CN109660386B - Software upgrading method for semiconductor memory aging test system - Google Patents

Software upgrading method for semiconductor memory aging test system Download PDF

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Publication number
CN109660386B
CN109660386B CN201811436611.5A CN201811436611A CN109660386B CN 109660386 B CN109660386 B CN 109660386B CN 201811436611 A CN201811436611 A CN 201811436611A CN 109660386 B CN109660386 B CN 109660386B
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test
core board
upper computer
test core
upgrading
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CN109660386A (en
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黄磊
刘海
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Wuhan Jinghong Electronic Technology Co ltd
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Wuhan Jinghong Electronic Technology Co ltd
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L41/00Arrangements for maintenance, administration or management of data switching networks, e.g. of packet switching networks
    • H04L41/08Configuration management of networks or network elements
    • H04L41/0803Configuration setting
    • H04L41/0813Configuration setting characterised by the conditions triggering a change of settings
    • H04L41/082Configuration setting characterised by the conditions triggering a change of settings the condition being updates or upgrades of network functionality
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L67/00Network arrangements or protocols for supporting network services or applications
    • H04L67/01Protocols
    • H04L67/06Protocols specially adapted for file transfer, e.g. file transfer protocol [FTP]
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L69/00Network arrangements, protocols or services independent of the application payload and not provided for in the other groups of this subclass
    • H04L69/16Implementation or adaptation of Internet protocol [IP], of transmission control protocol [TCP] or of user datagram protocol [UDP]
    • H04L69/164Adaptation or special uses of UDP protocol
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L9/00Cryptographic mechanisms or cryptographic arrangements for secret or secure communications; Network security protocols
    • H04L9/06Cryptographic mechanisms or cryptographic arrangements for secret or secure communications; Network security protocols the encryption apparatus using shift registers or memories for block-wise or stream coding, e.g. DES systems or RC4; Hash functions; Pseudorandom sequence generators
    • H04L9/0643Hash functions, e.g. MD5, SHA, HMAC or f9 MAC

Abstract

The invention belongs to the technical field of software upgrading, and discloses a software upgrading method for a semiconductor memory aging test system, which comprises the steps of taking an upper computer as a client, taking a test core board of the semiconductor memory aging test system as a server, sending UDP (user Datagram protocol) broadcast packets to all test core boards in the semiconductor memory aging test system by the upper computer by adopting a UDP (user Datagram protocol) protocol to find IP (Internet protocol) addresses of all test core boards in a local area network, and transmitting an upgrading command and a response message by adopting a TCP (Transmission control protocol) protocol; setting FTP service in the test core board, transmitting the program file to be upgraded to the test core board by adopting FTP protocol, and updating the program file to a finger storage area or a file system by the test core board according to the file type after the program file passes the verification; the software upgrading method provided by the invention can upgrade a plurality of test core boards through a network simultaneously, and uses the network architecture of the semiconductor aging test system during working, so that the upgrading cost is not increased, the upgrading operation is reduced, and the upgrading reliability and convenience are greatly improved.

Description

Software upgrading method for semiconductor memory aging test system
Technical Field
The invention belongs to the technical field of software upgrading, and particularly relates to a software upgrading method of a semiconductor memory aging test system.
Background
The semiconductor memory device can be accelerated to expose its defective cells as early as possible by a burn-in Test (TDBI). The aging test system comprises an aging test box, a test module, a data processing module and a system control module. Due to the complexity of burn-in testing, the software of its data processing modules and system control modules often needs to be upgraded. In order to improve the aging test efficiency of the semiconductor memory device and shorten the test time, the aging test system of the semiconductor memory device generally tests a plurality of semiconductor memory devices at the same time, and the corresponding aging test system is provided with a plurality of data processing modules; most of the existing software upgrading methods are single-machine upgrading, and a single machine is generally upgraded through a serial port or a network, so that the upgrading is very inconvenient for a complex semiconductor aging test system.
Chinese patent application publication No. CN103577202A discloses a software upgrading method and system, which performs subpackage processing of an upgrade package while downloading the upgrade package, and generates a differential package for upgrading directly based on a data package of the received upgrade package; in the upgrading stage, the differential packet is directly used for upgrading; but does not relate to a method for simultaneously upgrading a plurality of terminal devices;
the chinese patent application with publication number CN105278990A discloses a software upgrading method and system, which upgrade management programs in a usb disk mounting manner, and the upgrading method is also not suitable for simultaneous upgrading of multiple terminals; moreover, the test method needs the semiconductor memory aging test core board to have a USB flash disk hardware interface, and is not suitable for the upgrading requirement of the aging test system of network communication.
Disclosure of Invention
In view of the above drawbacks and needs of the prior art, the present invention provides a method for upgrading software of a semiconductor memory burn-in test system, which is implemented to upgrade different files simultaneously for a plurality of test core boards of such a semiconductor memory burn-in test system having at least one test core board.
In order to achieve the above object, according to an aspect of the present invention, a method for upgrading software of a semiconductor memory aging test system is provided, in which an upper computer is used as a client, a test core board of the semiconductor memory aging test system is used as a server, and the upper computer is used for upgrading the test core board;
sending UDP broadcast packets to all test core boards in the aging test system by adopting a UDP protocol, and enabling an upper computer to find IP addresses of all test core boards in a local area network according to responses of all test core boards in the local area network after receiving the UDP broadcast packets;
transmitting the upgraded command and response message by adopting a TCP (Transmission control protocol); and setting FTP service in the test core board, transmitting the program file to be upgraded to the test core board by the upper computer by adopting an FTP protocol, and updating the program file to the storage area or the file system by the test core board according to the file type after the program file passes the verification.
Preferably, in the method for upgrading software of a semiconductor memory burn-in test system, the processing at the upper computer end includes:
(1) the upper computer sends a network discovery instruction through UDP (user Datagram protocol) broadcast, receives a response message of a test core board of the semiconductor memory aging test system to the instruction, and generates a local area network equipment list according to the response message; the response message comprises a test core board device number and a network IP address;
(2) sending an uploading command to the test core board by adopting a TCP protocol, and uploading an upgrading program file selected by a user to an FTP server of the equipment selected by the user after receiving an uploading command response of the test core board;
(3) after the uploading is finished, sending an MD5(Message-Digest Algorithm5) check Message by adopting a TCP (transmission control protocol);
(4) the upper computer receives a verification result sent by the test core board, and if the verification is correct, an upgrading instruction is sent by adopting a TCP (transmission control protocol) protocol, so that the test core board automatically finishes program updating and restarting; and (4) if the verification is incorrect, entering the step (2) to carry out the file uploading operation again.
Preferably, in the software upgrading method for the semiconductor memory aging test system, the upgrading step of the test core board end is as follows:
(i) after receiving a network discovery instruction sent by an upper computer, the test core board sends a response message to the upper computer to respond to the equipment number and the IP address of the test core board;
(ii) after receiving an uploading command sent by an upper computer by adopting a TCP (transmission control protocol), starting an FTP (file transfer protocol) service and sending an uploading command response to the upper computer;
(iii) receiving an MD5 check message sent by the upper computer by adopting a TCP (transmission control protocol), calculating and comparing an uploaded file MD5 value, and feeding a check result back to the upper computer;
(iv) after receiving an upgrading instruction sent by an upper computer, backing up a program file to be updated, and updating the program file to a specified storage space or a file system according to the type of the program file;
(v) and after the program is upgraded, restarting the test core board.
Preferably, in the software upgrading method for the semiconductor memory aging test system, the FPGA program is written into Flash, and the ARM linux application program is written into a file system.
Preferably, in the software upgrading method for the semiconductor memory aging test system, for the running ARM linux application file, the running is firstly quitted, and then the file is updated.
In general, compared with the prior art, the above technical solution contemplated by the present invention can achieve the following beneficial effects:
(1) according to the software upgrading method of the semiconductor memory aging test system, the local IP address is obtained in a UDP (user Datagram protocol) broadcasting mode, the trouble of manual configuration is saved, and the problem that the equipment IP is not matched with the equipment ID configuration can be searched;
(2) the software upgrading method of the semiconductor memory aging test system provided by the invention binds the equipment number and the IP address of the test core board, provides the function of modifying the IP address of the aging core board, and is convenient for modifying the aging core board under the condition of wrong configuration of the IP address of the system;
(3) according to the software upgrading method of the semiconductor memory aging test system, the FTP service is arranged on the test core board, different files can be upgraded to a plurality of different devices at the same time through the configuration of the upper computer, and the upgrading flexibility is improved;
(4) according to the software upgrading method of the semiconductor memory aging test system, three protocols of UDP, TCP and FTP used in a test core board lower computer program are all server sides and are used as daemon programs, so that the upper computer can conveniently carry out upgrading operation at any time; through the network upgrading program, the network architecture of the semiconductor aging test system during working is used, the upgrading cost cannot be increased, a plurality of test core boards can be upgraded through the network simultaneously, the upgrading operation is reduced, and the upgrading reliability and convenience are greatly improved.
Drawings
FIG. 1 is a hardware block diagram of a semiconductor memory burn-in test system to be upgraded in an embodiment;
FIG. 2 is a schematic diagram of an architecture of a software upgrading method of a semiconductor memory burn-in test system according to an embodiment;
fig. 3 is a schematic flowchart of an upper computer upgrading program of a software upgrading method for a semiconductor memory aging test system according to an embodiment of the present invention;
fig. 4 is a flowchart of an upgrade program of the burn-in core board lower computer of the software upgrade method of the burn-in test system for semiconductor memories according to the embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention. In addition, the technical features involved in the embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
Referring to fig. 1, the semiconductor memory aging Test system to be upgraded includes an upper computer, an ethernet switch, a Test core board, a first backplane, a pass-through board, a second backplane, and a DUT (Device Under Test) Test board; the Ethernet switch provides a plurality of hundreds of million/giga/ten million ports to connect the computer and the test core board, each test core board corresponds to one port and undertakes the information exchange of test commands and test results between the computer and the test core board.
The test core board provides test signals and power supplies for the DUT to be tested, compares the output signals of the DUT, and respectively stores the test results in different storage intervals so as to facilitate analysis; the DUT test board is used for bearing DUTs to be tested, leading a test signal and a power supply provided by the test core board to each DUT to be tested, and sending an output signal fed back by each DUT to be tested to the test core board; the first back board provides slots for the test core board and the through board to realize the transmission of signals and power supplies; a combination of the test core board, the first backplane, the pass-through board, the second backplane, and the DUT test board is called a slot/site, and each slot can support simultaneous testing of multiple DUTs.
Referring to fig. 2, in the software upgrading method of the semiconductor memory aging test system according to the embodiment, software upgrading is performed on a test core board through an upper computer. Since the semiconductor memory burn-in test system includes a plurality of test core boards, the plurality of test core boards need to be upgraded simultaneously. In the embodiment, a processor chip used by the test core board is an SOC with an ARM + FPGA architecture, and the software to be upgraded is an FPGA logic code and an ARM application program.
The program upgrading comprises two processes of uploading and updating, wherein the uploading process is that the upper computer transmits files to be upgraded to the test core board, and the updating process is that the test core board refreshes the received correct files to a specified storage area or a file system according to file types. The information interaction of software upgrading uses three network protocols of TCP, UDP and FTP, the upper computer is used as a client, the test core board is used as a server, and the upper computer can carry out software upgrading operation on the test core board at any time.
Transmitting the upgraded command and response message by adopting a TCP (Transmission control protocol); the upper computer sends a UDP broadcast packet by adopting a UDP protocol, and all the test core boards in the local area network respond after receiving the UDP broadcast packet, so that the upper computer finds the IP addresses of all the test core boards in the local area network; and the FTP protocol is adopted to transmit the program files needing to be upgraded to the test core board, and the test core board updates the program files to the storage area or the file system according to the file types.
According to the system software upgrading method provided by the embodiment, the local IP address is acquired in a UDP (user Datagram protocol) broadcasting mode, the trouble of manual configuration is saved, and the problem that the equipment IP is not matched with the equipment ID configuration can be searched; the equipment number of the test core board is bound with the IP address, and the function of modifying the IP address of the test core board is provided, so that the test core board can be modified under the condition that the IP address configuration of the system is wrong. Because the FTP server is placed on the test core board, different files can be upgraded on a plurality of different test core boards simultaneously through the configuration of the upper computer, and the upgrading flexibility is improved; three protocols of UDP, TCP and FTP used in the test core board lower computer program are all server sides and are used as daemon programs, so that the upper computer can conveniently carry out upgrading operation at any time; on the other hand, the method adopts the network architecture when the semiconductor memory aging test system works to upgrade the program through the network, and the upgrading cost is not increased.
The following describes the flow of the software upgrading method of the semiconductor memory aging test system with reference to fig. 3 to 4; the processing at the upper computer end comprises the following steps:
(1) the upper computer end sends a network discovery instruction through UDP protocol broadcasting, and the test core board sends a response message after receiving the instruction, wherein the response message comprises a test core board equipment number and a network IP address; after receiving the response message, the upper computer generates a local area network equipment list;
(2) sending an uploading command to a test core board by adopting a TCP protocol, and uploading an upgrading program file selected by a user to an FTP server of a user selected device after receiving a correct uploading command response of the test core board;
(3) after uploading, sending an MD5 check message by adopting a TCP (transmission control protocol);
(4) the upper computer receives a verification result sent by the test core board, if the verification is correct, an upgrading instruction is sent by adopting a TCP (transmission control protocol), and the test core board automatically completes program updating and restarting; and (4) if the verification is incorrect, entering the step (2) to carry out the file uploading operation again.
The upgrading steps of the test core board end are as follows:
(i) after receiving a network discovery instruction sent by an upper computer, the test core board responds to the equipment number and the IP address of the test core board;
(ii) after receiving an uploading command sent by an upper computer by adopting a TCP (transmission control protocol), starting an FTP (file transfer protocol) service and sending an uploading command response to the upper computer;
(iii) receiving an MD5 check message sent by the upper computer by adopting a TCP (transmission control protocol), calculating and comparing an uploaded file MD5 value, and feeding a check result back to the upper computer;
(iv) after receiving an upgrading instruction sent by an upper computer, backing up a program file to be updated, and updating the program file to a specified storage space or a file system according to the type of the program file; for example, an FPGA program is written into Flash, and an ARM linux application program is written into a file system; for the running ARM linux application program file, the running is firstly quitted, and then the file is updated;
(v) and after the program is upgraded, restarting the test core board.
The upgrading program not only has the basic function of program upgrading, but also has the functions of checking the file version, modifying the IP address of the equipment, returning the equipment version, upgrading by one key, restarting the equipment of the lower computer such as the test core board and the like, and is convenient for the upper computer to manage the program of the lower computer.
It will be understood by those skilled in the art that the foregoing is only a preferred embodiment of the present invention, and is not intended to limit the invention, and that any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the scope of the present invention.

Claims (5)

1. A software upgrading method for a semiconductor memory aging test system is characterized in that the semiconductor memory aging test system comprises an upper computer, an Ethernet switch, a test core board, a first back board, a through board, a second back board and a DUT test board, wherein the upper computer is used as a client, the test core board of the semiconductor memory aging test system is used as a server, the upper computer sends UDP broadcast packets to all the test core boards in the semiconductor memory aging test system by adopting a UDP protocol to find IP addresses of all the test core boards in a local area network, and a TCP protocol is adopted to transmit upgrading commands and response messages; setting FTP service in a test core board, transmitting a program file to be upgraded to the test core board by adopting an FTP protocol, updating the program file to a specified storage area or a file system by the test core board according to the file type after the program file passes verification, and placing an upper computer, an Ethernet switch, the test core board, a first back board, a through board, a second back board and a DUT test board in a high-low temperature box, wherein the upper computer and the Ethernet switch are placed in a normal temperature area; the test core board and the first backplane are placed in a first temperature zone, the through board is placed in an isolation zone, and the second backplane and the DUT test board are placed in a second temperature zone.
2. The method for upgrading software of a semiconductor memory burn-in test system according to claim 1, wherein the processing step at the upper computer end specifically includes:
(1) the method comprises the steps of sending a network discovery instruction through UDP (user datagram protocol) broadcasting, receiving a response message of a test core board to the discovery instruction, and generating a local area network equipment list according to the response message;
(2) sending an uploading command to a test core board by adopting a TCP (Transmission control protocol), and uploading an upgrading program file selected by a user to an FTP (file transfer protocol) server of a user selected device according to the uploading command response of the test core board;
(3) after uploading, sending an MD5 check message by adopting a TCP (transmission control protocol);
(4) receiving a verification result sent by the test core board, and if the verification is correct, sending an upgrading instruction by adopting a TCP (transmission control protocol) protocol to enable the test core board to automatically complete program updating and restarting; and (4) if the verification is incorrect, entering the step (2) to carry out the file uploading operation again.
3. The method for upgrading software of a semiconductor memory burn-in test system according to claim 1, wherein the processing step of testing the core board terminal specifically includes:
(i) receiving a network discovery instruction sent by an upper computer, sending a response message to the upper computer, and responding to the equipment number and the IP address of the test core board;
(ii) starting the FTP service after receiving an uploading command sent by the upper computer, and sending an uploading command response to the upper computer;
(iii) receiving an MD5 verification message sent by the upper computer, calculating and comparing an uploaded file MD5 value, and feeding a verification result back to the upper computer;
(iv) after receiving an upgrading instruction sent by an upper computer, backing up a program file to be updated, and updating the program file to a specified storage space or a file system according to the type of the program file;
(v) and after the program is upgraded, restarting the test core board.
4. The software upgrading method for the semiconductor memory burn-in test system as claimed in claim 1, wherein the FPGA program is written into Flash and the ARM linux application is written into a file system.
5. The software upgrading method for the semiconductor memory aging test system according to claim 3 or 4, wherein for the running ARM linux application program file, the running is firstly exited, and then the file is updated.
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CN111552599B (en) * 2020-04-26 2024-04-09 武汉精测电子集团股份有限公司 Distributed process processing system, semiconductor aging test method and system and distributed system
CN114024950B (en) * 2021-09-13 2023-06-30 福建新大陆通信科技股份有限公司 Big data transmission method and system for electronic equipment

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101442688A (en) * 2008-12-31 2009-05-27 中兴通讯股份有限公司 Method and system for updating intelligent network platform, controller and intelligent network platform equipment
CN107864207A (en) * 2017-11-14 2018-03-30 上海赫千电子科技有限公司 A kind of ECU software upgrade method based on vehicle-mounted Ethernet

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101858956B (en) * 2010-05-27 2012-10-03 北京新润泰思特测控技术有限公司 Ageing test system
CN104596738A (en) * 2015-01-04 2015-05-06 武汉电信器件有限公司 Digital type ageing equipment of laser device
WO2016150623A1 (en) * 2015-03-20 2016-09-29 Nokia Solutions And Networks Management International Gmbh Coexistence of software defined network, network function virtualization and legacy networks

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101442688A (en) * 2008-12-31 2009-05-27 中兴通讯股份有限公司 Method and system for updating intelligent network platform, controller and intelligent network platform equipment
CN107864207A (en) * 2017-11-14 2018-03-30 上海赫千电子科技有限公司 A kind of ECU software upgrade method based on vehicle-mounted Ethernet

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