to-zero " running time, had both made things convenient for use, had accelerated measuring speed again.

Description of drawings

Fig. 1: line array CCD is measured the schematic diagram of grating corner;

Fig. 2: grating spectrograph structural representation;

Fig. 3: the synoptic diagram of spectrometer measurement grating corner;

Fig. 4: reflective mirror and grating connection layout.

Embodiment

The present invention is further detailed explanation with principle with reference to the accompanying drawings below:

The principle of directly measuring the grating corner with the device of measuring raster angle with linear CCD array to determine wavelength as shown in Figure 1, figure cathetus AB is the minute surface that is fixed on the plane mirror on the grating.A branch of rectangle directional light is incident upon on the level crossing center of rotation O, receive reflected light (shown in the figure cathetus MP) in the reflected light direction with a line array CCD (or one group of line array CCD), the positional information of the center line of rectangle directional light on the CCD image planes and the corner of grating (also promptly with the blaze wavelength of grating) have one to one and concern.

If the direct of travel of rectangle directional light and the angle of horizontal direction are α, the initial position of plane mirror is AB, its normal is OP, and at this moment the incident angle of rectangle directional light and emergence angle are α, the long distance that equals the CCD image planes to plane mirror center of rotation O of OP.When AB turned over an angle θ, normal forwarded the OQ position to by OP, and incident angle and the emergence angle of this moment become β.There is following relation at angle γ and the θ angle of emergent ray OM, ON before and after rotating:

γ＝2α-2β＝2(α-β)＝2θ (1)

When survey spectrum CCD detected the zero level principal maximum at the receiving screen P place of Fig. 1, the detected rectangle directional light of angle measurement CCD position of center line was exactly the M point.Known OP and α, and MP=OPtg α are so P point position also can be determined.If angle measurement CCD detects PN=x, ∠ NOP=arctg (x/OP) then, and

$\mathrm{\θ}=\frac{1}{2}\mathrm{\γ}=\frac{1}{2}(\mathrm{\α}-\∠\mathrm{NOP})=\frac{1}{2}(\mathrm{\α}-\mathrm{arctg}\frac{x}{\mathrm{OP}})---\left(2\right)$

With θ substitution (2), finally try to achieve blaze of grating wavelength for shown in (3) formula:

D is a grating constant in the formula, and is both angle between grating and two catoptrons of textural constant of spectrometer, and OP is the distance of plane mirror to line array CCD, and α is an initial angle as shown in Figure 1, more than these 4 parameters be constant.By starting condition, when initial angle was α, the directional light position of center line that line array CCD records was xo, and α is α=arctg (xo/OP).This shows that blaze of grating wavelength X only has definite funtcional relationship with the detected x value of angle measurement CCD, and irrelevant with other parameters.I.e. explanation can detect the wavelength of spectrometer spectrum face with angle measurement CCD, and measuring accuracy is relevant with the precision that the line array CCD location moves x.

Inner structure such as Fig. 2, Fig. 3 and shown in Figure 4 with the device of measuring raster angle with linear CCD array to determine wavelength.Fig. 2 is the branch flash ranging spectrum part of grating spectrograph, and it is by incident, exit slit, reflective mirror, spectro-grating, survey spectrum line array CCD, line array CCD photometry grid corner system, formations such as A/D data collecting card and computing machine.It is basic identical that it and common CCD survey the spectrum spectrometer, and different is that it can save sinusoidal drive photometry grid corner system and adopt line array CCD photometry grid corner system.Fig. 3 is the structural representation of CCD photometry grid corner system.As seen from the figure, it is made of grating reflective mirror, line source, line array CCD, binaryzation data collecting card and computing machine etc., grating reflective mirror wherein is the plane mirror that is installed on the plane grating, line source is for sending the light source of rectangle directional light, this light source is installed in the image sensing surface of line array CCD and the center line of reflective mirror to become in the same horizontal plane, and make parallel rays become a angle with horizontal line, like this, the directional light that sends of line source incide on the plane mirror with a angle and with a corner reflection on the image planes of line array CCD.The assembly relation of plane mirror and plane grating will guarantee during assembling that the minute surface of plane mirror is parallel with grating planar as shown in Figure 4.The corner of plane mirror both had been the corner of grating planar.When grating rotated the θ angle, the position of parallel rays on line array CCD was x, can measure the corner of grating and obtain spectral wavelength λ on the spectrometer spectrum face by the measurement of x value.

The line array CCD that can be used for measuring grating has a lot, and as TCD1500C (5340 pixel), TCD1702C (7500 pixel), TCD2901D (10550 * 3 pixel) etc., these line array CCDs are Toshiba Corp and produce.

Claims (4)

1. device with measuring raster angle with linear CCD array to determine wavelength, it is made of grating reflective mirror, line source, line array CCD, binaryzation data collecting card and computing machine; It is characterized by the grating reflective mirror is the plane mirror that is installed on the plane grating, line source is for sending the light source of rectangle directional light, this light source is installed in the image sensing surface of line array CCD and the center line of reflective mirror to become in the same horizontal plane, and parallel rays and horizontal line are had a certain degree.

2. a kind of device with measuring raster angle with linear CCD array to determine wavelength as claimed in claim 1 is characterized in that described grating reflective mirror is the plane mirror that is installed on the plane grating; The minute surface of plane mirror is parallel with grating planar.

3. a kind of device with measuring raster angle with linear CCD array to determine wavelength as claimed in claim 1 is characterized in that described line array CCD is TCD1500C (5340 pixel), TCD1702C (7500 pixel), TCD2901D (10550 * 3 pixel).

4. a kind of device with measuring raster angle with linear CCD array to determine wavelength as claimed in claim 1 is characterized in that described line source is for sending the light source of rectangle directional light.

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