CN116866811A - Audio test system and audio test method - Google Patents

Abstract

The present application relates to the field of audio test circuits, and in particular, to an audio test system and an audio test method. An audio test system comprising a test processing module, the test processing module comprising: the data processing sub-module is used for sending various test commands and analyzing and processing test results; and the test function sub-module is connected with the data processing sub-module and is used for receiving the plurality of test commands, generating and sending a plurality of different test signals to the equipment to be tested according to the plurality of test commands and receiving test feedback signals of the equipment to be tested. The audio test system can expand the functional range of the test device, improve the universality of the test device and reduce the hardware cost of audio test.

Description

Audio test system and audio test method

Technical Field

The present application relates to the field of audio test circuits, and in particular, to an audio test system and an audio test method.

Background

With the market trend of consumer electronics, especially the product market of wearable devices, the demand for test devices is increasing in recent years, and further demands are also being made on the performance requirements and testable types of the test devices. In current consumer electronics, a digital microphone is generally used as the audio receiving portion, and the audio output portion is still in analog mode. The PDM (Pulse Density Modulation ) microphone is widely applied to wearable devices due to its simple structure, strong anti-interference capability, good low noise performance, etc., but the PDM microphone is a high-precision device and is susceptible to the influence of a hardware circuit board, a welding process, etc., so that multiple links are required to detect the PDM microphone in the whole production process of the product. The audio output part still adopts an analog mode, so that the performance of each aspect of the audio output part is required to be detected due to the welding process and other reasons, such as SNR, THD, THD +N and other performance parameters; the general requirement of the market at present is to perform a Loopback test, that is, the data received by the PDM RX is output through an analog part (DAC), the test device needs to generate a PDM TX signal and collect the signal output by the analog part through the ADC at the same time, analyze the test data, and feed back the test result to the customer.

In the related art, in order to implement performance test on audio equipment, a single detecting device of some digital microphones and a sound card testing device are generally adopted at present, the functions of the digital microphone part are tested by the digital microphone detecting device, and the functions of the analog part of the audio output are tested by the sound card testing device.

However, the current audio test device has the following technical problems:

in order to realize testing of different functions in the current audio testing device, different testing modules need to be configured, so that the cost of testing equipment is too high, and the testing process is complex.

Disclosure of Invention

Accordingly, it is desirable to provide an audio test system and a test method capable of expanding the functional range of a test device, improving the versatility of the test device, and reducing the hardware cost of audio test.

In a first aspect, the present application provides an audio test system, including a test processing module, the test processing module including:

the data processing sub-module is used for sending various test commands and analyzing and processing test results;

and the test function sub-module is connected with the data processing sub-module and is used for receiving the plurality of test commands, generating and sending a plurality of different test signals to the equipment to be tested according to the plurality of test commands and receiving test feedback signals of the equipment to be tested.

In one embodiment, the test function submodule includes:

the analog signal sending unit is used for generating different analog signals according to different test commands;

and the pulse signal transmitting unit comprises a pulse modulation circuit which is connected with the analog signal transmitting unit and is used for carrying out pulse modulation on the analog signal so as to generate and transmit the test signal to the equipment to be tested.

In one embodiment, the test function sub-module further comprises:

and the signal processing unit is connected with the pulse signal transmitting unit and the analog signal transmitting unit and is used for processing the test signal according to the test command so as to insert a trigger signal before the test signal.

In one embodiment, the pulse signal receiving unit includes a signal filtering circuit, configured to receive different test feedback signals fed back by different devices under test, and perform filtering processing on the test feedback signals.

In one embodiment, the system comprises:

the level conversion module is connected with the test processing module and is used for carrying out level conversion on the external signal so as to enable the external signal to be matched with the test processing module;

the data conversion module is connected with the test function submodule and is used for carrying out data processing conversion on signals output by the test function submodule or signals input to the test processing module;

and the external interaction module is connected with the test processing module and is used for realizing data transmission interaction with the equipment to be tested and an external data source.

In one embodiment, the test processing module further comprises:

the memory unit is connected with the external interaction module and the test function sub-module, and is used for storing a data source imported through the external interaction module and also used for receiving and storing a pulse signal source transmitted by the test function sub-module.

In one embodiment, the test function submodule includes:

a signal conversion unit for performing time-frequency conversion processing on the signal to convert the signal from a time domain signal to a frequency domain signal;

the digital-to-analog conversion unit is used for carrying out digital-to-analog conversion processing on the signals so as to convert the signals from digital signals to analog signals;

and the analog-to-digital conversion unit is used for performing analog-to-digital conversion processing on the signal so as to convert the signal from the analog signal to a digital signal.

In a second aspect, the present application provides an audio test method, comprising the steps of:

acquiring a test command required by audio performance test of a target device to be tested;

determining signal parameters of an initial test signal according to the command, and generating the test signal according to the signal parameters;

and responding to the test feedback signal returned by the target equipment to be tested, and analyzing the test feedback signal to obtain a test result.

In one embodiment, the determining the signal parameter of the initial test signal according to the command, and generating the test signal according to the signal parameter includes:

generating an initial test signal according to the signal parameters, and inserting a preset trigger signal before the initial test signal to obtain a synthesized test signal;

the step of responding to the test feedback signal returned by the target equipment to be tested, and the step of analyzing the test feedback signal to obtain a test result comprises the following steps:

and identifying a trigger node corresponding to the trigger signal in the test feedback signal, and analyzing the test feedback signal based on the trigger node.

In one embodiment, the method further comprises:

measuring the clock frequency of the test feedback signal to obtain a plurality of initial measurement results;

and determining a target clock frequency according to a plurality of initial measurement results.

According to the audio test system, the following beneficial effects can be achieved by deducing the technical characteristics in the claims:

the system is provided with a test processing module, the data processing submodule in the test processing module is used for realizing the control of the system and the processing of data, the test function submodule is used for realizing the function realization on hardware, corresponding test signals can be generated according to various different test commands and sent to the equipment to be tested, and test feedback signals fed back by the equipment to be tested are received, so that the test results of different equipment to be tested are finally obtained. In the implementation, the data processing sub-module provides editable and adaptable characteristics on software for the system function, the test function sub-module provides editable and adaptable characteristics on hardware, and finally the coverage range of the system test function is improved, so that the audio test system can be compatible with different scenes and the effects of the requirements of test operation under different requirements, the universality and the compatibility of the test system are improved, and the flexibility in use is improved.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments or the conventional techniques of the present application, the drawings required for the descriptions of the embodiments or the conventional techniques will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present application, and other drawings may be obtained according to the drawings without inventive effort for those skilled in the art.

FIG. 1 is a schematic diagram of a test processing module of an audio test system according to an embodiment of the present application;

FIG. 2 is a schematic diagram showing a specific structure of a testing function sub-module of an audio testing system according to an embodiment of the present application;

FIG. 3 is a schematic diagram of a system flow for processing pulse signals in a test function sub-module of an audio test system according to an embodiment of the present application;

FIG. 4 is a schematic diagram of a test signal processed by a signal processing unit according to an embodiment of the present application;

FIG. 5 is a schematic circuit diagram of a signal filtering unit according to an embodiment of the present application;

FIG. 6 is a schematic diagram illustrating an overall structure of an audio test system according to an embodiment of the present application;

FIG. 7 is a schematic diagram of a memory unit in an audio test system according to an embodiment of the application;

FIG. 8 is a schematic diagram illustrating a test function sub-module in an audio test system according to an embodiment of the present application;

FIG. 9 is a schematic diagram illustrating a first flow chart of an audio testing method according to an embodiment of the application;

FIG. 10 is a second flow chart of an audio testing method according to another embodiment of the application;

fig. 11 is a schematic diagram illustrating a third flow chart of an audio testing method according to another embodiment of the application.

Reference numerals illustrate: 1. a test processing module; 11. a data processing sub-module; 12. a test function sub-module; 121. an analog signal transmitting unit; 122. a pulse signal transmitting unit; 123. a pulse signal receiving unit; 124. a signal processing unit; 125. a signal conversion unit; 126. a digital-to-analog conversion unit; 127. an analog-to-digital conversion unit; 13. a memory unit; 2. a level conversion module; 3. a data conversion module; 4. and an external interaction module.

Detailed Description

In order that the application may be readily understood, a more complete description of the application will be rendered by reference to the appended drawings. Embodiments of the application are illustrated in the accompanying drawings. This application may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.

It will be understood that the terms first, second, etc. as used herein may be used to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another element. For example, a first resistance may be referred to as a second resistance, and similarly, a second resistance may be referred to as a first resistance, without departing from the scope of the application. Both the first resistor and the second resistor are resistors, but they are not the same resistor.

It is to be understood that in the following embodiments, "connected" is understood to mean "electrically connected", "communicatively connected", etc., if the connected circuits, modules, units, etc., have electrical or data transfer between them.

It is understood that "at least one" means one or more and "a plurality" means two or more. "at least part of an element" means part or all of the element.

As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and/or "comprising," and/or the like, specify the presence of stated features, integers, steps, operations, elements, components, or groups thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, or groups thereof. Also, the term "and/or" as used in this specification includes any and all combinations of the associated listed items.

In the related art, in order to implement performance test on audio equipment, a single detecting device of some digital microphones and a sound card testing device are generally adopted at present, the functions of the digital microphone part are tested by the digital microphone detecting device, and the functions of the analog part of the audio output are tested by the sound card testing device.

However, the current audio test device has the following technical problems:

in order to realize testing of different functions in the current audio testing device, different testing modules need to be configured, so that the cost of testing equipment is too high, and the testing process is complex.

Based on the above, the embodiment of the application provides an audio test system.

In one embodiment, as shown in fig. 1, an audio test system includes a test processing module 1, where the test processing module 1 may be a core module of the audio test system for providing hardware, software, and other characteristics that are editable, extensible, and adaptable. In this embodiment, the test processing module 1 is illustrated as a ZYNQ platform, and it should be noted that the test processing module 1 may be a ZYNQ platform, or may be another processing platform with editable and expandable software and hardware. Specifically, the test processing module 1 may include: the data processing sub-module 11 and the test function sub-module 12. Wherein:

the data processing sub-module 11 may be a software supporting module of the test processing module 1, and may be configured to send various test commands and analyze and process the received test results. Taking the test processing module 1 as a ZYNQ platform as an example, the data processing sub-module 11 may be a PS end of the ZYNQ platform.

The test function sub-module 12 may be a hardware support module of the test processing module 1, and may be configured to receive a test command transmitted by the data processing sub-module 11, send a plurality of different test signals to a device to be tested according to the test command, and receive and process a test feedback signal fed back by the device to be tested according to the test signal. Taking the test processing module 1 as a ZYNQ platform as an example, the test function sub-module 12 may be a PL end of the ZYNQ platform.

The data processing sub-module 11 and the test function sub-module 12 can be connected by signals, and in practice can be connected by a data bus. Taking the test processing module 1 as a ZYNQ platform as an example, the data processing sub-module 11 and the test function sub-module 12 may be connected through an internal data bus AXI, where the data bus AXI may include an AXI HP bus and an AXI GP bus. The AXI HP bus may be used to transmit large volumes of data streams, and the AXI GP bus may be used to transmit small volumes of data streams. The AXI GP bus may be further configured to implement configuration of a control signal, for example, may configure a working mode of the signal generating unit, for example, may convert a mode setting of a bit number of 8 bits, 16 bits, 24 bits, 32 bits, and the like, and may set a draw ratio of the pulse signal.

In addition, taking the test processing module 1 as a ZYNQ platform as an example, various peripheral devices, such as JTAG, USB, ethernet, e-MMC, norFlash, DDR3, etc., can be further arranged on the basis of the platform.

By implementing the audio test system, the following beneficial effects can be achieved:

the system is provided with a test processing module 1, the data processing sub-module 11 in the test processing module 1 is used for realizing the control of the system and the processing of data, the test function sub-module 12 is used for realizing the function realization on hardware, generating corresponding test signals according to various different test commands and sending the test signals to the equipment to be tested, receiving test feedback signals fed back by the equipment to be tested, and finally obtaining the test results of different equipment to be tested. In implementation, the data processing sub-module 11 provides the system function with the characteristic of editable and adaptable in software, and the test function sub-module 12 provides the characteristic of editable and adaptable in hardware, so that the coverage range of the system test function is finally improved, the audio test system can be compatible with different scenes and the effect of the requirements of test operation under different requirements, the universality and the compatibility of the test system are improved, and the flexibility in use is improved.

In one embodiment, as shown in fig. 2, the test function sub-module 12 may include an analog signal transmitting unit 121, a pulse signal transmitting unit 122, and a pulse signal receiving unit 123, wherein:

the analog signal sending unit 121 may be configured to generate different analog signals according to different test commands, taking the test processing module 1 as a ZYNQ platform as an example, and the analog signal sending unit 121 may be a DDS module, so as to generate DDS signal data, and realize generation of sine signals and cosine signals with arbitrary frequencies.

The pulse signal transmitting unit 122 may include a pulse modulation circuit. As shown in fig. 3, a pulse signal transmitting unit 122 may be connected to the analog signal transmitting unit 121 for pulse-modulating the analog signal generated by the analog signal transmitting unit 121, thereby generating a test signal and transmitting the test signal to the device under test. Taking the test processing module 1 as a ZYNQ platform as an example, the pulse signal transmitting unit 122 may be a PDM TX module, capable of generating PDM data. The pulse modulation circuit may be a modulation scheme of a second-order ΔΣ, or may be another modulation scheme.

The pulse signal receiving unit 123 may be configured to receive a test feedback signal fed back by the device under test, and process the test feedback signal. Taking the test processing module 1 as a ZYNQ platform as an example, the pulse signal transmitting unit 122 may be a PDM RX module, capable of receiving PDM data.

In the present embodiment, two signal generating units, as core modules providing main effects, can produce an effect of improving system editability.

In one embodiment, the test function sub-module 12 may further include a signal processing unit 124, as shown in FIG. 3. Specifically, the signal processing unit 124 may be connected to the pulse signal transmitting unit 122 and the analog signal transmitting unit 121, so as to process the test signal according to the test command to insert the trigger signal before the test signal. Taking the test processing module 1 as a ZYNQ platform as an example, the signal processing unit 124 may be a MUX module, and correspondingly, in order to obtain the trigger signal, a matched DSP module and a Factor module may also be provided to assist in implementing the function of inserting the trigger signal. Additionally, the DSP module may also control the amplitude of the test signal by multiplication.

For example, the test signal processed by the signal processing unit 124 may be as shown in fig. 4, in which the sine wave part is the test signal and the square wave part may be the inserted trigger signal.

In this embodiment, the signal processing unit 124 inserts the trigger signal before the test signal, which helps to start the test from the trigger signal, and improves the accuracy and efficiency of the audio test.

In one embodiment, as shown in fig. 5, the pulse signal receiving unit 123 may include a signal filtering circuit, where the signal filtering circuit may be configured to receive and filter different test feedback signals fed back by different devices under test, and the signal filtering circuit may include one or more of CIC decimator, HB half band filter, and low pass filter.

In this embodiment, the signal filtering circuit provided in the PDM receiving end can process the received signal, and improve the efficiency of audio test analysis.

In one embodiment, as shown in fig. 6, the audio test system may further include a level conversion module 2, a data conversion module 3, and an external interaction module 4, where:

the level conversion module 2 may be connected to the test processing module 1 for level converting an external signal. Taking the test processing module 1 as a ZYNQ platform as an example, the Level conversion module 2 may be a Level Shift module.

The data conversion module 3 may be connected to the test function sub-module 12, and is configured to perform data processing conversion on a signal output by the test function sub-module 12 or a signal input to the test processing module 1, where the data processing conversion may be digital-to-analog conversion, analog-to-digital conversion, or other signal conversion types. Taking the test processing module 1 as a ZYNQ platform as an example, the data conversion module 3 may be one or more of conversion modules such as an ADC and a DAC.

The external interaction module 4 may be connected to the test processing module 1, and is used for implementing data transmission interaction with the device to be tested and an external data source, and may be a data transmission interface such as USB. Taking the test processing module 1 as a ZYNQ platform as an example, the external interaction module 4 may be a USB module or the like.

In this embodiment, the peripheral modules in the system can perform level conversion, data conversion and data interaction, and can support the diversity function of implementing audio test.

In one embodiment, as shown in fig. 7, the test processing module 1 may further comprise a memory unit 13, in particular: the memory unit 13 may be connected to the external interaction module 4 and the test function sub-module 12 for storing data sources imported by the external interaction module 4 and for receiving and storing pulse signal sources transmitted by the test function sub-module 12. Taking the test processing module 1 as a ZYNQ platform as an example, the memory module may be DDR3.

Additionally, the memory unit 13 may be a RAM module, and the memory unit 13 may be configured to store data generated in the test function sub-module 12, so that the data processing sub-module 11 may read the data, and the storage modulus may be real part data and imaginary part data of a corresponding point location.

In this embodiment, the memory unit 13 stores the externally-introduced test command and the signal source, so that the selectable range of the signal source is enlarged, and the universality of the scheme is further improved.

In one embodiment, as shown in fig. 7, the test function sub-module 12 may include a signal conversion unit 125, a digital-to-analog conversion unit 126, and an analog-to-digital conversion unit 127. Wherein:

the signal conversion unit 125 may be configured to perform a time-frequency conversion process on the signal to convert the signal from a time domain signal to a frequency domain signal, taking the test processing module 1 as a ZYNQ platform as an example, and the signal conversion unit 125 may be an FFT (fast fourier transform) module.

The digital-to-analog conversion unit 126 may be configured to perform digital-to-analog conversion on the signal to convert the signal from a digital signal to an analog signal, and taking the test processing module 1 as a ZYNQ platform as an example, the digital-to-analog conversion unit 126 may be a DAC module.

The analog-to-digital conversion unit 127 may be configured to perform analog-to-digital conversion on the signal to convert the signal from an analog signal to a digital signal, and taking the test processing module 1 as a ZYNQ platform as an example, the digital-to-analog conversion unit 126 may be an ADC module.

In this embodiment, a plurality of signal conversion units are disposed in the test processing module 1, which is conducive to further realizing signal editability and improving system versatility.

Based on the same inventive concept, the embodiment of the application also provides an audio testing method, which can be shown in fig. 9, and comprises the following steps:

step 901: and acquiring a test command required by the audio performance test of the target device to be tested.

Step 903: and determining signal parameters of an initial test signal according to the command, and generating the test signal according to the signal parameters.

Step 905: and responding to the test feedback signal returned by the target equipment to be tested, and analyzing the test feedback signal to obtain a test result.

By implementing the audio test method, the following beneficial effects can be achieved:

the system is provided with a test processing module, the data processing submodule in the test processing module is used for realizing the control of the system and the processing of data, the test function submodule is used for realizing the function realization on hardware, corresponding test signals can be generated according to various different test commands and sent to the equipment to be tested, and test feedback signals fed back by the equipment to be tested are received, so that the test results of different equipment to be tested are finally obtained. In the implementation, the data processing sub-module provides editable and adaptable characteristics on software for the system function, the test function sub-module provides editable and adaptable characteristics on hardware, and finally the coverage range of the system test function is improved, so that the audio test system can be compatible with different scenes and the effects of the requirements of test operation under different requirements, the universality and the compatibility of the test system are improved, and the flexibility in use is improved.

In one embodiment, as shown in fig. 10, step 903 includes:

step 1001: generating an initial test signal according to the signal parameters, and inserting a preset trigger signal before the initial test signal to obtain a synthesized test signal;

the step 905 includes:

step 1003: and identifying a trigger node corresponding to the trigger signal in the test feedback signal, and analyzing the test feedback signal based on the trigger node.

In this embodiment, the signal processing unit inserts the trigger signal before the test signal, which is conducive to enabling the test to start from the trigger signal, and improves the accuracy and efficiency of the audio test.

In one embodiment, as shown in fig. 11, the method further includes:

step 1101: measuring the clock frequency of the test feedback signal to obtain a plurality of initial measurement results;

step 1103: and determining a target clock frequency according to a plurality of initial measurement results.

In this embodiment, the clock frequency of the test feedback signal is measured, so that the effect of improving the accuracy of the test result can be achieved.

It will be appreciated that the above-described audio test system may take other forms, not limited to the forms already mentioned in the above-described embodiments, as long as it is capable of achieving the function of improving the compatibility of the audio test system with respect to different test requirements.

The above-described circuit may be applied to an audio device of an electronic apparatus such as an AC adapter, a television receiver, or a video game device, or a test application of a similar audio device.

In the description of the present specification, reference to the term "some embodiments," "other embodiments," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, schematic descriptions of the above terms do not necessarily refer to the same embodiment or example.

The technical features of the above-described embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above-described embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.

The above examples merely represent a few embodiments of the present application, which are described in more detail and are not to be construed as limiting the scope of the present application. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the application, which are all within the scope of the application. Accordingly, the scope of the application should be assessed as that of the appended claims.

Claims (10)

1. An audio test system comprising a test processing module (1), the test processing module (1) comprising:

the data processing sub-module (11) is used for sending various test commands and analyzing and processing test results;

and the test function sub-module (12) is connected with the data processing sub-module (11) and is used for receiving the plurality of test commands, generating and sending a plurality of different test signals to the equipment to be tested according to the plurality of test commands and receiving test feedback signals of the equipment to be tested.

2. The system of claim 1, wherein the test function sub-module (12) comprises:

an analog signal transmitting unit (121) for generating different analog signals according to different ones of the test commands;

a pulse signal transmitting unit (122) including a pulse modulation circuit connected to the analog signal transmitting unit (121) for pulse-modulating the analog signal to generate and transmit the test signal to the device under test;

and the pulse signal receiving unit (123) is used for receiving the test feedback signal fed back by the device to be tested.

3. The system of claim 2, wherein the test function sub-module (12) further comprises:

and the signal processing unit (124) is connected with the pulse signal transmitting unit (122) and the analog signal transmitting unit (121) and is used for processing the test signal according to the test command so as to insert a trigger signal before the test signal.

4. The system according to claim 2, wherein said pulse signal receiving unit (123) comprises a signal filtering circuit for receiving different ones of said test feedback signals fed back by different ones of said devices under test and filtering said test feedback signals.

5. The system according to claim 1, characterized in that the system comprises:

the level conversion module (2) is connected with the test processing module (1) and is used for carrying out level conversion on the external signal so as to enable the external signal to be matched with the test processing module (1);

the data conversion module (3) is connected with the test function sub-module (12) and is used for carrying out data processing conversion on signals output by the test function sub-module (12) or signals input to the test processing module (1);

and the external interaction module (4) is connected with the test processing module (1) and is used for realizing data transmission interaction with the equipment to be tested and an external data source.

6. The system according to claim 5, wherein the test processing module (1) further comprises:

the memory unit (13), the memory unit (13) is connected with the external interaction module (4) and the test function sub-module (12), and is used for storing a data source imported through the external interaction module (4) and also used for receiving and storing a pulse signal source transmitted by the test function sub-module (12).

7. The system of claim 1, wherein the test function sub-module (12) comprises:

a signal conversion unit (125) for performing time-frequency conversion processing on the signal to convert the signal from a time-domain signal to a frequency-domain signal;

a digital-to-analog conversion unit (126) for performing digital-to-analog conversion processing on the signal to convert the signal from a digital signal to an analog signal;

and an analog-to-digital conversion unit (127) for performing an analog-to-digital conversion process on the signal to convert the signal from an analog signal to a digital signal.

8. An audio testing method, comprising the steps of:

acquiring a test command required by audio performance test of a target device to be tested;

determining signal parameters of an initial test signal according to the command, and generating the test signal according to the signal parameters;

and responding to the test feedback signal returned by the target equipment to be tested, and analyzing the test feedback signal to obtain a test result.

9. The method of claim 8, wherein determining signal parameters of an initial test signal based on the command, and generating the test signal based on the signal parameters comprises:

generating an initial test signal according to the signal parameters, and inserting a preset trigger signal before the initial test signal to obtain a synthesized test signal;

the step of responding to the test feedback signal returned by the target equipment to be tested, and the step of analyzing the test feedback signal to obtain a test result comprises the following steps:

and identifying a trigger node corresponding to the trigger signal in the test feedback signal, and analyzing the test feedback signal based on the trigger node.

10. The method of claim 8, wherein the method further comprises:

measuring the clock frequency of the test feedback signal to obtain a plurality of initial measurement results;

and determining a target clock frequency according to a plurality of initial measurement results.