CN116654530A - Automatic turnover type chip testing equipment - Google Patents
Automatic turnover type chip testing equipment Download PDFInfo
- Publication number
- CN116654530A CN116654530A CN202310943861.2A CN202310943861A CN116654530A CN 116654530 A CN116654530 A CN 116654530A CN 202310943861 A CN202310943861 A CN 202310943861A CN 116654530 A CN116654530 A CN 116654530A
- Authority
- CN
- China
- Prior art keywords
- damping
- sleeve
- clamping
- chip
- stabilizing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 118
- 230000007306 turnover Effects 0.000 title abstract description 23
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims abstract description 48
- 230000007246 mechanism Effects 0.000 claims abstract description 36
- 229910052742 iron Inorganic materials 0.000 claims abstract description 24
- 230000001939 inductive effect Effects 0.000 claims abstract description 16
- 238000013016 damping Methods 0.000 claims description 108
- 230000000087 stabilizing effect Effects 0.000 claims description 41
- 230000006698 induction Effects 0.000 claims description 16
- 230000035939 shock Effects 0.000 claims description 14
- 241000252254 Catostomidae Species 0.000 claims description 8
- 230000000712 assembly Effects 0.000 claims description 7
- 238000000429 assembly Methods 0.000 claims description 7
- 238000009423 ventilation Methods 0.000 claims description 5
- 238000012544 monitoring process Methods 0.000 claims description 3
- 230000002441 reversible effect Effects 0.000 claims 9
- 239000012530 fluid Substances 0.000 claims 2
- 230000005389 magnetism Effects 0.000 abstract description 12
- 230000005540 biological transmission Effects 0.000 abstract description 4
- 238000001514 detection method Methods 0.000 description 12
- 238000000034 method Methods 0.000 description 11
- 230000007547 defect Effects 0.000 description 9
- 230000000694 effects Effects 0.000 description 8
- 239000007788 liquid Substances 0.000 description 8
- 230000033001 locomotion Effects 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 230000001681 protective effect Effects 0.000 description 6
- 238000010521 absorption reaction Methods 0.000 description 4
- 230000003139 buffering effect Effects 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 4
- 238000001125 extrusion Methods 0.000 description 4
- 230000008520 organization Effects 0.000 description 4
- 239000000523 sample Substances 0.000 description 4
- 230000006872 improvement Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000011093 chipboard Substances 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G15/00—Conveyors having endless load-conveying surfaces, i.e. belts and like continuous members, to which tractive effort is transmitted by means other than endless driving elements of similar configuration
- B65G15/30—Belts or like endless load-carriers
- B65G15/58—Belts or like endless load-carriers with means for holding or retaining the loads in fixed position, e.g. magnetic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G47/00—Article or material-handling devices associated with conveyors; Methods employing such devices
- B65G47/22—Devices influencing the relative position or the attitude of articles during transit by conveyors
- B65G47/24—Devices influencing the relative position or the attitude of articles during transit by conveyors orientating the articles
- B65G47/248—Devices influencing the relative position or the attitude of articles during transit by conveyors orientating the articles by turning over or inverting them
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16F—SPRINGS; SHOCK-ABSORBERS; MEANS FOR DAMPING VIBRATION
- F16F15/00—Suppression of vibrations in systems; Means or arrangements for avoiding or reducing out-of-balance forces, e.g. due to motion
- F16F15/02—Suppression of vibrations of non-rotating, e.g. reciprocating systems; Suppression of vibrations of rotating systems by use of members not moving with the rotating systems
- F16F15/023—Suppression of vibrations of non-rotating, e.g. reciprocating systems; Suppression of vibrations of rotating systems by use of members not moving with the rotating systems using fluid means
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16F—SPRINGS; SHOCK-ABSORBERS; MEANS FOR DAMPING VIBRATION
- F16F15/00—Suppression of vibrations in systems; Means or arrangements for avoiding or reducing out-of-balance forces, e.g. due to motion
- F16F15/02—Suppression of vibrations of non-rotating, e.g. reciprocating systems; Suppression of vibrations of rotating systems by use of members not moving with the rotating systems
- F16F15/04—Suppression of vibrations of non-rotating, e.g. reciprocating systems; Suppression of vibrations of rotating systems by use of members not moving with the rotating systems using elastic means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Aviation & Aerospace Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Specific Conveyance Elements (AREA)
Abstract
The invention relates to the technical field of chip testing, and discloses automatic turnover chip testing equipment which comprises a machine base, wherein a machine frame is fixedly arranged on the upper side of the machine base, a control chassis is fixedly arranged on the front side of the machine frame, a conveying assembly for conveying chips is arranged on the machine frame, a plurality of testing seats are arranged on the conveying assembly and are uniformly distributed on the conveying assembly, and a turnover mechanism is arranged on the testing seats. This can overturn core test equipment voluntarily, the device when the stall phenomenon appears in the rotation axis, centrifugal force effort through the rotation axis when rotating for centrifugal piece pulling elastic connection spare and with inductive switch take place the contact, start inductive switch and with electric energy transmission to the electro-magnet cover, make electro-magnet cover circular telegram produce magnetism, and utilize this magnetism to produce the suction to fixed iron cover, thereby hold it and lock, make the rotation axis stop operation, and send information suitcase relevant personnel in time to overhaul it.
Description
Technical Field
The invention belongs to the technical field of chip testing, and particularly relates to chip testing equipment capable of automatically overturning.
Background
After the chip is packaged, potential defects may exist, which may cause unstable performance or potential defects in functions of the chip, if the chips with potential defects are used on key equipment, faults may occur, and property loss or life danger of users may be caused, so after the chip finished product is produced, the chip is detected, and detection contents include physical defect detection, magnetic induction detection and the like.
At present, the existing test equipment has the following problems that when the existing chip on the market is tested, after the front surface of the chip is tested, the chip is required to be overturned manually or by means of a turning device, then the back surface of the chip is tested, the chip cannot be damaged and the test accuracy is ensured in the overturning process by the manual operation, and the turning device is easy to generate uncontrollable conditions in the overturning process of the chip due to the lack of a protection device, so that the possibility of rollover of the chip is caused, the reliability of the chip test equipment is lower, and the test efficiency is lower; therefore, the test device has the defects that the test device cannot meet the test use requirements of manufacturers, and therefore, further improvement is needed.
The utility model discloses a touch chip electrical property testing device, equipment and test method in China patent application number 201710883239.1, including the year dish module that is used for bearing the location chip board, divide and establish the first, second test module in year dish module upper and lower both sides, first test module includes the probe seat that can reciprocate and establishes a plurality of group test probes at the probe seat, and every group test probe is used for corresponding the contact with a plurality of solder joints on the corresponding touch chip respectively, and first test module and second test module group establish the upper and lower both sides of year dish module have realized synchronous detection, but because this kind of transmission mode uses two sets of test module, the cost of the test module of single set is high, has also increased the holistic input cost of equipment to because the inconsistent position of these two kinds of detections during the detection can receive the influence of environmental factor such as chip carrier plate and light, can indirectly cause the inconsistent existence nuances of test result of two sets of test module, has influenced the precision.
Accordingly, in view of the above, research and improvement on the existing structure and the existing defects are performed, and an automatic flip-chip testing device is provided to achieve the purpose of having more practical value.
Disclosure of Invention
In order to solve the technical problems, the invention provides automatic turnover type chip testing equipment, which is realized by the following specific technical means:
the automatic turnover type chip testing equipment comprises a machine base, wherein a machine frame is fixedly arranged on the upper side of the machine base, a control cabinet is fixedly arranged on the front side of the machine frame, a conveying assembly for conveying chips is arranged on the machine frame, a plurality of testing seats are arranged on the conveying assembly and are uniformly distributed on the conveying assembly, turnover mechanisms are arranged on the testing seats, the turnover mechanisms are fixedly connected with clamping parts by utilizing rotating shafts, the clamping parts are provided with clamping assemblies for clamping the chips, and turnover operations on the front side and the back side of the chips in a clamping state are formed by the turnover mechanisms;
the periphery of the rotating shaft is sleeved with a protecting part, so that the rotating shaft penetrates through a central shaft of the protecting part and is rotationally connected, and a stabilizing assembly and a protecting seat are arranged in the protecting part;
the stabilizing assembly comprises a stabilizing outer sleeve, a stabilizing inner sleeve and a damping part, wherein the outer side of the stabilizing outer sleeve is fixedly arranged on the inner wall of the protection part, the inner side of the stabilizing inner sleeve is fixedly arranged on the outer side of the rotating shaft, the damping part is arranged between the stabilizing outer sleeve and the stabilizing inner sleeve, the damping part is fixedly arranged on the stabilizing inner sleeve, and the damping part is slidably arranged on the stabilizing outer sleeve;
the inside of the protection seat is provided with a locking component, the locking component comprises a fixed iron sleeve and an electromagnet sleeve, the fixed iron sleeve is fixedly sleeved on the periphery of the rotating shaft, the outer side wall of the electromagnet sleeve is mutually attached to the inner wall of the protection seat, so that the rotating shaft, the fixed iron sleeve and the electromagnet sleeve are sequentially sleeved, and the fixed iron sleeve and the rotating shaft are locked by electrifying the electromagnet sleeve;
and a testing mechanism is arranged on the upper part of the testing seat, and the testing mechanism is used for detecting the front and back surfaces of the chip.
Further, the conveying assembly comprises a conveying motor, a conveying roller and a conveying belt;
the conveying motor is fixedly arranged on the outer side of the frame, the conveying roller is movably arranged on the inner side of the frame, the conveying motor is fixedly connected with the conveying roller through an output end, and a conveying belt for testing and conveying chips is arranged on the outer side of the conveying roller.
Through adopting above-mentioned structure, drive the conveying roller through conveying motor's output and rotate, based on the effort when conveying roller and conveyer belt contacted, drive test seat and chip and remove to realize the automatic feed of chip, promoted the production efficiency of producer simultaneously.
Further, the clamping assembly comprises a clamping seat, an elastic pad, a clamping plate, a positioning sucker and a ventilation valve;
the clamping seat is characterized in that an elastic pad is fixedly arranged on one side of the clamping seat, a clamping plate for clamping the chip is fixedly arranged on one side, away from the clamping seat, of the elastic pad, a plurality of positioning suckers are arranged between the clamping seat and the elastic pad opposite to one side of the elastic pad, and are uniformly and symmetrically distributed, and the positioning suckers are used for fixedly positioning the chip.
Through adopting above-mentioned structure, fix the centre gripping through clamping assembly relative movement to the chip, and the clamping assembly carries out the in-process of centre gripping to the chip, utilizes the grip block to carry out the centre gripping to the chip, and can play the effect of buffering through the elastic pad, effectively avoids causing the chip to appear warping because of the grip block clamping dynamics is too big.
Further, an inner cavity is formed in the clamping seat and is communicated with the positioning sucker, a ventilation valve for inflating and deflating the positioning sucker is arranged on the outer side of the clamping seat, and the ventilation valve is communicated with the inner cavity of the clamping seat.
Through adopting above-mentioned structure, utilize location sucking disc and chip contact each other, impel the location sucking disc to adsorb on the chip surface through the extrusion of grip slipper, and the inside air of location sucking disc is all outwards discharged by the breather valve through the interior cavity in the grip slipper to make location sucking disc form negative pressure state, can effectively guarantee the absorption dynamics of location sucking disc to the chip, effectively improved the stability of chip.
Further, the damping component comprises a damping sleeve, a damping rod, a damping sliding block, a damping plate, a spring and a through hole;
the damping sleeve is fixedly arranged on one side of the damping sleeve and the stable inner sleeve, the damping rod is movably arranged on the damping sleeve, the damping slide blocks and the damping plates are respectively arranged at two ends of the damping rod, the damping slide blocks are located at one ends of the damping rod, which are close to the stable outer sleeve, and the damping plates are located at one ends of the damping rod, which are far away from the damping slide blocks, and are located in the damping sleeve, springs are fixedly sleeved between the damping rod and the damping sleeve and between the stable inner sleeve and the damping slide blocks, damping liquid is arranged in the damping sleeve, a plurality of through holes are formed in the damping plates, and the through holes are used for the back and forth flowing of the damping liquid.
Through adopting above-mentioned structure, drive stable endotheca and damping part through the rotation axis at pivoted in-process and rotate in step, slide in the stable spout of stable overcoat through damping part, can guarantee the stability performance of rotation axis when rotating.
Further, the inner side of the stable outer sleeve is provided with a stable sliding groove, the damping sliding block is positioned in the stable sliding groove, and the damping sliding block and the stable outer sleeve are slidably installed through the stable sliding groove.
Through adopting above-mentioned structure, when rocking the condition appears in step through rotation axis and stable endotheca for the shock attenuation board carries out reciprocating motion in the inside of shock attenuation cover, utilizes the shock attenuation liquid in the shock attenuation cover to make a round trip to reciprocate through the through-hole, and the reaction force of appling on the shock attenuation board simultaneously can be transmitted to the rotation axis on, thereby can effectively guarantee the stability performance when the pivot rotates, and then can promote the upset effect to the chip.
Further, a centrifugal ring is fixedly sleeved on the outer side of the rotating shaft and positioned between the locking assemblies, the centrifugal ring is used for monitoring stall induction of the rotating shaft, a groove is formed in the outer side of the centrifugal ring, a centrifugal piece is arranged in the groove, and an elastic connecting piece is connected between the centrifugal piece and the inner wall of the groove of the centrifugal ring;
the inner wall of the protection seat is provided with an inductive switch for supplying power to the electromagnet sleeve, the inductive switch is positioned on the right outer side of the centrifugal ring, and the centrifugal piece is matched with the inductive switch.
Through adopting above-mentioned structure, centrifugal force effort when rotating through the rotation axis for centrifugal member pulling elastic connection spare outwards removes, along with centrifugal member's outer removal and make it take place to contact with inductive switch, and then start inductive switch and with electric energy transmission to electromagnet sheathes in, make electromagnet sheathes in the circular telegram produce magnetism, and utilize this magnetism to produce the suction to fixed iron cover, thereby hold it and lock, make the rotation axis stop operation, and send the information in step and remind relevant personnel in time to overhaul it, can effectively avoid the equipment to appear stall condition and lead to the fact the influence to the detection test of chip, the security performance of further promotion equipment simultaneously.
Further, a groove is vertically formed in one side, opposite to the clamping component, of the clamping part, and a driving component is arranged in the groove and used for driving the clamping operation of the clamping component to move, and the driving component comprises a driving sliding rod and a driving sliding block;
the driving slide bar is arranged in the groove of the clamping part, and the driving slide bar is slidably provided with a driving slide block.
Through adopting above-mentioned structure, slide on the drive slide bar through the drive slider to can drive clamping assembly relative movement and fix the centre gripping to the chip, and can realize driving assembly's removal through this setting.
Further, the connecting blocks are fixedly arranged on the opposite sides of the clamping assemblies, and connecting rods are fixedly connected between the connecting blocks and the driving sliding blocks.
Through adopting above-mentioned structure, can make the drive slider drive clamping assembly and remove in step at the in-process that removes through this setting.
Further, the upside fixed mounting of frame has the test frame, the fixed accredited testing organization who tests the chip that is provided with on the test frame, wherein, be provided with photoelectric switch on the inner wall of frame relative conveying assembly one side, photoelectric switch is used for responding to the chip that test seat and await measuring were tested, and photoelectric switch is located under the test frame.
Through adopting above-mentioned structure, when test seat and chip remove to the assigned position, through photoelectric switch's setting, when the chip removes to photoelectric switch's the place ahead to produce the response, and through setting up photoelectric switch and accredited testing organization into electric connection, once photoelectric switch senses induction seat and chip, photoelectric switch then sends the signal transmission to accredited testing organization in, utilizes accredited testing organization to detect the chip openly.
Advantageous effects
Compared with the prior art, the invention provides the automatic turnover type chip testing equipment, which has the following beneficial effects:
1. when stall phenomenon appears in the rotation axis, centrifugal force effort through rotation axis rotation for centrifugal member pulling elastic connection piece outwards removes, through the outer removal of centrifugal member and make it take place to contact with inductive switch, start inductive switch and with electric energy transmission to electromagnet sheathe in, make electromagnet sheathe circular telegram produce magnetism, and utilize this magnetism to produce the suction to fixed iron cover, thereby hold it and lock, make the rotation axis stop operation, and send the information in step and remind relevant personnel in time to overhaul it, can effectively avoid the equipment to appear stall condition and cause the influence to the detection test of chip, the security performance of further promotion equipment simultaneously.
2. The device is through utilizing the grip block to carry out the centre gripping to the chip, and can play the effect of buffering through the elastic pad, effectively avoid leading to the fact the chip to appear warping because of grip block clamping dynamics is too big, utilize positioning chuck and chip contact each other simultaneously, promote positioning chuck to adsorb on the chip surface through the extrusion of grip block, and the inside air of positioning chuck is all outwards discharged by the breather valve through the interior cavity in the grip block, thereby make positioning chuck form negative pressure state, can effectively guarantee the absorption dynamics of positioning chuck to the chip, effectively improved the stability of chip, and then promote the testing effect to the chip.
3. The device induces the induction seat and the chip through the photoelectric switch, and prompts the conveying motor to stop running, and sends out an electric signal through the photoelectric switch to be transmitted to the testing mechanism, and the testing mechanism is utilized to detect and test the front surface of the chip; after the testing mechanism detects the front surface of the chip, the turnover mechanism is started through the control of the program, the rotation shaft is utilized to drive the clamping part, the clamping assembly and the chip to rotate, the back surface of the chip is rotated to the upper side, the turnover of the chip is realized, the testing mechanism is utilized to detect and test the back surface of the chip, and meanwhile, the detection and test accuracy of the chip can be guaranteed through the setting of the turnover mechanism.
4. When the rotation shaft shakes and shakes, the rotation shaft and the stable inner sleeve synchronously shake, the damping sleeve is made to extrude the spring, the damping plate reciprocates in the damping sleeve, damping liquid in the damping sleeve is utilized to reciprocate back and forth through the through hole, and reaction force applied to the damping plate can be transferred to the rotation shaft, so that stability of the rotation shaft during rotation can be effectively guaranteed, and the overturning effect of the chip can be improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed for the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic perspective view of the whole structure of the present invention;
FIG. 2 is a schematic view of a mounting structure of a transport assembly and a test seat according to the present invention;
FIG. 3 is a schematic view of the transport assembly of the present invention;
FIG. 4 is a schematic view of the mounting structure of the test socket and the turnover mechanism of the present invention;
FIG. 5 is a schematic view of the mounting structure of the clamping portion and clamping assembly of the present invention;
FIG. 6 is a schematic view of a clamping assembly of the present invention;
FIG. 7 is a schematic view of the mounting structure of the guard and the rotating shaft of the present invention;
FIG. 8 is a schematic view of the mounting structure of the stabilizing assembly and the rotating shaft of the present invention;
FIG. 9 is a schematic view of the shock absorbing member of the present invention;
FIG. 10 is a schematic view of the locking assembly and rotating shaft mounting structure of the present invention;
fig. 11 is an enlarged schematic view of portion a of fig. 10 in accordance with the present invention.
In the figure: 1. a base; 2. a frame; 3. a control cabinet; 4. a transport assembly; 41. a conveying motor; 42. a conveying roller; 43. a conveyor belt; 5. a test seat; 6. a turnover mechanism; 61. a rotation shaft; 7. a clamping part; 8. a clamping assembly; 81. a clamping seat; 82. an elastic pad; 83. a clamping plate; 84. positioning a sucker; 85. a vent valve; 9. a protective part; 10. a stabilizing assembly; 101. stabilizing the outer jacket; 1011. stabilizing the chute; 102. stabilizing the inner sleeve; 103. a shock absorbing member; 1031. a damping sleeve; 1032. a shock-absorbing rod; 1033. a damping slide block; 1034. a shock absorbing plate; 1035. a spring; 1036. a through hole; 11. a protective seat; 12. a centrifugal ring; 13. a centrifuge; 131. an elastic connection member; 14. an inductive switch; 15. a locking assembly; 151. fixing an iron sleeve; 152. an electromagnet sleeve; 16. a drive assembly; 161. driving a slide bar; 162. driving a sliding block; 17. a connecting block; 171. a connecting rod; 18. a test rack; 19. a testing mechanism; 20. an optoelectronic switch.
Description of the embodiments
The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are only some embodiments of the present invention, but not all embodiments, and all other embodiments obtained by those skilled in the art without making creative efforts fall within the protection scope of the present invention.
Referring to fig. 1 and 2, an embodiment of the invention provides an automatic turnover type chip testing device, which comprises a machine base 1, wherein a machine frame 2 is fixedly installed on the upper side of the machine base 1, a control cabinet 3 is fixedly arranged on the front side of the machine frame 2, a conveying component 4 for conveying chips is arranged on the machine frame 2, a plurality of test seats 5 are arranged on the conveying component 4, the test seats 5 are uniformly distributed on the conveying component 4, as shown in fig. 4, a turnover mechanism 6 is arranged on the test seats 5, the turnover mechanism 6 is fixedly connected with a clamping part 7 by a rotating shaft 61, a clamping component 8 for clamping the chips is arranged on the clamping part 7, and turnover operation on the front and the back of the chips in a clamping state is formed by the turnover mechanism 6; the protective part 9 is sleeved on the periphery of the rotating shaft 61, so that the rotating shaft 61 penetrates through the central shaft of the protective part 9 and is rotationally connected.
As shown in fig. 7 and 8, the inside of the guard 9 is provided with a stabilizing assembly 10 and a guard seat 11; the stabilizing assembly 10 comprises a stabilizing outer sleeve 101, a stabilizing inner sleeve 102 and a damping part 103, wherein the outer side of the stabilizing outer sleeve 101 is fixedly installed with the inner wall of the protecting part 9, the inner side of the stabilizing inner sleeve 102 is fixedly installed with the outer side of the rotating shaft 61, the damping part 103 is arranged between the stabilizing outer sleeve 101 and the stabilizing inner sleeve 102, the damping part 103 is fixedly installed with the stabilizing inner sleeve 102, and the damping part 103 is slidably installed with the stabilizing outer sleeve 101.
As shown in fig. 10-11, a locking assembly 15 is arranged in the protective seat 11, the locking assembly 15 comprises a fixed iron sleeve 151 and an electromagnet sleeve 152, the fixed iron sleeve 151 is fixedly sleeved on the periphery of the rotating shaft 61, the outer side wall of the electromagnet sleeve 152 is mutually attached to the inner wall of the protective seat 11, the rotating shaft 61, the fixed iron sleeve 151 and the electromagnet sleeve 152 are sequentially sleeved, and the fixed iron sleeve 151 and the rotating shaft 61 are locked by electrifying the electromagnet sleeve 152; the upper part of the test seat 5 is provided with a test mechanism 19, and the front and back surfaces of the chip are detected by the test mechanism 19; when the rotating shaft 61 is stalled, the elastic connecting piece 131 is pulled to move outwards by the centrifugal force acting force generated when the rotating shaft 61 rotates, the centrifugal piece 13 moves outwards and is contacted with the induction switch 14, the induction switch 14 is started and electric energy is transmitted to the electromagnet sleeve 152, the electromagnet sleeve 152 is electrified to generate magnetism, the fixed iron sleeve 151 is attracted by the magnetism, so that the fixed iron sleeve 151 is sucked and locked, the rotating shaft 61 is stopped to synchronously send out information to remind related personnel to overhaul the fixed iron sleeve in time, the influence of stall condition on detection test of a chip of equipment can be effectively avoided, and meanwhile, the safety performance of the equipment is further improved.
The outer side of the rotating shaft 61 is fixedly sleeved with a centrifugal ring 12, the centrifugal ring 12 is positioned between the locking assemblies 15, the centrifugal ring 12 is used for monitoring stall induction of the rotating shaft 61, a groove is formed in the outer side of the centrifugal ring 12, a centrifugal piece 13 is arranged in the groove, and an elastic connecting piece 131 is connected between the centrifugal piece 13 and the inner wall of the groove of the centrifugal ring 12; the inner wall of the protection seat 11 is provided with an inductive switch 14 for supplying power to the electromagnet sleeve 152, the inductive switch 14 is positioned at the right outer side of the centrifugal ring 12, and the centrifugal piece 13 is matched with the inductive switch 14 for use; the centrifugal force generated when the rotating shaft 61 rotates causes the centrifugal member 13 to pull the elastic connecting member 131 to move outwards, and the centrifugal member 13 moves outwards and makes contact with the induction switch 14, so that the induction switch 14 is started and electric energy is transmitted to the electromagnet sleeve 152, the electromagnet sleeve 152 is electrified to generate magnetism, and the magnetism is utilized to generate attraction force to the fixed iron sleeve 151, so that the fixed iron sleeve is sucked and locked, and the rotating shaft 61 stops running.
As shown in fig. 9, the shock absorbing member 103 includes a shock absorbing sleeve 1031, a shock absorbing rod 1032, a shock absorbing slider 1033, a shock absorbing plate 1034, a spring 1035, and a through hole 1036; one side of a damping sleeve 1031 is fixedly arranged with a stabilizing inner sleeve 102, a damping rod 1032 is movably arranged on the damping sleeve 1031, a damping slide block 1033 and a damping plate 1034 are respectively arranged at two ends of the damping rod 1032, the damping slide block 1033 is positioned at one end of the damping rod 1032 close to the stabilizing outer sleeve 101, the damping plate 1034 is positioned at one end of the damping rod 1032 far away from the damping slide block 1033 and is positioned in the damping sleeve 1031, a spring 1035 is fixedly sleeved outside the damping rod 1032 and the damping sleeve 1031 and between the stabilizing inner sleeve 102 and the damping slide block 1033, a plurality of through holes 1036 are formed in the damping plate 1034, damping liquid is arranged in the damping sleeve 1031, and the through holes 1036 are used for the back and forth flow of the damping liquid; the rotation shaft 61 drives the stable inner sleeve 102 and the damping part 103 to synchronously rotate in the rotating process, and the damping part 103 slides in the stable sliding groove 1011 of the stable outer sleeve 101, so that the stability of the rotation shaft 61 in the rotating process is ensured.
A stable sliding groove 1011 is formed in the inner side of the stable outer sleeve 101, a damping sliding block 1033 is positioned in the stable sliding groove 1011, and the damping sliding block 1033 and the stable outer sleeve 101 are slidably installed through the stable sliding groove 1011; when the shaking condition occurs synchronously through the rotating shaft 61 and the stable inner sleeve 102, the damping plate 1034 reciprocates in the damping sleeve 1031, the damping liquid in the damping sleeve 1031 reciprocates back and forth through the through hole 1036, and the reaction force applied on the damping plate 1034 can be transmitted to the rotating shaft 61, so that the stability of the rotating shaft during rotation can be effectively ensured.
As shown in fig. 3, the conveying assembly 4 includes a conveying motor 41, a conveying roller 42, and a conveying belt 43; the conveying motor 41 is fixedly arranged on the outer side of the frame 2, the conveying roller 42 is movably arranged on the inner side of the frame 2, the conveying motor 41 is fixedly connected with the conveying roller 42 by utilizing an output end, and a conveying belt 43 for testing and conveying chips is arranged on the outer side of the conveying roller 42; the output end of the conveying motor 41 drives the conveying roller 42 to rotate, and the test seat 5 and the chip are driven to move based on acting force when the conveying roller 42 is contacted with the conveying belt 43, so that automatic feeding of the chip is realized.
The clamping assembly 8 comprises a clamping seat 81, an elastic pad 82, a clamping plate 83, a positioning sucker 84 and a ventilation valve 85; an elastic pad 82 is fixedly arranged on one side of the clamping seat 81, a clamping plate 83 for clamping the chip is fixedly arranged on one side, away from the clamping seat 81, of the elastic pad 82, a plurality of positioning suckers 84 are arranged between the elastic pads 82 and opposite to one side of the clamping seat 81, the positioning suckers 84 are uniformly and symmetrically distributed, and the positioning suckers 84 are used for fixedly positioning the chip; the chip is fixedly clamped through the relative movement of the clamping assembly 8, and the clamping assembly 8 clamps the chip by utilizing the clamping plate 83 in the process of clamping the chip, and the elastic pad 82 can play a role in buffering, so that the chip deformation caused by overlarge clamping force of the clamping plate 83 is effectively avoided.
As shown in fig. 6, an inner cavity is formed in the clamping seat 81 and is communicated with the positioning sucker 84, a vent valve 85 for inflating and deflating the positioning sucker 84 is arranged on the outer side of the clamping seat 81, and the vent valve 85 is communicated with the inner cavity of the clamping seat 81; utilize location sucking disc 84 and chip contact each other, impel location sucking disc 84 to adsorb on the chip surface through the extrusion of grip slipper 81, and the inside air of location sucking disc 84 is all outwards discharged by breather valve 85 through the interior cavity in grip slipper 81 to make location sucking disc 84 form negative pressure state, can effectively guarantee the absorption dynamics of location sucking disc 84 to the chip.
As shown in fig. 5, a groove is vertically formed on one side of the clamping part 7 opposite to the clamping component 8, and a driving component 16 is arranged in the groove, the driving component 16 is used for driving the clamping operation of the clamping component 8, and the driving component 16 comprises a driving sliding rod 161 and a driving sliding block 162; the driving slide bar 161 is arranged in a groove of the clamping part 7, and the driving slide bar 161 is provided with a driving slide block 162 in a sliding way; the driving sliding block 162 slides on the driving sliding rod 161, so that the clamping assembly 8 can be driven to relatively move to fixedly clamp the chip, and the driving assembly 16 can be moved through the arrangement. The opposite sides of the clamping assemblies 8 are fixedly provided with connecting blocks 17, and connecting rods 171 are fixedly connected between the connecting blocks 17 and the driving sliding blocks 162; by this arrangement, the driving slider 162 can drive the clamping assembly 8 to move synchronously during the movement.
The upper side of the machine base 1 is fixedly provided with a test frame 18, the test frame 18 is fixedly provided with a test mechanism 19 for testing chips, wherein the inner wall of one side of the machine base 1 opposite to the conveying component 4 is provided with a photoelectric switch 20, the photoelectric switch 20 is used for sensing the test base 5 and the chips to be tested, and the photoelectric switch 20 is positioned under the test frame 18; when the test seat 5 and the chip move to the designated position, through the arrangement of the photoelectric switch 20, when the chip moves to the right front of the photoelectric switch 20, induction is generated, and once the photoelectric switch 20 senses the induction seat and the chip, the photoelectric switch 20 sends out an electric signal to the test mechanism 19 through setting the photoelectric switch 20 to be electrically connected with the test mechanism 19, and the test mechanism 19 is utilized to detect and test the front of the chip.
Specific use and action of the embodiment:
working principle: after the chips are packaged, potential defects may exist, which may cause unstable performance or potential defects in functions of the chips, if the chips with the potential defects are used on key equipment, faults may occur, and property loss or life danger of users may occur, so after the chip finished product is produced, detection test is performed on the chips, during use, the chips to be detected and tested are placed right above the test seat 5, and by setting a program of the control cabinet 3, the driving sliding block 162 is caused to slide on the driving sliding rod 161, and the clamping assembly 8 is driven to relatively move to fixedly clamp the chips.
In-process to the chip centre gripping is carried out through clamping assembly 8 utilizes grip block 83 to carry out the centre gripping to the chip, and can play the effect of buffering through elastic pad 82, effectively avoid appearing warping because of grip block 83 clamping force is too big causes the chip, simultaneously the in-process that grip block 83 carried out the centre gripping to the chip utilizes location sucking disc 84 and chip contact each other, the extrusion through grip block 81 makes location sucking disc 84 adsorb on the chip surface, and the inside air of location sucking disc 84 is all outwards discharged by breather valve 85 through the interior cavity in grip block 81, thereby make location sucking disc 84 form negative pressure state, can effectively guarantee the absorption dynamics of location sucking disc 84 to the chip, the stability of chip has effectively been improved.
The output end of the conveying motor 41 drives the conveying roller 42 to rotate, the test seat 5 and the chip are driven to move based on acting force when the conveying roller 42 is contacted with the conveying belt 43, so that automatic feeding of the chip is realized, meanwhile, the production efficiency of a manufacturer is improved, and along with continuous movement of the chip, when the chip moves to a specified position, induction is generated when the chip moves to the right front of the photoelectric switch 20 through the arrangement of the photoelectric switch 20, and the photoelectric switch 20 is electrically connected with the test mechanism 19, once the photoelectric switch 20 senses the induction seat and the chip, the conveying motor 41 stops running, an electric signal is transmitted to the test mechanism 19 through the photoelectric switch 20, and the front of the chip is detected and tested by the test mechanism 19; after the front surface of the chip is detected by the testing mechanism 19, starting the turnover mechanism 6 through program control, driving the clamping part 7, the clamping assembly 8 and the chip to rotate by using the rotating shaft 61, turning the back surface of the chip to the upper part, realizing turnover of the chip, and detecting and testing the back surface of the chip by using the testing mechanism 19;
in addition, the rotation shaft 61 drives the stable inner sleeve 102 and the damping component 103 to synchronously rotate in the rotating process, the damping component 103 slides in the stable sliding groove 1011 of the stable outer sleeve 101, so that the stability of the rotation shaft 61 in rotation is ensured, and when the rotation shaft 61 shakes and shakes, the rotation shaft 61 and the stable inner sleeve 102 synchronously shake, the stable inner sleeve 102 is caused to squeeze the spring 1035, the damping plate 1034 reciprocates in the damping sleeve 1031, the damping liquid in the damping sleeve 1031 reciprocates back and forth through the through hole 1036, and the reaction force applied on the damping plate 1034 can be transmitted to the rotation shaft 61, so that the stability of the rotation shaft in rotation can be effectively ensured, and the overturning effect on the chip can be improved.
And when the equipment runs for a long time, when the rotating shaft 61 is stalled, the centrifugal force generated when the rotating shaft 61 rotates causes the centrifugal piece 13 to pull the elastic connecting piece 131 to move outwards, and the elastic connecting piece 13 moves outwards along with the centrifugal piece and makes the centrifugal piece contact with the induction switch 14, so that the induction switch 14 is started and electric energy is transmitted to the electromagnet sleeve 152, the electromagnet sleeve 152 is electrified to generate magnetism, and the fixed iron sleeve 151 is attracted by the magnetism, so that the fixed iron sleeve is sucked and locked, the rotating shaft 61 stops running, and synchronously sends information to remind related personnel to overhaul the fixed iron sleeve in time, thereby effectively avoiding the influence of the stall condition of the equipment on the detection test of the chip, and further improving the safety performance of the equipment.
The preferred embodiments of the invention disclosed above are intended only to assist in the explanation of the invention. The preferred embodiments are not exhaustive or to limit the invention to the precise form disclosed. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the invention and the practical application, to thereby enable others skilled in the art to best understand and utilize the invention. The invention is limited only by the claims and the full scope and equivalents thereof.
Claims (10)
1. The utility model provides a can overturn core piece test equipment automatically, includes frame (1), its characterized in that:
the chip overturning machine comprises a machine base (1), wherein a machine frame (2) is fixedly arranged on the upper side of the machine base (1), a control cabinet (3) is fixedly arranged on the front side of the machine frame (2), a conveying assembly (4) for conveying chips is arranged on the machine frame (2), a plurality of test seats (5) are arranged on the conveying assembly (4), the test seats (5) are uniformly distributed on the conveying assembly (4), an overturning mechanism (6) is arranged on the test seats (5), the overturning mechanism (6) is fixedly connected with a clamping part (7) through a rotating shaft (61), a clamping assembly (8) for clamping the chips is arranged on the clamping part (7), and overturning operations of the front side and the back side of the chips in a clamping state are formed through the overturning mechanism (6).
The periphery of the rotating shaft (61) is sleeved with a protecting part (9), the rotating shaft (61) penetrates through the central shaft of the protecting part (9) and is connected in a rotating mode, and a stabilizing assembly (10) and a protecting seat (11) are arranged in the protecting part (9);
the stabilizing assembly (10) comprises a stabilizing outer sleeve (101), a stabilizing inner sleeve (102) and a damping part (103), wherein the outer side of the stabilizing outer sleeve (101) is fixedly installed with the inner wall of the protection part (9), the inner side of the stabilizing inner sleeve (102) is fixedly installed with the outer side of the rotating shaft (61), the damping part (103) is arranged between the stabilizing outer sleeve (101) and the stabilizing inner sleeve (102), the damping part (103) is fixedly installed with the stabilizing inner sleeve (102), and the damping part (103) is slidably installed with the stabilizing outer sleeve (101);
the inside of the protection seat (11) is provided with a locking assembly (15), the locking assembly (15) comprises a fixed iron sleeve (151) and an electromagnet sleeve (152), the fixed iron sleeve (151) is fixedly sleeved on the periphery of the rotating shaft (61), the outer side wall of the electromagnet sleeve (152) is mutually attached to the inner wall of the protection seat (11), so that the rotating shaft (61), the fixed iron sleeve (151) and the electromagnet sleeve (152) are sequentially sleeved, and the fixed iron sleeve (151) and the rotating shaft (61) are locked by electrifying the electromagnet sleeve (152);
the upper part of the test seat (5) is provided with a test mechanism (19), and the front and back sides of the chip are detected through the test mechanism (19).
2. An automatically reversible chip test apparatus as in claim 1, wherein: the conveying assembly (4) comprises a conveying motor (41), a conveying roller (42) and a conveying belt (43);
the conveying motor (41) is fixedly arranged on the outer side of the frame (2), the conveying roller (42) is movably arranged on the inner side of the frame (2), the conveying motor (41) is fixedly connected with the conveying roller (42) through an output end, and a conveying belt (43) for testing and conveying chips is arranged on the outer side of the conveying roller (42).
3. An automatically reversible chip test apparatus as in claim 1, wherein: the clamping assembly (8) comprises a clamping seat (81), an elastic pad (82), a clamping plate (83), a positioning sucker (84) and a ventilation valve (85);
the chip clamping device is characterized in that an elastic pad (82) is fixedly arranged on one side of the clamping seat (81), a clamping plate (83) for clamping the chip is fixedly arranged on one side, away from the clamping seat (81), of the elastic pad (82), a plurality of positioning suckers (84) are arranged on one side, opposite to the elastic pad (82), of the clamping seat (81) and located between the elastic pads (82), the positioning suckers (84) are uniformly and symmetrically distributed, and the positioning suckers (84) are used for fixedly positioning the chip.
4. An automatically reversible chip test apparatus as claimed in claim 3, wherein: the inside of grip slipper (81) has offered the interior cavity, and interior cavity and location sucking disc (84) set up to communicate with each other, the outside of grip slipper (81) is provided with breather valve (85) that fills gassing to location sucking disc (84), and breather valve (85) and interior cavity setting of grip slipper (81) communicate with each other.
5. An automatically reversible chip test apparatus as in claim 1, wherein: the damping component (103) comprises a damping sleeve (1031), a damping rod (1032), a damping sliding block (1033), a damping plate (1034), a spring (1035) and a through hole (1036);
the damping sleeve (1031) is fixedly arranged on one side of the damping sleeve (1031) and is fixedly arranged in the stabilizing inner sleeve (102), a damping rod (1032) is movably arranged on the damping sleeve (1031), damping sliding blocks (1033) and damping plates (1034) are respectively arranged at two ends of the damping rod (1032), the damping sliding blocks (1033) are located at one ends, close to the stabilizing outer sleeve (101), of the damping rod (1032), the damping plates (1034) are located at one ends, far away from the damping sliding blocks (1033), of the damping rod (1032) and are located in the damping sleeve (1031), and springs (1035) are fixedly sleeved between the stabilizing inner sleeve (102) and the damping sliding blocks (1033);
the inside of damping sleeve (1031) is equipped with damping fluid, a plurality of through-hole (1036) have been seted up on shock attenuation board (1034), and through-hole (1036) are used for the round trip flow of damping fluid.
6. An automatically reversible chip test apparatus as in claim 5, wherein: a stable sliding groove (1011) is formed in the inner side of the stable outer sleeve (101), the damping sliding block (1033) is located in the stable sliding groove (1011), and the damping sliding block (1033) and the stable outer sleeve (101) are installed in a sliding mode through the stable sliding groove (1011).
7. An automatically reversible chip test apparatus as in claim 1, wherein: the centrifugal ring (12) is fixedly sleeved on the outer side of the rotating shaft (61), the centrifugal ring (12) is positioned between the locking assemblies (15), the centrifugal ring (12) is used for monitoring stall induction of the rotating shaft (61), a groove is formed in the outer side of the centrifugal ring (12), a centrifugal piece (13) is arranged in the groove, and an elastic connecting piece (131) is connected between the centrifugal piece (13) and the inner wall of the groove of the centrifugal ring (12);
the inner wall of the protection seat (11) is provided with an inductive switch (14) for supplying power to the electromagnet sleeve (152), the inductive switch (14) is positioned at the right outer side of the centrifugal ring (12), and the centrifugal piece (13) is matched with the inductive switch (14).
8. An automatically reversible chip test apparatus as in claim 1, wherein: the clamping part (7) is vertically provided with a groove at one side opposite to the clamping component (8), a driving component (16) is arranged in the groove, the driving component (16) is used for driving the clamping component (8) to perform clamping operation, and the driving component (16) comprises a driving sliding rod (161) and a driving sliding block (162);
the driving sliding rod (161) is arranged in a groove of the clamping part (7), and the driving sliding rod (161) is provided with a driving sliding block (162) in a sliding manner.
9. An automatically reversible chip test apparatus as in claim 8, wherein: connecting blocks (17) are fixedly arranged on the opposite sides of the clamping assemblies (8), and connecting rods (171) are fixedly connected between the connecting blocks (17) and the driving sliding blocks (162).
10. An automatically reversible chip test apparatus as in claim 1, wherein: the testing device is characterized in that a testing frame (18) is fixedly arranged on the upper side of the machine base (1), a testing mechanism (19) for testing chips is fixedly arranged on the testing frame (18), a photoelectric switch (20) is arranged on the inner wall of one side of the machine base (1) opposite to the conveying assembly (4), the photoelectric switch (20) is used for sensing the testing seat (5) and the chips to be tested, and the photoelectric switch (20) is located under the testing frame (18).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310943861.2A CN116654530B (en) | 2023-07-31 | 2023-07-31 | Automatic turnover type chip testing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310943861.2A CN116654530B (en) | 2023-07-31 | 2023-07-31 | Automatic turnover type chip testing equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN116654530A true CN116654530A (en) | 2023-08-29 |
| CN116654530B CN116654530B (en) | 2023-10-10 |
Family
ID=87728210
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310943861.2A Active CN116654530B (en) | 2023-07-31 | 2023-07-31 | Automatic turnover type chip testing equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116654530B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117148122A (en) * | 2023-10-31 | 2023-12-01 | 镇江矽佳测试技术有限公司 | Chip testing device and system convenient to remove |
| CN117963418A (en) * | 2024-01-30 | 2024-05-03 | 温州科菱环保科技有限公司 | Surface plasma treatment equipment |
| CN118123870A (en) * | 2024-05-07 | 2024-06-04 | 苏州微伏芯芯片科技有限公司 | Adjustable chip overturning mechanical arm and use method |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107861043A (en) * | 2017-09-26 | 2018-03-30 | 广东利扬芯片测试股份有限公司 | Touch chip electric characteristic detecting apparatus, equipment and method of testing |
| CN113859936A (en) * | 2021-11-08 | 2021-12-31 | 湖南南松光电科技有限公司 | Turning device is used in cell-phone chip processing |
| CN216234660U (en) * | 2021-11-12 | 2022-04-08 | 杭州艾斯博电装有限公司 | Multi-level industrial power supply circuit board frock testing arrangement |
| CN218464906U (en) * | 2022-11-02 | 2023-02-10 | 苏州航菱微精密组件有限公司 | Wafer clamping and transporting structure |
| CN219227970U (en) * | 2023-01-10 | 2023-06-20 | 星华科技（惠州）有限公司 | Crawler-type panel turnover machine for circuit board |
-
2023
- 2023-07-31 CN CN202310943861.2A patent/CN116654530B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107861043A (en) * | 2017-09-26 | 2018-03-30 | 广东利扬芯片测试股份有限公司 | Touch chip electric characteristic detecting apparatus, equipment and method of testing |
| CN113859936A (en) * | 2021-11-08 | 2021-12-31 | 湖南南松光电科技有限公司 | Turning device is used in cell-phone chip processing |
| CN216234660U (en) * | 2021-11-12 | 2022-04-08 | 杭州艾斯博电装有限公司 | Multi-level industrial power supply circuit board frock testing arrangement |
| CN218464906U (en) * | 2022-11-02 | 2023-02-10 | 苏州航菱微精密组件有限公司 | Wafer clamping and transporting structure |
| CN219227970U (en) * | 2023-01-10 | 2023-06-20 | 星华科技（惠州）有限公司 | Crawler-type panel turnover machine for circuit board |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117148122A (en) * | 2023-10-31 | 2023-12-01 | 镇江矽佳测试技术有限公司 | Chip testing device and system convenient to remove |
| CN117148122B (en) * | 2023-10-31 | 2024-01-23 | 镇江矽佳测试技术有限公司 | Chip testing device and system convenient to remove |
| CN117963418A (en) * | 2024-01-30 | 2024-05-03 | 温州科菱环保科技有限公司 | Surface plasma treatment equipment |
| CN118123870A (en) * | 2024-05-07 | 2024-06-04 | 苏州微伏芯芯片科技有限公司 | Adjustable chip overturning mechanical arm and use method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN116654530B (en) | 2023-10-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN116654530B (en) | Automatic turnover type chip testing equipment | |
| CN107909877A (en) | A kind of automatic sorting actual training device and method | |
| CN104646996B (en) | Suction nozzle and pressing claw mechanism capable of moving in Z-axis direction | |
| CN112024460B (en) | Detection equipment capable of accurately positioning chip | |
| CN106323984A (en) | Pre-treatment device for integrated circuit detection | |
| CN109406020B (en) | Automatic testing equipment for torque of micro motor | |
| CN210533653U (en) | Drop test machine capable of preventing secondary impact | |
| CN206384553U (en) | Material transfering device | |
| CN214053561U (en) | Support and base equipment check out test set of product | |
| CN108033235B (en) | A kind of spoon material arranging apparatus of view-based access control model | |
| CN109834054A (en) | A kind of device for diaphragm gas meter epithelium quality testing | |
| CN210690364U (en) | Needle die device for automatically and rapidly checking punching and drilling of circuit board | |
| CN217738415U (en) | Integrated electronic component shell detection equipment | |
| CN206248778U (en) | A kind of pcb plates open short-circuit automatic detecting machine | |
| CN110907182A (en) | Material clamping mechanism for motor testing device | |
| CN217276420U (en) | Mobile vibrating table for detecting outgoing flowmeter | |
| CN206589458U (en) | Hollow product positioning device | |
| CN206906539U (en) | One kind is to more flying probe tester automatic loading and unloading mechanisms and flying probe production line | |
| CN210401635U (en) | Automatic magnetic detection device | |
| CN221351426U (en) | Food quality detects with detecting platform | |
| CN108996181B (en) | Automatic turnover device for detecting surface defects of bearing | |
| JPH09246790A (en) | Device for loading electronic part | |
| CN111220109B (en) | Detection device and product detection method | |
| CN216526068U (en) | Commutator inner hole electric detection all-in-one machine | |
| CN213638587U (en) | Embedded core plate's frock |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |