CN116501563B

CN116501563B - Storage device testing method, system, device, communication device and storage medium

Info

Publication number: CN116501563B
Application number: CN202310752978.2A
Authority: CN
Inventors: 张继元
Original assignee: Suzhou Inspur Intelligent Technology Co Ltd
Current assignee: Suzhou Inspur Intelligent Technology Co Ltd
Priority date: 2023-06-25
Filing date: 2023-06-25
Publication date: 2023-09-29
Anticipated expiration: 2043-06-25
Also published as: CN116501563A

Abstract

The embodiment of the application provides a storage device testing method, a system, a device, a communication device and a storage medium, comprising the following steps: responding to binding operation of a user, and carrying out binding processing on the storage device to be tested and the test server according to the first binding information of the storage device to be tested and the second binding information of the test server; performing supplementary processing on test information corresponding to the storage device to be tested according to the first binding relation; and under the condition that the IP address exists in the test information, the baseboard management controller of the storage device to be tested is subjected to test setting according to the IP address. According to the embodiment of the application, the test server and the storage equipment to be tested are synchronously bound when the storage equipment to be tested is put on the shelf, the information of the storage equipment to be tested is automatically supplemented, the IP address of the storage equipment to be tested is obtained, and the substrate management controller accessing the storage equipment to be tested can realize test setting and information acquisition through the IP address.

Description

Storage device testing method, system, device, communication device and storage medium

Technical Field

The present application relates to the field of data processing technologies, and in particular, to a method, a system, an apparatus, a communication device, and a storage medium for testing a storage device.

Background

With the rapid development of information in modern society and the rapid spread of the Internet, the requirement for storing data information is increasing. With this trend, various storage products have been developed. In order to meet various different service demands, the independent storage equipment used as the expansion storage of the server is more and more, the continuous binding array (Just a Bunch Of Disks, JBOD) of the disk is an independent storage equipment, and the JBOD is independent machine equipment and comprises a chassis, a baseboard management controller (Baseboard Management Controller, BMC), a fan, a power supply, a board card, a hard disk and the like, and after being connected with the server, the server can directly identify the JBOD hard disk and perform the service. Most JBOD products are developed to adapt to fixed model servers, support communication with the server BMC, and are co-produced and applied to business.

In order to meet different market and business demands, JBOD products which do not support communication with a server BMC appear, for the products, because the JBOD cannot be installed in the products, a test server is connected with the JBOD as a machine head to perform test binding together in factory test, however, in the prior art, because the machine head cannot access the BMC of the JBOD, all information of the machine head and the JBOD is required to wait for manually inputting information in an input mode, a large amount of manpower and time are consumed, and the testing efficiency of the JBOD is reduced.

Disclosure of Invention

The embodiment of the application aims to provide a storage device testing method, a system, a device, communication equipment and a storage medium, which are used for solving the technical problem that a machine head cannot access a BMC of JBOD in the prior art and information binding is needed to be carried out manually in the testing process. The specific technical scheme is as follows:

in a first aspect of the present application, there is provided a storage device testing method, applied to a test server, the method including:

responding to the binding operation of a user to a monitoring management interface in a test server, and carrying out binding processing on the storage device to be tested and the test server according to the first binding information of the storage device to be tested and the second binding information of the test server to generate a first binding relation;

performing supplementary processing on the test information corresponding to the storage device to be tested according to the first binding relation;

and under the condition that the IP address exists in the test information corresponding to the storage device to be tested, accessing the baseboard management controller of the storage device to be tested according to the IP address, and testing the storage device to be tested according to a preset test flow.

Optionally, after the step of testing the storage device under test according to a preset test procedure, the method includes:

integrating the hard disk serial number, slot information and equipment number information corresponding to the storage equipment to be tested to obtain an information comparison table of the storage equipment to be tested;

and under the condition that the storage device to be tested is detected to be in a fault state, slot information corresponding to the fault hard disk in the storage device to be tested is obtained according to the information comparison table and the hard disk serial number.

Optionally, the integrating the hard disk serial number, the slot information and the device number information corresponding to the to-be-tested storage device to obtain the information comparison table of the to-be-tested storage device includes:

acquiring asset information of the storage device to be tested according to a first preset command;

analyzing the asset information to obtain a hard disk serial number and slot information of a hard disk in the storage device to be tested;

inquiring a device number corresponding to a hard disk in the storage device to be tested according to a second preset command, and establishing a mapping relation between the device number and the first serial number;

and matching the mapping relation in the asset information to obtain an information comparison table of the storage device to be tested.

Optionally, the first binding information includes a first serial number and first location information, the second binding information includes a second serial number and second location information, the first location information is physical location information corresponding to the storage device to be tested, and the second location information is physical location information corresponding to the test server.

and responding to a viewing instruction of a user, and displaying the first binding relation, the first position information and the second position information of the test server and the storage device to be tested on a monitoring management interface.

Optionally, before the step of responding to the binding operation of the user to the monitoring management interface in the test server, binding the storage device to be tested and the test server according to the first binding information of the storage device to be tested and the second binding information of the test server, and generating the first binding relationship, the method includes:

acquiring a physical address and a first serial number corresponding to a storage device to be tested;

And correlating the physical address with the first serial number, and storing the correlation in a first preset database table.

Optionally, after the step of responding to the binding operation of the user to the monitoring management interface in the test server and performing binding processing on the storage device to be tested and the test server according to the first binding information of the storage device to be tested and the second binding information of the test server to generate the first binding relationship, the method includes:

judging whether a second serial number of the test server exists in a second preset database table or not;

if yes, transferring a second binding relation corresponding to a second serial number of the test server to a third preset database table;

if not, the first binding relation is stored in the second preset database table.

Optionally, the performing the supplementing processing on the test information corresponding to the to-be-tested storage device according to the first binding relationship includes:

acquiring a first serial number corresponding to the storage device to be tested from a second preset database table according to a second serial number of the test server;

acquiring a physical address corresponding to the storage device to be tested from a first preset database table according to the first serial number;

And acquiring the IP address of the storage device to be tested according to the physical address in a prestored dynamic host configuration protocol service lease file, and storing the IP address into the second preset database table.

Optionally, after the step of performing the complementary processing on the test information corresponding to the storage device to be tested according to the first binding relationship, the method includes:

judging whether to acquire the IP address of the storage device to be tested;

if not, a first fault prompt is sent to the user.

Optionally, the testing the storage device to be tested according to a preset test procedure includes:

according to a preset test flow, a test component is called to test the storage equipment to be tested item by item, wherein the test component is downloaded in advance from a total test environment server by the test server;

and testing the hard disk information and the board card information in the storage equipment to be tested through an SAS line, and accessing other accessories in the storage equipment to be tested to a baseboard management controller of the storage equipment to be tested through the test server in an out-of-band manner.

Optionally, the calling the test component to test the storage device to be tested item by item according to a preset test flow includes:

Reading the board information through a preset tool, wherein the board information comprises the number of the boards;

judging whether the number of the board cards is matched with the number of the storage devices to be tested;

if not, a second fault prompt is sent to the user.

and refreshing the storage device to be tested, wherein the refreshing device comprises at least one of the following components: field replaceable unit FRU refreshing, baseboard management controller BMC version refreshing and mechanical hard disk HDD version refreshing;

and checking other accessory information in the storage equipment to be tested and a baseboard management controller of the storage equipment to be tested according to pre-acquired order configuration, wherein the pre-acquired order configuration is to configure the storage equipment to be tested according to user requirements.

performing a pressure test on the storage device to be tested, wherein the pressure test comprises at least one of the following: system pressure test, drop voltage test and hard disk pressure test.

Optionally, after the step of calling a testing component to test the storage device to be tested item by item according to a preset testing flow, the method includes:

and storing test data corresponding to each test to a database module in real time, and displaying the test data on a monitoring management interface in real time, wherein the test data comprises configuration information and asset information of the storage equipment to be tested.

performing remote test on the storage equipment to be tested according to a preset test flow;

and displaying the first binding relation between the test server and the storage device to be tested in real time according to a second preset database table.

In still another aspect of the present application, there is further provided a storage device testing system, including a storage device to be tested, and a test server;

the test server is used for responding to the binding operation of a user on a monitoring management interface in the test server, and binding the storage device to be tested and the test server according to the first binding information of the storage device to be tested and the second binding information of the test server to generate a first binding relation; performing supplementary processing on the test information corresponding to the storage device to be tested according to the first binding relation; under the condition that the IP address exists in the test information corresponding to the storage device to be tested, accessing a baseboard management controller of the storage device to be tested according to the IP address, and testing the storage device to be tested according to a preset test flow;

The storage device to be tested is used for receiving the binding instruction sent by the test server, and a first binding relation between the storage device to be tested and the test server is established.

Optionally, the test server includes an information binding module, a database module, a test module, a hard disk analysis module and a monitoring management module.

Optionally, the information binding module is configured to respond to a binding operation of a user to a monitoring management interface in a test server, and bind the storage device to be tested and the test server according to first binding information of the storage device to be tested and second binding information of the test server to generate a first binding relationship;

the database module is used for storing a first preset database table, a second preset database table, a third preset database table and test data, wherein the first preset database table comprises the physical address of the storage device to be tested and the association relation between first serial numbers, the second preset database table comprises the first binding relation between the storage device to be tested and the test server, and the third preset database table comprises the second binding relation corresponding to the second serial numbers of the test server;

The test module is used for testing the storage device to be tested through a pre-downloaded test assembly, a first preset database table, a second preset database table and a preset test flow;

the hard disk analysis module is used for integrating the hard disk serial number, the slot information and the equipment number information corresponding to the storage equipment to be detected to obtain an information comparison table of the storage equipment to be detected; under the condition that the storage device to be tested is detected to be in a fault state, slot information corresponding to a fault hard disk in the storage device to be tested is obtained according to the information comparison table and the hard disk serial number;

the monitoring management module is used for displaying the first binding relation between the test server and the storage device to be tested and the test progress corresponding to the test module in real time according to a second preset database table.

In still another aspect of the present application, there is also provided a storage device testing apparatus applied to a server management platform, the apparatus including:

the binding module is used for responding to the binding operation of a user on a monitoring management interface in the test server, carrying out binding processing on the storage device to be tested and the test server according to the first binding information of the storage device to be tested and the second binding information of the test server, and generating a first binding relation;

The supplementing module is used for carrying out supplementing processing on the test information corresponding to the storage device to be tested according to the first binding relation;

the testing module is used for accessing the baseboard management controller of the storage device to be tested according to the IP address under the condition that the IP address exists in the testing information corresponding to the storage device to be tested, and testing the storage device to be tested according to a preset testing flow.

Optionally, the apparatus further comprises:

the integration module is used for integrating the hard disk serial number, the slot information and the equipment number information corresponding to the storage equipment to be detected to obtain an information comparison table of the storage equipment to be detected;

the first acquisition module is used for acquiring slot information corresponding to the fault hard disk in the storage device to be tested according to the information comparison table and the hard disk serial number under the condition that the storage device to be tested is detected to be in a fault state.

Optionally, the integration module includes:

the first integration submodule is used for acquiring asset information of the storage equipment to be tested according to a first preset command;

the second integration submodule is used for analyzing the asset information to obtain a hard disk serial number and slot information of a hard disk in the storage device to be tested;

The third integration sub-module is used for inquiring the equipment number corresponding to the hard disk in the storage equipment to be tested according to a second preset command, and establishing a mapping relation between the equipment number and the first serial number;

and the fourth integration sub-module is used for matching the mapping relation in the asset information to obtain an information comparison table of the storage device to be tested.

Optionally, the apparatus further comprises:

the second acquisition module is used for acquiring a physical address and a first serial number corresponding to the storage equipment to be detected;

and the association module is used for associating the physical address with the first serial number and storing the association relationship in a first preset database table.

Optionally, the apparatus further comprises:

the judging module is used for judging whether a second serial number of the test server exists in a second preset database table or not;

the transfer module is used for transferring a second binding relation corresponding to the second serial number of the test server to a third preset database table if the second binding relation is the same as the first binding relation;

and the storage module is used for storing the first binding relation to the second preset database table if not.

Optionally, the apparatus further comprises:

And the display module is used for responding to a viewing instruction of a user and displaying the first binding relation and the initial state of the test server and the storage device to be tested on the monitoring management interface.

Optionally, the supplementary module includes:

the first supplementing sub-module is used for acquiring a first serial number corresponding to the storage device to be tested according to the second serial number of the test server in a second preset database table;

the second supplementing sub-module is used for acquiring a physical address corresponding to the storage device to be tested according to the first serial number in a first preset database table;

and the third supplementing sub-module is used for acquiring the IP address of the storage device to be tested according to the physical address in a prestored dynamic host configuration protocol service lease file and storing the IP address into the second preset database table.

Optionally, the apparatus further comprises:

the second judging module is used for judging whether the IP address of the storage device to be tested is acquired or not;

and the sending prompt module is used for sending a first fault prompt to the user if the first fault prompt is not sent.

Optionally, the test module includes:

the first testing sub-module is used for calling a testing component to test the storage device to be tested item by item according to a preset testing flow, wherein the testing component is downloaded in advance from a total testing environment server by the testing server;

The second testing sub-module is used for testing the hard disk information and the board card information in the storage device to be tested through an SAS line, and other accessories in the storage device to be tested are accessed to the baseboard management controller of the storage device to be tested in an out-of-band mode through the testing server to test.

Optionally, the first test submodule includes:

the first test unit is used for reading the board card information through a preset tool, wherein the board card information comprises the number of the board cards;

the second test unit is used for judging whether the number of the board cards is matched with the number of the storage devices to be tested;

and the third test unit is used for sending a second fault prompt to the user if not.

Optionally, the first test submodule includes:

a fourth test unit, configured to perform refresh setting on the to-be-tested storage device, where the refresh device includes at least one of the following: field replaceable unit FRU refreshing, baseboard management controller BMC version refreshing and mechanical hard disk HDD version refreshing;

and the fifth test unit is used for checking other accessory information in the storage equipment to be tested and the baseboard management controller of the storage equipment to be tested according to pre-acquired order configuration, wherein the pre-acquired order configuration is to configure the storage equipment to be tested according to user requirements.

Optionally, the first test submodule includes:

a sixth testing unit, configured to perform a pressure test on the storage device to be tested, where the pressure test includes at least one of the following: system pressure test, drop voltage test and hard disk pressure test.

Optionally, the first test submodule includes:

and the seventh test unit is used for storing test data corresponding to each test to the database module in real time and displaying the test data on the monitoring management interface in real time, wherein the test data comprises configuration information and asset information of the storage device to be tested.

Optionally, the apparatus further comprises:

the remote operation module is used for remotely testing the storage device to be tested according to a preset test flow;

and the real-time display module is used for displaying the first binding relation between the test server and the storage device to be tested in real time according to a second preset database table.

In yet another aspect of the present application, there is also provided an electronic device including a processor, a communication interface, a memory, and a communication bus, wherein the processor, the communication interface, and the memory perform communication with each other through the communication bus;

A memory for storing a computer program;

and the processor is used for realizing any one of the storage device testing methods when executing the programs stored in the memory.

In yet another aspect of the present application, there is also provided a computer readable storage medium having instructions stored therein which, when executed on a computer, cause the computer to perform any of the storage device testing methods described above.

In yet another aspect of the application, there is also provided a computer program product containing instructions that, when run on a computer, cause the computer to perform any of the storage device testing methods described above.

According to the storage device testing method provided by the embodiment of the application, the binding operation of the user to the monitoring management interface in the test server is responded, and the first binding relation is generated by carrying out binding processing on the storage device to be tested and the test server according to the first binding information of the storage device to be tested and the second binding information of the test server; performing supplementary processing on the test information corresponding to the storage device to be tested according to the first binding relation; and under the condition that the IP address exists in the test information corresponding to the storage device to be tested, accessing the baseboard management controller of the storage device to be tested according to the IP address, and testing the storage device to be tested according to a preset test flow. According to the embodiment of the application, by combining an on-frame binding function and utilizing a front end and database interaction function, a test server and a storage device to be tested are bound when the on-frame storage device is on-frame, under the condition of an acquired binding relation, the information of the storage device to be tested can be automatically supplemented by utilizing the working principle of a dynamic host configuration protocol service, wherein the information of the supplemented storage device to be tested comprises the IP address of the storage device to be tested, when the storage device to be tested is JBOD, as an operating system is not arranged in JBOD, and BMC in JBOD cannot directly communicate with the test server, the access to a baseboard management controller of the storage device to be tested can be realized by acquiring the IP address in JBOD, so that test setting and information acquisition of the JBOD to be tested are carried out on the storage device to be tested, compared with the method of acquiring IP through serial port line access in the related technology, the serial port login command is not limited by the number of the serial port, the IP is output under the system of the BMC, and the IP address cannot be acquired when the BMC or the BMC is abnormal, and subsequent test is influenced. Therefore, the application solves the problem that the test server cannot access the baseboard management controller of the storage device to be tested to cause manual information binding in the test process, realizes automatic processing after the test is started, greatly saves labor, improves the test efficiency and factory production capacity of the storage device to be tested, and facilitates accurate report of the fault hard disk slot position of the fault storage device (such as fault JBOD) when the fault of the storage device to be tested is detected through the binding relation between the test server and the storage device to be tested and the IP address in the follow-up test.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below.

FIG. 1 is a flowchart illustrating steps of a method for testing a storage device according to an embodiment of the present application;

FIG. 2 is a flowchart illustrating steps of another method for testing a storage device according to an embodiment of the present application;

FIG. 3 is a flowchart illustrating steps of another method for testing a storage device according to an embodiment of the present application;

FIG. 4 is a flowchart illustrating steps of another method for testing a storage device according to an embodiment of the present application;

FIG. 5 is a flowchart illustrating steps of another method for testing a storage device according to an embodiment of the present application;

FIG. 6 is a schematic diagram of a storage device testing system according to an embodiment of the present application;

FIG. 7 is a block diagram of a storage device testing apparatus according to an embodiment of the present application;

fig. 8 is a schematic diagram showing test information in a monitoring management interface according to an embodiment of the present application;

fig. 9 is a block diagram of a communication device according to an embodiment of the present application;

FIG. 10 is a schematic diagram illustrating a top-loading in a monitoring management interface according to an embodiment of the present application;

Fig. 11 shows a hardware structure schematic of a storage device testing system according to an embodiment of the present application.

Detailed Description

The technical solutions in the embodiments of the present application will be described below with reference to the accompanying drawings in the embodiments of the present application.

For the purpose of making the objects, technical solutions and advantages of the embodiments of the present application more apparent, the following detailed description of the embodiments of the present application will be given with reference to the accompanying drawings. However, those of ordinary skill in the art will understand that in various embodiments of the present application, numerous technical details have been set forth in order to provide a better understanding of the present application. However, the claimed application may be practiced without these specific details and with various changes and modifications based on the following embodiments. The following embodiments are divided for convenience of description, and should not be construed as limiting the specific implementation of the present application, and the embodiments can be mutually combined and referred to without contradiction.

It should be noted that, in the embodiment of the present application, the method is applied to a test server, where the test server is used as a machine head and carries a storage device to be tested for testing, where the storage device to be tested may be a JBOD, which is a storage device with a plurality of disk drives installed on a bottom board, and is an important storage device in the storage field.

The test server comprises an information binding module, a database module, a test module, a hard disk analysis module and a monitoring management module, wherein the information binding module is used for binding the machine head and JBOD test combination information, the test module is used for executing the relevant test of JBOD, the hard disk analysis module is used for accurately positioning the hard disk in question, the test monitoring module is used for actually displaying the binding relation and test progress of the machine head and JBOD, and the database module is used for storing and extracting data.

Referring to fig. 1, a flowchart illustrating steps of a method for testing a storage device according to an embodiment of the present application may include:

step 101, responding to the binding operation of a user to a monitoring management interface in a test server, and carrying out binding processing on the storage device to be tested and the test server according to the first binding information of the storage device to be tested and the second binding information of the test server to generate a first binding relation.

Therefore, in the embodiment of the application, firstly, information binding is performed, and a user can perform binding operation through a monitoring management interface in a monitoring management module in a test server when the storage device to be tested and the test server group are put on shelf, wherein the operation of binding the position information is performed after the server or other test devices are assembled.

Specifically, when the storage device to be tested and the test server are assembled, the storage device to be tested and the test server are required to be put on shelf according to the binding operation.

As shown in FIG. 10, FIG. 10 shows a schematic diagram of a monitoring management interface provided by an embodiment of the present application, a test server may scan a machine head, a carried JBOD chassis tag and its position tag, respectively, and the present application supports binding and putting on a shelf of one machine head and a plurality of JBODs. When the number of JBODs actually loaded is greater than the number of pages that can be scanned, the number of JBODs in the interface that can be scanned can be increased by the ADD button.

Therefore, according to the binding operation of the user to the monitoring management interface in the test server, the first binding information of the storage device to be tested and the second binding information of the test server are bound, namely the first binding relationship, specifically, the first binding information comprises a first serial number and first position information, the second binding information comprises a second serial number and second position information, the first position information is used for determining physical position information corresponding to the storage device to be tested, the second position information is used for determining physical position information corresponding to the test server, wherein the two position information is the specific placement position of the storage device to be tested and the test server in the rack, and the serial number is the unique identifier for distinguishing the test server and the storage device.

Specifically, the first location information and the second location information may be input by a user, as shown in fig. 10, where the user may input the location information of the current device, for example, the test server, on an input box corresponding to the physical location, so that the test server may obtain the location information of the test server.

Through the first position information and the second position information, when a user views the test server and the storage device to be tested through the monitoring management interface, the accurate physical positions of the storage device to be tested and the test server on the rack in the machine room or the test site can be viewed, as shown in fig. 8, the position information of the storage device to be tested and the test server can be obviously displayed in fig. 8.

In the subsequent test process, the monitoring management module displays the binding relation and the test progress of the machine head and the JBOD in real time according to a second preset database Table (Table 2 Table) on the monitoring management interface, supports the remote management operation of the test process through the JBOD, and automatically acquires the machine head information through the binding relation and transmits an operation instruction to the machine head when the remote test management operation (such as retesting and cancellation) is performed through the JBOD, so that the test management control is realized, and the time consumption caused by manually inquiring the machine head bound by the JBOD and then operating the machine head is avoided.

Further, after the step of performing binding processing on the storage device to be tested and the test server according to the first binding information of the storage device to be tested and the second binding information of the test server in response to the binding operation of the user to the monitoring management interface in the test server, and generating the first binding relationship, the method includes: judging whether a second serial number of the test server exists in a second preset database table or not; if yes, transferring a second binding relation corresponding to a second serial number of the test server to a third preset database table; if not, the first binding relation is stored in the second preset database table.

It should be noted that, in the embodiment of the present application, when all the machine head and the carried JBOD machine case label (serial number) and its position label are scanned, click the on-shelf button, store the data into the database module through the front end and database interaction technology, store the first binding relationship between the machine head and the JBOD serial number into the second preset database Table of the database module while recording the machine head and the JBOD position information, which may be represented as a Table2 Table, and if the machine head already has a binding relationship (for example, the second binding relationship established with other storage devices) in the Table2 Table, move the previous binding relationship to the third preset database Table, which may be represented as a Table2_his Table, and then insert the newly entered first binding relationship.

Further, after the step of storing the first binding relationship to the second preset database table, the method includes: and responding to a viewing instruction of a user, and displaying the first binding relation, the first position information and the second position information of the test server and the storage device to be tested on a monitoring management interface.

After binding, the user can continue to check the first binding relationship between the test server and the storage device to be tested and the first location information and the second location information through the front-end page, and can check an initial state, wherein the initial state can comprise some conventional parameters, such as whether the storage device to be tested is powered on or not.

And 102, carrying out supplementary processing on test information corresponding to the storage device to be tested according to the first binding relation.

It should be noted that, in the embodiment of the present application, the JBOD and the machine head are powered on in sequence, the DHCP service allocates IP, where a dynamic host configuration protocol (Dynamic Host Configuration Protocol, DHCP) protocol allows the server to dynamically allocate IP addresses and configuration information to the client, and the machine head downloads a system image, such as a linux64 system, through the total server, and then automatically downloads a test module assembly for testing.

However, before testing, the test information corresponding to the storage device to be tested needs to be completed, specifically, after starting the test, the information of the binding JBOD is firstly completed, the first serial number of the binding JBOD is obtained according to the second serial number of the machine head in the Table2 Table, the MAC address (physical address) of the JBOD is obtained according to the first preset database Table which can be expressed as the Table1, when the DHCP allocates the IP, lease information of the IP is stored in a master server (the factory master server can be used for downloading the operating system and the test component), the file is copied to an OS system of the machine head, the latest IP about information of the MAC address is obtained according to the MAC address of the machine head in the file, and the IP address is stored in the first serial number record of the corresponding JBOD 2 Table.

Further, after step 102, that is, after the step of performing the complementary processing on the test information corresponding to the to-be-tested storage device according to the first binding relationship, the method includes: judging whether to acquire the IP address of the storage device to be tested; if not, a first fault prompt is sent to the user.

If the IP address is not acquired, it is indicated that the JBOD has a failure, and at this time, an error report is required to be given to the user.

And step 103, accessing the baseboard management controller of the storage device to be tested according to the IP address under the condition that the IP address exists in the test information corresponding to the storage device to be tested, and testing the storage device to be tested according to a preset test flow.

In the embodiment of the application, by utilizing the working principle of the DHCP service, the test server can automatically acquire the IP address of the JBOD, and can realize the access to the JBOD BMC through the IP address, thereby carrying out test setting and information acquisition through the BMC.

When the access test is needed, the BMC is arranged in the test server and the storage device to be tested, the BMC can be electrified independently, the BMC does not need to be started together with the system, and an operating system is not carried in the storage device to be tested, so that the test server is required to carry out the access test through the BMC, and the access test can be managed through the out-of-band.

After the JBOD information bound by the machine head is complemented, the testing component is called to perform item-by-item testing according to a preset testing flow chart, wherein the hard disk and the Expander information of the JBOD can be identified and tested on the machine head through an SAS line, and other accessories need to be tested in a mode of accessing the JBOD BMC in an out-of-band mode.

As shown in fig. 8, fig. 8 shows a schematic diagram of test information presentation in a monitoring management interface according to an embodiment of the present application. It can be seen that the test server accesses the JBOD through the BMC, specifically, the test server performs test setting and information acquisition on the JBOD through the BMC of the JBOD, wherein the types include the test server and at least one JBOD, and the order number is a batch set according to the user requirement or the test requirement when leaving the factory.

Further, after step 103, after the step of testing the storage device under test according to the preset test flow, the method includes: performing remote test on the storage equipment to be tested according to a preset test flow; and displaying the first binding relation between the test server and the storage device to be tested in real time according to a second preset database table.

It should be noted that, in the testing process of the embodiment of the present application, the test monitoring management module displays the binding relationship between the machine head and the JBOD and the test progress in real time according to the Table2 Table, and supports the remote management operation of the testing process by the JBOD. When the JBOD is used for remote test management operation (such as retest, cancellation and the like), the machine head information is automatically acquired through the binding relationship and the operation instruction is transmitted to the machine head, so that test management control is realized, and the time consumption caused by manually inquiring the machine head bound by the JBOD and then operating the machine head is avoided.

According to the storage device testing method provided by the embodiment of the application, the binding operation of the user to the monitoring management interface in the test server is responded, and the first binding relation is generated by carrying out binding processing on the storage device to be tested and the test server according to the first binding information of the storage device to be tested and the second binding information of the test server; performing supplementary processing on the test information corresponding to the storage device to be tested according to the first binding relation; and under the condition that the IP address exists in the test information corresponding to the storage device to be tested, accessing the baseboard management controller of the storage device to be tested according to the IP address, and testing the storage device to be tested according to a preset test flow. According to the embodiment of the application, the front end and the database interaction function are utilized by combining the on-shelf binding function, and the test server and the storage device to be tested are bound when on-shelf. By utilizing the working principle of the DHCP service, the information of the storage device to be tested can be automatically supplemented, the IP address of the storage device to be tested is obtained, and the substrate management controller accessing the storage device to be tested can be used for test setting and information obtaining through the IP address. Therefore, the problem that the test server cannot access the baseboard management controller of the storage device to be tested, and information binding is performed manually in the test process is solved. The automatic processing after the test is started is realized, the labor is greatly saved, and the test efficiency and the factory production capacity of the storage device to be tested are improved.

Referring to fig. 2, a flowchart illustrating steps of another storage device testing method according to an embodiment of the present application is shown, where the method may include:

step 201, a physical address and a first serial number corresponding to a storage device to be tested are obtained.

Step 202, associating the physical address with the first serial number, and storing the association relationship in a first preset database table.

It should be noted that, in the foregoing steps 201 to 202, when the JBOD is assembled, the MAC address information (physical address) of the BMC management board and the first serial number of the chassis may be scanned by the code scanning gun, that is, the test server is connected with the code scanning gun, so as to obtain the physical address and the first serial number corresponding to the storage device to be tested, establish an association relationship, and store the association relationship in a first preset database table (table 1 table) of the database module.

Step 203, in response to a binding operation of the user to the monitoring management interface in the test server, binding the storage device to be tested and the test server according to the first binding information of the storage device to be tested and the second binding information of the test server, and generating a first binding relationship.

And 204, carrying out supplementary processing on the test information corresponding to the storage device to be tested according to the first binding relation.

Step 205, accessing the baseboard management controller of the storage device to be tested according to the IP address and testing the storage device to be tested according to a preset test flow under the condition that the IP address exists in the test information corresponding to the storage device to be tested.

It should be noted that, the steps 203-205 are discussed with reference to the foregoing, and are not repeated herein.

According to the embodiment of the application, the front end and the database interaction function are utilized by combining the on-shelf binding function, and the test server and the storage device to be tested are bound when on-shelf. By utilizing the working principle of the DHCP service, the information of the storage device to be tested can be automatically supplemented, the IP address of the storage device to be tested is obtained, and the substrate management controller accessing the storage device to be tested can be used for test setting and information obtaining through the IP address. Therefore, the problem that the test server cannot access the baseboard management controller of the storage device to be tested, and information binding is performed manually in the test process is solved. The automatic processing after the test is started is realized, the labor is greatly saved, and the test efficiency and the factory production capacity of the storage device to be tested are improved.

Referring to fig. 3, a flowchart illustrating steps of another storage device testing method according to an embodiment of the present application is shown, where the method may include:

Step 301, responding to a binding operation of a user to a monitoring management interface in a test server, and carrying out binding processing on the test server according to first binding information of a storage device to be tested and second binding information of the test server to generate a first binding relation.

It should be noted that, the above step 301 is discussed with reference to the foregoing, and is not repeated herein.

Step 302, obtaining a first serial number corresponding to the storage device to be tested according to the second serial number of the test server in a second preset database table.

Step 303, obtaining the physical address corresponding to the storage device to be tested according to the first serial number in the first preset database table.

Step 304, the IP address of the storage device to be tested is obtained according to the physical address in the pre-stored dynamic host configuration protocol service lease file, and the IP address is stored in the second preset database table.

It should be noted that in the above steps 302-304, the JBOD and the machine head are powered on in sequence, the DHCP service allocates IP, where the dynamic host configuration protocol, that is, the DHCP protocol, allows the server to dynamically allocate IP addresses and configuration information to the client, and the machine head downloads a system image, for example, a linux64 system, through the total server, and then automatically downloads the test module assembly for testing.

However, before testing, the test information corresponding to the storage device to be tested needs to be completed, specifically, after starting the test, the information of the binding JBOD is completed, the first serial number of the binding JBOD is obtained according to the second serial number of the machine head in the Table2 Table, the MAC address of the JBOD is obtained according to the first preset database Table which can be expressed as the Table1 Table, when the DHCP allocates the IP, the lease information of the IP can be stored in a DHCP service lease file of a total server (the factory total server can be used for downloading an operating system and a test component), for example,/var/lib/dhcpd/dhcpd.leases, the file is copied to the operating system of the machine head, the corresponding IP address is obtained according to the latest IP lease information of the MAC address matched with the MAC address in the file, and the IP address is stored in a record corresponding to the first serial number of the JBOD in the Table 2.

Step 305, accessing a baseboard management controller of the storage device to be tested according to the IP address when detecting that the IP address exists in the test information corresponding to the storage device to be tested, and testing the storage device to be tested according to a preset test flow.

It should be noted that, the step 305 is discussed with reference to the foregoing, and is not repeated here.

Referring to fig. 4, a flowchart illustrating steps of another storage device testing method according to an embodiment of the present application is shown, where the method may include:

step 401, responding to a binding operation of a user to a monitoring management interface in a test server, and carrying out binding processing on the storage device to be tested and the test server according to first binding information of the storage device to be tested and second binding information of the test server to generate a first binding relationship.

And step 402, performing complementary processing on the test information corresponding to the storage device to be tested according to the first binding relation.

It should be noted that, the steps 401-402 are discussed with reference to the foregoing, and are not repeated herein.

Step 403, accessing a baseboard management controller of the storage device to be tested according to the IP address under the condition that the IP address exists in the test information corresponding to the storage device to be tested, and calling a test component to test the storage device to be tested item by item according to a preset test flow, wherein the test component is downloaded in advance from a total test environment server by the test server; and the hard disk information and the board card information in the storage equipment to be tested are tested through serial connection with a small computer interface line, and other accessories in the storage equipment to be tested are tested through the substrate management controller of the storage equipment to be tested accessed out of band of the test server.

In the embodiment of the present application, the test server may automatically obtain the IP address of the JBOD by using the working principle of the DHCP service, and may access the JBOD BMC through the IP address, so as to perform test setting and information obtaining through the BMC.

After the JBOD information bound by the machine head is complemented, the testing component is called to test item by item according to a preset testing flow chart, wherein the hard disk and the Expander information of the JBOD can be identified and tested at the machine head through a serial connection small computer interface line (SAS line), and other accessories need to be tested in a mode of accessing the JBOD BMC in an out-of-band mode.

It should be noted that, the JBOD includes a chassis, a BMC management board, a fan, a power supply, a board card and a hard disk, where the board card is an Expander card, and the board card can connect more hard disks based on the original array card and does not occupy a limited pcie channel, so that the information of the hard disk and the board card can be identified and tested in a test server through SAS lines, where SAS (Serial Attached SCSI, serial connection SCSI) uses a serial technology to obtain a higher transmission speed, and improves an internal space by shortening a connection line.

Therefore, for the hard disk and the board card to be tested by directly connecting with a test server through an SAS line, other devices need to be tested in a mode of BMC with out-of-band access JBOD.

In one embodiment, it may be tested that, according to a preset test procedure, invoking a test component to test the storage device to be tested item by item includes: reading the board information through a preset tool, wherein the board information comprises the number of the boards; judging whether the number of the board cards is matched with the number of the storage devices to be tested; if not, a second fault prompt is sent to the user.

It should be noted that, the machine head can read the information of the JBOD Expander card through the scrtnycli tool, and match the number of JBODs bound by the machine head, if one JBOD has two Expander cards, the following formula 1 should be satisfied:

JBODNum =expanernum (formula 1)

Wherein JBOD num represents the number of JBODs, expandarNum represents the number of Expandar cards, if the information of the Expandar cards is not matched with the number of JBODs bound with the machine head (i.e. does not meet formula 1), the situation that the SAS cable is not connected well or the JBODs have faults is indicated, and a second fault prompt is sent to the user for error reporting.

In another embodiment, the refresh setting is performed on the memory device under test, where the refresh device includes at least one of: FRU refresh, BMC version refresh, and HDD version refresh; and checking other accessory information in the storage equipment to be tested and a baseboard management controller of the storage equipment to be tested according to pre-acquired order configuration, wherein the pre-acquired order configuration is to configure the storage equipment to be tested according to user requirements.

It should be noted that, a series of refresh settings and information checks are performed on the JBOD, such as FRU refresh, BMC and HDD version refresh, and each piece of accessory information and sel, sensor of the BMC have no alarms and the like are checked item by item according to the order configuration.

In another embodiment, the storage device under test is pressure tested, wherein the pressure test includes at least one of: DC stress test, AC stress test, and hard disk stress test.

The DC pressure test is a system pressure test, namely a pressure test under the system, the AC pressure test is a voltage drop pressure test, specifically, when the AC pressure test is carried out, the power distribution unit (Power Distribution Unit, PDU) at the upper frame position is used for controlling the machine head to immediately power down, the JBOD waits for 1 minute and then power down, and when the power up is carried out, the JBOD is firstly powered up, and when the power up is carried out, the machine head is powered up again after 1 minute.

Further, after step 404, test data corresponding to each test is stored in real time to a database module, and the test data is displayed in real time on a monitoring management interface, where the test data includes configuration information and asset information of the storage device to be tested.

It should be noted that, in the embodiment of the present application, the test information and the status are stored in the database module in real time during each test item, and the test monitoring management module collects and displays the test progress in real time.

Referring to fig. 5, a flowchart illustrating steps of another method for testing a storage device according to an embodiment of the present application may include:

step 501, responding to a binding operation of a user to a monitoring management interface in a test server, and carrying out binding processing on the storage device to be tested and the test server according to first binding information of the storage device to be tested and second binding information of the test server to generate a first binding relation.

And step 502, performing supplementary processing on the test information corresponding to the storage device to be tested according to the first binding relation.

Step 503, when it is detected that an IP address exists in the test information corresponding to the to-be-tested storage device, accessing the baseboard management controller of the to-be-tested storage device according to the IP address, and testing the to-be-tested storage device according to a preset test flow.

It should be noted that, the above steps 501-503 are discussed with reference to the foregoing, and are not repeated herein.

And 504, integrating the hard disk serial number, the slot information and the equipment number information corresponding to the storage equipment to be tested to obtain an information comparison table of the storage equipment to be tested.

It should be noted that, in the JBOD test process, the hard disk will often fail, however, in the related art, under the test server system, the hard disk problem is detected, only the information of the hard disk itself can be identified, the accurate error reporting cannot be performed, only the equipment number can be reported, the information of the hard disk slot corresponding to the JBOD cannot be accurately reported, the problem analysis is inconvenient, and the time consumed for checking is required to be specific physical location, and the maintenance cost is high.

Therefore, in the embodiment of the application, the hard disk analysis module in the test server is used for analyzing the hard disk faults when the hard disk breaks down, so that the accurate report is realized.

Specifically, the hard disk analysis module integrates the information such as JBOD, hard disk serial number, SLOT information, equipment number and the like bound by the machine head, provides an external interface, and outputs the hard disk SLOT information and the first serial number of the JBOD according to the input hard disk serial number or equipment number.

Further, in step 504, the integrating the hard disk serial number, the slot information and the device number information corresponding to the to-be-tested storage device to obtain the information comparison table of the to-be-tested storage device includes: acquiring asset information of the storage device to be tested according to a first preset command; analyzing the asset information to obtain a hard disk serial number and slot information of a hard disk in the storage device to be tested; inquiring a device number corresponding to a hard disk in the storage device to be tested according to a second preset command, and establishing a mapping relation between the device number and the first serial number; and matching the mapping relation in the asset information to obtain an information comparison table of the storage device to be tested.

It should be noted that, the storage device to be tested in the present application, i.e. the JBOD, includes a plurality of hard disks, so that the hard disks correspond to the serial numbers of the hard disks, so that a specific hard disk failure is determined when the JBOD failure is determined.

It should be noted that, according to the JBOD bound by the machine head, according to the first preset command, for example, using "curl-vv-k-tlsv 1 https:// $bmcip/api/asset_info-o JBOD_asset_info.txt" to obtain the asset information of the JBOD, and extracting the asset information of the hard disk through json analysis to obtain the serial number and slot information of the hard disk.

Inquiring the device numbers $devid of all the hard disks through a second preset command, for example, lsblk|grep-i disk, and obtaining the mapping relation between the serial numbers of the hard disks and the device numbers through a third preset command, for example, smartctl-i/dev/$devid, and matching the mapping relation with the obtained asset information of the hard disks to obtain complete hard disk information.

The first preset command, the second preset command and the third preset command are BMC commands.

And 505, under the condition that the storage device to be tested is detected to be in a fault state, obtaining slot information corresponding to the fault hard disk in the storage device to be tested according to the information comparison table and the hard disk serial number.

It should be noted that the hard disk analysis module provides two interfaces to the outside, the first interface is used for obtaining the hard disk slot information according to the serial number or the equipment number of the hard disk; the second interface is used for acquiring undetected hard disk slot position information. When a hard disk problem occurs, the test module calls the hard disk analysis module to supplement error reporting information of the hard disk or less-detection hard disk, and the error reporting information is accurate to the slot position, so that the labor time cost of problem analysis and maintenance is reduced.

Referring to fig. 6, a system schematic diagram of a storage device testing system provided by an embodiment of the present application is shown, where the storage device testing system includes a storage device to be tested, and a test server;

It should be noted that, as shown in fig. 11, fig. 11 shows a hardware structure schematic of a storage device testing system according to an embodiment of the present application, where the storage device testing system may include multiple JBODs and a testing server.

In addition, for JBOD, there is no operating system in JBOD, there is a corresponding serial number on JBOD's chassis, but BMC on JBOD cannot directly communicate with test server (head) and can only access out-of-band through BMC.

Further, the test server comprises an information binding module, a database module, a test module, a hard disk analysis module and a monitoring management module.

The information binding module is used for responding to the binding operation of a user on a monitoring management interface in a test server, and binding the storage device to be tested and the test server according to the first binding information of the storage device to be tested and the second binding information of the test server to generate a first binding relation;

In addition, the monitoring management module can be remotely connected with a monitoring management interface.

According to the storage device testing system provided by the embodiment of the application, the front end and the database interaction function are utilized by combining the on-frame binding function, and the testing server and the storage device to be tested are bound during on-frame. By utilizing the working principle of the DHCP service, the information of the storage device to be tested can be automatically supplemented, the IP address of the storage device to be tested is obtained, and the substrate management controller accessing the storage device to be tested can be used for test setting and information obtaining through the IP address. Therefore, the problem that the test server cannot access the baseboard management controller of the storage device to be tested, and information binding is performed manually in the test process is solved. The automatic processing after the test is started is realized, the labor is greatly saved, and the test efficiency and the factory production capacity of the storage device to be tested are improved.

In addition, by adding a hard disk analysis module, the JBOD problem hard disk slot position is accurately reported. The efficiency of the maintenance personnel to the problem analysis and maintenance operation of the fault JBOD is improved, and the testing efficiency of the JBOD and the production capacity of the factory are further improved.

In addition, the test progress and binding relation of the JBOD and the machine head are displayed in real time through the test monitoring management module, and the management operation of the test process through the JBOD is supported. The monitoring management capability and the testing efficiency of the testing operator on the testing progress are improved.

Referring to fig. 7, fig. 7 illustrates a storage device testing apparatus provided by an embodiment of the present application, where the apparatus may include:

a binding module 701, configured to respond to a binding operation of a user to a monitoring management interface in a test server, and perform binding processing on the storage device to be tested and the test server according to first binding information of the storage device to be tested and second binding information of the test server, so as to generate a first binding relationship;

the supplementing module 702 is configured to supplement the test information corresponding to the to-be-tested storage device according to the first binding relationship;

and the test module 703 is configured to access the baseboard management controller of the storage device to be tested according to the IP address and test the storage device to be tested according to a preset test flow when it is detected that the IP address exists in the test information corresponding to the storage device to be tested.

Optionally, the apparatus further comprises:

Optionally, the integration module includes:

Optionally, the apparatus further comprises:

Optionally, the supplementary module includes:

Optionally, the apparatus further comprises:

Optionally, the test module includes:

Optionally, the first test submodule includes:

Optionally, the apparatus further comprises:

the real-time display module is used for displaying the first binding relation between the test server and the storage device to be tested in real time according to a second preset database table;

and the remote operation module is used for performing remote test operation on the storage equipment to be tested.

According to the storage device testing device provided by the embodiment of the application, the front end and the database interaction function are utilized by combining the on-frame binding function, and the test server and the storage device to be tested are bound during on-frame. By utilizing the working principle of the DHCP service, the information of the storage device to be tested can be automatically supplemented, the IP address of the storage device to be tested is obtained, and the substrate management controller accessing the storage device to be tested can be used for test setting and information obtaining through the IP address. Therefore, the problem that the test server cannot access the baseboard management controller of the storage device to be tested, and information binding is performed manually in the test process is solved. The automatic processing after the test is started is realized, the labor is greatly saved, and the test efficiency and the factory production capacity of the storage device to be tested are improved.

The embodiment of the present application also provides an electronic device, as shown in fig. 9, including a processor 901, a communication interface 902, a memory 903, and a communication bus 904, where the processor 901, the communication interface 902, and the memory 903 perform communication with each other through the communication bus 904,

a memory 903 for storing a computer program;

the processor 901, when executing the program stored in the memory 903, may implement the following steps:

responding to the binding operation of a user to a monitoring management interface in a test server, and carrying out binding processing on the storage device to be tested and the test server according to the first binding information of the storage device to be tested and the second binding information of the test server to generate a first binding relation; performing supplementary processing on the test information corresponding to the storage device to be tested according to the first binding relation; and under the condition that the IP address exists in the test information corresponding to the storage device to be tested, accessing the baseboard management controller of the storage device to be tested according to the IP address, and testing the storage device to be tested according to a preset test flow.

The communication bus mentioned by the above terminal may be a peripheral component interconnect standard (Peripheral Component Interconnect, abbreviated as PCI) bus or an extended industry standard architecture (Extended Industry Standard Architecture, abbreviated as EISA) bus, etc. The communication bus may be classified as an address bus, a data bus, a control bus, or the like. For ease of illustration, the figures are shown with only one bold line, but not with only one bus or one type of bus.

The communication interface is used for communication between the terminal and other devices.

The memory may include random access memory (Random Access Memory, RAM) or non-volatile memory (non-volatile memory), such as at least one disk memory. Optionally, the memory may also be at least one memory device located remotely from the aforementioned processor.

The processor may be a general-purpose processor, including a central processing unit (Central Processing Unit, CPU for short), a network processor (Network Processor, NP for short), etc.; but also digital signal processors (Digital Signal Processing, DSP for short), application specific integrated circuits (Application Specific Integrated Circuit, ASIC for short), field-programmable gate arrays (Field-Programmable Gate Array, FPGA for short) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.

In yet another embodiment of the present application, a computer readable storage medium having instructions stored therein that, when executed on a computer, cause the computer to perform the storage device testing of any of the above embodiments is also provided.

In yet another embodiment of the present application, there is also provided a computer program product containing instructions that, when run on a computer, cause the computer to perform the storage device testing of any of the above embodiments.

In the above embodiments, it may be implemented in whole or in part by software, hardware, firmware, or any combination thereof. When implemented in software, may be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When loaded and executed on a computer, produces a flow or function in accordance with embodiments of the present application, in whole or in part. The computer may be a general purpose computer, a special purpose computer, a computer network, or other programmable apparatus. The computer instructions may be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another computer-readable storage medium, for example, the computer instructions may be transmitted from one website, computer, server, or third database to another website, computer, server, or third database by a wired (e.g., coaxial cable, fiber optic, digital Subscriber Line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.). The computer readable storage medium may be any available medium that can be accessed by a computer or a data storage device including one or more servers, third databases, etc. that can be integrated with the available medium. The usable medium may be a magnetic medium (e.g., floppy Disk, hard Disk, magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium (e.g., solid State Disk (SSD)), etc.

It is noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.

In this specification, each embodiment is described in a related manner, and identical and similar parts of each embodiment are all referred to each other, and each embodiment mainly describes differences from other embodiments. In particular, for system embodiments, since they are substantially similar to method embodiments, the description is relatively simple, as relevant to see a section of the description of method embodiments.

The foregoing description is only of the preferred embodiments of the present application and is not intended to limit the scope of the present application. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application are included in the protection scope of the present application.

Claims

1. A storage device testing method, applied to a test server, comprising:

responding to the binding operation of a user to a monitoring management interface in a test server, and carrying out binding processing on a storage device to be tested and the test server according to first binding information of the storage device to be tested and second binding information of the test server to generate a first binding relationship, wherein the storage device to be tested comprises JBOD (just a Bunch of code), and the first binding information and the second binding information consist of serial numbers and position information;

performing complementary processing on the test information corresponding to the storage device to be tested according to the first binding relation, including:

Acquiring an IP address of the storage device to be tested according to the physical address in a prestored dynamic host configuration protocol service lease file, and storing the IP address into the second preset database table;

2. The method for testing a storage device according to claim 1, wherein after the step of testing the storage device under test according to a preset test flow, the method comprises:

3. The method for testing a storage device according to claim 2, wherein the integrating the serial number of the hard disk, the information of the slot, and the information of the device number corresponding to the storage device to be tested to obtain the information comparison table of the storage device to be tested includes:

4. The storage device testing method according to claim 1, wherein the first binding information includes a first serial number and first location information, the second binding information includes a second serial number and second location information, the first location information is physical location information corresponding to the storage device to be tested, and the second location information is physical location information corresponding to the test server.

5. The method for testing a storage device according to claim 4, wherein after the step of testing the storage device under test according to a preset test flow, the method comprises:

6. The method for testing a storage device according to claim 1, wherein before the step of performing a binding process on the storage device to be tested and the test server according to the first binding information of the storage device to be tested and the second binding information of the test server in response to the binding operation of the monitoring management interface in the test server by the user, the method comprises:

7. The method for testing a storage device according to claim 1, wherein after the step of performing a binding process on the storage device to be tested and the test server according to the first binding information of the storage device to be tested and the second binding information of the test server in response to the binding operation of the monitoring management interface in the test server by the user to generate the first binding relationship, the method comprises:

8. The storage device testing method according to claim 1, wherein after the step of performing complementary processing on the test information corresponding to the storage device to be tested according to the first binding relationship, the method includes:

judging whether to acquire the IP address of the storage device to be tested;

if not, a first fault prompt is sent to the user.

9. The method for testing a storage device according to claim 1, wherein the testing the storage device under test according to a preset test flow includes:

and the hard disk information and the board card information in the storage equipment to be tested are tested through serial connection with a small computer interface line, and other accessories in the storage equipment to be tested are tested through the substrate management controller of the storage equipment to be tested accessed out of band of the test server.

10. The method for testing a storage device according to claim 9, wherein the calling a testing component to test the storage device to be tested item by item according to a preset testing procedure comprises:

if not, a second fault prompt is sent to the user.

11. The method for testing a storage device according to claim 9, wherein the calling a testing component to test the storage device to be tested item by item according to a preset testing procedure comprises:

and carrying out refreshing setting on the storage device to be tested, wherein the refreshing setting comprises at least one of the following steps: refreshing a field replaceable unit, refreshing a baseboard management controller version and refreshing a mechanical hard disk version;

12. The method for testing a storage device according to claim 9, wherein the calling a testing component to test the storage device to be tested item by item according to a preset testing procedure comprises:

13. The method for testing a storage device according to claim 9, wherein after the step of calling a testing component to test the storage device to be tested item by item according to a preset testing procedure, the method comprises:

14. The method for testing a storage device according to claim 1, wherein after the step of testing the storage device under test according to a preset test flow, the method comprises:

15. The storage device testing system is characterized by comprising a storage device to be tested and a testing server;

the test server is used for responding to the binding operation of a user on a monitoring management interface in the test server, and carrying out binding processing on the storage device to be tested and the test server according to first binding information of the storage device to be tested and second binding information of the test server to generate a first binding relationship, wherein the storage device to be tested comprises JBOD (just a Bunch of the code) and the first binding information and the second binding information consist of serial numbers and position information; performing complementary processing on the test information corresponding to the storage device to be tested according to the first binding relation, including:

acquiring a first serial number corresponding to the storage device to be tested from a second preset database table according to a second serial number of the test server; acquiring a physical address corresponding to the storage device to be tested from a first preset database table according to the first serial number; acquiring an IP address of the storage device to be tested according to the physical address in a prestored dynamic host configuration protocol service lease file, and storing the IP address into the second preset database table;

Under the condition that the IP address exists in the test information corresponding to the storage device to be tested, accessing a baseboard management controller of the storage device to be tested according to the IP address, and testing the storage device to be tested according to a preset test flow;

16. The storage device testing system of claim 15, wherein the test server comprises an information binding module, a database module, a test module, a hard disk parsing module, and a monitoring management module.

17. The storage device testing system of claim 16, wherein the information binding module is configured to respond to a binding operation of a user to a monitoring management interface in a test server, and perform binding processing on the storage device to be tested and the test server according to first binding information of the storage device to be tested and second binding information of the test server, so as to generate a first binding relationship;

18. A storage device testing apparatus for use with a test server, the apparatus comprising:

the binding module is used for responding to the binding operation of a user on a monitoring management interface in the test server, carrying out binding processing on the storage device to be tested and the test server according to the first binding information of the storage device to be tested and the second binding information of the test server, and generating a first binding relation, wherein the storage device to be tested comprises JBOD (just a Bunch of the code), and the first binding information and the second binding information consist of serial numbers and position information;

The supplementing module is configured to supplement test information corresponding to the to-be-tested storage device according to the first binding relationship, and includes:

19. A communication device, comprising: a transceiver, a memory, a processor, and a program stored on the memory and executable on the processor;

the processor being configured to read a program in a memory to implement a storage device testing method according to any one of claims 1-14.

20. A readable storage medium storing a program, wherein the program, when executed by a processor, implements a storage device testing method according to any one of claims 1-14.