CN114879080B - Transient high voltage suppression tube leakage current test system and method - Google Patents
Transient high voltage suppression tube leakage current test system and method Download PDFInfo
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Abstract
The invention provides a leakage current testing system and method of a transient high-voltage suppression tube, wherein a first output end of an upper computer module is connected with an input end of a programmable high-voltage power generation module, a second output end of the upper computer module is connected with a first input end of a power polarity switching module, an output end of the programmable high-voltage power generation module is connected with a second input end of the power polarity switching module, the first output end of the power polarity switching module is connected with first input ends of a plurality of TVS testing modules, the second output end of the power polarity switching module is connected with second input ends of the plurality of TVS testing modules, and output ends of the plurality of TVS testing modules are all connected with the input ends of the upper computer module. The invention not only can realize the parallel automatic test of the multipath TVS tubes, but also can automatically switch the polarities of the high-voltage constant-voltage sources to carry out the bidirectional leakage current test.
Description
Technical Field
The invention relates to the technical field of communication, in particular to a leakage current testing system and method of a transient high-voltage suppression tube, and especially relates to a leakage current testing system and method of a transient high-voltage suppression tube applied to an electronic detonator.
Background
In order to suppress surge and electromagnetic interference, the conventional electronic detonator adopts a bidirectional transient high voltage suppression tube (TVS tube), and the TVS tube is connected in parallel between the leg wire input ends of the electronic detonator module. Under normal conditions, the leakage current of the TVS tube is smaller and is generally less than 1 microampere, and the normal communication of the electronic detonator module is not affected. The normal power consumption of a single-shot electronic detonator module is generally about 20 microamps, and if the TVS tube leakage current is too large (such as more than 10 microamps or even more), abnormal communication of the electronic detonator module can be caused. Therefore, the TVS tube needs to be tested through a special test circuit, and the TVS tube with overlarge leakage current is prevented from being used on the electronic detonator module by mistake, so that detonator abnormality is caused. Most of the existing TVS tube leakage current testing circuits have complex structures, and cannot conduct bidirectional leakage current testing on the TVS at the same time, so that the testing cost is extremely high.
Patent document CN103487736B discloses an apparatus and method for detecting a TVS tube of a transient voltage suppressor, the apparatus including a dc voltage source for providing a detection voltage to a TVS tube in a power interface circuit to be detected, a power supply conversion device connected to the dc voltage source for connecting one TVS tube in the power interface circuit to be detected to the detection circuit and controlling the polarity of the TVS tube, and a current measurement device connected to the dc voltage source and the power supply conversion device for determining the electrical performance of the TVS tube currently connected to the detection circuit based on the measured current in the detection circuit. However, the patent document still has the defects of complex structure, incapability of simultaneously carrying out bidirectional leakage current test on the TVS tube and high test cost.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide a leakage current testing system and method for a transient high-voltage suppressor.
The invention provides a leakage current testing system of a transient high-voltage suppression tube, which comprises an upper computer module, a programmable high-voltage power generation module, a power polarity switching module and a plurality of TVS testing modules, wherein the upper computer module is connected with the programmable high-voltage power generation module;
The first output end of the upper computer module is connected with the input end of the programmable high-voltage power generation module, and the second output end of the upper computer module is connected with the first input end of the power polarity switching module;
The output end of the programmable high-voltage power generation module is connected with the second input end of the power polarity switching module;
The first output end of the power polarity switching module is connected with the first input ends of the TVS test modules, and the second output end of the power polarity switching module is connected with the second input ends of the TVS test modules;
the output ends of the TVS test modules are connected with the input end of the upper computer module;
The power supply polarity switching module is used for switching the polarities of voltages at two ends of the TVS tube, and the TVS testing module is used for converting the leakage current of the TVS tube into the voltage.
Preferably, the programmable high-voltage power generation module includes a capacitor C I, a capacitor C O, a capacitor C SS, a capacitor C C, a resistor R1, a resistor R2, a resistor R3, a resistor R4, a resistor R5, a resistor R SH, a resistor R SL, a resistor R C, an inductor L, a zener diode D, a regulator, and a proportional amplifier;
One end of the capacitor C I is respectively connected with one end of the inductor L, the VIN pin of the voltage stabilizer and the EN pin of the voltage stabilizer and is used as an external VIN pin;
the other end of the inductor L is respectively connected with the positive electrode of the voltage stabilizing diode D and three SW pins of the voltage stabilizer;
The negative electrode of the voltage stabilizing diode D is respectively connected with one end of the resistor R SH and one end of the capacitor C O and is used as a VOUT pin connected with the power polarity switching module, and the other end of the capacitor C O is grounded;
The other end of the resistor R SH is respectively connected with the FB pin of the voltage stabilizer, one end of the resistor R SL and one end of the resistor R1;
The other end of the resistor R SL is respectively connected with one end of the resistor R5, one end of the capacitor C SS, one end of the capacitor C C, an AGND pin of the voltage stabilizer and a SYNC pin of the voltage stabilizer;
The other end of the resistor R5 is connected with a FREQ pin of the voltage stabilizer, the other end of the capacitor C SS is connected with an SS pin of the voltage stabilizer, the other end of the capacitor C C is connected with one end of the resistor R C, and the other end of the resistor R C is connected with a COMP pin of the voltage stabilizer;
the other end of the resistor R1 is respectively connected with one end of the resistor R2 and the output end of the proportional amplifier;
the first power end of the proportional amplifier is externally connected with a power supply, the second power end of the proportional amplifier is grounded, the non-inverting input end of the proportional amplifier is connected with one end of the resistor R4, and the inverting input end of the proportional amplifier is respectively connected with the other end of the resistor R2 and one end of the resistor R3;
The other end of the resistor R4 is connected with the upper computer module and is used for receiving a DA control signal of the upper computer module;
The other end of the resistor R1 is used for receiving DA signals, and the other end of the resistor R3 is grounded;
and three PGND pins of the voltage stabilizer are all grounded.
Preferably, the stabilizer is a boost chip.
Preferably, the power polarity switching module comprises a double-pole double-throw relay K, a resistor R-S1, a resistor R-S2 and a triode, wherein the type of the double-pole double-throw relay K is TQ2-5V;
One end of the capacitor C O is respectively connected with a second pin of the double-pole double-throw relay K and a seventh pin of the double-pole double-throw relay K;
One end of the resistor R-S2 is respectively connected with one end of the resistor R-S1 and the base electrode of the three-stage tube, and the other end of the resistor R-S2 is connected with the control port of the upper computer module;
the other end of the resistor R-S1 is connected with the emitter of the third transistor and grounded;
and the collector electrode of the third tube is respectively connected with a first pin and a tenth pin of the double-pole double-throw relay K.
Preferably, the power polarity switching module further comprises a diode M7;
the collector electrode of the third transistor is respectively connected with the positive electrode of the diode M7 and the tenth pin of the double-pole double-throw relay K;
and the cathode of the diode M7 is connected with the pin I of the double-pole double-throw relay K.
Preferably, the TVS test module includes a resistor R6, a resistor R7, a resistor R8, a resistor R9, a bidirectional transient suppression diode TVS1, a bidirectional transient suppression diode TVS2, a first voltage follower, a second voltage follower, a first ADC voltage acquisition channel, a second ADC voltage acquisition channel, a single-pole double-throw switch K1, and a single-pole double-throw switch K2;
One end of the resistor R6 is respectively connected with one end of the resistor R7 and a third pin of the double-pole double-throw relay K, and the other end of the resistor R6 is respectively connected with one end of the bidirectional transient suppression diode TVS2 and a first contact end of the single-pole double-throw switch K2;
the other end of the resistor R7 is respectively connected with one end of the bidirectional transient suppression diode TVS1 and the first contact end of the single-pole double-throw switch K1;
the other end of the bidirectional transient suppression diode TVS2 is respectively connected with one end of the resistor R8 and the second contact end of the single-pole double-throw switch K2;
the other end of the bidirectional transient suppression diode TVS1 is respectively connected with one end of the resistor R9 and a second contact end of the single-pole double-throw switch K1;
The other end of the resistor R8 is respectively connected with the other end of the resistor R9 and the eighth pin of the double-pole double-throw relay K;
the single-pole end of the single-pole double-throw switch K1 is connected with the non-inverting input end of the first voltage follower, and the single-pole end of the single-pole double-throw switch K2 is connected with the non-inverting input end of the second voltage follower;
the first power end of the first voltage follower is externally connected with a power supply, and the second power end of the first voltage follower is grounded;
The inverting input end of the second voltage follower is respectively connected with the output end of the second voltage follower and the second ADC voltage acquisition channel, the first power end of the second voltage follower is externally connected with a power supply, and the second power end of the second voltage follower is grounded.
Preferably, the first power end of the first voltage follower is externally connected with a 3.3V direct current power supply, and the first power end of the second voltage follower is externally connected with a 3.3V direct current power supply.
Preferably, the upper computer module is an STM32F103R8T6 controller.
The invention also provides a test method of the leakage current test system based on the transient high-voltage suppression tube, which comprises the following steps:
Step 1, connecting a power supply, and supplying power to the upper computer module and the programmable high-voltage generation module through the power supply;
Step 2, generating a control voltage through a DA conversion function in the upper computer module, wherein the control voltage is used as a DA signal to be provided for the programmable high-voltage generation module, and is output to the other end of the resistor R1 after being stabilized by the proportional amplifier in the programmable high-voltage generation module, and the boost chip generates a corresponding high voltage for testing TVS according to the size of the DA signal;
Step 3, the high voltage generated by the programmable high voltage generation module is transmitted to the power polarity switching module, and the power polarity switching module transmits the high voltage to the appointed end of the TVS test module according to the control signal given by the upper computer module;
step 4, converting the current passing through the TVS testing module into voltage by a sampling resistor, stably outputting the voltage by a voltage follower, opening an ADC (analog to digital converter) adopting function of the upper computer module, and observing and recording a voltage value;
and 5, changing a control signal of the upper computer module to the power polarity switching module, switching polarities of two ends of the TVS, and testing the leakage current of the other end of the TVS.
Preferably, in the step 4, when the TVS is not turned on, the ADC theoretical value is 0, and when the TVS has a leakage current phenomenon or the TVS is turned on, the current is converted according to the ADC value.
Compared with the prior art, the invention has the following beneficial effects:
1. The invention solves the problems that the test automation degree of a transient high-voltage suppression tube applied to an electronic detonator is low and bidirectional test cannot be carried out by adopting a structure of combining a programmable constant-voltage source generating circuit and a power polarity switching circuit, achieves higher automatic test degree and can carry out random direction measurement on TVS;
2. the invention realizes low-cost large-scale test of the TVS tube by adopting a multi-path TVS parallel test method, thereby ensuring the effectiveness of the TVS tube on the electronic detonator module and improving the reliability of the detonator;
3. the test system comprises a programmable high-voltage constant-voltage source, a TVS voltage polarity switching module and a plurality of TVS test channels, so that not only can the parallel automatic test of the plurality of TVSs be realized, but also the polarity of the high-voltage constant-voltage source can be automatically switched to perform the bidirectional leakage current test;
4. the testing method can simultaneously realize the bidirectional leakage current measurement of the multipath bidirectional TVS tube, thereby not only greatly reducing the detection cost, but also ensuring the effectiveness of the TVS tube on the electronic detonator module and improving the reliability of the detonator.
Drawings
Other features, objects and advantages of the present invention will become more apparent upon reading of the detailed description of non-limiting embodiments, given with reference to the accompanying drawings in which:
FIG. 1 is a system block diagram of a leakage current testing system for a transient high voltage suppressor of the present invention;
FIG. 2 is a block diagram of an electronic detonator module;
FIG. 3 is a circuit diagram of a programmable high voltage power generation module;
FIG. 4 is a circuit diagram of a power polarity switching module;
FIG. 5 is a circuit diagram of a plurality of TVS test modules;
FIG. 6 is a circuit diagram of a single TVS test module;
Fig. 7 is a block diagram of the upper computer module.
Detailed Description
The present invention will be described in detail with reference to specific examples. The following examples will assist those skilled in the art in further understanding the present invention, but are not intended to limit the invention in any way. It should be noted that variations and modifications could be made by those skilled in the art without departing from the inventive concept. These are all within the scope of the present invention.
Example 1:
As shown in fig. 1 to 7, the present embodiment provides a leakage current testing system of a transient high voltage suppressor, which includes a host computer module, a programmable high voltage power generation module, a power polarity switching module, and a plurality of TVS testing modules. The first output end of the upper computer module is connected with the input end of the programmable high-voltage power supply generating module, the second output end of the upper computer module is connected with the first input end of the power polarity switching module, the output end of the programmable high-voltage power supply generating module is connected with the second input end of the power polarity switching module, the first output end of the power polarity switching module is connected with the first input ends of the TVS testing modules, the second output end of the power polarity switching module is connected with the second input ends of the TVS testing modules, the output ends of the TVS testing modules are connected with the input end of the upper computer module, the upper computer module is used for collecting leakage currents of the TVS tubes, the programmable high-voltage power supply generating module is used for generating voltage values in a preset range, the power polarity switching module is used for switching the polarities of the voltages at two ends of the TVS tubes, and the multi-path TVS testing modules are used for converting the leakage currents of the TVS tubes into voltages.
The upper computer module sends corresponding control signals to the programmable high-voltage power generation module and the power polarity switching module respectively, and the TVS leakage current is collected. The programmable high-voltage power generation module is responsible for generating a certain range of voltage values, determining a specific voltage value VDD according to a PWM control signal given by the upper computer module, and transmitting the VDD to the power polarity switching module. The power polarity switching module is used for switching the voltage polarities at two ends of the TVS to achieve the function of measuring the bidirectional leakage current of the TVS. The multi-path TVS test circuit converts leakage currents of a plurality of TVSs into voltages through sampling resistors, performs A/D conversion and sends the voltages to the upper computer module.
As shown in fig. 2, a block diagram of the electronic detonator module is provided. The bridge stack circuit converts a power supply switched on high and low on the leg wire into direct current to supply power to the detonator chip, and the electronic detonator chip is a main control chip of the module and is used for completing communication and ignition detonation with the detonator.
The programmable high-voltage power supply generating module comprises a capacitor C I, a capacitor C O, a capacitor C SS, a capacitor C C, resistor R1, resistor R2, resistor R3, resistor R4, resistor R5, resistor R SH, resistor R SL, resistor R C, inductor L, zener diode D, regulator, and a proportional amplifier. one end of the capacitor C I is respectively connected with one end of the inductor L, the VIN pin of the voltage stabilizer, The EN pin of the voltage stabilizer is used as an external VIN pin, the other end of the capacitor C I is grounded, the other end of the inductor L is respectively connected with the positive electrode of the voltage stabilizing diode D and three SW pins of the voltage stabilizer, the negative electrode of the voltage stabilizing diode D is respectively connected with one end of the resistor R SH and one end of the capacitor C O, the EN pin is used as an VOUT pin connected with the power polarity switching module, the other end of the capacitor C O is grounded, and the other end of the resistor R SH is respectively connected with the FB pin of the voltage stabilizer, One end of the resistor R SL and the other end of the resistor R SL are respectively connected with one end of the resistor R5, one end of the capacitor C SS and one end of the capacitor C C, AGND pin of voltage stabilizer and SYNC pin of voltage stabilizer, FREQ pin of voltage stabilizer is connected to the other end of resistance R5, SS pin of voltage stabilizer is connected to the other end of electric capacity C SS, one end of resistance R C is connected to the other end of electric capacity C C, COMP pin of voltage stabilizer is connected to the other end of resistance R C, one end of resistance R2 is connected respectively to the other end of resistance R1, The output end of the proportional amplifier, the first power end of the proportional amplifier is externally connected with a power supply, the second power end of the proportional amplifier is grounded, the non-inverting input end of the proportional amplifier is connected with one end of a resistor R4, the inverting input end of the proportional amplifier is respectively connected with the other end of a resistor R2 and one end of a resistor R3, the other end of the resistor R4 is connected with an upper computer module and is used for receiving DA control signals of the upper computer module, the other end of the resistor R1 is used for receiving DA signals, the other end of the resistor R3 is grounded, and three PGND pins of the voltage stabilizer are grounded. The stabilizer is a boost chip.
As shown in fig. 3, the main body of the programmable high-voltage power generation module is a BOOST circuit, the amplification factor is changed by changing the resistor R SH, the resistor R SL and the resistor R1, and different voltage generation ranges can be obtained by combining the DA control signal of the upper computer module, and the theoretical voltage can be calculated according to the following formula:
the effective range of the DA signal value is 0V-1.229V, and the effect is equivalent to 1.229V when the DA signal value is higher than 1.229V.
The range of voltages for different resistance values is calculated as follows:
The specific resistance is selected according to the TVS model.
The power polarity switching module comprises a double-pole double-throw relay K, a resistor R-S1, a resistor R-S2 and a three-stage tube, wherein the model of the double-pole double-throw relay K is TQ2-5V. One end of a capacitor C O is respectively connected with a second pin of the double-pole double-throw relay K and a seventh pin of the double-pole double-throw relay K, one end of a resistor R-S2 is respectively connected with one end of a resistor R-S1 and a base electrode of a third-stage tube, the other end of the resistor R-S2 is connected with a control port of an upper computer module, the other end of the resistor R-S1 is connected with an emitter electrode of the third-stage tube and grounded, and a collector electrode of the third-stage tube is respectively connected with a first pin and a tenth pin of the double-pole double-throw relay K. The power polarity switching module further comprises a diode M7, the collector electrode of the diode M7 is connected with the positive electrode of the diode M7 and the ten-number pin of the double-pole double-throw relay K respectively, and the negative electrode of the diode M7 is connected with the one-number pin of the double-pole double-throw relay K.
As shown in fig. 4, the power polarity switching module is mainly implemented by a double-pole double-throw relay, in which, under default conditions, the upper network VCC/GND of the TVS is connected to the high voltage VCC, and the lower network GND/VCC of the TVS is grounded, and when the upper computer gives the polarity switching signal CTRL, the relay works to implement polarity switching.
The TVS test module comprises a resistor R6, a resistor R7, a resistor R8, a resistor R9, a bidirectional transient suppression diode TVS1, a bidirectional transient suppression diode TVS2, a first voltage follower, a second voltage follower, a first ADC voltage acquisition channel, a second ADC voltage acquisition channel, a single-pole double-throw switch K1 and a single-pole double-throw switch K2. One end of a resistor R6 is respectively connected with one end of a resistor R7 and a third pin of a double-pole double-throw relay K, the other end of the resistor R6 is respectively connected with one end of a bidirectional transient suppression diode TVS2 and a first contact end of a single-pole double-throw switch K2, the other end of the resistor R7 is respectively connected with one end of a bidirectional transient suppression diode TVS1 and a first contact end of the single-pole double-throw switch K1, the other end of the bidirectional transient suppression diode TVS2 is respectively connected with one end of a resistor R8 and a second contact end of the single-pole double-throw switch K2, the other end of the resistor R8 is respectively connected with the other end of the resistor R9 and a eighth pin of the double-pole double-throw relay K2, the single-pole end of the single-pole double-throw switch K1 is connected with an in-phase input end of a first voltage follower, the single-pole end of the single-pole double-throw switch K2 is connected with an in-phase input end of a second voltage follower, the inverting input end of the first voltage follower is respectively connected with one end of the first voltage follower, the inverting input end of the first voltage follower is respectively connected with an output end of the first voltage follower, the first voltage follower is connected with the first voltage follower, the output end of the first voltage follower is connected with the first voltage follower, the output of the first voltage follower is respectively, and the output of the voltage follower is connected with the output of the voltage collector. The first power end of the first voltage follower is externally connected with a 3.3V direct current power supply, and the first power end of the second voltage follower is externally connected with a 3.3V direct current power supply.
As shown in fig. 5 and 6, the single TVS test module converts current into voltage mainly through a sampling resistor, and outputs the voltage to the ADC through a voltage follower, the sampling resistors corresponding to the different polarities of the power supply are different, when the upper end of the TVS is at high potential, the sampling resistors are R6 and R7, and when the lower end of the TVS is at high potential, the sampling resistors are R8 and R9, and the sampling resistors are realized through single-pole double-throw K1 and single-pole double-throw K2 switch.
The upper computer module is an STM32F103R8T6 controller, as shown in FIG. 7, the upper computer adopts an STM32F103R8T6 as a core module, and can directly use an STM32F103R8T6 internal ADC sampling module to perform data conversion, after the conversion is completed, simple feedback can be performed on abnormal TVS by lighting an LED lamp and the like, and measured values can be sent to a PC through a serial port for subsequent processing if required.
The embodiment also provides a test method of the leakage current test system based on the transient high-voltage suppression tube, which comprises the following steps:
Step 1, connecting a power supply, and supplying power to the upper computer module and the programmable high-voltage generation module through the power supply;
Step 2, generating a control voltage through a DA conversion function in the upper computer module, wherein the control voltage is used as a DA signal to be provided for the programmable high-voltage generation module, and is output to the other end of the resistor R1 after being stabilized by the proportional amplifier in the programmable high-voltage generation module, and the boost chip generates a corresponding high voltage for testing the TVS according to the size of the DA signal, when the TVS is not conducted, the theoretical value of the ADC is 0, and when the TVS is conducted, the leakage current phenomenon exists or the TVS is conducted, the current is converted according to the value of the ADC;
Step 3, the high voltage generated by the programmable high voltage generation module is transmitted to the power polarity switching module, and the power polarity switching module transmits the high voltage to the appointed end of the TVS test module according to the control signal given by the upper computer module;
step 4, converting the current passing through the TVS testing module into voltage by a sampling resistor, stably outputting the voltage by a voltage follower, opening an ADC (analog to digital converter) adopting function of the upper computer module, and observing and recording a voltage value;
and 5, changing a control signal of the upper computer module to the power polarity switching module, switching polarities of two ends of the TVS, and testing the leakage current of the other end of the TVS.
Example 2:
The present embodiment will be understood by those skilled in the art as a more specific description of embodiment 1.
The present embodiment provides a test method of a leakage current test system based on the transient high voltage suppressor in embodiment 1, including the steps of:
Step 1, connecting a power supply to supply power for an upper computer module and a programmable high-voltage generation module;
and 2, generating DA control signals with different magnitudes by applying a DA conversion function in STM32F103R8T 6. The DA signal is stabilized by a proportional amplifier in the programmable high-voltage generation module and then is output to one end of a resistor R1, and a boost chip generates a corresponding high voltage VCC for testing TVS according to the size of the DA signal;
and 3, VCC is transmitted to a double-pole double-throw relay of the power polarity switching module. The TVS upper network VCC/GND and the TVS lower network GND/VCC are respectively connected with VCC and GND through double-pole double-throw relays.
And 4, connecting the VCC/GND network and the GND/VCC in the TVS test module into circuits where the TVS is positioned after the VCC and the GND are respectively connected to generate current. The current passing through the TVS is converted into voltage by a sampling resistor, a single-pole double-throw switch is connected to a sampling point according to the polarity, and the sampling voltage is connected to a voltage follower through the single-pole double-throw switch to be stably output.
And 5, turning on an ADC (analog to digital converter) circulation automatic conversion function of STM32F103R8T6, quantitatively outputting the sampling point voltage to a PC, and observing and recording the voltage value. When the TVS is not conducted, the sampling voltage is lower than the minimum ADC precision, so that the theoretical ADC value is 0, and the leakage current phenomenon exists in the TVS or the current can be converted according to the ADC value when the TVS is conducted.
And 6, sending CTRL signals to a power polarity switching module, wherein the network VCC/GND at the upper end of the TVS and the network GND/VCC at the lower end of the TVS are respectively connected with the GND and the VCC through double-pole double-throw relays to repeat the sampling test steps, and measuring the leakage current at the other end of the TVS.
The invention not only can realize the parallel automatic test of the multipath TVS tubes, but also can automatically switch the polarities of the high-voltage constant-voltage sources to carry out the bidirectional leakage current test.
The foregoing describes specific embodiments of the present application. It is to be understood that the application is not limited to the particular embodiments described above, and that various changes or modifications may be made by those skilled in the art within the scope of the appended claims without affecting the spirit of the application. The embodiments of the application and the features of the embodiments may be combined with each other arbitrarily without conflict.
Claims (9)
1. The leakage current testing system of the transient high-voltage suppression tube is characterized by comprising an upper computer module, a programmable high-voltage power generation module, a power polarity switching module and a plurality of TVS testing modules;
The first output end of the upper computer module is connected with the input end of the programmable high-voltage power generation module, and the second output end of the upper computer module is connected with the first input end of the power polarity switching module;
The output end of the programmable high-voltage power generation module is connected with the second input end of the power polarity switching module;
The first output end of the power polarity switching module is connected with the first input ends of the TVS test modules, and the second output end of the power polarity switching module is connected with the second input ends of the TVS test modules;
the output ends of the TVS test modules are connected with the input end of the upper computer module;
The programmable high-voltage power supply system comprises a programmable high-voltage power supply generating module, a power supply polarity switching module, a multi-path TVS testing module, a power supply polarity switching module, a power supply voltage switching module and a power supply voltage switching module, wherein the upper computer module is used for collecting leakage current of a TVS (transient voltage suppressor) tube;
The programmable high-voltage power generation module comprises a capacitor C I, a capacitor C O, a capacitor C SS, a capacitor C C, a resistor R1, a resistor R2, a resistor R3, a resistor R4, a resistor R5, a resistor R SH, a resistor R SL, a resistor R C, an inductor L, a zener diode D, a voltage regulator and a proportional amplifier;
One end of the capacitor C I is respectively connected with one end of the inductor L, the VIN pin of the voltage stabilizer and the EN pin of the voltage stabilizer and is used as an external VIN pin;
the other end of the inductor L is respectively connected with the positive electrode of the voltage stabilizing diode D and three SW pins of the voltage stabilizer;
The negative electrode of the voltage stabilizing diode D is respectively connected with one end of the resistor R SH and one end of the capacitor C O and is used as a VOUT pin connected with the power polarity switching module, and the other end of the capacitor C O is grounded;
The other end of the resistor R SH is respectively connected with the FB pin of the voltage stabilizer, one end of the resistor R SL and one end of the resistor R1;
The other end of the resistor R SL is respectively connected with one end of the resistor R5, one end of the capacitor C SS, one end of the capacitor C C, an AGND pin of the voltage stabilizer and a SYNC pin of the voltage stabilizer;
The other end of the resistor R5 is connected with a FREQ pin of the voltage stabilizer, the other end of the capacitor C SS is connected with an SS pin of the voltage stabilizer, the other end of the capacitor C C is connected with one end of the resistor R C, and the other end of the resistor R C is connected with a COMP pin of the voltage stabilizer;
the other end of the resistor R1 is respectively connected with one end of the resistor R2 and the output end of the proportional amplifier;
the first power end of the proportional amplifier is externally connected with a power supply, the second power end of the proportional amplifier is grounded, the non-inverting input end of the proportional amplifier is connected with one end of the resistor R4, and the inverting input end of the proportional amplifier is respectively connected with the other end of the resistor R2 and one end of the resistor R3;
The other end of the resistor R4 is connected with the upper computer module and is used for receiving a DA control signal of the upper computer module;
The other end of the resistor R1 is used for receiving DA signals, and the other end of the resistor R3 is grounded;
and three PGND pins of the voltage stabilizer are all grounded.
2. The leakage current testing system of a transient high voltage suppressor of claim 1, wherein said voltage regulator is a boost chip.
3. The leakage current testing system of the transient high-voltage suppressor of claim 2, wherein said power polarity switching module comprises a double pole double throw relay K, a resistor R-S1, a resistor R-S2 and a triode, said double pole double throw relay K being of the type TQ2-5V;
One end of the capacitor C O is respectively connected with a second pin of the double-pole double-throw relay K and a seventh pin of the double-pole double-throw relay K;
One end of the resistor R-S2 is respectively connected with one end of the resistor R-S1 and the base electrode of the three-stage tube, and the other end of the resistor R-S2 is connected with the control port of the upper computer module;
the other end of the resistor R-S1 is connected with the emitter of the third transistor and grounded;
and the collector electrode of the third tube is respectively connected with a first pin and a tenth pin of the double-pole double-throw relay K.
4. A leakage current testing system for a transient high voltage suppressor of claim 3, wherein said power supply polarity switching module further comprises a diode M7;
the collector electrode of the third transistor is respectively connected with the positive electrode of the diode M7 and the tenth pin of the double-pole double-throw relay K;
and the cathode of the diode M7 is connected with the pin I of the double-pole double-throw relay K.
5. The leakage current testing system of the transient high voltage suppression tube of claim 4, wherein the TVS testing module comprises a resistor R6, a resistor R7, a resistor R8, a resistor R9, a bidirectional transient suppression diode TVS1, a bidirectional transient suppression diode TVS2, a first voltage follower, a second voltage follower, a first ADC voltage acquisition channel, a second ADC voltage acquisition channel, a single pole double throw switch K1, and a single pole double throw switch K2;
One end of the resistor R6 is respectively connected with one end of the resistor R7 and a third pin of the double-pole double-throw relay K, and the other end of the resistor R6 is respectively connected with one end of the bidirectional transient suppression diode TVS2 and a first contact end of the single-pole double-throw switch K2;
the other end of the resistor R7 is respectively connected with one end of the bidirectional transient suppression diode TVS1 and the first contact end of the single-pole double-throw switch K1;
the other end of the bidirectional transient suppression diode TVS2 is respectively connected with one end of the resistor R8 and the second contact end of the single-pole double-throw switch K2;
the other end of the bidirectional transient suppression diode TVS1 is respectively connected with one end of the resistor R9 and a second contact end of the single-pole double-throw switch K1;
The other end of the resistor R8 is respectively connected with the other end of the resistor R9 and the eighth pin of the double-pole double-throw relay K;
the single-pole end of the single-pole double-throw switch K1 is connected with the non-inverting input end of the first voltage follower, and the single-pole end of the single-pole double-throw switch K2 is connected with the non-inverting input end of the second voltage follower;
the first power end of the first voltage follower is externally connected with a power supply, and the second power end of the first voltage follower is grounded;
The inverting input end of the second voltage follower is respectively connected with the output end of the second voltage follower and the second ADC voltage acquisition channel, the first power end of the second voltage follower is externally connected with a power supply, and the second power end of the second voltage follower is grounded.
6. The leakage current testing system of the transient high voltage suppressor of claim 5, wherein said first power supply terminal of said first voltage follower is externally connected to a 3.3V dc power supply, and said first power supply terminal of said second voltage follower is externally connected to a 3.3V dc power supply.
7. The leakage current testing system of a transient high voltage suppressor of claim 1, wherein said host computer module is an STM32F103R8T6 controller.
8. A test method of a leakage current test system based on the transient high voltage suppressor of claim 5, comprising the steps of:
Step 1, connecting a power supply, and supplying power to the upper computer module and the programmable high-voltage generation module through the power supply;
Step 2, generating a control voltage through a DA conversion function in the upper computer module, wherein the control voltage is used as a DA signal to be provided for the programmable high-voltage generation module, and is output to the other end of the resistor R1 after being stabilized by the proportional amplifier in the programmable high-voltage generation module, and the boost chip generates a corresponding high voltage for testing TVS according to the size of the DA signal;
Step 3, the high voltage generated by the programmable high voltage generation module is transmitted to the power polarity switching module, and the power polarity switching module transmits the high voltage to the appointed end of the TVS test module according to the control signal given by the upper computer module;
step 4, converting the current passing through the TVS testing module into voltage by a sampling resistor, stably outputting the voltage by a voltage follower, opening an ADC (analog to digital converter) adopting function of the upper computer module, and observing and recording a voltage value;
and 5, changing a control signal of the upper computer module to the power polarity switching module, switching polarities of two ends of the TVS, and testing the leakage current of the other end of the TVS.
9. The method according to claim 8, wherein in the step 4, when the TVS is not turned on, the ADC theoretical value is 0, and when the TVS has a leakage current phenomenon or the TVS is turned on, the current is converted according to the ADC value.
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| CN111766493A (en) * | 2020-04-29 | 2020-10-13 | 珠海博杰电子股份有限公司 | TVS test system based on TCP/IP communication |
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| CN203630296U (en) * | 2013-05-13 | 2014-06-04 | 燕山大学 | PN junction reverse leakage current detection circuit |
| CN105334409B (en) * | 2015-09-23 | 2018-07-17 | 中国人民解放军理工大学 | A kind of integrated system suitable for a variety of lightning protection component Characteristics Detections |
| CN111239538B (en) * | 2020-04-13 | 2024-10-29 | 吴江市建设工程质量检测中心有限公司 | Intelligent analyzer and analysis method for aging degradation of surge protector |
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| CN103487736A (en) * | 2013-09-18 | 2014-01-01 | 大唐移动通信设备有限公司 | Method and device for detecting TVS pipe |
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