CN116566195A - Power supply circuit and ATE equipment - Google Patents

Power supply circuit and ATE equipment Download PDF

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Publication number
CN116566195A
CN116566195A CN202310363152.7A CN202310363152A CN116566195A CN 116566195 A CN116566195 A CN 116566195A CN 202310363152 A CN202310363152 A CN 202310363152A CN 116566195 A CN116566195 A CN 116566195A
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CN
China
Prior art keywords
power supply
unit
output
switching
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202310363152.7A
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Chinese (zh)
Inventor
吴海涛
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Shenzhen Cztek Co ltd
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Shenzhen Cztek Co ltd
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Priority to CN202310363152.7A priority Critical patent/CN116566195A/en
Publication of CN116566195A publication Critical patent/CN116566195A/en
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00—Details of apparatus for conversion
    • H02M1/0003—Details of control, feedback or regulation circuits
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00—Details of apparatus for conversion
    • H02M1/0003—Details of control, feedback or regulation circuits
    • H02M1/0006—Arrangements for supplying an adequate voltage to the control circuit of converters
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00—Details of apparatus for conversion
    • H02M1/08—Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters
    • H02M1/088—Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters for the simultaneous control of series or parallel connected semiconductor devices
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00—Details of apparatus for conversion
    • H02M1/36—Means for starting or stopping converters
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00—Details of apparatus for conversion
    • H02M1/38—Means for preventing simultaneous conduction of switches
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M3/00—Conversion of dc power input into dc power output
    • H02M3/02—Conversion of dc power input into dc power output without intermediate conversion into ac
    • H02M3/04—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
    • H02M3/10—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode
    • H02M3/145—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal
    • H02M3/155—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only
    • H02M3/156—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The invention discloses a power supply circuit and ATE equipment, and relates to the field of semiconductor integrated circuit manufacturing, wherein the power supply circuit comprises a plurality of power supply units, a current spreading unit and a switching unit; each power supply unit comprises an input end and an output end, the input end of each power supply unit is respectively connected with one port of the ATE equipment, and the output end of each power supply unit is respectively connected with one device to be tested; the switching unit comprises an input end and a plurality of output ends, wherein the input end of the switching unit is connected with the output end of the current spreading unit, the plurality of output ends of the switching unit are respectively connected with the output ends of the power supply units in a one-to-one correspondence manner, and the switching unit is used for controlling any one of the plurality of power supply units to output power supply voltage to the device to be tested together with the output end of the current spreading unit. According to the embodiment of the invention, one flow expansion unit is not required to be added to each power supply, and the number of the flow expansion units is reduced by sharing one flow expansion unit, so that the heating and cost are reduced, and the utilization rate is improved.

Description

Power supply circuit and ATE equipment
Technical Field
The present invention relates to the field of semiconductor integrated circuit fabrication, and more particularly, to a power supply circuit and ATE equipment.
Background
When the ATE (Automatic Test Equipment) tester is used for testing the device DUT (Device Under Test) to be tested, a power supply circuit of the ATE tester is required to supply power to the device to be tested, the power supply circuit comprises a plurality of power supply units, generally, the power supply units adopt DC/DC, and the output ends of the power supply units are connected with the DUT of the device to be tested to provide working power for the DUT.
The power supply unit can provide larger current for the DUT by adopting DC/DC, but the ripple of the DC/DC is larger, and the requirement of test precision can not be met, so that the power supply unit also adopts LDO, the LDO has smaller ripple and can ensure the test precision, but the current generally output by the LDO is smaller, however, the DUT in some tests can need large current driving, that is, any power supply unit can reach the maximum current in order to meet the requirement of working current of the DUT in some tests.
Therefore, the problem that any one power supply unit can reach the maximum current on the premise of ensuring the test precision still exists in the related art.
Disclosure of Invention
Aiming at the defects of the related art, the invention provides a power supply circuit and ATE equipment, and aims to solve the problem that any power supply unit can reach the maximum current on the premise of ensuring the test precision in the prior art.
In order to achieve the above purpose, the embodiment of the present invention adopts the following technical scheme:
according to one aspect of the present invention, a power supply circuit includes a plurality of power supply units, a current spreading unit, and a switching unit; each power supply unit comprises an input end and an output end, the input end of each power supply unit is respectively connected with one port of the ATE equipment, and the output end of each power supply unit is respectively connected with one device to be tested; the power supply unit is used for supplying power to the connected device to be tested; the output end of the flow expansion unit is connected with the switching unit; the current expansion unit is used for supplying power to different devices to be tested under the control of the switching unit; the switching unit comprises an input end and a plurality of output ends, the number of the output ends of the switching unit is the same as that of the output ends of the power supply units, the input end of the switching unit is connected with the output end of the current expansion unit, and the plurality of output ends of the switching unit are respectively connected with the output ends of the power supply units in a one-to-one correspondence manner; the switching unit is used for controlling any one output end of the power supply units and the output end of the current expansion unit to jointly output power supply voltage to the device to be tested, and the device to be tested is connected with any one output end.
Optionally, the switching unit includes a gating module and a plurality of switching modules; the number of the switch modules is the same as the number of the output ends of the power supply units; each switch module comprises an input end, an output end and a control end, the input end of each switch module is connected with the output end of the current spreading unit, the output end of each switch module is respectively connected with the output end of each power supply unit in a one-to-one correspondence manner, and the control end of each switch module is respectively connected with a plurality of output ends of the gating module in a one-to-one correspondence manner; under the control of the gating module, the switching modules are turned on one at a time.
Optionally, the power supply unit includes a first linear regulated power supply, and the first linear regulated power supply is connected between a port of the ATE equipment and the device under test; the current expansion unit comprises a second linear voltage-stabilized power supply, and the second linear voltage-stabilized power supply is connected with the switching unit.
Optionally, the power supply circuit further includes a selection unit, the selection unit including a plurality of input terminals and an output terminal; the output end of the selection unit is connected with the second linear voltage-stabilized power supply of the current expansion unit; and under the control of the selection unit, the SET terminal of any one of the first linear voltage-stabilizing power supplies is connected with the SET terminal of the second linear voltage-stabilizing power supply.
Optionally, the power supply unit further includes a first switching power supply, an input end of the first switching power supply is connected with a port of the ATE equipment, and an output end of the first switching power supply is connected with an input end of the first linear regulated power supply.
Optionally, the VIOC terminal of the first linear voltage-stabilizing power supply is connected to the FB terminal of the first switching power supply, so as to regulate the input voltage of the first switching power supply output to the first linear voltage-stabilizing power supply, so that the voltage difference between the input voltage and the output voltage of the first linear voltage-stabilizing power supply is within a set range.
Optionally, the current expansion unit further includes a second switching power supply, and an output end of the second switching power supply is connected with an input end of the second linear stabilized voltage power supply.
Optionally, the VIOC terminal of the second linear voltage-stabilizing power supply is connected to the FB terminal of the second switching power supply, so as to regulate the input voltage of the second switching power supply output to the second linear voltage-stabilizing power supply, so that the voltage difference between the input voltage and the output voltage of the second linear voltage-stabilizing power supply is within a set range.
Optionally, the power supply circuit further includes a control unit, and an output end of the control unit is connected to an input end of the switching unit, and is configured to output a control signal to the input end of the switching unit to control the switching unit.
According to one aspect of the invention, an ATE device includes a power supply circuit as described above.
The invention has the following beneficial effects:
the switching unit is used for connecting the output end of the current expansion unit with the output end of any one of the power units, so that the current expansion unit and the power units jointly output power voltage to corresponding devices to be tested, the purpose that any one of the power units can realize parallel current expansion with the current expansion unit is achieved, the requirement that the output end of any one of the power units can reach the maximum current can be met on the premise that the power units adopt LDO power to ensure the test precision, and the problem that any one of the power units cannot reach the maximum current on the premise that the test precision is ensured in the related art is solved.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings that are required to be used in the description of the embodiments of the present invention will be briefly described below.
FIG. 1 is a schematic diagram of a power circuit of a prior art ATE device;
FIG. 2 is a schematic diagram of an application scenario of a power supply circuit;
FIG. 3 is a schematic diagram of a power circuit according to an embodiment of the present invention;
FIG. 4 is a circuit diagram of one possible implementation of a power supply circuit provided by an embodiment of the present invention;
FIG. 5 is a circuit diagram of another possible implementation of a power supply circuit provided by an embodiment of the present invention;
FIG. 6 is a circuit diagram of two linear regulated power supplies connected in parallel;
fig. 7 is a circuit diagram of a switching power supply and a linear regulated power supply in series.
Detailed Description
The present invention will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present invention more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention. In addition, the technical features of the embodiments of the present invention described below may be combined with each other as long as they do not collide with each other.
As used herein, the singular forms "a", "an", "the" and "the" are intended to include the plural forms as well, unless expressly stated otherwise, as understood by those skilled in the art. It will be further understood that the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. It will be understood that when an element is referred to as being "connected" or "coupled" to another element, it can be directly connected or coupled to the other element or intervening elements may also be present. Further, "connected" or "coupled" as used herein may include wirelessly connected or wirelessly coupled. The term "and/or" as used herein includes all or any element and all combination of one or more of the associated listed items.
The following is an introduction and explanation of several terms involved in the present invention:
ATE, automatic Test Equipment, in the semiconductor industry, refers to an automatic Integrated Circuit (IC) tester for testing the integrity of integrated circuit functions, which is the final process of integrated circuit manufacturing to ensure the quality of integrated circuit manufacturing.
DUT, device Under Test, i.e. device under test.
DC, which is a Direct Current, i.e. a Direct Current source, can also be considered as a switching power supply.
LDO, low Dropout Regulator, i.e., low dropout linear regulator, can also be considered as a linear regulated power supply.
VIOC means Voltage for Input-to-Output Control.
The Mosfet switch is a Metal-Oxide-Semiconductor Field-Effect Transistor Metal-Oxide semiconductor field effect transistor, and one Mosfet has three electrodes: the grid electrode, the source electrode and the drain electrode are controlled to be turned on and off by controlling the voltage of the grid electrode, and the like a switch controlled by the voltage.
The multiplexer, also called a data selector, can select any one of them as required in the process of multiplexing data, for example, a four-out-of-one multiplexer has four inputs and one output, and any one of the four inputs is transmitted to the output according to the state of the data selection terminal.
The decoder is a kind of multi-input multi-output combined logic circuit device, generally a device with less input and more output, and is commonly provided with n-line-2 n Line coding and 8421BCD coding are two types.
As described above, the prior art still has the problem that any one power supply unit cannot reach the maximum current under the premise of ensuring the test precision.
At present, an LDO parallel scheme is proposed for the above problem, as shown in fig. 1, in the LDO parallel scheme, power supply units P11, P12 to P1N all adopt LDO power supplies, and each power supply unit P11, P12 to P1N is connected in parallel with one LDO power supply, so that the output end of any one power supply unit can reach the maximum current under the premise of ensuring the test precision.
However, the total test current will not exceed 1.5A, which makes it necessary to have at most one power supply unit with its output end required to reach the maximum current, i.e. 1A, so that the utilization rate of the multiple LDO power supplies in the LDO parallel scheme is not high, and 4×7 LDO power supply units are taken as examples of power supply units, if each power supply unit is connected in parallel with one LDO power supply, 56 LDO power supplies are required, which greatly increases the cost and the volume of the PCB board (Printed Circuit Board), and increases the heat generation of the whole board.
Therefore, an effective scheme is still needed to solve the problem that any one power supply unit can reach the maximum current on the premise of ensuring the test precision.
Referring to fig. 2, an application scenario of a power circuit is shown, in the application scenario, the power circuit is connected between a plurality of ports of an ATE and a DUT, an ATE device supplies power to the DUT through the power circuit connected to the plurality of ports, a signal end of the ATE device outputs a control signal to the DUT, and then the DUT outputs data to be tested to the ATE device, so that the ATE device performs semiconductor testing on the DUT based on the data to be tested. In one possible implementation, where the DUT is a CIS chip, the data to be tested is image data.
In order to make the objects, technical solutions and advantages of the present invention more apparent, the power supply circuit provided by the present invention will be described in further detail with reference to the accompanying drawings.
Referring to fig. 3, a power circuit is shown, which includes a plurality of power units P31 to P3N, a current spreading unit E31, and a switching unit C31.
Each of the power supply units P31 to P3N includes an input end and an output end, the input ends of each of the power supply units P31 to P3N are respectively connected with one port of the ATE equipment (for simplicity of drawing, the connection relationship between the ATE equipment and the power supply units is not shown in fig. 3), and the output ends of each of the power supply units P31 to P3N are respectively connected with one DUT; the power supply units P31 to P3N are used for supplying power to the connected DUT.
The output end of the flow expansion unit E31 is connected with the switching unit C31; the current spreading unit E31 is configured to supply power to different devices under test under the control of the switching unit C31.
The switching unit C31 comprises an input end and a plurality of output ends, the number of the output ends of the switching unit C31 is the same as that of the output ends of the power supply units P31 to P3N, the input end of the switching unit C31 is connected with the output end of the flow expansion unit E31, and the plurality of output ends of the switching unit C31 are respectively connected with the output ends of the power supply units P31 to P3N in a one-to-one correspondence manner; the switching unit C31 is configured to control any one of the output terminals of the plurality of power supply units P31 to P3N and the output terminal of the current spreading unit E31 to commonly output a power supply voltage to the DUT connected to any one of the output terminals.
Through the embodiment, the switching unit connects the output end of the current spreading unit with the output end of any one of the power units, so that the current spreading unit and the power units jointly output power voltage to corresponding devices to be tested, parallel current spreading of any one of the power units and the current spreading unit is realized, the requirement that the output end of any one of the power units can reach the maximum current is met under the condition that the power units adopt LDO to ensure the test precision, and meanwhile, each power unit is prevented from being provided with one current spreading unit, the cost is reduced, the heating is reduced, and the utilization rate is improved.
In an exemplary embodiment, the switching unit includes a gating module and a plurality of switching modules; the number of the switch modules is the same as the number of the output ends of the power supply units; each switch module comprises an input end, an output end and a control end, the input end of each switch module is connected with the output end of the current spreading unit, the output end of each switch module is respectively connected with the output end of each power supply unit in a one-to-one correspondence manner, and the control end of each switch module is respectively connected with a plurality of output ends of the gating module in a one-to-one correspondence manner; under the control of the gating module, one switching module is turned on at a time. Alternatively, the switching module may be a MOSFET switch and the gating module may be a decoder.
By the embodiment, the output end of the current spreading unit is connected with the output end of any power supply unit, and the current of the output end of any power supply unit can be flexibly switched to be increased.
In an exemplary embodiment, the power supply unit includes a first linear regulated power supply connected between a port of the ATE device and the device under test; the current expansion unit comprises a second linear voltage-stabilized power supply, and the second linear voltage-stabilized power supply is connected with the switching unit. Optionally, the first linear regulated power supply and the second linear regulated power supply are both LT3045.
Through the embodiment, the power supply unit and the current expansion unit both adopt linear stabilized power supplies, the output ripple is small, and the test precision can be provided.
In an exemplary embodiment, the power supply circuit further includes a selection unit including a plurality of input terminals and an output terminal; the output end of the selection unit is connected with the second linear stabilized power supply of the current spreading unit; under the control of the selection unit, the SET end of any one first linear voltage-stabilized power supply is connected with the SET end of the second linear voltage-stabilized power supply. The selection unit may be a multiplexer.
Through the embodiment, the SET end of any one first linear voltage-stabilized power supply is connected with the SET end of the second linear voltage-stabilized power supply by the selection unit, so that the voltage is consistent when the output end of the current expansion unit is connected with the output end of any one power supply unit, and the testing precision is further improved.
In an exemplary embodiment, the power supply unit further comprises a first switching power supply, an input terminal of the first switching power supply being connected to a port of the ATE device, and an output terminal of the first switching power supply being connected to an input terminal of the first linear regulated power supply. Alternatively, the first switching power supply may be a DCDC converter.
Through the embodiment, the remote compensation can be realized, and the test precision is further improved.
In an exemplary embodiment, the VIOC terminal of the first linear voltage-stabilized power supply is connected to the FB terminal of the first switching power supply, so as to regulate the input voltage of the first switching power supply output to the first linear voltage-stabilized power supply, so that the voltage difference between the input voltage and the output voltage of the first linear voltage-stabilized power supply is within a set range.
Through the embodiment, the VIOC can adjust the output of the upstream switching power supply, so that a reasonable voltage drop is maintained across the first linear regulated power supply, and thus power consumption and heat generation can be reduced to the maximum extent.
In an exemplary embodiment, the current spreading unit further includes a second switching power supply, and an output terminal of the second switching power supply is connected to an input terminal of the second linear regulated power supply.
Through the embodiment, the remote compensation can be realized, and the test precision is further improved.
In an exemplary embodiment, the VIOC terminal of the second linear voltage-stabilized power supply is connected to the FB terminal of the second switching power supply, so as to regulate the input voltage of the second switching power supply output to the second linear voltage-stabilized power supply, so that the voltage difference between the input voltage and the output voltage of the second linear voltage-stabilized power supply is within a set range.
Through the embodiment, the VIOC can adjust the output of the upstream switching power supply, so that a reasonable voltage drop is maintained across the second linear regulated power supply, and thus power consumption and heat generation can be reduced to the maximum extent.
In an exemplary embodiment, the power supply circuit further includes a control unit, an output terminal of the control unit is connected to an input terminal of the switching unit, and is configured to output a control signal to the input terminal of the switching unit to control the switching unit
Through the embodiment, the control of the switching unit is realized based on the control unit, so that the output end of the current expansion unit is controlled to be connected with the output end of any power supply unit needing current expansion, and the working current is never increased for the device to be tested which needs high-current driving.
The details of the above embodiments will be described below in connection with a preferred embodiment.
Taking an example in which the power supply circuit includes seven power supply units, in an exemplary embodiment, as shown in fig. 4, seven power supply units P41 to P47, one current spreading unit E41, and a switching unit C41 composed of a gating module 401 and seven switching modules M1 to M7 are included. Alternatively, the gating module 401 may be a 3/8 decoder and the switching modules M1 to M7 may be mosfet switching transistors.
Each of the switch modules M1 to M7 includes an input end, an output end and a control end, the output end of the current expansion unit E41 is connected with the input ends of the seven switch modules M1 to M7, the output ends of the seven switch modules M1 to M7 are respectively connected with the output ends of the seven power supply units P41 to P47 in a one-to-one correspondence manner, and the output ends s1, s2, s3, s4, s5, s6, s7 of the 3/8 decoder are respectively connected with the control ends of the seven switch tubes in a one-to-one correspondence manner. The control ends of the seven switch modules M1 to M7 are respectively connected with a plurality of output ends s1, s2, s3, s4, s5, s6 and s7 of the gating module 401 in a one-to-one correspondence manner, and one switch module is turned on at most at the same time under the control of the gating module 401.
Wherein the output end of the current spreading unit E41 is connected to the output ends of the seven power supply units P41 to P47 through the seven switch modules M1 to M7, respectively; only when the control end of the switch module obtains an effective level, the switch module is conducted; the gating module 401 employs a 3/8 decoder, where at most one of its multiple output terminals s1 to s7 is active at the same time, and any one of the output terminals of the gating module 401 can be made active by controlling the input terminal of the gating module 401.
For example, when the seven power supply units P41 to P47 do not need large output current, i.e. do not need current spreading, all the output ends of the gating module 401 are at an invalid level, the control ends of the seven switching modules M1 to M7 obtain signals at the invalid level, the seven switching tubes are all turned off, and the current spreading unit E41 is not connected to the output end of any power supply unit. When any power supply unit, such as the power supply unit P43, needs to perform current expansion, by setting the input end of the gating module 401 to 011, and the output ends s1, s2, s3, s4, s5, s6, s7 to 0, 1, 0 respectively, only the control end of the switch module M3 will obtain an effective level signal, and only the switch tube M3 in all the switch modules will be turned on, so that the output end of the current expansion unit E41 and the output end of the power supply unit P43 are connected, so that the output end current of the power supply unit P43 is increased, and current expansion of the output end of the power supply unit is realized. Any other power supply unit needs to spread the current, and the gating module 401 controls the switch module to connect the output end of the spreading unit E41 with the output end of the power supply unit, so as to realize the spreading of the power supply unit.
Through the embodiment, the decoder and the switching tube are adopted to form the switching unit, so that the problem that the output end of the flow expansion unit is connected to the output end of more than two paths of power supplies due to software errors is avoided, and efficient and accurate multi-path switching flow expansion is realized; in addition, compared with the prior art, taking 4×7 power supply units as an example, if each power supply unit needs 1A, 56 power supply units are needed, namely, each power supply unit is connected with an LDO power supply in parallel, and by adopting the scheme provided by the embodiment, the requirements can be met by only 32 power supply units, namely, each 7 power supply units share one current spreading unit, so that a large amount of cost and the area of a PCB board can be saved, and meanwhile, the heating of the whole board is also greatly reduced.
Referring to fig. 5, in an exemplary embodiment, based on fig. 4, each of the seven power supply units P51 to P57 is composed of a DC/DC series LT3045, the current spreading unit E51 is composed of a DC/DC series LT3045, the power supply circuit further includes a selection unit 502, input ends of the selection unit 502 are respectively connected to SET ends of the LT3045 of the seven power supply units P51 to P57, and output ends of the selection unit 502 are connected to SET ends of the LT3045 of the current spreading unit E51. Wherein the gating module 501 may be a 3/8 decoder and the selecting unit 502 may be a multiplexer.
When the switching module 501 connects the output end of the current spreading unit E51 with the output end of any power supply unit to spread current, at this time, the LT3045 of the current spreading unit E51 and the LT3045 of the power supply unit are connected in parallel, in order to ensure that the voltages are consistent, the SET ends of the LT3045 connected in parallel need to be connected, and when the output end of the current spreading unit E51 is connected with the output end of any power supply unit, the selection unit 502 cooperates to connect the SET end of the LT3045 of the current spreading unit E51 and the SET end of the LT3045 of the power supply unit.
For further explanation of the parallel connection of the two LT3045, please refer to FIG. 6, which shows a circuit diagram of the parallel connection of the two LT3045 chips, wherein the IN terminal, EN/UV terminal, PGFB terminal of the LT3045 chips 601, 602 are all connected to V IN One end of the capacitor C61 is connected to the IN end, EN/UV end, PGFB end and V end of the LT3045 chips 601, 602 IN The other end of the capacitor C61 is grounded; the OUT terminal and the OUTS terminal of the LT3045 chip 601 are connected with V OUT One end of the capacitor C64 is connected to the OUT end, the OUTS end and the V end of the LT3045 chip 601 OUT The other end of the capacitor C64 is grounded, and the OUT end and the OUTS end of the LT3045 chip 602 are connected with V OUT One end of the capacitor C63 is connected to the OUT end, the OUTS end and the V end of the LT3045 chip 601 OUT The other end of the capacitor C63 is grounded; the SET terminals of the LT3045 chips 601 and 602 are both connected to one end of a resistor R61, the other end of the resistor R61 is grounded, and a capacitor C62 is connected in parallel with the resistor R61.
When the gating module 501 in fig. 5 connects the output end of the current spreading unit E51 with the output end of any power supply unit to spread current, at this time, the LT3045 of the current spreading unit E51 and the LT3045 of the power supply unit are connected in parallel, and at the same time, the selection unit 502 cooperates to connect the SET end of the LT3045 of the current spreading unit E51 and the SET end of the LT3045 of the power supply unit, at this time, a specific circuit of the parallel LT3045 is shown in fig. 6.
Through the above embodiment, the power supply unit adopts the DC/DC series LT3045, which can reduce output ripple and increase test accuracy. The selection unit may dynamically connect the SET terminals of the parallel LT3045 (linear voltage-stabilized power supply), in which the SET terminals of the parallel LT3045 (linear voltage-stabilized power supply) are fixedly connected in the prior art, and when the parallel LT3045 (linear voltage-stabilized power supply) changes, the SET terminals of the parallel LT3045 (linear voltage-stabilized power supply) after the change cannot be dynamically connected.
In an exemplary embodiment, in a series connection of DC/DC and LT3045, the voltage drop across LT3045 may be controlled using the VIOC terminal of LT3045, thereby reducing power consumption and heat generation. Fig. 7 shows a circuit diagram of DC/DC and LT3045 connected in series, including a DC/DC chip 701, a LT3045 chip 702, a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a first capacitor C1, a second capacitor C2, a third capacitor C3, a fourth capacitor C4, a fifth capacitor C5, a sixth capacitor C6, and a first inductor L1.
The DC/DC chip 701 is an LT8608 chip, the first resistor R1 is 40.2kΩ, the second resistor R2 is 7.68kΩ, the third resistor R3 is 2.21kΩ, the fourth resistor R4 is a slide varistor, the fifth resistor R5 is 249 Ω, the first capacitor C1 is 10nF, the second capacitor C2 is 1uF, the third capacitor C3 is 0.22uF, the fourth capacitor C4 is 47uF, the fifth capacitor C5 is 4.7uF, the sixth capacitor C6 is 10uF, and the first inductor L1 is 2.2uH.
The IN terminal, EN/UV terminal of DC/DC chip 701 is connected with V IN The TR/SS end of the DC/DC chip 701 is connected with one end of the first capacitor C1, the INTCVcc end of the DC/DC chip 701 is connected with one end of the second capacitor C2, and the R of the DC/DC chip 701 T The end is connected with one end of the first resistor R1, the other ends of the first capacitor C1, the second capacitor C2 and the first resistor R1 are grounded, the GND end of the DC/DC chip 701 is grounded, the BST end of the DC/DC chip 701 is connected with one end of the third capacitor C3, the SW end of the DC/DC chip 701 is connected with the other end of the third capacitor C3, and the SW end of the DC/DC chip 701 is also connected with one end of the first inductor L1.
The IN end, EN/UV end, PGFB end of LT3045 chip 702 are all connected to the other end of first inductor L1, the IN end, EN/UV end, PGFB end of LT3045 chip 702 are also connected to one end of fourth capacitor C4, the other end of fourth capacitor C4 is grounded, the end FB end of DC/DC chip 701 is connected to one end of third resistor R3, the end FB end of DC/DC chip 701 is connected to one end of second resistor R2, the other end of second resistor R2 is grounded, the other end of third resistor R3 is connected to the VIOC end of LT3045 chip 702, the SET end of LT3045 chip 702 is connected to one end of fourth resistor R4, one end of fifth capacitor C5, the ILIM end of LT3045 chip 702 is connected to one end of fifth resistor R5, the OUT end of LT3045 chip 702 is connected to one end of sixth capacitor C6, the GND end of LT3045 chip 702, the other end of fourth resistor R4, the other end of fifth capacitor C5, the other end of fifth resistor C5, and the other end of sixth capacitor C6 are all grounded.
Wherein the VIOC terminal of LT3045 chip 702 and the FB terminal of DC/DC chip 701 are connected such that the output of DC/DC is electricThe output voltages of the voltage and LDO occur at a fixed voltage differential, e.g., V in FIG. 7 LDOIN -V LDOUT =1v, meaning that the voltage drop over LT3045 stabilizes at 1V, so that the voltage drop over LT3045 is smaller, and the excessive heating power caused by excessive voltage drop is avoided, and the heating is further reduced.
It should be noted that, there are many different types of linear regulated power Supplies (LDOs) with the function of VIOC, including but not limited to LT3045, LT3042 and LT3070-1, and in the embodiment of the present invention, only LT3045 is taken as an example, and this is not a specific limitation.
Through the above embodiment, the VIOC can regulate the output voltage of the upstream switching power supply, thereby maintaining a reasonable voltage drop across the linear regulated power supply (LDO) to minimize power consumption and heat generation.
In an exemplary embodiment, a microcontroller is used in controlling the assignment of values to the decoder inputs. In addition, the selection unit transmits any input end signal to the output end, and the assignment of the control end of the selection unit to the output end can also be realized through the microcontroller.
For example, in fig. 5, the power supply unit P53 needs to perform current spreading, and the microcontroller is used to assign 010 to the input terminal of the 3/8 decoder 501, so that the third output terminal of the 3/8 decoder 501 is at an active level, that is, the 3/8 decoder outputs 00100000, and current spreading of the power supply unit P53 can be implemented.
The microcontroller is an IC chip and is mainly used for executing programs for controlling other devices or machines, and optionally, the microcontroller can be a PIC single-chip microcomputer, an ARM microcontroller, an 8051 single-chip microcomputer, an AVR microcontroller or an MSP single-chip microcomputer.
The invention also provides an ATE device, which comprises the power supply circuit in each embodiment. Referring back to fig. 2, the power supply circuit is connected between a plurality of ports of the ATE and the DUT, the ATE equipment supplies power to the DUT through the power supply circuit connected with the ports, and the signal end of the ATE equipment outputs a control signal to the DUT, and then the DUT outputs data to be tested to the ATE equipment, so that the ATE equipment performs semiconductor test on the DUT based on the data to be tested.
Compared with the prior art, the invention has the following beneficial effects:
1. the switching unit connects the output end of the flow expansion unit with the output end of any power supply unit, realizes the parallel flow expansion of the power supply unit and the flow expansion unit, meets the requirement that any power supply unit can reach the maximum current, but under some conditions, at most one power supply needs the flow expansion unit to perform flow expansion at the same time.
2. The decoder and the switching tube are adopted to form the switching unit, the switching tube is controlled by the decoder to realize parallel current expansion of the current expansion unit and any power supply, the output characteristic of the decoder is utilized, the current expansion unit and the multipath power supply are prevented from being combined together due to software errors, and the accuracy and the efficiency are improved.
3. Compared with DC/DC, the linear regulated power supply (LDO) has low ripple, and the measurement accuracy can be improved by adopting the linear regulated power supply.
4. The FB terminal of the switching power supply (DC/DC) is adjusted by the voltage of the terminal VIOC terminal of the linear stabilized power supply, so that the output voltage of the switching power supply (i.e., the input voltage of the linear stabilized power supply) and the output voltage of the linear stabilized power supply appear at a fixed voltage difference, thereby reducing the voltage drop and the power consumption on the linear stabilized power supply, and further reducing the heat productivity.
It should be understood that, although the steps in the flowcharts of the figures are shown in order as indicated by the arrows, these steps are not necessarily performed in order as indicated by the arrows. The steps are not strictly limited in order and may be performed in other orders, unless explicitly stated herein. Moreover, at least some of the steps in the flowcharts of the figures may include a plurality of sub-steps or stages that are not necessarily performed at the same time, but may be performed at different times, the order of their execution not necessarily being sequential, but may be performed in turn or alternately with other steps or at least a portion of the other steps or stages.
It will be readily appreciated by those skilled in the art that the foregoing description is merely a preferred embodiment of the invention and is not intended to limit the invention, but any modifications, equivalents, improvements or alternatives falling within the spirit and principles of the invention are intended to be included within the scope of the invention.

Claims (10)

1. The power supply circuit is characterized by comprising a plurality of power supply units, a current spreading unit and a switching unit; wherein,,
each power supply unit comprises an input end and an output end, the input end of each power supply unit is respectively connected with one port of the ATE equipment, and the output end of each power supply unit is respectively connected with one device to be tested; the power supply unit is used for supplying power to the connected device to be tested;
the output end of the flow expansion unit is connected with the switching unit; the current expansion unit is used for supplying power to different devices to be tested under the control of the switching unit;
the switching unit comprises an input end and a plurality of output ends, the number of the output ends of the switching unit is the same as that of the output ends of the power supply units, the input end of the switching unit is connected with the output end of the current expansion unit, and the plurality of output ends of the switching unit are respectively connected with the output ends of the power supply units in a one-to-one correspondence manner; the switching unit is used for controlling any one output end of the power supply units and the output end of the current expansion unit to jointly output power supply voltage to the device to be tested, and the device to be tested is connected with any one output end.
2. The power supply circuit of claim 1, wherein the switching unit comprises a gating module and a plurality of switching modules; the number of the switch modules is the same as the number of the output ends of the power supply units; wherein,,
each switch module comprises an input end, an output end and a control end, the input end of each switch module is connected with the output end of the current spreading unit, the output end of each switch module is respectively connected with the output end of each power supply unit in a one-to-one correspondence manner, and the control end of each switch module is respectively connected with a plurality of output ends of the gating module in a one-to-one correspondence manner; under the control of the gating module, the switching modules are turned on one at a time.
3. The power supply circuit of claim 1, wherein the power supply unit comprises a first linear regulated power supply connected between a port of the ATE device and the device under test;
the current expansion unit comprises a second linear voltage-stabilized power supply, and the second linear voltage-stabilized power supply is connected with the switching unit.
4. The power supply circuit of claim 3, further comprising a selection unit, the selection unit comprising a plurality of inputs and an output; wherein,,
the input ends of the selection units are respectively connected with the first linear stabilized power supplies of the power supply units in a one-to-one correspondence manner, and the output ends of the selection units are connected with the second linear stabilized power supplies of the current expansion units; and under the control of the selection unit, the SET terminal of any one of the first linear voltage-stabilizing power supplies is connected with the SET terminal of the second linear voltage-stabilizing power supply.
5. The power supply circuit of claim 3, wherein the power supply unit further comprises a first switching power supply, an input of the first switching power supply being connected to a port of the ATE device, an output of the first switching power supply being connected to an input of the first linear regulated power supply.
6. The power supply circuit of claim 5, wherein a VIOC terminal of the first linear regulated power supply is coupled to a FB terminal of the first switching power supply to regulate an input voltage of the first switching power supply output to the first linear regulated power supply such that a voltage difference between the input voltage and the output voltage of the first linear regulated power supply is within a set range.
7. The power supply circuit of claim 3, wherein the current spreading unit further comprises a second switching power supply, an output of the second switching power supply being connected to an input of the second linear regulated power supply.
8. The power supply circuit of claim 7, wherein a VIOC terminal of the second linear regulated power supply is connected to a FB terminal of the second switching power supply to regulate an input voltage of the second switching power supply output to the second linear regulated power supply such that a voltage difference between the input voltage and the output voltage of the second linear regulated power supply is within a set range.
9. The power supply circuit according to any one of claims 1 to 8, further comprising a control unit, an output of the control unit being connected to an input of the switching unit for outputting a control signal to the input of the switching unit for controlling the switching unit.
10. ATE apparatus comprising a power supply circuit according to any of claims 1 to 9.
CN202310363152.7A 2023-03-31 2023-03-31 Power supply circuit and ATE equipment Pending CN116566195A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117420422A (en) * 2023-12-18 2024-01-19 赛英特半导体技术(西安)有限公司 VI source current expansion method, circuit and VI source

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117420422A (en) * 2023-12-18 2024-01-19 赛英特半导体技术(西安)有限公司 VI source current expansion method, circuit and VI source

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