CN116418416A - Noise temperature test method suitable for OTA test - Google Patents
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Abstract
The invention discloses a noise temperature test method suitable for OTA test, which aims to measure the noise temperature of a device to be tested by using an air interface test method, and comprises the following steps: acquiring the noise temperature of the instrument according to the first test system; constructing a second test system, and testing the noise temperature and gain of the whole second test system; and constructing a third test system, and testing the noise temperature value and the gain of the whole third test system, wherein the device to be tested is suitable for devices and systems such as a microwave millimeter wave module, a receiver, a transmitter, a package antenna and the like. The test meter may be a combination of noise source and signal analyzer, or other noise generating device and receiving system. The measuring method calibrates the environment temperature and the instrument before the test, so the method has the characteristics of simplicity, convenience, rapidness and high precision for the test of the antenna radio frequency integrated module and the on-chip antenna module.
Description
Technical Field
The invention relates to the field of microwave and millimeter wave measurement, in particular to a noise temperature test method suitable for OTA (over the air) test.
Background
Noise Temperature (NT) is used as one of the key indicators for measuring the performance of a radio receiver, transmitter or antenna array. The current method of measuring noise temperature parameters is still based on the traditional conduction method, however, as the integration level of the system is higher and higher, the conduction method is not suitable for testing devices with integrated antennas, such as a package Antenna (AiP).
NT is an important indicator for measuring the sensitivity of the receiver system. The antenna noise temperature is defined as the noise temperature of an antenna if the noise temperature of the receiver output is the same as the noise temperature when the antenna is connected, within a unit bandwidth of a designated frequency, assuming that a resistor is connected in front of the noiseless receiver.
For the research of the noise parameter test of the device to be tested, the conduction method shown in fig. 2 is generally adopted at present, and although the test process is simpler, the method is only suitable for testing the device with double/multiple ports, and the module with the integrated antenna cannot be tested. In 2014, h.f. hsiao et al test noise parameters of the down converter by using a cold source method and a Y factor method, respectively, and it can be seen from the test result that the influence of the reflection coefficient on the cold source method is smaller than that on the Y factor method, but the calibration error of the cold source method on the noise parameters is larger. For the research of OTA test noise, when the antenna and the front-end module are measured by adopting the traditional method, the antenna to be measured (AUT) is usually faced to the sky (Effect Study of Spectrum Analyzer Noise Floor on Antenna Noise Temperature Measurement Zhen-Dong WU, shun-You QIN The Fifty Fourth Institute of CETC, shijia zhuang 050081, P.R. China), (Uncertainty Analysis of Antenna Noise Temperature Measurement Using Y-factor Method Shunyou Qin, lijun Zhang, zhensheng Li The Fifty Fourth Research Institute of China Electronics Technology Group Corporation Shijiazhuang 050081, P.R. CHINA), and the noise temperature of the antenna is obtained respectively through the switch of the rear stage of the antenna. This measurement method is inconvenient, and particularly in mass production, the measurement results are significantly affected by external ambient noise temperature and internal loss, which are closely related to the pitch angle at which the antenna is placed. Furthermore, radio frequency switches are necessary, which introduces additional uncertainty in the noise results.
Disclosure of Invention
In view of the above problems, the present invention provides a noise temperature measurement method suitable for OTA measurement.
The invention is realized at least by one of the following technical schemes.
A noise temperature test method suitable for OTA test comprises the following steps:
a) According to the first test system, obtaining the noise temperature T of the instrument Instr ；
b) Constructing a second test system, and testing the noise temperature T of the second test system b Gain G b ；
c) Constructing a third test system, and testing the noise temperature value T of the third test system a And gain G a 。
Further, the first test system includes a first noise source NS, a first spectrum analyzer SA, and a required radio frequency adapter, where the first noise source is connected to the first spectrum analyzer through a test cable and the radio frequency adapter, and parameters of frequency, intermediate frequency bandwidth, preamplifier, temperature, and ENR in the first spectrum analyzer are set according to test requirements, so as to obtain noise temperature when the first noise source is turned on and turned off, respectively
The Y factor of the system.
Further, the noise temperature T of the meter Instr Calculated by the following formula:
wherein T is Instr And Y Instr The noise temperature and Y factor of the first test system respectively,
and->
The noise temperature of the first noise source at on and off, respectively.
Further, the second system comprises a second noise source, a second spectrum analyzer, two standard gain antennas with identical performance parameters and a required radio frequency adapter, and the distance between the two standard gain antennas is D.
Further, the noise temperature T of the second test system b Calculated by the following formula:
wherein T is ANT For noise temperature of single standard gain antenna, G ANT Gain for a single standard gain antenna, where T ANT And G ANT Including path loss in space; t (T) Instr A noise temperature for the first test system; g b Is the gain of the second test system.
Further, the third test system comprises a third noise source, a reference antenna, a device under test DUT, a test cable, a third spectrum analyzer and a required radio frequency adapter, wherein the distance between the reference antenna and the device under test DUT is D.
Further, the DUT is a module of the antenna and the radio frequency module integrated together or a separate antenna to be tested.
Further, when the DUT is the receiving module, the noise temperature T of the DUT DUT,RX ：
Wherein T is a And G a For the third test systemNoise temperature value and gain, T Instr A noise temperature for the first test system; t (T) b And G b Noise temperature and gain for the second test system; g ANT The gain of a single standard gain antenna for the second test system.
Further, when the DUT is the transmitting module, the noise temperature T of the DUT DUT,TX ：
Wherein T is c And G c For the noise temperature value and gain of the third test system, T Instr A noise temperature for the first test system; t (T) b And G b Noise temperature and gain for the second test system; g ANT The gain of a single standard gain antenna for the second test system.
Further, the device under test DUT comprises a microwave millimeter wave module, a receiver, a transmitter and a package antenna.
Compared with the prior art, the invention has the beneficial effects that:
the invention adopts a pair of standard gain antennas to measure the module with the integrated antenna indoors, so that the test result is less influenced by the outside sky, and the measurement result is relatively stable. And the DUT, whether the receiving module or the transmitting module, can independently measure the noise temperature or the noise factor of the device under test during the test.
Drawings
FIG. 1 is a schematic diagram of the air interface noise temperature calibration and test in this embodiment;
FIG. 2 is a diagram of a NT test structure based on conduction;
FIG. 3a is a diagram of a noise temperature simulation verification reference antenna calibration simulation model based on the OTA method;
FIG. 3b is a graph of simulation results of reference antenna noise temperature;
FIG. 3c is a diagram of a test simulation model of a device under test;
fig. 3d is a diagram of the result of the noise temperature simulation of the device under test.
Detailed Description
In order that those skilled in the art will better understand the present invention, the following description will be given in detail with reference to the accompanying drawings and detailed description. It will be apparent that the described embodiments are only some, but not all, embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
A noise temperature test method suitable for OTA test includes such steps as analyzing the concept of noise temperature and the expression of noise temperature in cascade system, listing the process of measuring noise temperature by conducting method and air interface method, analyzing the constitution of noise temperature in air interface OTA measurement, simulating according to proposed measuring method, and comparing the simulation result with that of conducting method. The comparison results show that this approach is technically feasible for integrated antennas.
The noise temperature of the system cascade can be expressed as:
wherein T is 1 And G 1 Representing noise temperature and gain, T, of a first stage module on a reference plane 2 And G 2 The noise temperature and the gain of the second-stage module are used for pushing the noise temperature of the whole system.
The tested radio frequency component is respectively connected with a noise source and a spectrum analyzer (signal analyzer) at the input and output ends thereof through a coaxial cable, and the total noise temperature T is measured sys Noise temperature T divided into receiving ends RX And the noise temperature T of the measured piece DUT Two parts.
If T of receiving end Instr Can be calibrated and the gain G of the measured piece DUT Known, then the test piece T DUT Can be calculated from equation (6):
since the ambient temperature at the time of the test is not necessarily 290K, but the ENR value of the noise source is a standard value measured at 290K, it is necessary to perform temperature correction on the noise source before the test. I.e. when
At this time, correction is performed according to the formula (7).
Wherein ENR is CORR Representing the super-noise ratio of the corrected noise source; ENR (enhanced optical fiber) CAL Representing the super-noise ratio standard value of the noise source before correction; t (T) 0 290K for a standard reference temperature;
the noise temperature of the noise source when the noise source is in a closed state, namely the physical temperature of the noise source during testing;
in the air interface method test, the horizontal distance between the transmitting end antenna and the receiving end antenna is recommended to meet the far-field distance of the antenna, as shown in a formula (8), wherein R represents the test distance, D represents the aperture of the antenna, and lambda represents the wavelength corresponding to the working frequency of the test signal.
The traditional method for measuring the noise temperature of the DUT is based on a conduction method, and a specific measurement block diagram is shown in a and b of FIG. 2;
the NTR test block diagram based on the conduction method shows that:
FIG. 2 a is a schematic diagram of a conductive test system comprising NS, SA, test cable and RF converter, which are connected by coaxial connection lines to form the test system of FIG. 2 a.
The Y factor of the system is measured by turning on/off the noise source and is denoted as Y 1 Expressed as equation (9);
wherein the method comprises the steps of
The noise temperature of the noise source when the noise source is in an on state; />
The noise temperature of the noise source when the noise source is in a closed state, namely the physical temperature of the noise source during testing; t (T) Instr Is the internal noise temperature of the SA; wherein->
Can be obtained from the super noise ratio (ENR) of the noise source according to equation (10).
The T of the meter itself can be obtained according to the formulas (9) and (10) Instr Wherein the device is referred to as SA as shown in equation (7).
The test system of fig. 2 b is a conduction method, which comprises NS, SA, test cable, required rf converter and DUT to be tested, wherein the input end of DUT is connected with NS, the output end of DUT is connected with VSA, and the three components together form the test system of fig. 2 (b).
The NT value measured from graph b of fig. 2 can be regarded as the noise temperature T of the device itself Instr T with instrument to be measured DUT The constitution is as shown in formula (12).
The testing steps comprise:
a) Setting up a system according to the figure 2 (a), setting up various parameters such as frequency, intermediate frequency bandwidth, a pre-amplifier, temperature, ENR (ENR value according to noise sources used in test) and the like in a spectrum analyzer according to test requirements, and then performing noise test;
b) Through the method (11), the instrument can automatically calibrate the ENR value of the noise source, and the instrument can automatically measure and obtain the noise temperature T of the instrument Instr 。
c) According to FIG. 2 (b), the test system is built, the setting parameters of the spectrum analyzer are completely consistent with those of the step a), and the noise temperature T of the whole test system can be measured sys And gain G of DUT DUT ；
d) Noise temperature T of the DUT can be calculated according to equation (12) DUT 。
The noise temperature testing method suitable for OTA testing in the embodiment comprises the following steps:
a) A first test system was set up as shown in fig. 1a, fig. 1a being a meter calibration.
As a preferred embodiment, the first test system comprises a first noise source NS, a first spectrum analyzer SA and a required radio frequency adapter, wherein the first noise source is connected with the first spectrum analyzer through a test cable and the radio frequency adapter, parameters such as frequency, intermediate frequency bandwidth, a preamplifier, temperature, ENR (according to the ENR value of the noise source used in the test) and the like in the spectrum analyzer are set according to test requirements, then noise test is carried out, and the noise temperature T of the meter can be measured Instr ：
Wherein T is Instr And Y Instr The noise temperature and Y factor of the first test system respectively,
and->
The noise temperature of the first noise source at on and off, respectively.
b) According toB of fig. 1 is a second test system, configured to test noise of the reference antenna, where the setting parameters of the spectrum analyzer are completely consistent with those of step a), the second system includes a second noise source, a second spectrum analyzer, two standard gain antennas with completely identical performance parameters, and a required radio frequency adapter, and the distance between the two reference antennas (i.e., standard gain antennas) is D, so that the noise temperature T of the whole second test system can be measured b And overall gain G of the second test system b ；
From the above, the noise temperature T of a single standard gain antenna can be obtained ANT And gain G ANT Wherein T is ANT And G ANT Including path loss in space.
c) And constructing a third test system and testing the third test system. The third test system comprises a third noise source, a reference antenna, a device under test DUT, a test cable, a third spectrum analyzer and a required radio frequency adapter, wherein the setting parameters of the spectrum analyzer are completely consistent with those of the step a), the distance between the reference antenna and the antenna of the device under test is also D, and the corresponding test system is selected according to whether the device under test is a receiving module or a transmitting module. If the device to be tested is a receiving module, a third test system is carried according to c of fig. 1, and the noise temperature T of the whole third test system can be measured by air interface noise test when the DUT is the receiving module a And the overall gain G of the system a . The noise temperature T of the device under test can be obtained according to the following formula DUT,RX ：
Wherein T is a And G a For the noise temperature value and gain of the third test system, T Instr Is the firstA noise temperature of the test system; t (T) b And G b Noise temperature and gain for the second test system; g ANT The gain of a single standard gain antenna for the second test system.
If the device to be tested is the transmitting module, a third test system is carried according to D of fig. 1, the air interface method noise test is carried out when the DUT is the transmitting module, the setting parameters of the spectrum analyzer are completely consistent with those of the step a), the distance between the reference antenna and the antenna of the device to be tested is D, and the noise temperature T of the whole third test system can be measured c And the overall gain G of the system c Noise temperature T of the device under test DUT,TX ：
Wherein T is c And G c For the noise temperature value and gain of the third test system, T Instr A noise temperature for the first test system; t (T) b And G b Noise temperature and gain for the second test system; g ANT The gain of a single standard gain antenna for the second test system.
As another preferred embodiment, the device under test is a microwave millimeter wave module, a receiver, a transmitter, a packaged antenna, or the like.
A specific test case was given by the system vue 2020 software from keyight corporation to justify the testing principle of the present invention. As shown in fig. 3a, the leftmost port=1 PORT acts as a noise source, producing a continuous wave of 30dBm at 27 GHz; the rightmost port=2 PORT is used as the input end of the signal (spectrum) analyzer; the middle AntPath_1 is a pair of standard gain antennas with identical parameters, the parameters are set according to the following formula, the total gain of the antenna is-40 dB, the system noise coefficient is 40dB, and the system noise temperature is 2899719K (T) 0 In the case of=290K), as shown in the following figure.
Total Loss＝Lossb+[Lossa*log 10 (DIST)]-G 1 -G 2 +Loss1+Loss2
G in 1 、G 2 Is a single ginsengTaking into account the gain of the antenna (which does not include the path Loss in air), loss1, loss2 are losses of the material of the antenna itself, loss is path Loss, and the spectrum (signal) analyzer can be regarded as an ideal (noiseless) meter, i.e., T Instr =0; by the corresponding formula sum
The noise temperature T of a single reference antenna can be obtained ANT = 28710K and gain G ANT ＝0.01dB。
Further, as shown in fig. 3c, the leftmost port=1 is a noise source, the rightmost port=2 is an input terminal of the signal analyzer, the middle antpath_1 is a pair of standard gain antennas with identical parameters, and the parameters are the same as those in fig. 3a, and Lin is a linear gain amplifier. The noise temperature of a Device Under Test (DUT) is simulated, and in the system, the device under test comprises a receiving antenna and a linear gain amplifier, wherein the noise coefficient of the linear gain amplifier is 3dB, and the gain is 20dB.
The simulation result shows that the noise temperature of the system is 5785970.7134K (T 0 In the case of 290K), the noise temperature of the DUT can be calculated by the above corresponding formula to be 57572.607134K, and when the gain of the antenna to be measured in the DUT is known (0.01 in the figure), the noise temperature T of the linear gain amplifier can be calculated according to the following formula LNA 288.626K, noise figure NF LNA Can be obtained from the following equation, which is 3dB. The result is consistent with the designed parameter value, and the feasibility of the test scheme can be verified.
T LNA ＝(T DUT -T ANT2 )×G ANT2
In order to further verify the feasibility of the test method proposed by the present invention, actual measurement data based on the method are given here as table 1.
Table 1 noise temperature test data based on the OTA method proposed by the present invention
The test results were compared with conventional conduction methods as shown in table 2.
Table 2 comparison of noise temperature test results for OTA method and conventional conduction method
The active radio frequency module adopts a broadband low-noise amplifier module of Qotana company, the gain is 43dB, and the saturated power Psat is 20dBm. The feedhorns were from A-INFO company and had an average gain of 4.90-7.05 GHz over a frequency range of 10 dBi. The Noise source is NC346V of Noise company, and can work in the frequency range of 0.10GHz to 55.0 GHz. The spectrum analyzer FSW43 from rad and schwaltz was selected as the signal receiver for this measurement and a 28V dc power supply was provided to the noise source.
In Table 2, T Moudle,CT And T Moudle,OTA The noise temperature test results of the radio frequency module based on the conduction method and the OTA method provided by the invention are respectively. From the comparison results, the average errors of the OTA method are 11.287%,12.736% and 12.32% respectively at the distances of 55cm,75cm and 95cm between the reference antenna and the device to be tested, so that the method has feasibility.
The invention can test the noise temperature of a device under test with/without input and output ports. The test method is based on a pair of horn antennas with standard gain, and the horizontal distance suggestion between the transmitting end antenna and the receiving end antenna in the air interface method test meets the far-field distance of the antenna. The test meter required for the test may be a combination of noise source and signal (spectrum) analyzer, or other noise generating device and receiving system. The device to be tested is suitable for devices and systems such as microwave millimeter wave modules, receivers, transmitters, packaged antennas and the like. Before testing the noise temperature, the environmental temperature, the instrument noise and other influencing factors need to be calibrated, so that the measurement accuracy and reliability are improved.
The preferred embodiments of the invention disclosed above are intended only to assist in the explanation of the invention. The preferred embodiments are not exhaustive or to limit the invention to the precise form disclosed. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the invention and the practical application, to thereby enable others skilled in the art to best understand and utilize the invention. The invention is limited only by the claims and the full scope and equivalents thereof.
Claims (10)
1. The noise temperature test method suitable for OTA test is characterized by comprising the following steps:
a) Acquiring the noise temperature of the instrument according to the first test system;
b) Constructing a second test system, and testing the noise temperature and gain of the whole second test system;
c) And constructing a third test system, and testing the noise temperature value and the gain of the whole third test system.
2. The noise temperature testing method according to claim 1, wherein the first testing system comprises a first noise source NS, a first spectrum analyzer SA and a required radio frequency adapter, wherein the first noise source is connected to the first spectrum analyzer through a testing cable and the radio frequency adapter, and each parameter of a frequency, an intermediate frequency bandwidth, a preamplifier, a temperature and an ENR in the first spectrum analyzer is set according to a testing requirement to obtain the noise temperature when the first noise source is turned on and off
The Y factor of the system.
3. The noise temperature test method for OTA test according to claim 1, wherein the noise temperature T of the meter Instr By the following steps ofThe following formula is calculated:
wherein T is Instr And Y Instr The noise temperature and Y factor of the first test system respectively,
and->
The noise temperature of the first noise source at on and off, respectively.
4. The method of claim 1, wherein the second system comprises a second noise source, a second spectrum analyzer, two standard gain antennas with identical performance parameters, and a desired rf adapter, and wherein the distance between the two standard gain antennas is D.
5. The noise temperature test method according to claim 4, wherein the noise temperature T of the second test system b Calculated by the following formula:
wherein T is ANT For noise temperature of single standard gain antenna, G ANT Gain for a single standard gain antenna, where T ANT And G ANT Including path loss in space; t (T) Instr Noise for the first test systemA temperature; g b Is the gain of the second test system.
6. The method of claim 1, wherein the third test system comprises a third noise source, a reference antenna, a DUT, a test cable, a third spectrum analyzer, and a desired rf adapter, and the distance between the reference antenna and the DUT is D.
7. The method of claim 6, wherein the DUT is a module of an antenna integrated with a radio frequency module or a separate antenna to be tested.
8. The noise temperature test method according to claim 6, wherein when the DUT is a receiving module, the noise temperature T of the DUT is higher than the noise temperature T of the DUT DUT,RX ：
Wherein T is a And G a For the noise temperature value and gain of the third test system, T Instr A noise temperature for the first test system; t (T) b And G b Noise temperature and gain for the second test system; g ANT The gain of a single standard gain antenna for the second test system.
9. The noise temperature test method according to claim 4, wherein when the DUT is a transmitting module, the noise temperature T of the DUT is higher than the noise temperature T of the DUT DUT,TX ：
Wherein T is c And G c For the noise temperature value and gain of the third test system, T Instr A noise temperature for the first test system; t (T) b And G b Noise temperature and gain for the second test system; g ANT The gain of a single standard gain antenna for the second test system.
10. A noise temperature testing method suitable for OTA testing according to claims 6-9 wherein the device under test DUT comprises a microwave millimeter wave module, a receiver, a transmitter, a packaged antenna.
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