CN111274687B - Component failure rate prediction method and device, computer equipment and storage medium - Google Patents
Component failure rate prediction method and device, computer equipment and storage medium Download PDFInfo
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Abstract
The application relates to a component failure rate prediction method, a device, computer equipment and a storage medium. The component failure rate prediction method introduces the influence coefficients, the quality coefficients and the continuous working time duty ratios on the basis of a traditional failure rate prediction model, so that the component failure rate prediction model is built. According to the component failure rate prediction method provided by the embodiment of the application, the traditional component failure rate prediction model is split into finer prediction steps according to the induced stress type, so that the failure rate of the component group to be tested is more in line with the actual use condition of the component group to be tested. The technical problem that the traditional mathematical statistics prediction model failure rate and the actual failure rate have larger prediction deviation is solved, and the technical effect of reducing the prediction deviation of the prediction failure rate and the actual failure rate is achieved.
Description
Technical Field
The present application relates to the field of component reliability prediction technologies, and in particular, to a component failure rate prediction method, a device, a computer apparatus, and a storage medium.
Background
Reliability prediction is one of main work items of component reliability design, and the reliability prediction has important supporting functions on predicting the reliability level of components, positioning weak links, carrying out reliability tests and the like. The basis for reliability prediction implementation is to build a component failure rate prediction model, which is typically provided by various prediction standards, manuals, and the like.
The conventional mathematical statistics prediction model is adopted in the prior art, and the failure rate of components in the conventional mathematical statistics prediction model is obtained by multiplying a plurality of influence coefficients by the basic failure rate. In the traditional mathematical statistics, different influence coefficients in the expected model can be synergistically amplified or reduced in the continuous multiplication process, but in practical application, component failure is possibly induced by multiple failure mechanisms, sensitivity of different failure mechanisms to different stresses is different, and failure positions are different. Therefore, the failure rate obtained by the traditional mathematical statistics prediction model has larger prediction deviation from the actual failure rate.
Disclosure of Invention
Based on the above, it is necessary to provide a component failure rate prediction method, device, computer equipment and storage medium, aiming at the problem that the failure rate obtained by the traditional mathematical statistics prediction model has larger prediction deviation from the actual failure rate.
A component failure rate prediction method, comprising:
determining failure components in a component group to be tested, and acquiring the total use time length, the failure number and the confidence of the failure components in the component group to be tested; wherein the types of components in the component group to be tested are the same;
determining basic failure rates of the component group to be tested under different reference stresses according to the total using time, the failure number and the confidence coefficient, and obtaining a plurality of basic failure rates;
according to the component types of the component group to be tested, determining influence coefficients of the component group to be tested under different induced stresses to obtain a plurality of influence coefficients; wherein the induced stress is of the same stress type as the reference stress;
determining a quality coefficient according to the component type and the component grade of the component group to be tested;
the continuous working time of the failure component under different induced stresses is obtained, and the continuous working time duty ratio of the failure component under different induced stresses is calculated according to the continuous working time, so that a plurality of continuous working time duty ratios are obtained;
And determining the failure rate of the component group to be tested according to the plurality of basic failure rates, the plurality of influence coefficients, the quality coefficient and the plurality of continuous working time duty ratios.
In one embodiment, the determining the failure rate of the component group to be tested according to the plurality of basic failure rates, the plurality of influence coefficients, the quality coefficient and the plurality of continuous operation time ratios includes:
calculating the product of the basic failure rate of the component group to be tested under each reference stress and the influence coefficient of the component group to be tested under the induced stress corresponding to the reference stress to obtain a plurality of first products;
calculating the sum of the first products to obtain a first accumulated sum;
respectively calculating products of the first accumulated sum and the continuous working time duty ratio of the failure component under each induced stress to obtain a plurality of second products;
calculating the sum of the second products to obtain a second accumulated sum;
and calculating the product of the second cumulative sum and the quality coefficient to obtain the failure rate of the component group to be tested.
In one embodiment, the determining the failure rate of the component group to be tested according to the plurality of basic failure rates, the plurality of influence coefficients, the quality coefficient and the plurality of continuous operation time ratios includes:
Determining the failure rate of the component group to be tested through a formula (1):
wherein lambda represents the failure rate of the component group to be tested, lambda i Represents the basic failure rate pi of the component group to be tested under the ith reference stress i Representation ofThe i-th influence coefficient, pi, of the component group to be tested corresponding to the induced stress Q Representing the mass coefficient, P j Representing the duty cycle of the duration corresponding to the jth induced stress.
In one embodiment, the determining the basic failure rate of the component to be tested under different reference stresses according to the total usage duration, the failure number and the confidence coefficient, to obtain a plurality of basic failure rates includes:
determining the plurality of base failure rates by equation (2):
wherein lambda is i Represents the basic failure rate at the ith reference stress, gamma represents the failure number, T 0 Representing the total duration of use, alpha representing the confidence level, χ 2 1-α And representing the chi-square distribution of the failure components in the component group to be tested.
In one embodiment, the obtaining the total duration of use of the failed component includes:
determining acceleration coefficients of the failure components under the induced stresses according to the component types;
Determining the service time of the failed component under each reference stress amount according to the continuous working time of the failed component under different induced stresses and the acceleration coefficient;
and determining the total use duration of the failed components according to the use duration of all the failed components.
In one embodiment, the determining the usage time of the failed component under each reference stress amount according to the duration of the failed component under different induced stresses and the acceleration coefficient includes:
determining the use period by the formula (3):
wherein t' represents the duration of use, t i Representing the duration of operation of the failed component at the ith induced stress, AF i Representing the acceleration factor at the ith induced stress.
In one embodiment, the determining the total duration of use of the failed component according to the duration of use of all the failed components includes:
determining the total duration of use by equation (4):
T 0 ＝Σt' (4)
wherein T' represents the use duration, T 0 Indicating the total duration of use.
A component failure rate predicting apparatus comprising:
The basic parameter acquisition module is used for determining failure components in a component group to be tested and acquiring the total use duration, the failure number and the confidence level of the failure components in the component group to be tested; wherein the types of components in the component group to be tested are the same;
the basic failure rate determining module is used for determining the basic failure rate of the component to be tested under different reference stresses according to the total using time length, the failure quantity and the confidence coefficient, so as to obtain a plurality of basic failure rates;
the influence coefficient determining module is used for determining influence coefficients of the component group to be tested under different induced stresses according to the component type of the component group to be tested to obtain a plurality of influence coefficients; wherein the induced stress is of the same stress type as the reference stress;
the quality coefficient determining module is used for determining a quality coefficient according to the component type and the component grade of the component group to be tested;
the continuous working time duty ratio determining module is used for obtaining the continuous working time of the failure component under different induced stresses, and calculating the continuous working time duty ratio of the failure component under different induced stresses according to the continuous working time to obtain a plurality of continuous working time duty ratios;
And the failure rate determining module is used for determining the failure rate of the component group to be tested according to the plurality of basic failure rates, the plurality of influence coefficients, the quality coefficient and the plurality of continuous working time duty ratios.
A computer device, comprising: comprising a memory storing a computer program and a processor implementing the steps of the method as described above when said computer program is executed.
A computer readable storage medium having stored thereon a computer program which when executed by a processor realizes the steps of the method as described above.
According to the embodiment of the application, the component failure rate prediction model is built by introducing the influence coefficients, the quality coefficients and the continuous working time duty ratios on the basis of the traditional failure rate prediction model. According to the component failure rate prediction method provided by the embodiment of the application, the traditional component failure rate prediction model is split into finer steps according to the induced stress type, so that the failure rate of the component is predicted to be more similar to the actual use environment of the component group to be tested, and the failure rate of the component is more similar to the actual situation. The component failure rate prediction method solves the technical problem that the failure rate obtained through the traditional mathematical statistics prediction model has larger prediction deviation from the actual failure rate, can obtain more accurate prediction results, provides finer guidance for weak link positioning and design of the component, and achieves the technical effect of reducing the prediction deviation of the prediction failure rate and the actual failure rate.
Drawings
FIG. 1 is a schematic diagram of an application scenario of a failure rate prediction method for components according to an embodiment of the present application;
FIG. 2 is a flow chart of a method for predicting failure rate of components in accordance with one embodiment of the present application;
FIG. 3 is a flow chart of a method for predicting failure rate of components in accordance with one embodiment of the present application;
FIG. 4 is a flow chart of a method for predicting failure rate of components in accordance with one embodiment of the present application;
fig. 5 is a schematic structural diagram of a device for predicting failure rate of components according to an embodiment of the present application.
Reference numerals illustrate:
10. the failure rate prediction device of the components; 100. a basic parameter acquisition module; 200. a basic failure rate determination module; 300. an influence coefficient determination module; 400. a quality coefficient determining module; 500. a continuous operation time duty ratio determining module; 600. and a failure rate determining module.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the following embodiments are used to further describe in detail a method, an apparatus, a computer device and a storage medium for predicting failure rate of components according to the present application with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application.
Referring to fig. 1, the method for predicting failure rate of components provided in the embodiment of the present application may be applied to a computer device, and an internal structure diagram of the computer device may be shown in fig. 1. The computer device includes a processor, a memory, a network interface, and a database connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, computer programs, and a database. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage media. The database of the computer device is for storing data. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program, when executed by a processor, implements a method for predicting failure rate of a component.
Components are short for electronic components, which generally include: capacitors, transistors, resistors, etc. The stresses of the components generally include: electrical stress, mechanical stress, temperature stress, humidity stress, etc. The component failure rate prediction method is suitable for the prediction of failure rate of any component and the establishment of failure rate prediction models. The component failure rate prediction method in the embodiment can set a plurality of different stress profiles, and detect and predict the failure rate of the component to be tested in the different stress profiles. The embodiment specifically describes an example in which the component failure rate prediction method is applied to predicting the failure rate of the capacitor.
Referring to fig. 2, an embodiment of the present application provides a method for predicting failure rate of a component, which is used for predicting failure rate of the component.
The component failure rate prediction method comprises the following steps:
s100, determining failure components in a component group to be tested, and acquiring the total use time length, the failure number and the confidence of the failure components in the component group to be tested. And the types of the components in the component group to be tested are the same.
The component group to be tested refers to a group of components which need to be subjected to failure rate test and correction. The components to be tested may be in a batch of products, or may be representative samples selected from a batch of products according to a certain rule. The components in the component group to be tested can be any electronic components such as resistors, capacitors and the like. However, the types of the components in the component group to be tested are completely the same, namely the components in the component group to be tested are resistors or capacitors. The failed component refers to a component damaged due to the action of different types of stress such as electric stress, mechanical stress, temperature stress and the like. The total use duration of the failed component refers to the accumulated time of the component working before failure, and the component can be acquired by adopting artificial timing observation or by using a measuring element such as a timer. The failure number refers to the number of the failure components in the same batch of products or samples, and can be counted by using manual collection or other modes. The confidence coefficient refers to a distribution value of the failure number of the failed components in the total number of the products or the samples in a batch of products or samples, and the distribution value can be calculated according to the number of the components in the component group to be tested and the failure number of the failed components.
And S200, determining the basic failure rate of the component group to be tested under different reference stresses according to the total using time, the failure number and the confidence coefficient, and obtaining a plurality of basic failure rates.
The plurality of basic failure rates refer to the duty ratio of the failure component in the component group to be tested. The different reference stresses refer to different types of stresses, and the types of the reference stresses are the same as the induced stresses of the failed component. The type of the reference stress and the type of the induced stress can be consistent, so as to characterize new stress conditions or use environments of the component to be tested, such as electric stress, mechanical stress, temperature stress, humidity stress and the like.
S300, determining influence coefficients of the component group to be tested under different induced stresses according to the component type of the component group to be tested, and obtaining a plurality of influence coefficients. Wherein the induced stress is of the same stress type as the reference stress.
The influence coefficient refers to the influence degree of different induced stresses on the component group to be tested, and the influence coefficient is determined according to the component type and different stress types in the component group to be tested. The influence coefficient can be determined through experimental tests, and can also be directly obtained through existing literature or historical empirical values. In this embodiment, the determination of the influence coefficient is not specifically limited, and the function of determining the influence coefficient of the component group to be tested under different induced stresses and obtaining a plurality of influence coefficients only needs to be satisfied.
S400, determining the quality coefficient according to the component type and the component grade of the component group to be tested.
The quality coefficient is determined according to the type of the component and the component grade of the component group to be tested, and is used for representing the influence degree of quality control on reliability in development and production of the component, namely the influence degree on failure rate in the embodiment. The quality coefficient can be obtained through experimental calculation, and can also be determined by referring to relevant standard specifications or historical experience data. The determination of the quality coefficient is not limited in this embodiment, and the quality coefficient may be determined according to the component type and the component level of the component group to be tested.
S500, obtaining the continuous working time of the failure component under different induced stresses, and calculating the continuous working time duty ratio of the failure component under different induced stresses according to the continuous working time to obtain a plurality of continuous working time duty ratios.
The continuous working time of the failed component under different induced stresses refers to the accumulated working time when the component to be tested fails due to the induced stresses. For example, when the component group to be tested is a capacitor, the capacitor may be subjected to different stresses during use, resulting in failure of some of the capacitors due to the combined action of the different induced stresses. The failed capacitor is subjected to various induced stresses during failure, such as electrical stress, mechanical stress, temperature stress, humidity stress, and the like. For example, the capacitor experiences the electrical stress for a time t before failing 1 The time of experiencing the mechanical stress is t 2 The time of experiencing the temperature stress is t 3 The time of experiencing the humidity stress is t 4 ，t 1 、t 2 、t 3 And t 4 The sum is then the total time t of the induced stresses experienced by the failed capacitor. Thus t 1 And/t is the continuous working time duty ratio of the capacitor, namely the failure component under the electric stress induced stress. Similarly, t 2 And t is the continuous working time duty ratio of the failure component under the mechanical stress induced stress, t 1 And t is the continuous working time duty ratio of the failure component under the temperature stress induced stress, t 1 And/t is the continuous working time duty ratio of the failure component under the humidity stress induced stress.
S600, determining the failure rate of the component group to be tested according to the plurality of basic failure rates, the plurality of influence coefficients, the quality coefficient and the plurality of continuous working time duty ratios.
The failure rate of the component group to be tested is the failure rate obtained by correcting the basic failure rate through the component failure rate prediction method in the embodiment. Different reference stresses are introduced into the basic failure rate through the influence coefficient, and then the failure rate of the component group to be tested applied to different environments can be obtained through some simple mathematical calculations.
According to the component failure rate prediction method, the influence coefficients, the quality coefficients and the continuous working time duty ratios are introduced on the basis of a traditional failure rate prediction model, so that the component failure rate prediction model is built. According to the component failure rate prediction method, a traditional component failure rate prediction model is split into finer steps according to the induced stress type, so that the failure rate of the component is predicted to be closer to the actual use environment of the component group to be tested, and the failure rate of the component is more close to the actual situation. The component failure rate prediction method solves the technical problem that the failure rate obtained through the traditional mathematical statistics prediction model has larger prediction deviation from the actual failure rate, can obtain more accurate prediction results, provides finer guidance for weak link positioning and design of the component, and achieves the technical effect of reducing the prediction deviation of the prediction failure rate and the actual failure rate.
Referring to fig. 3, the present embodiment relates to determining a failure rate of the component group to be tested according to the plurality of basic failure rates, the plurality of influence coefficients, the quality coefficient, and the plurality of continuous operation time ratios, that is, S600 includes:
And S610, calculating the product of the basic failure rate of the component group to be tested under each reference stress and the influence coefficient under the induced stress corresponding to the reference stress to obtain a plurality of first products.
The induced stress is a core cause of the failure of the components in the component group to be tested, and can be directly or indirectly obtained through methods such as test and inspection or empirical data. In a typical use environment, the stress types generally include: electrical stress, mechanical stress, temperature stress, humidity stress, etc. The reference stress is used for simulating a real use stress environment of the component group to be tested in the future, and the induced stress is the induced stress type corresponding to the historical experience data of the component group to be tested or the failure rate experience value in the test.
S620, calculating the sum of the first products to obtain a first accumulated sum.
S630, respectively calculating products of the first accumulated sum and the continuous working time duty ratio of the failure component under each induced stress to obtain a plurality of second products.
S640, calculating the sum of the second products to obtain a second accumulated sum.
And S650, calculating the product of the second accumulated sum and the quality coefficient to obtain the failure rate of the component group to be tested.
Through the steps, the failure rate of the component group to be tested is split into the product of the basic failure rate and the influence coefficient under the induced stress corresponding to the reference stress, so that the failure rate of the component group to be tested is divided more finely. The induced stress can be directly utilized to represent the failure rate of the component group to be tested, so that the failure rate of the component group to be tested is predicted more deeply and carefully, and finer guidance is provided for positioning and designing weak links of the components in the future.
In one embodiment, the determining, at S600, the failure rate of the component group to be tested according to the plurality of basic failure rates, the plurality of influence coefficients, the quality coefficient, and the plurality of continuous operation time ratios includes:
determining the failure rate of the component group to be tested through a formula (1):
wherein lambda represents the failure rate of the component group to be tested, lambda i Represents the basic failure rate pi of the component group to be tested under the ith reference stress i Indicating the influence coefficient pi corresponding to the induced stress of the component group to be tested at the ith kind Q Representing the mass coefficient, P j Representing the duty cycle of the duration corresponding to the jth induced stress.
In one embodiment, the step S200 of determining the basic failure rate of the component to be tested under different reference stresses according to the total usage duration, the failure number and the confidence level, to obtain a plurality of basic failure rates includes:
determining the plurality of base failure rates by equation (2):
wherein lambda is i Represents the basic failure rate at the ith reference stress, gamma represents the failure number, T 0 Representing the total duration of use, alpha representing the confidence level, χ 2 1-alpha represents the chi-square distribution of the failed components in the component group to be tested.
Referring to fig. 4, in one embodiment, the step S100 of obtaining the total duration of use of the failed component includes:
s110, determining the acceleration coefficient of the failure component under each induced stress according to the component type.
The component types may be capacitors, resistors, diodes, etc. The acceleration coefficient can be obtained through field test, or can be directly obtained in historical experience data according to the type of the component and different induced stresses. The acceleration coefficient is used for representing the acceleration capability of the actual induced stress level of the component to the failure of the component compared with the reference stress magnitude.
And S120, determining the service time of the failed component under each reference stress amount according to the continuous working time of the failed component under different induced stresses and the acceleration coefficient.
In a specific embodiment, the step S120 of determining the usage duration of the failed component under each of the reference stress amounts according to the duration of the failed component under different induced stresses and the acceleration coefficient includes:
determining the use period by the formula (3):
wherein t' represents the duration of use, t i Representing the duration of operation of the failed component at the ith induced stress, AF i Representing the acceleration factor at the ith induced stress.
S130, determining the total use duration of the failed components according to the use duration of all the failed components.
In a specific embodiment, the step S130 of determining the total duration of use of the failed component according to the duration of use of all the failed components includes:
determining the total duration of use by equation (4):
T 0 ＝∑t' (4)
wherein T' represents the use duration, T 0 Indicating the total duration of use.
It should be understood that, although the steps in the flowchart are shown in sequence as indicated by the arrows, the steps are not necessarily performed in sequence as indicated by the arrows. The steps are not strictly limited to the order of execution unless explicitly recited herein, and the steps may be executed in other orders. Moreover, at least some of the steps in the figures may include multiple sub-steps or stages that are not necessarily performed at the same time, but may be performed at different times, nor does the order in which the sub-steps or stages are performed necessarily performed in sequence, but may be performed alternately or alternately with at least a portion of other steps or other steps.
Referring to fig. 5, in one embodiment of the present application, a device 10 for predicting failure rate of components is provided, including: the system comprises a basic parameter acquisition module 100, a basic failure rate determination module 200, an influence coefficient determination module 300, a quality coefficient determination module 400, a continuous operation time duty ratio determination module 500 and a failure rate determination module 600.
Wherein:
the basic parameter acquisition module 100 is used for determining failure components in a component group to be tested and acquiring the total use duration, the failure number and the confidence level of the failure components in the component group to be tested; and the types of the components in the component group to be tested are the same.
The basic failure rate determining module 200 is configured to determine a basic failure rate of the component to be tested under different reference stresses according to the total usage time, the failure number and the confidence level, so as to obtain a plurality of basic failure rates.
The influence coefficient determining module 300 is configured to determine influence coefficients of the component group to be tested under different induced stresses according to the component type of the component group to be tested, so as to obtain a plurality of influence coefficients; wherein the induced stress is of the same stress type as the reference stress.
The quality coefficient determining module 400 is configured to determine a quality coefficient according to the component type and the component class of the component group to be tested.
The continuous operation time duty ratio determining module 500 is configured to obtain continuous operation time of the failed component under different induced stresses, and calculate the continuous operation time duty ratio of the failed component under different induced stresses according to the continuous operation time, so as to obtain a plurality of continuous operation time duty ratios.
The failure rate determining module 600 is configured to determine a failure rate of the component group to be tested according to the plurality of basic failure rates, the plurality of influence coefficients, the quality coefficient, and the plurality of continuous operating time ratios.
In one embodiment, the failure rate determining module 600 is specifically configured to calculate a product of the basic failure rate of the component group to be tested under each reference stress and an influence coefficient under the induced stress corresponding to the reference stress, so as to obtain a plurality of first products; calculating the sum of the first products to obtain a first accumulated sum; respectively calculating products of the first accumulated sum and the continuous working time duty ratio of the failure component under each induced stress to obtain a plurality of second products; calculating the sum of the second products to obtain a second accumulated sum; and calculating the product of the second cumulative sum and the quality coefficient to obtain the failure rate of the component group to be tested.
In one embodiment, the failure rate determining module 600 is specifically configured to determine the failure rate of the component group to be tested according to formula (1):
wherein lambda represents the failure rate of the component group to be tested, lambda i Represents the basic failure rate pi of the component group to be tested under the ith reference stress i Representing the influence coefficient pi corresponding to the ith induced stress of the component group to be tested Q Representing the mass coefficient, P j Representing the duty cycle of the duration corresponding to the jth induced stress.
In one embodiment, the basic failure rate determination module 200 is specifically configured to determine the plurality of basic failure rates by equation (2):
wherein lambda is i Represents the basic failure rate at the ith reference stress, gamma represents the failure number, T 0 Representing the total duration of use, alpha representing the confidence level, χ 2 1- Alpha represents chi-square distribution of the failure components in the component group to be tested.
In one embodiment, the basic parameter collection module 100 is specifically configured to determine an acceleration coefficient of the failed component under each induced stress according to the component type; determining the service time of the failed component under each reference stress amount according to the continuous working time of the failed component under different induced stresses and the acceleration coefficient; and determining the total use duration of the failed components according to the use duration of all the failed components.
In one embodiment, the basic parameter collection module 100 is specifically configured to determine the usage duration by the formula (3):
wherein t' represents the duration of use, t i Representing the duration of operation of the failed component at the ith induced stress, AF i Representing the acceleration factor at the ith induced stress.
In one embodiment, the basic parameter collection module 100 is specifically configured to determine the total duration of use by the formula (4):
T 0 ＝∑t' (4)
wherein T' represents the use duration, T 0 Indicating the total duration of use.
For specific limitation of the device failure rate prediction apparatus 10, reference may be made to the limitation of the device failure rate prediction method hereinabove, and no further description is given here. The various modules in the component failure rate prediction apparatus 10 described above may be implemented in whole or in part by software, hardware, and combinations thereof. The above modules may be embedded in hardware or may be independent of a processor in the computer device, or may be stored in software in a memory in the computer device, so that the processor may call and execute operations corresponding to the above modules.
In one embodiment, there is provided a computer device comprising: the device comprises a memory and a processor, wherein the memory stores a computer program, and the processor realizes the following steps when executing the computer program:
Determining failure components in a component group to be tested, and acquiring the total use time length, the failure number and the confidence of the failure components in the component group to be tested; wherein the types of components in the component group to be tested are the same;
determining basic failure rates of the component group to be tested under different reference stresses according to the total using time, the failure number and the confidence coefficient, and obtaining a plurality of basic failure rates;
according to the component types of the component group to be tested, determining influence coefficients of the component group to be tested under different induced stresses to obtain a plurality of influence coefficients; wherein the induced stress is of the same stress type as the reference stress;
determining a quality coefficient according to the component type and the component grade of the component group to be tested;
the continuous working time of the failure component under different induced stresses is obtained, and the continuous working time duty ratio of the failure component under different induced stresses is calculated according to the continuous working time, so that a plurality of continuous working time duty ratios are obtained;
and determining the failure rate of the component group to be tested according to the plurality of basic failure rates, the plurality of influence coefficients, the quality coefficient and the plurality of continuous working time duty ratios.
In one embodiment, the processor when executing the computer program further implements: calculating the product of the basic failure rate of the component group to be tested under each reference stress and the influence coefficient of the component group to be tested under the induced stress corresponding to the reference stress to obtain a plurality of first products; calculating the sum of the first products to obtain a first accumulated sum; respectively calculating products of the first accumulated sum and the continuous working time duty ratio of the failure component under each induced stress to obtain a plurality of second products; calculating the sum of the second products to obtain a second accumulated sum; and calculating the product of the second cumulative sum and the quality coefficient to obtain the failure rate of the component group to be tested.
In one embodiment, the processor when executing the computer program further implements:
determining the failure rate of the component group to be tested through a formula (1):
wherein lambda represents the failure rate of the component group to be tested, lambda i Represents the basic failure rate pi of the component group to be tested under the ith reference stress i Indicating the influence coefficient pi corresponding to the induced stress of the component group to be tested at the ith kind Q Representing the mass coefficient, P j Representing the duty cycle of the duration corresponding to the jth induced stress.
In one embodiment, the processor when executing the computer program further implements:
determining the plurality of base failure rates by equation (2):
wherein lambda is i Represents the basic failure rate at the ith reference stress, gamma represents the failure number, T 0 Representing the total duration of use, alpha representing the confidence level, χ 2 1-α And representing the chi-square distribution of the failure components in the component group to be tested.
In one embodiment, the processor when executing the computer program further implements: determining acceleration coefficients of the failure components under the induced stresses according to the component types; determining the service time of the failed component under each reference stress amount according to the continuous working time of the failed component under different induced stresses and the acceleration coefficient; and determining the total use duration of the failed components according to the use duration of all the failed components.
In one embodiment, the processor when executing the computer program further implements:
determining the use period by the formula (3):
Wherein t' represents the duration of use, t i Representing the duration of operation of the failed component at the ith induced stress, AF i Representing the acceleration factor at the ith induced stress.
In one embodiment, the processor when executing the computer program further implements:
determining the total duration of use by equation (4):
T 0 ＝∑t' (4)
wherein T' represents the use duration, T 0 Indicating the total duration of use.
In one embodiment, a computer readable storage medium is provided having a computer program stored thereon, which when executed by a processor, performs the steps of:
determining failure components in a component group to be tested, and acquiring the total use time length, the failure number and the confidence of the failure components in the component group to be tested; wherein the types of components in the component group to be tested are the same;
determining basic failure rates of the component group to be tested under different reference stresses according to the total using time, the failure number and the confidence coefficient, and obtaining a plurality of basic failure rates;
according to the component types of the component group to be tested, determining influence coefficients of the component group to be tested under different induced stresses to obtain a plurality of influence coefficients; wherein the induced stress is of the same stress type as the reference stress;
Determining a quality coefficient according to the component type and the component grade of the component group to be tested;
the continuous working time of the failure component under different induced stresses is obtained, and the continuous working time duty ratio of the failure component under different induced stresses is calculated according to the continuous working time, so that a plurality of continuous working time duty ratios are obtained;
and determining the failure rate of the component group to be tested according to the plurality of basic failure rates, the plurality of influence coefficients, the quality coefficient and the plurality of continuous working time duty ratios.
In one embodiment, the computer program when executed by the processor further implements: calculating the product of the basic failure rate of the component group to be tested under each reference stress and the influence coefficient of the component group to be tested under the induced stress corresponding to the reference stress to obtain a plurality of first products; calculating the sum of the first products to obtain a first accumulated sum; respectively calculating products of the first accumulated sum and the continuous working time duty ratio of the failure component under each induced stress to obtain a plurality of second products; calculating the sum of the second products to obtain a second accumulated sum; and calculating the product of the second cumulative sum and the quality coefficient to obtain the failure rate of the component group to be tested.
In one embodiment, the computer program when executed by the processor further implements:
determining the failure rate of the component group to be tested through a formula (1):
wherein lambda represents the failure rate of the component group to be tested, lambda i Represents the basic failure rate pi of the component group to be tested under the ith reference stress i Indicating the influence coefficient pi corresponding to the induced stress of the component group to be tested at the ith kind Q Representing the mass coefficient, P j Representing the duty cycle of the duration corresponding to the jth induced stress.
In one embodiment, the computer program when executed by the processor further implements:
determining the plurality of base failure rates by equation (2):
wherein lambda is i Represents the basic failure rate at the ith reference stress, gamma represents the failure number, T 0 Representing the total duration of use, alpha representing the confidence level, χ 2 1-α And representing the chi-square distribution of the failure components in the component group to be tested.
In one embodiment, the computer program when executed by the processor further implements: determining acceleration coefficients of the failure components under the induced stresses according to the component types; determining the service time of the failed component under each reference stress amount according to the continuous working time of the failed component under different induced stresses and the acceleration coefficient; and determining the total use duration of the failed components according to the use duration of all the failed components.
In one embodiment, the computer program when executed by the processor further implements:
determining the use period by the formula (3):
wherein t' represents the duration of use, t i Representing the duration of operation of the failed component at the ith induced stress, AF i Representing the acceleration factor at the ith induced stress.
In one embodiment, the computer program when executed by the processor further implements:
determining the total duration of use by equation (4):
T 0 ＝∑t' (4)
wherein T' represents the use duration, T 0 Indicating the total duration of use.
The technical features of the above-described embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above-described embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The above examples illustrate only a few embodiments of the application, which are described in detail and are not to be construed as limiting the scope of the claims. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the application, which are all within the scope of the application. Accordingly, the scope of protection of the present application is to be determined by the appended claims.
Claims (10)
1. A component failure rate prediction method, comprising:
determining failure components in a component group to be tested, and acquiring the total use time length, the failure number and the confidence of the failure components in the component group to be tested; wherein the types of components in the component group to be tested are the same;
determining basic failure rates of the component group to be tested under different reference stresses according to the total using time, the failure number and the confidence coefficient, and obtaining a plurality of basic failure rates;
according to the component types of the component group to be tested, determining influence coefficients of the component group to be tested under different induced stresses to obtain a plurality of influence coefficients; wherein the induced stress is of the same stress type as the reference stress;
determining a quality coefficient according to the component type and the component grade of the component group to be tested;
the continuous working time of the failure component under different induced stresses is obtained, and the continuous working time duty ratio of the failure component under different induced stresses is calculated according to the continuous working time, so that a plurality of continuous working time duty ratios are obtained;
Determining failure rates of the component group to be tested according to the plurality of basic failure rates, the plurality of influence coefficients, the quality coefficient and the plurality of continuous working time duty ratios;
wherein determining the failure rate of the component group to be tested according to the plurality of basic failure rates, the plurality of influence coefficients, the quality coefficient and the plurality of continuous working time duty ratios includes:
determining the failure rate of the component group to be tested through a formula (1):
（1）
wherein lambda represents the failure rate of the component group to be tested, lambda i Indicating that the component to be tested is in the first groupiBasic failure rate under the reference stress, pi i Representing the first component group to be testediThe influence coefficient corresponding to the induced stress, pi Q Representing the mass coefficient, P j Representation and the firstjThe continuous working time duty ratio corresponding to the induced stress;
and determining the basic failure rate of the component to be tested under different reference stresses according to the total using time, the failure number and the confidence coefficient, so as to obtain a plurality of basic failure rates, wherein the method comprises the following steps:
determining the plurality of base failure rates by equation (2):
（2）
wherein lambda is i Is shown in the firstiSaid substantial failure rate at said reference stress,γrepresenting the number of failures, T 0 Indicating the total duration of the use,αrepresenting the confidence, χ 2 1-α And representing the chi-square distribution of the failure components in the component group to be tested.
2. The component failure rate prediction method according to claim 1, wherein the obtaining the total duration of use of the failed component includes:
determining acceleration coefficients of the failure components under the induced stresses according to the component types;
determining the service time of the failed component under each reference stress amount according to the continuous working time of the failed component under different induced stresses and the acceleration coefficient;
and determining the total use duration of the failed components according to the use duration of all the failed components.
3. The component failure rate prediction method according to claim 2, wherein the determining the usage period of the failed component under the respective reference stress amounts based on the duration of the failed component under the different induced stresses and the acceleration coefficient includes:
Determining the use period by the formula (3):
（3）
wherein,the duration of the use is indicated as such,t i is shown in the firstiThe continuous working time of the failure component under the induced stress and AF i Is shown in the firstiThe acceleration factor under induced stress.
4. The component failure rate prediction method according to claim 2, wherein the determining the total duration of use of the failed component according to the duration of use of all the failed components includes:
determining the total duration of use by equation (4):
（4）
wherein,indicating the duration of use, T 0 Indicating the total duration of use.
5. A component failure rate predicting apparatus, comprising:
the basic parameter acquisition module is used for determining failure components in a component group to be tested and acquiring the total use duration, the failure number and the confidence level of the failure components in the component group to be tested; wherein the types of components in the component group to be tested are the same;
the basic failure rate determining module is used for determining the basic failure rate of the component to be tested under different reference stresses according to the total using time length, the failure quantity and the confidence coefficient, so as to obtain a plurality of basic failure rates;
The influence coefficient determining module is used for determining influence coefficients of the component group to be tested under different induced stresses according to the component type of the component group to be tested to obtain a plurality of influence coefficients; wherein the induced stress is of the same stress type as the reference stress;
the quality coefficient determining module is used for determining a quality coefficient according to the component type and the component grade of the component group to be tested;
the continuous working time duty ratio determining module is used for obtaining the continuous working time of the failure component under different induced stresses, and calculating the continuous working time duty ratio of the failure component under different induced stresses according to the continuous working time to obtain a plurality of continuous working time duty ratios;
the failure rate determining module is used for determining the failure rate of the component group to be tested according to the plurality of basic failure rates, the plurality of influence coefficients, the quality coefficient and the plurality of continuous working time duty ratios;
wherein determining the failure rate of the component group to be tested according to the plurality of basic failure rates, the plurality of influence coefficients, the quality coefficient and the plurality of continuous working time duty ratios includes:
Determining the failure rate of the component group to be tested through a formula (1):
（1）
wherein lambda represents the failure rate of the component group to be tested, lambda i Representing the meta-device to be testedThe parts are assembled at the firstiBasic failure rate under the reference stress, pi i Representing the first component group to be testediThe influence coefficient corresponding to the induced stress, pi Q Representing the mass coefficient, P j Representation and the firstjThe continuous working time duty ratio corresponding to the induced stress;
and determining the basic failure rate of the component to be tested under different reference stresses according to the total using time, the failure number and the confidence coefficient, so as to obtain a plurality of basic failure rates, wherein the method comprises the following steps:
determining the plurality of base failure rates by equation (2):
（2）
wherein lambda is i Is shown in the firstiSaid substantial failure rate at said reference stress,γrepresenting the number of failures, T 0 Indicating the total duration of the use,αrepresenting the confidence, χ 2 1-α And representing the chi-square distribution of the failure components in the component group to be tested.
6. The device according to claim 5, wherein the basic parameter acquisition module is specifically configured to determine an acceleration coefficient of the failed component under each induced stress according to the component type; determining the service time of the failed component under each reference stress amount according to the continuous working time of the failed component under different induced stresses and the acceleration coefficient; and determining the total use duration of the failed components according to the use duration of all the failed components.
7. The apparatus of claim 6, wherein the base parameter acquisition module is specifically configured to determine the usage duration by equation (3):
（3）
wherein,the duration of the use is indicated as such,t i is shown in the firstiThe continuous working time of the failure component under the induced stress and AF i Is shown in the firstiThe acceleration factor under induced stress.
8. The apparatus of claim 6, wherein the base parameter acquisition module is specifically configured to determine the total duration of use by equation (4):
（4）
wherein,indicating the duration of use, T 0 Indicating the total duration of use.
9. A computer device, comprising: comprising a memory and a processor, said memory storing a computer program, characterized in that the processor implements the steps of the method according to any one of claims 1 to 4 when said computer program is executed.
10. A computer readable storage medium, on which a computer program is stored, characterized in that the computer program, when being executed by a processor, implements the steps of the method of any of claims 1 to 4.
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