CN111552599B - Distributed process processing system, semiconductor aging test method and system and distributed system - Google Patents
Distributed process processing system, semiconductor aging test method and system and distributed system Download PDFInfo
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G06F11/00—Error detection; Error correction; Monitoring
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Abstract
The invention discloses a distributed process processing system, a semiconductor aging test method and system and a distributed system, wherein the distributed process processing system comprises: the first-level node management module is used for managing the first-level nodes and storing the corresponding relation between the first-level nodes and the second-level nodes, wherein a management logic board is used as the first-level nodes, a test logic board is used as the second-level nodes, and each second-level node comprises a plurality of test units; the system comprises a plurality of secondary node management modules, a plurality of test unit management modules and a plurality of test unit management modules, wherein the plurality of secondary node management modules are used for managing corresponding secondary nodes and test processes corresponding to the secondary nodes, and storing the corresponding relation between the secondary nodes and the test processes, and each test process corresponds to one test unit and is used for running test cases of the test units.
Description
Technical Field
The invention relates to the field of semiconductor memory testing, in particular to a distributed process processing system, a semiconductor aging testing method and system and a distributed system.
Background
Semiconductor memory (semi-conductor memory) is an important component in modern digital systems, particularly computer systems, and as the integration level of semiconductor memory increases, the size of semiconductor device particles decreases and the failure rate of semiconductor devices increases. The reliability and stability of semiconductor memory devices are required to be tested and verified in various different inspection apparatuses. The semiconductor memory burn-in test apparatus is an apparatus for detecting semiconductor memory devices at different limit temperatures and for a long time.
In the development and design of the semiconductor memory burn-in test equipment at present, a single process management mode is generally adopted by a test system, so that the problem of operation stability exists.
Disclosure of Invention
The invention provides a distributed process processing system, a semiconductor aging test method and system and a distributed system, which are used for solving or at least partially solving the problem of instability in the prior art.
In order to solve the above technical problem, a first aspect of the present invention provides a distributed process processing system applied to a semiconductor memory burn-in test system, the semiconductor memory burn-in test system including a management logic board and a test logic board, the distributed process processing system including:
the first-level node management module is used for managing the first-level nodes and storing the corresponding relation between the first-level nodes and the second-level nodes, wherein a management logic board is used as the first-level nodes, a test logic board is used as the second-level nodes, and each second-level node comprises a plurality of test units;
and the plurality of secondary node management modules are used for managing the corresponding secondary nodes and the test processes corresponding to the secondary nodes and storing the corresponding relation between the secondary nodes and the test processes, wherein each test process corresponds to one test unit and is used for running the test instance of the test unit.
Based on the same inventive concept, a second aspect of the present invention provides a distributed process processing method, including:
taking a management logic board as a first-level node, taking a test logic board as a second-level node, and managing the first-level node and storing the corresponding relation between the first-level node and the second-level node through a first-level node management module, wherein each second-level node comprises a plurality of test units;
the corresponding secondary nodes and the test processes corresponding to the secondary nodes are managed through the secondary node management module, and the corresponding relation between the secondary nodes and the test processes is stored;
and allocating a test process for each test unit, wherein the test process is used for running the test instance of the test unit according to the corresponding relation between the primary node and the secondary node and the corresponding relation between the secondary node and the test process.
Based on the same inventive concept, a third aspect of the present invention provides a testing method based on the distributed process processing system of the first aspect, including:
creating a primary node management process through a primary node management module, and creating a secondary node management process through a secondary node management module;
the first-level node management process sends a starting command to the second-level node management process, so that the second-level node management process starts a corresponding test process based on the starting command and returns a starting completion message, wherein each test process corresponds to one test unit;
the primary node management process sends a test command to the secondary node management process based on the starting completion message, and the secondary node management process forwards the test command to the corresponding test process so that the test process tests the corresponding test unit to obtain test result data.
In one embodiment, the primary node management process sends a start command to the secondary node management process, so that the secondary node management process starts a corresponding test process based on the start command, and returns a start completion message, including:
the primary node management process sends a starting command to the secondary node management process, wherein the starting command carries the identification of the unit to be tested;
the secondary node management process sequentially starts the test process corresponding to the unit to be tested based on the identification of the unit to be tested, and when one test process is started, a starting completion message is sent to the secondary node management process;
the secondary node management process collects all the starting completion messages and sends the starting completion messages to the primary node management process.
In one embodiment, the second-level node management process sequentially starts a test process corresponding to a unit to be tested based on an identifier of the unit to be tested, including:
the second-level node management process builds a shared memory area of the test process corresponding to the unit to be tested so as to start the test process corresponding to the unit to be tested, wherein the target test process is connected with the corresponding shared memory area.
In one embodiment, the primary node management process sends a test command to the secondary node management process based on the start-up completion message, and forwards the test command to a corresponding test process through the secondary node management process, so that the test process tests a corresponding test unit, including:
the primary node management process sends a test command to the secondary node management process based on the starting completion message, wherein the test command corresponds to the unit to be tested;
the second-level node management process writes the test command into a shared memory communication area corresponding to the unit to be tested, wherein the shared memory communication area is constructed by the second-level node management process when the test process is started;
and acquiring a test command in the shared memory communication area through the test process, and executing the test command, so that the unit to be tested runs a test flow corresponding to the test command, and test result data of the unit to be tested is obtained.
In one embodiment, the start command is used to start one or more preset test processes.
In one embodiment, when the unit to be tested is a single unit, the primary node management process sends a test command to the secondary node management process based on the start-up completion message, and forwards the test command to the corresponding test process through the secondary node management process, so that the test process tests the corresponding test unit, including:
the primary node management process sends a test command to the secondary node management process corresponding to the unit to be tested based on the starting completion message;
and the second-level node management process transmits the test command to the test process corresponding to the unit to be tested, and tests the unit to be tested.
In one embodiment, when the units to be tested are plural, the primary node management process sends a test command to the secondary node management process based on the start-up completion message, and forwards the test command to the corresponding test process through the secondary node management process, so that the test process tests the corresponding test unit, including:
the primary node management process respectively sends a test command to the secondary node management process corresponding to each unit to be tested based on the starting completion message;
and the secondary node management process forwards the test command to the test process corresponding to each unit to be tested, and performs parallel test on the units to be tested.
Based on the same inventive concept, a fourth aspect of the present invention provides a semiconductor memory burn-in test system, comprising:
the management logic board is provided with a primary node management module;
the test logic board is provided with a secondary node management module;
the process creation module is used for creating a primary node management process through the primary node management module and creating a secondary node management process through the secondary node management module;
the starting command sending module is used for sending a starting command to the secondary node management process by the primary node management process so that the secondary node management process starts the corresponding test process based on the starting command and returns a starting completion message, wherein each test process corresponds to one test unit;
the test command sending module is used for sending a test command to the secondary node management process based on the starting completion message by the primary node management process, and forwarding the test command to the corresponding test process through the secondary node management process so that the test process tests the corresponding test unit to obtain test result data.
Based on the same inventive concept, a fifth aspect of the present invention provides a distributed system, including the distributed process processing system according to the first aspect and the semiconductor memory burn-in test system according to the fourth aspect.
The above-mentioned one or more technical solutions in the embodiments of the present application at least have one or more of the following technical effects:
the invention provides a distributed process processing system, which is characterized in that a primary node management module is arranged to manage primary nodes and store the corresponding relation between the primary nodes and secondary nodes, a plurality of secondary node management modules are used to manage the corresponding secondary nodes and the corresponding test processes between the secondary nodes and store the corresponding relation between the secondary nodes and the test processes, wherein each test process corresponds to one test unit and is used to run the test instance of the test unit. Compared with the mode of managing all test units by a single process in the prior art, the invention adopts the two-stage management architecture to manage the test units of the semiconductor memory aging test system, and tests a test process for a test unit independently and respectively during testing, thus being a distributed management system, greatly improving the stability of the system, and improving the processing capacity and the processing speed of the system to test data by adopting a two-stage management strategy.
Further, the semiconductor aging test method is provided based on the distributed process processing system, corresponding management processes are respectively established through the primary node management module and the secondary node management module, then corresponding test units are tested, accurate control can be carried out on each test unit, and different test processes of each test unit are controlled.
Furthermore, each test unit in the burn-in test method is independent, so that a single test unit test and a plurality of test units test can be supported, a plurality of chips can be supported for simultaneous test, and the usability and reusability of the system can be improved.
Further, the software modules in the test system: the primary node management module and the secondary node management module can be abstract and independent, so that the complexity of the system is reduced, the independence of the software modules can be maintained, the updating iteration speed of the test system is accelerated, and the research and development cost is reduced.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a block diagram of a distributed process processing system according to the present invention;
FIG. 2 is a schematic diagram illustrating a distributed process processing system according to the present invention;
FIG. 3 is a flow chart of a distributed process processing method according to the present invention;
FIG. 4 is a flow chart of a method for burn-in testing a semiconductor memory according to the present invention;
FIG. 5 is a flow chart of a process for starting a test and a start of the test according to an embodiment of the invention;
FIG. 6 is a flow chart of a partial test unit test in accordance with one embodiment of the present invention;
FIG. 7 is a schematic diagram of a system initialization state according to an embodiment of the present invention;
FIG. 8 is a schematic diagram of a single test procedure in an embodiment of the present invention;
FIG. 9 is a schematic diagram of a testing process of a single testing process according to an embodiment of the present invention;
FIG. 10 is a schematic diagram illustrating a simultaneous testing process of a plurality of testing processes according to an embodiment of the present invention;
FIG. 11 is a block diagram of a hardware module of the test system provided by the present invention.
Detailed Description
In the prior art, related technologies about a process management system and a process management method applied to a distributed system are mainly studied, and the related technologies mainly relate to management and scheduling of the process management system. The method is not aimed at the development and the realization of a semiconductor test system, and can not well solve a plurality of problems faced by the existing aging equipment. The invention introduces the distributed processing idea into the field of semiconductor burn-in test, and develops and designs a test system of burn-in test equipment.
The invention provides a distributed process processing system, a semiconductor aging test method and a system and a distributed system, wherein the distributed process processing system comprises a primary node management module and a secondary node management module, the primary node management module is used for managing primary nodes and storing the corresponding relation between the primary nodes and the secondary nodes, and the secondary node management module is used for managing the corresponding secondary nodes and the test process corresponding to the secondary nodes and storing the corresponding relation between the secondary nodes and the test process, so that the test unit can be managed by adopting a two-stage architecture, the stability of the system can be improved, and the processing capacity and the processing speed of test data can be improved.
Abbreviations and acronyms for related terms referred to in the present invention are as follows: ATE (Automatic Test Equipment ), IC (Integrated Circuits, integrated circuit), TDBI (Test Burn-In), burn-In (Burn-In).
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments of the present invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Example 1
The present embodiment provides a distributed process processing system, which is applied to a semiconductor memory burn-in test system, wherein the semiconductor memory burn-in test system includes a management logic board and a test logic board, and referring to fig. 1, the distributed process processing system includes:
the first-level node management module is used for managing the first-level nodes and storing the corresponding relation between the first-level nodes and the second-level nodes, wherein a management logic board is used as the first-level nodes, a test logic board is used as the second-level nodes, and each second-level node comprises a plurality of test units;
and the plurality of secondary node management modules are used for managing the corresponding secondary nodes and the test processes corresponding to the secondary nodes and storing the corresponding relation between the secondary nodes and the test processes, wherein each test process corresponds to one test unit and is used for running the test instance of the test unit.
Specifically, a two-stage management architecture is adopted, a first-stage node management module is used for managing a first-stage node, and storing a corresponding relation between the first-stage node and a second-stage node, so that the first-stage node and the second-stage node can be associated through the corresponding relation, and the first-stage node and the second-stage node can be positioned from the first-stage node to the second-stage node.
The secondary node management module is used for managing secondary nodes and corresponding test processes, each secondary node comprises a plurality of test units, and the corresponding test processes can be positioned through the secondary nodes by the corresponding relation between the stored secondary nodes and the test processes.
The test processes are in one-to-one correspondence with the test units, and one test process corresponds to one test unit, so that the test units are independent and do not influence each other, and the operation of other test units cannot be influenced when one test unit tests a problem, thereby improving the stability of the system.
FIG. 1 is a schematic diagram of a distributed process processing system, in which test software is a program for creating a test process, each chip under test represents a test unit, and the chips under test are independent of each other.
As shown in fig. 2, an operation schematic diagram of a distributed process processing system is shown, m_s1 represents a process created by a primary node management module in an operation process, which is called a primary node management process, and similarly, m_s2 represents a secondary node management process, and testprocesses are test processes created by test software in an actual operation process, where each TestProcess corresponds to a tested chip.
Example two
Based on the same inventive concept, this embodiment provides a distributed process processing method, please refer to fig. 3, which includes:
s1: taking a management logic board as a first-level node, taking a test logic board as a second-level node, and managing the first-level node and storing the corresponding relation between the first-level node and the second-level node through a first-level node management module, wherein each second-level node comprises a plurality of test units;
s2: the corresponding secondary nodes and the test processes corresponding to the secondary nodes are managed through the secondary node management module, and the corresponding relation between the secondary nodes and the test processes is stored;
s3: and allocating a test process for each test unit, wherein the test process is used for running the test instance of the test unit according to the corresponding relation between the primary node and the secondary node and the corresponding relation between the secondary node and the test process.
Since the system described in the second embodiment of the present invention is a method implemented by the distributed process processing system according to the first embodiment of the present invention, a specific implementation of the method can be known to a person skilled in the art based on the system described in the first embodiment of the present invention, and thus will not be described herein. All the methods implemented by the distributed process processing system in the first embodiment of the present invention belong to the scope of protection desired by the present invention.
Example III
Based on the same inventive concept, this embodiment provides a testing method of a distributed process processing system based on the embodiment, please refer to fig. 4, the method includes:
s1: creating a primary node management process through a primary node management module, and creating a secondary node management process through a secondary node management module;
s2: the first-level node management process sends a starting command to the second-level node management process, so that the second-level node management process starts a corresponding test process based on the starting command and returns a starting completion message, wherein each test process corresponds to one test unit;
s3: the primary node management process sends a test command to the secondary node management process based on the starting completion message, and the secondary node management process forwards the test command to the corresponding test process so that the test process tests the corresponding test unit to obtain test result data.
Specifically, S1 is an initialization step, a primary node management process is created through a primary node management module, a secondary node management process is created by a secondary node management module, and interaction is performed between the primary node management module and the secondary node management module.
S2, starting a corresponding test process by sending a starting command to the second-level node management process by the first-level node management process.
S3, a specific testing step is that after receiving a starting completion message returned by the testing process, the primary node management process sends a testing command to the secondary node management process based on the starting completion message, and testing of the testing unit is carried out.
In one embodiment, the primary node management process sends a start command to the secondary node management process, so that the secondary node management process starts a corresponding test process based on the start command, and returns a start completion message, including:
the primary node management process sends a starting command to the secondary node management process, wherein the starting command carries the identification of the unit to be tested;
the secondary node management process sequentially starts the test process corresponding to the unit to be tested based on the identification of the unit to be tested, and when one test process is started, a starting completion message is sent to the secondary node management process;
the secondary node management process collects all the starting completion messages and sends the starting completion messages to the primary node management process.
In a specific implementation process, the primary node management module knows in advance which test units need to be tested, namely which test units need to be tested, so that the identity of the units to be tested can be sent to the primary node management process, and then the primary node management process can send a starting command to the secondary node management processes corresponding to the units to be tested. The identification of the unit to be tested carried in the start command is the only information which can identify the test unit to which the secondary management node module belongs, such as a number, an identification code and the like.
After the node management process receives the starting command, the test process corresponding to the unit to be tested can be started according to the unit identifier to be tested in the node management process.
When the secondary node management process collects all the starting completion messages, the primary node management process and the notification are informed, and the starting process is completed.
The number of units to be tested is one or more,
for example, when the number of units to be tested is one, the primary node management process sends a start command to the secondary node management process of the unit to be tested, and the secondary node management process starts a target test process according to the unit identifier to be tested in the start command, so as to test the unit to be tested.
When the number of the units to be tested is multiple, if the units to be tested belong to the same secondary node management module, a starting command is sent to the process created by the secondary node management module, and then multiple target test processes are started through the secondary node management process and are respectively used for testing the units to be tested.
When the units to be tested belong to different secondary node management modules, a starting command needs to be sent to the processes created by the secondary node management modules, and then a target test process is started by adopting a similar method.
Referring to fig. 5, a flow chart of a start test procedure and a start test in an embodiment of the invention is shown, which mainly shows two parts of the start test procedure and the start test,
(1) M_S1 (primary node management process) sends a start command to M_S2 (secondary node management process) to which the unit to be tested belongs;
(2) After receiving the starting command, the M_S2 sequentially starts 9 test processes of the TestProgram software to respectively correspond to 9 units to be tested, and after each test is started, a starting completion message is sent to the M_S2, and the M_S2 collects messages and sends the messages to the M_S1 software;
(3) After all the test processes are started, M_S1 sends a start test command to M_S2;
(4) M_s2 sends a start test command to the associated test process.
Referring to fig. 6, a partial test unit test flow chart is shown, and only test units numbered 1, 4 and 9 are started, then the test processes corresponding to the three test units are started.
In one embodiment, the second-level node management process sequentially starts a test process corresponding to a unit to be tested based on an identifier of the unit to be tested, including:
the second-level node management process builds a shared memory area of the test process corresponding to the unit to be tested so as to start the test process corresponding to the unit to be tested, wherein the target test process is connected with the corresponding shared memory area.
In particular, to implement distributed process processing in a test method, the main difficulty is how to accurately manage a test process on a logic test board, and in order to accelerate data communication efficiency between a secondary node management process and the test process and increase data transmission speed, the invention adopts a mode of sharing a memory.
Before starting the test process, the initialization is needed, namely, the corresponding primary node management process and secondary node management process are started. As shown in fig. 7 in particular, after m_s1 and m_s2 are started, communication is established.
The flow of the initiation of a single test procedure is specifically described below with reference to fig. 8:
(1) M_s1 sends command 1 (a test progress command to start test unit n);
(2) M_S2 receives the command 1, and establishes a shared memory communication area of a test process of the test unit n;
(3) M_S2 starts the test program with the number n (the test program and the test unit are in one-to-one correspondence, and the numbers of the test unit and the test program are the same for convenience here);
(4) TestProcess (n) process start is completed;
(5) TestProcess (n) to the shared memory communication area;
(6) TestProcess (n) is connected with the test unit and starts the test unit;
in one embodiment, the primary node management process sends a test command to the secondary node management process based on the start-up completion message, and forwards the test command to a corresponding test process through the secondary node management process, so that the test process tests a corresponding test unit, including:
the primary node management process sends a test command to the secondary node management process based on the starting completion message, wherein the test command corresponds to the unit to be tested;
the second-level node management process writes the test command into a shared memory communication area corresponding to the unit to be tested;
and acquiring a test command in the shared memory communication area through the test process, and executing the test command, so that the unit to be tested runs a test flow corresponding to the test command, and test result data of the unit to be tested is obtained.
In one embodiment, when the unit to be tested is single, the primary node management process sends a test command to the secondary node management process based on the start-up completion message, and forwards the test command to the corresponding test process through the secondary node management process, so that the test process tests the corresponding test unit, including:
the primary node management process sends a test command to the secondary node management process corresponding to the unit to be tested based on the starting completion message;
and the second-level node management process transmits the test command to the test process corresponding to the unit to be tested, and tests the unit to be tested.
Specifically, a single test unit is tested during a test, corresponding to the initiation of a single test procedure.
In one embodiment, when the units to be tested are plural, the primary node management process sends a test command to the secondary node management process based on the start-up completion message, and forwards the test command to the corresponding test process through the secondary node management process, so that the test process tests the corresponding test unit, including:
the primary node management process respectively sends a test command to the secondary node management process corresponding to each unit to be tested based on the starting completion message;
and the secondary node management process forwards the test command to the test process corresponding to each unit to be tested, and performs parallel test on the units to be tested.
Specifically, the parallel test is performed on a plurality of test units during the test corresponding to the start of a plurality of test processes. The primary node management process respectively sends test commands to the secondary node management processes corresponding to each unit to be tested based on the starting completion message, and the units to be tested and the secondary node management processes are in a many-to-one relationship.
In one embodiment, after the obtaining the test result of the unit to be tested, the method further includes:
and the test process writes the test result data into the corresponding shared memory communication area.
Specifically, taking a single test process as an example, the operation of the test process is described with reference to fig. 9:
(1) M_S1 sends a command "test Command 2";
(2) M_S2 receives a test command 2, and writes the test command content into the shared memory communication area so as to update the information in the shared memory communication area;
(3) TestProcess (n) acquiring a test command 2 in the shared memory communication area (n);
(4) TestProcess (n) executing "test command 2", the test unit running a test flow;
(5) TestProcess (n) acquires the test RESULT "result_b" of "test unit n".
(6) TestProcess (n) the test results are written into the shared memory communication area (n).
In one embodiment, after the test process writes the test result data into the corresponding shared memory communication area, the method further includes:
the second-level node management process obtains test result data from the shared memory communication area corresponding to the test process;
the second-level node management process performs preliminary processing on the test result data to obtain first result data, wherein the first result data comprises the test progress;
the second-level node management process sends the first result data to the corresponding first-level node management process, and the first result data is classified and counted through the first-level node management process to obtain second result data.
Specifically, after the test process writes the test result into the shared memory communication area, the secondary node management process will read the test result data therefrom and perform preliminary processing, and then send to the primary node management process. The specific implementation process is as follows:
(7) M_S2 obtains test RESULT 'RESULT_B' and test RESULT data (test pass/fail, test interrupt, test log, etc.) and test flow or progress (test start, test end, test pause, test termination, etc.) from the shared memory communication area (n);
(8) M_S2 performs preliminary processing on the test RESULT "result_B" to obtain first RESULT data "result_B1", wherein the result_B1 comprises a test flow or progress, such as test start, test end, test pause, test termination, etc
(9) M_S1 receives the 'result_B1', and performs comprehensive processing to obtain second RESULT data. The second result data may include the number of test units that pass/fail the test, the number of test interruptions, a test log after correction processing, and the like.
When a plurality of test units need to be tested, the specific flow is similar to that of a single test unit, but different test processes and shared memory communication areas corresponding to the test processes are respectively constructed, so that different test units are not affected by each other, and the specific flow is shown in fig. 10.
Through distributed process management, the test method and system provided by the invention can realize the following purposes:
(1) Extreme environmental operational stability: the aging equipment where the test system is located needs to run stably for a long time under different extreme environments such as high temperature, low temperature and the like;
(2) High number of chip test requirements: the test chip processes a plurality of memories, up to hundreds of thousands of memories, at a time;
(3) Testing the differential processing capacity of the system: each tested unit in the aging test system has inconsistent performance, so that the running speed and running result of the chip are greatly different, and therefore, the test units need to be independently processed;
(4) And (3) large-scale data processing: the aging test system has huge test data and higher requirements on data processing performance;
(5) Equipment is rapidly upgraded: because the memory chip is updated more quickly, the test system can quickly support quick updating and reconstruction, and the development cost is reduced;
(6) Various types of chip test requirements: the usability of the system is increased, and the use value of the equipment is improved.
Since the method described in the third embodiment of the present invention is a method implemented by the distributed process processing system according to the first embodiment of the present invention, a specific implementation of the method can be known to those skilled in the art based on the test method implemented by the system described in the first embodiment of the present invention, and thus will not be described herein. The method implemented by the distributed process processing system in the first embodiment of the present invention belongs to the scope of protection of the present invention.
Example IV
Based on the same inventive concept, the present embodiment provides a semiconductor memory burn-in test system including:
the management logic board is provided with a primary node management module;
the test logic board is provided with a secondary node management module;
the process creation module is used for creating a primary node management process through the primary node management module and creating a secondary node management process through the secondary node management module;
the starting command sending module is used for sending a starting command to the secondary node management process by the primary node management process so that the secondary node management process starts the corresponding test process based on the starting command and returns a starting completion message, wherein each test process corresponds to one test unit;
the test command sending module is used for sending a test command to the secondary node management process based on the starting completion message by the primary node management process, and forwarding the test command to the corresponding test process through the secondary node management process so that the test process tests the corresponding test unit to obtain test result data.
Referring to fig. 11, a hardware module structure diagram of a test system provided by the present invention includes a management logic board and a test logic board.
The management logic board is responsible for managing the test logic boards to which the management logic board belongs, and one management logic board is connected with a plurality of test logic boards;
the test logic board is responsible for managing all the test units on the test logic board, and one test logic board and a plurality of test units are carried;
the test unit is connected with the test chip and performs test interaction on the tested chip.
Because different test chips can be realized by replacing the test logic board, only the test program which interacts with the chip in the test logic board is associated with hardware only in the whole test system, and therefore, the decoupling of the software module and the hardware module in the test system can be achieved. Therefore, the software modules in the test system can be abstract and independent, so that the complexity of the system can be reduced, the independence of the software system is maintained, the updating iteration speed of the test system is accelerated, and the research and development cost is reduced.
Since the system described in the fourth embodiment of the present invention is a system for implementing the method for testing semiconductor memory burn-in the third embodiment of the present invention, based on the method described in the first embodiment of the present invention, a person skilled in the art can understand the specific structure and the modification of the system, and therefore, the description thereof is omitted herein. All systems used in the method according to the first embodiment of the present invention are within the scope of the present invention.
Example five
Based on the same inventive concept, the present embodiment provides a distributed system including the distributed process processing system as described in the embodiment and the semiconductor memory burn-in test system in the third embodiment.
In general, the distributed process processing system, the semiconductor aging test method and system and the distributed system are characterized in that a test process is independently distributed for each test unit in the aging test system for testing, and the test units are managed by adopting a 2-level management architecture, so that the loose coupling design of software and hardware of the semiconductor aging test system can be realized, the complexity of the system is reduced, the stability and the robustness of the system are enhanced, the updating iteration speed of the system is accelerated, and the distributed process processing system and the semiconductor aging test system have the following advantages and beneficial technical effects:
1. distributed management ensures the stability and the robustness of the system and increases the capability of the system for resisting severe environments;
2. the accurate test can be performed on each test unit, and different test processes of each test unit can be controlled;
3. the requirement of simultaneous testing of multiple versions of chips is supported, the usability of the system is improved, and the use value of equipment is improved;
4. the decoupling design of the test system software and the test hardware reduces the complexity of the system and accelerates the update iteration speed of the system;
5. a 2-level management strategy is adopted, so that the processing capacity and the processing speed of the system on test data are improved;
6. by adopting the multi-process test program, the method for testing all test units by adopting a single process and requiring the management of threads of all test units by adopting the single process in the prior art has the advantages that one test process is adopted to test one test unit, and only one test process is required to manage threads of the single test unit, so that the processing complexity of excessive threads is avoided, the development difficulty of the test program is reduced, and the development of the test program is accelerated.
It will be appreciated by those skilled in the art that embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. It is therefore intended that the following claims be interpreted as including the preferred embodiments and all such alterations and modifications as fall within the scope of the invention.
It will be apparent to those skilled in the art that various modifications and variations can be made to the embodiments of the present invention without departing from the spirit or scope of the embodiments of the invention. Thus, if such modifications and variations of the embodiments of the present invention fall within the scope of the claims and the equivalents thereof, the present invention is also intended to include such modifications and variations.
Claims (8)
1. A test method based on a distributed process processing system, which is applied to a semiconductor memory burn-in test system, wherein the semiconductor memory burn-in test system comprises a management logic board and a test logic board, and the distributed process processing system comprises:
the first-level node management module is used for managing the first-level nodes and storing the corresponding relation between the first-level nodes and the second-level nodes, wherein the management logic board is used as the first-level nodes, the test logic board is used as the second-level nodes, each second-level node comprises a plurality of test units, and the first-level nodes and the second-level nodes can be associated through the corresponding relation between the first-level nodes and the second-level nodes;
the system comprises a plurality of secondary node management modules, a plurality of test units and a plurality of test unit management modules, wherein the plurality of secondary node management modules are used for managing corresponding secondary nodes and test processes corresponding to the secondary nodes, and storing the corresponding relation between the secondary nodes and the test processes, each test process corresponds to one test unit, and the test processes are used for running test cases of the test units according to the corresponding relation between the primary nodes and the secondary nodes and the corresponding relation between the secondary nodes and the test processes;
the test method comprises the following steps:
creating a primary node management process through a primary node management module, and creating a secondary node management process through a secondary node management module;
the primary node management process sends a starting command to the secondary node management process, so that the secondary node management process starts a corresponding test process based on the starting command and returns a starting completion message;
the primary node management process sends a test command to the secondary node management process based on the starting completion message, and the secondary node management process forwards the test command to the corresponding test process so that the test process tests the corresponding test unit to obtain test result data.
2. The method of claim 1, wherein the primary node management process sends a start command to the secondary node management process to cause the secondary node management process to start a corresponding test process based on the start command and return a start complete message, comprising:
the primary node management process sends a starting command to the secondary node management process, wherein the starting command carries the identification of the unit to be tested;
the secondary node management process sequentially starts the test process corresponding to the unit to be tested based on the identification of the unit to be tested, and when one test process is started, a starting completion message is sent to the secondary node management process;
the secondary node management process collects all the starting completion messages and sends the starting completion messages to the primary node management process.
3. The method of claim 2, wherein the secondary node management process sequentially starts a test process corresponding to the unit to be tested based on the identification of the unit to be tested, comprising:
the second-level node management process builds a shared memory area of the test process corresponding to the unit to be tested so as to start the test process corresponding to the unit to be tested, wherein the target test process is connected with the corresponding shared memory area.
4. The method of claim 1, wherein the primary node management process sends the test command to the secondary node management process based on the start-up completion message and forwards the test command to the corresponding test process through the secondary node management process to cause the test process to test the corresponding test unit, comprising:
the primary node management process sends a test command to the secondary node management process based on the starting completion message, wherein the test command corresponds to the unit to be tested;
the second-level node management process writes the test command into a shared memory communication area corresponding to the unit to be tested, wherein the shared memory communication area is constructed by the second-level node management process when the test process is started;
and acquiring a test command in the shared memory communication area through the test process, and executing the test command, so that the unit to be tested runs a test flow corresponding to the test command, and test result data of the unit to be tested is obtained.
5. The method of claim 2, wherein the start command is used to start a preset one or more test processes.
6. The method of claim 2, wherein when the units to be tested are plural, the primary node management process sends the test command to the secondary node management process based on the start-up completion message, and forwards the test command to the corresponding test process through the secondary node management process, so that the test process tests the corresponding test unit, comprising:
the primary node management process respectively sends a test command to the secondary node management process corresponding to each unit to be tested based on the starting completion message;
and the secondary node management process forwards the test command to the test process corresponding to each unit to be tested, and performs parallel test on the units to be tested.
7. A test system based on a distributed process processing system, the distributed process processing system comprising:
the first-level node management module is used for managing the first-level nodes and storing the corresponding relation between the first-level nodes and the second-level nodes, wherein the management logic board is used as the first-level nodes, the test logic board is used as the second-level nodes, each second-level node comprises a plurality of test units, and the first-level nodes and the second-level nodes can be associated through the corresponding relation between the first-level nodes and the second-level nodes;
the system comprises a plurality of secondary node management modules, a plurality of test units and a plurality of test unit management modules, wherein the plurality of secondary node management modules are used for managing corresponding secondary nodes and test processes corresponding to the secondary nodes, and storing the corresponding relation between the secondary nodes and the test processes, each test process corresponds to one test unit, and the test processes are used for running test cases of the test units according to the corresponding relation between the primary nodes and the secondary nodes and the corresponding relation between the secondary nodes and the test processes;
the test system based on the distributed process processing system is a semiconductor memory aging test system, and the test system based on the distributed process processing system comprises:
the management logic board is provided with a primary node management module;
the test logic board is provided with a secondary node management module;
the process creation module is used for creating a primary node management process through the primary node management module and creating a secondary node management process through the secondary node management module;
the starting command sending module is used for sending a starting command to the secondary node management process by the primary node management process so that the secondary node management process starts a corresponding test process based on the starting command and returns a starting completion message;
the test command sending module is used for sending a test command to the secondary node management process based on the starting completion message by the primary node management process, and forwarding the test command to the corresponding test process through the secondary node management process so that the test process tests the corresponding test unit to obtain test result data.
8. A distributed system comprising the distributed process processing system of claim 1 and the distributed process processing system-based test system of claim 7.
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