CN116449130A - Acceleration test method and device, electronic equipment and storage medium - Google Patents
Acceleration test method and device, electronic equipment and storage medium Download PDFInfo
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Abstract
The embodiment of the invention provides an acceleration test method, an acceleration test device, electronic equipment and a storage medium, wherein the method calculates sub-acceleration coefficients corresponding to each sub-time period according to temperature data of each sub-time period in a prediction history time period of a reference test region, preset acceleration test conditions and a preset test acceleration model, and can simulate real aging data of the equipment in each sub-time period under the reference test region; according to the sub acceleration coefficient corresponding to each sub time period, calculating a corresponding test acceleration coefficient in a preset time period, so that the test acceleration coefficient is more accurate; therefore, based on the test acceleration coefficient and the preset use cycle times, the obtained test cycle times are calculated, and the equipment to be tested is subjected to accelerated test according to the test cycle times, so that the test result can more accurately predict the actual use result of the equipment to be tested in the reference test area, and the accuracy of the test result of the accelerated test is improved.
Description
Technical Field
The present invention relates to the field of accelerated testing technologies for devices, and in particular, to an accelerated testing method and apparatus, an electronic device, and a storage medium.
Background
In the existing accelerated aging test, after the equivalent ambient temperature is calculated, the accelerated aging test is performed by setting an environment with the equivalent ambient temperature, namely the equipment aging condition under the constant temperature is simulated by the existing accelerated aging test. However, in the actual use process of the equipment, the external environment is variable in temperature, so that in the existing accelerated aging test, larger deviation exists in the calculation of the acceleration coefficient, and the accelerated aging test result is inaccurate.
Therefore, how to solve the problem that the accuracy of the test result in the existing accelerated aging test is low becomes a technical problem to be solved urgently.
Disclosure of Invention
The embodiment of the invention provides an acceleration test method, an acceleration test device, electronic equipment and a storage medium, and aims to improve the accuracy of test results in an equipment acceleration aging test.
In a first aspect, an embodiment of the present invention provides an acceleration test method, where the acceleration test method includes:
acquiring temperature data of a reference test area in a preset historical time period; the preset history time period comprises a plurality of sub-time periods;
calculating a sub-acceleration coefficient corresponding to each sub-time period based on a preset acceleration test condition, a preset test acceleration model and temperature data corresponding to each sub-time period;
calculating a test acceleration coefficient corresponding to the preset historical time period based on the sub acceleration coefficient corresponding to each sub time period;
calculating the number of test cycles based on the preset number of use cycles and the test acceleration coefficient;
and in an environment corresponding to the preset acceleration test condition, carrying out acceleration test on the equipment to be tested based on the test cycle times so as to obtain a test result.
In a second aspect, an embodiment of the present invention further provides a testing device, where the testing device includes:
the temperature data acquisition module is used for acquiring temperature data of the reference test area in a preset historical time period; the preset history time period comprises a plurality of sub-time periods;
the sub acceleration coefficient calculation module is used for calculating a sub acceleration coefficient corresponding to each sub time period based on a preset acceleration test condition, a preset test acceleration model and temperature data corresponding to each sub time period;
the test acceleration coefficient calculation module is used for calculating the test acceleration coefficient corresponding to the preset historical time period based on the sub acceleration coefficient corresponding to each sub time period;
the test cycle number calculation module is used for calculating the test cycle number based on the preset use cycle number and the test acceleration coefficient;
and the test adding module is used for carrying out accelerated test on the equipment to be tested based on the test cycle times in the environment corresponding to the preset accelerated test conditions so as to obtain a test result.
In a third aspect, an embodiment of the present invention further provides an electronic device, where the electronic device includes a processor, a memory, and a computer program stored on the memory and executable by the processor, where the computer program when executed by the processor implements the test method as described above.
In a fourth aspect, an embodiment of the present invention further provides a computer readable storage medium, where the computer readable storage medium stores a computer program, where the computer program when executed by a processor causes the processor to implement the steps of the test method as described above.
The embodiment of the invention provides an acceleration test method, an acceleration test device, electronic equipment and a storage medium, wherein the acceleration test method comprises the steps of acquiring temperature data of a reference test area in a preset historical time period; the preset history time period comprises a plurality of sub-time periods; calculating a sub-acceleration coefficient corresponding to each sub-time period based on a preset acceleration test condition, a preset test acceleration model and temperature data corresponding to each sub-time period; calculating a test acceleration coefficient corresponding to the preset historical time period based on the sub acceleration coefficient corresponding to each sub time period; calculating the number of test cycles based on the preset number of use cycles and the test acceleration coefficient; and in an environment corresponding to the preset acceleration test condition, carrying out acceleration test on the equipment to be tested based on the test cycle times so as to obtain a test result.
According to the method, the sub-acceleration coefficient corresponding to each sub-time period is calculated according to the temperature data of each sub-time period in the prediction history time period of the reference test area, the preset acceleration test condition and the preset test acceleration model, and the real aging data of the equipment in each sub-time period in the reference test area can be simulated; according to the sub acceleration coefficient corresponding to each sub time period, calculating a corresponding test acceleration coefficient in a preset time period, so that the test acceleration coefficient is more accurate; therefore, based on the test acceleration coefficient and the preset use cycle times, the obtained test cycle times are calculated, and the equipment to be tested is subjected to accelerated test according to the test cycle times, so that the test result can more accurately predict the actual use result of the equipment to be tested in the reference test area, and the accuracy of the test result of the accelerated test is improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present application, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic flow chart of a first embodiment of an acceleration test method according to an embodiment of the present application;
FIG. 2 is a schematic flow chart of a second embodiment of an acceleration test method according to an embodiment of the present application;
FIG. 3 is a schematic structural view of a testing device provided in the present application;
fig. 4 is a schematic block diagram of an electronic device according to an embodiment of the present application.
The realization, functional characteristics and advantages of the present application will be further described with reference to the embodiments, referring to the attached drawings.
Detailed Description
The following description of the embodiments of the present application will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are some, but not all, of the embodiments of the present application. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure.
The flow diagrams depicted in the figures are merely illustrative and not necessarily all of the elements and operations/steps are included or performed in the order described. For example, some operations/steps may be further divided, combined, or partially combined, so that the order of actual execution may be changed according to actual situations.
Some embodiments of the present application are described in detail below with reference to the accompanying drawings. The following embodiments and features of the embodiments may be combined with each other without conflict.
The embodiment of the application provides an acceleration test method, an acceleration test device, electronic equipment and a storage medium. According to the temperature data of the reference test area in a plurality of sub-time periods within a preset historical time period, calculating sub-acceleration coefficients corresponding to each sub-time period, and calculating test acceleration coefficients corresponding to the preset historical time period according to each sub-acceleration coefficient, so that the test acceleration coefficients are more accurate, the acceleration test result of the equipment is more similar to the actual use condition of the equipment in the reference test area, and the test result accuracy of the acceleration test is improved.
Referring to fig. 1, fig. 1 is a flowchart of a first embodiment of an acceleration test method according to an embodiment of the present application. The method can be applied to an electronic device.
As shown in fig. 1, the acceleration test method includes steps S101 to S105.
Step S101, acquiring temperature data of a reference test area in a preset historical time period; the preset history time period comprises a plurality of sub-time periods;
in this embodiment, according to the scheme of the present application, the acceleration coefficient of the accelerated aging test is calculated according to the actual environmental temperature of the reference test area, so as to calculate the number of test cycles, so that the historical environmental temperature data of the test area needs to be acquired first.
By way of example, the reference test area may be an area where the device under test may be used, such as a city area or a mountain area, etc.; or a region of a special environment, such as a highland region, a desert region or an ocean region. For example, assuming that the device to be tested may be sold to a certain area, the area may be used as a reference test area, and temperature data of a preset historical period of the area may be acquired for accelerated aging test.
In an embodiment, each of the sub-periods of the preset history period is uniformly set.
In an embodiment, the sub-periods are uniformly arranged within the preset history period, and each sub-period can be considered as a cycle period.
For example, the preset historical time period may be a historical one year time, and the sub-time period may be each day of the historical one year time, i.e., each twenty-four hours is a sub-time period.
The temperature data may be, for example, time-by-time temperature data over a preset historical period of time, i.e., ambient temperature for each hour over a historical year.
Step S102, calculating sub-acceleration coefficients corresponding to the sub-time periods based on preset acceleration test conditions, a preset test acceleration model and temperature data corresponding to the sub-time periods;
in an embodiment, according to preset acceleration test conditions and temperature data corresponding to each sub-time period, calculating an acceleration coefficient of each sub-time period through a predictive test acceleration model to obtain a sub-acceleration coefficient corresponding to each sub-time period.
For example, the preset accelerated test conditions may include a test temperature, a test time, and the like.
In an embodiment, the preset test acceleration model may be a component temperature cycle test acceleration model or a solder joint temperature cycle test acceleration model.
The component temperature cycle test acceleration model is used for carrying out acceleration test on the whole machine/component of the equipment to be tested, and the welding spot temperature cycle test acceleration model is used for carrying out acceleration test on welding spots or bonding wires of active components in the equipment to be tested.
The component temperature cycle test acceleration model can be a Kefen-Manson (Coffin-Manson) acceleration model, and is mainly used for carrying out acceleration test on the whole machine/components, wherein the Coffin-Manson acceleration model is an inverse power law relation model, and the service life of the components is inversely proportional to the power of the environmental temperature stress.
The mathematical expression of the Coffin-Manson acceleration model is as follows:
wherein AF is an acceleration coefficient, deltaTt is a temperature difference in an acceleration test, deltaT o Is the highest temperature and lowest temperature difference within each sub-time period.
The solder joint temperature cycle test acceleration model can be a NORRIS-LANZBERG acceleration model, and is mainly used for carrying out acceleration test on solder joints/bonding wires of components, and the NORRIS-LANZBERG acceleration model is suitable for analyzing fatigue failure of the solder joints caused by temperature cycle action in the repeated switching process of the components.
The mathematical expression of the NORRIS-LANZBERG acceleration model is as follows:
wherein t is t /t o Is a duty cycle ratio, which can be defined as 1/12, i.e. test time t t Is 1 hour, the actual service time t o Is 12 hours; t (T) max，O The device is a Cal Wen Wendu with the highest junction temperature in actual use; t (T) max，t Cal Wen Wendu which is the highest junction temperature during component testing。
Step S103, calculating a test acceleration coefficient corresponding to the preset historical time period based on the sub acceleration coefficient corresponding to each sub time period;
in an embodiment, the calculating the test acceleration coefficient corresponding to the preset historical time period based on the sub acceleration coefficient corresponding to each sub time period may include: and calculating the harmonic mean of each sub acceleration coefficient to obtain the test acceleration coefficient corresponding to the preset historical time period.
It is understood that the harmonic mean, also known as the reciprocal mean, is the reciprocal of the arithmetic mean of the reciprocal of the overall statistical variables. The harmonic mean is one of the averages. But the statistical harmonic mean, unlike the mathematical mean, is the inverse of the arithmetic mean of the inverse of the variable. Since it is calculated from the reciprocal of the variable, it is also called reciprocal average.
Wherein, the formula of the harmonic mean is as follows:
wherein n may represent the number of sub-periods, x, when the test acceleration coefficient is calculated using the formula of the harmonic mean i And indicating the sub acceleration coefficient corresponding to the ith sub time period, and H indicates the test acceleration coefficient.
Step S104, calculating the test cycle times based on the preset use cycle times and the test acceleration coefficient;
in an embodiment, the calculating the number of test cycles based on the preset number of use cycles and the test acceleration coefficient includes: dividing the number of use cycles by the test acceleration factor to obtain the number of test cycles.
In an embodiment, the preset usage cycle number may be calculated according to the total aging period, and the cycle number in the actual usage process of the device is calculated according to the single cycle period and the total aging period of the device, where the usage cycle number divided by the test acceleration coefficient is the test cycle number of the acceleration test.
Wherein the total time length L of aging is as required o And testing the acceleration coefficient AF, and calculating the total cycle times of the aging test, wherein the calculation formula is as follows:
Test＝L o /AF
wherein Test is the total cycle number of the acceleration Test, L o For the total aging time, AF is the test acceleration factor.
For example, if the aging period is 10 years, and the temperature data of each day is taken as the basis for calculating the acceleration coefficient in the present application, each day may be taken as a cycle period, that is, cycle once a day and cycle 365 times a year, the number of test cycles needed for performing the additive aging test is:
test= (10 years 365 cycles/year)/Test acceleration factor
The Test is the Test cycle number, and the preset use cycle number is 365 cycles/year in 10 years.
Step S105, in an environment corresponding to the preset acceleration test condition, performing acceleration test on the device to be tested based on the test cycle number, so as to obtain a test result.
It is understood that the accelerated life test is to excite the product to generate the same failure as the long-term use under normal stress level in a short time by increasing test stress (such as thermal stress, electric stress, mechanical stress, etc.), shorten the test period without changing the failure distribution of the tested sample, and then evaluate the reliability or life characteristics of the product under normal working stress by using an accelerated life model.
In an embodiment, corresponding preset acceleration test conditions are set for different test objects, and the equipment to be tested is placed in an environment corresponding to the preset acceleration test conditions to perform acceleration cycle test until the acceleration test of the test cycle times is completed, so as to obtain a test result of the acceleration test.
The embodiment of the invention provides an acceleration test method, which calculates sub-acceleration coefficients corresponding to each sub-time period according to temperature data of each sub-time period in a prediction history time period of a reference test area, preset acceleration test conditions and a preset test acceleration model, and can simulate real aging data of equipment in each sub-time period in the reference test area; according to the sub acceleration coefficient corresponding to each sub time period, calculating a corresponding test acceleration coefficient in a preset time period, so that the test acceleration coefficient is more accurate; therefore, based on the test acceleration coefficient and the preset use cycle times, the obtained test cycle times are calculated, and the equipment to be tested is subjected to accelerated test according to the test cycle times, so that the test result can more accurately predict the actual use result of the equipment to be tested in the reference test area, and the accuracy of the test result of the accelerated test is improved.
Referring to fig. 2, fig. 2 is a flowchart of a second embodiment of an acceleration test method according to an embodiment of the present application.
As shown in fig. 2, in this embodiment, based on the embodiment shown in fig. 1, the step S102 specifically includes:
step S201, determining a test temperature difference based on the preset acceleration test condition;
in one embodiment, different acceleration test conditions are required for different test subjects when performing the acceleration test.
For example, for the whole equipment, the accelerated test conditions can be set to be-25-75 ℃, the residence time of the high-low temperature test is 1 hour each, and the test temperature difference is 100 ℃.
For example, for component solder joints/bond joints, accelerated test conditions may be set to run at a height of Wen Manzai, -25-75 ℃. But the temperature of the active component rises by 21.42 ℃ during normal operation, so that the highest junction temperature of the component is 96.42 ℃ under the test high temperature condition (75 ℃).
Step S202, calculating according to the temperature data corresponding to each sub-time period, and determining the maximum temperature difference data corresponding to each sub-time period;
in one embodiment, the maximum temperature and the minimum temperature of each sub-period are determined according to the temperature data of each sub-period, and the maximum temperature difference data in each sub-period is calculated.
In an embodiment, the calculating according to the temperature data corresponding to each sub-time period, determining the maximum temperature difference data corresponding to each sub-time period includes: determining the highest environmental temperature and the lowest environmental temperature in the sub-time period based on the temperature data corresponding to the sub-time period; and calculating the maximum temperature difference data corresponding to the sub-time period based on the highest environmental temperature and the lowest environmental temperature.
In an embodiment, the preset test acceleration model calculates the acceleration coefficient of each sub-time period according to the maximum temperature difference data corresponding to each sub-time period, namely, the temperature stress of each test period corresponding to each sub-time period in the fitting test environment, so that the test condition simulated according to the acceleration coefficient corresponding to each sub-time period is closer to the use condition in the actual use environment, and the acceleration test result is more accurate.
Step 203, calculating sub-acceleration coefficients corresponding to the sub-time periods respectively based on the preset test acceleration model, the test temperature difference and the maximum temperature difference data corresponding to the sub-time periods.
In an embodiment, for different test objects, the acceleration coefficient is calculated through different preset test acceleration models, a Coffin-Manson acceleration model can be adopted for the acceleration test of the whole device, and a NORRIS-LANZBERG acceleration model can be adopted for the welding points/bonding wires of the device.
For the accelerated test of the whole machine component, the accelerated test condition is-25-75 ℃, and the residence time of the high-temperature test and the low-temperature test is 1 hour respectively. Assuming a service life of 10 years for the equipment to be tested, the time-by-time temperature data in table 1 below is taken as an example:
table 1: first time-by-time temperature data table of reference test area
For example, acceleration simulation is performed on the whole device by using a Coffin-Manson acceleration model, taking an acceleration coefficient of the first day as an example:
AF1＝[100/35.2]^2.65＝15.9013
similarly, after calculating the daily acceleration coefficient, the harmonic mean of the daily acceleration coefficient may be calculated, resulting in the total acceleration coefficient being af= 11.4038.
Then, since the total aging period is 10 years, and the cycle is 1 time per day, the total number of cycles required for the acceleration test is:
test= (10 years x 365 cycles/year)/11.4038 =320 cycles
Namely, when the accelerated life test is performed, the test is performed for 320 times of temperature cycles in a non-working mode under the test condition of the cycle temperature of minus 25 ℃ to 75 ℃.
For the accelerated test of the welding spots/bonding wires of the components, the accelerated test condition is that the temperature of the active components rises by 21.42 ℃ and is Wen Manzai in operation at the height of-25 ℃ to 75 ℃ in normal operation. The highest junction temperature of the components under high temperature conditions (75 ℃) was tested at 96.42 ℃ (depending on thermal strategy). t is t t And t o The ratio is defined as 1 according to the test frequency and the product operating mode frequency: 4, test time t t Is 6 hours, the actual service time t o Is 24 hours.
Assuming a service life of 10 years for the equipment to be tested, the time-by-time temperature data in table 2 below is taken as an example:
table 2: second time-by-time temperature data table of reference test area
For example, acceleration simulation was performed on active component bond pad (bonding) applications using the NORRIS LANZBERG acceleration model, taking the acceleration coefficient of the first day as an example: AF 1= (121.42/49.66)/(2.65) (1/4)/(0.136) e (2185) (1/(63.1+273.15) -1/(75+21.42+273).
15)))＝15.90
Similarly, after calculating the acceleration coefficient for each day, the harmonic mean of the acceleration coefficients for each day may be calculated, resulting in a total acceleration coefficient of af=11.17.
Then, since the total aging period is 10 years, the total number of cycles required to be tested is:
test= (10 years x 365 cycles/year)/11.17=327
When the accelerated life test is performed, the high Wen Manzai operation is required under the test condition of the circulation temperature of minus 25 ℃ to 75 ℃ and the accelerated test is required to be performed 327 times of temperature circulation.
According to the acceleration test method provided by the embodiment of the application, the acceleration factor of the acceleration experiment model is calculated based on the real environment temperature, so that the accuracy of equipment service life calculation can be improved, and the accuracy of an acceleration test result can be improved.
Referring to fig. 3, fig. 3 is a schematic structural diagram of a testing device provided in the present application, where the testing device is used for executing the foregoing accelerated testing method. The testing device can be configured in a server.
As shown in fig. 3, the test apparatus 300 includes: a temperature data acquisition module 301, a sub acceleration coefficient calculation module 302, a test acceleration coefficient calculation module 303, a test cycle number calculation module 304, and an add test module 305.
A temperature data acquisition module 301, configured to acquire temperature data of a reference test area in a preset historical time period; the preset history time period comprises a plurality of sub-time periods;
the sub acceleration coefficient calculating module 302 is configured to calculate a sub acceleration coefficient corresponding to each sub time period based on a preset acceleration test condition, a preset test acceleration model, and temperature data corresponding to each sub time period;
a test acceleration coefficient calculation module 303, configured to calculate a test acceleration coefficient corresponding to the preset historical time period based on a sub acceleration coefficient corresponding to each sub time period;
the test cycle number calculation module 304 is configured to calculate a test cycle number based on a preset usage cycle number and the test acceleration coefficient;
and the test adding module 305 is configured to perform an accelerated test on the device to be tested based on the test cycle number in an environment corresponding to the preset accelerated test condition, so as to obtain a test result.
In one embodiment, the sub acceleration coefficient calculating module 302 is further configured to determine a test temperature difference based on the preset acceleration test condition; calculating according to the temperature data corresponding to each sub-time period, and determining the maximum temperature difference data corresponding to each sub-time period; and respectively calculating sub-acceleration coefficients corresponding to the sub-time periods based on the preset test acceleration model, the test temperature difference and the maximum temperature difference data corresponding to the sub-time periods.
In one embodiment, the sub acceleration coefficient calculating module 302 is further configured to determine a highest ambient temperature and a lowest ambient temperature in the sub time period based on the temperature data corresponding to the sub time period; and calculating the maximum temperature difference data corresponding to the sub-time period based on the highest environmental temperature and the lowest environmental temperature.
In one embodiment, the test acceleration coefficient calculating module 303 is further configured to calculate a harmonic mean of each of the sub acceleration coefficients to obtain a test acceleration coefficient corresponding to the preset historical time period.
In one embodiment, the preset test acceleration model is a component temperature cycle test acceleration model or a solder joint temperature cycle test acceleration model.
In one embodiment, the test cycle number calculation module 304 is further configured to divide the usage cycle number by the test acceleration factor to obtain the test cycle number.
In one embodiment, each of the sub-periods of the preset history period is uniformly set.
It should be noted that, for convenience and brevity of description, the specific working process of the above-described apparatus and each module may refer to the corresponding process in the foregoing embodiment of the acceleration test method, which is not described herein again.
The apparatus provided by the above embodiments may be implemented in the form of a computer program that is executable on an electronic device as shown in fig. 4.
Referring to fig. 4, fig. 4 is a schematic block diagram of an electronic device according to an embodiment of the present application.
Referring to fig. 4, the electronic device includes a processor 401, a memory 402, and a network interface 403 connected by a data bus, wherein the memory 402 may include a nonvolatile storage medium and an internal memory.
The non-volatile storage medium may store an operating system and a computer program. The computer program comprises program instructions that, when executed, cause the processor 401 to perform any of a number of acceleration test methods.
The processor 401 is used to provide computing and control capabilities to support the operation of the overall electronic device.
The internal memory provides an environment for the execution of a computer program in a non-volatile storage medium that, when executed by the processor 401, causes the processor 401 to perform any one of the accelerated test methods.
The network interface 403 is used for network communication such as transmitting assigned tasks and the like. It will be appreciated by those skilled in the art that the structure shown in fig. 4 is merely a block diagram of a portion of the structure associated with the present application and is not limiting of the electronic device to which the present application is applied, and that a particular electronic device may include more or fewer components than shown, or may combine certain components, or have a different arrangement of components.
It should be appreciated that the processor 401 may be a central processing unit (Central Processing Unit, CPU), and the processor 401 may also be other general purpose processors, digital signal processors (Digital Signal Processor, DSP), application specific integrated circuits (Application Specific Integrated Circuit, ASIC), field programmable gate arrays (Field-Programmable Gate Array, FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or the like. Wherein the general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
Wherein in one embodiment, the processor 401 is configured to execute a computer program stored in a memory, so as to implement the following steps:
acquiring temperature data of a reference test area in a preset historical time period; the preset history time period comprises a plurality of sub-time periods;
acquiring temperature data of a reference test area in a preset historical time period; the preset history time period comprises a plurality of sub-time periods;
calculating a sub-acceleration coefficient corresponding to each sub-time period based on a preset acceleration test condition, a preset test acceleration model and temperature data corresponding to each sub-time period;
calculating a test acceleration coefficient corresponding to the preset historical time period based on the sub acceleration coefficient corresponding to each sub time period;
calculating the number of test cycles based on the preset number of use cycles and the test acceleration coefficient;
and in an environment corresponding to the preset acceleration test condition, carrying out acceleration test on the equipment to be tested based on the test cycle times so as to obtain a test result.
In an embodiment, when implementing the temperature data corresponding to each of the sub-time periods based on the preset acceleration test condition, the preset test acceleration model, and the preset acceleration test model, the processor 401 is configured to implement:
determining a test temperature difference based on the preset acceleration test conditions;
calculating according to the temperature data corresponding to each sub-time period, and determining the maximum temperature difference data corresponding to each sub-time period;
and respectively calculating sub-acceleration coefficients corresponding to the sub-time periods based on the preset test acceleration model, the test temperature difference and the maximum temperature difference data corresponding to the sub-time periods.
In an embodiment, when the processor 401 performs the calculation according to the temperature data corresponding to each sub-period, it determines the maximum temperature difference data corresponding to each sub-period, the processor is configured to perform:
determining the highest environmental temperature and the lowest environmental temperature in the sub-time period based on the temperature data corresponding to the sub-time period;
and calculating the maximum temperature difference data corresponding to the sub-time period based on the highest environmental temperature and the lowest environmental temperature.
In an embodiment, when implementing the sub acceleration coefficient corresponding to each sub time period, the processor 401 is configured to implement:
and calculating the harmonic mean of each sub acceleration coefficient to obtain the test acceleration coefficient corresponding to the preset historical time period.
In an embodiment, the preset test acceleration model is a component temperature cycle test acceleration model or a solder joint temperature cycle test acceleration model.
In one embodiment, when implementing the calculation of the number of test cycles based on the preset number of use cycles and the test acceleration coefficient, the processor 401 is configured to implement:
dividing the number of use cycles by the test acceleration factor to obtain the number of test cycles.
In an embodiment, each of the sub-periods of the preset history period is uniformly set.
The embodiment of the application also provides a computer readable storage medium, wherein the computer readable storage medium stores a computer program, the computer program comprises program instructions, and the processor executes the program instructions to realize any acceleration test method provided by the embodiment of the application.
The computer readable storage medium may be an internal storage unit of the electronic device according to the foregoing embodiment, for example, a hard disk or a memory of the electronic device. The computer readable storage medium may also be an external storage device of the electronic device, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card) or the like, which are provided on the electronic device.
While the invention has been described with reference to certain preferred embodiments, it will be understood by those skilled in the art that various changes and substitutions of equivalents may be made and equivalents will be apparent to those skilled in the art without departing from the scope of the invention. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. A method of testing, comprising:
acquiring temperature data of a reference test area in a preset historical time period; the preset history time period comprises a plurality of sub-time periods;
calculating a sub-acceleration coefficient corresponding to each sub-time period based on a preset acceleration test condition, a preset test acceleration model and temperature data corresponding to each sub-time period;
calculating a test acceleration coefficient corresponding to the preset historical time period based on the sub acceleration coefficient corresponding to each sub time period;
calculating the number of test cycles based on the preset number of use cycles and the test acceleration coefficient;
and in an environment corresponding to the preset acceleration test condition, carrying out acceleration test on the equipment to be tested based on the test cycle times so as to obtain a test result.
2. The test method according to claim 1, wherein the calculating the sub acceleration coefficient corresponding to each sub time period based on the preset acceleration test condition, the preset test acceleration model, and the temperature data corresponding to each sub time period includes:
determining a test temperature difference based on the preset acceleration test conditions;
calculating according to the temperature data corresponding to each sub-time period, and determining the maximum temperature difference data corresponding to each sub-time period;
and respectively calculating sub-acceleration coefficients corresponding to the sub-time periods based on the preset test acceleration model, the test temperature difference and the maximum temperature difference data corresponding to the sub-time periods.
3. The method according to claim 2, wherein the calculating according to the temperature data corresponding to each of the sub-time periods, determining the maximum temperature difference data corresponding to each of the sub-time periods, includes:
determining the highest environmental temperature and the lowest environmental temperature in the sub-time period based on the temperature data corresponding to the sub-time period;
and calculating the maximum temperature difference data corresponding to the sub-time period based on the highest environmental temperature and the lowest environmental temperature.
4. The method according to claim 1, wherein calculating the test acceleration coefficient corresponding to the preset historical period based on the sub acceleration coefficient corresponding to each sub period comprises:
and calculating the harmonic mean of each sub acceleration coefficient to obtain the test acceleration coefficient corresponding to the preset historical time period.
5. The test method according to claim 1, wherein,
the preset test acceleration model is a component temperature cycle test acceleration model or a welding spot temperature cycle test acceleration model.
6. The test method according to claim 1, wherein the calculating the number of test cycles based on the preset number of use cycles and the test acceleration coefficient includes:
dividing the number of use cycles by the test acceleration factor to obtain the number of test cycles.
7. The test method of claim 1, wherein each of the sub-periods of the preset history period is uniformly set.
8. A test device, comprising:
the temperature data acquisition module is used for acquiring temperature data of the reference test area in a preset historical time period; the preset history time period comprises a plurality of sub-time periods;
the sub acceleration coefficient calculation module is used for calculating a sub acceleration coefficient corresponding to each sub time period based on a preset acceleration test condition, a preset test acceleration model and temperature data corresponding to each sub time period;
the test acceleration coefficient calculation module is used for calculating the test acceleration coefficient corresponding to the preset historical time period based on the sub acceleration coefficient corresponding to each sub time period;
the test cycle number calculation module is used for calculating the test cycle number based on the preset use cycle number and the test acceleration coefficient;
and the test adding module is used for carrying out accelerated test on the equipment to be tested based on the test cycle times in the environment corresponding to the preset accelerated test conditions so as to obtain a test result.
9. An electronic device comprising a processor, a memory and a computer program stored on the memory and executable by the processor, wherein the computer program when executed by the processor implements the test method of any one of claims 1 to 7.
10. A computer readable storage medium, characterized in that it stores a computer program which, when executed by a processor, causes the processor to implement the steps of the test method according to any one of claims 1 to 7.
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