CN216561571U

CN216561571U - Test system and device of multichannel constant current electronic load

Info

Publication number: CN216561571U
Application number: CN202123115349.4U
Authority: CN
Inventors: 陈承静; 柴俊标; 卜建明
Original assignee: Hangzhou Zhong An Electronics Co ltd
Current assignee: Hangzhou Zhongan Electronics Co ltd
Priority date: 2021-12-10
Filing date: 2021-12-10
Publication date: 2022-05-17
Anticipated expiration: 2031-12-10

Abstract

The utility model relates to the aging equipment testing technology, and discloses a testing system and a testing device of a multi-channel constant-current electronic load, which comprise at least one group of electronic loads, an FPGA control module and at least 1 group of rectifying and filtering modules; the FPGA control module generates at least 1 path of PWM wave and transmits the generated PWM wave to the rectification filtering module; and the rectification filtering module processes the PWM wave and transmits a processed voltage signal to the electronic load. The utility model generates multi-path PWM waves through the FPGA control module and is used for controlling the electronic load, and the whole system has simple test control and low cost. The electronic load is controlled by the PWM wave and the rectifying and filtering circuit, so that 16-bit and higher control precision can be achieved.

Description

Test system and device of multichannel constant current electronic load

Technical Field

The utility model relates to a test technology of aging equipment, in particular to a test system and a test device of a multi-channel constant-current electronic load.

Background

The electronic load is a necessary detecting instrument for power supply products, the traditional multi-channel independently controlled constant current electronic load adopts a DAC chip to control a constant current value, and the mode has the defects of large control defect when processing multi-channel control, high cost, troublesome control and difficult operation.

For example, in the prior art, patent application No.: CN 201520921993.6, patent name: a multi-channel isolated electronic load and power supply aging test system is controlled by a plurality of DAC chips and is high in cost. The resources of the singlechip for controlling the DAC are more, and the control is troublesome.

Disclosure of Invention

Aiming at the defects that in the prior art, the cost is high, a singlechip for controlling the DAC has more resources and the control is troublesome because a plurality of DAC chips are used for controlling the electronic load, the utility model provides a testing system and a device of a multi-channel constant-current electronic load.

In order to solve the technical problem, the utility model is solved by the following technical scheme:

a test system of multi-channel constant-current electronic loads comprises at least one group of electronic loads, an FPGA control module and at least 1 group of rectifying and filtering modules; the FPGA control module generates at least 1 path of PWM wave and transmits the generated PWM wave to the rectification filtering module; and the rectification filtering module processes the PWM wave and transmits a processed voltage signal to the electronic load.

Different PWM waves are generated through the FPGA, so that the FPGA is used for controlling different electronic loads, and the FPGA is simple to control and low in cost.

Preferably, the rectification filter module is a first-order filter and comprises a resistor, a capacitor and an amplifier; one end of the resistor is connected with the capacitor and the anode of the input end of the amplifier, the other end of the capacitor is grounded, and the cathode of the input end of the amplifier is connected with the output end.

Preferably, the rectification filter module is a second-order filter module and comprises a first resistor, one end of the first resistor is connected with a first capacitor and a second resistor, the other end of the first capacitor is grounded, the other end of the second resistor is connected with the second capacitor and the anode of the input end of the amplifier, the other end of the second capacitor is grounded, and the cathode of the input end of the amplifier is connected with the output end.

Preferably, the system also comprises a singlechip and an upper computer; the upper computer provides different current values to the single chip microcomputer, the single chip microcomputer sends frequency and duty ratio signals to the FPGA control module, and the FPGA control module generates PWM waves with different frequencies and duty ratios according to the signals of the received frequencies and duty ratios.

Preferably, the FPGA chip adopted by the FPGA control module is a xilinx chip.

Preferably, the test system further comprises a power supply module, and the power supply module is used for supplying power for the test system of the electronic load.

In order to solve the technical problem, the utility model provides a testing device of a multi-channel constant current electronic load, and the testing device is a testing system of the multi-channel constant current electronic load.

At present, many test devices of the aging test equipment are realized based on the FPGA, so the test device for controlling the electronic load designed by the utility model has low cost and simple control.

Due to the adoption of the technical scheme, the utility model has the remarkable technical effects that:

the utility model generates multi-path PWM waves through the FPGA control module and is used for controlling the electronic load, and the whole system has simple test control and low cost.

The utility model controls the electronic load through the PWM wave and the rectifying and filtering circuit, thereby achieving 16-bit and higher control precision.

Drawings

FIG. 1 is a system diagram of the present invention.

Fig. 2 is a system diagram of embodiment 3 of the present invention.

Fig. 3 is a circuit diagram of a rectifying module according to embodiment 1 of the present invention.

Fig. 4 is a circuit diagram of a rectifying module according to embodiment 2 of the present invention.

Fig. 5 is a circuit diagram of an electronic load according to the present invention.

Fig. 6 is a 1.0V circuit diagram of the power module of the present invention.

Fig. 7 is a 1.5V circuit diagram of the power module of the present invention.

Fig. 8 is a 1.8V circuit diagram of the power module of the present invention.

Fig. 9 is a 3.3V circuit diagram of the power module of the present invention.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings and examples.

Example 1

The rectification filtering module is a first-order filtering module and comprises a resistor, a capacitor and an amplifier; one end of the resistor is connected with the capacitor and the anode of the input end of the amplifier, the other end of the capacitor is grounded, and the cathode of the input end of the amplifier is connected with the output end.

The FPGA chip adopted by the FPGA control module is a xilinx chip.

The power supply module is used for providing power for the test system of the electronic load. The power supply module provides 1.0V, 1.5V, 1.8V and 3.3V power supplies. The specific circuit diagram refers to the attached drawings.

Example 2

On the basis of embodiment 1, the rectifying and filtering module of this embodiment is a second-order filter, and includes that one end of a first resistor is connected to a first capacitor and a second resistor, the other end of the first capacitor is grounded, the other end of the second resistor is connected to a second capacitor and the anode of the input end of the amplifier, the other end of the second capacitor is grounded, and the cathode of the input end of the amplifier is connected to the output end.

In fig. 4, the first resistor R642 has a resistance of 4.7K; the first capacitor is C642; the resistance of the second resistor R643 is 4.7K; the second capacitance is C643; the amplifier is LM 358.

Example 3

On the basis of the embodiment, the embodiment also comprises a singlechip and an upper computer; the upper computer provides different current values to the single chip microcomputer, the single chip microcomputer sends frequency and duty ratio signals to the FPGA control module, and the FPGA control module generates PWM waves with different frequencies and duty ratios according to the signals of the received frequencies and duty ratios.

Example 4

On the basis of the above embodiments, the present embodiment provides a testing apparatus for a multi-channel constant current electronic load, where the testing apparatus includes a testing system for a multi-channel constant current electronic load.

Example 5

On the basis of the above embodiments, the electronic load of this embodiment has 10 sets, and a specific circuit of each set of electronic load is shown in fig. 5, and the corresponding rectifying and filtering module includes 10 sets of rectifying and filtering modules, and at the same time, 10 paths of PWM waves are generated in the FPGA control module.

Claims

1. A test system of multi-channel constant-current electronic loads comprises at least one group of electronic loads, and is characterized by comprising an FPGA control module and at least 1 group of rectifying and filtering modules; the FPGA control module generates at least 1 path of PWM wave and transmits the generated PWM wave to the rectification filtering module; and the rectification filtering module processes the PWM wave and transmits a processed voltage signal to the electronic load.

2. The system for testing the multi-channel constant-current electronic load according to claim 1, wherein the rectifying and filtering module is a first-order filter and comprises a resistor, a capacitor and an amplifier; one end of the resistor is connected with the capacitor and the anode of the input end of the amplifier, the other end of the capacitor is grounded, and the cathode of the input end of the amplifier is connected with the output end.

3. The system for testing the multi-channel constant-current electronic load according to claim 1, wherein the rectifying and filtering module is a second-order filter and comprises a first resistor, one end of the first resistor is connected with a first capacitor and a second resistor, the other end of the first capacitor is grounded, the other end of the second resistor is connected with a second capacitor and an anode of an input end of the amplifier, the other end of the second capacitor is grounded, and a cathode of the input end of the amplifier is connected with an output end.

4. The system for testing the multi-channel constant-current electronic load according to claim 1, further comprising a single chip microcomputer and an upper computer; the upper computer provides different current values to the single chip microcomputer, the single chip microcomputer sends frequency and duty ratio signals to the FPGA control module, and the FPGA control module generates PWM waves with different frequencies and duty ratios according to the signals of the received frequencies and duty ratios.

5. The system for testing the multi-channel constant-current electronic load according to claim 1, wherein an FPGA chip adopted by the FPGA control module is a xilinx chip.

6. The system of claim 1, further comprising a power module for providing power to the system for testing electronic loads.

7. A testing device for a multi-channel constant-current electronic load, which is characterized by comprising a testing system for the multi-channel constant-current electronic load as claimed in any one of claims 1 to 6.